HAL401 [MICRONAS]
Linear Hall-Effect Sensor IC; 线性霍尔效应传感器IC型号: | HAL401 |
厂家: | MICRONAS |
描述: | Linear Hall-Effect Sensor IC |
文件: | 总20页 (文件大小:1349K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Hardware
Documentation
Data Sheet
HAL® 401
Linear Hall-Effect Sensor IC
Edition Dec. 8, 2008
DSH000018_002EN
HAL401
DATA SHEET
Copyright, Warranty, and Limitation of Liability
Micronas Trademarks
– HAL
Theinformationanddatacontainedinthisdocumentare
believed to be accurate and reliable. The software and
proprietary information contained therein may be pro-
tectedbycopyright, patent, trademarkand/orotherintel-
lectual property rights of Micronas. All rights not ex-
pressly granted remain reserved by Micronas.
Micronas Patents
ChopperedOffsetCompensationprotectedbyMicronas
patents no. US5260614A, US5406202A, EP052523B1,
and EP0548391B1.
Micronas assumes no liability for errors and gives no
warrantyrepresentationorguaranteeregardingthesuit-
ability of its products for any particular purpose due to
these specifications.
Third-Party Trademarks
All other brand and product names or company names
may be trademarks of their respective companies.
Bythispublication, Micronasdoesnotassumeresponsi-
bility for patent infringements or other rights of third par-
ties which may result from its use. Commercial condi-
tions, product availability and delivery are exclusively
subject to the respective order confirmation.
Any information and data which may be provided in the
document can and do vary in different applications, and
actual performance may vary over time.
Alloperatingparametersmustbevalidatedforeachcus-
tomer application by customers technical experts. Any
new issue of this document invalidates previous issues.
Micronas reserves the right to review this document and
to make changes to the documents content at any time
without obligation to notify any person or entity of such
revision or changes. For further advice please contact
us directly.
Do not use our products in life-supporting systems, avi-
ation and aerospace applications! Unless explicitly
agreed to otherwise in writing between the parties, Mi-
cronas products are not designed, intended or autho-
rizedforuseascomponentsinsystemsintendedforsur-
gical implants into the body, or other applications
intended to support or sustain life, or for any other ap-
plication in which the failure of the product could create
a situation where personal injury or death could occur.
No part of this publication may be reproduced, photoco-
pied, stored on a retrieval system or transmitted without
the express written consent of Micronas.
2
Micronas
DATA SHEET
HAL401
Contents
Page
Section
Title
4
4
4
4
4
5
1.
Introduction
1.1.
1.2.
1.3.
1.4.
1.5.
Features
Marking Code
Operating Junction Temperature Range
Hall Sensor Package Codes
Solderability and Welding
6
2.
Functional Description
7
3.
Specifications
7
3.1.
3.2.
3.3.
3.4.
3.4.1.
3.5.
3.6.
Outline Dimensions
8
Dimensions of Sensitive Area
Positions of Sensitive Area
Absolute Maximum Ratings
Storage and Shelf Life
Recommended Operating Conditions
Characteristics
8
8
8
9
10
18
18
18
18
4.
Application Notes
Ambient Temperature
EMC and ESD
4.1.
4.2.
4.3.
Application Circuit
20
5.
Data Sheet History
Micronas
3
HAL401
DATA SHEET
Linear Hall Effect Sensor IC
in CMOS technology
1.2. Marking Code
Type
Temperature Range
Release Notes: Revision bars indicate significant
changes to the previous edition.
A
K
HAL401
401A
401K
1. Introduction
The HAL401 is a Linear Hall Effect Sensors produced in
CMOS technology. The sensor includes a temperature-
compensated Hall plate with choppered offset com-
pensation, two linear output stages, and protection de-
vices (see Fig. 2–1).
1.3. Operating Junction Temperature Range
The Hall sensors from Micronas are specified to the chip
temperature (junction temperature T ).
J
The output voltage is proportional to the magnetic flux
density through the hall plate. The choppered offset
compensation leads to stable magnetic characteristics
over supply voltage and temperature.
