1110C65M00000AA [MICROSEMI]

TTL Output Clock Oscillator, 65MHz Nom, PLASTIC, FLAT PACKAGE-20;


型号：	1110C65M00000AA
厂家：	Microsemi
描述：	TTL Output Clock Oscillator, 65MHz Nom, PLASTIC, FLAT PACKAGE-20 机械振荡器
文件：	总22页 (文件大小：453K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

REV

DESCRIPTION

DATE

PREP

APPD

CO-14428

4/30/09

DF/LT

VECTRON INTERNATIONAL

MOUNT HOLLY SPRINGS, PA 17065

DATE

10/26/00

11/1/00

10/30/00

PREPARED BY

QUALITY

Stan Carpenter

SWP

Oscillator Specification, Hybrid Clock

Hi-Rel Standard

CODE IDENT NO SIZE DWG. NO.

REV

S. Carpenter

ENGINEERING

OS-68338

00136 A

UNSPECIFIED TOLERANCES: N/A

SHEET 1 0F 20

SCOPE

1.1

General. This specification defines the design, assembly and functional evaluation of high

reliability, hybrid clock oscillators produced by Vectron International. Devices delivered to

this specification represent the standardized Parts, Materials and Processes (PMP) Program

developed, implemented and certified for advanced applications and extended environments.

1.2

Applications Overview. The designs represented by these products were primarily developed

for the MIL-Aerospace community. The lesser Design Pedigrees and Screening Options

imbedded within OS-68338 bridge the gap between Space and COTS hardware by providing

custom hardware with measures of mechanical, assembly and reliability assurance needed for

Military or Ruggedized COTS environments.

APPLICABLE DOCUMENTS

2.1

Specifications and Standards. The following specifications and standards form a part of this

document to the extent specified herein. The issue currently in effect on the date of quotation

will be the product baseline, unless otherwise specified. In the event of conflict between the

texts of any references cited herein, the text of this document shall take precedence.

Military

MIL-PRF-55310

MIL-PRF-38534

Oscillators, Crystal Controlled, General Specification For

Hybrid Microcircuits, General Specification For

Standards

MIL-STD-202

MIL-STD-883

MIL-STD-1686

Test Method Standard, Electronic and Electrical Component Parts

Test Methods and Procedures for Microelectronics

Electrostatic Discharge Control Program for Protection of Electrical and

Electronic Parts, Assemblies and Equipment

Other

HT-67849

QSP-90100

VL-65339

Test Specification, OS-68338 Hybrids, Hi-Rel Standard

Quality Systems Manual, Vectron International

Identification Common Documents, Materials and Processes, Hi-Rel XO

GENERAL REQUIREMENTS

3.1

Classification. All devices delivered to this specification are of hybrid technology conforming

to Type 1, Class 2 of MIL-PRF-55310. Primarily developed as a Class S equivalent

specification, options are imbedded within it to also produce Class B, Engineering Model and

Ruggedized COTS devices. Devices carry a Class 2 ESDS classification.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

3.2

3.3

Item Identification. External packaging choices are of metal flatpacks, DIP’s and ceramic J-

lead 9x14mm and LCC’s with either TTL or ACMOS logic output. Unique Model Number

Series’ are utilized to identify device package configurations and output logic as listed in Table

Absolute Maximum Ratings.

a. Supply Voltage Range (V_CC):

b. Storage Temperature Range (T_STG):

c. Junction Temperature (T_J):

-0.5Vdc to +7.0Vdc

-65°C to +125°C

+175°C

d. Lead Temperature (soldering, 10 seconds):

e. Output Source/Sink Current

+300°C

70 mA

3.4

Design, Parts, Materials and Processes, Assembly, Inspection and Test.

3.4.1 Design. The ruggedized designs implemented for these devices are proven in military and

space applications under extreme environments. Designs utilize 4-point crystal mounting in

compliment with Established Reliability (MIL-ER) componentry. When specified, radiation

hardening up to 100krad(Si) (RHA level R) can be included without altering the device’s

internal topography.

3.4.1.1 Design and Configuration Stability. Barring changes to improve performance by reselecting

passive chip component values to offset component tolerances, there will not be fundamental

changes to the design or assembly or parts, materials and processes after first product delivery

of that item without written approval from the procuring activity.

