MHL117B40K-3 [MICROSEMI]
Adjustable Positive Standard Regulator;
| 型号： | MHL117B40K-3 |
| 厂家： | 
Microsemi |
| 描述： | Adjustable Positive Standard Regulator |
| 文件： | 总5页 (文件大小：132K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
MHL117 / MHL117A / MHL117B / MHL117Q
Levels Available
MHL117 / MHL117A / MHL117B / MHL117Q
SPACE
(Formerly SAT117 / SAT117A / SAT117B)
DESCRIPTION
These devices are space qualified, wide-input range linear regulators designed for
military and space flight applications. Hermetically packaged, they provide up to 1.5A
of output current. The devices also feature internal thermal shutdown, output current-
limiting circuitry and in one model ±1% initial output accuracy. These are an excellent
choice for applications requiring high radiation tolerance, low noise and high power
supply rejection ratios.
Devices are available in adjustable output voltage configurations. The adjustable
version requires only 2 external resistors to program the output from 1.25V to 37V.
Important: For the latest information, visit our website http://www.microsemi.com.
FEATURES
Rad-Tolerant to 300K rad TID (Note 1)
ELDRS effects free through 50K Rad TID (Note 1)
Wide Input Voltage: 40V
Space level screening
Excellent Temperature Stability
1% Accuracy -55°C to 125°C for MHL117A only
APPLICATIONS / BENEFITS
Adjustable over a wide range of output voltages.
Table 1 – ABSOLUTE MAXIMUM RATINGS (Tc = +25°C unless otherwise note)
(Exceeding maximum ratings may damage the device)
Parameters / Test Conditions
DC Input-Output differential
DC Output Voltage
Symbol
Vin-Vo
Vo
Value
Unit
V
40
1.2 – 37
1.5
V
Output Current
Io
A
Power Dissipation Tcase = 25°C
Thermal Resistance, Junction to Case
Storage Temperature
Pd
50
W
2.5
°C/W
°C
°C
°C
G
RJC
Tstg
Top
Tj
-65 to +150
-55 to +125
175
Operating Temperature Range
Maximum Junction Temperature
Package weight
MSC – Lawrence
6 Lake Street,
W
5
Lawrence, MA 01841
1-800-446-1158
(978) 620-2600
Maximum Soldering Temperature, 10sec
Tsolder
300
°C
Fax: (978) 689-0803
MECHANICAL and PACKAGING
See page 6 for package information.
Website:
www.microsemi.com
T4-LDS-0116 Rev. 11 (130188)
©2013 Microsemi Corporation
Page 1 of 5
MHL117 / MHL117A / MHL117B / MHL117Q
Table 2 – ELECTRICAL CHARACTERISTICS (Note 9 & 10)
(TA = -55°C to +125°C unless otherwise noted) (Nominal reference voltage is 1.265V @ 25°C)
PRE-RADIATION
MHL117A,
MHL117Q
MHL117
MHL117B
Parameters / Test Conditions
Symbol
Unit
Min. Typ Max. Min. Typ Max. Min. Typ Max.
