MCP3302T-BI/ST [MICROCHIP]

13-Bit Differential Input, Low Power A/D Converter with SPI⑩ Serial Interface; 13位差分输入,低功耗A / D转换器SPI⑩串行接口
MCP3302T-BI/ST
型号: MCP3302T-BI/ST
厂家: MICROCHIP    MICROCHIP
描述:

13-Bit Differential Input, Low Power A/D Converter with SPI⑩ Serial Interface
13位差分输入,低功耗A / D转换器SPI⑩串行接口

转换器
文件: 总40页 (文件大小:747K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MCP3302/04  
13-Bit Differential Input, Low Power A/D Converter  
with SPI™ Serial Interface  
Features  
General Description  
• Full Differential Inputs  
The Microchip Technology Inc. MCP3302/04 13-bit A/D  
converters feature full differential inputs and low power  
consumption in a small package that is ideal for battery  
powered systems and remote data acquisition applica-  
tions. The MCP3302 is programmable to provide two  
differential input pairs or four single ended inputs. The  
MCP3304 is programmable and provides four differen-  
tial input pairs or eight single ended inputs.  
• MCP3302: 2 Differential or 4 Single ended Inputs  
• MCP3304: 4 Differential or 8 Single ended Inputs  
• ±1 LSB max DNL  
• ±1 LSB max INL (MCP3302/04-B)  
• ±2 LSB max INL (MCP3302/04-C)  
• Single supply operation: 2.7V to 5.5V  
• 100 ksps sampling rate with 5V supply voltage  
• 50 ksps sampling rate with 2.7V supply voltage  
• 50 nA typical standby current, 1 μA max  
• 450 μA max active current at 5V  
• Industrial temp range: -40°C to +85°C  
• 14 and 16-pin PDIP, SOIC and TSSOP packages  
• MXDEVTM Evaluation kit available  
Incorporating a successive approximation architecture  
with on-board sample and hold circuitry, these 13-bit  
A/D converters are specified to have ±1 LSB Differen-  
tial Nonlinearity (DNL); ±1 LSB Integral Nonlinearity  
(INL) for B-grade and ±2 LSB for C-grade devices. The  
industry-standard SPI™ serial interface enables 13-bit  
A/D converter capability to be added to any PIC®  
microcontroller.  
The MCP3302/04 devices feature low current design  
that permits operation with typical standby and active  
currents of only 50 nA and 300 μA, respectively. The  
devices operate over a broad voltage range of 2.7V to  
5.5V and are capable of conversion rates of up to  
100 ksps. The reference voltage can be varied from  
400 mV to 5V, yielding input-referred resolution  
between 98 μV and 1.22 mV.  
Applications  
• Remote Sensors  
• Battery Operated Systems  
• Transducer Interface  
Package Types  
PDIP, SOIC, TSSOP  
The MCP3302 is available in 14-pin PDIP, 150 mil  
SOIC and TSSOP packages. The MCP3304 is avail-  
able in 16-pin PDIP and 150 mil SOIC packages. The  
full differential inputs of these devices enable a wide  
variety of signals to be used in applications such as  
remote data acquisition, portable instrumentation and  
battery operated applications.  
CH0  
CH1  
CH2  
CH3  
NC  
1
2
3
4
5
6
7
14  
13  
VDD  
VREF  
12 AGND  
CLK  
11  
10  
9
DOUT  
DIN  
NC  
DGND  
8
CS/SHDN  
PDIP, SOIC  
CH0  
CH1  
CH2  
CH3  
CH4  
CH5  
CH6  
CH7  
1
2
3
4
5
6
7
8
16 VDD  
VREF  
15  
14  
AGND  
13 CLK  
12 DOUT  
DIN  
11  
10  
9
CS/SHDN  
DGND  
© 2007 Microchip Technology Inc.  
DS21697C-page 1  
MCP3302/04  
Functional Block Diagram  
AGND DGND  
VDD  
VREF  
CH0  
CH1  
Input  
Channel  
Mux  
CH7*  
CDAC  
Comparator  
-
Sample  
& Hold  
Circuits  
13-Bit SAR  
+
Shift  
Register  
Control Logic  
CS/SHDN DIN  
CLK  
DOUT  
* Channels 5-7 available on MCP3304 Only  
DS21697C-page 2  
© 2007 Microchip Technology Inc.  
MCP3302/04  
1.0  
ELECTRICAL  
PIN FUNCTION TABLE  
CHARACTERISTICS  
Name  
Function  
Maximum Ratings*  
CH0-CH7  
DGND  
CS/SHDN  
DIN  
Analog Inputs  
Digital Ground  
VDD........................................................................7.0V  
All inputs and outputs w.r.t. VSS .....-0.3V to VDD +0.3V  
Storage temperature ..........................-65°C to +150°C  
Ambient temp. with power applied.....-65°C to +125°C  
Maximum Junction Temperature ....................... 150°C  
ESD protection on all pins (HBM)......................... > 4 kV  
Chip Select / Shutdown Input  
Serial Data In  
DOUT  
Serial Data Out  
CLK  
Serial Clock  
AGND  
VREF  
Analog Ground  
Reference Voltage Input  
+2.7V to 5.5V Power Supply  
*Notice: Stresses above those listed under “Maximum rat-  
ings” may cause permanent damage to the device. This is a  
stress rating only and functional operation of the device at  
those or any other conditions above those indicated in the  
operational listings of this specification is not implied. Expo-  
sure to maximum rating conditions for extended periods may  
affect device reliability.  
VDD  
ELECTRICAL SPECIFICATIONS  
Electrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, V = 0V, and V  
= 5V. Full differential  
SS  
REF  
input configuration (Figure 3-4) with fixed common mode voltage of 2.5V. All parameters apply over temperature with  
T
= -40°C to +85°C (Note 7). Conversion speed (F  
) is 100 ksps with F  
= 21*F  
CLK SAMPLE  
AMB  
SAMPLE  
Parameter  
Symbol  
Min  
Typ  
Max  
Units  
Conditions  
Conversion Rate  
Maximum Sampling Frequency  
F
100  
50  
ksps Note 8  
SAMPLE  
ksps  
V
= V  
= 2.7V, V  
=1.35V  
DD  
REF  
CM  
Conversion Time  
Acquisition Time  
T
13  
CLK  
periods  
CONV  
T
1.5  
CLK  
ACQ  
periods  
DC Accuracy  
Resolution  
12 data bits + sign  
bits  
Integral Nonlinearity  
INL  
±0.5  
±1  
±1  
LSB  
LSB  
MCP3302/04-B  
MCP3302/04-C  
±2  
±1  
+2  
+2  
+6  
Differential Nonlinearity  
Positive Gain Error  
Negative Gain Error  
Offset Error  
DNL  
-3  
-3  
-3  
±0.5  
-0.75  
-0.5  
+3  
LSB  
LSB  
LSB  
LSB  
Monotonic over temperature  
Note 1: This specification is established by characterization and not 100% tested.  
2: See characterization graphs that relate converter performance to V level.  
REF  
3:  
4:  
V
V
= 0.1V to 4.9V @ 1 kHz.  
IN  
=5V  
±500 mV @ 1 kHz, see test circuit Figure 3-3.  
DD  
P-P  
5: Maximum clock frequency specification must be met.  
6: = 400 mV, V = 0.1V to 4.9V @ 1 kHz  
7: TSSOP devices are only specified at 25°C and +85°C.  
8: For slow sample rates, see Section 6.2.1 for limitations on clock frequency.  
V
REF  
IN  
© 2007 Microchip Technology Inc.  
DS21697C-page 3  
MCP3302/04  
ELECTRICAL SPECIFICATIONS (CONTINUED)  
Electrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, V = 0V, and V  
= 5V. Full differential  
SS  
REF  
input configuration (Figure 3-4) with fixed common mode voltage of 2.5V. All parameters apply over temperature with  
T
= -40°C to +85°C (Note 7). Conversion speed (F  
) is 100 ksps with F  
= 21*F  
CLK SAMPLE  
AMB  
SAMPLE  
Parameter  
Symbol  
Min  
Typ  
Max  
Units  
Conditions  
Dynamic Performance  
Total Harmonic Distortion  
Signal to Noise and Distortion  
Spurious Free Dynamic Range  
Common Mode Rejection  
Channel to Channel Crosstalk  
Power Supply Rejection  
Reference Input  
THD  
SINAD  
SFDR  
CMRR  
CT  
-91  
78  
dB  
dB  
dB  
dB  
dB  
dB  
Note 3  
Note 3  
Note 3  
Note 6  
Note 6  
Note 4  
92  
79  
> -110  
74  
PSR  
Voltage Range  
0.4  
V
V
Note 2  
DD  
Current Drain  
100  
0.001  
150  
3
μA  
μA  
CS = V = 5V  
DD  
Analog Inputs  
Full Scale Input Span  
Absolute Input Voltage  
Leakage Current  
CH0 - CH7  
CH0 - CH7  
-V  
V
V
V
REF  
REF  
-0.3  
V
+ 0.3  
DD  
0.001  
1
±1  
μA  
kΩ  
pF  
Switch Resistance  
R
See Figure 6-3  
See Figure 6-3  
S
Sample Capacitor  
C
25  
SAMPLE  
Digital Input/Output  
Data Coding Format  
High Level Input Voltage  
Low Level Input Voltage  
High Level Output Voltage  
Low Level Output Voltage  
Input Leakage Current  
Output Leakage Current  
Pin Capacitance  
Binary Two’s Complement  
V
0.7 V  
0.3 V  
V
V
IH  
DD  
V
IL  
DD  
V
4.1  
V
I
I
= -1 mA, V = 4.5V  
DD  
OH  
OH  
OL  
V
I
0.4  
10  
10  
10  
V
= 1 mA, V = 4.5V  
OL  
DD  
-10  
-10  
μA  
μA  
pF  
V
V
= V or V  
DD  
LI  
IN  
SS  
I
= V or V  
SS DD  
LO  
OUT  
C
, C  
T
= 25°C, F = 1 MHz, Note 1  
IN  
OUT  
AMB  
Note 1: This specification is established by characterization and not 100% tested.  
2: See characterization graphs that relate converter performance to V level.  
REF  
3:  
4:  
V
V
= 0.1V to 4.9V @ 1 kHz.  
IN  
=5V  
±500 mV @ 1 kHz, see test circuit Figure 3-3.  
DD  
P-P  
5: Maximum clock frequency specification must be met.  
6: = 400 mV, V = 0.1V to 4.9V @ 1 kHz  
7: TSSOP devices are only specified at 25°C and +85°C.  
8: For slow sample rates, see Section 6.2.1 for limitations on clock frequency.  
