MTP5N40EWC [MOTOROLA]

5A, 400V, 1ohm, N-CHANNEL, Si, POWER, MOSFET, TO-220AB;
MTP5N40EWC
型号: MTP5N40EWC
厂家: MOTOROLA    MOTOROLA
描述:

5A, 400V, 1ohm, N-CHANNEL, Si, POWER, MOSFET, TO-220AB

晶体 晶体管 功率场效应晶体管
文件: 总8页 (文件大小:261K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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by MTP5N40E/D  
SEMICONDUCTOR TECHNICAL DATA  
Motorola Preferred Device  
N–Channel Enhancement–Mode Silicon Gate  
TMOS POWER FET  
5.0 AMPERES  
400 VOLTS  
This advanced high voltage TMOS E–FET is designed to  
withstand high energy in the avalanche mode and switch efficiently.  
This new high energy device also offers a drain–to–source diode  
with fast recovery time. Designed for high voltage, high speed  
switching applications such as power supplies, PWM motor  
controls and other inductive loads, the avalanche energy capability  
is specified to eliminate the guesswork in designs where inductive  
loads are switched and offer additional safety margin against  
unexpected voltage transients.  
R
= 1.0 OHM  
DS(on)  
Avalanche Energy Capability Specified at Elevated  
Temperature  
D
Low Stored Gate Charge for Efficient Switching  
Internal Source–to–Drain Diode Designed to Replace External  
Zener Transient Suppressor — Absorbs High Energy in the  
Avalanche Mode  
G
Source–to–Drain Diode Recovery Time Comparable to Discrete  
Fast Recovery Diode  
S
CASE 221A–06, Style 5  
TO–220AB  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
C
Rating  
Symbol  
Value  
400  
Unit  
Vdc  
Vdc  
Drain–Source Voltage  
V
DSS  
Drain–Gate Voltage (R  
GS  
= 1.0 M)  
V
DGR  
400  
Gate–Source Voltage — Continuous  
Gate–Source Voltage — Non–repetitive  
V
±20  
±40  
Vdc  
Vpk  
GS  
V
GSM  
Drain Current — Continuous  
Drain Current — Pulsed  
I
5.0  
12  
Adc  
D
I
DM  
Total Power Dissipation @ T = 25°C  
Derate above 25°C  
P
D
75  
0.6  
Watts  
W/°C  
C
Operating and Storage Temperature Range  
T , T  
55 to 150  
°C  
J
stg  
UNCLAMPED DRAIN–TO–SOURCE AVALANCHE CHARACTERISTICS (T < 150°C)  
J
Single Pulse Drain–to–Source Avalanche Energy — T = 25°C  
W
W
(1)  
(2)  
290  
46  
7.4  
mJ  
J
DSR  
Single Pulse Drain–to–Source Avalanche Energy — T = 100°C  
J
Repetitive Pulse Drain–to–Source Avalanche Energy  
DSR  
THERMAL CHARACTERISTICS  
Thermal Resistance — Junction to Case  
Thermal Resistance — Junction to Ambient°  
R
R
1.67  
62.5  
°C/W  
°C  
θJC  
θJA  
Maximum Lead Temperature for Soldering Purposes, 1/8from case for 10 seconds  
T
260  
L
(1) V  
DD  
= 50 V, I = 5.0 A  
D
(2) Pulse Width and frequency is limited by T (max) and thermal response  
J
Designer’s Data for “Worst Case” Conditions — The Designer’s Data Sheet permits the design of most circuits entirely from the information presented. SOA Limit  
curves — representing boundaries on device characteristics — are given to facilitate “worst case” design.  
E–FET and Designer’s are trademarks of Motorola, Inc. TMOS is a registered trademark of Motorola, Inc.  
Preferred devices are Motorola recommended choices for future use and best overall value.  
