NNCD5.6LH [NEC]

LOW CAPACITANCE TYPE ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES QUARTO TYPE: COMMON ANODE 5-PIN SUPER SMALL MINI MOLD; 低电容式静电放电噪声,限幅二极管QUARTO类型:共阳极5 -PIN超小型迷你模具
NNCD5.6LH
型号: NNCD5.6LH
厂家: NEC    NEC
描述:

LOW CAPACITANCE TYPE ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES QUARTO TYPE: COMMON ANODE 5-PIN SUPER SMALL MINI MOLD
低电容式静电放电噪声,限幅二极管QUARTO类型:共阳极5 -PIN超小型迷你模具

瞬态抑制器 二极管 光电二极管 局域网
文件: 总8页 (文件大小:49K)
中文:  中文翻译
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DATA SHEET  
ESD NOISE CLIPPING DIODES  
NNCD5.6LHtoNNCD6.8LH  
LOW CAPACITANCE TYPE ELECTROSTATIC DISCHARGE NOISE CLIPPING DIODES  
(QUARTO TYPE: COMMON ANODE)  
5-PIN SUPER SMALL MINI MOLD  
PACKAGE DIMENSIONS  
Thisproductseriesisalowcapacitancetypediodedeveloped  
for ESD (Electrostatic Discharge) absorption. Based on the  
IEC1000-4-2 test on electromagnetic interference (EMI), the  
diodeassuresanenduranceofnolessthan8kV,andcapacitance  
is small with 10 pF between the terminal. This product series is  
the most suitable for the ESD absorption in the high-speed data  
communication bus such as USB.  
(in millimeters)  
2.1 ± 0.1  
1.25  
1
2
3
5
4
With four elements mounted in the 5-pin super mini mold  
package,thatproductcancopewithmorehighdensityassembling.  
FEATURES  
Based on the electrostatic discharge immunity test (IEC1000-  
4-2), the product assures the minimum endurance of 8 kV.  
Capacitance is small with 10 pF (at VR = 0 V, f = 1 MHz)  
between the terminal. It is excellent in the frequency  
characteristic.  
With 4 elements mounted (common anode) in the 5-pin super  
mini mold package, that product can cope with more high  
density assembling.  
(5-pin super mini mold)  
PIN CONNECTION  
APPLICATIONS  
External interface circuit ESD absorption in the high-speed  
data communication bus such as USB.  
5
4
1: K1 Cathode 1  
2: Anode (Common)  
A
3: K2 Cathode 2  
4: K3 Cathode3  
5: K4 Cathode4  
1
2
3
MAXIMUM RATINGS (TA = 25°C)  
Power Dissipation  
P
200 mW  
(Total)  
Fig.5  
Surge Reverse Power  
Junction Temperature  
Storage Temperature  
PRSM  
Tj  
2W (t = 10 µs, 1 pulse)  
150°C  
Tstg  
–55°C to +150°C  
Document No. D12786EJ1V0DS00 (1st edition)  
Date Published October 1998 N CP(K)  
Printed in Japan  
1998  
©
NNCD5.6LH to NNCD6.8LH  
ELECTRICAL CHARACTERISTICS (TA = 25 °C) (A-K1, A-K2, A-K3, A-K4)  
Note 2  
Dynamic  
Reverse  
Leakage  
IR (µA)  
Note 1  
Note 3  
Breakdown Voltage  
VBR (V)  
Capacitance  
Ct (pF)  
ESD Voltage  
(kV)  
Impedance  
Type No  
Zz ()  
MIN.  
5.3  
MAX. IT (mA) MAX. IT (mA) MAX.  
VR (V)  
2.5  
TYP. Test Condition MIN. Test Condition  
NNCD5.6LH  
NNCD6.2LH  
NNCD6.8LH  
6.3  
6.7  
7.1  
5
5
5
80  
50  
30  
5
5
5
5
2
2
10  
8
VR = 0 V  
8
8
8
C = 150 pF  
R = 330 Ω  
Contact  
f = 1 MHz  
5.7  
3.0  
6.2  
3.5  
7
discharge  
Notes 1. Tested with pulse (40 ms)  
2. Zz is measured at IT given a small A.C. signal.  
3. ESD voltage is measured based on the IEC1000-4-2 test on electromagnetic interference (EMI).  
2
NNCD5.6LH to NNCD6.8LH  
TYPICAL CHARACTERISTICS (TA = 25°C)  
Figure 1. P - TA RATING  
Figure 2. It - VBR CHARACTERISTICS  
(A - K1, A - K2, A - K3, A - K4)  
250  
200  
150  
100  
50  
NNCD5.6LH NNCD6.2LH NNCD6.8LH  
10 m  
1 m  
100  
10  
0
0
25  
T
50  
75  
100  
125  
150  
A
- Ambient Temperature - °C  
1
100 n  
10 n  
4
5
6
7
8
VBR - Breakdown Voltage - V  
Figure 3. Ct - VR CHARACTERISTICS  
