MX25L1675EZNI-10G [Macronix]
Flash, 4MX4, PDSO8, 6 X 5 MM, 0.80 MM HEIGHT, 1.27 MM PITCH, HALOGEN FREE AND ROHS COMPLIANT, MO-220, WSON-8;型号: | MX25L1675EZNI-10G |
厂家: | MACRONIX INTERNATIONAL |
描述: | Flash, 4MX4, PDSO8, 6 X 5 MM, 0.80 MM HEIGHT, 1.27 MM PITCH, HALOGEN FREE AND ROHS COMPLIANT, MO-220, WSON-8 时钟 光电二极管 内存集成电路 |
文件: | 总65页 (文件大小:761K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
MX25L1675E
MX25L1675E
HIGH PERFORMANCE
SERIAL FLASH SPECIFICATION
P/N: PM1850
REV. 1.2, NOV. 11, 2013
1
MX25L1675E
Contents
1. FEATURES ........................................................................................................................................................ 4
2. GENERAL DESCRIPTION ............................................................................................................................... 6
Table 1. Additional Feature.....................................................................................................................6
3. PIN CONFIGURATION ...................................................................................................................................... 7
4. PIN DESCRIPTION............................................................................................................................................ 7
5. BLOCK DIAGRAM............................................................................................................................................. 8
6. DATA PROTECTION.......................................................................................................................................... 9
Table 2. Protected Area Sizes..............................................................................................................10
Table 3. 512-bit Secured OTP Definition..............................................................................................10
7. MEMORY ORGANIZATION..............................................................................................................................11
Table 4. Memory Organization .............................................................................................................11
8. DEVICE OPERATION...................................................................................................................................... 12
9. COMMAND DESCRIPTION............................................................................................................................. 13
Table 5. Command Sets.......................................................................................................................13
9-1. Write Enable (WREN)..........................................................................................................................15
9-2. Write Disable (WRDI)...........................................................................................................................16
9-3. Read Identification (RDID)...................................................................................................................17
9-4. Read Status Register (RDSR).............................................................................................................18
9-5. Write Status Register (WRSR).............................................................................................................20
Table 6. Protection Modes....................................................................................................................21
9-6. Read Data Bytes (READ) ....................................................................................................................23
9-7. Read Data Bytes at Higher Speed (FAST_READ) ..............................................................................24
9-8. Dual Read Mode (DREAD)..................................................................................................................25
9-9. 2 x I/O Read Mode (2READ) ...............................................................................................................26
9-10. Quad Read Mode (QREAD) ................................................................................................................27
9-11. 4 x I/O Read Mode (4READ) ...............................................................................................................28
9-12. Performance Enhance Mode...............................................................................................................29
9-13. Performance Enhance Mode Reset (FFh)...........................................................................................29
9-14. Sector Erase (SE)................................................................................................................................32
9-15. Block Erase (BE) .................................................................................................................................33
9-16. Chip Erase (CE)...................................................................................................................................34
9-17. Page Program (PP) .............................................................................................................................35
9-18. 4 x I/O Page Program (4PP)................................................................................................................36
9-19. Deep Power-down (DP).......................................................................................................................37
9-20. Release from Deep Power-down (RDP), Read Electronic Signature (RES) .......................................38
9-21. Read Electronic Manufacturer ID & Device ID (REMS), (REMS2), (REMS4) .....................................40
9-22. ID Read................................................................................................................................................41
Table 7. ID Definitions .........................................................................................................................41
9-23. Enter Secured OTP (ENSO)................................................................................................................41
9-24. Exit Secured OTP (EXSO)...................................................................................................................41
9-25. Read Security Register (RDSCUR).....................................................................................................42
Table 8. Security Register Definition ....................................................................................................42
9-26. Write Security Register (WRSCUR).....................................................................................................43
9-27. Read SFDP Mode (RDSFDP)..............................................................................................................44
Table 9. Signature and Parameter Identification Data Values .............................................................45
P/N: PM1850
REV. 1.2, NOV. 11, 2013
2
MX25L1675E
Table 10. Parameter Table (0): JEDEC Flash Parameter Tables.........................................................46
Table 11. Parameter Table (1): Macronix Flash Parameter Tables.......................................................48
10. POWER-ON STATE....................................................................................................................................... 50
11. ELECTRICAL SPECIFICATIONS.................................................................................................................. 51
11-1. Absolute Maximum Ratings.................................................................................................................51
11-2. Capacitance.........................................................................................................................................51
Table 12. DC Characteristics................................................................................................................53
Table 13. AC Characteristics................................................................................................................54
12. TIMING ANALYSIS ........................................................................................................................................ 55
Table 14. Power-Up Timing .................................................................................................................56
12-1. Initial Delivery State.............................................................................................................................56
13. OPERATING CONDITIONS........................................................................................................................... 57
14. ERASE AND PROGRAMMING PERFORMANCE........................................................................................ 59
15. DATA RETENTION ........................................................................................................................................ 59
16. LATCH-UP CHARACTERISTICS.................................................................................................................. 59
17. ORDERING INFORMATION.......................................................................................................................... 60
18. PART NAME DESCRIPTION......................................................................................................................... 61
19. REVISION HISTORY ..................................................................................................................................... 64
P/N: PM1850
REV. 1.2, NOV. 11, 2013
3
MX25L1675E
16M-BIT [x 1/x 2/x 4] CMOS MXSMIO® (SERIAL MULTI I/O) FLASH MEMORY
1. FEATURES
GENERAL
• Serial Peripheral Interface compatible -- Mode 0 and Mode 3
• 16,777,216 x 1 bit structure or 8,388,608 x 2 bits (two I/O read mode) structure or 4,194,304 x 4 bits (four I/O
read mode) structure
• 512 Equal Sectors with 4K byte each
- Any Sector can be erased individually
• 32 Equal Blocks with 64K byte each
- Any Block can be erased individually
• Single Power Supply Operation
- 2.7 to 3.6 volt for read, erase, and program operations
• Latch-up protected to 100mA from -1V to Vcc +1V
• Default QE=1 (4 I/O) before factory shipping
PERFORMANCE
• High Performance
- Fast read
- 1 I/O: 104MHz with 8 dummy cycles
- 2 I/O: 85MHz with 4 dummy cycles
- 4 I/O: 85MHz with 6 dummy cycles
- Fast access time: 104MHz serial clock
- Serial clock of four I/O read mode : 85MHz, which is equivalent to 340MHz
- Fast program time: 0.6ms(typ.) and 3ms(max.)/page (256-byte per page)
- Byte program time: 9us (typical)
- Fast erase time: 40ms (typ.)/sector (4K-byte per sector) ; 0.4s(typ.) /block (64K-byte per block); 5s(typ.) /chip
• Low Power Consumption
- Low active read current: 25mA(max.) at 104MHz and 10mA(max.) at 33MHz
- Low active programming current: 15mA (typ.)
- Low active sector erase current: 9mA (typ.)
- Low standby current: 15uA (typ.)
• Typical 100,000 erase/program cycles
• 20 years data retention
P/N: PM1850
REV. 1.2, NOV. 11, 2013
4
MX25L1675E
SOFTWARE FEATURES
• Input Data Format
- 1-byte Command code
• Advanced Security Features
- Block lock protection
The BP0-BP3 status bit defines the size of the area to be software protection against program and erase
instructions
- Additional 512-bit secured OTP for unique identifier
• Auto Erase and Auto Program Algorithm
- Automatically erases and verifies data at selected sector
- Automatically programs and verifies data at selected page by an internal algorithm that automatically times the
program pulse widths (Any page to be programed should have page in the erased state first)
• Status Register Feature
• Electronic Identification
- JEDEC 1-byte manufacturer ID and 2-byte device ID
- RES command for 1-byte Device ID
- Both REMS,REMS2 and REMS4 commands for 1-byte manufacturer ID and 1-byte device ID
• Support Serial Flash Discoverable Parameters (SFDP) mode
HARDWARE FEATURES
• SCLK Input
- Serial clock input
• SI/SIO0
- Serial Data Input or Serial Data Input/Output for 2 x I/O read mode and 4 x I/O read mode
• SO/SIO1
- Serial Data Output or Serial Data Input/Output for 2 x I/O read mode and 4 x I/O read mode
• WP#/SIO2
- Hardware write protection or serial data Input/Output for 4 x I/O read mode
• NC/SIO3
- NC pin or serial data Input/Output for 4 x I/O read mode
• PACKAGE
8-pin SOP (200mil)
8-WSON (6x5mm)
-
-
- All devices are RoHS Compliant & Halogen-free.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
2. GENERAL DESCRIPTION
The MX25L1675E are 16,777,216 bit serial Flash memory, which is configured as 2,097,152 x 8 internally. When it
is in two or four I/O read mode, the structure becomes 8,388,608 bits x 2 or 4,194,304 bits x 4. The MX25L1675E
feature a serial peripheral interface and software protocol allowing operation on a simple 3-wire bus. The three bus
signals are a clock input (SCLK), a serial data input (SI), and a serial data output (SO). Serial access to the device
is enabled by CS# input.
When it is in two I/O read mode, the SI pin and SO pin become SIO0 pin and SIO1 pin for address/dummy bits input
and data output. When it is in four I/O read mode, the SI pin, SO pin, WP# pin and NC pin become SIO0 pin, SIO1
pin, SIO2 pin and SIO3 pin for address/dummy bits input and data output.
The MX25L1675E provides sequential read operation on whole chip.
After program/erase command is issued, auto program/erase algorithms which program/erase and verify the speci-
fied page or sector/block locations will be executed. Program command is executed on byte basis, or page (256
bytes) basis, and erase command is executes on sector (4K-byte), or block (64K-byte), or whole chip basis.
To provide user with ease of interface, a status register is included to indicate the status of the chip. The status read
command can be issued to detect completion status of a program or erase operation via WIP bit.
Advanced security features enhance the protection and security functions, please see security features section for
more details.
When the device is not in operation and CS# is high, it is put in standby mode.
The MX25L1675E utilizes Macronix proprietary memory cell, which reliably stores memory contents even after
100,000 program and erase cycles.
Table 1. Additional Feature
Protection and
Security
Read
Performance
Identifier
Additional
Features
Flexible
Block
Protection secured
512-bit
RES
REMS
REMS2
REMS4
RDID
2 I/O
4 I/O
Part
Name
(command: (command: (command: (command: (command:
Read
Read
(BP0-
BP3)
OTP
AB hex)
90 hex)
EF hex)
DF hex)
9F hex)
C2 24 (hex) C2 24 (hex) C2 24 (hex) C2 24 15
(if ADD=0) (if ADD=0) (if ADD=0) (hex)
MX25L1675E
V
V
V
V
24 (hex)
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REV. 1.2, NOV. 11, 2013
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MX25L1675E
3. PIN CONFIGURATION
8-PIN SOP (200mil)
4. PIN DESCRIPTION
SYMBOL DESCRIPTION
CS#
Chip Select
Serial Data Input (for 1 x I/O)/ Serial
Data Input & Output (for 2xI/O or 4xI/
O read mode)
1
2
3
4
CS#
SO/SIO1
WP#/SIO2
GND
VCC
8
7
6
5
NC/SIO3
SCLK
SI/SIO0
SI/SIO0
Serial Data Output (for 1 x I/O)/
Serial Data Input & Output (for 2xI/O
or 4xI/O read mode)
SO/SIO1
SCLK
Clock Input
8-WSON (6x5mm)
Write protection: connect to GND or
1
2
3
4
VCC
CS#
SO/SIO1
WP#/SIO2
GND
WP#/SIO2 Serial Data Input & Output (for 4xI/O
8
7
6
5
NC/SIO3
SCLK
read mode)
NC pin (Not connect) or Serial Data
Input & Output (for 4xI/O read mode)
NC/SIO3
SI/SIO0
VCC
GND
+ 3.3V Power Supply
Ground
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
5. BLOCK DIAGRAM
Address
Generator
Memory Array
Page Buffer
Y-Decoder
Data
Register
SI/SIO0
SRAM
Buffer
Sense
Amplifier
CS#
WP#/SIO2
NC#/SIO3
Mode
Logic
State
Machine
HV
Generator
SCLK
Clock Generator
Output
Buffer
SO/SIO1
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
6. DATA PROTECTION
During power transition, there may be some false system level signals which result in inadvertent erasure or pro-
gramming. The device is designed to protect itself from these accidental write cycles.