REV 1  
Motorola, Inc. 1996  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
J
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
Drain–to–Source Breakdown Voltage  
V
400  
Vdc  
(BR)DSS  
(V  
GS  
= 0, I = 250 µAdc)  
D
Zero Gate Voltage Drain Current  
I
mAdc  
DSS  
(V  
DS  
(V  
DS  
= 400 V, V  
= 320 V, V  
= 0)  
0.25  
1.0  
GS  
GS  
= 0, T = 125°C)  
J
Gate–Body Leakage Current, Forward (V  
GSF  
= 20 Vdc, V  
DS  
= 0)  
= 0)  
I
100  
100  
nAdc  
nAdc  
GSSF  
Gate–Body Leakage Current, Reverse (V  
= 20 Vdc, V  
DS  
I
GSR  
GSSR  
ON CHARACTERISTICS*  
Gate Threshold Voltage  
V
Vdc  
GS(th)  
(V  
= V , I = 250 µAdc)  
2.0  
1.5  
4.0  
3.5  
DS  
GS  
D
(T = 125°C)  
J
Static Drain–Source On–Resistance (V  
GS  
= 10 Vdc, I = 2.5 Adc)  
R
V
0.8  
1.0  
Ohm  
Vdc  
D
DS(on)  
Drain–Source On–Voltage (V  
GS  
= 10 Vdc)  
DS(on)  
(I = 5.0 A)  
6.2  
5.0  
D
(I = 2.5 A, T = 100°C)  
D
J
Forward Transconductance (V  
DS  
= 15 Vdc, I = 2.5 Adc)  
g
2.0  
mhos  
pF  
D
FS  
DYNAMIC CHARACTERISTICS  
Input Capacitance  
C
775  
96  
iss  
(V  
DS  
= 25 V, V = 0,  
GS  
f = 1.0 MHz)  
Output Capacitance  
C
oss  
Transfer Capacitance  
C
22  
rss  
SWITCHING CHARACTERISTICS*  
Turn–On Delay Time  
t
24  
34  
60  
36  
27  
3.5  
14  
32  
ns  
d(on)  
(V  
DD  
= 250 V, I 5.0 A,  
D
Rise Time  
t
r
R
= 12 , R = 50 ,  
L
G
V
Turn–Off Delay Time  
Fall Time  
t
d(off)  
= 10 V)  
GS(on)  
t
f
Total Gate Charge  
Gate–Source Charge  
Gate–Drain Charge  
Q
nC  
g
(V  
DS  
= 320 V, I = 5.0 A,  
D
Q
Q
gs  
V
GS  
= 10 V)  
gd  
SOURCE–DRAIN DIODE CHARACTERISTICS*  
Forward On–Voltage  
V
**  
1.4  
Vdc  
ns  
SD  
Forward Turn–On Time  
Reverse Recovery Time  
(I = 5.0 A, di/dt = 100 A/µs)  
S
t
on  
t
660  
rr  
INTERNAL PACKAGE INDUCTANCE  
Internal Drain Inductance  
(Measured from the contact screw on tab to center of die)  
(Measured from the drain lead 0.25from package to center of die)  
L
d
nH  
3.5  
4.5  
Internal Source Inductance  
(Measured from the source lead 0.25from package to source bond pad)  
L
s
7.5  
*Indicates Pulse Test: Pulse Width = 300 µs Max, Duty Cycle 2.0%.  