V
REF  
IN  
DS21697C-page 4  
© 2007 Microchip Technology Inc.  
MCP3302/04  
ELECTRICAL SPECIFICATIONS (CONTINUED)  
Electrical Characteristics: Unless otherwise noted, all parameters apply at VDD = 5V, V = 0V, and V  
= 5V. Full differential  
SS  
REF  
input configuration (Figure 3-4) with fixed common mode voltage of 2.5V. All parameters apply over temperature with  
T
= -40°C to +85°C (Note 7). Conversion speed (F  
) is 100 ksps with F  
= 21*F  
CLK SAMPLE  
AMB  
SAMPLE  
Parameter  
Symbol  
Min  
Typ  
Max  
Units  
Conditions  
Timing Specifications:  
Clock Frequency (Note 8)  
F
0.105  
0.105  
2.1  
1.05  
MHz  
MHz  
V
V
= 5V, F  
= 2.7V, F  
= 100 ksps  
CLK  
DD  
DD  
SAMPLE  
= 50 ksps  
SAMPLE  
Clock High Time  
T
210  
210  
100  
50  
50  
ns  
Note 5  
Note 5  
HI  
Clock Low Time  
T
ns  
LO  
CS Fall To First Rising CLK Edge  
Data In Setup time  
T
ns  
SUCS  
T
ns  
SU  
Data In Hold Time  
T
T
ns  
HD  
DO  
CLK Fall To Output Data Valid  
125  
200  
ns  
ns  
V
V
= 5V, see Figure 3-1  
= 2.7V, see Figure 3-1  
DD  
DD  
CLK Fall To Output Enable  
CS Rise To Output Disable  
CS Disable Time  
T
125  
200  
ns  
ns  
V
V
= 5V, see Figure 3-1  
= 2.7V, see Figure 3-1  
EN  
DD  
DD  
T
100  
ns  
See test circuits, Figure 3-1  
Note 1  
DIS  
T
475  
ns  
ns  
CSH  
D
Rise Time  
T
100  
See test circuits, Figure 3-1  
OUT  
R
Note 1  
D
Fall Time  
T
100  
ns  
See test circuits, Figure 3-1  
OUT  
F
Note 1  
Power Requirements:  
Operating Voltage  
Operating Current  
V
I
2.7  
5.5  
V
DD  
300  
200  
450  
μA  
V
V
, V  
, V  
= 5V, D  
= 2.7V, D  
unloaded  
OUT  
DD  
DD  
DD  
REF  
REF  
unloaded  
OUT  
Standby Current  
I
0.05  
1
μA  
CS = V = 5.0V  
DD  
DDS  
Temperature Ranges:  
Specified Temperature Range  
Operating Temperature Range  
Storage Temperature Range  
Thermal Package Resistance:  
Thermal Resistance, 14L-PDIP  
Thermal Resistance, 14L-SOIC  
Thermal Resistance, 14L-TSSOP  
Thermal Resistance, 16L-PDIP  
Thermal Resistance, 16L-SOIC  
T
-40  
-40  
-65  
+85  
+85  
°C  
°C  
°C  
A
T
A
T
+150  
A
θ
70  
108  
100  
70  
°C/W  
°C/W  
°C/W  
°C/W  
°C/W  
JA  
JA  
JA  
JA  
JA  
θ
θ
θ
θ
90  
Note 1: This specification is established by characterization and not 100% tested.  
2: See characterization graphs that relate converter performance to V level.  
REF  
3:  
4:  
V
V
= 0.1V to 4.9V @ 1 kHz.  
IN  
=5V  
±500 mV @ 1 kHz, see test circuit Figure 3-3.  
DD  
P-P  
5: Maximum clock frequency specification must be met.  
6: = 400 mV, V = 0.1V to 4.9V @ 1 kHz  
7: TSSOP devices are only specified at 25°C and +85°C.  
8: For slow sample rates, see Section 6.2.1 for limitations on clock frequency.  
V
REF  
IN  
© 2007 Microchip Technology Inc.  
DS21697C-page 5  
MCP3302/04  
.
T
CSH  
CS  
T
SUCS  
T
T
LO  
HI  
CLK  
T
T
HD  
SU  
D
IN  
MSB IN  
T
T
T
F
R
T
DO  
DIS  
T
EN  
D
LSB  
OUT  
Null Bit  
Sign BIT  
FIGURE 1-1:  
Timing Parameters  
DS21697C-page 6  
© 2007 Microchip Technology Inc.  
MCP3302/04  
2.0  
TYPICAL PERFORMANCE CURVES  
Note: The graphs and tables provided following this note are a statistical summary based on a limited number of  
samples and are provided for informational purposes only. The performance characteristics listed herein  
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified  
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
.
.
1
0.8  
0.6  
1
0.8  
0.6  
VDD=VREF=2.7V  
Positive INL  
Positive INL  
Negative INL  
0.4  
0.2  
0
0.4  
0.2  
0
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
Negative INL  
0
10  
20  
30  
40  
50  
60  
70  
0
50  
100  
Sample Rate (ksps)  
150  
200  
Sample Rate (ksps)  
FIGURE 2-1:  
Integral Nonlinearity (INL)  
FIGURE 2-4:  
Integral Nonlinearity (INL)  
vs. Sample Rate  
vs. Sample Rate (VDD = 2.7V)  
.
2
1.5  
1
2
VDD = 2.7V  
1.5  
1
Positive INL  
Positive INL  
Negative INL  
0.5  
0
0.5  
0
-0.5  
-1  
-0.5  
Negative INL  
-1  
-1.5  
-2  
-1.5  
-2  
0
1
2
3
4
5
0
0.5  
1
1.5  
2
2.5  
3
VREF(V)  
VREF(V)  
FIGURE 2-2:  
Integral Nonlinearity (INL)  
FIGURE 2-5:  
Integral Nonlinearity (INL)  
vs. VREF.  
vs. VREF (VDD = 2.7V)  
1
0.8  
0.6  
0.4  
0.2  
0
1
VDD=VREF=2.7V  
0.8  
0.6  
0.4  
0.2  
0
FSAMPLE = 50 ksps  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-4096 -3072 -2048 -1024  
0
1024  
2048  
3072  
4096  
-4096 -3072 -2048 -1024  
0
1024  
2048  
3072  
4096  
Code  
Code  
FIGURE 2-3:  
Integral Nonlinearity (INL)  
FIGURE 2-6:  
Integral Nonlinearity (INL)  
vs. Code (Representative Part).  
vs. Code (Representative Part, VDD = 2.7V).  
© 2007 Microchip Technology Inc.  
DS21697C-page 7  
MCP3302/04  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
1
0.8  
0.6  
0.4  
0.2  
0
1
0.8  
0.6  
0.4  
0.2  
0
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
Positive INL  
Positive INL  
Negative INL  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
Negative INL  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Temperature(°C)  
Temperature (°C)  
FIGURE 2-7:  
Integral Nonlinearity (INL)  
FIGURE 2-10:  
Integral Nonlinearity (INL)  
vs. Temperature.  
vs. Temperature (VDD = 2.7V).  
1
0.8  
0.6  
0.4  
0.2  
0
1
VDD=VREF=2.7V  
0.8  
0.6  
Positive DNL  
Positive DNL  
0.4  
0.2  
0
-0.2  
-0.2  
-0.4  
-0.6  
-0.8  
Negative DNL  
-0.4  
-0.6  
-0.8  
-1  
Negative DNL  
0
10  
20  
30  
40  
50  
60  
70  
-1  
0
50  
100  
150  
200  
Sample Rate (ksps)  
Sample Rate (ksps)  
FIGURE 2-8:  
Differential Nonlinearity  
FIGURE 2-11:  
Differential Nonlinearity  
(DNL) vs. Sample Rate.  
(DNL) vs. Sample Rate (VDD = 2.7V).  
2
1.5  
1
2
VDD=2.7V  
FSAMPLE = 50 ksps  
1.5  
1
Positive DNL  
Positive DNL  
0.5  
0
0.5  
0
Negative DNL  
-0.5  
-1  
Negative DNL  
-0.5  
-1  
-1.5  
-2  
-1.5  
-2  
0
1
2
3
4
5
6
0
0.5  
1
1.5  
2
2.5  
3
VREF(V)  
VREF (V)  
FIGURE 2-9:  
Differential Nonlinearity  
FIGURE 2-12:  
Differential Nonlinearity  
(DNL) vs. VREF  
.
(DNL) vs. VREF (VDD = 2.7V).]  
DS21697C-page 8  
© 2007 Microchip Technology Inc.  
MCP3302/04  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
1
0.8  
0.6  
0.4  
0.2  
0
1
0.8  
0.6  
0.4  
0.2  
0
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-4096 -3072 -2048 -1024  
0
1024  
2048  
3072  
4096  
-4096 -3072 -2048 -1024  
0
1024  
2048  
3072  
4096  
Code  
Code  
FIGURE 2-13:  
Differential Nonlinearity  
FIGURE 2-16:  
Differential Nonlinearity  
(DNL) vs. Code (Representative Part).  
(DNL) vs. Code (Representative Part,  
V
DD = 2.7V).  
1
0.8  
0.6  
1
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
0.8  
0.6  
0.4  
0.2  
0
Positive DNL  
Negative DNL  
Positive DNL  
0.4  
0.2  
0
-0.2  
-0.4  
-0.6  
-0.8  
-1  
-0.2  
-0.4  
-0.6  
-0.8  
-1  
Negaitive DNL  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
-50  
-25  
0
25  
50  
75  
100  
125  
150  
Temperature (°C)  
Temperature (°C)  
FIGURE 2-14:  
Differential Nonlinearity  
FIGURE 2-17:  
Differential Nonlinearity  
(DNL) vs. Temperature.  
(DNL) vs. Temperature (VDD = 2.7V).  
4
3
2
20  
18  
16  
14  
12  
10  
8
VDD=5V  
VDD = 5V  
1
FSAMPLE = 100 ksps  
FSAMPLE = 100 ksps  
0
-1  
-2  
-3  
6
4
VDD = 2.7V  
2
FSAMPLE = 50 ksps  
0
0
1
2
3
4
5
6
0
1
2
3
4
5
6
VREF(V)  
VREF(V)  
FIGURE 2-15:  
VREF  
Positive Gain Error vs.  
FIGURE 2-18:  
Offset Error vs. VREF.  
.
© 2007 Microchip Technology Inc.  
DS21697C-page 9  
MCP3302/04  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
0
-0.2  
-0.4  
-0.6  
-0.8  
-1  
3.5  
3
VDD=VREF=5V  
FSAMPLE = 100 ksps  
VDD=VREF=5V  
2.5  
2
FSAMPLE = 100 ksps  
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
1.5  
1
-1.2  
-1.4  
-1.6  
-1.8  
VDD=VREF=2.7V  
0.5  
0
FSAMPLE = 50 ksps  
-50  
0
50  
100  
150  
-50  
0
50  
100  
150  
Temperature (°C)  
Temperature (°C)  
FIGURE 2-19:  
Positive Gain Error vs.  
