ARF476FL [MICROSEMI]

RF POWER MOSFET N-CHANNEL PUSH - PULL PAIR; RF功率MOSFET N沟道PUSH - PULL PAIR
ARF476FL
型号: ARF476FL
厂家: Microsemi    Microsemi
描述:

RF POWER MOSFET N-CHANNEL PUSH - PULL PAIR
RF功率MOSFET N沟道PUSH - PULL PAIR

晶体 射频场效应晶体管 高压 放大器 局域网
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中文:  中文翻译
下载:  下载PDF数据表文档文件
Common Source  
Push-Pull Pair  
ARF476FL  
S
D
D
S
D
G
S
S
S
S
ARF476FL  
G
D
S
G
G
S
RF POWER MOSFET  
N-CHANNEL PUSH - PULL PAIR  
165V 450W 150MHz  
TheARF476FLisamatchedpairofRFpowertransistorsinacommonsourceconfiguration.Itisdesignedforhighvoltage  
push-pull or parallel operation in narrow band ISM and MRI power amplifiers up to 150 MHz.  
Specified150Volt, 128MHzCharacteristics:  
Extended Flange - 3mm Creep Distance.  
Output Power = 900 Watts Peak  
Gain = 15dB (Class AB)  
Efficiency = 50% min  
High Voltage Breakdown and Large SOA  
forSuperiorRuggedness.  
LowThermalResistance.  
MAXIMUM RATINGS  
All Ratings: T = 25°C unless otherwise specified.  
C
Symbol Parameter  
ARF476FL  
500  
UNIT  
Volts  
Amps  
VDSS  
Drain-Source Voltage  
VDGO  
ID  
Drain-Gate Voltage  
500  
Continuous Drain Current @ TC = 25°C  
Gate-Source Voltage  
(each device)  
10  
VGS  
PD  
±30  
Volts  
Total Device Dissipation @ TC = 25°C  
910  
Watts  
TJ,TSTG  
TL  
-55 to 175  
300  
Operating and Storage Junction Temperature Range  
Lead Temperature: 0.063" from Case for 10 Sec.  
°C  
STATIC ELECTRICAL CHARACTERISTICS (each device)  
Symbol Characteristic / Test Conditions  
MIN  
TYP  
MAX  
UNIT  
BVDSS  
Drain-Source Breakdown Voltage (VGS = 0V, ID = 250 µA)  
500  
Volts  
1
VDS  
2.9  
4
On State Drain Voltage (ID(ON) = 5A, VGS = 10V)  
(ON)  
100  
500  
±100  
Zero Gate Voltage Drain Current (VDS = VDSS, VGS = 0V)  
Zero Gate Voltage Drain Current (VDS = 50V, VGS = 0, TC = 125°C)  
Gate-Source Leakage Current (VGS = ±30V, VDS = 0V)  
Forward Transconductance (VDS = 15V, ID = 5A)  
IDSS  
µA  
IGSS  
gfs  
nA  
3
0.9  
2
3.6  
3.3  
mhos  
gfs1 gfs2  
1.1  
4
Forward Transconductance Match Ratio (VDS = 15V, ID = 5A)  
Gate Threshold Voltage (VDS = VGS, ID = 200mA)  
/
VGS  
(TH)  
Volts  
VGS  
0.2  
Gate Threshold Voltage Match (VDS = VGS, ID = 200mA)  
(TH)  
THERMAL CHARACTERISTICS  
Symbol Characteristic  
MIN  
TYP  
0.15  
0.30  
MAX  
0.165  
0.33  
UNIT  
RθJC  
Junction to Case  
°C/W  
RθJHS  
Junction to Sink (Use High Efficiency Thermal Grease and Planar Heat Sink Surface.)  
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.  
