N02M0818L2AD [NANOAMP]

2Mb Ultra-Low Power Asynchronous Medical CMOS SRAM 256Kx8 bit; 2MB超低功耗异步医疗CMOS SRAM 256Kx8位
N02M0818L2AD
型号: N02M0818L2AD
厂家: NANOAMP SOLUTIONS, INC.    NANOAMP SOLUTIONS, INC.
描述:

2Mb Ultra-Low Power Asynchronous Medical CMOS SRAM 256Kx8 bit
2MB超低功耗异步医疗CMOS SRAM 256Kx8位

医疗 静态存储器
文件: 总8页 (文件大小:216K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
NanoAmp Solutions, Inc.  
670 North McCarthy Blvd. Suite 220, Milpitas, CA 95035  
ph: 408-935-7777, FAX: 408-935-7770  
www.nanoamp.com  
N02M0818L2A  
2Mb Ultra-Low Power Asynchronous Medical CMOS SRAM  
256Kx8 bit  
Overview  
Features  
The N02M0818L2A is an integrated memory  
device intended for implanted life-support (Class 3)  
medical applications. This device comprises a 2  
Mbit Static Random Access Memory organized as  
262,144 words by 8 bits. The device is designed  
and fabricated using NanoAmp’s advanced CMOS  
technology with reliability inhancements for  
• Single Wide Power Supply Range  
1.3 to 2.3 Volts  
• Very low standby current  
200nA typical at 2.1V and 37 deg C  
• Very low operating current  
1 mA at 2.0V and 1µs (Typical)  
medical users. The base design is the same as  
NanoAmp’s N02M0818L1A, which is intended for  
non life-support (Class 1 and 2) medical  
• Very low Page Mode operating current  
0.5mA at 1.0V and 1µs (Typical)  
• Simple memory control  
applications. The device operates with two chip  
enable (CE1 and CE2) controls and output enable  
(OE) to allow for easy memory expansion. The  
N02M0818L2A is optimal for various applications  
where low-power is critical such as implanted  
pacemaker devices. The device can operate over a  
Dual Chip Enables (CE1 and CE2)  
Output Enable (OE) for memory expansion  
• Low voltage data retention  
Vcc = 1.0V  
• Automatic power down to standby mode  
• TTL compatible three-state output driver  
o
o
very wide temperature range of -20 C to +60 C  
and is available in die form as well as in JEDEC  
standard packages compatible with other standard  
256Kb x 8 SRAMs  
Product Family  
Standby  
Current  
Operating  
Current (Icc),  
Max  
Operating  
Power  
Part Number  
Package Type  
Speed  
Temperature Supply (Vcc)  
(ISB  
)
N02M0818L2AN  
32 - STSOP I  
100ns @ 1.65V 450nA @  
-20oC to +60oC  
1.3V - 2.3V  
2.5 mA @ 1MHz  
500ns @ 1.3V  
2.3V  
N02M0818L2AD Known Good Die  
Pin Configuration  
Pin Descriptions  
Pin Name  
A0-A17  
WE  
CE1, CE2  
OE  
I/O0-I/O7  
VCC  
VSS  
Pin Function  
Address Inputs  
Write Enable Input  
Chip Enable Input  
Output Enable Input  
Data Inputs/Outputs  
A11  
A9  
1
32  
31  
30  
29  
28  
27  
26  
25  
24  
23  
22  
21  
20  
19  
18  
17  
OE  
2
A10  
CE1  
I/O7  
I/O6  
I/O5  
I/O4  
I/O3  
Vss  
I/O2  
I/O1  
I/O0  
A0  
A8  
3
A13  
WE  
CE2  
A15  
Vcc  
A17  
A16  
A14  
A12  
A7  
4
5
6
7
N02M0818L2A  
STSOP  
8
9
Power  
Ground  
10  
11  
12  
13  
14  
15  
16  
A6  
A1  
A5  
A2  
A4  
A3  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
1
NanoAmp Solutions, Inc.  