FIGURE 2-22:  
Offset Error vs.  
Temperature.  
Temperature.  
90  
80  
70  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
VDD=VREF=5V  
FSAMPLE = 100 ksps  
60  
50  
40  
30  
20  
10  
0
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
VDD=VREF=2.7V  
SAMPLE = 50 ksps  
F
VDD=VREF=5V  
FSAMPLE = 100 ksps  
0
1
1
10  
100  
10  
100  
Input Frequency (kHz)  
Input Frequency (kHz)  
FIGURE 2-20:  
Signal to Noise Ratio (SNR)  
FIGURE 2-23:  
Signal to Noise and  
vs. Input Frequency.  
Distortion (SINAD) vs. Input Frequency.  
0
-10  
-20  
80  
70  
60  
50  
40  
-30  
VDD=VREF=2.7V  
-40  
VDD=VREF=5V  
FSAMPLE = 50 ksps  
FSAMPLE = 100 ksps  
-50  
-60  
-70  
-80  
-90  
VDD=VREF=2.7V  
VDD=VREF=5V  
30  
20  
10  
0
FSAMPLE = 50 ksps  
FSAMPLE = 100 ksps  
-100  
1
-40  
-35  
-30  
-25  
-20  
-15  
-10  
-5  
0
10  
Input Frequency (kHz)  
100  
Input Signal Level (dB)  
FIGURE 2-21:  
Total Harmonic Distortion  
FIGURE 2-24:  
Signal to Noise and  
(THD) vs. Input Frequency.  
Distortion (SINAD) vs. Input Signal Level.  
DS21697C-page 10  
© 2007 Microchip Technology Inc.  
MCP3302/04  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
13  
12  
11  
10  
9
13  
12.8  
12.6  
12.4  
12.2  
12  
VDD=VREF=5V  
VDD=2.7V  
VDD=5V  
FSAMPLE = 100 ksps  
FSAMPLE = 50 ksps  
FSAMPLE = 100 ksps  
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
11.8  
11.6  
11.4  
11.2  
8
7
0
1
2
3
4
5
1
10  
Input Frequency (kHz)  
100  
VREF(V)  
FIGURE 2-25:  
Effective Number of Bits  
FIGURE 2-28:  
Effective Number of Bits  
(ENOB) vs. VREF  
.
(ENOB) vs. Input Frequency.  
100  
90  
80  
70  
60  
-30  
-35  
-40  
-45  
-50  
-55  
-60  
-65  
-70  
-75  
-80  
VDD=VREF=5V  
0.1 µF Bypass  
Capacitor  
FSAMPLE = 100 ksps  
VDD=VREF=2.7V  
50  
40  
30  
20  
10  
0
FSAMPLE = 50 ksps  
1
10  
Input Frequency (kHz)  
100  
1
10  
100  
1000  
10000  
Ripple Frequency (kHz)  
FIGURE 2-26:  
Spurious Free Dynamic  
FIGURE 2-29:  
Power Supply Rejection  
Range (SFDR) vs. Input Frequency.  
(PSR) vs. Ripple Frequency.  
0
-10  
0
-10  
-20  
-20  
-30  
-30  
-40  
-40  
-50  
-50  
-60  
-60  
-70  
-70  
-80  
-80  
-90  
-90  
-100  
-110  
-120  
-130  
-140  
-150  
-100  
-110  
-120  
-130  
-140  
-150  
0
10000  
20000  
30000  
40000  
50000  
0
5000  
10000  
Frequency (Hz)  
15000  
20000  
25000  
Frequency (Hz)  
FIGURE 2-27:  
Frequency Spectrum of  
FIGURE 2-30:  
Frequency Spectrum of  
10 kHz Input (Representative Part).  
1 kHz Input (Representative Part, VDD = 2.7V).  
© 2007 Microchip Technology Inc.  
DS21697C-page 11  
MCP3302/04  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
450  
400  
350  
300  
250  
200  
150  
100  
50  
120  
100  
80  
60  
40  
20  
0
0
2
2.5  
3
50  
0
3.5  
4
4.5  
5
5.5  
6
2
2.5  
3
3.5  
4
4.5  
5
5.5  
6
VDD (V)  
VDD (V)  
FIGURE 2-31:  
IDD vs. VDD  
.
FIGURE 2-34:  
IREF vs. VDD.  
600  
500  
400  
300  
200  
100  
120  
100  
80  
VDD=VREF=5V  
VDD=VREF=5V  
60  
40  
VDD=VREF=2.7V  
VDD=VREF=2.7V  
20  
0
0
0
0
100  
150  
200  
50  
100  
150  
200  
Sample Rate (ksps)  
Sample Rate (ksps)  
FIGURE 2-32:  
IDD vs. Sample Rate.  
FIGURE 2-35:  
IREF vs. Sample Rate.  
400  
350  
300  
250  
200  
150  
100  
50  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
VDD=VREF=5V  
VDD=VREF=5V  
FSAMPLE = 100 ksps  
FSAMPLE = 100 ksps  
VDD=VREF=2.7V  
VDD=VREF=2.7V  
FSAMPLE = 50 ksps  
FSAMPLE = 50 ksps  
0
0
-50  
50  
100  
150  
-50  
0
50  
100  
150  
Temperature (°C)  
Temperature (°C)  
FIGURE 2-33:  
IDD vs. Temperature.  
FIGURE 2-36:  
IREF vs. Temperature.  
DS21697C-page 12  
© 2007 Microchip Technology Inc.  
MCP3302/04  
Note: Unless otherwise indicated, VDD = VREF = 5V, Full differential input configuration, VSS = 0V,  
FSAMPLE = 100 ksps, FCLK = 21*FSAMPLE, TA = 25°C.  
80  
70  
60  
50  
40  
30  
20  
10  
0
2
1.5  
1
VDD=VREF=2.7V  
VDD=VREF=5V  
0.5  
0
FSAMPLE = 50 ksps  
FSAMPLE = 100 ksps  
-0.5  
-1  
-1.5  
-2  
2
2.5  
3
3.5  
4
4.5  
5
5.5  
6
-50  
0
50  
100  
150  
VDD (V)  
Temperature (°C)  
FIGURE 2-37:  
IDDS vs. VDD  
.
FIGURE 2-40:  
Negative Gain Error vs.  
Temperature.  
100  
10  
80  
79  
78  
77  
76  
75  
74  
73  
72  
71  
1
0.1  
0.01  
0.001  
-50  
-25  
0
25  
50  
75  
100  
70  
1
Temperature (°C)  
10  
100  
1000  
Input Frequency (kHz)  
FIGURE 2-38:  
IDDS vs. Temperature.  
FIGURE 2-41:  
Common Mode Rejection  
vs. Frequency.  
4
3.5  
3
2.5  
2
1.5  
1
VDD=5V  
FSAMPLE = 100 ksps  
0.5  
0
-0.5  
-1  
0
1
2
3
4
5
6
VREF (V)  
FIGURE 2-39:  
Negative Gain Error vs.  
Reference Voltage.  
© 2007 Microchip Technology Inc.  
DS21697C-page 13  
MCP3302/04  
3.0  
TEST CIRCUITS  
1 kΩ  
1/2 MCP602  
1 kΩ  
+
-
1.4V  
5V ±500 mVP-P  
To VDD on DUT  
20 kΩ  
5VP-P  
3 kΩ  
Test Point  
DOUT  
1 kΩ  
2.63V  
CL = 100 pF  
FIGURE 3-3:  
Test Circuit (PSRR).  
Power Supply Sensitivity  
FIGURE 3-1:  
Load Circuit for TR, TF, TDO.  
Test Point  
V
= 5V  
V
= 5V  
DD  
REF  
VDD  
1 µF  
0.1 µF  
TDIS Waveform 2  
0.1 µF  
VDD/2  
3 kΩ  
100 pF  
DOUT  
TEN Waveform  
5V  
P-P  
TDIS Waveform 1  
IN(+)  
IN(-)  
V
V
REF DD  
VSS  
MCP330X  
V
SS  
5V  
P-P  
Voltage Waveforms for TDIS  
VIH  
V
= 2.5V  
CM  
CS  
DOUT  
Waveform 1*  
90%  
10%  
FIGURE 3-4:  
Configuration Example.  
Full Differential Test  
TDIS  
DOUT  
Waveform 2†  
V
= 2.5V  
1µF  
V
= 5V  
DD  
REF  
*Waveform 1 is for an output with internal con-  
ditions such that the output is high, unless dis-  
abled by the output control.  
0.1µF  
0.1µF  
IN(+)  
V
V
5V  
†Waveform 2 is for an output with internal con-  
ditions such that the output is low, unless dis-  
abled by the output control.  
REF DD  
P-P  
MCP330X  
IN(-)  
V
SS  
V
= 2.5V  
CM  
FIGURE 3-2:  
TEN  
Load circuit for TDIS and  
.
FIGURE 3-5:  
Pseudo Differential Test  
Configuration Example.  
DS21697C-page 14  
© 2007 Microchip Technology Inc.  
MCP3302/04  
4.6  
Serial Clock (CLK)  
4.0  
PIN DESCRIPTIONS  
The SPI clock pin is used to initiate a conversion and to  
clock out each bit of the conversion as it takes place.  
See Section 6.2 for constraints on clock speed. See  
Figure 7-2 for serial communication protocol.  
The descriptions of the pins are listed in Table 4-1.  
TABLE 4-1:  
Name  
PIN FUNCTION TABLE  
Function  
4.7  
AGND  
CH0-CH7  
DGND  
CS/SHDN  
DIN  
Analog Inputs  
Digital Ground  
Ground connection to internal analog circuitry. To  
ensure accuracy, this pin must be connected to the  
same ground as DGND. If an analog ground plane is  
available, it is recommended that this device be tied to  
the analog ground plane in the circuit. See Section 6.6  
for more information regarding circuit layout.  
Chip Select / Shutdown Input  
Serial Data In  
DOUT  
Serial Data Out  
CLK  
Serial Clock  
AGND  
VREF  
Analog Ground  
4.8  
Voltage Reference (V  
)
REF  
Reference Voltage Input  
+2.7V to 5.5V Power Supply  
This input pin provides the reference voltage for the  
device, which determines the maximum range of the  
analog input signal and the LSB size.  
VDD  
4.1  
CH0-CH7  
The LSB size is determined according to the equation  
shown below. As the reference input is reduced, the  
LSB size is reduced accordingly.  