Microsemi Website - http://www.microsemi.com  
DYNAMIC CHARACTERISTICS (per section)  
ARF476FL  
UNIT  
Symbol  
Ciss  
Coss  
Crss  
td(on)  
tr  
Characteristic  
Test Conditions  
GS = 0V  
MIN  
TYP  
780  
125  
7
MAX  
830  
130  
9
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Turn-on Delay Time  
Rise Time  
V
pF  
VDS = 50V  
f = 1MHz  
5.1  
4.1  
12  
10  
8
VGS = 15V  
VDD = 250V  
ns  
ID = ID[Cont.] @ 25°C  
td(off)  
tf  
Turn-off Delay Time  
Fall Time  
18  
7
RG = 1.6 Ω  
4.0  
FUNCTIONAL CHARACTERISTICS (Push-Pull Configuration)  
Symbol Characteristic  
Test Conditions  
MIN  
14  
TYP  
16  
MAX  
UNIT  
dB  
f = 128 MHz  
GPS  
Common Source Amplifier Power Gain  
Drain Efficiency  
Idq = 15mA  
VDD = 150V  
η
50  
55  
Pout = 900W  
%
PW = 3ms  
10% duty cycle  
ψ
Electrical Ruggedness VSWR 5:1  
No Degradation in Output Power  
1
Pulse Test: Pulse width < 380 µS, Duty Cycle < 2%.  
MicrosemiReservestherighttochange,withoutnotice,thespecificationsandinformationcontainedherein.  
Per transistor section unless otherwise specified.  
3000  
30  
25  
20  
15  
10  
12V  
C
iss  
1000  
500  
11V  
10V  
C
oss  
100  
50  
9V  
8V  
7V  
C
rss  
10  
5
0
1
.1  
1
10  
100 200  
0
5
10  
15  
20  
25  
30  
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
VDS,DRAIN-TO-SOURCEVOLTAGE(VOLTS)  
Figure 2, Typical Capacitance vs. Drain-to-Source Voltage  
Figure1,TypicalOutputCharacteristics  
30  
25  
20  
15  
10  
1.10  
1.05  
1.00  
V
> I (ON) x  
R
(ON)MAX.  
DS  
DS  
D
250µSEC. PULSE TEST  
@
<0.5 % DUTY CYCLE  
T
= -55°C  
J
T
= +25°C  
J
0.95  
0.90  
T
= -55°C  
J
5
0
T
= +125°C  
2
J
0
4
6
8
10  
-50 -25  
0
25  
TC,CASETEMPERATURE(°C)  
Figure4,TypicalThresholdVoltagevsTemperature  
50  
75 100 125 150  
VGS,GATE-TO-SOURCEVOLTAGE(VOLTS)  
Figure 3, Typical Transfer Characteristics  
ARF476FL  
0.18  
0.16  
0.14  
0.12  
0.10  
0.08  
0.06  
0.04  
D = 0.9  
0.7  
0.5  
Note:  
t
0.3  
1
t
2
SINGLEPULSE  
t
1
Duty Factor D =  
Peak T = P x Z  
/
t
0.1  
2
+ T  
0.02  
0
J
DM θJC  
C
0.05  
-5  
-4  
-3  
-2  
-1  
10  
10  
10  
10  
10  
1.0  
RECTANGULARPULSEDURATION(SECONDS)  
FIGURE5a,MAXIMUMEFFECTIVETRANSIENTTHERMALIMPEDANCE,JUNCTION-TO-CASEvsPULSEDURATION  
TJ (°C)  
TC (°C)  
ZEXT are the external thermal  
0.0755  
0.0893  
impedances: Case to sink, sink to  
ambient, etc. Set to zero when modeling  
only the case to junction.  