A: T = –40 °C to +170 °C
J
K: T = –40 °C to +140 °C
J
The HAL401 can be used for magnetic field measure-
ments, current measurements, and detection of any me-
chanical movement. Very accurate angle measure-
ments or distance measurements can also be done. The
sensor is very robust and can be used in electrical and
mechanical hostile environments.
Note: Due to power dissipation, there is a difference be-
tween the ambient temperature (T ) and junction
A
temperature. Please refer to section 4.1. on page
18 for details.
1.4. Hall Sensor Package Codes
The sensor is designed for industrial and automotive ap-
plications and operates in the ambient temperature
range from –40 °C up to 150 °C and is available in the
SMD-package SOT89B-1.
HALXXXPA-T
Temperature Range: A or K
Package: SF for SOT89B-1
Type: 401
1.1. Features:
– switching offset compensation at 147 kHz
– low magnetic offset
Example: HAL401SF-K
→ Type: 401
→ Package: SOT89B-1
– extremely sensitive
→ Temperature Range: T = –40 °C to +140 °C
J
– operates from 4.8 to 12 V supply voltage
Hall sensors are available in a wide variety of packaging
versions and quantities. For more detailed information,
please refer to the brochure: “Hall Sensors: Ordering
Codes, Packaging, Handling”.
– wide temperature range T = –40 °C to +150 °C
A
– overvoltage protection
– reverse voltage protection of V -pin
DD
– differential output
– accurate absolute measurements of DC and low fre-
quency magnetic fields
– on-chip temperature compensation
4
Micronas
DATA SHEET
HAL401
1.5. Solderability and Welding
Soldering
During soldering reflow processing and manual rework-
ing, acomponentbodytemperatureof260°Cshouldnot
be exceeded.
Welding
Deviceterminalsshouldbecompatiblewithlaserandre-
sistance welding. Please note that the success of the
welding process is subject to different welding parame-
ters which will vary according to the welding technique
used. A very close control of the welding parameters is
absolutely necessary in order to reach satisfying results.
Micronas, therefore, does not give any implied or ex-
press warranty as to the ability to weld the component.
V
DD
1
2
3
OUT1
OUT2
4
GND
Fig. 1–1: Pin configuration
Micronas
5
HAL401
DATA SHEET
2. Functional Description
External filtering or integrating measurement can be
done to eliminate the AC component of the signal. Re-
sultingly, the influence of mechanical stress and temper-
ature cycling is suppressed. No adjustment of magnetic
offset is needed.
GND
4
Chopper
Oscillator
The sensitivity is stabilized over a wide range of temper-
ature and supply voltage due to internal voltage regula-
tion and circuits for temperature compensation.
Temp.
Dependent
Bias
Offset
Compensation;
Hallplate
Switching
Matrix
Offset Compensation (see Fig. 2–2)
The Hall Offset Voltage is the residual voltage measured
in absence of a magnetic field (zero-field residual volt-
age). This voltage is caused by mechanical stress and
can be modeled by a displacement of the connections
for voltage measurement and/or current supply.
Protection
Device
V
OUT1
2
OUT2
3
DD
1
Compensation of this kind of offset is done by cyclic
commutating the connections for current flow and volt-
age measurement.
Fig. 2–1: Block diagram of the HAL401 (top view)
– First cycle:
The Linear Hall Sensor measures constant and low fre-
quency magnetic flux densities accurately. The differen-
The hall supply current flows between points 4 and 2.
In the absence of a magnetic field, V is the Hall Off-
set Voltage (+V ). In case of a magnetic field, V is
the sum of the Hall voltage (V ) and V
13
tial output voltage V
(difference of the voltages on
OUTDIF
Offs
13
pin2andpin3)isproportionaltothemagneticfluxdensi-
ty passing vertically through the sensitive area of the
.