The state machine will be reset as standby mode automatically during power up. In addition, the control register ar-
chitecture of the device constrains that the memory contents can only be changed after specific command sequenc-
es have completed successfully.
In the following, there are several features to protect the system from the accidental write cycles during VCC power-
up and power-down or from system noise.
•
•
Valid command length checking: The command length will be checked whether it is at byte base and completed
on byte boundary.
Write Enable (WREN) command: WREN command is required to set the Write Enable Latch bit (WEL) before
other command to change data. The WEL bit will return to reset stage under following situation:
- Power-up
- Write Disable (WRDI) command completion
- Write Status Register (WRSR) command completion
- Page Program (PP, 4PP) command completion
- Sector Erase (SE) command completion
- Block Erase (BE) command completion
- Chip Erase (CE) command completion
•
•
Deep Power Down Mode: By entering deep power down mode, the flash device also is under protected from
writing all commands except Release from deep power down mode command (RDP) and Read Electronic Sig-
nature command (RES).
Advanced Security Features: there are some protection and securuity features which protect content from inad-
vertent write and hostile access.
I. Block lock protection
- The Software Protected Mode (SPM) use (BP3, BP2, BP1, BP0) bits to allow part of memory to be protected
as read only. The proected area definition is shown as table of "Protected Area Sizes", the protected areas are
more flexible which may protect various area by setting value of BP0-BP3 bits.
Please refer to table of "protected area sizes".
- The Hardware Proteced Mode (HPM) use WP#/SIO2 to protect the (BP3, BP2, BP1, BP0) bits and SRWD bit.
If the system goes into four I/O read mode, the feature of HPM will be disabled.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
9
MX25L1675E
Table 2. Protected Area Sizes
Status bit
Protect Level
BP0 16Mb
BP3
0
BP2
0
BP1
0
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0
1
0 (none)
0
0
0
1 (1block, protected block 31th)
2 (2blocks, protected block 30th-31th)
3 (4blocks, protected block 28th-31th)
4 (8blocks, protected block 24th-31th)
0
0
1
0
0
1
0
1
0
0
1
0
5 (16blocks, protected block 16th-31th)
6 (32blocks, protected all)
0
1
1
0
1
1
7 (32blocks, protected all)
1
0
0
8 (32blocks, protected all)
1
0
0
9 (32blocks, protected all)
1
0
1
10 (16blocks, protected block 0th-15th)
11 (24blocks, protected block 0th-23th)
12 (28blocks, protected block 0th-27th)
13 (30blocks, protected block 0th-29th)
14 (31blocks, protected block 0th-30th)
15 (32blocks, protected all)
1
0
1
1
1
0
1
1
0
1
1
1
1
1
1
II. Additional 512-bit secured OTP for unique identifier: to provide 512-bit one-time program area for setting de-
vice unique serial number - Which may be set by factory or system customer. Please refer to "Table 3. 512-bit
Secured OTP Definition"
- Security register bit 0 indicates whether the chip is locked by factory or not.
- To program the 512-bit secured OTP by entering 512-bit secured OTP mode (with ENSO command), and going
through normal program procedure, and then exiting 512-bit secured OTP mode by writing EXSO command.
- Customer may lock-down the customer lockable secured OTP by writing WRSCUR(write security register) com-
mand to set customer lock-down bit1 as "1". Please refer to table of "security register definition" for security reg-
ister bit definition and table of "512-bit secured OTP definition" for address range definition.
- Note: Once lock-down whatever by factory or customer, it cannot be changed any more. While in 512-bit secured
OTP mode, array access is not allowed.
Table 3. 512-bit Secured OTP Definition
Address range
xxxx00~xxxx0F
xxxx10~xxxx3F
Size
Standard Factory Lock
ESN (electrical serial number)
N/A
Customer Lock
128-bit
384-bit
Determined by customer
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10
MX25L1675E
7. MEMORY ORGANIZATION
Table 4. Memory Organization
Block
Sector
255
:
Address Range
0FF000h 0FFFFFh
Block
Sector
511
:
Address Range
1FF000h 1FFFFFh
15
:
:
31
:
:
240
239
:
224
223
:
208
207
:
192
191
:
176
175
:
160
159
:
144
143
:
128
127
:
112
111
:
96
95
:
80
79
:
64
63
:
48
47
:
32
31
:
16
15
:
0F0000h
0EF000h
:
0E0000h
0DF000h
:
0D0000h
0CF000h
:
0C0000h
0BF000h
:
0B0000h
0AF000h
:
0A0000h
09F000h
:
090000h
08F000h
:
080000h
07F000h
:
070000h
06F000h
:
060000h
05F000h
:
050000h
04F000h
:
040000h
03F000h
:
030000h
02F000h
:
020000h
01F000h
:
010000h
00F000h
:
0F0FFFh
0EFFFFh
:
0E0FFFh
0DFFFFh
:
0D0FFFh
0CFFFFh
:
0C0FFFh
0BFFFFh
:
0B0FFFh
0AFFFFh
:
0A0FFFh
09FFFFh
:
090FFFh
08FFFFh
:
080FFFh
07FFFFh
:
070FFFh
06FFFFh
:
060FFFh
05FFFFh
:
050FFFh
04FFFFh
:
040FFFh
03FFFFh
:
030FFFh
02FFFFh
:
020FFFh
01FFFFh
:
010FFFh
00FFFFh
:
496
495
:
480
479
:
464
463
:
448
447
:
432
431
:
416
415
:
400
399
:
384
383
:
368
367
:
352
351
:
336
335
:
320
319
:
304
303
:
288
287
:
272
271
:
1F0000h
1EF000h
:
1E0000h
1DF000h
:
1D0000h
1CF000h
:
1C0000h
1BF000h
:
1B0000h
1AF000h
:
1A0000h
19F000h
:
190000h
18F000h
:
180000h
17F000h
:
170000h
16F000h
:
160000h
15F000h
:
150000h
14F000h
:
140000h
13F000h
:
130000h
12F000h
:
120000h
11F000h
:
110000h
10F000h
:
1F0FFFh
1EFFFFh
:
1E0FFFh
1DFFFFh
:
1D0FFFh
1CFFFFh
:
1C0FFFh
1BFFFFh
:
1B0FFFh
1AFFFFh
:
1A0FFFh
19FFFFh
:
190FFFh
18FFFFh
:
180FFFh
17FFFFh
:
170FFFh
16FFFFh
:
160FFFh
15FFFFh
:
150FFFh
14FFFFh
:
140FFFh
13FFFFh
:
130FFFh
12FFFFh
:
120FFFh
11FFFFh
:
110FFFh
10FFFFh
:
14
13
12
11
10
9
30
29
28
27
26
25
24
23
22
21
20
19
18
17
16
8
7
6
5
4
3
2
1
0
2
1
0
002000h
001000h
000000h
002FFFh
001FFFh
000FFFh
256
100000h
100FFFh
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MX25L1675E
8. DEVICE OPERATION
1. Before a command is issued, status register should be checked to ensure device is ready for the intended opera-
tion.
2. When incorrect command is inputted to this LSI, this LSI becomes standby mode and keeps the standby mode
until next CS# falling edge. In standby mode, SO pin of this LSI should be High-Z.
3. When correct command is inputted to this LSI, this LSI becomes active mode and keeps the active mode until
next CS# rising edge.
4. For standard single data rate serial mode, input data is latched on the rising edge of Serial Clock(SCLK) and
data shifts out on the falling edge of SCLK. The difference of Serial mode 0 and mode 3 is shown as "Figure 1.
Serial Modes Supported (for Normal Serial mode)" .
5. For the following instructions: RDID, RDSR, RDSCUR, READ, FAST_READ, RDSFDP, 2READ, DREAD,
4READ, QREAD, RES, REMS, REMS2, and REMS4 the shifted-in instruction sequence is followed by a data-
out sequence. After any bit of data being shifted out, the CS# can be high. For the following instructions: WREN,
WRDI, WRSR, SE, BE, CE, PP, 4PP, RDP, DP, ENSO, EXSO,and WRSCUR, the CS# must go high exactly at
the byte boundary; otherwise, the instruction will be rejected and not executed.
6. During the progress of Write Status Register, Program, Erase operation, to access the memory array is neglect-
ed and not affect the current operation of Write Status Register, Program, Erase.
Figure 1. Serial Modes Supported (for Normal Serial mode)
CPOL CPHA
shift in
shift out
SCLK
SCLK
(Serial mode 0)
(Serial mode 3)
0
1
0
1
SI
MSB
SO
MSB
Note:
CPOL indicates clock polarity of Serial master,
-CPOL=1 for SCLK high while idle,
-CPOL=0 for SCLK low while not transmitting.
CPHA indicates clock phase.
The combination of CPOL bit and CPHA bit decides which Serial mode is supported.
P/N: PM1850
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MX25L1675E
9. COMMAND DESCRIPTION
Table 5. Command Sets
Read Commands
2READ (2 x I/O
DREAD
4READ (4 x I/O
QREAD
Command
(byte)
READ (read
data)
FAST READ
(fast read data) (Read SFDP)
RDSFDP
read command) (1I / 2O read read command) (1I / 4O read
(Note1)
BB (hex)
ADD(2)
command)
3B (hex)
AD1(8)
(Note2)
command)
6B (hex)
AD1(8)
1st byte
2nd byte
03 (hex)
AD1
(A23-A16)
0B (hex)
AD1
5A (hex)
AD1
EB (hex)
ADD(4) &
Dummy(4)
AD2
(A15-A8)
AD3
ADD(2) &
Dummy(2)
3rd byte
AD2
AD3
AD2
AD3
AD2(8)
Dummy(4)
AD2(8)
4th byte
5th byte
AD3(8)
AD3(8)
(A7-A0)
Dummy(8)
n bytes read
Dummy(8)
Read SFDP
mode
Dummy(8)
Dummy(8)
n bytes read
out until CS# out until CS#
goes high goes high
n bytes
read out
by 2 x I/O until
CS# goes high
n bytes read
out by 4 x I/O
until CS# goes
high
Action
Note 1: The count base is 4-bit for ADD(2) and Dummy(2) because of 2 x I/O.
Note 2: The count base is 4-bit for ADD(4) and Dummy(4) because of 4 x I/O.
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MX25L1675E
Other Commands
RDID
(read identific-
ation)
Command WREN (write
WRDI
(write disable)
RDSR (read
status register) status register) page program)
WRSR (write
4PP (quad
SE (sector
erase)
(byte)
enable)
1st byte
2nd byte
3rd byte
4th byte
06 (hex)
04 (hex)
9F (hex)
05 (hex)
01 (hex)
38 (hex)
AD1
20 (hex)
AD1
Values
AD2
AD3
sets the (WEL)
write enable
latch bit
resets the
(WEL) write
outputs JEDEC to read out the to write new
ID: 1-byte values of the values of the
quad input to
program the selected sector
to erase the
Action
enable latch bit Manufact-urer status register status register selected page
ID & 2-byte
Device ID
RDP (Release
from deep
power down)
Release Read
Enhanced
Command
(byte)
BE (block
erase)
PP (page
program)
DP (Deep
power down)
RES (read
electronic ID)
CE (chip erase)
60 or C7 (hex)
1st byte
2nd byte
3rd byte
4th byte
D8 (hex)
AD1
02 (hex)
AD1
B9 (hex)
AB (hex)
AB (hex)
FFh (hex)
x
x
x
x
x
x
AD2
AD2
AD3
AD3
to erase the to erase whole to program the enters deep
release from
deep power
down mode
to read out
1-byte Device
ID
All these
commands
FFh, 00h, AAh
or 55h will
selected block
chip
selected page power down
mode
Action
escape the
performance
enhance mode
REMS (read
electronic
manufacturer &
device ID)
REMS2 (read REMS4 (read
RDSCUR
(read security (write security
WRSCUR
Command
(byte)
ENSO (enter
secured OTP) secured OTP)
EXSO (exit
ID for 2x I/O
mode)
ID for 4x I/O
mode)
register)
register)
2F (hex)
1st byte
2nd byte
3rd byte
4th byte
90 (hex)
EF (hex)
DF (hex)
B1 (hex) C1 (hex)
2B (hex)
x
X
X
x
x
x
ADD (Note3)
output the
ADD (Note3)
output the
ADD (Note3)
output the
to enter the to exit the 512- to read value of to set the lock-
Manufacturer Manufacturer Manufacturer 512-bit secured bit secured security register down bit as
ID & Device ID ID & Device ID ID & Device ID
OTP mode
OTP mode
"1" (once lock-
down, cannot
be update)
Action
Note 3: ADD=00H will output the manufacturer ID first and ADD=01H will output device ID first.
