GCG155L81H561KA02# [MURATA]

汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C];


型号：	GCG155L81H561KA02#
厂家：	muRata
描述：	汽车[动力总成 / 安全设备],汽车[信息娱乐 / 舒适设备],植入式以外的医疗器械设备 [GHTF A/B/C] 医疗医疗器械
文件：	总17页 (文件大小：664K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

AgPd Termination Conductive Glue Mounting Chip Multilayer Ceramic Capacitors for Automotive

GCG155L81H561KA02_ (0402, X8L:EIA, 560pF, DC50V)

_: packaging code

Reference Sheet

1.Scope

This product specification is applied to Chip Multilayer Ceramic Capacitors limited to Conductive Glue Mounting used for Automotive Electronic equipment.

ꢀꢀ

2.MURATA Part NO. System

(Ex.)

GCG

561

A02

(2)T

Dimensions

(1)L/W

Dimensions

(4)Rated

Voltage

(3)Temperature

Characteristics

(6)Capacitance

Tolerance

(7)Murata’s Control

(5)Nominal

Capacitance

(8)Packaging Code

Code

3. Type & Dimensions

(Unit:mm)

(1)-1 L

1.0±0.1

(1)-2 W

0.5±0.05

(2) T

0.5±0.05

0.15 to 0.35

0.3 min.

4.Rated value

(3) Temperature Characteristics

(Public STD Code):X8L(EIA)

Specifications and Test

Methods

(4)

Rated

Voltage

(6)

(5) Nominal

Capacitance

Tolerance

(Operating

Temp. Range)

Temp. coeff

orꢀCap. Change

Temp. Range

(Ref.Temp.)

-55 to 150 °C

(25 °C)

DC 50 V

560 pF

±10 %

-40 to 15 %

-55 to 150 °C

5.Package

mark

(8) Packaging

Packaging Unit

f180mm Reel

PAPER W8P2

f180mm Reel

PAPER W8P1

f330mm Reel

PAPER W8P2

10000 pcs./Reel

20000 pcs./Reel

50000 pcs./Reel

Product specifications in this catalog are as of Apr.6,2018,and are subject to change or obsolescence without notice.

Please consult the approval sheet before ordering.

Please read rating and !Cautions first.

GCG155L81H561KA02-01

■AEC-Q200 Murata Standard Specification and Test Methods

Specification.

AEC-Q200 Test Item

AEC-Q200 Test Method

High Dielectric Type

Temperature

Compensating Type

Pre-and Post-Stress

Electrical Test

High Temperature

Exposure (Storage)

The measured and observed characteristics should satisfy the

specifications in the following table.

Fix the capacitor to the test substrate in the same manner and

under the same conditions as No.16.

Appearance No marking defects

Set the capacitor for 1000+/-12hours at 150+/-3℃.

Set for 24+/-2hours at room temperature, then measure.

Capacitance Within +/-2.5% or +/-0.25pF

Within +/-12.5%

R7/L8 : 0.05 max.

・ Initial measurement for high dielectric constant type

Change

(Whichever is larger)

Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit

for 24+/-2hours at room temperature. Perform the initial measurement.

Q or D.F.

30pF min. : Q≧1000

30pF max.: Q ≧400+20C

C: Nominal Capacitance(pF)

: 0.075 max.

I.R.

More than 10000MΩ or 500Ω・ F (Whichever is smaller)

R9 : More than 3000MΩ or 150 Ω・ F (Whichever is smaller)

25℃

Temperature Cycling

The measured and observed characteristics should satisfy the

specifications in the following table.

Fix the capacitor to the test substrate in the same manner and

under the same conditions as No.16. Perform the 1000 cycles

according to the four heat treatments listed in the following table.

Set for 24+/-2hours at room temperature, then measure.

Appearance No marking defects

Capacitance Within +/-2.5% or +/-0.25pF

Within +/-10.0%

Step

Change

(Whichever is larger)

Temp.

Min. Operating

Temp.+0/-3

Room

Max. Operating

Temp.+3/-0

Room

(℃)

Temp.

Q or D.F.

30pF min. : Q≧1000

R7/L8 W.V.: 25Vmin.: 0.03 max.

ꢀꢀꢀꢀꢀW.V.: 16Vꢀꢀ : 0.05 max

R9 : 0.075 max.

30pF max.: Q ≧400+20C

C: Nominal Capacitance (pF)

Time

15+/-3

(min)

・ Initial measurement for high dielectric constant type

I.R.

More than 10000MΩ or 500Ω・F

Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit

25℃

(Whichever is smaller)

for 24+/-2hours at room temperature. Perform the initial measurement.

Destructive

No defects or abnormalities

Per EIA-469.

Physical Analysis

Moisture Resistance

The measured and observed characteristics should satisfy the

specifications in the following table.

