ARF477FL [MICROSEMI]

RF POWER MOSFET N-CHANNEL PUSH - PULL PAIR; RF功率MOSFET N沟道PUSH - PULL PAIR
ARF477FL
型号: ARF477FL
厂家: Microsemi    Microsemi
描述:

RF POWER MOSFET N-CHANNEL PUSH - PULL PAIR
RF功率MOSFET N沟道PUSH - PULL PAIR

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Common Source  
Push-Pull Pair  
ARF477FL  
D
G
S
S
S
S
ARF477FL  
G
D
RF POWER MOSFET  
N-CHANNEL PUSH - PULL PAIR  
165V 400W 100MHz  
The ARF477FL is a matched pair of RF power transistors in a common source conguration. It is designed for high  
voltage push-pull or parallel operation in narrow band ISM and MRI power ampliers up to 100 MHz.  
High Performance Push-Pull RF Package.  
Specied 150 Volt, 65 MHz Characteristics:  
High Voltage Breakdown and Large SOA  
Output Power = 400 Watts  
Gain = 15dB (Class AB)  
Efciency = 50% min  
for Superior Ruggedness.  
Low Thermal Resistance.  
RoHS Compliant  
MAXIMUM RATINGS  
All Ratings: T = 25°C unless otherwise specied.  
C
Symbol  
Parameter  
Ratings  
500  
Unit  
VDSS  
Drain-Source Voltage  
V
VDGO  
ID  
Drain-Gate Voltage  
500  
Continuous Drain Current @ TC = 25°C (each device)  
Gate-Source Voltage  
15  
A
V
VGS  
±30  
PD  
Total Power Dissipation @ TC = 25°C  
Operating and Storage Junction Temperature Range  
Lead Temperature: 0.063” from Case for 10 Sec.  
750  
W
TJ, TSTG  
TL  
-55 to 175  
300  
°C  
Static Electrical Characteristics  
Symbol  
Parameter  
Min  
Typ  
Max  
Unit  
BVDSS  
Drain-Source Breakdown Voltage (VGS = 0V, ID = 250 μA)  
On State Drain Voltage 1 (ID(ON) = 7.5A, VGS = 10V)  
Zero Gate Voltage Drain Current (VDS = VDSS, VGS = 0V)  
Zero Gate Voltage Drain Current (VDS = 50VDSS, VGS = 0, TC = 125°C)  
Gate-Source Leakage Current (VGS = ±30V, VDS = 0V)  
Forward Transconductance (VDS = 15V, ID = 7.5A)  
500  
V
VDS(ON)  
2.9  
4
25  
IDSS  
μA  
250  
±100  
8
IGSS  
gfs  
nA  
3.5  
0.9  
3
5.6  
mhos  
gfs1/gfa2  
VGS(TH)  
VGS(TH)  
Forward Transconductance Match Ratio (VDS = 15V, ID = 5A)  
Gate Threshold Voltage (VDS = VGS, ID = 50mA)  
1.1  
5
Gate Threshold Voltage Match (VDS = VGS, ID = 50mA)  
0.2  
Volts  
Thermal Characteristics  
Symbol  
Parameter  
Min  
Typ  
0.18  
0.30  
Max  
0.2  
Unit  
RθJC  
Junction to Case  
°C/W  
RθJHS  
Junction to Sink (High Efciency Thermal Joint Compound and Planar Heat Sink Surface.)  
0.32  
CAUTION: These Devices are Sensitive to Electrostatic Discharge. Proper Handling Procedures Should Be Followed.  
Microsemi Website - http://www.microsemi.com  
DYNAMIC CHARACTERISTICS (per section)  
ARF477FL  
Symbol  
CISS  
Parameter  
Test Conditions  
VGS = 0V  
Min  
Typ  
1890  
350  
75  
Max  
Unit  
Input Capacitance  
Output Capacitance  
Reverse Transfer Capacitance  
Turn-on Delay Time  
Rise Time  
2100  
390  
90  
Coss  
VDS = 50V  
pF  
Crss  
f = 1MHz  
td(on)  
tr  
td(off)  
tf  
7
VGS = 15V  
VDD = 250V  
6
nS  
ID = ID[Cont.] @ 25°C  
Turn-off Delay Time  
Fall Time  
20  
RG = 1.6 W  
4.0  
7
Functional Characteristics  
Symbol  
Characteristic  
Test Conditions  
Min  
14  
Typ  
16  
Max  
Unit  
dB  
GPS  
Common Source Amplier Power Gain  
Drain Efciency  
f = 27MHz  
Idq = 0mA VDD = 125V  
POUT = 300W  
η
50  
55  
%
Ψ
Electrical Ruggedness VSWR 10:1  
No Degradation in Output Power  
1. Pulse Test: Pulse width < 380 μS, Duty Cycle < 2%.  
Microsemi reserves the right to change, without notice, the specications and information contained herein.  
25  
20  
15  
10  
5
5000  
VGS=15 & 10V  
9V  
8V  
Ciss  
1000  
500  
Coss  
Crss  
7V  