Note 4: It is not recommended to adopt any other code not in the command definition table, which will potentially enter the hid-
den mode.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
14
MX25L1675E
9-1.
Write Enable (WREN)
The Write Enable (WREN) instruction is for setting Write Enable Latch (WEL) bit. For those instructions like PP,
4PP, SE, BE, CE, and WRSR, which are intended to change the device content, should be set every time after the
WREN instruction setting the WEL bit.
The sequence of issuing WREN instruction is: CS# goes low→ sending WREN instruction code→ CS# goes high.
The SIO[3:1] are don't care in this mode.
Figure 2. Write Enable (WREN) Sequence (Command 06)
CS#
0
1
2
3
4
5
6
7
SCLK
Command
06h
SI
High-Z
SO
P/N: PM1850
REV. 1.2, NOV. 11, 2013
15
MX25L1675E
9-2.
Write Disable (WRDI)
The Write Disable (WRDI) instruction is for resetting Write Enable Latch (WEL) bit.
The sequence of issuing WRDI instruction is: CS# goes low→ sending WRDI instruction code→ CS# goes high.
The WEL bit is reset by following situations:
- Power-up
- Write Disable (WRDI) instruction completion
- Write Status Register (WRSR) instruction completion
- Page Program (PP, 4PP) instruction completion
- Sector Erase (SE) instruction completion
- Block Erase (BE) instruction completion
- Chip Erase (CE) instruction completion
Figure 3. Write Disable (WRDI) Sequence (Command 04)
CS#
0
1
2
3
4
5
6
7
SCLK
Command
04h
SI
High-Z
SO
P/N: PM1850
REV. 1.2, NOV. 11, 2013
16
MX25L1675E
9-3.
Read Identification (RDID)
The RDID instruction is for reading the Manufacturer ID of 1-byte and followed by Device ID of 2-byte. The MXIC
Manufacturer ID is C2(hex), the memory type ID is as the first-byte Device ID, and the individual Device ID of sec-
ond-byte ID are listed as table of "Table 7. ID Definitions".
The sequence of issuing RDID instruction is: CS# goes low→ sending RDID instruction code → 24-bits ID data out
on SO→ to end RDID operation can use CS# to high at any time during data out.
While Program/Erase operation is in progress, it will not decode the RDID instruction, so there's no effect on the cy-
cle of program/erase operation which is currently in progress. When CS# goes high, the device is at standby stage.
Figure 4. Read Identification (RDID) Sequence (Command 9F)
CS#
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18
28 29 30 31
SCLK
SI
Command
9Fh
Manufacturer Identification
Device Identification
High-Z
SO
7
6
5
3
2
1
0
15 14 13
MSB
3
2
1
0
MSB
P/N: PM1850
REV. 1.2, NOV. 11, 2013
17
MX25L1675E
9-4.
Read Status Register (RDSR)
The RDSR instruction is for reading Status Register. The Read Status Register can be read at any time (even in
program/erase/write status register condition) and continuously. It is recommended to check the Write in Progress (WIP)
bit before sending a new instruction when a program, erase, or write status register operation is in progress.
The sequence of issuing RDSR instruction is: CS# goes low→ sending RDSR instruction code→ Status Register
data out on SO.
The SIO[3:1] are don't care when during this mode.
Figure 5. Read Status Register (RDSR) Sequence (Command 05)
CS#
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15
SCLK
SI
command
05h
Status Register Out
Status Register Out
High-Z
SO
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
MSB
MSB
P/N: PM1850
REV. 1.2, NOV. 11, 2013
18
MX25L1675E
The definition of the status register bits is as below:
WIP bit. The Write in Progress (WIP) bit, a volatile bit, indicates whether the device is busy in program/erase/write
status register progress. When WIP bit sets to 1, which means the device is busy in program/erase/write status
register progress. When WIP bit sets to 0, which means the device is not in progress of program/erase/write status
register cycle.
WEL bit. The Write Enable Latch (WEL) bit, a volatile bit, indicates whether the device is set to internal write enable
latch. When WEL bit sets to "1", which means the internal write enable latch is set, the device can accept program/
erase/write status register instruction. When WEL bit sets to 0, which means no internal write enable latch; the de-
vice will not accept program/erase/write status register instruction. The program/erase command will be ignored and
will reset WEL bit if it is applied to a protected memory area. To ensure both WIP bit & WEL bit are both set to 0 and
available for next program/erase/operations, WIP bit needs to be confirm to be 0 before polling WEL bit. After WIP bit
confirmed, WEL bit needs to be confirm to be 0.
BP3, BP2, BP1, BP0 bits. The Block Protect (BP3, BP2, BP1, BP0) bits, non-volatile bits, indicate the protected area (as
defined in "Table 2. Protected Area Sizes") of the device to against the program/erase instruction without hardware
protection mode being set. To write the Block Protect (BP3, BP2, BP1, BP0) bits requires the Write Status Register
(WRSR) instruction to be executed. Those bits define the protected area of the memory to against Page Program (PP),
Sector Erase (SE), Block Erase (BE) and Chip Erase (CE) instructions (only if all Block Protect bits set to 0, the CE
instruction can be executed). The BP3, BP2, BP1, BP0 bits are "0" as default. Which is un-protected.
QE bit. The Quad Enable (QE) bit, non-volatile bit, while it is "0", it performs non-Quad and WP# is enable. While
QE is "1", it performs Quad I/O mode and WP# is disabled. QE bit is set to "1" before factory shipping, in the other
word, the system goes into four I/O mode (QE=1) before factory shipping, and the feature of HPM is disabled.
SRWD bit. The Status Register Write Disable (SRWD) bit, non-volatile bit, default value is "0". SRWD bit is operat-
ed together with Write Protection (WP#/SIO2) pin for providing hardware protection mode. The hardware protection
mode requires SRWD sets to 1 and WP#/SIO2 pin signal is low stage. In the hardware protection mode, the Write
Status Register (WRSR) instruction is no longer accepted for execution and the SRWD bit and Block Protect bits (BP3,
BP2, BP1, BP0) are read only. The SRWD bit defaults to be "0".
Status Register
bit7
bit6
bit5
BP3
(level of
protected
block)
bit4
BP2
(level of
protected
block)
bit3
BP1
(level of
protected
block)
bit2
BP0
(level of
protected
block)
bit1
bit0
SRWD (status
register write
protect)
QE
(Quad
Enable)
WEL
(write enable
latch)
WIP
(write in
progress bit)
1=Quad
Enable
0=not Quad
Enable
1=write
enable
0=not write 0=not in write
enable
1=write
operation
1=status
register write
disable
(Note)
(Note)
(Note)
(Note)
operation
Non-volatile Non-volatile Non-volatile Non-volatile Non-volatile Non-volatile
bit bit bit bit bit bit
volatile bit
volatile bit
Note: See the "Table 2. Protected Area Sizes".
P/N: PM1850
REV. 1.2, NOV. 11, 2013
19
MX25L1675E
9-5.
Write Status Register (WRSR)
The WRSR instruction is for changing the values of Status Register Bits. Before sending WRSR instruction, the
Write Enable (WREN) instruction must be decoded and executed to set the Write Enable Latch (WEL) bit in ad-
vance. The WRSR instruction can change the value of Block Protect (BP3, BP2, BP1, BP0) bits to define the pro-
tected area of memory (as shown in "Table 2. Protected Area Sizes"). The WRSR also can set or reset the Quad
enable (QE) bit and set or reset the Status Register Write Disable (SRWD) bit in accordance with Write Protection (WP#/
SIO2) pin signal, but has no effect on bit1(WEL) and bit0 (WIP) of the status register. The WRSR instruction cannot
be executed once the Hardware Protected Mode (HPM) is entered.
The sequence of issuing WRSR instruction is: CS# goes low→ sending WRSR instruction code→ Status Register
data on SI→ CS# goes high.
Figure 6. Write Status Register (WRSR) Sequence (Command 01)
CS#
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15 16 17 18 19 20 21 22 23
Mode 3
Mode 0
SCLK
command
01h
Status
Register In
Configuration
Register In
SI
4
15 14
13
12 11
10 9
8
2
1
0
7
6
5
3
MSB
High-Z
SO
P/N: PM1850
REV. 1.2, NOV. 11, 2013
20
MX25L1675E
The CS# must go high exactly at the byte boundary; otherwise, the instruction will be rejected and not executed.
The self-timed Write Status Register cycle time (tW) is initiated as soon as Chip Select (CS#) goes high. The Write
in Progress (WIP) bit still can be checked out during the Write Status Register cycle is in progress. The WIP sets 1
during the tW timing, and sets 0 when Write Status Register Cycle is completed, and the Write Enable Latch (WEL)
bit is reset.
Table 6. Protection Modes
Mode
Status register condition
WP# and SRWD bit status
Memory
Status register can be written
in (WEL bit is set to "1") and
the SRWD, BP0-BP3
Software protection
mode (SPM)
WP#=1 and SRWD bit=0, or
WP#=0 and SRWD bit=0, or
WP#=1 and SRWD=1
The protected area cannot
be programmed or erased.
bits can be changed
The SRWD, BP0-BP3 of
status register bits cannot be
changed
Hardware protection
mode (HPM)
The protected area cannot
be programmed or erased.
WP#=0, SRWD bit=1
Note: As defined by the values in the Block Protect (BP3, BP2, BP1, BP0) bits of the Status Register, as shown in
"Table 2. Protected Area Sizes".
As the table above showing, the summary of the Software Protected Mode (SPM) and Hardware Protected Mode (HPM):
Software Protected Mode (SPM):
-
When SRWD bit=0, no matter WP#/SIO2 is low or high, the WREN instruction may set the WEL bit and can
change the values of SRWD, BP3, BP2, BP1, BP0 and QE. The protected area, which is defined by BP3, BP2,
BP1, BP0, is at software protected mode (SPM).
-
When SRWD bit=1 and WP#/SIO2 is high, the WREN instruction may set the WEL bit can change the values of
SRWD, BP3, BP2, BP1, BP0 and QE. The protected area, which is defined by BP3, BP2, BP1, BP0, is at soft-
ware protected mode (SPM)
Hardware Protected Mode (HPM):
-
When SRWD bit=1, and then WP#/SIO2 is low (or WP#/SIO2 is low before SRWD bit=1), it enters the hardware
protected mode (HPM). The data of the protected area is protected by software protected mode by BP3, BP2,
BP1, BP0 and hardware protected mode by the WP#/SIO2 to against data modification.
Note:
To exit the hardware protected mode requires WP#/SIO2 driving high once the hardware protected mode is en-
tered. If the WP#/SIO2 pin is permanently connected to high, the hardware protected mode can never be entered;
only can use software protected mode via BP3, BP2, BP1, BP0.
If the system goes into four I/O mode, the feature of HPM will be disabled.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
21
MX25L1675E
Figure 7. WRSR flow
start
WREN command
RDSR command
No
WREN=1?