Fix the capacitor to the test substrate in the same manner and

under the same conditions as No.16.

Apply the 24-hour heat (25℃ to 65℃) and humidity (80%RH to 98%RH)

treatment shown below, 10 consecutive times.

Appearance No marking defects

Set for 24+/-2hours at room temperature, then measure.

Humidity

80～98%

Humidity

80～98%

Temperature

Humidity

90～98%

Humidity

90～98%

Humidity

90～98%

(℃)

Capacitance Within +/-3.0% or +/-0.30pF

Within +/-12.5%

R7/L8 : 0.05 max.

Change

(Whichever is larger)

Q or D.F.

30pF min. : Q≧350

10pF and over, 30pF and below:

Q≧275+5C/2

: 0.075 max.

+10

- 2 ℃

10pF max.: Q ≧200+10C

C: Nominal Capacitance(pF)

Initial measuremt

-5

-10

I.R.

More than 10000MΩ or 500Ω・ F (Whichever is smaller)

R9 : More than 3000MΩ or 150 Ω・ F (Whichever is smaller)

One cycle 24hours

25℃

10 11 12 13 14 15 16 17 18 19 20 21 22 23 24

Hours

・ Initial measurement for high dielectric constant type

Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit

for 24+/-2hours at room temperature. Perform the initial measurement.

The measured and observed characteristics should satisfy the

specifications in the following table.

Biased Humidity

Fix the capacitor to the test substrate in the same manner and

under the same conditions as No.16.

Apply the rated voltage and 1.3+0.2/-0Vdc (add 6.8kΩ resister)

Appearance No marking defects

at 85+/-3℃ and 80%RH to 85%RH humidity for 1000+/-12hours.

Remove and set for 24+/-2hours at room temperature, then measure.

The charge/discharge current is less than 50mA.

Capacitance Within +/-3.0% or +/-0.30pF

Within +/-12.5%

R7/L8 : 0.05 max.

Change

(Whichever is larger)

Q or D.F.

30pF and over: Q≧200

・ Initial measurement for high dielectric constant type

30pF and below: Q≧100+10C/3

C: Nominal Capacitance(pF)

More than 1000MΩ or 50Ω・F

(Whichever is smaller)

: 0.075 max.

Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit

for 24+/-2hours at room temperature. Perform the initial measurement.

I.R.

25℃

JEMCGS-01499D

■AEC-Q200 Murata Standard Specification and Test Methods

Specification.

AEC-Q200 Test Item

AEC-Q200 Test Method

Temperature

Compensating Type

High Dielectric Type

The measured and observed characteristics should satisfy the

specifications in the following table.

Operational Life

Fix the capacitor to the test substrate in the same manner and

under the same conditions as No.16.

Appearance

No marking defects

Apply 200% of the rated voltage for 1000+/-12 hours at maximum operating

temperature +/-3℃.

Capacitance

Change

Within +/-3.0% or +/-0.30pF

(Whichever is larger)

30pF min. : Q≧350

Within +/-12.5%

Set for 24+/-2hours at room temperature, then measure.

The charge/discharge current is less than 50mA.

Q or D.F.

R7/L8 : 0.05 max.

10pF and over, 30pF and below: R9

Q≧275+5C/2

: 0.075 max.

・ Initial measurement for high dielectric constant type.

Apply the test voltage at the maximum operating temperature +/-3°C

for 1 hour and then let sit for 24+/-2hours at room temperature,

then measure.

10pF max.: Q ≧200+10C

C: Nominal Capacitance(pF)

More than 1,000MΩ or 50Ω・F

(Whichever is smaller)

I.R.

25℃

External Visual

No defects or abnormalities

Visual inspection

Physical Dimension

Within the specified dimensions

Using Measuring instrument of dimension.

10 Resistance to Appearance No marking defects

Solvents

Per MIL-STD-202 Method 215

Solvent 1 : 1 part (by volume) of isopropyl alcohol

3 parts (by volume) of mineral spirits

Capacitance Within the specified initial value.

Solvent 2 : Terpene defluxer

Q or D.F.

Within the specified initial value.

Solvent 3 : 42 parts (by volume) of water

1part (by volume) of propylene glycol monomethyl ether

1 part (by volume) of monoethanolamine

I.R.

More than 10000MΩ or 500Ω・F

25℃

(Whichever is smaller)

11 Mechanical

Shock

Appearance No marking defects

Fix the capacitor to the test substrate in the same manner and

same conditions as No.16.

Capacitance Within the specified initial value.

Three shocks in each direction should be applied along 3 mutually

perpendicular axes of the test specimen (18 shocks).

The specified test pulse should be Half-sine and should have a

duration :0.5ms, peak value:1500g and velocity change: 4.7m/s.

Q or D.F.