3.4.1.2 Environmental Integrity. Designs have passed the environmental qualification levels of MIL-

PRF-55310. These designs have also passed extended dynamic levels of at least:

Sine Vibration: MIL-STD-202, Method 204, Condition G (30g pk.)

Random Vibration: MIL-STD-202, Method 214, Condition II-J (43.92g rms)

Mechanical Shock: MIL-STD-202, Method 213, Condition F (1500g, 0.5ms)

3.4.2 Prohibited Parts, Materials and Processes. The items listed are prohibited for use in high

reliability devices produced to this specification.

a. Gold metallization of package elements without a barrier metal.

b. Zinc chromate as a finish.

c. Cadmium, zinc, or pure tin external or internal to the device.

d. Plastic encapsulated semiconductor devices.

e. Ultrasonically cleaned electronic parts.

f. Heterojunction Bipolar Transistor (HBT) technology.

g. ‘getter’ materials

3.4.3 Assembly. Manufacturing utilizes standardized procedures, processes and verification

methods to produce MIL-PRF-55310 Class S / MIL-PRF-38534 Class K equivalent devices.

MIL-PRF-38534 Group B Option 1 in-line inspection is included on radiation hardened part

numbers to further verify lot pedigree. Traceability of all components and production lots are

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

in accordance with MIL-PRF-38534, as a minimum. Tabulated records are provided as a part

of the deliverable data package. Devices are handled in accordance with MIL-STD-1686 for

Class 1 devices.

3.4.4 Inspection. The inspection requirements of MIL-PRF-55310 apply to all devices delivered to

this document. Inspection conditions and standards are documented in accordance with the

Quality Assurance, ISO-9001 derived, System of QSP-90100.

3.4.5 Test. The Screening test matrix of Table 5 is tailored for selectable-combination testing to

eliminate costs associated with the development/maintenance of device-specific documentation

packages while maintaining performance integrity.

3.4.6 Marking. Device marking shall be in accordance with the requirements of MIL-PRF-55310.

3.4.7 Ruggedized COTS Design Implementation. Design Pedigree “D” devices (see ¶ 5.2) use the

same robust designs found in the other device pedigrees. They do not include the provisions of

traceability or the Class-qualified componentry noted in paragraphs 3.4.3 and 4.1.

DETAIL REQUIREMENTS

Components

4.1

4.1.1 Crystals. Cultured quartz crystal resonators are used to provide the selected frequency for the

devices. The optional use of Premium Q swept quartz can, because of its processing to remove

impurities, be specified for better frequency aging characteristics. In accordance with MIL-

PRF-55310, the manufacturer has a documented crystal element evaluation program.

4.1.2 Passive Components. Established Reliability (ER) failure level R minimum passive

components are procured from QPL suppliers. Lot evaluations are in accordance with MIL-

PRF-55310 or Enhanced Element Evaluation as specified in Table 7.

4.1.3 Class S Microcircuits. Microcircuits are procured from wafer lots that have passed MIL-PRF-

55310 Lot Acceptance Tests for Class S devices. The prescribed die carries a Class 2 ESDS

classification in accordance with MIL-PRF-38535. When optionally specified, further testing

in accordance with MIL-PRF-55310 and MIL-PRF-38534 is performed for radiation hardness

assurance and for Enhanced Element Evaluation as specified in Table 6. Those microcircuits,

identified by a unique part number, are certified for 100krad(Si) total ionizing dose (TID),

RHA level R (2X minimum margin). NSC, as the original 54ACT designer, rates the SEU

LET at >40 MeV and SEL at >120MeV for the FACT™ family (AN-932). Vectron has

conducted additional SEE testing in 2008 to verify this performance since our lot wafer testing

does not include these parameters and determinations.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

4.1.3.1 Class B Microcircuits. When specified, microcircuits assembled into OS-68338 Design

Pedigree letters “B” and “C” devices (¶ 5.2a) are procured from wafer lots that have passed

MIL-PRF-55310 element evaluations for Class B devices.

4.1.4 Packages. Packages are procured that meet the construction, lead materials and finishes as

specified in MIL-PRF-55310. Package lots are upscreened in accordance with the

requirements of MIL-PRF-38534 as applicable.