Yes
WRSR command
Write status register data
RDSR command
No
WIP=0?
Yes
RDSR command
Read WEL=0, BP[3:0], QE,
and SRWD data
No
Verify OK?
Yes
WRSR successfully
WRSR fail
P/N: PM1850
REV. 1.2, NOV. 11, 2013
22
MX25L1675E
9-6.
Read Data Bytes (READ)
The read instruction is for reading data out. The address is latched on rising edge of SCLK, and data shifts out on
the falling edge of SCLK at a maximum frequency fR. The first address byte can be at any location. The address
is automatically increased to the next higher address after each byte data is shifted out, so the whole memory can
be read out at a single READ instruction. The address counter rolls over to 0 when the highest address has been
reached.
The sequence of issuing READ instruction is: CS# goes low→ sending READ instruction code→3-byte address on
SI →data out on SO→ to end READ operation can use CS# to high at any time during data out.
Figure 8. Read Data Bytes (READ) Sequence (Command 03)
CS#
0
1
2
3
4
5
6
7
8
9
10
28 29 30 31 32 33 34 35 36 37 38 39
SCLK
Command
03
24 ADD Cycles
A23 A22 A21
MSB
A3 A2 A1 A0
SI
Data Out 2
Data Out 1
High-Z
D7 D6 D5 D4 D3 D2 D1 D0 D7
MSB MSB
SO
P/N: PM1850
REV. 1.2, NOV. 11, 2013
23
MX25L1675E
9-7.
Read Data Bytes at Higher Speed (FAST_READ)
The FAST_READ instruction is for quickly reading data out. The address is latched on rising edge of SCLK, and
data of each bit shifts out on the falling edge of SCLK at a maximum frequency fC. The first address byte can be at
any location. The address is automatically increased to the next higher address after each byte data is shifted out,
so the whole memory can be read out at a single FAST_READ instruction. The address counter rolls over to 0 when
the highest address has been reached.
The sequence of issuing FAST_READ instruction is: CS# goes low→ sending FAST_READ instruction code→
3-byte address on SI→1-dummy byte (default) address on SI→ data out on SO→ to end FAST_READ operation
can use CS# to high at any time during data out.
In the performance-enhancing mode, P[7:4] must be toggling with P[3:0] ; likewise P[7:0]=A5h,5Ah,F0h or 0Fh can
make this mode continue and reduce the next 4READ instruction. Once P[7:4] is no longer toggling with P[3:0]; like-
wise P[7:0]=FFh,00h,AAh or 55h and afterwards CS# is raised and then lowered, the system then will escape from
performance enhance mode and return to normal operation.
While Program/Erase/Write Status Register cycle is in progress, FAST_READ instruction is rejected without any im-
pact on the Program/Erase/Write Status Register current cycle.
Figure 9. Read at Higher Speed (FAST_READ) Sequence (Command 0B) (104MHz)
CS#
0
1
2
3
4
5
6
7
8
9
10
28 29 30 31
SCLK
Command
0Bh
24 BIT ADDRESS
SI
23 22 21
3
2
1
0
High-Z
SO
CS#
47
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46
SCLK
Dummy Cycle
7
6
5
4
3
2
0
1
SI
DATA OUT 2
DATA OUT 1
7
6
5
4
3
2
1
0
7
7
6
5
4
3
2
0
1
SO
MSB
MSB
MSB
P/N: PM1850
REV. 1.2, NOV. 11, 2013
24
MX25L1675E
9-8.
Dual Read Mode (DREAD)
The DREAD instruction enable double throughput of Serial Flash in read mode. The address is latched on rising
edge of SCLK, and data of every two bits (interleave on 2 I/O pins) shift out on the falling edge of SCLK at a maxi-
mum frequency fT. The first address byte can be at any location. The address is automatically increased to the next
higher address after each byte data is shifted out, so the whole memory can be read out at a single DREAD instruc-
tion. The address counter rolls over to 0 when the highest address has been reached. Once writing DREAD instruc-
tion, the following data out will perform as 2-bit instead of previous 1-bit.
The sequence of issuing DREAD instruction is: CS# goes low
sending DREAD instruction
3-byte address on
→
→
SI
8-bit dummy cycle
data out interleave on SO1 & SO0
to end DREAD operation can use CS# to high at
→
→
→
any time during data out.
While Program/Erase/Write Status Register cycle is in progress, DREAD instruction is rejected without any impact
on the Program/Erase/Write Status Register current cycle.
Figure 10. Dual Read Mode Sequence (Command 3B)
CS#
30 31 32
39 40 41 42 43 44 45
0
1
2
3
4
5
6
7
8
9
SCLK
…
…
Data Out
Data Out
1
8 dummy
cycle
Command
24 ADD Cycle
2
…
A23 A22
A1 A0
D4 D2
D6 D4
D7 D5
3B
D6
D7
D0
SI/SIO0
High Impedance
D1
D5 D3
SO/SIO1
P/N: PM1850
REV. 1.2, NOV. 11, 2013
25
MX25L1675E
9-9.
2 x I/O Read Mode (2READ)
The 2READ instruction enables Double Transfer Rate of Serial Flash in read mode. The address is latched on rising
edge of SCLK, and data of every two bits (interleave on 2 I/O pins) shift out on the falling edge of SCLK at a maxi-
mum frequency fT. The first address byte can be at any location. The address is automatically increased to the next
higher address after each byte data is shifted out, so the whole memory can be read out at a single 2READ instruc-
tion. The address counter rolls over to 0 when the highest address has been reached. Once writing 2READ instruc-
tion, the following address/dummy/data out will perform as 2-bit instead of previous 1-bit.
The sequence of issuing 2READ instruction is: CS# goes low→ sending 2READ instruction→ 24-bit address in-
terleave on SIO1 & SIO0→ 4-bit dummy cycles on SIO1 & SIO0→ data out interleave on SIO1 & SIO0→ to end
2READ operation can use CS# to high at any time during data out.
While Program/Erase/Write Status Register cycle is in progress, 2READ instruction is rejected without any impact
on the Program/Erase/Write Status Register current cycle.
Figure 11. 2 x I/O Read Mode Sequence (Command BB)
CS#
28 29
18 19 20 21 22 23 24 25 26 27
0
1
2
3
4
5
6
7
8
9
SCLK
…
Data Out
Data Out
4 dummy
cycle
Command
12 ADD Cycle
2
1
…
A22 A20
A23 A21
A2 A0
P0
D4 D2
D6 D4
D7 D5
P2
BB(hex)
D6
D7
D0
D1
SI/SIO0
High Impedance
…
A3 A1 P3
P1
D5 D3
SO/SIO1
Note: SI/SIO0 or SO/SIO1 should be kept "0h" or "Fh" in the first two dummy cycles. In other words, P2=P0 or
P3=P1 is necessary.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
26
MX25L1675E
9-10. Quad Read Mode (QREAD)
The QREAD instruction enable quad throughput of Serial Flash in read mode. The address is latched on rising edge
of SCLK, and data of every four bits (interleave on 4 I/O pins) shift out on the falling edge of SCLK at a maximum
frequency fQ. The first address byte can be at any location. The address is automatically increased to the next high-
er address after each byte data is shifted out, so the whole memory can be read out at a single QREAD instruction.
The address counter rolls over to 0 when the highest address has been reached. Once writing QREAD instruction,
the following data out will perform as 4-bit instead of previous 1-bit.
The sequence of issuing QREAD instruction is: CS# goes low
sending QREAD instruction → 3-byte address on
→
SI
8-bit dummy cycle
data out interleave on SO3, SO2, SO1 & SO0
to end QREAD operation can use
→
→
→
CS# to high at any time during data out.
While Program/Erase/Write Status Register cycle is in progress, QREAD instruction is rejected without any impact
on the Program/Erase/Write Status Register current cycle.
Figure 12. Quad Read Mode Sequence (Command 6B)
CS#
29 30 31 32 33
38 39 40 41 42
0
1
2
3
4
5
6
7
8
9
SCLK
…
…
Data
Out 2
Data
Out 3
Command
6B
8 dummy cycles
24 ADD Cycles
Data
Out 1
…
A23A22
A2 A1 A0
D4 D0 D4 D0 D4
SI/SO0
High Impedance
High Impedance
High Impedance
SO/SO1
D5 D1 D5 D1 D5
D6 D2 D6 D2 D6
WP#/SO2
HOLD#/SO3
D7 D3 D7 D3 D7
P/N: PM1850
REV. 1.2, NOV. 11, 2013
27
MX25L1675E
9-11. 4 x I/O Read Mode (4READ)
The 4READ instruction enables quad throughput of Serial Flash in read mode. A Quad Enable (QE) bit of status
Register must be set to "1" before sending the 4READ instruction. The address is latched on rising edge of SCLK,
and data of every four bits (interleave on 4 I/O pins) shift out on the falling edge of SCLK at a maximum frequency
fQ. The first address byte can be at any location. The address is automatically increased to the next higher address
after each byte data is shifted out, so the whole memory can be read out at a single 4READ instruction. The address
counter rolls over to 0 when the highest address has been reached. Once writing 4READ instruction, the following
address/dummy/data out will perform as 4-bit instead of previous 1-bit.
The sequence of issuing 4READ instruction is: CS# goes low sending 4READ instruction 24-bit address inter-
→
→
leave on SIO3, SIO2, SIO1 & SIO0 2+4 dummy cycles data out interleave on SIO3, SIO2, SIO1 & SIO0 to
→
→
→
end 4READ operation can use CS# to high at any time during data out.
Figure 13. 4 x I/O Read Mode Sequence (Command EB)
CS#
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23
n
SCLK
4 dummy
cycles
8 Bit Instruction
EB(hex)
6 Address cycles
Data Output
Performance
enhance
indicator (Note)
data
bit4, bit0, bit4....
address
bit20, bit16..bit0
P4 P0
P5 P1
P6 P2
P7 P3
SI/SIO0
High Impedance
High Impedance
High Impedance
address
bit21, bit17..bit1
data
bit5 bit1, bit5....
SO/SIO1
WP#/SIO2
NC/SIO3
address
bit22, bit18..bit2
data
bit6 bit2, bit6....
address
bit23, bit19..bit3
data
bit7 bit3, bit7....
Note:
1. Hi-impedance is inhibited for the two clock cycles.
2. P7≠P3, P6≠P2, P5≠P1 & P4≠P0 (Toggling) is inhibited.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
28
MX25L1675E
Another sequence of issuing 4READ instruction especially useful in random access is : CS# goes low→ sending
4READ instruction→ 3-bytes address interleave on SIO3, SIO2, SIO1 & SIO0 →performance enhance toggling bit
P[7:0]→ 4 dummy cycles→ data out until CS# goes high → CS# goes low (reduce 4 Read instruction) → 24-bit ran-
dom access address (Please refer to "Figure 14. 4 x I/O Read enhance performance Mode Sequence (Command
EB)" ).
In the performance-enhancing mode (Notes of "Figure 14. 4 x I/O Read enhance performance Mode Sequence
(Command EB)"), P[7:4] must be toggling with P[3:0]; likewise P[7:0]=A5h, 5Ah, F0h or 0Fh can make this mode
continue and reduce the next 4READ instruction. Once P[7:4] is no longer toggling with P[3:0]; likewise P[7:0]=FFh,
00h, AAh or 55h. These commands will reset the performance enhance mode. And afterwards CS# is raised and
then lowered, the system then will return to normal operation.
While Program/Erase/Write Status Register cycle is in progress, 4READ instruction is rejected without any impact
on the Program/Erase/Write Status Register current cycle.
9-12. Performance Enhance Mode
The device could waive the command cycle bits if the two cycle bits after address cycle toggles. (Please note "Fig-
ure 14. 4 x I/O Read enhance performance Mode Sequence (Command EB)")
Please be noticed that “EBh” and “E7h” commands support enhance mode. The performance enhance mode is not
supported in dual I/O mode.
After entering enhance mode, following CSB go high, the device will stay in the read mode and treat CSB go low of
the first clock as address instead of command cycle.