Within the specified initial value.

I.R.

More than 10000MΩ or 500Ω・F

25℃

(Whichever is smaller)

12 Vibration

Appearance No marking defects

Fix the capacitor to the test substrate in the same manner and

same conditions as No.16.

Capacitance Within the specified initial value.

The capacitor should be subjected to a simple harmonic motion having

a total amplitude of 1.5mm, the frequency being varied uniformly

between the approximate limits of 10Hz and 2000Hz.

The frequency range, from 10Hz to 2000Hz and return to 10Hz,

should be traversed in approximately 20 minutes.

Q or D.F.

Within the specified initial value.

I.R.

More than 10000MΩ or 500Ω・F

25℃

This motion should be applied for 12 cycles in each 3 mutually

perpendicular directions (total of 36 times).

(Whichever is smaller)

13 Thermal Shock

The measured and observed characteristics should satisfy the

specifications in the following table.

Fix the capacitor to the test substrate in the same manner and

under the same conditions as No.16.

Appearance No marking defects

Perform the 300 cycles according to the two heat treatments listed

in the following table(Maximum transfer time is 20seconds).

Set for 24+/-2hours at room temperature, then measure.

Capacitance

Change

Within +/-2.5% or +/-0.25pF

Within +/-10.0%

(Whichever is larger)

Step

Temp.(℃）

Min. Operating Temp.+0/-3

Max. Operating Temp.+3/-0

Q or D.F.

30pF min. : Q≧1000

R7/L8 : W.V.: 25V min.: 0.025 max.*

*GCG21BL81H104K: 0.03 max.

W.V.: 16V : 0.035 max.

Time

(min）

15+/-3

30pF max.: Q ≧400+20C

C: Nominal Capacitance(pF)

R9 : 0.075 max.

・ Initial measurement for high dielectric constant type

Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit

for 24+/-2hours at room temperature. Perform the initial measurement.

I.R.

More than 10000MΩ or 500Ω・F

25℃

(Whichever is smaller)

JEMCGS-01499D

■AEC-Q200 Murata Standard Specification and Test Methods

Specification.

AEC-Q200 Test Item

AEC-Q200 Test Method

Temperature

Compensating Type

High Dielectric Type

14 ESD

Appearance

Capacitance

Q or D.F.

No marking defects

Per AEC-Q200-002

Within the specified initial value.

More than 10000MΩ or 500Ω・F

I.R.

25℃

(Whichever is smaller)

15 Electrical Appearance

Chatacteri-

No defects or abnormalities

Visual inspection.

The capacitance/Q/D.F. should be measured at 25℃ at the

zation

Capacitance

Shown in Rated value.

frequency and voltage shown in the table.

Q or D.F.

30pF min. : Q≧1000

R7/L8 : W.V.: 25Vmin.: 0.025 max.

W.V.: 16Vꢀꢀꢀ : 0.035 max.

R9 : 0.075 max.

Char.

ΔC,5G

(more than 1000pF)

R7,R9,L8(C≦10μF)

ΔC,5G

(1000 pF and below)

30pF max.: Q ≧400+20C

C: Nominal Capacitance(pF)

Item

Frequency

Voltage

1.0+/-0.1MHz

1.0+/-0.1kHz

1.0+/-0.2Vrms

0.5Vrms to 5Vrms

The insulation resistance should be measured with a DC voltage not

exceeding the rated voltage at 25℃ and 125℃(for ΔC/R7)/ 150℃

（for 5G/L8/R9）within 2 minutes of charging.

I.R.ꢀ25℃

More than 100000MΩ or 1000Ω・F

More than 10000MΩ or 500Ω・F

(Whichever is smaller)

The charge/discharge current is less than 50mA.

I.R.ꢀ125℃

I.R.ꢀ150℃

More than 10000MΩ or 100Ω・F

More than 1000MΩ or 10Ω・F

(Whichever is smaller)

More than 10000MΩ or 100Ω・F

More than 1000MΩ or 1Ω・F

(Whichever is smaller)

No failure should be observed when 250% of the rated voltage is

applied between the terminations for 1 second to 5 seconds.

The charge/discharge current is less than 50mA.

Dielectric

Strength

No failure

16 Terminal

Strength

Appearance

Capacitance

Q or D.F.

No marking defects

Mount the capacitor on the test substrate in Fig.1 using a conductive glue

(HEREAUS"PC3000").

Within the specified initial value.

The conductive glue is hardened at 140℃ for 30 minites.

Then apply *shear tension in parallel with the test substrate for 60 seconds.

*Show in the table 1

I.R.