Analog input channels. These pins have an absolute  
voltage range of VSS - 0.3V to VDD + 0.3V. The full scale  
differential input range is defined as the absolute value  
of (IN+) - (IN-). This difference can not exceed the  
value of VREF - 1 LSB or digital code saturation will  
occur.  
EQUATION  
2 x VREF  
LSB Size =  
8192  
4.2  
DGND  
Ground connection to internal digital circuitry. To  
ensure accuracy this pin must be connected to the  
same ground as AGND. If an analog ground plane is  
available, it is recommended that this device be tied to  
the analog ground plane in the circuit. See Section 6.6  
for more information regarding circuit layout.  
When using an external voltage reference device, the  
system designer should always refer to the manufac-  
turer’s recommendations for circuit layout. Any instabil-  
ity in the operation of the reference device will have a  
direct effect on the accuracy of the ADC conversion  
results.  
4.3  
Chip Select/Shutdown (CS/SHDN)  
4.9  
V
DD  
The CS/SHDN pin is used to initiate communication  
with the device when pulled low. This pin will end a con-  
version and put the device in low power standby when  
pulled high. The CS/SHDN pin must be pulled high  
between conversions and cannot be tied low for multi-  
ple conversions. See Figure 7-2 for serial communica-  
tion protocol.  
The voltage on this pin can range from 2.7 to 5.5V. To  
ensure accuracy, a 0.1 μF ceramic bypass capacitor  
should be placed as close as possible to the pin. See  
Section 6.6 for more information regarding circuit lay-  
out.  
4.4  
Serial Data Input (D )  
IN  
The SPI port serial data input pin is used to clock in  
input channel configuration data. Data is latched on the  
rising edge of the clock. See Figure 7-2 for serial com-  
munication protocol.  
4.5  
Serial Data Output (D  
)
OUT  
The SPI serial data output pin is used to shift out the  
results of the A/D conversion. Data will always change  
on the falling edge of each clock as the conversion  
takes place. See Figure 7-2 for serial communication  
protocol.  
© 2007 Microchip Technology Inc.  
DS21697C-page 15  
MCP3302/04  
Signal to Noise Ratio - Signal to Noise Ratio (SNR) is  
defined as the ratio of the signal to noise measured at  
the output of the converter. The signal is defined as the  
rms amplitude of the fundamental frequency of the  
input signal. The noise value is dependant on the  
device noise as well as the quantization error of the  
converter and is directly affected by the number of bits  
in the converter. The theoretical signal to noise ratio  
limit based on quantization error only for an N-bit con-  
verter is defined as:  
5.0  
DEFINITION OF TERMS  
Bipolar Operation - This applies to either a differential  
or single ended input configuration, where both positive  
and negative codes are output from the A/D converter.  
Full bipolar range includes all 8192 codes. For bipolar  
operation on a single ended input signal, the A/D con-  
verter must be configured to operate in pseudo differ-  
ential mode.  
Unipolar Operation - This applies to either a single  
ended or differential input signal where only one side of  
the device transfer is being used. This could be either  
the positive or negative side, depending on which input  
(IN+ or IN-) is being used for the DC bias. Full unipolar  
operation is equivalent to a 12-bit converter.  
EQUATION  
SNR = (6.02N + 1.76)dB  
For a 13-bit converter, the theoretical SNR limit is  
80.02 dB.  
Full Differential Operation - Applying a full differential  
signal to both the IN(+) and IN(-) inputs is referred to as  
full differential operation. This configuration is  
described in Figure 3-4.  
Total Harmonic Distortion - Total Harmonic Distortion  
(THD) is the ratio of the rms sum of the harmonics to  
the fundamental, measured at the output of the con-  
verter. For the MCP3302/04, it is defined using the first  
9 harmonics, as is shown in the following equation:  
Pseudo-Differential Operation - Applying a single  
ended signal to only one of the input channels with a  
bipolar output is referred to as pseudo differential oper-  
ation. To obtain a bipolar output from a single ended  
input signal the inverting input of the A/D converter  
must be biased above VSS. This operation is described  
in Figure 3-5.  
EQUATION  
V22 + V23 + V24 + ..... + V28 + V29  
THD(-dB) = –20 log--------------------------------------------------------------------------  
V21  
Integral Nonlinearity - The maximum deviation from a  
straight line passing through the endpoints of the bipo-  
lar transfer function is defined as the maximum integral  
nonlinearity error. The endpoints of the transfer func-  
tion are a point 1/2 LSB above the first code transition  
(0x1000) and 1/2 LSB below the last code transition  
(0x0FFF).  
Here V1 is the rms amplitude of the fundamental and V2  
through V9 are the rms amplitudes of the second  
through ninth harmonics.  
Signal to Noise plus Distortion (SINAD) - Numeri-  
cally defined, SINAD is the calculated combination of  
SNR and THD. This number represents the dynamic  
performance of the converter, including any harmonic  
distortion.  
Differential Nonlinearity - The difference between two  
measured adjacent code transitions and the 1 LSB  
ideal is defined as differential nonlinearity.  
Positive Gain Error - This is the deviation between the  
last positive code transition (0x0FFF) and the ideal volt-  
age level of VREF-1/2 LSB, after the bipolar offset error  
has been adjusted out.  
EQUATION  
SINAD(dB) = 20 log 10(SNR 10) + 10(THD 10)  
Negative Gain Error - This is the deviation between  
the last negative code transition (0X1000) and the ideal  
voltage level of -VREF-1/2 LSB, after the bipolar offset  
error has been adjusted out.  
EffectIve Number of Bits - Effective Number of Bits  
(ENOB) states the relative performance of the ADC in  
terms of its resolution. This term is directly related to  
SINAD by the following equation:  
Offset Error - This is the deviation between the first  
positive code transition (0x0001) and the ideal 1/2 LSB  
voltage level.  
EQUATION  
SINAD 1.76  
ENOB(N) = ----------------------------------  
6.02  
Acquisition Time - The acquisition time is defined as  
the time during which the internal sample capacitor is  
charging. This occurs for 1.5 clock cycles of the exter-  
nal CLK as defined in Figure 7-2.  
For SINAD performance of 78 dB, the effective number  
of bits is 12.66.  
Conversion Time - The conversion time occurs imme-  
diately after the acquisition time. During this time, suc-  
cessive approximation of the input signal occurs as the  
13-bit result is being calculated by the internal circuitry.  
This occurs for 13 clock cycles of the external CLK as  
defined in Figure 7-2.  
Spurious Free Dynamic Range - Spurious Free  
Dynamic Range (SFDR) is the ratio of the rms value of  
the fundamental to the next largest component in  
ADC’s output spectrum. This is, typically, the first har-  
monic, but could also be a noise peak.  
DS21697C-page 16  
© 2007 Microchip Technology Inc.  
MCP3302/04  
6.2  
Driving the Analog Input  
6.0  
6.1  
APPLICATIONS INFORMATION  
Conversion Description  
The analog input of the MCP3302/04 is easily driven,  
either differentially or single ended. Any signal that is  
common to the two input channels will be rejected by  
the common mode rejection of the device. During the  
charging time of the sample capacitor, a small charging  
current will be required. For low source impedances,  
this input can be driven directly. For larger source  
impedances, a larger acquisition time will be required  
due to the RC time constant that includes the source  
impedance. For the A/D Converter to meet specifica-  
tion, the charge holding capacitor (CSAMPLE) must be  
given enough time to acquire a 13-bit accurate voltage  
level during the 1.5 clock cycle acquisition period.  
The MCP3302/04 A/D converters employ a conven-  
tional SAR architecture. With this architecture, the  
potential between the IN+ and IN- inputs are simulta-  
neously sampled and stored with the internal sample  
circuits for 1.5 clock cycles. Following this sampling  
time, the input hold switches of the converter open and  
the device uses the collected charge to produce a  
serial 13-bit binary two’s complement output code. This  
conversion process is driven by the external clock and  
must include 13 clock cycles, one for each bit. During  
this process, the most significant bit (MSB) is output  
first. This bit is the sign bit and indicates if the IN+ or IN-  
input is at a higher potential.  
An analog input model is shown in Figure 6-3. This  
model is accurate for an analog input, regardless if it is  
configured as a single ended input, or the IN+ and IN-  
input in differential mode. In this diagram, it is shown  
that the source impedance (RS) adds to the internal  
sampling switch (RSS) impedance, directly affecting the  
time that is required to charge the capacitor (CSAMPLE).  
Consequently, a larger source impedance with no addi-  
tional acquisition time increases the offset, gain and  
integral linearity errors of the conversion. To overcome  
this, a slower clock speed can be used to allow for the  
longer charging time. Figure 6-2 shows the maximum  
clock speed associated with source impedances.  
CDAC  
Hold  
IN+  
C
C
SAMP  
+
-
Comp  
13-Bit SAR  
SAMP  
IN-  
Shift  
Register  
Hold  
D
OUT  
2.5  
2.0  
1.5  
1.0  
0.5  
0.0  
FIGURE 6-1:  
Simplified Block Diagram.  
100  
1000  
10000  
100000  
Source Resistance (ohms)  
FIGURE 6-2:  
Maximum Clock Frequency  
vs. Source Resistance (RS) to maintain ±1 LSB  
INL.  
© 2007 Microchip Technology Inc.  
DS21697C-page 17  
MCP3302/04  
VDD  
Sampling  
Switch  
VT = 0.6V  
VT = 0.6V  
RS = 1 kΩ  
CHx  
RSS  
SS  
CSAMPLE  
= DAC capacitance  
= 25 pF  
CPIN  
7 pF  
ILEAKAGE  
±1 nA  
VA  
VSS  
Legend  
VA  
signal source  
=
=
=
=
=
=
source impedance  
input channel pad  
input pin capacitance  
threshold voltage  
R
SS  
CHx  
C
PIN  
V
T
leakage current at the pin  
due to various junctions  
I
LEAKAGE  
SS  
sampling switch  
=
=
=
sampling switch resistor  
sample/hold capacitance  
R
S
C
SAMPLE  
bring down the high pass corner. The value of R will  
need to be 1 kΩ, or less, since higher input impedances  
require additional acquisition time. Using the RC values  
in Figure 6-4, we have a 100 Hz corner frequency. See  
Figure 2-12 for relation between input impedance and  
acquisition time.  
FIGURE 6-3:  
6.2.1  
Analog Input Model.  