To exit enhance mode, a new fast read command whose first two dummy cycles is not toggle then exit. Or issue
”FFh” command to exit enhance mode.
9-13. Performance Enhance Mode Reset (FFh)
To conduct the Performance Enhance Mode Reset operation, FFh command code, 8 clocks, should be issued in 1I/
O sequence.
If the system controller is being Reset during operation, the flash device will return to the standard operation.
Upon Reset of main chip, Instruction would be issued from the system. Instructions like Read ID (9Fh) or Fast Read
(0Bh) would be issued.
The SIO[3:1] are don't care when during this mode.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
29
MX25L1675E
Figure 14. 4 x I/O Read enhance performance Mode Sequence (Command EB)
CS#
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23
n
SCLK
4 dummy
cycles
8 Bit Instruction
EB(hex)
6 Address cycles
Data Output
Performance
enhance
indicator (Note)
data
bit4, bit0, bit4....
address
bit20, bit16..bit0
P4 P0
P5 P1
P6 P2
P7 P3
SI/SIO0
High Impedance
High Impedance
High Impedance
address
bit21, bit17..bit1
data
bit5 bit1, bit5....
SO/SIO1
WP#/SIO2
NC/SIO3
address
bit22, bit18..bit2
data
bit6 bit2, bit6....
address
bit23, bit19..bit3
data
bit7 bit3, bit7....
CS#
n+1
...........
n+7......n+9 ........... n+13
...........
SCLK
4 dummy
cycles
6 Address cycles
address
Data Output
Performance
enhance
indicator (Note)
data
bit4, bit0, bit4....
P4 P0
P5 P1
P6 P2
P7 P3
SI/SIO0
bit20, bit16..bit0
address
bit21, bit17..bit1
data
bit5 bit1, bit5....
SO/SIO1
WP#/SIO2
NC/SIO3
address
bit22, bit18..bit2
data
bit6 bit2, bit6....
address
bit23, bit19..bit3
data
bit7 bit3, bit7....
Note:
1. Performance enhance mode, if P7≠P3 & P6≠P2 & P5≠P1 & P4≠P0 (Toggling), ex: A5, 5A, 0F, if not using
performance enhance recommend to keep 1 or 0 in performance enhance indicator.
Reset the performance enhance mode, if P7=P3 or P6=P2 or P5=P1 or P4=P0, ex: AA, 00, FF
P/N: PM1850
REV. 1.2, NOV. 11, 2013
30
MX25L1675E
Figure 15. Performance Enhance Mode Reset for Fast Read Quad I/O
Mode Bit Reset
for Quad I/O
CS#
Mode 3
Mode 3
0
1
2
3
4
5
6
7
SCLK
Mode 0
Mode 0
IO0
IO1
IO2
FFh
Don’t Care
Don’t Care
Don’t Care
IO3
P/N: PM1850
REV. 1.2, NOV. 11, 2013
31
MX25L1675E
9-14. Sector Erase (SE)
The Sector Erase (SE) instruction is for erasing the data of the chosen sector to be "1". The instruction is used for
any 4K-byte sector. A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL) bit before
sending the Sector Erase (SE). Any address of the sector (see "Table 4. Memory Organization" ) is a valid address
for Sector Erase (SE) instruction. The CS# must go high exactly at the byte boundary (the latest eighth of address
byte has been latched-in); otherwise, the instruction will be rejected and not executed.
The sequence of issuing SE instruction is: CS# goes low → sending SE instruction code→ 3-byte address on SI
→CS# goes high.
The SIO[3:1] are don't care when during this mode.
The self-timed Sector Erase Cycle time (tSE) is initiated as soon as Chip Select (CS#) goes high. The Write in Pro-
gress (WIP) bit still can be checked out during the Sector Erase cycle is in progress. The WIP sets 1 during the tSE
timing, and sets 0 when Sector Erase Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the page
is protected by BP3, BP2, BP1, BP0 bits, the Sector Erase (SE) instruction will not be executed on the page.
Figure 16. Sector Erase (SE) Sequence (Command 20)
CS#
0
1
2
3
4
5
6
7
8
9
29 30 31
SCLK
Command
20h
24 Bit Address
SI
23 22
MSB
2
1
0
P/N: PM1850
REV. 1.2, NOV. 11, 2013
32
MX25L1675E
9-15. Block Erase (BE)
The Block Erase (BE) instruction is for erasing the data of the chosen block to be "1". The instruction is used for
64K-byte block erase operation. A Write Enable (WREN) instruction must execute to set the Write Enable Latch (WEL)
bit before sending the Block Erase (BE). Any address of the block (see "Table 4. Memory Organization" ) is a valid
address for Block Erase (BE) instruction. The CS# must go high exactly at the byte boundary (the latest eighth of
address byte has been latched-in); otherwise, the instruction will be rejected and not executed.
The sequence of issuing BE instruction is: CS# goes low → sending BE instruction code → 3-byte address on SI →
CS# goes high.
The SIO[3:1] are don't care when during this mode.
The self-timed Block Erase Cycle time (tBE) is initiated as soon as Chip Select (CS#) goes high. The Write in Pro-
gress (WIP) bit still can be checked out during the Sector Erase cycle is in progress. The WIP sets 1 during the tBE
timing, and sets 0 when Sector Erase Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the page
is protected by BP3, BP2, BP1, BP0 bits, the Block Erase (BE) instruction will not be executed on the page.
Figure 17. Block Erase (BE) Sequence (Command D8)
CS#
0
1
2
3
4
5
6
7
8
9
29 30 31
SCLK
Command
D8h
24 Bit Address
SI
23 22
MSB
2
0
1
P/N: PM1850
REV. 1.2, NOV. 11, 2013
33
MX25L1675E
9-16. Chip Erase (CE)
The Chip Erase (CE) instruction is for erasing the data of the whole chip to be "1". A Write Enable (WREN) instruc-
tion must execute to set the Write Enable Latch (WEL) bit before sending the Chip Erase (CE). The CS# must go
high exactly at the byte boundary; otherwise, the instruction will be rejected and not executed.
The sequence of issuing CE instruction is: CS# goes low → sending CE instruction code → CS# goes high.
The SIO[3:1] are don't care when during this mode.
The self-timed Chip Erase Cycle time (tCE) is initiated as soon as Chip Select (CS#) goes high. The Write in Pro-
gress (WIP) bit still can be checked out during the Chip Erase cycle is in progress. The WIP sets 1 during the tCE
timing, and sets 0 when Chip Erase Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If the chip is
protected, the Chip Erase (CE) instruction will not be executed, but WEL will be reset.
Figure 18. Chip Erase (CE) Sequence (Command 60 or C7)
CS#
0
1
2
3
4
5
6
7
SCLK
SI
Command
60h or C7h
P/N: PM1850
REV. 1.2, NOV. 11, 2013
34
MX25L1675E
9-17. Page Program (PP)
The Page Program (PP) instruction is for programming the memory to be "0". A Write Enable (WREN) instruction
must execute to set the Write Enable Latch (WEL) bit before sending the Page Program (PP). The device programs
only the last 256 data bytes sent to the device. If the entire 256 data bytes are going to be programmed, A7-A0
(The eight least significant address bits) should be set to 0. If A7-A0 are not all zero, transmitted data that exceed
page length are programmed from the starting address (24-bit address that last 8 bit are all 0) of currently selected
page. If the data bytes sent to the device exceeds 256, the last 256 data byte is programmed at the request page
and previous data will be disregarded. If the data bytes sent to the device has not exceeded 256, the data will be
programmed at the request address of the page. There will be no effort on the other data bytes of the same page.
The sequence of issuing PP instruction is: CS# goes low→ sending PP instruction code→ 3-byte address on SI→ at
least 1-byte on data on SI→ CS# goes high.
The CS# must be kept to low during the whole Page Program cycle; The CS# must go high exactly at the byte
boundary (the latest eighth bit of data being latched in), otherwise, the instruction will be rejected and will not be
executed.
The self-timed Page Program Cycle time (tPP) is initiated as soon as Chip Select (CS#) goes high. The Write in
Progress (WIP) bit still can be checked out during the Page Program cycle is in progress. The WIP sets 1 during
the tPP timing, and sets 0 when Page Program Cycle is completed, and the Write Enable Latch (WEL) bit is reset. If
the page is protected by BP3~0, the array data will be protected (no change) and the WEL bit will still be reset.
The SIO[3:1] are don't care when during this mode.
Figure 19. Page Program (PP) Sequence (Command 02)
CS#
0
1
2
3
4
5
6
7
8
9
10
28 29 30 31 32 33 34 35 36 37 38 39
SCLK
Command
02h
24-Bit Address
Data Byte 1
23 22 21
MSB
3
2
1
0
7
6
5
4
3
2
0
1
SI
MSB
CS#
40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55
SCLK
Data Byte 2
Data Byte 3
Data Byte 256
7
6
5
4
3
2
0
7
6
5
4
3
2
0
7
6
5
4
3
2
0
1
1
1
SI
MSB
MSB
MSB
P/N: PM1850
REV. 1.2, NOV. 11, 2013
35
MX25L1675E
9-18. 4 x I/O Page Program (4PP)
The Quad Page Program (4PP) instruction is for programming the memory to be "0". A Write Enable (WREN)
instruction must execute to set the Write Enable Latch (WEL) bit and Quad Enable (QE) bit must be set to "1"
before sending the Quad Page Program (4PP). The Quad Page Programming takes four pins: SIO0, SIO1, SIO2,
and SIO3, which can raise programmer performance and the effectiveness of application of lower clock less than
85MHz. For system with faster clock, the Quad page program cannot provide more actual favors, because the
required internal page program time is far more than the time data flows in. Therefore, we suggest that while
executing this command (especially during sending data), user can slow the clock speed down to 85MHz below.
The other function descriptions are as same as standard page program.
The sequence of issuing 4PP instruction is: CS# goes low→ sending 4PP instruction code→ 3-byte address on
SIO[3:0]→ at least 1-byte on data on SIO[3:0]→ CS# goes high.
If the page is protected by BP3~0, the array data will be protected (no change) and the WEL bit will still be reset.
Figure 20. 4 x I/O Page Program (4PP) Sequence (Command 38)
CS#
524 525
10 11 12 13 14 15 16 17
0
1
2
3
4
5
6
7
8
9
SCLK
…
…
Data
Byte 256
Data Data
Byte 1 Byte 2
Command
38
6 ADD cycles
D4 D0 D4 D0
D4 D0
A20 A16 A12 A8 A4 A0
SI/SIO0
…
…
…
D5 D1 D5 D1
D6 D2 D6 D2
D7 D3 D7 D3
D5 D1
D6 D2
D7 D3
SO/SIO1
A21 A17 A13 A9 A5 A1
A22 A18 A14 A10 A6 A2
WP#/SIO2
HOLD#/SIO3
A23 A19 A15 A11 A7 A3
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
9-19. Deep Power-down (DP)
The Deep Power-down (DP) instruction is for setting the device on the minimizing the power consumption (to enter-
ing the Deep Power-down mode), the standby current is reduced from ISB1 to ISB2). The Deep Power-down mode
requires the Deep Power-down (DP) instruction to enter, during the Deep Power-down mode, the device is not ac-
tive and all Write/Program/Erase instructions are ignored. When CS# goes high, it's only in standby mode not deep
power-down mode. It's different from Standby mode.
The sequence of issuing DP instruction is: CS# goes low→ sending DP instruction code→ CS# goes high.
The SIO[3:1] are don't care when during this mode.
Once the DP instruction is set, all instructions will be ignored except the Release from Deep Power-down mode (RDP)
and Read Electronic Signature (RES) instruction. (those instructions allow the ID being reading out). When Power-
down, the deep power-down mode automatically stops, and when power-up, the device automatically is in standby
mode. For RDP instruction the CS# must go high exactly at the byte boundary (the latest eighth bit of instruction
code has been latched-in); otherwise, the instruction will not be executed. As soon as Chip Select (CS#) goes high,
a delay of tDP is required before entering the Deep Power-down mode and reducing the current to ISB2.