More than 10000MΩ or 500Ω・F

Series

GCG15

GCG18

GCG21

GCG31

GCG32

Share Tension

2.0N

25℃

(Whichever is smaller)

2.7N

4.9N

6.9N

12.6N

Table.1

Ag Pd electrode

Alumina

Series

GCG15

GCG18

GCG21

GCG31

GCG32

0.4

1.0

1.2

2.2

1.5

3.0

4.0

5.0

0.5

1.2

1.65

2.0

2.9

Fig.1

（in mm）

JEMCGS-01499D

■AEC-Q200 Murata Standard Specification and Test Methods

Specification.

AEC-Q200 Test Item

AEC-Q200 Test Method

High Dielectric Type

Temperature

Compensating Type

Place the capacitor in the beam load fixture as Fig 2.

Apply a force.

17 Beam Load Test

Destruction value should be exceed following one.

< Chip L dimension : 2.5mm max. >

< Chip Length : 2.5mm max. >

Chip thickness > 0.5mm rank : 20N

Chip thickness = 0.5mm rank : 8N

Iron Board

< Chip L dimension : 3.2mm mim. >

Chip thickness < 1.25mm rank : 15N

Chip thickness ≧1.25mm rank : 54.5N

< Chip Length : 3.2mm min. >

0.6L

Fig.2

Speed supplied the Stress Load : 0.5mm/s.

18 Capacitance Temperature

Characteristics

Nominal values of the temperature R7 : Within +/-15%

The capacitance change should be measured after 5 minutes

at each specified temp. stage.

coefficient is shown in

Rated value.

(-55℃ to +125℃)

L8 : Within +/-15%

(-55℃ to +125℃)

ꢀꢀꢀWithin +15/-40%

(+125℃ to +150℃)

R9 : Within +/-15%

(-55℃ to +150℃)

Capacitance value as a reference is the value in step 3.

(1)Temperature Compensating Type

But, the Capacitance Change

under Reference Temp. is

shown in Table A.

The capacitance drift is calculated by dividing the differences

between the maximum and minimum measured values in the

step 1,3 and 5 by the cap. value in step 3.

Capacitance Drift

Step

Temperature(C)

Reference Temp.+/-2

Min. Operating Temp.+/-3

Reference Temp.+/-2

Max. Operating Temp.+/-3

Reference Temp.+/-2

Within +/-0.2% or +/-0.05pF

(Whichever is larger.)

(2) High Dielectric Constant Type

Step

Temperature(C)

Reference Temp.+/-2

Min. Operating Temp.+/-3

Reference Temp.+/-2

Max. Operating Temp.+/-3

Reference Temp.+/-2

・ Initial measurement for high dielectric constant type

Perform a heat treatment at 150+0/-10 ℃ for 1hour and then sit

for 24+/-2hours at room temperature. Perform the initial measurement.

Table A Capacitance Change between at Reference Temp. and at each Temp. (%)

-10

-55

-30

Char.

Max.

0.58

Min.

-0.24

Max.

0.40

Min.

-0.17

Max.

0.25

Min.

-0.11

5C/5G

JEMCGS-01499D

Package

GCG Type

1.Tape Carrier Packaging(Packaging Code:D/E/W/F/L/J/K)

1.1 Minimum Quantity(pcs./reel)

φ180mm reel

Paper Tape

φ330mm reel

Plastic Tape Paper Tape Plastic Tape

Type

Code:D/E

Code:W

20000

(W8P1)

Code:L

Code:J/ F

50000

(W8P2)

10000

Code:K

10000

(W8P2)

4000

GCG15 5

GCG18 8

4000

10000

GCG21

4000

10000

3000

2000

1000

10000

6000

4000

GCG31

GCG32

1.2 Dimensions of Tape

(1)GCG15(W8P2 CODE:D/E/J/F)ꢀ<Paper Tape>

(in:mm)

*1,2：2.0±0.05

4.0±0.1

+0.1

-0

φ1.5

Ａ

0.05 max.

Dimensions(Chip)

1.0±0.1 0.5±0.05 0.5±0.05

Type

A *3

0.65

B *3

1.15

ｔ

GCG15

0.8 max.

*3 Nominal value

(in:mm)

(2)GCG15(W8P1 CODE:W)ꢀ<Paper Tape>

4.0±0.1

1.0±0.05

+0.1

-0

φ1.5

Ａ

1.0±0.05

Dimensions(Chip)

1.0±0.1 0.5±0.05 0.5±0.05

Type

A *3

0.65

B *3

1.15

ｔ

GCG15

0.8 max.

*3 Nominal value

JEMCGP-04125A

Package

GCG Type

ꢀ(3)GCG18/21ꢀ<Paper Tape>

(in:mm)

4.0±0.1

2.0±0.1

+0.1

-0

φ1.5

Ａ

Dimentions(Chip)

Type

1.6±0.2

0.8±0.1

1.05±0.10

1.85±0.10

2.30±0.15

GCG18

1.1 max.