4.1.5 Traceability. Class S active device lots are homogenous and traceable to the manufacturer’s

individual wafer. Swept Quartz Crystals are traceable to the quartz bar and the processing

details of the autoclave lot, as applicable. All other elements and materials are traceable to

their manufacturer and incoming inspection lots.

4.1.6 Enhanced Element Evaluation. When Design Pedigree Option “E” is specified, active and

passive devices with Enhanced Element Evaluation as listed in Table 6 and 7 shall be

implemented for the highest reliability preference.

4.2

Mechanical.

4.2.1 Package Outline. Table 1 links each Hi-Rel Standard Model Number of this specification to a

corresponding package style. Mechanical Outline information of each package style is found

in the referenced Figure.

4.2.2 Thermal Characteristics. The worst case thermal characteristics of each package style are

found in Table 4.

4.3

Electrical.

4.3.1 Input Power. Devices are designed for standard 5.0 volt dc operation, 10%. Optional 3.3

Vdc ( 10%) input performance for ACMOS output conditions. Current is measured, no load,

at maximum rated operating voltage.

4.3.2 Temperature Range. Operating range is -55°C to +125°C.

4.3.3 Frequency Tolerance. Initial accuracy at +23°C is 15 ppm maximum. Frequency-

Temperature Stability is 50 ppm maximum from +23°C reference. Frequency-Voltage

Tolerance is 4 ppm maximum.

4.3.4 Frequency Aging. Aging limits, and when tested in accordance with MIL-PRF-55310 Group B

inspection, shall not exceed 1 ppm the first 30 days, 5 ppm Year 1 and 2 ppm per year

thereafter. When screening Option F is selected, aging is performed on 100% of the lot and

Vectron does not apply the PDA as specified in MIL-PRF-55310. Data will be presented for

each individual unit to show compliance to the aging limit.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

4.3.4.1 Frequency Aging Duration Option. By customer request, the Aging test may be terminated

after 15 days if the measured aging rate is less than half of the specified aging rate. This is a

common method of expediting 30-Day Aging without incurring risk to the hardware and used

quite successfully for numerous customers. It is based on the ‘least squares fit’ determinations

of MIL-PRF-55310 paragraph 4.8.35. The ‘half the time/half the spec’ limit is generally

conservative as roughly 2/3 of a unit’s Aging deviation occurs within that period of time.

Vectron’s automated aging systems take about 6 data points per day, so a lot of data is

available to do very accurate projections, much more data than what is required by MIL-PRF-

55310. The delivered data would include the Aging plots projected to 30 days. If the units

would not perform within that limit then they would continue to full 30 Day term. Please

advise by purchase order text if this may be an acceptable option to exercise as it assists in

Production Test planning.

4.3.5 Operating Characteristics. Symmetrical square wave limits are dependent on the device

frequency and are in accordance with Tables 2 and 2A. Waveform measurement points and

logic limits are in accordance with MIL-PRF-55310. Start-up time is 10.0 msec. maximum.

4.3.6 Output Load. Standard TTL (6 or 10) and ACMOS (10kΩ, 15pF) test loads are in accordance

with MIL-PRF-55310.

QUALITY ASSURANCE PROVISIONS AND VERIFICATION

5.1

Verification and Test. Device lots shall be tested prior to delivery in accordance with the

applicable Screening Option letter as stated by the 15^thcharacter of the part number. Table 5

tests are conducted in the order shown and annotated on the appropriate process travelers and

data sheets of the governing test procedure. For devices that require Screening Options that

include MIL-PRF-55310 Group A testing, the Post-Burn-In Electrical Test and the Group A

Electrical Test are combined into one operation.

5.1.1 Screening Options. The Screening Options, by letter, are summarized as:

Modified MIL-PRF-38534 Class K

Modified MIL-PRF-55310 Class B Screening & Group A Quality Conformance

Inspection (QCI)

Modified MIL-PRF-55310 Class S Screening & Group A QCI

Modified MIL-PRF-38534 Class K with Burn-in Delta Aging

Modified MIL-PRF-55310 Class B Screening, Groups A & B QCI

Modified MIL-PRF-55310 Class S Screening, Groups A & B QCI

Modified MIL-PRF-55310 Class B Screening & Post Burn-in Nominal

Electricals

Engineering Model (EM)