Reference Voltage Accuracy
(Note 9)
VREF 1.200 1.25 1.300 1.238 1.25 1.262 1.225 1.25 1.275
VREF 1.200 1.25 1.300 1.225 1.25 1.275 1.200 1.25 1.300
V
Vdiff = 3.25V, IL = 10mA (5.25mA for 117)
Reference Voltage Accuracy
Vdiff = 40V, IL = 10mA
(Note 10)
(Note 7)
V
Line Regulation
(Note 2)
(Note 7)
Vout = Vref, IL = 10mA,
VLINE
Vload
IADJ
-10
-15
10
15
100
5
-10
-15
10
15
100
5
-10
-15
10
15
100
5
mV
mV
A
A
A
dB
A
3.0 Vdiff 40V
Load Regulation
Vdiff = 5.25V, 10mA IL 1.5A
(Note 2)
(Note 8)
Adjust-pin Current
(Note 7)
(Note 7)
(Note 8)
Vdiff = 3.3V – 40V, Iload = 10mA
Adjust-pin Current Change
diff = 5.25V – 40V, IL = 10mA
∆ladj
∆ladj
PSRR
los
-5
-5
-5
-5
-5
-5
V
Adjust-pin Current Change
Vdiff = 5.25V, 10mA IL 1.5A
5
5
5
Ripple Rejection
F = 120Hz, Iout = 50mA, Vdiff = 5.25V,
Vr = 2 Vp-p
65
1.5
-5
65
1.5
-5
65
1.5
-5
Short-circuit Current
Vdiff = 10V
Thermal Regulation
TA = 25°C
(Note 4)
Vrth
5
5
5
mV
Vin = 14.6V, II = 1.5A, Pd = 20W, t = 20mS
T4-LDS-0116 Rev. 11 (130188)
©2013 Microsemi Corporation
Page 2 of 5
MHL117 / MHL117A / MHL117B / MHL117Q
Table 3 – RADIATION RATING
Parameters / Test Conditions
Symbol
TID
Value
300
50
Unit
Maximum Total Dose (Dose Rate: 50 – 300 rad (Si)/s)
Krads (Si)
Krads (Si)
MeV/mg/cm2
MeV/mg/cm2
ELDRS
SET
ELDRS (Low Dose Rate 10 mrad (Si)/s)
Linear Energy Threshold, Single Event Transient < 100mV
15
Single-Event Latch-up linear Energy threshold
(Note 5)
SEL / SEB
87.4
Application Circuits
Formula for Vout
VO = 1.25(1 + Radj / R1) + IADJRADJ
Vo
117
Vin
R1 = 121Ω
Adj
Radj
T4-LDS-0116 Rev. 11 (130188)
©2013 Microsemi Corporation
Page 3 of 5
MHL117 / MHL117A / MHL117B / MHL117Q
Table 4 – SCREENING OPTIONS
Screening Levels
MIL-STD-883
Method
TESTS
SPACE
MIL-PRF-38534 Certified
100 % Non-Destruct Wire-Pull
Pre-Cap Visual
100%
100%
100%
100%
100%
100%
2023
2017
1010
2001
2020
Temperature Cycle
Constant Acceleration
PIND
Pre-Burn-In Electrical (TA = 25°C)
Burn-In
100%
(320 hours)
1015
Final Electrical
100%
100%
100%
100%
Hermeticity (Fine & Gross Leak)
X-Ray (Note 11)
1014
2012
2009
External Visual
NOTES:
1. At the time of publication of this datasheet, Microsemi did not have a DSCC certified MIL-PRF-
38534 radiation hardness assurance program.
2. Load & Line regulation are measured at constant (Tj) junction temperature using a low duty cycle
pulse. Changes in output voltage due to heating effects must be evaluated separately.
3. TID Radiation Testing is performed per MIL-STD-883, Method 1019. “ELDRS tested per MIL-STD-
883 method 1019 par. 3.13.11.
4. Not Tested.
5. Latch up immune due to DI process.
6. Internal SOA protection limits output current with high input voltages.
7. Vdiff = 39V @ 125°C
8. At 125°C, 1.5A is achievable at an I/O differential of 6.75V. At the stated 5.25V differential, 1.25A is
achievable at 125°C.
9. For MHL117Q, these specifications hold at 25°C only.
10. For MHL117Q, these specifications hold also for the above input conditions at temperature
extremes.
11. Performed at a DLA approved facility.
T4-LDS-0116 Rev. 11 (130188)
©2013 Microsemi Corporation
Page 4 of 5
MHL117 / MHL117A / MHL117B / MHL117Q
PACKAGE OUTLINE – TABLESS TO-257 (D2)
0.210 Max.
0.420 Max.
Pin No Pin Name
Pin Description
1
2
3
ADJ/GND Adjust Pin or Ground for fixed versions
CASE
OUT
IN
Output Voltage
Input Voltage
Case
No Connection- Isolated
(SMT lead bend shown)
ORDERING INFORMATION
PART NUMBER
REGULATOR ACCURACY
40V Standard
MHL117 40K
MHL117A 40K
MHL117B 40K
MHL117Q 40K
40V 1% Accuracy
40V 2% Accuracy
40V 1% Accuracy at 25°C,
2% Accuracy at temperature extremes
Lead Bend Type
-1 Straight
-2 SMT
-3 Up
-4 Down
T4-LDS-0116 Rev. 11 (130188)
©2013 Microsemi Corporation
Page 5 of 5
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