0.6±0.1

GCG21

2.0±0.3

1.25±0.2

1.55±0.15

0.85±0.1

ꢀ(4)GCG21/31/32 <Plastic Tape>

4.0±0.1

2.0±0.1

0.25±0.1(T≦1.8mm)

0.3±0.1(T：2.5mm)

+0.1

φ1.5

-0

Ａ

Dimentions(Chip)

Type

GCG21

2.0±0.3

1.25±0.2

1.15±0.2

1.6±0.3

1.6±0.4

2.0±0.3

2.5±0.3

1.45±0.20

2.25±0.20

3.50±0.20

3.60±0.20

3.50±0.20

2.0 max.

1.7 max.

3.2±0.3

3.2±0.4

1.6±0.3

1.6±0.4

2.5±0.3

1.90±0.20

2.10±0.20

2.80±0.20

GCG31

GCG32

2.5 max.

3.0 max.

3.7 max.

JEMCGP-04125A

Package

GCG Type

Fig.1 Package Chips

(in:mm)

Chip

Fig.2 Dimensions of Reel

2.0±0.5

φ21±0.8

ｗ1

w₁

10±1.5

Fig.3 Taping Diagram

GCG32 max.

16.5 max.

Top Tape : Thickness 0.06

Feeding Hole :As specified in 1.2.

Hole for Chip : As specified in 1.2.

Bottom Tape :Thickness 0.05

(Only a bottom tape existence )

Base Tape : As specified in 1.2.

JEMCGP-04125A

Package

GCG Type

1.3 Tapes for capacitors are wound clockwise shown in Fig.3.

(The sprocket holes are to the right as the tape is pulled toward the user.)

1.4 Part of the leader and part of the vacant section are attached as follows.

Tail vacant Section

Chip-mounting Unit Leader vacant Section

(in:mm)

Leader Unit

(Top Tape only)

Direction

of Feed

160 min.

190 min.

210 min.

1.5 Accumulate pitch : 10 of sprocket holes pitch = 40±0.3mm

1.6 Chip in the tape is enclosed by top tape and bottom tape as shown in Fig.1.

1.7 The top tape and base tape are not attached at the end of the tape for a minimum of 5 pitches.

1.8 There are no jointing for top tape and bottom tape.

1.9 There are no fuzz in the cavity.

1.10 Break down force of top tape : 5N min.

Break down force of bottom tape : 5N min. (Only a bottom tape existence )

1.11 Reel is made by resin and appeaser and dimension is shown in Fig 2.

There are possibly to change the material and dimension due to some impairment.

1.12 Peeling off force : 0.1N to 0.6N in the direction as shown below.

Top tape

165～180°

1.13 Label that show the customer parts number, our parts number, our company name, inspection

number and quantity, will be put in outside of reel.

JEMCGP-04125A

Caution

■Limitation of Applications

Please contact us before using our products for the applications listed below which require especially high reliability

for the prevention of defects which might directly cause damage to the third party's life, body or property.

ꢀ

ꢀꢀꢀ①Aircraft equipment ②Aerospace equipment ③Undersea equipment ④Power plant control equipment

ꢀꢀꢀ⑤Medical equipment ⑥Transportation equipment(vehicles,trains,ships,etc.) ⑦Traffic signal equipment

ꢀꢀꢀ⑧Disaster prevention / crime prevention equipment

⑨Data-processing equipment

ꢀꢀꢀ⑩Application of similar complexity and/or reliability requirements to the applications listed in the above.

■Storage and Operation condition

1. If store the chip multilayer ceramic capacitors in an atmosphere consisting of high temperature or humidity,

sulfur or chlorine gases, contaminants attach to the surface of external electrode, and bondability with

conductive glue may deteriorate. Do not store the capacitors in an atmosphere consisting of corrosive gas

(e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammoria gas, etc.). Storage environment must be at room

temperature of +5°C to +40°C and a relative humidity of 20% to 70%, and use the product within six months

ꢀ after receipt.

In case of packaging, do not open the last wrappend, polyethylene bag, till just before using.

After unpacking, immediately reseal, or store in a desiccator containing a desiccant.

ꢀ

2. Due to moisture condensation caused by rapid humidity changes, or the photochemical change caused

by direct sunlight on the terminal electrodes and/or the resin/epoxy coatings, the bondability with conductive glue and

electrical performance may deteriorate. Do not store capacitors under direct sunlight or in high huimidity conditions.

3. This product is chip monolithic ceramic capacitor limited to conductive glue mounting. Do not apply mounting method

other than conductive glue. Flow or reflow soldering can result in a lack of adhesive strength on the outer electrode by

poor wettability, which may result in chips breaking loose from the PCB.