H
Offs
V
13
= V + V
H Offs
chip. The common mode voltage V
(average of the
CM
– Second cycle:
The hall supply current flows between points 1 and 3.
voltages on pin 2 and pin 3) of the differential output am-
plifier is a constant 2.2 V.
In the absence of a magnetic field, V is the Hall Off-
24
set Voltage with negative polarity (–V ). In case of
The differential output voltage consists of two compo-
nents due to the switching offset compensation tech-
nique. The average of the differential output voltage rep-
resents the magnetic flux density. This component is
overlaid by a differential AC signal at a typical frequency
of 147 kHz. The AC signal represents the internal offset
voltages of amplifiers and hall plates that are influenced
by mechanical stress and temperature cycling.
Offs
a magnetic field, V is the difference of the Hall volt-
24
age (V ) and V
.
H
Offs
= V – V
H Offs
V
24
In the first cycle, the output shows the sum of the Hall
voltage and the offset; in the second, the difference of
both. The difference of the mean values of V
and
OUT1
V
(V
) is equivalent to V
.
OUT2
OUTDIF
Hall
V
for Bu0 mT
V
OUT1
Note: The numbers do not
represent pin numbers.
I
C
1
V
OUTDIF/2
V
CM
2
1
V
V
Offs
OUTDIF
4
V
V
OUTAC
OUTDIF/2
V
Offs
I
C
2
3
4
V
OUT2
1/f = 6.7 μs
CH
3
V
V
t
a) Offset Voltage
Fig. 2–2: Hall Offset Compensation
b) Switched Current Supply
c) Output Voltage
6
Micronas
DATA SHEET
HAL401
3. Specifications
3.1. Outline Dimensions
Fig. 3–1:
SOT89B-1: Plastic Small Outline Transistor package, 4 leads
Weight approximately 0.034 g
Micronas
7
HAL401
DATA SHEET
3.2. Dimensions of Sensitive Area
0.37 mm x 0.17 mm
3.3. Position of Sensitive Area
SOT89B-1
y
0.95 mm nominal
3.4. Absolute Maximum Ratings
Stresses beyond those listed in the “Absolute Maximum Ratings” may cause permanent damage to the device. This
is a stress rating only. Functional operation of the device at these conditions is not implied. Exposure to absolute maxi-
mum rating conditions for extended periods will affect device reliability.
This device contains circuitry to protect the inputs and outputs against damage due to high static voltages or electric
fields; however, it is advised that normal precautions be taken to avoid application of any voltage higher than absolute
maximum-rated voltages to this circuit.
All voltages listed are referenced to ground (GND).
Symbol
Parameter
Pin No.
1
Min.
–12
–0.3
–5
Max.
12
Unit
V
V
DD
V
O
Supply Voltage
Output Voltage
2, 3
2, 3
12
V
I
O
Continuous Output Current
Junction Temperature Range
Ambient Temperature
5
mA
°C
T
–40
170
J
T
A
at V = 5 V
–
–
150
125
°C
°C
DD
at V = 12 V
DD
3.4.1. Storage and Shelf Life
The permissible storage time (shelf life) of the sensors is unlimited, provided the sensors are stored at a maximum of
30 °C and a maximum of 85% relative humidity. At these conditions, no Dry Pack is required.
Solderability is guaranteed for one year from the date code on the package.
8
Micronas
DATA SHEET
HAL401
3.5. Recommended Operating Conditions
Functional operation of the device beyond those indicated in the “Recommended Operating Conditions” of this specifi-
cation is not implied, may result in unpredictable behavior of the device and may reduce reliability and lifetime.
All voltages listed are referenced to ground (GND).
Symbol
Parameter
Pin No.
2, 3
2, 3
2, 3
1
Min.
–2.25
–1
Max.