5.2

Optional Design, Test and Data Parameters. The following is a list of design, assembly,

inspection and test options that can be selected or added by purchase order request.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

a. Design Pedigree (choose one as the 5^thcharacter in the part number):

(E) Enhanced Element Evaluation, 100krad Class S die, Premium Q Swept Quartz

(R) Hi-Rel design w/ 100krad Class S die, Premium Q Swept Quartz

(V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz

(X) Hi-Rel design w/ Cultured Quartz, Class S die

(B) Hi-Rel design w/ Swept Quartz, Class B die

(D) Hi-Rel design w/ Cultured Quartz and commercial grade components

b. Input Voltage, (A) for 5.0V, (B) for 3.3V as the 14^thcharacter

c. Frequency-Temperature Slew Test

d. Radiographic Inspection

e. Group C Inspection: MIL-PRF-55310 (requires 8 pc. sample)

f. Group C Inspection: MIL-PRF-38534 (requires 8 pc. sample – 5 pc. Life, 3 pc. RGA)

g. Internal Water-Vapor Content (RGA) samples and test performance

h. MTBF Reliability Calculations

i. Worst Case/Derating Analysis

j. Deliverable Process Identification Documentation (PID)

k. Customer Source Inspection (pre-cap / final)

5.3

5.4

Test Conditions. Unless otherwise stated herein, inspections are performed in accordance with

those specified in MIL-PRF-55310 and MIL-PRF-38534, in that order. Process travelers

identify the applicable methods, conditions and procedures to be used. Examples of electrical

test procedures that correspond to MIL-PRF-55310 requirements are shown in Table 3.

Special Tests and Descriptions.

5.4.1 Frequency-Temperature Slew. Frequency-Temperature Slew Test has been developed as an

indicator of higher than normal internal water vapor content. The incremental temperature

sweep from +125°C to -55°C and back to +125°C records output frequency fluctuations

emulating the mass loading of moisture deposited on the crystal blank surface. Though not

replacing a customer’s internal water-vapor content (RGA) requirement, confidence is

increased without destructively testing otherwise good devices.

5.4.2 Burn-in Delta Frequency Aging (in Option D). The frequency measurement for burn-in delta

measurements is performed at the crystal’s upper turning point temperature where its effects on

repeatable frequency accuracy are maximized. Dependent on the crystal specified, this

temperature is typically between +65°C and +85°C, 0.2°C.

5.5

Deliverable Data. The manufacturer supplies the following data, as a minimum, with each lot

of devices:

a. Completed assembly and screening lot travelers, including rework history.

b. Electrical test variables data, identified by unique serial number.

c. Frequency-Temperature Slew plots, Radiographic films, Group C data and RGA data as

required by purchase order.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

5.6

5.7

Discrepant Material. All MRB authority resides with the procuring activity.

Failure Analysis. Any catastrophic failure (no clocking, no current) at Post Burn-In or after

will be evaluated for root cause. The customer will be notified after occurrence and upon

completion of the evaluation.

PREPARATION FOR DELIVERY

6.1

Packaging. Devices will be packaged in a manner that prevents handling and transit damage

during shipping. Devices will be handled in accordance with MIL-STD-1686 for Class 1

devices.

ORDERING INFORMATION

7.1

Ordering Part Number. The ordering part number is made up of an alphanumeric series

of 15 characters. Design-affected product options, identified by the parenthetic letter on

the Optional Parameters list (¶ 5.2a and b), are included within the device part number.

The Part Number breakdown is described as:

1104 R 10M00000 A F

Model # (Table 1)

Screening Option

per Table 5, 5.1.1

Design Pedigree

E = Enhanced Element

Evaluation, 100krad

Class S die, Swept

Quartz

Input Voltage

A= 5.0V

B= 3.3V

R = 100krad Class S die,

Swept Quartz

Frequency

V = 100krad Class S

die, Cultured Quartz

X = Class S die,

Cultured Quartz

B = Class B die,

Swept Quartz

C = Class B die,

Cultured Quartz

D = Ruggedized COTS:

Cultured Quartz,

Commercial Grade

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

7.1.1 Model Number. The device model number is the four (4) digit number assigned to a

corresponding package and output combination per Table 1.