■Rating

1.Temperature Dependent Characteristics

1. The electrical characteristics of the capacitor can change with temperature.

1-1. For capacitors having larger temperature dependency, the capacitance may change with temperature

changes. The following actions are recommended in order to ensure suitable capacitance values.

(1) Select a suitable capacitance for the operating temperature range.

(2) The capacitance may change within the rated temperature.

When you use a high dielectric constant type capacitor in a circuit that needs a tight (narrow) capacitance

tolerance (e.g., a time-constant circuit), please carefully consider the temperature characteristics, and

carefully confirm the various characteristics in actual use conditions and the actual system.

[Example of Temperature Caracteristics X7R(R7)]

[Example of Temperature Characteristics X5R(R6)]

Sample: 0.1μF, Rated Voltage 50VDC

Sample: 22μF, Rated Voltage 4VDC

-5

-10

-15

-20

-10

-15

-20

-75

-50

-25

100

-75

-50

-25

100 125 150

Temperature (ꢀC)

JEMCGC-04887A

Caution

2.Measurement of Capacitance

1. Measure capacitance with the voltage and frequency specified in the product specifications.

1-1. The output voltage of the measuring equipment may decrease occasionally when capacitance is high.

Please confirm whether a prescribed measured voltage is impressed to the capacitor.

1-2. The capacitance values of high dielectric constant type capacitors change depending on the AC voltage applied.

Please consider the AC voltage characteristics when selecting a capacitor to be used in a AC circuit.

3.Applied Voltage

1. Do not apply a voltage to the capacitor that exceeds the rated voltage as called out in the specifications.

1-1. Applied voltage between the terminals of a capacitor shall be less than or equal to the rated voltage.

(1) When AC voltage is superimposed on DC voltage, the zero-to-peak voltage shall not exceed the rated DC voltage.

When AC voltage or pulse voltage is applied, the peak-to-peak voltage shall not exceed the rated DC voltage.

(2) Abnormal voltages (surge voltage, static electricity, pulse voltage, etc.) shall not exceed the rated DC voltage.

Typical Voltage Applied to the DC capacitor

DC Voltage

DC Voltage+AC

AC Voltage

Pulse Voltage

(E：Maximum possible applied voltage.)

1-2. Influence of over voltage

Over voltage that is applied to the capacitor may result in an electrical short circuit caused by the breakdown

of the internal dielectric layers .

The time duration until breakdown depends on the applied voltage and the ambient temperature.

4.Type of Applied Voltage and Self-heating Temperature

1.Confirm the operating conditions to make sure that no large current is flowing into the capacitor due to the

continuous application of an AC voltage or pulse voltage.

When a DC rated voltage product is used in an AC voltage circuit or a pulse voltage circuit, the AC current

or pulse current will flow into the capacitor; therefore check the self-heating condition.

Please confirm the surface temperature of the capacitor so that the temperature remains within the upper limits

of the operating temperature, including the rise in temperature due to self-heating. When the capacitor is

used with a high-frequency voltage or pulse voltage, heat may be generated by dielectric loss.

[Example of Temperature Rise (Heat Generation) in Chip

Multilayer Ceramic Capacitors in Contrast to Ripple Current]

Sample: R(R1) characteristics 10μF, Rated voltage: DC10V

The load should be contained so that the self-heating

ꢀof the capacitor body remains below 20°C ,

ꢀwhen measuring at an ambient temperature of 25°C.

Ripple Current

100

100kHz

500kHz

1MHz

Current (Ar.m.s.)

JEMCGC-04887A

^!Caution

5. DC Voltage and AC Voltage Characteristic

1. The capacitance value of a high dielectric constant type

capacitor changes depending on the DC voltage applied.

Please consider the DC voltage characteristics when a

capacitor is selected for use in a DC circuit.

[Example of DC Voltage Characteristics]

Sample: R(R1) Characteristics 0.1μF, Rated Voltage 50VDC

-20

-40

-60

-80

1-1. The capacitance of ceramic capacitors may change

sharply depending on the applied voltage. (See figure)

Please confirm the following in order to secure the

capacitance.

(1) Determine whether the capacitance change caused

by the applied voltage is within the allowed range .

(2) In the DC voltage characteristics, the rate of

capacitance change becomes larger as voltage

increases, even if the applied voltage is below

the rated voltage. When a high dielectric constant

type capacitor is used in a circuit that requires a

tight (narrow) capacitance tolerance (e.g., a time

constant circuit), please carefully consider the

voltage characteristics, and confirm the various

characteristics in the actual operating conditions

-100

DC Voltage (V)

[Example of AC Voltage Characteristics]

Sample: X7R(R7) Characteristics 10μF, Rated Voltage 6.3VDC

ꢀ

of the system.

-10

-20

2. The capacitance values of high dielectric

constant type capacitors changes depending

on the AC voltage applied.