100  
50  
6.5V  
6V  
5.5V  
5V  
4.5V  
10  
.1  
0
0
5
10  
15  
20  
25  
30  
.5  
1
5
10  
50  
150  
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
Figure 1, Typical Output Characteristics  
Figure 2, Typical Capacitance vs. Drain-to-Source Voltage  
56.00  
16  
12  
8
TJ = -55°C  
OPERATION HERE  
LIMITED BY R  
(ON)  
DS  
VDS> ID (ON) x RDS (ON)MAX.  
250SEC. PULSE TEST  
@ <0.5 % DUTY CYCLE  
10.00  
1.00  
0.10  
4
TJ = +125°C  
T = -55°C  
TC =+25°C  
TJ =+150°C  
SINGLE PULSE  
J
TJ = +25°C →  
0
1
5
10  
VDS, DRAIN-TO-SOURCE VOLTAGE (VOLTS)  
Figure 4, Typical Maximum Safe Operating Area  
50 100  
500  
2
4
6
8
10  
VGS, GATE-TO-SOURCE VOLTAGE (VOLTS)  
Figure 3, Typical Transfer Characteristics  
ARF477FL  
0.25  
0.20  
0.15  
0.10  
D = 0.9  
0.7  
Note:  
0.5  
0.3  
t
1
t
2
0.05  
0
t
1
t
/
2
Duty Factor D =  
0.1  
Peak T = P  
x Z  
+ T  
θJC C  
J
DM  
0.05  
SINGLE PULSE  
10-3  
10-5  
10-4  
10-2  
10 -1  
1.0  
RECTANGULAR PULSE DURATION (SECONDS)  
Figure 5a, Maximum Effective Transient Thermal Impedance, Junction-To-Case vs Pulse Duration  
TJ (˚C)  
TC (˚C)  
ZEXT are the external thermal  
impedances: Case to sink,  
sink to ambient, etc. Set to  
zero when modeling only  
the case to junction.  
.108  
.0915  
Dissipated Power  
(Watts)  
.133F  
.0111F  
Figure 5b, TRANSIENT THERMAL IMPEDANCE MODEL  
Freq. (MHz)  
Zin (Ω)  
ZOUT (Ω)  
40  
60  
80  
1.5 - j 10  
1.9 - j 1.3  
2.2 - j 0.82  
24 - j 37  
13 - j 29  
7.9 - j 24  
ZIN - Gate shunted with 100Ω  
Idq = 0  
ZOL - Conjugate of optimum load for 400 Watts output at Vdd=125V  
ARF477FL  
65MHz Test Circuit  
Thermal Considerations and Package Mounting:  
The rated power dissipation is only available when the package  
mounting surface is at 25°C and the junction temperature is 175°C.  
The thermal resistance between junctions and case mounting sur-  
face is 0.23 °C/W. When installed, an additional thermal impe-  
dance of 0.07°C/W between the package base and the mounting  
surface is typical. Insure that the mounting surface is smooth and  
flat. Thermal joint compound must be used to reduce the effects of  
small surface irregularities. Use the minimum amount necessary to  
coat the surface. The heatsink should incorporate a copper heat  
spreader to obtain best results.  
.325 +/- .010  
.080  
1.000  
.125R  
4 pls  
.125dia  
4 pls  
.570  
ARF477FL  
.320  
The package design clamps the ceramic base to the heatsink. A  
clamped joint maintains the required mounting pressure while al-  
lowing for thermal expansion of both the base and the heat sink.  
Four 4-40 (M3) screws provide the required mounting force. T = 6  
in-lb (0.68 N-m).  
1.250  
.325  
.175  
.175  
HAZARDOUS MATERIAL WARNING  
The white ceramic portion of the device between leads  
and mounting surface is beryllium oxide, BeO. Beryllium  
oxide dust is toxic when inhaled. Care must be taken dur-  
ing handling and mounting to avoid damage to this area.  
These devices must never be thrown away with general  
industrial or domestic waste.  
.200  
.300  
.005 .040  
1.500  
Microsemi’s products are covered by one or more of U.S. patents 4,895,810 5,045,903 5,089,434 5,182,234 5,019,522 5,262,336 6,503,786 5,256,583  
4,748,103 5,283,202 5,231,474 5,434,095 5,528,058 6,939,743, 7,352,045 5,283,201 5,801,417 5,648,283 7,196,634 6,664,594 7,157,886 6,939,743 7,342,262  
and foreign patents. US and Foreign patents pending. All Rights Reserved.  

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