MAINTAINING MINIMUM CLOCK  
SPEED  
When the MCP3302/04 initiates, charge is stored on  
the sample capacitor. When the sample period is com-  
plete, the device converts one bit for each clock that is  
received. It is important for the user to note that a slow  
clock rate will allow charge to bleed off the sample cap  
while the conversion is taking place. For the MCP330X  
devices, the recommended minimum clock speed dur-  
ing the conversion cycle (TCONV) is 105 kHz. Failure to  
meet this criteria may induce linearity errors into the  
conversion outside the rated specifications. It should  
be noted that during the entire conversion cycle, the  
A/D converter does not have requirements for clock  
speed or duty cycle, as long as all timing specifications  
are met.  
VDD = 5V  
0.1 µF  
C
10 µF  
IN+  
VIN  
MCP330X  
R
1 kΩ  
IN-  
VREF  
VOUT  
VIN  
6.3  
Biasing Solutions  
MCP1525  
0.1 µF  
1 µF  
For pseudo-differential bipolar operation, the biasing  
circuit (shown in Figure 6-4) shows a single ended  
input AC coupled to the converter. This configuration  
will give a digital output range of -4096 to +4095. With  
the 2.5V reference, the LSB size equal to 610 μV.  
FIGURE 6-4:  
circuit for bipolar operation.  
Pseudo-differential biasing  
Using an external operation amplifier on the input  
allows for gain and also buffers the input signal from the  
input to the ADC allowing for a higher source imped-  
ance. This circuit is shown in Figure 6-5.  
Although the ADC is not production tested with a 2.5V  
reference as shown, linearity will not change more than  
0.1 LSB. See Figure 2-2 and Figure 2-9 for DNL and  
INL errors versus VREF at VDD = 5V. A trade-off exists  
between the high pass corner and the acquisition time.  
The value of C will need to be quite large in order to  
DS21697C-page 18  
© 2007 Microchip Technology Inc.  
MCP3302/04  
6.4  
Common Mode Input Range  
The common mode input range has no restriction and is  
equal to the absolute input voltage range: VSS -0.3V to  
VDD + 0.3V. However, for a given VREF, the common  
mode voltage has a limited swing, if the entire range of  
the A/D converter is to be used. Figure 6-7 and  
Figure 6-8 show the relationship between VREF and the  
common mode voltage swing. A smaller VREF allows for  
wider flexibility in a common mode voltage. VREF levels,  
down to 400 mv, exhibit less than 0.1 LSB change in  
DNL and INL. For characterization graphs that show  
this performance relationship, see Figure 2-9 and  
Figure 2-12.  
V
= 5V  
DD  
10 kΩ  
0.1 μF  
MCP6021  
1 kΩ  
-
IN+  
IN-  
V
+
MCP330X  
IN  
1 μF  
V
REF  
1 MΩ  
1 μF  
V
V
IN  
OUT  
MCP1525  
VDD = 5V  
0.1 μF  
5
4
3
4.05V  
2.8V  
FIGURE 6-5:  
Adding an amplifier allows  
for gain and also buffers the input from any high  
impedance sources.  
2
2.3V  
1
This circuit shows that some headroom will be lost due  
to the amplifier output not being able to swing all the  
way to the rail. An example would be for an output  
swing of 0V to 5V. This limitation can be overcome by  
supplying a VREF that is slightly less than the common  
mode voltage. Using a 2.048V reference for the A/D  
converter while biasing the input signal at 2.5V solves  
the problem. This circuit is shown in Figure 6-5.  
0.95V  
0
-1  
0.25  
1.0  
5.0  
2.5  
4.0  
V
(V)  
REF  
FIGURE 6-7:  
Common Mode Input Range  
of Full Differential Input Signal versus VREF  
.
V
= 5V  
DD  
VDD = 5V  
10 kΩ  
0.1 µF  
5
4
4.05V  
0.95V  
MCP606  
1 kΩ  
2.8V  
2.3V  
3
2
1
0
-
IN+  
IN-  
V
+
MCP330X  
IN  
1 µF  
V
REF  
1 MΩ  
10 kΩ  
2.048V  
-1  
0.25  
0.5  
2.5  
1.25  
(V)  
2.0  
V
V
IN  
OUT  
V
REF  
1 µF  
MCP1525  
0.1 µF  
FIGURE 6-8:  
Common Mode Input Range  
versus VREF for Pseudo Differential Input.  
FIGURE 6-6:  
Circuit solution to overcome  
amplifier output swing limitation.  
© 2007 Microchip Technology Inc.  
DS21697C-page 19  
MCP3302/04  
6.5  
Buffering/Filtering the Analog  
Inputs  
6.6  
Layout Considerations  
When laying out a printed circuit board for use with  
analog components, care should be taken to reduce  
noise wherever possible. A bypass capacitor from VDD  
to ground should always be used with this device and  
should be placed as close as possible to the device pin.  
A bypass capacitor value of 0.1 μF is recommended.  
Inaccurate conversion results may occur if the signal  
source for the A/D converter is not a low impedance  
source. Buffering the input will overcome the imped-  
ance issue. It is also recommended that an analog filter  
be used to eliminate any signals that may be aliased  
back into the conversion results. This is illustrated in  
Figure 6-9, where an op amp is used to drive the ana-  
log input of the MCP3302/04. This amplifier provides a  
low impedance source for the converter input and a low  
pass filter, which eliminates unwanted high frequency  
noise. Values shown are for a 10 Hz Butterworth Low  
Pass filter.  
Digital and analog traces on the board should be sepa-  
rated as much as possible, with no traces running  
underneath the device or the bypass capacitor. Extra  
precautions should be taken to keep traces with high  
frequency signals (such as clock lines) as far as possi-  
ble from analog traces.  
Use of an analog ground plane is recommended in  
order to keep the ground potential the same for all  
devices on the board. Providing VDD connections to  
devices in a “star” configuration can also reduce noise  
by eliminating current return paths and associated  
errors (see Figure 6-10). For more information on lay-  
out tips when using the MCP3302/04, or other ADC  
devices, refer to Application Note 688, “Layout Tips for  
12-Bit A/D Converter Applications”.  
Low pass (anti-aliasing) filters can be designed using  
Microchip’s interactive FilterLab® software. FilterLab  
will calculate capacitor and resistor values, as well as  
determine the number of poles that are required for the  
application. For more information on filtering signals,  
see Application Note 699 “Anti-Aliasing Analog Filters  
for Data Acquisition Systems”.  
VDD  
10 µF  
VDD  
4.096V  
Reference  
Connection  
1 µF  
0.1 µF  
MCP1541  
CL  
0.1 µF  
VREF  
IN+  
MCP330X  
IN-  
Device 4  
2.2 µF  
MCP601  
7.86 kΩ  
VIN  
+
-
14.6 kΩ  
1 µF  
Device 1  
FIGURE 6-9:  
The MCP601 Operational  
Device 3  
Amplifier is used to implement a 2nd order anti-  
aliasing filter for the signal being converted by  
the MCP3302/04.  
Device 2  
FIGURE 6-10:  
VDD traces arranged in a  
‘Star’ configuration in order to reduce errors  
caused by current return paths.  
DS21697C-page 20  
© 2007 Microchip Technology Inc.  
MCP3302/04  
6.7  
Utilizing the Digital and Analog  
Ground Pins  
The MCP3302/04 devices provide both digital and ana-  
log ground connections to provide another means of  
noise reduction. As shown in Figure 6-11, the analog  
and digital circuitry are separated internal to the device.  
This reduces noise from the digital portion of the device  
being coupled into the analog portion of the device. The  
two grounds are connected internally through the sub-  
strate which has a resistance of 5 -10 Ω.  
If no ground plane is utilized, then both grounds must  
be connected to VSS on the board. If a ground plane is  
available, both digital and analog ground pins should  
be connected to the analog ground plane. If both an  
analog and a digital ground plane are available, both  
the digital and the analog ground pins should be con-  
nected to the analog ground plane, as shown in  
Figure 6-11. Following these steps will reduce the  
amount of digital noise from the rest of the board being  
coupled into the A/D Converter.  
V
DD  
MCP3302/04  
Analog Side  
Digital Side  
-Sample Cap  
-Capacitor Array  
-Comparator  
-SPI Interface  
-Shift Register  
-Control Logic  
Substrate  
5 - 10  
Ω
DGND  
AGND  
0.1 µF  
Analog Ground Plane  
FIGURE 6-11:  
Separation of Analog and  
Digital Ground Pins.  
© 2007 Microchip Technology Inc.  
DS21697C-page 21  
MCP3302/04  
TABLE 7-1:  
BINARY TWO’S  
COMPLEMENT OUTPUT  
CODE EXAMPLES.  
7.0  
7.1  
SERIAL COMMUNICATIONS  
Output Code Format  
Sign  
Bit  
Decimal  
DATA  
The output code format is a binary two’s complement  
scheme, with a leading sign bit that indicates the sign  
of the output. If the IN+ input is higher than the IN-  
input, the sign bit will be a zero. If the IN- input is higher,  
the sign bit will be a ‘1’.  
Analog Input Levels  
Binary Data  
Full Scale Positive  
(IN+)-(IN-)=VREF-1 LSB  
0
0
0
0
0
1
1
1
1111 1111 1111  
1111 1111 1110  
0000 0000 0010  
0000 0000 0001  
0000 0000 0000  
1111 1111 1111  
1111 1111 1110  
0000 0000 0001  
+4095  
+4094  
+2  
(IN+)-(IN-) = VREF-2 LSB  
IN+ = (IN-) +2 LSB  
IN+ = (IN-) +1 LSB  
IN+ = IN-  
The diagram shown in Figure 7-1 shows the output  
code transfer function. In this diagram, the horizontal  
axis is the analog input voltage and the vertical axis is  
the output code of the ADC. It shows that when IN+ is  
equal to IN-, both the sign bit and the data word is zero.  
As IN+ gets larger with respect to IN-, the sign bit is a  
zero and the data word gets larger. The full scale output  
code is reached at +4095 when the input [(IN+) - (IN-)]  
reaches VREF - 1 LSB. When IN- is larger than IN+, the  
two’s complement output codes will be seen with the  
sign bit being a one. Some examples of analog input  
levels and corresponding output codes are shown in  
Table 7-1.  
+1  
0
IN+ = (IN-) - 1 LSB  
IN+ = (IN-) - 2 LSB  
(IN+)-(IN-) = VREF-2 LSB  
-1  
-2  
-4095  
Full Scale Negative  
(IN+)-(IN-) = VREF-1 LSB  
1
0000 0000 0000  
-4096  
Output  
Code  
Positive Full  
Scale Output = VREF -1 LSB  
0 + 1111 1111 1111 (+4095)  
0 + 1111 1111 1110 (+4094)  
0 + 0000 0000 0011 (+3)  
0 + 0000 0000 0010 (+2)  
0 + 0000 0000 0001 (+1)  
Analog Input  
IN+ > IN-  
0 + 0000 0000 0000 (0)  
Voltage  
IN+ - IN-  
IN+ < IN-  
1 + 1111 1111 1111 (-1)  
1 + 1111 1111 1110 (-2)  
-VREF  
VREF  
1 + 1111 1111 1101 (-3)  
1 + 0000 0000 0001 (-4095)  
1 + 0000 0000 0000 (-4096)  
Negative Full  
Scale Output = -VREF  
FIGURE 7-1:  
Output Code Transfer Function.  