-30

-40

-50

-60

Please consider the AC voltage characteristics

when selecting a capacitor to be used in a

AC circuit.

0.5

1.5

AC Voltage (Vr.m.s.)

6. Capacitance Aging

[Example of Change Over Time (Aging characteristics) ]

1. The high dielectric constant type capacitors

have an Aging characteristic in which the capacitance

value decreases with the passage of time.

When you use a high dielectric constant type

capacitors in a circuit that needs a tight (narrow)

capacitance tolerance (e.g., a time-constant circuit),

please carefully consider the characteristics

of these capacitors, such as their aging, voltage,

and temperature characteristics. In addition,

check capacitors using your actual appliances

at the intended environment and operating conditions.

-10

C0G(5C)

X7R(R7)

-20

-30

-40

100

1000

10000

Time(h)

7.Vibration and Shock

1. Please confirm the kind of vibration and/or shock, its condition, and any generation of resonance.

Please mount the capacitor so as not to generate resonance, and do not allow any impact on the terminals.

2. Mechanical shock due to being dropped may cause damage or

a crack in the dielectric material of the capacitor.

Crack

Do not use a dropped capacitor because the quality and reliability

may be deteriorated.

Floor

3. When printed circuit boards are piled up or handled, the corner

ꢀof another printed circuit board

Mounting printed circuit board

Crack

should not be allowed to hit the capacitor in order to avoid

a crack or other damage to the capacitor.

JEMCGC-04887A

^!Caution

■Mounting

1. Selection of Conductive Adhesive, Mounting Process, and Bonding Strength

1.The acuired bonding strength may change greatly depending on the conductive adhesive to be used.

ꢀ Be sure to confirming the desired performance can be acquired in the assumed monting process

ꢀ with the conductive adhesive to be used.

2.Maintenance of the Mounting (pick and place) Machine

1. Make sure that the following excessive forces are not applied to the capacitors.

Check the mounting in the actual device under actual use conditions ahead of time.

1-1. In mounting the capacitors on the printed circuit board, any bending force against them shall be kept

to a minimum to prevent them from any damage or cracking. Please take into account the following precautions

and recommendations for use in your process.

(1) Adjust the lowest position of the pickup nozzle so as not to bend the printed circuit board.

Suction Nozzle

ꢀ [Incorrect]

Deflection

Board

Board Guide

ꢀ [Correct]

Support Pin

2.Dirt particles and dust accumulated in the suction nozzle and suction mechanism prevent the nozzle from

moving smoothly. This creates excessive force on the capacitor during mounting, causing cracked chips.

Also, the locating claw, when worn out, imposes uneven forces on the chip when positioning, causing cracked chips.

The suction nozzle and the locating claw must be maintained, checked and replaced periodically.

3.Moisture proof

1.To prevent the silver electrode migration, keep parts under low moisture condition with resin coating and the equivalent.

4.Coating

1. A crack may be caused in the capacitor due to the stress of the thermal contraction of the resin during curing process.

The stress is affected by the amount of resin and curing contraction. Select a resin with low curing contraction.

The difference in the thermal expansion coefficient between a coating resin or a molding resin and the capacitor

may cause the destruction and deterioration of the capacitor such as a crack or peeling, and lead to the deterioration

of insulation resistance or dielectric breakdown.

Select a resin for which the thermal expansion coefficient is as close to that of the capacitor as possible.

A silicone resin can be used as an under-coating to buffer against the stress.

2. Select a resin that is less hygroscopic.

Using hygroscopic resins under high humidity conditions may cause the deterioration of the insulation resistance

of a capacitor. An epoxy resin can be used as a less hygroscopic resin.

3．The halogen system substance and organic acid are included in coating material, and a chip corrodes

ꢀꢀby the kind of Coating material. Do not use strong acid type.

JEMCGC-04887A

^!Caution

■ Others

1. Under Operation of Equipment

1-1. Do not touch a capacitor directly with bare hands during operation in order to avoid the danger of an electric shock.

1-2. Do not allow the terminals of a capacitor to come in contact with any conductive objects (short-circuit).

Do not expose a capacitor to a conductive liquid, inducing any acid or alkali solutions.

1-3. Confirm the environment in which the equipment will operate is under the specified conditions.

Do not use the equipment under the following environments.

(1) Being spattered with water or oil.

(2) Being exposed to direct sunlight.

(3) Being exposed to ozone, ultraviolet rays, or radiation.

(4) Being exposed to toxic gas (e.g., hydrogen sulfide, sulfur dioxide, chlorine, ammonia gas etc.)

(5) Any vibrations or mechanical shocks exceeding the specified limits.

(6) Moisture condensing environments.

1-4. Use damp proof countermeasures if using under any conditions that can cause condensation.