7.1.2 Design Pedigree. Class S variants correspond to either letter “E”, “R”, “V” or “X” and are

described in paragraph 5.2a. Class B variants correspond to either letter “B” or “C” and are

described in paragraph 5.2a. Ruggedized COTS, using commercial grade components,

corresponds to letter “D”.

7.1.2.1 Input Voltage. Voltage is the 14^thcharacter, letters “A” representing 5.0V and “B” for 3.3V.

7.1.3 Output Frequency. The nominal output frequency is expressed in the format as specified in

MIL-PRF-55310 utilizing eight (8) characters.

7.1.4 Screening Options. The 15^thcharacter is the Screening Option (letter A thru G or X) selected

from Table 4.

7.2

Optional Design, Test and Data Parameters. Test and documentation requirements above that

of the standard high reliability model shall be specified by separate purchase order line items

(as listed in ¶ 5.2c thru k).

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

HI-REL

STANDARD

MODEL #

OUTPUT

Square

Wave

PIN I/O 1/

MECHANICAL

OUTLINE

PACKAGE

Vcc

Out Gnd/ E/D

Case

FIGURE 1

FIGURE 2

FIGURE 3

FIGURE 6

FIGURE 7

FIGURE 4

FIGURE 5

FIGURE 8

FIGURE 9

1101

1102

1103

1104

1105

1106

1113

1115

1116

1118 2/.

12 Lead Flatpack

14 Lead Flatpack

16 Lead Flatpack

20 Lead Flatpack

14 Pin DIP

ACMOS

ACMOS 13, 20 11

ACMOS

20 Lead Ceramic

40 Pad LCC

4 pin ½ DIP

J-lead SMT

4 pad 5 x 7mm

FIGURE 1

FIGURE 2

FIGURE 3

FIGURE 6

FIGURE 7

FIGURE 4

FIGURE 8

1107

1108

1109

1110

1111

1112

1114

1117

12 Lead Flatpack

14 Lead Flatpack

16 Lead Flatpack

20 Lead Flatpack

14 Pin DIP

TTL

13, 20 11

20 Lead Ceramic

40 Pad LCC

J-lead SMT

1/. All unassigned pins have no internal connections or ties.

2/. See Appendix A

TABLE 1 - Item Identification and Package Outline

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

Frequency Range @ 5V Operation: 0.35 MHz to 100.0 MHz 1/.

Frequency Range @ 3.3V Operation: 0.35 MHz to 100.0 MHz

Temperature Range: -55°C to +125°C

Frequency Tolerance, Initial Accuracy @ +23°C: 15 ppm max.

Frequency-Temperature Stability from +23°C ref.: 50 ppm max.

Frequency-Voltage Tolerance: 4 ppm max. (Vcc 10%)

Frequency Aging: 1 ppm max. 1^st30 days, 5 ppm max. Year 1, 2 ppm max. Year 2+

Start-up Time: 10.0 ms max.

Frequency

Range

(MHz)

Current (mA)

(max. no load)

5.5V | 3.63V

Rise / Fall

Times

(ns max.)

Duty Cycle

(%)

Fan-out

(if TTL)

0.35 - 4.0

45 to 55

40 to 60

4.0 – 12.0

>12.0 – 24.0

>24.0 – 40.0

>40.0 – 65.0

>65.0 – 85.0

>85.0 – 100

1/. Exception: Frequency Range @ 5V Operation for model 1117 (TTL) series is limited to

85 MHz.

2/. Waveform measurement points and logic limits are in accordance with MIL-PRF-55310.

TABLE 2 - Electrical Performance Characteristics

OPERATION LISTING

REQUIREMENTS AND

CONDITIONS

VECTRON

TEST

PROCEDURE

@ all Electrical tests

Input Current (no load)

Initial Accuracy @ Ref. Temp.

Output Logic Voltage Levels

Rise and Fall Times

MIL-PRF-55310, Para 4.8.5.1

MIL-PRF-55310, Para 4.8.6

MIL-PRF-55310, Para 4.8.21.3

MIL-PRF-55310, Para 4.8.22

MIL-PRF-55310, Para 4.8.23

GR-51681

GR-51596

GR-51597

GR-51599

GR-51601

Duty Cycle

@ Post Burn-In Electrical only

Overvoltage Survivability

MIL-PRF-55310, Para 4.8.4

MIL-PRF-55310, Para 4.8.10.1

MIL-PRF-55310, Para 4.8.14

MIL-PRF-55310, Para 4.8.29

GR-37269

GR-51602

GR-61352

Initial Freq. – Temp. Accuracy

Freq. – Voltage Tolerance

Start-up Time (fast/slow start)

TABLE 3 - Electrical Test Parameters

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

Model #

Thermal Resistance

Junction to Case

θ_jc(°C / W)

17.32

∆ Junction Temp.