**Limited by circuit inductance.  
2
Motorola TMOS Power MOSFET Transistor Device Data  
TYPICAL ELECTRICAL CHARACTERISTICS  
1.2  
10  
8
V = 10 V  
GS  
7 V  
T
= 25°C  
J
V
I
= V  
GS  
DS  
= 0.25 mA  
1.1  
D
6 V  
6
4
2
0
1
0.9  
5 V  
0.8  
4 V  
0
4
8
12  
16  
20  
–50  
–25  
0
25  
50  
75  
100  
C)  
125  
150  
V
, DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
T , JUNCTION TEMPERATURE (  
°
DS  
J
Figure 1. On–Region Characteristics  
Figure 2. Gate–Threshold Voltage Variation  
With Temperature  
10  
8
1.2  
V
10 V  
DS  
V
= 0  
GS  
= 0.25 mA  
I
D
1.1  
1
6
4
T
= 25°C  
0.9  
0.8  
J
2
125°C  
–55°C  
0
0
2
4
6
8
10  
–50  
0
50  
100  
150  
200  
V
, GATE–TO–SOURCE VOLTAGE (VOLTS)  
T , JUNCTION TEMPERATURE (  
°C)  
GS  
J
Figure 3. Transfer Characteristics  
Figure 4. Breakdown Voltage Variation  
With Temperature  
2
2.5  
2
V
= 10 V  
GS  
= 2.5 A  
T
= 100°C  
1.6  
J
I
D
1.2  
0.8  
0.4  
0
1.5  
1
25°C  
–55°C  
0.5  
V
= 10 V  
GS  
0
0
2
4
6
8
10  
–50  
0
50  
100  
150  
200  
I
, DRAIN CURRENT (AMPS)  
T , JUNCTION TEMPERATURE (°C)  
D
J
Figure 5. On–Resistance versus Drain Current  
Figure 6. On–Resistance Variation  
With Temperature  
Motorola TMOS Power MOSFET Transistor Device Data  
3
SAFE OPERATING AREA INFORMATION  
100  
10  
1
14  
12  
V
= 20 V  
GS  
SINGLE PULSE  
T
= 25°C  
C
10  
µ
s
10  
8
0.1 ms  
1 ms  
6
4
T
150°C  
J
R
LIMIT  
DS(on)  
10 ms  
dc  
THERMAL LIMIT  
PACKAGE LIMIT  
2
0
0.1  
1
10  
100  
1000  
0
100  
V , DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
DS  
200  
300  
400  
500  
V
, DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
DS  
Figure 7. Maximum Rated Forward Biased  
Safe Operating Area  
Figure 8. Maximum Rated Switching  
Safe Operating Area  
10000  
1000  
FORWARD BIASED SAFE OPERATING AREA  
V
= 250 V  
= 5 A  
= 10 V  
DD  
The FBSOA curves define the maximum drain–to–source  
voltage and drain current that a device can safely handle  
when it is forward biased, or when it is on, or being turned on.  
Because these curves include the limitations of simultaneous  
high voltage and high current, up to the rating of the device,  
they are especially useful to designers of linear systems. The  
curves are based on a case temperature of 25°C and a maxi-  
mum junction temperature of 150°C. Limitations for repetitive  
pulses at various case temperatures can be determined by  
using the thermal response curves. Motorola Application  
Note, AN569, “Transient Thermal Resistance–General Data  
and Its Use” provides detailed instructions.  
I
V
D
t
d(off)  
GS  
= 25°C  
T
J
t
t
f
r
t
d(on)  
100  
10  
1
10  
100  
1000  
SWITCHING SAFE OPERATING AREA  
R
, GATE RESISTANCE (OHMS)  
G
The switching safe operating area (SOA) of Figure 8 is the  
boundary that the load line may traverse without incurring  
damage to the MOSFET. The fundamental limits are the  
Figure 9. Resistive Switching Time  
Variation versus Gate Resistance  
peakcurrent,I  
andthebreakdownvoltage,V  
.The  
DM  
(BR)DSS  
switching SOA shown in Figure 8 is applicable for both turn–  
on and turn–off of the devices for switching times less than  
one microsecond.  
1
D = 0.5  
0.5  
0.3  
0.2  
0.2  
0.1  
P
0.1  
(pk)  
R
R
(t) = r(t) R  
θ
θ
θ
JC  
JC  
JC  
°C/W MAX  
0.05  
= 1.67  
0.05  
0.02  
D CURVES APPLY FOR POWER  
PULSE TRAIN SHOWN  
READ TIME AT t  
t
1
0.03  
1
(pk)  
t
2
0.02  
0.01  
T
– T = P  
C
R
(t)  
JC  
J(pk)  
θ
DUTY CYCLE, D = t /t  
1 2  
SINGLE PULSE  
0.01  
0.01  
0.02  
0.05  
0.1  
0.2  
0.5  
1
2
5
10  
20  
50  
100  
200  
500  
1000  
t, TIME (ms)  
Figure 10. Thermal Response  
4
Motorola TMOS Power MOSFET Transistor Device Data  
2000  
1500  
1000  
500  
16  
12  
8
T
= 25°C  
= 5 A  
T
V
= 25  
°
C
J
J
I
= 0  
D
V
= 100 V  
GS  
DS  
200 V  
320 V  
C
rss  
C
iss  
4
0
V
= 0 V  
DS  
C
oss  
0
0
10  
20  
30  
40  
50  
10  
5
0
5
10  
15  
20  
25  
V
V
DS  
GS  
Q , TOTAL GATE CHARGE (nC)  
g
GATE–TO–SOURCE OR DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
Figure 12. Gate Charge versus  
Gate–To–Source Voltage  
Figure 11. Capacitance Variation  
COMMUTATING SAFE OPERATING AREA (CSOA)  
The Commutating Safe Operating Area (CSOA) of  
Figure 14 defines the limits of safe operation for commutated  
source–drain current versus re–applied drain voltage when  
the source–drain diode has undergone forward bias. The  
Stray inductances in Motorola’s test circuit are assumed to  
be practical minimums. dV /dt in excess of 10 V/ns was at-  
DS  
tained with dI /dt of 400 A/µs.  