DS21697C-page 22  
© 2007 Microchip Technology Inc.  
MCP3302/04  
TABLE 7-2:  
CONFIGURATION BITS FOR  
THE MCP3302  
7.2  
Communicating with the MCP3302  
and MCP3304  
Control Bit  
Selections  
Communication with the MCP3302/04 devices is done  
using a standard SPI-compatible serial interface. Initi-  
ating communication with either device is done by  
bringing the CS line low (see Figure 7-2). If the device  
was powered up with the CS pin low, it must be brought  
high and back low to initiate communication. The first  
clock received with CS low and DIN high will constitute  
a start bit. The SGL/DIFF bit follows the start bit and will  
determine if the conversion will be done using single  
ended or differential input mode. Each channel in  
single ended mode will operate as a 12-bit converter  
with a unipolar output. No negative codes will be output  
in single ended mode. The next three bits (D0, D1 and  
D2) are used to select the input channel configuration.  
Table 7-2 and Table 7-3 show the configuration bits for  
the MCP3302 and MCP3304, respectively. The device  
will begin to sample the analog input on the fourth rising  
edge of the clock after the start bit has been received.  
The sample period will end on the falling edge of the  
fifth clock following the start bit.  
Input  
Channel  
Configuration Selection  
Single  
D2* D1 D0  
/Diff  
1
1
1
1
0
X
X
X
X
X
0
0
1
1
0
0
1
0
1
0
single ended  
single ended  
single ended  
single ended  
differential  
CH0  
CH1  
CH2  
CH3  
CH0 = IN+  
CH1 = IN-  
0
0
0
X
X
X
0
1
1
1
0
1
differential  
differential  
differential  
CH0 = IN-  
CH1 = IN+  
CH2 = IN+  
CH3 = IN-  
CH2 = IN-  
CH3 = IN+  
*D2 is don’t care for MCP3302  
After the D0 bit is input, one more clock is required to  
complete the sample and hold period (DIN is a “don’t  
care” for this clock). On the falling edge of the next  
clock, the device will output a low null bit. The next 13  
clocks will output the result of the conversion with the  
sign bit first, followed by the 12 remaining data bits, as  
shown in Figure 7-2. Note that if the device is operating  
in the single ended mode, the sign bit will always be  
transmitted as a ‘0’. Data is always output from the  
device on the falling edge of the clock. If all 13 data bits  
have been transmitted, and the device continues to  
receive clocks while the CS is held low, the device will  
output the conversion result, LSB, first, as shown in  
Figure 7-3. If more clocks are provided to the device  
while CS is still low (after the LSB first data has been  
transmitted), the device will clock out zeros indefinitely.  
TABLE 7-3:  
CONFIGURATION BITS FOR  
THE MCP3304  
Control Bit  
Selections  
Input  
Channel  
Configuration Selection  
SinglE  
/Diff  
D2 D1 D0  
1
1
1
1
1
1
1
1
0
0
0
0
0
1
1
1
1
0
0
0
1
1
0
0
1
1
0
0
1
0
1
0
1
0
1
0
single ended  
single ended  
single ended  
single ended  
single ended  
single ended  
single ended  
single ended  
differential  
CH0  
CH1  
CH2  
CH3  
CH4  
CH5  
CH6  
CH7  
If necessary, it is possible to bring CS low and clock in  
leading zeros on the DIN line before the start bit. This is  
often done when dealing with microcontroller-based  
SPI ports that must send 8 bits at a time. Refer to  
Section 7.3 for more details on using the MCP3302/04  
devices with hardware SPI ports  
CH0 = IN+  
CH1 = IN-  
0
0
0
0
0
0
0
0
0
0
1
1
1
1
0
1
1
0
0
1
1
1
0
1
0
1
0
1
differential  
differential  
differential  
differential  
differential  
differential  
differential  
CH0 = IN-  
CH1 = IN+  
CH2 = IN+  
CH3 = IN-  
CH2 = IN-  
CH3 = IN+  
CH4 = IN+  
CH5 = IN-  
CH4 = IN-  
CH5 = IN+  
CH6 = IN+  
CH7 = IN-  
CH6 = IN-  
CH7 = IN+  
© 2007 Microchip Technology Inc.  
DS21697C-page 23  
MCP3302/04  
T
SAMPLE  
T
SAMPLE  
T
CSH  
CS  
T
SUCS  
CLK  
SGL/  
DIFF  
SGL/  
DIFF  
Don’t Care  
Start  
Start  
D2 D1 D0  
D2  
D
D
IN  
HI-Z  
HI-Z  
Null  
Bit  
SB† B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 *  
OUT  
T
CONV  
T
ACQ  
T
**  
DATA  
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output LSB  
first data, followed by zeros indefinitely. See Figure 7-3 below.  
** TDATA: during this time, the bias current and the comparator power down while the reference input becomes  
a high impedance node, leaving the CLK running to clock out the LSB-first data or zeros.  
When operating in single ended mode, the sign bit will always be transmitted as a ‘0’.  
FIGURE 7-2:  
Communication with MCP3302/04 (MSB first Format).  
T
SAMPLE  
T
CSH  
CS  
T
SUCS  
Power Down  
CLK  
Start  
D
D2 D1 D0  
Don’t Care  
IN  
SGL/  
DIFF  
HI-Z  
Null  
Bit  
HI-Z  
SB† B11 B10 B9 B8 B7 B6 B5 B4 B3 B2 B1 B0 B1 B2 B3 B4 B5 B6 B7 B8 B9 B10 B11 SB*  
D
OUT  
(MSB)  
T
T
**  
DATA  
T
CONV  
ACQ  
* After completing the data transfer, if further clocks are applied with CS low, the A/D Converter will output zeros  
indefinitely.  
** TDATA: During this time, the bias circuit and the comparator power down while the reference input becomes  
a high impedance node, leaving the CLK running to clock out LSB first data or zeroes.  
When operating in single ended mode, the sign bit will always be transmitted as a ‘0’.  
FIGURE 7-3:  
Communication with MCP3302/04 (LSB first Format).  
DS21697C-page 24  
© 2007 Microchip Technology Inc.  
MCP3302/04  
7.3  
Using the MCP3302/04 with  
Microcontroller (MCU) SPI Ports  
With most microcontroller SPI ports, it is required to  
send groups of eight bits. It is also required that the  
microcontroller SPI port be configured to clock out data  
on the falling edge of clock and latch data in on the ris-  
ing edge. Because communication with the MCP3302  
and MCP3304 devices may not need multiples of eight  
clocks, it will be necessary to provide more clocks than  
are required. This is usually done by sending ‘leading  
zeros’ before the start bit. For example, Figure 7-4 and  
Figure 7-5 show how the MCP3302/04 devices can be  
interfaced to a MCU with a hardware SPI port.  
Figure 7-4 depicts the operation shown in SPI Mode  
0,0, which requires that the SCLK from the MCU idles  
in the ‘low’ state, while Figure 7-5 shows the similar  
case of SPI Mode 1,1, where the clock idles in the ‘high’  
state.  
As shown in Figure 7-4, the first byte transmitted to the  
A/D Converter contains 6 leading zeros before the start  
bit. Arranging the leading zeros this way produces the  
13 data bits to fall in positions easily manipulated by the  
MCU. The sign bit is clocked out of the A/D Converter  
on the falling edge of clock number 11, followed by the  
remaining data bits (MSB first). After the second eight  
clocks have been sent to the device, the MCU receive  
buffer will contain 2 unknown bits (the output is at high  
impedance for the first two clocks), the null bit, the sign  
bit and the 4 highest order bits of the conversion. After  
the third byte has been sent to the device, the receive  
register will contain the lowest order eight bits of the  
conversion results. Easier manipulation of the con-  
verted data can be obtained by using this method.  
Figure 7-5 shows the same situation in SPI Mode 1,1,  
which requires that the clock idles in the high state. As  
with mode 0,0, the A/D Converter outputs data on the  
falling edge of the clock and the MCU latches data from  
the A/D Converter in on the rising edge of the clock.  
© 2007 Microchip Technology Inc.  
DS21697C-page 25  
MCP3302/04  
CS  
MCU latches data from A/D Converter  
on rising edges of SCLK  
SCLK  
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16  
17 18 19 20 21 22 23 24  
Data is clocked out of  
A/D Converter on falling edges  
SGL/  
D1  
Start  
D2  
D0  
Don’t Care  
D
DIFF  
IN  
HI-Z  
NULL  
SB B11 B10 B9 B8  
BIT  
B7  
B6 B5 B4 B3 B2 B1 B0  
D
OUT  
Start  
Bit  
MCU Transmitted Data  
(Aligned with falling  
edge of clock)  
SGL/  
DIFF  
0
0
0
0
1
D2 D1  
DO  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
MCU Received Data  
(Aligned with rising  
edge of clock)  
0
?
?
?
?
?
?
?
?
?
?
SB B11 B10 B9 B8  
B7 B6 B5 B4 B3 B2 B1 B0  
(Null)  
Data stored into MCU receive register  
after transmission of first 8 bits  
Data stored into MCU receive register  
after transmission of second 8 bits  
Data stored into MCU receive register  
after transmission of last 8 bits  
? = Unknown Bits  
X = Don’t Care Bits  
FIGURE 7-4:  
SPI Communication with the MCP3302/04 using 8-bit segments (Mode 0,0: SCLK  
idles low).  
MCU latches data from A/D Converter  
on rising edges of SCLK  
CS  
4
9
1
2
3
5
6
7
8
10 11 12 13 14 15  
16  
17 18 19 20 21 22 23  
24  
SCLK  
Data is clocked out of  
A/D Converter on falling edges  
SGL/  
DIFF  
DontCare
Start  
D2  
D1  
D0  
D
IN  
HI-Z  
NULL  
SB B11 B10 B9  
BIT  
B8  
B7 B6 B5 B4 B3 B2 B1 B0  
D
OUT  
Start  
Bit  
SGL/  
DIFF  
MCU Transmitted Data  
(Aligned with falling  
edge of clock)  
0
0
0
0
1
D2 D1  
?
DO  
X
X
X
X
X
X
X
X
X
X
X
X
X
X
X
MCU Received Data  
(Aligned with rising  
edge of clock)  
0
?
?
?
?
?
?
?
?
?