2.25
1
Unit
mA
mA
nF
Remarks
T = 25 °C
I
O
I
O
Continuous Output Current
Continuous Output Current
Load Capacitance
J
T = 170 °C
J
C
–
1
L
V
DD
Supply Voltage
4.8
12
V
see Fig. 3–2
B
Magnetic Field Range
–50
50
mT
V
DD
power dissipation limit
12 V
11.5 V
8.0 V
6.8 V
4.8 V
4.5 V
min. V
DD
for specified
sensitivity
–40 °C
150 °C T
A
25 °C
125 °C
Fig. 3–2: Recommended Operating Supply Voltage
Micronas
9
HAL401
DATA SHEET
3.6. Characteristics at T = –40 °C to +170 °C , V = 4.8 V to 12 V, GND = 0 V
J
DD
at Recommended Operation Conditions (Fig. 3–2 for T and V ) as not otherwise specified in the column“Conditions”.
A
DD
Typical characteristics for T = 25 °C, V = 6.8 V and –50 mT < B < 50 mT
J
DD
Symbol
Parameter
Pin No.
Min.
11
Typ.
14.5
14.5
Max.
17.1
18.5
Unit
mA
mA
Conditions
T = 25 °C, I
I
I
Supply Current
1
1
= 0 mA
OUT1,2
DD
DD
J
Supply Current over
Temperature Range
9
I
I
I
= 0 mA
OUT1,2
OUT1,2
OUT1,2
V
CM
Common Mode Output Voltage
2, 3
2, 3
2.1
2.2
0
2.3
2.5
V
= 0 mA,
= 0 mA,
V
CM
= (V
+ V
) / 2
OUT1
OUT2
CMRR
Common Mode Rejection Ratio
–2.5
mV/V
CMRR is limited by the influ-
ence of power dissipation.
S
Differential Magnetic Sensitivity
2–3
2–3
2–3
42
48.5
46.5
–0.2
0
55
55
1.5
25
mV/mT
mV/mT
mT
–50 mT < B < 50 mT
T = 25 °C
J
B
S
B
Differential Magnetic Sensitivity
over Temperature Range
37.5
–1.5
–25
–50 mT < B < 50 mT
B
Magnetic Offset
over Temperature
B = 0 mT, I
B = 0 mT, I
= 0 mA
offset
OUT1,2
ΔB
ΔT
/
Magnetic Offset Change
Bandwidth (–3 dB)
μT/K
= 0 mA
OFFSET
OUT1,2
1)
BW
2–3
2–3
–
–
10
–
2
kHz
%
without external Filter
NL
Non-Linearity
0.5
–50 mT < B < 50 mT
dif
of Differential Output
NL
Non-Linearity
2, 3
–
2
–
%
single
of Single Ended Output
f
Chopper Frequency over Temp.
2, 3
2, 3
–
–
147
0.6
–
kHz
V
CH
V
Peak-to-Peak
1.3
OUTACpp
AC Output Voltage
n
Magnetic RMS Differential
Broadband Noise
2–3
2–3
2–3
2, 3
2, 3
–
–
–
–
–
–
10
–
μT
Hz
Hz
Ω
BW = 10 Hz to 10 kHz
B = 0 mT
meff
f
f
Corner Frequency
of 1/f Noise
10
–
Cflicker
Corner Frequency
of 1/f Noise
100
30
–
B = 50 mT
Cflicker
R
R
R
Output Impedance
50
150
200
I
v
2.5 mA,
OUT
OUT
thJSB
OUT1,2
T = 25 °C, V = 6.8 V
J
DD
Output Impedance
over Temperature
30
Ω
I
v
2.5 mA
OUT1,2
Thermal Resistance Junction to
Substrate Backside
150
K/W
Fiberglass Substrate
30 mm x 10 mm x 1.5 mm
pad size (see Fig. 3–3)
case
SOT89B-1
1)
with external 2 pole filter (f
= 5 kHz), V
is reduced to less than 1 mV by limiting the bandwith
OUTAC
3db
10
Micronas
DATA SHEET
HAL401
1.80
1.05
1.45
2.90
1.05
0.50
1.50
Fig. 3–3: Recommended footprint SOT89B,
Dimensions in mm
Note: All dimensions are for reference only. The pad
size may vary depending on the requirements of
the soldering process.