10.0  
8.0  
6.0  
4.0  
f = 1 MHz  
NNCD5.6LH  
NNCD6.2LH  
NNCD6.8LH  
0.1  
1.0  
10  
VR - Reverse Voltage - V  
3
NNCD5.6LH to NNCD6.8LH  
Figure 4. TRANSIENT THERMAL IMPEDANCE  
1000  
100  
10  
625°C/W  
NNCD [ ] LH  
1
0.1  
1 m  
10 m  
100 m  
1
10  
100  
t - Time - s  
Figure 5. SURGE REVERSE POWER RATING  
1000  
100  
10  
T
A
= 25°C  
Nom - Repetive  
tT  
NNCD [ ] LH  
1
0.1  
1µ  
10 µ  
100 µ  
1 m  
- Pulse Width - s  
10 m  
100 m  
t
T
4
NNCD5.6LH to NNCD6.8LH  
REFERENCE  
Document  
Document No.  
C11745E  
NEC semiconductor device reliability/quality control system  
NEC semiconductor device reliability/quality control system  
Quality grade on NEC semiconductor device  
MEI - 1201  
C11531E  
Semiconductor device mounting technology manual  
C10535E  
5
NNCD5.6LH to NNCD6.8LH  
[MEMO]  
6
NNCD5.6LH to NNCD6.8LH  
[MEMO]  
7
NNCD5.6LH to NNCD6.8LH  
No part of this document may be copied or reproduced in any form or by any means without the prior written  
consent of NEC Corporation. NEC Corporation assumes no responsibility for any errors which may appear in  
this document.  
NEC Corporation does not assume any liability for infringement of patents, copyrights or other intellectual property  
rights of third parties by or arising from use of a device described herein or any other liability arising from use  
of such device. No license, either express, implied or otherwise, is granted under any patents, copyrights or other  
intellectual property rights of NEC Corporation or others.  
While NEC Corporation has been making continuous effort to enhance the reliability of its semiconductor devices,  
the possibility of defects cannot be eliminated entirely. To minimize risks of damage or injury to persons or  
property arising from a defect in an NEC semiconductor device, customers must incorporate sufficient safety  
measures in its design, such as redundancy, fire-containment, and anti-failure features.  
NEC devices are classified into the following three quality grades:  
"Standard", "Special", and "Specific". The Specific quality grade applies only to devices developed based on a  
customer designated "quality assurance program" for a specific application. The recommended applications of  
a device depend on its quality grade, as indicated below. Customers must check the quality grade of each device  
before using it in a particular application.  
Standard: Computers, office equipment, communications equipment, test and measurement equipment,  
audio and visual equipment, home electronic appliances, machine tools, personal electronic  
equipment and industrial robots  
Special: Transportation equipment (automobiles, trains, ships, etc.), traffic control systems, anti-disaster  
systems, anti-crime systems, safety equipment and medical equipment (not specifically designed  
for life support)  
Specific: Aircrafts, aerospace equipment, submersible repeaters, nuclear reactor control systems, life  
support systems or medical equipment for life support, etc.  
The quality grade of NEC devices is "Standard" unless otherwise specified in NEC's Data Sheets or Data Books.  
If customers intend to use NEC devices for applications other than those specified for Standard quality grade,  
they should contact an NEC sales representative in advance.  
Anti-radioactive design is not implemented in this product.  
M4 96.5  

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