T_j(°C @ max. Icc)

1101 / 1107

1102 / 1108

1103 / 1109

1104 / 1110

1105 / 1111

1106 / 1112

1113 / 1114

1115

5.24

5.20

5.13

5.92

1.33

6.12

5.42

1.14

17.32

17.20

16.97

19.57

4.38

20.22

17.91

1116 / 1117

1118

Maximum operating power = 302.5 mW per Table 2.

3.77

TABLE 4 - Thermal Characteristics

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

OPN.

NO.

OPERATION LISTING

REQUIREMENTS AND CONDITIONS

MIL Class Similarity

Option

B-

S-

K+

SCREENING

100%

Non-Destruct Bond Pull

Internal Visual

MIL-STD-883, Meth 2023

MIL-STD-883, Meth 2017 Class K,

Meth 2032 Class K

Completed During Assembly

Stabilization (Vacuum) Bake

Thermal Shock

MIL-STD-883, Meth 1008, Cond C,

150°C, 48 hours min.

MIL-STD-883, Meth 1011, Cond A

Temperature Cycle

MIL-STD-883, Meth 1010, Cond. B,

10 cycles min.

Constant Acceleration

Particle Impact Noise Detection

Electrical Testing, Pre Burn-In

Freq-Temp Slew Test

1^stBurn-In

MIL-STD-883, Meth 2001, Cond A,

Y1 plane only, 5000 g’s

MIL-STD-883, Meth 2020, Cond B

Perform tests in Table 3. Nominal Vcc, nominal

temperature

X, 3/

Operating temp. range, frequency plotted at 1.0°C

steps

MIL-STD-883, Meth 1015, Condition B

160 hrs.

240 hrs.

160 hrs.

X, 4/

160 hrs.

240 hrs.

160 hrs.

Electrical Testing, Intermediate

2^ndBurn-In

Perform tests in Table 3. Nominal Vcc, nominal

temperature

MIL-STD-883, Meth 1015, Condition B

160 hrs.

X, 5/

Electrical Testing, Post Burn-In

(Group A)

Perform tests in Table 3. Nominal Vcc & extremes,

nominal temperature & extremes

MIL-STD-883, Meth 1014, Cond A2

5 x 10^-8atm cc/sec max

nom. Vcc

Seal: Fine Leak

Seal: Gross Leak

MIL-STD-202, Meth 112, Cond D

MIL-STD-883, Meth 2012

Radiographic Inspection

Solderability

MIL-STD-883, Meth 2003

MIL-STD-883, Meth 2009

MIL-PRF-55310, para. 4.8.35.1

X 7/

External Visual & Mechanical

Aging, 30 Day 8/

(M55310 Group B)

X 7/

X 9/.

X 7/

13 pcs.

LEGEND: X = Required, NR = Not Required, AR = As Required

TABLE 5 - Test Matrix

3/ includes frequency recorded at the crystal Upper Turning Point (UTP) temperature. 4/ ꢀ_F@ UTP = 7.5 ppm maximum.

5/ ꢀ_F@ UTP = 2.5 ppm maximum. 6/ Performed at package LAT. Include LAT data sheet

7/ When specified, RGA samples will be removed from the lot after completion of this operation. Use of Screening failures require customer concurrence.