Micronas
11
HAL401
DATA SHEET
V
5
V
0.05
T
A
= 25 °C
B = 0 mT
T = –40 °C
V
= 6.8 V
0.04
0.03
0.02
0.01
0.00
DD
V
OUT1
V
OUT2
A
V
OFFS
4
3
2
1
0
T = 25 °C
A
V
OUT1
V
OUT2
T = 125 °C
A
T = 150 °C
A
–0.01
–0.02
–0.03
–0.04
–0.05
–150 –100 –50
0
50
100 150
2
4
6
8
10
12
14 V
mT
B
V
DD
Fig. 3–4: Typical output voltages
Fig. 3–6: Typical differential output offset
versus magnetic flux density
voltage versus supply voltage
mT
2.0
mT
2.0
B = 0 mT
T = –40 °C
B = 0 mT
1.5
1.0
1.5
A
B
OFFS
B
OFFS
V
DD
V
DD
V
DD
= 4.8 V
= 6.0 V
= 12 V
T = 25 °C
A
1.0
0.5
T = 125 °C
A
T = 150 °C
A
0.5
0.0
0.0
–0.5
–1.0
–1.5
–2
–0.5
–1.0
–1.5
–2
2
4
6
8
10
12
14 V
–50 –25
0
25 50 75 100 125 150 °C
V
DD
T
A
Fig. 3–5: Typical magnetic offset of
differential output versus supply voltage
Fig. 3–7: Typical magnetic offset of differential
output versus ambient temperature
12
Micronas
DATA SHEET
HAL401
mV/mT
60
mV/mT
60
B = ±50 mT
B = ±50 mT
55
55
S
B
S
B
50
45
40
35
30
25
20
15
50
45
40
35
30
25
20
15
T = –40 °C
A
V
DD
V
DD
V
DD
= 4.8 V
T = 25 °C
A
= 6.0 V
= 12 V
T = 125 °C
A
T = 150 °C
A
2
4
6
8
10
12
14 V
–50 –25
0
25 50 75 100 125 150 °C
V
DD
T
A
Fig. 3–8: Typical differential magnetic
Fig. 3–10: Typical differential magnetic
sensitivity versus supply voltage
sensitivity versus ambient temperature
%
%
1.5
1.5
T = 25 °C
A
V
DD
= 6.8 V
1.0
0.5
1.0
0.5
NL
NL
dif
dif
0.0
0.0
–0.5
–1.0
–1.5
–0.5
–1.0
–1.5
V
V
V
= 4.8 V
T = –40 °C
A
DD
DD
DD
= 6.0 V
= 12 V
T = 25 °C
A
T = 125 °C
A
T = 150 °C
A
–80 –60 –40 –20
0
20 40 60 80 mT
–80 –60 –40 –20
0
20 40 60 80 mT
B
B
Fig. 3–9: Typical non-linearity of differential
Fig. 3–11: Typicalnon-linearityofdifferential
output versus magnetic flux density
output versus magnetic flux density
Micronas
13
HAL401
DATA SHEET
%
3
%
3
T = 25 °C
A
V
DD
= 6.0 V
2
2
1
NL
NL
single
single
1
0
0
–1
–2
–3
–1
–2
–3
V
V
= 4.8 V
DD
T = –40 °C
A
= 12 V
DD
T = 25 °C
A
T = 125 °C
A
T = 150 °C
A
–80 –60 –40 –20
0
20 40 60 80 mT
–80 –60 –40 –20
0
20 40 60 80 mT
B
B
Fig. 3–12: Typical single-ended non-linearity
Fig. 3–14: Typical non-linearity of single-
versus magnetic flux density
ended output versus magnetic flux density
kHz
200
kHz
200
180
180
f
f
CH
CH
160
140
120
100
80
160
140
120
100
80
T = –40 °C
A
60
60
T = 25 °C
A
V
DD
V
DD
V
DD
= 4.8 V
= 6.0 V
= 12 V
T = 125 °C
A
40
40
T = 150 °C
A
20
20
0
0
2
4
6
8
10
12
14 V
–50 –25
0
25 50 75 100 125 150
°C
V
DD
T
A