Figure 21. Deep Power-down (DP) Sequence (Command B9)
CS#
tDP
0
1
2
3
4
5
6
7
SCLK
SI
Command
B9h
Stand-by Mode
Deep Power-down Mode
P/N: PM1850
REV. 1.2, NOV. 11, 2013
37
MX25L1675E
9-20. Release from Deep Power-down (RDP), Read Electronic Signature (RES)
The Release from Deep Power-down (RDP) instruction is terminated by driving Chip Select (CS#) High. When Chip
Select (CS#) is driven High, the device is put in the standby Power mode. If the device was not previously in the
Deep Power-down mode, the transition to the standby Power mode is immediate. If the device was previously in the
Deep Power-down mode, though, the transition to the standby Power mode is delayed by tRES2, and Chip Select
(CS#) must remain High for at least tRES2(max), as specified in "Table 13. AC Characteristics". Once in the stand-
by mode, the device waits to be selected, so that it can receive, decode and execute instructions.
RES instruction is for reading out the old style of 8-bit Electronic Signature, whose values are shown as "Table 7.
ID Definitions". This is not the same as RDID instruction. It is not recommended to use for new design. For new
design, please use RDID instruction. Even in Deep power-down mode, the RDP and RES are also allowed to be
executed, only except the device is in progress of program/erase/write cycles; there's no effect on the current pro-
gram/erase/write cycles in progress.
The SIO[3:1] are don't care when during this mode.
The RES instruction is ended by CS# goes high after the ID been read out at least once. The ID outputs repeat-
edly if continuously send the additional clock cycles on SCLK while CS# is at low. If the device was not previously
in Deep Power-down mode, the device transition to standby mode is immediate. If the device was previously in
Deep Power-down mode, there's a delay of tRES2 to transit to standby mode, and CS# must remain to high at least
tRES2(max). Once in the standby mode, the device waits to be selected, so it can receive, decode, and execute
instruction.
The RDP instruction is for releasing from Deep Power-down Mode.
Figure 22. Release from Deep Power-down and Read Electronic Signature (RES) Sequence (Command AB)
CS#
0
1
2
3
4
5
6
7
8
9
10
28 29 30 31 32 33 34 35 36 37 38
SCLK
Command
ABh
t
3 Dummy Bytes
RES2
SI
23 22 21
MSB
3
2
1
0
Electronic Signature Out
High-Z
7
6
5
4
3
2
0
1
SO
MSB
Deep Power-down Mode
Stand-by Mode
P/N: PM1850
REV. 1.2, NOV. 11, 2013
38
MX25L1675E
Figure 23. Release from Deep Power-down (RDP) Sequence (Command AB)
CS#
tRES1
0
1
2
3
4
5
6
7
SCLK
Command
ABh
SI
High-Z
SO
Deep Power-down Mode
Stand-by Mode
P/N: PM1850
REV. 1.2, NOV. 11, 2013
39
MX25L1675E
9-21. Read Electronic Manufacturer ID & Device ID (REMS), (REMS2), (REMS4)
The REMS, REMS2, and REMS4 instruction provides both the JEDEC assigned Manufacturer ID and the specific
Device ID.
The instruction is initiated by driving the CS# pin low and shift the instruction code "90h", "DFh" or "EFh" followed
by two dummy bytes and one byte address (A7~A0). After which, the Manufacturer ID for MXIC (C2h) and the De-
vice ID are shifted out on the falling edge of SCLK with most significant bit (MSB) first as shown in the figure below.
The Device ID values are listed in "Table 7. ID Definitions". If the one-byte address is initially set to 01h, then the
Device ID will be read first and then followed by the Manufacturer ID. The Manufacturer and Device IDs can be
read continuously, alternating from one to the other. The instruction is completed by driving CS# high.
Figure 24. Read Electronic Manufacturer & Device ID (REMS) Sequence (Command 90 or EF or DF)
CS#
0
1
2
3
4
5
6
7
8
9
10
47
30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46
28
29
SCLK
Command
90
24 ADD Cycles
SI
A0
A1
A3 A2
A23 A22 A21
Manufacturer ID
Device ID
High-Z
SO
D7 D6 D5 D4 D3 D2 D1 D0 D7 D6 D5 D4 D3 D2 D1 D0
MSB
MSB
MSB
Notes:
1. A0=0 will output the Manufacturer ID first and A0=1 will output Device ID first. A1~A23 are don't care.
2. Instruction is either 90(hex) or EF(hex) or DF(hex).
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
9-22. ID Read
User can execute this ID Read instruction to identify the Device ID and Manufacturer ID. The sequence of issue ID
instruction is CS# goes low→sending ID instruction→→Data out on SO→CS# goes high. Most significant bit (MSB)
first.
After the command cycle, the device will immediately output data on the falling edge of SCLK. The manufacturer ID,
memory type, and device ID data byte will be output continuously, until the CS# goes high.
Table 7. ID Definitions
manufacturer ID
C2
memory type
memory density
15
RDID Command
RES Command
24
electronic ID
24
manufacturer ID
C2
device ID
24
REMS/REMS2/REMS4/
Command
9-23. Enter Secured OTP (ENSO)
The ENSO instruction is for entering the additional 512-bit secured OTP mode. The additional 512-bit secured OTP
is independent from main array, which may use to store unique serial number for system identifier. After entering
the Secured OTP mode, and then follow standard read or program, procedure to read out the data or update data.
The Secured OTP data cannot be updated again once it is lock-down.
The sequence of issuing ENSO instruction is: CS# goes low→sending ENSO instruction to enter Secured OTP
mode→ CS# goes high.
Please note that WRSR/WRSCUR commands are not acceptable during the access of secure OTP region, once
se- curity OTP is lock down, only read related commands are valid.
9-24. Exit Secured OTP (EXSO)
The EXSO instruction is for exiting the additional 512-bit secured OTP mode.
The sequence of issuing EXSO instruction is: CS# goes low→sending EXSO instruction to exit Secured OTP
mode→CS# goes high.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
41
MX25L1675E
9-25. Read Security Register (RDSCUR)
The RDSCUR instruction is for reading the value of Security Register. The Read Security Register can be read at
any time (even in program/erase/write status register/write security register condition) and continuously.
The sequence of issuing RDSCUR instruction is : CS# goes low→ sending RDSCUR instruction → Security Regis-
ter data out on SO→ CS# goes high.
The SIO[3:1] are don't care when during this mode.
Figure 25. Read Security Register (RDSCUR) Sequence (Command 2B)
CS#
0
1
2
3
4
5
6
7
8
9 10 11 12 13 14 15
SCLK
SI
command
2B
Security Register Out
Security Register Out
High-Z
SO
7
6
5
4
3
2
1
0
7
6
5
4
3
2
1
0
7
MSB
MSB
The definition of the Security Register is as below:
Secured OTP Indicator bit. The Secured OTP indicator bit shows the chip is locked by factory before ex- factory or
not. When it is "0", it indicates non- factory lock; "1" indicates factory- lock.
Lock-down Secured OTP (LDSO) bit. By writing WRSCUR instruction, the LDSO bit may be set to "1" for custom-
er lock-down purpose. However, once the bit is set to "1" (lock-down), the LDSO bit and the 512-bit Secured OTP
area cannot be update any more. While it is in 512-bit secured OTP mode, main array access is not allowed.
Table 8. Security Register Definition
bit7
bit6
bit5
bit4
bit3
bit2
bit1
bit0
LDSO
(indicate if
lock-down
Secured OTP
indicator bit
x
x
x
x
x
x
0 = not lock-down
1 = lock-down
(cannot
program/erase
OTP)
0 = non-factory
lock
reserved
reserved
reserved
reserved
reserved
reserved
1 = factory
lock
volatile bit volatile bit volatile bit volatile bit volatile bit volatile bit
non-volatile bit
non-volatile bit
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
9-26. Write Security Register (WRSCUR)
The WRSCUR instruction is for changing the values of Security Register Bits. The WREN instruction is required be-
fore sending WRSCUR instruction. The WRSCUR instruction may change the values of bit1 (LDSO bit) for customer
to lock-down the Secured OTP area. Once the LDSO bit is set to "1", the Secured OTP area cannot be updated any
more.
The sequence of issuing WRSCUR instruction is :CS# goes low→ sending WRSCUR instruction → CS# goes high.
The SIO[3:1] are don't care when during this mode.
The CS# must go high exactly at the boundary; otherwise, the instruction will be rejected and not executed.
Figure 26. Write Security Register (WRSCUR) Sequence (Command 2F)
CS#
0
1
2
3
4
5
6
7
SCLK
Command
2F
SI
High-Z
SO
P/N: PM1850
REV. 1.2, NOV. 11, 2013
43
MX25L1675E
9-27. Read SFDP Mode (RDSFDP)
The Serial Flash Discoverable Parameter (SFDP) standard provides a consistent method of describing the functional
and feature capabilities of serial flash devices in a standard set of internal parameter tables. These parameter tables
can be interrogated by host system software to enable adjustments needed to accommodate divergent features
from multiple vendors. The concept is similar to the one found in the Introduction of JEDEC Standard, JESD68 on
CFI.
The sequence of issuing RDSFDP instruction is same as CS# goes low→send RDSFDP instruction (5Ah)→send 3
address bytes on SI pin→send 1 dummy byte on SI pin→read SFDP code on SO→to end RDSFDP operation can
use CS# to high at any time during data out.
SFDP is a JEDEC Standard. JESD216.
Figure 27. Read Serial Flash Discoverable Parameter (RDSFDP) Sequence
CS#
0
1
2
3
4
5
6
7
8
9
10
28 29 30 31
SCLK
Command
5Ah
24 BIT ADDRESS
SI
23 22 21
3
2
1
0
High-Z
SO
CS#
47
32 33 34 35 36 37 38 39 40 41 42 43 44 45 46
SCLK
Dummy Cycle
7
6
5
4
3
2
0
1
SI
DATA OUT 2
DATA OUT 1
7
6
5
4
3
2
1
0
7
7
6
5
4
3
2
0
1
SO
MSB
MSB
MSB
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
Table 9. Signature and Parameter Identification Data Values
Add (h) DW Add Data (h/b)
Data
(h)
Description
Comment
(Byte)
(Bit)
(Note1)
00h
07:00
53h
53h
46h
44h
50h
00h
01h
01h
01h
02h
03h
04h
05h
06h
15:08
23:16
31:24
07:00
15:08
23:16
46h
44h
50h
00h
01h
01h
SFDP Signature
Fixed: 50444653h
SFDP Minor Revision Number
SFDP Major Revision Number
Number of Parameter Headers
Start from 00h
Start from 01h
Start from 01h
Unused
07h
08h
09h
0Ah
0Bh
31:24
07:00
15:08
23:16
31:24
FFh
00h
00h
01h
09h
FFh
00h
00h
01h
09h
00h: it indicates a JEDEC specified
header.
ID number (JEDEC)
Parameter Table Minor Revision
Number
Parameter Table Major Revision
Number
Parameter Table Length
(in double word)
Start from 00h
Start from 01h
How many DWORDs in the
Parameter table
0Ch
0Dh
0Eh
07:00
15:08
23:16
30h
00h
00h
30h
00h
00h
First address of JEDEC Flash
Parameter table
Parameter Table Pointer (PTP)
Unused
0Fh
10h
11h
12h
13h
31:24
07:00
15:08
23:16
31:24
FFh
C2h
00h
01h
04h
FFh
C2h
00h
01h
04h
ID number
(Macronix manufacturer ID)
Parameter Table Minor Revision
Number
Parameter Table Major Revision
Number
Parameter Table Length
(in double word)
it indicates Macronix manufacturer
ID
Start from 00h
Start from 01h
How many DWORDs in the
Parameter table
14h
15h
16h
07:00
15:08
23:16
60h
00h
00h
60h
00h
00h
First address of Macronix Flash
Parameter table
Parameter Table Pointer (PTP)
Unused
17h
31:24
FFh
FFh
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
Table 10. Parameter Table (0): JEDEC Flash Parameter Tables
Add (h) DW Add Data (h/b)
Data
(h)
Description
Comment
(Byte)
(Bit)
(Note1)
00: Reserved, 01: 4KB erase,
10: Reserved,
Block/Sector Erase sizes
01:00
01b
11: not support 4KB erase
Write Granularity
0: 1Byte, 1: 64Byte or larger
02
03
1b
0b
Write Enable Instruction Required 0: not required
for Writing to Volatile Status
1: required 00h to be written to the
Registers
status register bit
30h
E5h
0: use 50h opcode,
1: use 06h opcode
Write Enable Opcode Select for
Writing to Volatile Status Registers
Note: If target flash status register
is nonvolatile, then bits 3 and 4
must be set to 00b.