8/ By customer request, the Aging test may be terminated after 15 days if the measured aging rate is less than one-half the specified aging rate, as described in

paragraph 4.3.4.1 herein. See the customer PO. 9/. PDA is not applicable.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

Mil-PRF-

38534

Subgroup Class

Test

Mil-STD-883

Quantity

Reference

Paragraph

Method

Condition

(accept number)

Element Electrical

A. May perform at wafer level

B. All failures shall be removed

from the lot

100%

C.3.3.1

C. Perform at room ambient

Element Visual

Internal Visual

2010

100%

C.3.3.2

C.3.3.3

C.3.3.4.2

C.3.3.3

10(0) or 22(0)

Temperature Cycling

Mechanical Shock

1010

2002

B, Y1

10(0)

22(0)

direction

3,000 G, Y1

direction

Constant Acceleration

2001

Interim Electrical

Burn-In

C.3.3.4.3

240 hours

minimum at

+125°C

1015

1005

Post Burn-In Electrical

Steady State Life

Final Electrical

C.3.3.4.3

10(0) wires or

20(1) wires

C.3.3.3

C.3.3.5

C.3.3.6

Wire Bond Evaluation

SEM

2011

2018

See method 2018

Notes:

Subgroups 3, 4, & 5 shall be performed on a sample of 10 die if the wafer lot is from a QPL/QML line. If the die are

from commercial wafer lots, then the sample size shall be 22 die.

TABLE 6 - MICROCIRCUIT ENHANCED ELEMENT EVALUATION

Parts Type

Test

N/A

Requirement

Paragraph

Sample size

N/A

Allowable Reject(s)

Ceramic Capacitors

M55681 FRL S or

M123 (chips)

Resistors

N/A

M55342 FRL R or

Inductors

N/A

Custom

Group A

Group B

Mil-Std-981

TABLE 7: PASSIVE COMPONENT ENHANCED ELEMENT EVALUATION

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

FIGURE 1

Models 1101 & 1107 Package Outline

FIGURE 2

Models 1102 & 1108 Package Outline

Tolerances: Unspecified = 0.010”

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

FIGURE 3

Models 1103 & 1109 Package Outline

FIGURE 4

Models 1106 & 1112 Package Outline

Models 1113 & 1114 - same package minus the leads

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

FIGURE 5

Model 1115 Package Outline

FIGURE 6

Model 1104 & 1110 Package Outline

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

FIGURE 7

Model 1105 & 1111 Package Outline

FIGURE 8

Model 1116 & 1117 Package Outline

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

APPENDIX A

4 Pad 5 x 7mm ACMOS Hybrid, Model Number 1118 Series

A.1 Scope. The Model 1118 Series uses a fundamentally different design approach versus

the other models offered by the OS-68338 Specification. Some of that text does not fit

this design, so for that reason the Model 1118 Series is specified here in Appendix A.

Where not superseded by this Appendix the original text still applies.

A.2 Design. The Model 1118 Series uses an AT-strip crystal mounted at two adjacent

points. Due to the crystal’s smaller mass this 2-point design has proven its ruggedness

by passing the same environmental qualification exposures of the other OS-68338

Models (¶ 3.4.1.2).

Frequency Range Operation: 0.7 MHz to 54 MHz

Temperature Range: -55°C to +125°C

Frequency Tolerance, Initial Accuracy @ +23°C: 15 ppm max.

Frequency-Temperature Stability from +23°C ref.: 75 ppm max.

Frequency-Voltage Tolerance: 4 ppm max. (Vcc 10%)

Frequency Aging: 1 ppm 1^st30 days, 5 ppm max. Year 1, 2 ppm max. Year 2+

Start-up Time: 10.0 ms max.

Frequency

Range

(MHz)

Current (mA)

(max. no load)

5.5V | 3.63V

Rise / Fall

Times

(ns max.)

Duty Cycle

(%)

0.7 - 4.0

45 to 55

40 to 60

4.0 – 12.0

>12.0 – 24.0

>24.0 – 40.0

>40.0 – 54.0

2/. Waveform measurement points and logic limits are in accordance with MIL-PRF-55310.

TABLE 2A - Electrical Performance Characteristics, Model 1118 Series

A.3 Marking. Device marking, due to size, will be limited to the Vectron logo (VI), date

code, Pin 1 / ESD ID and the fully traceable Work Order – unique serial number

combination, i.e. 370002-20. Individual device packaging will include the full part

number.