Functional Block Diagram  
N02M0818L2A  
V
CCQ(opt)  
Word  
Address  
Inputs  
Address  
A - A  
Decode  
Logic  
0
3
Input/  
Output  
Mux  
Page  
Address  
Decode  
Logic  
16K Page  
x 16 word  
x 8 bit  
Address  
Inputs  
A - A  
4
17  
and  
I/O - I/O  
0
7
Buffers  
RAM  
CE1  
CE2  
WE  
OE  
Control  
Logic  
Functional Description  
I/O0 - I/O7  
CE1  
CE2  
WE  
OE  
MODE  
POWER  
Standby1  
Standby1  
Write2  
H
X
L
L
L
X
L
X
X
L
X
X
X2  
L
H
High Z  
High Z  
Standby  
Standby  
Active  
H
H
H
Data In  
Data Out  
High Z  
H
H
Active  
Active  
Read  
Active  
1. When the device is in standby mode, control inputs (WE and OE), address inputs and data input/outputs are internally isolated  
from any external influence and disabled from exerting any influence externally.  
2. When WE is invoked, the OE input is internally disabled and has no effect on the circuit.  
1
Capacitance  
Item  
Symbol  
CIN  
Test Condition  
Min  
Max  
8
Unit  
pF  
VIN = 0V, f = 1 MHz, TA = 25oC  
VIN = 0V, f = 1 MHz, TA = 25oC  
Input Capacitance  
I/O Capacitance  
CI/O  
8
pF  
1. These parameters are verified in device characterization and are not 100% tested  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
2
NanoAmp Solutions, Inc.  
N02M0818L2A  
1
Absolute Maximum Ratings  
Item  
Symbol  
VIN,OUT  
VCC  
Rating  
–0.3 to VCC+0.3  
–0.3 to 3.0  
500  
Unit  
V
Voltage on any pin relative to VSS  
Voltage on VCC Supply Relative to VSS  
Power Dissipation  
V
PD  
mW  
oC  
oC  
oC  
TSTG  
Storage Temperature  
–40 to 125  
TA  
Operating Temperature  
-20 to +60  
240oC, 10sec(Lead only)  
TSOLDER  
Soldering Temperature and Time  
1. Stresses greater than those listed above may cause permanent damage to the device. This is a stress rating only and functional  
operation of the device at these or any other conditions above those indicated in the operating section of this specification is not  
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability.  
1
Recommended Operating Limits (Not all inclusive values tested)  
Item  
Symbol  
VCC  
VDR  
VIH  
Test Conditions  
Min.  
1.3  
Max  
Unit  
V
Core Supply Voltage  
Data Retention Voltage  
Input High Voltage  
Input Low Voltage  
2.3  
Chip Disabled (Note 3)  
1.0  
V
0.7VCCQ VCCQ+0.5  
V
VIL  
0.3VCCQ  
–0.5  
V
VOH  
VOL  
ILI  
IOH = 0.2mA  
IOL = -0.2mA  
VCCQ–0.3  
Output High Voltage  
Output Low Voltage  
Input Leakage Current  
Output Leakage Current  
V
0.3  
0.1  
0.1  
V
VIN = 0 to VCC  
µA  
µA  
ILO  
OE = VIH or Chip Disabled  
VCC=2.3 V, VIN=VIH or VIL  
Chip Enabled, IOUT = 0  
Read/Write Operating Supply Current  
ICC1  
ICC2  
2.5  
mA  
mA  
@ 1 µs Cycle Time2  
VCC=2.3 V, VIN=VIH or VIL  
Chip Enabled, IOUT = 0  
Read/Write Operating Supply Current  
@ 85 ns Cycle Time2  
13.0  
VIN = VCC or 0V  
Chip Disabled  
Standby Current3  
ISB1  
450  
nA  
tA= 37oC, VCC = 2.3 V  
VCC = 1.0V, VIN = VCC or 0  
Chip Disabled, tA= 85oC  
Data Retention Current3  
IDR  
1.0  
µA  
1. These limits are the expected operating conditions for this device. Only selected points within this range of conditions  
are specifically tested and guaranteed.  
2. This parameter is specified with the outputs disabled to avoid external loading effects. The user must add current  
required to drive output capacitance expected in the actual system.  
3. The chip is Disabled when CE1# is high or CE2 is low or UB# and LB# are high. The chip is Enabled when CE1# is  
low and CE2 is high.  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
3
NanoAmp Solutions, Inc.  
N02M0818L2A  
Recommended Timing Limits - Read Cycle (Not all inclusive values tested)  
1.3 - 2.3 V  
1.65 - 2.3 V  
Item  
Symbol  
Units  
Min.  
Max.  
Min.  