04
0b
Contains 111b and can never be
changed
Unused
07:05
111b
4KB Erase Opcode
31h
32h
15:08
16
20h
1b
20h
F1h
FFh
(1-1-2) Fast Read (Note2)
0=not support 1=support
Address Bytes Number used in
addressing flash array
00: 3Byte only, 01: 3 or 4Byte,
10: 4Byte only, 11: Reserved
18:17
19
00b
0b
Double Transfer Rate (DTR)
Clocking
0=not support 1=support
(1-2-2) Fast Read
(1-4-4) Fast Read
(1-1-4) Fast Read
Unused
0=not support 1=support
0=not support 1=support
0=not support 1=support
20
21
1b
1b
22
1b
23
1b
Unused
33h
31:24
31:00
FFh
Flash Memory Density
37h:34h
00FFFFFFh
(1-4-4) Fast Read Number of Wait 0 0000b: Wait states (Dummy
04:00
0 0100b
states (Note3)
Clocks) not support
38h
39h
3Ah
3Bh
44h
EBh
08h
6Bh
(1-4-4) Fast Read Number of
Mode Bits (Note4)
000b: Mode Bits not support
07:05
15:08
20:16
010b
EBh
(1-4-4) Fast Read Opcode
(1-1-4) Fast Read Number of Wait 0 0000b: Wait states (Dummy
states
(1-1-4) Fast Read Number of
Mode Bits
0 1000b
Clocks) not support
000b: Mode Bits not support
23:21
31:24
000b
6Bh
(1-1-4) Fast Read Opcode
P/N: PM1850
REV. 1.2, NOV. 11, 2013
46
MX25L1675E
Add (h) DW Add Data (h/b) Data
Description
Comment
(Byte)
(Bit)
(Note1)
(h)
(1-1-2) Fast Read Number of Wait 0 0000b: Wait states (Dummy
04:00
0 1000b
states
Clocks) not support
3Ch
08h
(1-1-2) Fast Read Number of
Mode Bits
000b: Mode Bits not support
07:05
15:08
20:16
000b
3Bh
(1-1-2) Fast Read Opcode
3Dh
3Eh
3Fh
3Bh
04h
BBh
(1-2-2) Fast Read Number of Wait 0 0000b: Wait states (Dummy
0 0100b
states
Clocks) not support
(1-2-2) Fast Read Number of
Mode Bits
000b: Mode Bits not support
23:21
000b
(1-2-2) Fast Read Opcode
(2-2-2) Fast Read
Unused
31:24
00
BBh
0b
0=not support 1=support
0=not support 1=support
03:01
04
111b
0b
40h
EEh
(4-4-4) Fast Read
Unused
07:05
31:08
15:00
111b
FFh
FFh
Unused
43h:41h
45h:44h
FFh
FFh
Unused
(2-2-2) Fast Read Number of Wait 0 0000b: Wait states (Dummy
20:16
23:21
0 0000b
000b
states
Clocks) not support
46h
00h
(2-2-2) Fast Read Number of
Mode Bits
000b: Mode Bits not support
(2-2-2) Fast Read Opcode
Unused
47h
31:24
15:00
FFh
FFh
FFh
FFh
49h:48h
(4-4-4) Fast Read Number of Wait 0 0000b: Wait states (Dummy
20:16
0 0000b
states
Clocks) not support
4Ah
00h
(4-4-4) Fast Read Number of
Mode Bits
000b: Mode Bits not support
23:21
31:24
07:00
15:08
23:16
31:24
07:00
15:08
23:16
31:24
000b
FFh
0Ch
20h
10h
D8h
00h
FFh
00h
FFh
(4-4-4) Fast Read Opcode
4Bh
4Ch
4Dh
4Eh
4Fh
50h
51h
52h
53h
FFh
0Ch
20h
10h
D8h
00h
FFh
00h
FFh
Sector/block size = 2^N bytes (Note5)
0x00b: this sector type doesn't exist
Sector Type 1 Size
Sector Type 1 erase Opcode
Sector Type 2 Size
Sector/block size = 2^N bytes
0x00b: this sector type doesn't exist
Sector Type 2 erase Opcode
Sector Type 3 Size
Sector/block size = 2^N bytes
0x00b: this sector type doesn't exist
Sector Type 3 erase Opcode
Sector Type 4 Size
Sector/block size = 2^N bytes
0x00b: this sector type doesn't exist
Sector Type 4 erase Opcode
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
Table 11. Parameter Table (1): Macronix Flash Parameter Tables
Add (h) DW Add Data (h/b)
Data
(h)
Description
Comment
2000h=2.000V
2700h=2.700V
3600h=3.600V
(Byte)
(Bit)
(Note1)
07:00
15:08
00h
36h
00h
36h
Vcc Supply Maximum Voltage
61h:60h
1650h=1.650V
2250h=2.250V
2350h=2.350V
2700h=2.700V
23:16
31:24
00h
27h
00h
27h
Vcc Supply Minimum Voltage
H/W Reset# pin
63h:62h
0=not support 1=support
00
0b
H/W Hold# pin
0=not support 1=support
0=not support 1=support
0=not support 1=support
01
02
03
0b
1b
0b
Deep Power Down Mode
S/W Reset
Reset Enable (66h) should be
issued before Reset Opcode
1111 1111b
(FFh)
65h:64h
4FF4h
S/W Reset Opcode
11:04
Program Suspend/Resume
Erase Suspend/Resume
Unused
0=not support 1=support
0=not support 1=support
12
13
0b
0b
14
1b
Wrap-Around Read mode
Wrap-Around Read mode Opcode
0=not support 1=support
15
0b
66h
67h
23:16
FFh
FFh
FFh
08h:support 8B wrap-around read
16h:8B&16B
32h:8B&16B&32B
Wrap-Around Read data length
31:24
FFh
64h:8B&16B&32B&64B
Individual block lock
0=not support 1=support
0=Volatile 1=Nonvolatile
00
01
0b
1b
Individual block lock bit
(Volatile/Nonvolatile)
1111 1111b
(FFh)
Individual block lock Opcode
09:02
10
Individual block lock Volatile
protect bit default protect status
0=protect 1=unprotect
1b
CFFEh
6Bh:68h
Secured OTP
Read Lock
Permanent Lock
Unused
0=not support 1=support
0=not support 1=support
0=not support 1=support
11
12
1b
0b
13
0b
15:14
31:16
31:00
11b
FFh
FFh
Unused
FFh
FFh
Unused
6Fh:6Ch
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
Note 1: h/b is hexadecimal or binary.
Note 2: (x-y-z) means I/O mode nomenclature used to indicate the number of active pins used for the opcode (x),
address (y), and data (z). At the present time, the only valid Read SFDP instruction modes are: (1-1-1), (2-2-2),
and (4-4-4)
Note 3: Wait States is required dummy clock cycles after the address bits or optional mode bits.
Note 4: Mode Bits is optional control bits that follow the address bits. These bits are driven by the system controller
if they are specified. (eg,read performance enhance toggling bits)
Note 5: 4KB=2^0Ch, 32KB=2^0Fh, 64KB=2^10h
Note 6: All unused and undefined area data is blank FFh.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
10. POWER-ON STATE
The device is at below states when power-up:
- Standby mode (please note it is not Deep Power-down mode)
- Write Enable Latch (WEL) bit is reset
The device must not be selected during power-up and power-down stage unless the VCC achieves below correct
level:
- VCC minimum at power-up stage and then after a delay of tVSL
- GND at power-down
Please note that a pull-up resistor on CS# may ensure a safe and proper power-up/down level.
An internal Power-on Reset (POR) circuit may protect the device from data corruption and inadvertent data change
during power up state.
For further protection on the device, if the VCC does not reach the VCC minimum level, the correct operation is not
guaranteed. The read, write, erase, and program command should be sent after the time delay:
- tVSL after VCC reached VCC minimum level
The device can accept read command after VCC reached VCC minimum and a time delay of tVSL.
Note:
- To stabilize the VCC level, the VCC rail decoupled by a suitable capacitor close to package pins is recommended.
(generally around 0.1uF)
P/N: PM1850
REV. 1.2, NOV. 11, 2013
50
MX25L1675E
11. ELECTRICAL SPECIFICATIONS
11-1. Absolute Maximum Ratings
RATING
VALUE
Ambient Operating Temperature
Storage Temperature
Applied Input Voltage
Applied Output Voltage
VCC to Ground Potential
Industrial grade
-40°C to 85°C
-65°C to 150°C
-0.5V to 4.6V
-0.5V to 4.6V
-0.5V to 4.6V
NOTICE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the
device. This is stress rating only and functional operational sections of this specification is not implied. Exposure
to absolute maximum rating conditions for extended period may affect reliability.
2. Specifications contained within the following tables are subject to change.
3. During voltage transitions, all pins may overshoot Vss to -2.0V and Vcc to +2.0V for periods up to 20ns, see the
figures below.
Figure 29. Maximum Positive Overshoot Waveform
Figure 28. Maximum Negative Overshoot Waveform
20ns
20ns
20ns
Vcc + 2.0V
Vcc
Vss
Vss-2.0V
20ns
20ns
20ns
11-2. Capacitance
TA = 25°C, f = 1.0 MHz
SYMBOL PARAMETER
MIN.
TYP.
MAX.
UNIT
pF
CONDITIONS
VIN = 0V
CIN
Input Capacitance
6
8
COUT Output Capacitance
pF
VOUT = 0V
P/N: PM1850
REV. 1.2, NOV. 11, 2013
51
MX25L1675E
Figure 30. Input Test Waveforms and Measurement Level
Input timing reference level
Output timing reference level
0.8VCC
0.7VCC
AC
Measurement
Level
0.5VCC
0.3VCC
0.2VCC
Note: Input pulse rise and fall time are <5ns
Figure 31. Output Loading
DEVICE UNDER
TEST
2.7K ohm
+3.3V
CL
6.2K ohm
DIODES=IN3064
OR EQUIVALENT
CL=30/15pF Including jig capacitance
P/N: PM1850
REV. 1.2, NOV. 11, 2013
52
MX25L1675E
Table 12. DC Characteristics
Temperature = -40°C to 85°C for Industrial grade
SYMBOL PARAMETER
NOTES
MIN.
TYP.
MAX. UNITS TEST CONDITIONS
VCC = VCC Max,
VIN = VCC or GND
ILI
Input Load Current
1
± 2
± 2
25
uA
uA
uA
uA
VCC = VCC Max,
VIN = VCC or GND
ILO
Output Leakage Current
1
1
VIN = VCC or GND,
CS# = VCC
ISB1 VCC Standby Current
15
2
Deep Power-down
Current
VIN = VCC or GND,
CS# = VCC
ISB2
20
f=104MHz,
fQ=85MHz (4 x I/O read)
SCLK=0.1VCC/0.9VCC,
SO=Open
25
mA
fT=85MHz (2 x I/O read)
mA SCLK=0.1VCC/0.9VCC,
ICC1 VCC Read
1
1
20
10
SO=Open
f=33MHz,
mA SCLK=0.1VCC/0.9VCC,
SO=Open
VCC Program Current
Program in Progress,
CS# = VCC
ICC2
(PP)
15
3
20
20
20
20
mA
VCC Write Status
ICC3
Program status register in
mA
Register (WRSR) Current
progress, CS#=VCC
VCC Sector Erase
Current (SE)
ICC4
1
1
9
mA Erase in Progress, CS#=VCC
mA Erase in Progress, CS#=VCC
VCC Chip Erase Current
ICC5
(CE)
15
VIL
VIH
VOL
Input Low Voltage
Input High Voltage
Output Low Voltage
-0.5
0.3VCC
VCC+0.4
0.4
V
V
0.7VCC
V
V
IOL = 1.6mA
IOH = -100uA
VOH Output High Voltage
VCC-0.2
Notes :
1. Typical values at VCC = 3.3V, T = 25 C. These currents are valid for all product versions (package and speeds).
°
2. Typical value is calculated by simulation.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
53
MX25L1675E
Table 13. AC Characteristics
Temperature = -40°C to 85°C for Industrial grade
Symbol Alt. Parameter
Min.