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

FIGURE 9

Model 1118 Package Outline

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

DOCUMENT CHANGE RECORD

Revision Change

ECO 04-2126

Add Application Overview: ¶ 1.2

Add new para. for Ruggedized COTS: ¶ 3.4.7

Add Design Pedigree ‘D’: ¶ 5.2, 7.1

Add references to Ruggedized COTS: ¶ 3.1, 7.1.2

Add Screening Option ‘G’: ¶ 5.1.1, 7.1.4

Table 1: change all HCMOS or ACMOS,

replace MIL package references with applicable added Figures

Table 4: add Screening Options ‘G’ and ‘EM’

Add Figures 6 thru 8

ECO 05-0727

Add ¶ 3.4.1.2 Environmental Integrity

¶ 4.1.3: add SEU / SEL statement

¶ 4.3.1: change 3.3Vdc tolerance from 5% to 10%

¶ 4.3.4: revised Aging from 5 ppm / year max. to 5 ppm max. Year 1, 2 ppm max. Year 2+

¶ 5.2: add (V) Hi-Rel design w/ 100krad Class S die, Cultured Quartz

¶ 7.1 Design Pedigree: add V=100krad Class S die, Cultured Quartz

Table 1: add 1118 Model Number info

Table 2, Current column: split into 5.5V and 3.6V columns and revised limits downward

Table 2, Rise/Fall Times column: revise limits downward for ≤12 MHz and >65.0 to 80 MHz

ranges

Add new Table 4 Thermal Characteristics, renumber Test Matrix to Table 5

Table 5 Test Matrix, Option X column: correct Opn. No. 5, 6 and 17 from “X” to “N/R”

Add Appendix A for 5 x 7 requirements

ECO 06-2510

¶ 2.1: add VL-65339

Add ¶ 3.3e, Output Source/Sink Current

Add ¶ 3.4.2g, ‘getter’ materials

Add ¶ 4.3.4.1 Frequency Aging Duration Option

¶ 5.1.1: S/O ‘G’, clarify description

¶ 5.2e & 5.2f: clarify Group C sample sizes

Table 1: 1106 & 1112 package name to 20 Lead Ceramic

Table 2: add Frequency Ranges of both voltages; >65.0MHz – 85.0; >85.0 -100, ‘n/a’ under

3.63V column

Table 5: add Note 8

Figure 2: add Unspecified Tolerance dimension

ECO 07-0692

•

Table 5: Corrected Operation 2 reference to “Cond. K”.

Table 5: Changed Table 5 OPN 10 and 12 to note Method 1015 Condition B.

Added new sentence to end of Par 5.1 describing that Post BI and Group A are combined

into one electrical test.

•

Added “n/a” to Table 2 for the 85.00-100.00 “Fan-out” column.

Removed photo from cover page (to reduce file size).

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

ECO 08-0145

Paragraph 4.1.5: added "Class S" & "SWEPT Quartz"

Table 2: replaced "n/a" with "30", at row “85.00-100.00”, column “3.63 V”

Figure 3: changed ".057" to ".042", the dimension at back-to-leads

CO-14428

Sheet1:

Inserted picture on cover sheet.

¶ 4.1.2:

Added “minimum” and “Lot evaluations are in accordance with MIL-PRF-55310 or Enhanced

Element Evaluation as specified in Table 7.”

¶ 4.1.3:

Added “and for Enhanced Element Evaluation as specified in Table 6.”

Added: “Vectron has conducted additional SEE testing in 2008 to verify this performance

since our lot wafer testing does not include these parameters and determinations.”

¶ 4.1.6:

Added new paragraph.

¶ 4.3.4:

Added “When screening Option F is selected, aging is… compliance to the aging limit.”

¶ 5.1.1:

Added “Modified” to options F and G.

¶ 5.2, 7.1 and 7.1.2:

Added Option (E) for Enhanced Element Evaluation

Table 1:

Added Footnote 2 for Model 1118

Table 2:

Added Footnote 1

Changed Frequency Range Maximum @ 3.3V Operation from “85.0 MHz” to “100.0 MHz”

Table 5:

Added Footnote 9 for Option F. “PDA is not applicable”

Tables 6 and 7: New

Figures 3, 6 and 9: Redrawn

¶ A.3: Deleted. Renumbered paragraphs.

Table 2A:

Added “Frequency Range: 0.7 MHz to 54 MHz”

Changed Duty Cycle at >12.0-24.0 From “40 to 60” To “45 to 55”

CODE IDENT NO.

UNSPECIFIED TOLERANCES

SIZE

DWG NO.

REV.

SHEET

00136

N/A

OS-68338

1110C65M00000AA [MICROSEMI]

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