Max.  
tRC  
tAA  
Read Cycle Time  
500  
100  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Address Access Time  
500  
500  
200  
100  
100  
50  
tCO  
tOE  
tLZ  
Chip Enable to Valid Output  
Output Enable to Valid Output  
Chip Enable to Low-Z output  
Output Enable to Low-Z Output  
Chip Disable to High-Z Output  
Output Disable to High-Z Output  
Output Hold from Address Change  
100  
50  
0
20  
10  
0
tOLZ  
tHZ  
tOHZ  
tOH  
150  
150  
30  
30  
0
0
50  
10  
Recommended Timing Limits - Write Cycle (Not all inclusive values tested)  
1.3 - 2.3 V  
1.65 - 2.3 V  
Item  
Symbol  
Units  
Min.  
Max.  
Min.  
Max.  
tWC  
tCW  
tAW  
tWP  
tAS  
Write Cycle Time  
Chip Enable to End of Write  
Address Valid to End of Write  
Address Setup Time  
500  
400  
400  
300  
0
85  
50  
50  
40  
0
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
Write Pulse Width  
tWR  
tWHZ  
tDW  
tDH  
Write Recovery Time  
0
0
Write to High-Z Output  
50  
15  
Data to Write Time Overlap  
Data Hold from Write Time  
End Write to Low-Z Output  
Output Hold from Address Change  
300  
0
40  
0
tOW  
tOH  
50  
0
10  
0
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
4
NanoAmp Solutions, Inc.  
Timing of Read Cycle (CE1 = OE = V , WE = CE2 = V )  
N02M0818L2A  
IL  
IH  
t
RC  
Address  
t
AA  
t
OH  
Previous Data Valid  
Data Valid  
Data Out  
Timing Waveform of Read Cycle (WE=V )  
IH  
t
RC  
Address  
t
AA  
t
HZ  
CE1  
CE2  
t
CO  
t
LZ  
t
OHZ  
t
OE  
OE  
t
OLZ  
High-Z  
Data Valid  
Data Out  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
5
NanoAmp Solutions, Inc.  
N02M0818L2A  
Timing Waveform of Write Cycle (WE control)  
t
WC  
Address  
CE1  
t
WR  
t
AW  
t
CW  
CE2  
WE  
t
t
AS  
WP  
t
t
DH  
DW  
High-Z  
Data Valid  
Data In  
t
WHZ  
t
OW  
High-Z  
Data Out  
Timing Waveform of Write Cycle (CE1 Control)  
t
WC  
Address  
t
t
WR  
AW  
CE1  
t
CW  
t
(for CE2 Control, use  
inverted signal)  
AS  
t
t
WP  
WE  
t
t
DH  
DW  
Data Valid  
Data In  
t
LZ  
WHZ  
High-Z  
Data Out  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
6
NanoAmp Solutions, Inc.  
N02M0818L2A  
32-Lead STSOP-I Package (N32)  
11.80±0.10  
0.50mm REF  
8.0±0.10  
0.27  
0.17  
13.40±0.20  
SEE DETAIL B  
DETAIL B  
1.10±0.15  
o
o
0 -8  
0.20  
0.00  
0.80mm REF  
Note:  
1. All dimensions in millimeters  
2. Package dimensions exclude molding flash  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
7
NanoAmp Solutions, Inc.  
Ordering Information  
N02M0818L2A  
N02M0818L2AX-XX X  
20°C to 60°C  
Temperature  
100 = 100ns @ 1.65V  
Performance  
N = 32-pin STSOP I  
D = Known Good Die  
Package Type  
Revision History  
Revision #  
Date  
Change Description  
A
B
C
Dec 2002  
January 2004  
July 2004  
Initial Release  
Updated with power characteristics  
General Update  
© 2001 - 2002 Nanoamp Solutions, Inc. All rights reserved.  
NanoAmp Solutions, Inc. ("NanoAmp") reserves the right to change or modify the information contained in this data sheet and the products described therein, without prior notice.  
NanoAmp does not convey any license under its patent rights nor the rights of others. Charts, drawings and schedules contained in this data sheet are provided for illustration pur-  
poses only and they vary depending upon specific applications.  
NanoAmp makes no warranty or guarantee regarding suitability of these products for any particular purpose, nor does NanoAmp assume any liability arising out of the application  
or use of any product or circuit described herein. NanoAmp does not authorize use of its products as critical components in any application in which the failure of the NanoAmp  
product may be expected to result in significant injury or death, including life support systems and critical medical instruments.  
(DOC#14-02-036 Rev C ECN#01-0887)  
The specifications of this device are subject to change without notice. For latest documentation see http://www.nanoamp.com.  
8

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