Typ.
Max.
Unit
Clock Frequency for the following instructions:
fSCLK
fC FAST_READ, RDSFDP, SE, BE, CE, DP, RES, RDP,
WREN, WRDI, RDID, RDSR, WRSR
D.C.
104
MHz
fP Clock Frequency for PP instructions
f4P Clock Frequency for 4PP instructions
fR Clock Frequency for READ instructions
fT Clock Frequency for 2READ/DREAD instructions
fQ Clock Frequency for 4READ/QREAD instructions
fC=104MHz
D.C.
D.C.
86
85
33
85
85
MHz
MHz
MHz
MHz
MHz
ns
ns
ns
ns
V/ns
V/ns
ns
ns
ns
fPSCLK
fRSCLK
fTSCLK
4.7
13
4.7
13
0.1
0.1
5
tCH(1) tCLH Clock High Time
fR=33MHz
fC=104MHz
fR=33MHz
tCL(1)
tCLL Clock Low Time
Clock Rise Time (3) (peak to peak)
Clock Fall Time (3) (peak to peak)
tCLCH(2)
tCHCL(2)
tSLCH tCSS CS# Active Setup Time (relative to SCLK)
tCHSL CS# Not Active Hold Time (relative to SCLK)
tDVCH tDSU Data In Setup Time
5
2
tCHDX
tCHSH
tSHCH
tDH Data In Hold Time
5
5
5
15
50
ns
ns
ns
ns
ns
ns
ns
CS# Active Hold Time (relative to SCLK)
CS# Not Active Setup Time (relative to SCLK)
Read
tSHSL(3) tCSH CS# Deselect Time
Write/Erase/Program
2.7V-3.6V
3.0V-3.6V
10
8
tSHQZ(2) tDIS Output Disable Time
2.7V-3.6V
9/8
8/6
ns
Clock Low to Output Valid
tCLQV
tV
Loading: 30pF/15pF
tHO Output Hold Time
Write Protect Setup Time
3.0V-3.6V
ns
ns
ns
ns
tCLQX
tWHSL
tSHWL
tDP(2)
0
20
100
Write Protect Hold Time
CS# High to Deep Power-down Mode
10
us
CS# High to Standby Mode without Electronic Signature
Read
tRES1(2)
8.8
us
tRES2(2)
tW
CS# High to Standby Mode with Electronic Signature Read
Write Status Register Cycle Time
Byte-Program
Page Program Cycle Time
Sector Erase Cycle Time
8.8
100
50
3
200
2
us
ms
us
ms
ms
s
40
9
0.6
40
0.4
5
tBP
tPP
tSE
tBE
Block Erase Cycle Time
Chip Erase Cycle Time
tCE
20
s
Notes:
1. tCH + tCL must be greater than or equal to 1/ f (fC or fR).
2. Value guaranteed by characterization, not 100% tested in production.
3. tSHSL=15ns from read instruction, tSHSL=50ns from Write/Erase/Program instruction.
4. Only applicable as a constraint for a WRSR instruction when SRWD is set at 1.
5. Test condition is shown as "Figure 30. Input Test Waveforms and Measurement Level" and "Figure 31. Output
Loading".
P/N: PM1850
REV. 1.2, NOV. 11, 2013
54
MX25L1675E
12. TIMING ANALYSIS
Figure 32. Serial Input Timing
tSHSL
tSHCH
tCHCL
CS#
tCHSL
tSLCH
tCHSH
SCLK
tDVCH
tCHDX
tCLCH
MSB
LSB
SI
High-Z
SO
Figure 33. Output Timing
CS#
tCH
SCLK
tCLQV
tCLQV
tCL
tSHQZ
tCLQX
SO
tCLQX
LSB
ADDR.LSB IN
SI
P/N: PM1850
REV. 1.2, NOV. 11, 2013
55
MX25L1675E
Figure 34. Power-Up Timing
V
CC
V
(max)
CC
Chip Selection is Not Allowed
V
(min)
CC
Device is fully accessible
tVSL
time
Note: VCC (max.) is 3.6V and VCC (min.) is 2.7V.
Table 14. Power-Up Timing
Symbol Parameter
Min.
Max.
Unit
tVSL(1)
VCC(min) to CS# low
200
us
Note: The parameter is characterized only.
12-1. Initial Delivery State
The device is delivered with the memory array erased: all bits are set to 1 (each byte contains FFh). The Status
Register contains 00h (all Status Register bits are 0).
P/N: PM1850
REV. 1.2, NOV. 11, 2013
56
MX25L1675E
13. OPERATING CONDITIONS
At Device Power-Up and Power-Down
AC timing illustrated in "Figure 35. AC Timing at Device Power-Up" and "Figure 36. Power-Down Sequence" are
for the supply voltages and the control signals at device power-up and power-down. If the timing in the figures is
ignored, the device will not operate correctly.
During power-up and power-down, CS# needs to follow the voltage applied on VCC to keep the device not to be
selected. The CS# can be driven low when VCC reach Vcc(min.) and wait a period of tVSL.
Figure 35. AC Timing at Device Power-Up
VCC(min)
VCC
GND
tVR
tSHSL
CS#
tSHCH
tSLCH
tCHSL
tCHSH
SCLK
tDVCH
tCHCL
tCHDX
tCLCH
MSB IN
LSB IN
SI
High Impedance
SO
Symbol
tVR
Parameter
VCC Rise Time
Notes
Min.
5
Max.
500000
Unit
us/V
1
Notes :
1. Sampled, not 100% tested.
2. For AC spec tCHSL, tSLCH, tDVCH, tCHDX, tSHSL, tCHSH, tSHCH, tCHCL, tCLCH in the figure, please refer
to "Table 13. AC Characteristics".
P/N: PM1850
REV. 1.2, NOV. 11, 2013
57
MX25L1675E
Figure 36. Power-Down Sequence
During power-down, CS# needs to follow the voltage drop on VCC to avoid mis-operation.
VCC
CS#
SCLK
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
14. ERASE AND PROGRAMMING PERFORMANCE
PARAMETER
Min.
TYP. (1)
Max. (2)
UNIT
ms
ms
s
Write Status Register Cycle Time
Sector Erase Cycle Time
Block Erase Cycle Time
40
40
100
200
2
0.4
Chip Erase Cycle Time
5
20
50
3
s
Byte Program Time (via page program command)
Page Program Cycle Time
Erase/Program Cycle
9
us
0.6
ms
cycles
100,000
Notes:
1. Typical program and erase time assumes the following conditions: 25 C, 3.3V, and checker board pattern.
°
2. Under worst conditions of 85 C and 2.7V.
°
3. System-level overhead is the time required to execute the first-bus-cycle sequence for the programming com-
mand.
15. DATA RETENTION
PARAMETER
Condition
Min.
Max.
UNIT
Data retention
55˚C
20
years
16. LATCH-UP CHARACTERISTICS
MIN.
MAX.
Input Voltage with respect to GND on all power pins, SI, CS#
Input Voltage with respect to GND on SO
Current
-1.0V
-1.0V
-100mA
2 VCCmax
VCC + 1.0V
+100mA
Includes all pins except VCC. Test conditions: VCC = 3.0V, one pin at a time.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
17. ORDERING INFORMATION
PART NO.
CLOCK (MHz)
TEMPERATURE
PACKAGE
Remark
8-SOP
(200mil)
8-WSON
(6x5mm)
MX25L1675EM2I-10G
104
-40°C~85°C
MX25L1675EZNI-10G
104
-40°C~85°C
*
* Advanced Information.
P/N: PM1850
REV. 1.2, NOV. 11, 2013
60
MX25L1675E
18. PART NAME DESCRIPTION
M2
MX 25 L 1675E
I
10 G
OPTION:
G: RoHS Compliant & Halogen-free
SPEED:
10: 104MHz
TEMPERATURE RANGE:
I: Industrial (-40° C to 85° C)
PACKAGE:
M2: 200mil 8-SOP
ZN: 6x5mm 8-WSON
DENSITY & MODE:
1675E: 16Mb standard type
TYPE:
L: 3V
DEVICE:
25: Serial Flash
P/N: PM1850
REV. 1.2, NOV. 11, 2013
61
MX25L1675E
P/N: PM1850
REV. 1.2, NOV. 11, 2013
62
MX25L1675E
P/N: PM1850
REV. 1.2, NOV. 11, 2013
63
MX25L1675E
19. REVISION HISTORY
Revision No. Description
Page
Date
0.00
1.0
1.1
1. Initial released
1. Added 8-WSON packages as Advanced Information
1. Added QREAD/DREAD function
All
JUN/06/2012
JUL/05/2012
P5,7,57~58,60
P12,13,25,27,54 OCT/18/2012
2. Updated 1-1-2, 1-1-4 parameter values in SFDP Table
1. Updated parameters for DC Characteristics.
2. Updated Erase and Programming Performance.
P46,47
P4,53
P4,54,59
1.2
NOV/11/2013
P/N: PM1850
REV. 1.2, NOV. 11, 2013
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MX25L1675E
Except for customized products which have been expressly identified in the applicable agreement, Macronix's products are
designed, developed, and/or manufactured for ordinary business, industrial, personal, and/or household applications only, and
not for use in any applications which may, directly or indirectly, cause death, personal injury, or severe property damages. In
the event Macronix products are used in contradicted to their target usage above, the buyer shall take any and all actions to
ensure said Macronix's product qualified for its actual use in accordance with the applicable laws and regulations; and Macro-
nix as well as it’s suppliers and/or distributors shall be released from any and all liability arisen therefrom.
Copyright© Macronix International Co., Ltd. 2012~2013. All rights reserved, including the trademarks and tradename thereof,
such as Macronix, MXIC, MXIC Logo, MX Logo, Integrated Solutions Provider, NBit, Nbit, NBiit, Macronix NBit, eLiteFlash, Hy-
bridNVM, HybridFlash, XtraROM, Phines, KH Logo, BE-SONOS, KSMC, Kingtech, MXSMIO, Macronix vEE, Macronix MAP,
Rich Audio, Rich Book, Rich TV, and FitCAM. The names and brands of third party referred thereto (if any) are for identification
purposes only.
For the contact and order information, please visit Macronix’s Web site at: http://www.macronix.com
MACRONIX INTERNATIONAL CO., LTD. reserves the right to change product and specifications without notice.
65
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SMBus Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9135LG-T1-E3
SMBus Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9135_11
SMBus Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9136_11
Multi-Output Power-Supply ControllerWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9130CG-T1-E3
Pin-Programmable Dual Controller - Portable PCsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9130LG-T1-E3
Pin-Programmable Dual Controller - Portable PCsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9130_11
Pin-Programmable Dual Controller - Portable PCsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9137
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9137DB
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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SI9137LG
Multi-Output, Sequence Selectable Power-Supply Controller for Mobile ApplicationsWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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VISHAY
SI9122E
500-kHz Half-Bridge DC/DC Controller with Integrated Secondary Synchronous Rectification DriversWarning: Undefined variable $rtag in /www/wwwroot/website_ic37/www.icpdf.com/pdf/pdf/index.php on line 217
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