Fig. 3–13: Typical chopper frequency
Fig. 3–15: Typical chopper frequency
versus supply voltage
versus ambient temperature
14
Micronas
DATA SHEET
HAL401
V
V
2.4
2.25
2.24
2.23
2.22
2.21
2.20
2.19
2.18
2.17
2.16
2.15
2.2
V
CM
V
CM
2.0
1.8
1.6
1.4
1.2
1
V
= 4.8 V
= 12 V
DD
V
DD
T = –40 °C
A
T = 25 °C
A
T = 150 °C
A
2
4
6
8
10
12
14 V
–50 –25
0
25 50 75 100 125 150
°C
V
DD
T
A
Fig. 3–16: Typical common mode output
Fig. 3–18: Typical common mode output
voltage versus supply voltage
voltage versus ambient temperature
mV
mV
1000
1000
T = 25 °C
A
V
V
V
V
OUT1pp,
OUT2pp
OUT1pp,
OUT2pp
800
600
400
200
0
800
600
400
200
0
V
V
V
= 4.8 V
= 6.0 V
= 12 V
DD
DD
DD
2
4
6
8
10
12
14 V
–50 –25
0
25 50 75 100 125 150 °C
V
DD
T
A
Fig. 3–17: Typical output AC voltage
Fig. 3–19: Typical output AC voltage
versus supply voltage
versus ambient temperature
Micronas
15
HAL401
DATA SHEET
mA
25
mA
20
I
= 0 mA
I
= 0 mA
OUT1,2
OUT1,2
20
I
I
DD
DD
15
10
15
10
5
5
0
–5
T = –40 °C
A
–10
–15
–20
–25
T = 25 °C
A
T = –40 °C
A
T = 125 °C
A
T = 25 °C
A
T = 150 °C
A
T = 125 °C
A
T = 150 °C
A
0
–15 –10
–5
0
5
10
15 V
2
3
4
5
6
7
8 V
V
DD
V
DD
Fig. 3–20: Typical supply current
Fig. 3–22: Typical supply current
versus supply voltage
versus supply voltage
mA
20
mA
25
B = 0 mT
B = 0 mT
I
I
DD
DD
20
15
10
5
15
10
5
V
V
= 4.8 V
= 12 V
DD
DD
V
DD
V
DD
V
DD
= 4.8 V
= 6.0 V
= 12 V
0
0
–50 –25
0
25 50 75 100 125 150 °C
–6
–4
–2
0
2
4
6 mA
T
A
I
OUT1,2
Fig. 3–21: Typical supply current
Fig. 3–23: Typical supply current
versus temperature
versus output current
16
Micronas
DATA SHEET
HAL401
dBTrms
Ǹ
Hz
Ω
200
–100
–110
–120
–130
–140
–150
B = 0 mT
= 4.8 V
T = 25 °C
A
180
V
DD
V
DD
V
DD
R
n
meff
OUT
160
140
120
100
80
= 6.0 V
= 12 V
B = 0 mT
B = 65 mT
60
40
83 nT
20
Ǹ
Hz
0
–50 –25
0
25 50 75 100 125 150 °C
0.1 1
10 100 1k 10k 100k 1M Hz
T
A
f
Fig. 3–24: Typical dynamic differential
Fig. 3–26: Typical magnetic noise spectrum
output resistance versus temperature
dB
20
T
A
= 25 °C
0 dB = 42.5 mV/mT
10
0
s
B
–10
–20
–30
–40
10
100
1 k
10 k 100 k
f
B
Fig. 3–25: Typical magnetic frequency
response
Micronas
17
HAL401
DATA SHEET
4. Application Notes
4.3. Application Circuit
Mechanical stress on the device surface (caused by the
package of the sensor module or overmolding) can influ-
ence the sensor performance.
The normal integrating characteristics of a voltmeter is
sufficient for signal filtering.