SB B11 B10 B9 B8  
B7 B6 B5 B4 B3 B2 B1 B0  
(Null)  
Data stored into MCU receive register  
after transmission of first 8 bits  
Data stored into MCU receive register  
after transmission of second 8 bits  
Data stored into MCU receive register  
after transmission of last 8 bits  
? = Unknown Bits  
X = Don’t Care Bits  
FIGURE 7-5:  
SPI Communication with the MCP3302/04 using 8-bit segments (Mode 1,1: SCLK  
idles high).  
DS21697C-page 26  
© 2007 Microchip Technology Inc.  
MCP3302/04  
8.0  
8.1  
PACKAGING INFORMATION  
Package Marking Information  
14-Lead PDIP (300 mil)  
Example:  
XXXXXXXXXXXXXX  
XXXXXXXXXXXXXX  
MCP3302-B  
I/P  
e3  
YYWWNNN  
0725NNN  
14-Lead SOIC (150 mil)  
Example:  
e
3
MCP3302-B  
XXXXXXXXXXX  
XXXXXXXXXXX  
XXXXXXXXXXX  
YYWWNNN  
0725NNN  
14-Lead TSSOP (4.4mm)  
Example:  
XXXXXXXX  
YYWW  
3302-C  
e3  
0725  
NNN  
NNN  
Legend: XX...X Customer-specific information  
Y
YY  
WW  
NNN  
Year code (last digit of calendar year)  
Year code (last 2 digits of calendar year)  
Week code (week of January 1 is week ‘01’)  
Alphanumeric traceability code  
e
3
Pb-free JEDEC designator for Matte Tin (Sn)  
*
This package is Pb-free. The Pb-free JEDEC designator (  
can be found on the outer packaging for this package.  
)
e3  
Note: In the event the full Microchip part number cannot be marked on one line, it will  
be carried over to the next line, thus limiting the number of available  
characters for customer-specific information.  
© 2007 Microchip Technology Inc.  
DS21697C-page 27  
MCP3302/04  
8.2  
Package Marking Information (Continued)  
16-Lead PDIP (300 mil) (MCP3304)  
Example:  
e
3
XXXXXXXXXXXXXX  
XXXXXXXXXXXXXX  
MCP3304-B  
I/P  
YYWWNNN  
0725NNN  
16-Lead SOIC (150 mil) (MCP3304)  
Example:  
e
3
MCP3304-B  
XXXXXXXXXXXXX  
XXXXXXXXXXXXX  
XXXXXXXXXX  
YYWWNNN  
0725NNN  
DS21697C-page 28  
© 2007 Microchip Technology Inc.  
MCP3302/04  
14-Lead Plastic Dual In-Line (P) – 300 mil Body [PDIP]  
Note: For the most current package drawings, please see the Microchip Packaging Specification located at  
http://www.microchip.com/packaging  
N
NOTE 1  
E1  
3
1
2
D
E
A2  
A
L
c
A1  
b1  
b
e
eB  
Units  
INCHES  
NOM  
14  
Dimension Limits  
MIN  
MAX  
Number of Pins  
Pitch  
N
e
.100 BSC  
Top to Seating Plane  
A
.210  
.195  
Molded Package Thickness  
Base to Seating Plane  
Shoulder to Shoulder Width  
Molded Package Width  
Overall Length  
A2  
A1  
E
.115  
.015  
.290  
.240  
.735  
.115  
.008  
.045  
.014  
.130  
.310  
.250  
.750  
.130  
.010  
.060  
.018  
.325  
.280  
.775  
.150  
.015  
.070  
.022  
.430  
E1  
D
Tip to Seating Plane  
Lead Thickness  
L
c
Upper Lead Width  
b1  
b
Lower Lead Width  
Overall Row Spacing §  
eB  
Notes:  
1. Pin 1 visual index feature may vary, but must be located with the hatched area.  
2. § Significant Characteristic.  
3. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed .010" per side.  
4. Dimensioning and tolerancing per ASME Y14.5M.  
BSC: Basic Dimension. Theoretically exact value shown without tolerances.  
Microchip Technology Drawing C04-005B  
© 2007 Microchip Technology Inc.  
DS21697C-page 29  
MCP3302/04  
14-Lead Plastic Small Outline (SL) – Narrow, 3.90 mm Body [SOIC]  
Note: For the most current package drawings, please see the Microchip Packaging Specification located at  
http://www.microchip.com/packaging  
D
N
E
E1  
NOTE 1  
1
2
3
e
h
b
α
h
c
φ
A2  
A
L
A1  
β
L1  
Units  
MILLMETERS  
Dimension Limits  
MIN  
NOM  
MAX  
Number of Pins  
Pitch  
N
e
14  
1.27 BSC  
Overall Height  
A
1.75  
Molded Package Thickness  
Standoff §  
A2  
A1  
E
1.25  
0.10  
0.25  
Overall Width  
6.00 BSC  
Molded Package Width  
Overall Length  
E1  
D
h
3.90 BSC  
8.65 BSC  
Chamfer (optional)  
Foot Length  
0.25  
0.40  
0.50  
1.27  
L
Footprint  
L1  
φ
1.04 REF  
Foot Angle  
0°  
0.17  
0.31  
5°  
8°  
Lead Thickness  
Lead Width  
c
0.25  
0.51  
15°  
b
Mold Draft Angle Top  
Mold Draft Angle Bottom  
α
β
5°  
15°  
Notes:  
1. Pin 1 visual index feature may vary, but must be located within the hatched area.  
2. § Significant Characteristic.  
3. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.15 mm per side.  
4. Dimensioning and tolerancing per ASME Y14.5M.  
BSC: Basic Dimension. Theoretically exact value shown without tolerances.  
REF: Reference Dimension, usually without tolerance, for information purposes only.  
Microchip Technology Drawing C04-065B  
DS21697C-page 30  
© 2007 Microchip Technology Inc.  
MCP3302/04  
14-Lead Plastic Thin Shrink Small Outline (ST) – 4.4 mm Body [TSSOP]  
Note: For the most current package drawings, please see the Microchip Packaging Specification located at  
http://www.microchip.com/packaging  
D
N
E
E1  
NOTE 1  
1
2
e
b
c
φ
A2  
A
A1  
L
L1  
Units  
MILLIMETERS  
Dimension Limits  
MIN  
NOM  
MAX  
Number of Pins  
Pitch  
N
e
14  
0.65 BSC  
Overall Height  
Molded Package Thickness  
Standoff  
A
1.20  
1.05  
0.15  
A2  
A1  
E
0.80  
0.05  
1.00  
Overall Width  
Molded Package Width  
Molded Package Length  
Foot Length  
6.40 BSC  
E1  
D
4.30  
4.90  
0.45  
4.40  
4.50  
5.10  
0.75  
5.00  
L
0.60  
Footprint  
L1  
φ
1.00 REF  
Foot Angle  
0°  
8°  
Lead Thickness  
Lead Width  
c
0.09  
0.19  
0.20  
0.30  
b
Notes:  
1. Pin 1 visual index feature may vary, but must be located within the hatched area.  
2. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.15 mm per side.  
3. Dimensioning and tolerancing per ASME Y14.5M.  
BSC: Basic Dimension. Theoretically exact value shown without tolerances.  
REF: Reference Dimension, usually without tolerance, for information purposes only.  
Microchip Technology Drawing C04-087B  
© 2007 Microchip Technology Inc.  
DS21697C-page 31  
MCP3302/04  
16-Lead Plastic Dual In-Line (P) – 300 mil Body [PDIP]  
Note: For the most current package drawings, please see the Microchip Packaging Specification located at  
http://www.microchip.com/packaging  
N
NOTE 1  
E1  
1
2
3
D
E
A
A2  
L
c
A1  
b1  
e
eB  
b
Units  
INCHES  
NOM  
16  
Dimension Limits  
MIN  
MAX  
Number of Pins  
Pitch  
N
e
.100 BSC  
Top to Seating Plane  
A
.210  
.195  
Molded Package Thickness  
Base to Seating Plane  
Shoulder to Shoulder Width  
Molded Package Width  
Overall Length  
A2  
A1  
E
.115  
.015  
.290  
.240  
.735  
.115  
.008  
.045  
.014  
.130  
.310  
.250  
.755  
.130  
.010  
.060  
.018  
.325  
.280  
.775  
.150  
.015  
.070  
.022  
.430  
E1  
D
Tip to Seating Plane  
Lead Thickness  
L
c
Upper Lead Width  
b1  
b
Lower Lead Width  
Overall Row Spacing §  
eB  
Notes:  
1. Pin 1 visual index feature may vary, but must be located within the hatched area.  
2. § Significant Characteristic.  
3. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed .010" per side.  
4. Dimensioning and tolerancing per ASME Y14.5M.  
BSC: Basic Dimension. Theoretically exact value shown without tolerances.  
Microchip Technology Drawing C04-017B  
DS21697C-page 32  
© 2007 Microchip Technology Inc.  
MCP3302/04  
16-Lead Plastic Small Outline (SL) – Narrow, 3.90 mm Body [SOIC]  
Note: For the most current package drawings, please see the Microchip Packaging Specification located at  
http://www.microchip.com/packaging  
D
N
E
E1  
NOTE 1  
3
1
2
e
b
h
α
h
c
φ
A2  
A
L
β
A1  
L1  
Units  
MILLMETERS  
Dimension Limits  
MIN  
NOM  
MAX  
Number of Pins  
Pitch  
N
e
16  
1.27 BSC  
Overall Height  
A
1.75  
Molded Package Thickness  
Standoff §  
A2  
A1  
E
1.25  
0.10  
0.25  
Overall Width  
6.00 BSC  
Molded Package Width  
Overall Length  
E1  
D
h
3.90 BSC  
9.90 BSC  
Chamfer (optional)  
Foot Length  
0.25  
0.40  
0.50  
1.27  
L
Footprint  
L1  
φ
1.04 REF  
Foot Angle  
0°  
0.17  
0.31  
5°  
8°  
Lead Thickness  
Lead Width  
c
0.25  
0.51  
15°  
b
Mold Draft Angle Top  
Mold Draft Angle Bottom  
α
β
5°  
15°  
Notes:  
1. Pin 1 visual index feature may vary, but must be located within the hatched area.  
2. § Significant Characteristic.  
3. Dimensions D and E1 do not include mold flash or protrusions. Mold flash or protrusions shall not exceed 0.15 mm per side.  
4. Dimensioning and tolerancing per ASME Y14.5M.  
BSC: Basic Dimension. Theoretically exact value shown without tolerances.  
REF: Reference Dimension, usually without tolerance, for information purposes only.  
Microchip Technology Drawing C04-108B  
© 2007 Microchip Technology Inc.  