s
15 V  
curve shows the limitations of I  
and peak V for a given  
FM  
DS  
V
GS  
rate of change of source current. It is applicable when wave-  
forms similar to those of Figure 11 are present. Full or half–  
bridge PWM DC motor controllers are common applications  
requiring CSOA data.  
0
I
FM  
dl /dt  
s
90%  
I
Device stresses increase with increasing rate of change of  
S
t
rr  
source current so dI /dt is specified with a maximum value.  
10%  
s
Higher values of dI /dt require an appropriate derating of I  
,
s
FM  
t
I
on  
peak V  
or both. Ultimately dI /dt is limited primarily by de-  
vice, package, and circuit impedances. Maximum device  
RM  
DS  
s
0.25 I  
RM  
stress occurs during t as the diode goes from conduction to  
reverse blocking.  
rr  
V
DS(pk)  
V
isthepeakdrain–to–sourcevoltagethatthedevice  
DS(pk)  
must sustain during commutation; I  
V
R
is the maximum for-  
FM  
ward source–drain diode current just prior to the onset of  
commutation.  
dV /dt  
DS  
V
DS  
V
dsL  
V
f
V
is specified at 80% of V  
to ensure that the  
R
(BR)DSS  
CSOA stress is maximized as I decays from I  
R
to zero.  
S
RM  
MAX. CSOA  
STRESS AREA  
should be minimized during commutation. T has only  
GS  
J
a second order effect on CSOA.  
Figure 15. Commutating Waveforms  
6
R
GS  
DUT  
4
V
R
I
I
S
L
i
FM  
+
di/dt  
90 A/µs  
V
2
0
DS  
+
20 V  
V
GS  
0
100  
200  
300  
400  
500  
V
= 80% OF RATED V  
= V + L dl /dt  
R
DS  
V
V
, DRAIN–TO–SOURCE VOLTAGE (VOLTS)  
dsL  
f
i
s
DS  
Figure 13. Commutating Safe Operating Area (CSOA)  
Figure 14. Commutating Safe Operating Area  
Test Circuit  
Motorola TMOS Power MOSFET Transistor Device Data  
5
V
(BR)DSS  
V
ds(t)  
I
O
L
I
D(t)  
V
C
DS  
4700 µF  
250 V  
I
D
V
DD  
V
DD  
t
t
t, (TIME)  
P
R
GS  
50  
V
(BR)DSS  
1
2
2
L I  
O
W
DSR  
V
– V  
DD  
(BR)DSS  
Figure 16. Unclamped Inductive Switching  
Test Circuit  
Figure 17. Unclamped Inductive Switching  
Waveforms  
RESISTIVE SWITCHING  
V
DD  
t
t
off  
on  
t
t
R
t
f
t
d(off)  
d(on)  
L
r
90%  
90%  
V
out  
OUTPUT, V  
INVERTED  
out  
V
in  
PULSE GENERATOR  
DUT  
10%  
z = 12  
R
gen  
50  
90%  
50%  
50  
50%  
INPUT, V  
in  
10%  
PULSE WIDTH  
* Note:TheMirrorisshortedtotheKelvinterminalforthistest.  