V
DD
The parameter V
(see Fig. 2–2) increases with
OUTACpp
external mechanical stress. This can cause linearity er-
rors at the limits of the recommended operation condi-
tions.
4.7n
1
47 n
330 p
V
DD
Oscillo-
scope
HAL401
OUT1
2
Ch1
4.1. Ambient Temperature
3.3 k
6.8 n
3.3 k
1 k
1 k
3
Due to internal power dissipation, the temperature on
OUT2
Ch2
the silicon chip (junction temperature T ) is higher than
the temperature outside the package (ambient tempera-
J
47 n
330 p
ture T ).
A
GND
4
T = T + ΔT
J
A
Do not connect OUT1 or OUT2 to Ground.
Atstaticconditionsandcontinuousoperation, thefollow-
ing equation applies:
Fig. 4–1: Filtering of output signals
ΔT = I * V * R
thJSB
DD
DD
Display the difference between channel 1 and channel
2 to show the Hall voltage. Capacitors 4.7 nF and 330 pF
for electromagnetic immunity are recommended.
For all sensors, the junction temperature range T is
J
specified. The maximum ambient temperature T
can be calculated as:
Amax
V
DD
T
Amax
= T
– ΔT
Jmax
1
For typical values, use the typical parameters. For worst
V
DD
case calculation, use the max. parameters for I and
DD
Voltage
Meter
R , and the max. value for V from the application.
HAL401
OUT1
th
DD
2
3
High
4.2. EMC and ESD
OUT2
Low
Please contact Micronas for detailed information on
EMC and ESD results.
GND
4
Do not connect OUT1 or OUT2 to Ground.
Fig. 4–2: Flux density measurement with voltmeter
18
Micronas
DATA SHEET
HAL401
V
CC
V
DD
1.33 C
4.7n
1
330 p
V
DD
R+ΔR
HAL401
OUT1
0.75 R
ADC
1.5 R
R
2
–
0.22 R
CMOS
OPV
+
3
OUT2
330 p
4.4 C
3 C
R–ΔR
GND
4
Do not connect OUT1 or OUT2 to Ground.
Fig. 4–3: Differential HAL401 output to single-ended output
R = 10 kΩ, C = 7.5 nF, ΔR for offset adjustment, BW = 1.3 kHz
–3dB
VCCy6 V
V
DD
2.2 n
4.7 n
1
330 p
V
DD
4.7 k
HAL401
OUT1
1 n
2
4.7 k
–
4.7 k
4.7 k
CMOS
OPV
+
–
3
4.7 k
3.0 k
8.2 n
CMOS
OPV
+
OUT2
OUT
4.7 k
330 p
4.7 n
GND
4
Do not connect OUT1 or OUT2 to Ground.
VEEx*6 V
Fig. 4–4: Differential HAL401 output to single-ended output (referenced to ground), filter – BW
= 14.7 kHz
–3dB
Micronas
19
HAL401
DATA SHEET
5. Data Sheet History
1. Final Data Sheet: “HAL401 Linear Hall Effect Sen-
sor IC”, June 26, 2002, 6251-470-1DS.
First release of the final data sheet.
2. Final Data Sheet: “HAL401 Linear Hall Effect Sen-
sor IC”, Sept. 14, 2004, 6251-470-2DS.
Second release of the final data sheet.
Major changes:
– new package diagram for SOT89-1
3. Final Data Sheet: “HAL401 Linear Hall Effect Sen-
sor IC”, Dec. 8, 2008, DSH000018_002EN
Third release of the final data sheet.
Major changes:
– Section 1.5. “Solderability and Welding” updated
– package diagrams updated
– Fig. 3–3: “Recommended footprint SOT89B” added
Micronas GmbH
Hans-Bunte-Strasse 19 · D-79108 Freiburg · P.O. Box 840 · D-79008 Freiburg, Germany
Tel. +49-761-517-0 · Fax +49-761-517-2174 · E-mail: docservice@micronas.com · Internet: www.micronas.com
20
Micronas
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