DS21697C-page 33  
MCP3302/04  
NOTES:  
DS21697C-page 34  
© 2007 Microchip Technology Inc.  
MCP3302/04  
APPENDIX A: REVISION HISTORY  
Revision C (January 2007)  
This revision includes updates to the packaging  
diagrams.  
© 2007 Microchip Technology Inc.  
DS21697C-page 35  
MCP3302/04  
NOTES:  
DS21697C-page 36  
© 2007 Microchip Technology Inc.  
MCP3302/04  
PRODUCT IDENTIFICATION SYSTEM  
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.  
PART NO.  
Device  
X
X
/XX  
Examples:  
a)  
b)  
c)  
MCP3302-BI/P: ±1 LSB INL, Industrial Tem-  
perature, PDIP package  
Grade Temperature Package  
Range  
MCP3302-BI/SL: ±1 LSB INL, Industrial  
Temperature, SOIC package  
Device:  
MCP3302: 13-Bit Serial A/D Converter  
MCP3302T: 13-Bit Serial A/D Converter (Tape and Reel)  
MCP3304: 13-Bit Serial A/D Converter  
MCP3302-CI/ST: ±2 LSB INL, Industrial  
Temperature, TSSOP package  
MCP3304T: 13-Bit Serial A/D Converter (Tape and Reel)  
a)  
b)  
MCP3304-BI/P: ±1 LSB INL, Industrial  
Temperature, PDIP package  
Grade:  
B
C
=
=
±1 LSB INL  
±2 LSB INL  
MCP3304-BI/SL: ±1 LSB INL, Industrial  
Temperature, SOIC package  
Temperature Range:  
Package:  
I
=
-40°C to +85°C  
P
SL  
ST  
=
=
=
Plastic DIP (300 mil Body), 14-lead, 16-lead  
Plastic SOIC (150 mil Body), 14-lead, 16-lead  
Plastic TSSOP (4.4mm), 14-lead  
© 2007 Microchip Technology Inc.  
DS21697C-page37  
MCP3302/04  
NOTES:  
DS21697C-page 38  
© 2007 Microchip Technology Inc.  
Note the following details of the code protection feature on Microchip devices:  
Microchip products meet the specification contained in their particular Microchip Data Sheet.  
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the  
intended manner and under normal conditions.  
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our  
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data  
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.  
Microchip is willing to work with the customer who is concerned about the integrity of their code.  
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not  
mean that we are guaranteeing the product as “unbreakable.”  
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our  
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts  
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.  
Information contained in this publication regarding device  
applications and the like is provided only for your convenience  
and may be superseded by updates. It is your responsibility to  
ensure that your application meets with your specifications.  
MICROCHIP MAKES NO REPRESENTATIONS OR  
WARRANTIES OF ANY KIND WHETHER EXPRESS OR  
IMPLIED, WRITTEN OR ORAL, STATUTORY OR  
OTHERWISE, RELATED TO THE INFORMATION,  
INCLUDING BUT NOT LIMITED TO ITS CONDITION,  
QUALITY, PERFORMANCE, MERCHANTABILITY OR  
FITNESS FOR PURPOSE. Microchip disclaims all liability  
arising from this information and its use. Use of Microchip  
devices in life support and/or safety applications is entirely at  
the buyer’s risk, and the buyer agrees to defend, indemnify and  
hold harmless Microchip from any and all damages, claims,  
suits, or expenses resulting from such use. No licenses are  
conveyed, implicitly or otherwise, under any Microchip  
intellectual property rights.  
Trademarks  
The Microchip name and logo, the Microchip logo, Accuron,  
dsPIC, KEELOQ, microID, MPLAB, PIC, PICmicro, PICSTART,  
PRO MATE, PowerSmart, rfPIC, and SmartShunt are  
registered trademarks of Microchip Technology Incorporated  
in the U.S.A. and other countries.  
AmpLab, FilterLab, Migratable Memory, MXDEV, MXLAB,  
SEEVAL, SmartSensor and The Embedded Control Solutions  
Company are registered trademarks of Microchip Technology  
Incorporated in the U.S.A.  
Analog-for-the-Digital Age, Application Maestro, CodeGuard,  
dsPICDEM, dsPICDEM.net, dsPICworks, ECAN,  
ECONOMONITOR, FanSense, FlexROM, fuzzyLAB,  
In-Circuit Serial Programming, ICSP, ICEPIC, Linear Active  
Thermistor, Mindi, MiWi, MPASM, MPLIB, MPLINK, PICkit,  
PICDEM, PICDEM.net, PICLAB, PICtail, PowerCal,  
PowerInfo, PowerMate, PowerTool, REAL ICE, rfLAB,  
rfPICDEM, Select Mode, Smart Serial, SmartTel, Total  
Endurance, UNI/O, WiperLock and ZENA are trademarks of  
Microchip Technology Incorporated in the U.S.A. and other  
countries.  
SQTP is a service mark of Microchip Technology Incorporated  
in the U.S.A.  
All other trademarks mentioned herein are property of their  
respective companies.  
© 2007, Microchip Technology Incorporated, Printed in the  
U.S.A., All Rights Reserved.  
Printed on recycled paper.  
Microchip received ISO/TS-16949:2002 certification for its worldwide  
headquarters, design and wafer fabrication facilities in Chandler and  
Tempe, Arizona, Gresham, Oregon and Mountain View, California. The  
Company’s quality system processes and procedures are for its PIC®  
MCUs and dsPIC DSCs, KEELOQ® code hopping devices, Serial  
EEPROMs, microperipherals, nonvolatile memory and analog  
products. In addition, Microchip’s quality system for the design and  
manufacture of development systems is ISO 9001:2000 certified.  
© 2007 Microchip Technology Inc.  
DS21697C-page 39  
WORLDWIDE SALES AND SERVICE  
AMERICAS  
ASIA/PACIFIC  
ASIA/PACIFIC  
EUROPE  
Corporate Office  
Asia Pacific Office  
Suites 3707-14, 37th Floor  
Tower 6, The Gateway  
Habour City, Kowloon  
Hong Kong  
Tel: 852-2401-1200  
Fax: 852-2401-3431  
India - Bangalore  
Tel: 91-80-4182-8400  
Fax: 91-80-4182-8422  
Austria - Wels  
Tel: 43-7242-2244-39  
Fax: 43-7242-2244-393  
2355 West Chandler Blvd.  
Chandler, AZ 85224-6199  
Tel: 480-792-7200  
Fax: 480-792-7277  
Technical Support:  
http://support.microchip.com  
Web Address:  
www.microchip.com  
Denmark - Copenhagen  
Tel: 45-4450-2828  
Fax: 45-4485-2829  
India - New Delhi  
Tel: 91-11-4160-8631  
Fax: 91-11-4160-8632  
France - Paris  
Tel: 33-1-69-53-63-20  
Fax: 33-1-69-30-90-79  
India - Pune  
Tel: 91-20-2566-1512  
Fax: 91-20-2566-1513  
Australia - Sydney  
Tel: 61-2-9868-6733  
Fax: 61-2-9868-6755  
Atlanta  
Duluth, GA  
Tel: 678-957-9614  
Fax: 678-957-1455  
Germany - Munich  
Tel: 49-89-627-144-0  
Fax: 49-89-627-144-44  
Japan - Yokohama  
Tel: 81-45-471- 6166  
Fax: 81-45-471-6122  
China - Beijing  
Tel: 86-10-8528-2100  
Fax: 86-10-8528-2104  
Italy - Milan  
Tel: 39-0331-742611  
Fax: 39-0331-466781  
Korea - Gumi  
Tel: 82-54-473-4301  
Fax: 82-54-473-4302  
Boston  
China - Chengdu  
Tel: 86-28-8665-5511  
Fax: 86-28-8665-7889  
Westborough, MA  
Tel: 774-760-0087  
Fax: 774-760-0088  
Netherlands - Drunen  
Tel: 31-416-690399  
Fax: 31-416-690340  
Korea - Seoul  
China - Fuzhou  
Tel: 86-591-8750-3506  
Fax: 86-591-8750-3521  
Tel: 82-2-554-7200  
Fax: 82-2-558-5932 or  
82-2-558-5934  
Chicago  
Itasca, IL  
Tel: 630-285-0071  
Fax: 630-285-0075  
Spain - Madrid  
Tel: 34-91-708-08-90  
Fax: 34-91-708-08-91  
China - Hong Kong SAR  
Tel: 852-2401-1200  
Fax: 852-2401-3431  
Malaysia - Penang  
Tel: 60-4-646-8870  
Fax: 60-4-646-5086  
Dallas  
Addison, TX  
Tel: 972-818-7423  
Fax: 972-818-2924  
UK - Wokingham  
Tel: 44-118-921-5869  
Fax: 44-118-921-5820  
China - Qingdao  
Tel: 86-532-8502-7355  
Fax: 86-532-8502-7205  
Philippines - Manila  
Tel: 63-2-634-9065  
Fax: 63-2-634-9069  
Detroit  
Farmington Hills, MI  
Tel: 248-538-2250  
Fax: 248-538-2260  
China - Shanghai  
Tel: 86-21-5407-5533  
Fax: 86-21-5407-5066  
Singapore  
Tel: 65-6334-8870  
Fax: 65-6334-8850  
Kokomo  
Kokomo, IN  
Tel: 765-864-8360  
Fax: 765-864-8387  
China - Shenyang  
Tel: 86-24-2334-2829  
Fax: 86-24-2334-2393  
Taiwan - Hsin Chu  
Tel: 886-3-572-9526  
Fax: 886-3-572-6459  
China - Shenzhen  
Tel: 86-755-8203-2660  
Fax: 86-755-8203-1760  
Taiwan - Kaohsiung  
Tel: 886-7-536-4818  
Fax: 886-7-536-4803  
Los Angeles  
Mission Viejo, CA  
Tel: 949-462-9523  
Fax: 949-462-9608  
China - Shunde  
Tel: 86-757-2839-5507  
Fax: 86-757-2839-5571  
Taiwan - Taipei  
Tel: 886-2-2500-6610  
Fax: 886-2-2508-0102  
Santa Clara  
Santa Clara, CA  
Tel: 408-961-6444  
Fax: 408-961-6445  
China - Wuhan  
Tel: 86-27-5980-5300  
Fax: 86-27-5980-5118  
Thailand - Bangkok  
Tel: 66-2-694-1351  
Fax: 66-2-694-1350  
Toronto  
Mississauga, Ontario,  
Canada  
Tel: 905-673-0699  
Fax: 905-673-6509  
China - Xian  
Tel: 86-29-8833-7250  
Fax: 86-29-8833-7256  
12/08/06  
DS21697C-page 40  
© 2007 Microchip Technology Inc.  

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