Dissipated Power  
(Watts)  
0.0135F  
0.161F  
Figure5b,TRANSIENT THERMAL IMPEDANCE MODEL  
Table 1 - Typical Series Equivalent Large Signal Input - Output Impedance  
Freq. (MHz)  
Z
() gate to gate  
ZOL () drain - drain  
in  
30  
60  
90  
120  
150  
5.2 -j10  
1.37 -j5.2  
.53 -j2.6  
.25 -j1.0  
.25 +j0.2  
41 -j20  
26 -j25  
16 -j23  
10 -j20  
6.7 -j17  
Z
- Gate -gate shunted with 25  
I
= 15mA each side  
in  
DQ  
ZOL - Conjugate of optimum load for 600 Watts peak output at V = 150V  
dd  
25% duty cycle and PW = 5ms  
ARF476FL  
+
Vdd  
-
128MHz Test amplifier  
Po = 900W @150V  
3ms pulse 10% Duty Cycle  
+
L3  
C11  
Vg1  
R3  
L2  
TL3  
C10  
C5  
C6  
R1  
T2  
TL5  
C3  
C4  
T1  
T3  
J1  
TL1  
C2  
C7  
C8  
L1  
J2  
C1  
TL2  
R4  
C9  
R2  
TL4  
TL6  
C1 25pF poly trimmer  
C2 750pF ATC 700B  
DUT  
Vg2  
C3-4 2200pF NPO 500V chip  
C5-10 10nF 500V chip  
C11 1000uF 250V electroytic  
L1 30nH 1.5t #18 enam .375" dia  
L2 680nH 12t #24 enam .312" dia  
R1-2 3.1: 3 parallel 221W 2512 SMT  
R3-4 2.2k1/4W axial  
T1 1:1 balun 50coax on Fair-Rite 2843000102 core  
T2 4:1 25coax on 2843000102 Fair-Rite balun core  
T3 1:1 coax balun RG-303 on 2861006802 Fair-Rite core  
TL1-2 Printed line L= 0.75" w =.23"  
L3 2t #20 on Fair-Rite 2643006302 bead, ~ 2uH  
TL3-6 Printed line L= 0.65" w =.23"  
0.23" wide stripline on FR-4 board is ~ 30&!Z  
o
Peak Output Power vs. Vdd and Duty Cycle  
900  
800  
700  
600  
500  
400  
300  
200  
100  
0
1.2  
Notes:  
1
Max  
Duty Cycle  
The value of L1 must be adjusted as the supply voltage is  
changed to maintain resonance in the output circuit. At  
128MHz its value changes from approximately 40nH at  
100V to 30nH at 150V.  
0.8  
0.6  
0.4  
0.2  
0
P
Watts  
With the 50drain-to-drain load, the duty cycle above  
100V must be reduced to insure power dissipation is  
within the limits of the device. Maximum pulse length  
should be 100mS or less. See transient thermal  
impedance, figure 5.  
o
80  
100  
120  
140  
160  
Drain Supply Voltage Vdd  
Thermal Considerations and Package Mounting:  
The rated power dissipation is only available when the package  
mounting surface is at 25°C and the junction temperature is 175°C.  
The thermal resistance between junctions and case mounting sur-  
face is 0.16°C/W. When installed, an additional thermal impedance  
of 0.15°C/W between the package base and the mounting surface  
is typical. Insure that the mounting surface is smooth and flat.  
Thermal joint compound must be used to reduce the effects of  
small surface irregularities. Use the minimum amount necessary to  
coat the surface. The heatsink should incorporate a copper heat  
spreader to obtain best results.  
.325 +/- .010  
1.000  
.125R  
4 pls  
.080  
.125dia  
4 pls  
.570  
ARF476FL  
.320  
The package design clamps the ceramic base to the heatsink. A  
clamped joint maintains the required mounting pressure while al-  
lowing for thermal expansion of both the base and the heat sink.  
Four 4-40 (M3) screws provide the required mounting force. T = 6  
in-lb (0.68 N-m).  
1.250  
.325  
.175  
.175  
HAZARDOUS MATERIAL WARNING  
The white ceramic portion of the device between leads  
and mounting surface is beryllium oxide, BeO. Beryllium  
oxide dust is toxic when inhaled. Care must be taken dur-  
ing handling and mounting to avoid damage to this area.  
These devices must never be thrown away with general  
industrial or domestic waste.  
.200  
.300  
.005 .040  
1.500  
Microsemi’sproductsarecoveredbyoneormoreofU.S.patents4,895,810 5,045,903 5,089,434 5,182,234 5,019,522  
5,262,336 6,503,786 5,256,583 4,748,103 5,283,202 5,231,474 5,434,095 5,528,0586,939,743andforeignpatents. USandForeignpatentspending. AllRightsReserved.  

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