2. Others

2-1. In an Emergency

(1) If the equipment should generate smoke, fire, or smell, immediately turn off or unplug the equipment.

If the equipment is not turned off or unplugged, the hazards may be worsened by supplying continuous power.

(2) In this type of situation, do not allow face and hands to come in contact with the capacitor or burns may be caused

by the capacitor's high temperature.

2-2. Disposal of waste

When capacitors are disposed of, they must be burned or buried by an industrial waste vendor with the appropriate

licenses.

2-3. Circuit Design

(1) Addition of Fail Safe Function

Capacitors that are cracked by dropping or bending of the board may cause deterioration of the

insulation resistance, and result in a short. If the circuit being used may cause an electrical shock,

smoke or fire when a capacitor is shorted, be sure to install fail-safe functions, such as a fuse,

to prevent secondary accidents.

(2) This series are not safety standard certified products.

2-4. Remarks

Failure to follow the cautions may result, worst case, in a short circuit and smoking when the product is used.

The above notices are for standard applications and conditions. Contact us when the products are used in special

mounting conditions.

Select optimum conditions for operation as they determine the reliability of the product after assembly.

The data herein are given in typical values, not guaranteed ratings.

JEMCGC-04887A

Notice

■ Rating

1.Operating Temperature

1. The operating temperature limit depends on the capacitor.

1-1. Do not apply temperatures exceeding the maximum operating temperature.

It is necessary to select a capacitor with a suitable rated temperature that will cover the operating temperature range.

It is also necessary to consider the temperature distribution in equipment and the seasonal temperature variable

factor.

1-2. Consider the self-heating factor of the capacitor

The surface temperature of the capacitor shall not exceed the maximum operating temperature including self-heating.

2.Atmosphere Surroundings (gaseous and liquid)

1. Restriction on the operating environment of capacitors.

1-1. Capacitors, when used in the above, unsuitable, operating environments may deteriorate due to the corrosion

of the terminations and the penetration of moisture into the capacitor.

1-2. The same phenomenon as the above may occur when the electrodes or terminals of the capacitor are subject

to moisture condensation.

1-3. The deterioration of characteristics and insulation resistance due to the oxidization or corrosion of terminal

ꢀꢀelectrodes may result in breakdown when the capacitor is exposed to corrosive or volatile gases or solvents

for long periods of time.

3.Piezo-electric Phenomenon

1. When using high dielectric constant type capacitors in AC or pulse circuits, the capacitor itself vibrates

at specific frequencies and noise may be generated.

Moreover, when the mechanical vibration or shock is added to capacitor, noise may occur.

JEMCGC-04887A

Notice

■ Others

1.Transportation

1. The performance of a capacitor may be affected by the conditions during transportation.

1-1. The capacitors shall be protected against excessive temperature, humidity and mechanical force during transportation.

(1) Climatic condition

ꢀ･ low air temperature : -40℃

･ change of temperature air/air : -25℃/+25℃

･ low air pressure : 30 kPa

･ change of air pressure : 6 kPa/min.

(2) Mechanical condition

Transportation shall be done in such a way that the boxes are not deformed and forces are not directly passed

on to the inner packaging.

1-2. Do not apply excessive vibration, shock, or pressure to the capacitor.

(1) When excessive mechanical shock or pressure is applied to a capacitor, chipping or cracking may occur

in the ceramic body of the capacitor.

(2) When the sharp edge of an air driver, tweezers, a chassis, etc. impacts strongly on the surface

of the capacitor, the capacitor may crack and short-circuit.

1-3. Do not use a capacitor to which excessive shock was applied by dropping etc.

A capacitor dropped accidentally during processing may be damaged.

2.Characteristics Evaluation in the Actual System

1. Evaluate the capacitor in the actual system,to confirm that there is no problem with the performance and specification

values in a finished product before using.

2. Since a voltage dependency and temperature dependency exists in the capacitance of high dielectric type ceramic

capacitors, the capacitance may change depending on the operating conditions in the actual system.

Therefore,be sure to evaluate the various characteristics, such as the leakage current and noise absorptivity,

which will affect the capacitance value of the capacitor.

3. In addition,voltages exceeding the predetermined surge may be applied to the capacitor by the inductance in

the actual system. Evaluate the surge resistance in the actual system as required.

JEMCGC-04887A

NOTE

1.Please make sure that your product has been evaluated in view of your specifications with our

product being mounted to your product.

2.Your are requested not to use our product deviating from this product specification.

3.We consider it not appropriate to include any terms and conditions with regard to the business

transaction in the product specifications, drawings or other technical documents. Therefore,

if your technical documents as above include such terms and conditions such as warranty clause,

product liability clause, or intellectual property infringement liability clause, they will be deemed to

be invalid.

JEMCGC-04887A

GCG155L81H561KA02# [MURATA]

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