Figure 18. Switching Test Circuit  
Figure 19. Switching Waveforms  
+18 V  
V
DD  
1 mA  
SAME  
DEVICE TYPE  
AS DUT  
47 k  
100 k  
10 V  
V
15 V  
in  
2N3904  
0.1 µF  
2N3904  
100 k  
FERRITE  
BEAD  
47 k  
100  
DUT  
V
= 15 V ; PULSE WIDTH 100 µs, DUTY CYCLE 10%  
pk  
in  
Figure 20. Gate Charge Test Circuit  
6
Motorola TMOS Power MOSFET Transistor Device Data  
PACKAGE DIMENSIONS  
NOTES:  
SEATING  
PLANE  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
–T–  
2. CONTROLLING DIMENSION: INCH.  
3. DIMENSION Z DEFINES A ZONE WHERE ALL  
BODY AND LEAD IRREGULARITIES ARE  
ALLOWED.  
C
S
B
F
T
4
INCHES  
MIN  
MILLIMETERS  
DIM  
A
B
C
D
F
G
H
J
K
L
N
Q
R
S
MAX  
0.620  
0.405  
0.190  
0.035  
0.147  
0.105  
0.155  
0.025  
0.562  
0.060  
0.210  
0.120  
0.110  
0.055  
0.255  
0.050  
–––  
MIN  
14.48  
9.66  
4.07  
0.64  
3.61  
2.42  
2.80  
0.46  
12.70  
1.15  
4.83  
2.54  
2.04  
1.15  
5.97  
0.00  
1.15  
–––  
MAX  
15.75  
10.28  
4.82  
0.88  
3.73  
2.66  
3.93  
0.64  
14.27  
1.52  
5.33  
3.04  
2.79  
1.39  
6.47  
1.27  
–––  
A
K
Q
Z
0.570  
0.380  
0.160  
0.025  
0.142  
0.095  
0.110  
0.018  
0.500  
0.045  
0.190  
0.100  
0.080  
0.045  
0.235  
0.000  
0.045  
–––  
STYLE 5:  
1
2
3
U
PIN 1. GATE  
2. DRAIN  
3. SOURCE  
4. DRAIN  
H
L
R
V
J
G
T
U
V
D
N
Z
0.080  
2.04  
CASE 221A–06  
ISSUE Y  
Motorola TMOS Power MOSFET Transistor Device Data  
7
Motorolareserves the right to make changes without further notice to any products herein. Motorola makes no warranty, representationorguaranteeregarding  
the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit,  
andspecifically disclaims any and all liability, includingwithoutlimitationconsequentialorincidentaldamages. “Typical” parameters can and do vary in different  
applications. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. Motorola does  
not convey any license under its patent rights nor the rights of others. Motorola products are not designed, intended, or authorized for use as components in  
systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of  
the Motorola product could create a situation where personal injury or death may occur. Should Buyer purchase or use Motorola products for any such  
unintendedor unauthorized application, Buyer shall indemnify and hold Motorola and its officers, employees, subsidiaries, affiliates, and distributors harmless  
against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death  
associated with such unintended or unauthorized use, even if such claim alleges that Motorola was negligent regarding the design or manufacture of the part.  
Motorola and  
are registered trademarks of Motorola, Inc. Motorola, Inc. is an Equal Opportunity/Affirmative Action Employer.  
How to reach us:  
USA / EUROPE: Motorola Literature Distribution;  
JAPAN: Nippon Motorola Ltd.; Tatsumi–SPD–JLDC, Toshikatsu Otsuki,  
P.O. Box 20912; Phoenix, Arizona 85036. 1–800–441–2447  
6F Seibu–Butsuryu–Center, 3–14–2 Tatsumi Koto–Ku, Tokyo 135, Japan. 03–3521–8315  
MFAX: RMFAX0@email.sps.mot.com – TOUCHTONE (602) 244–6609  
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HONG KONG: Motorola Semiconductors H.K. Ltd.; 8B Tai Ping Industrial Park,  
51 Ting Kok Road, Tai Po, N.T., Hong Kong. 852–26629298  
MTP5N40E/D  

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