10T10AICW [NELLSEMI]

TRIACs, 10A Snubberless and Standard; 三端双向可控硅, 10A无缓冲器和标准
10T10AICW
型号: 10T10AICW
厂家: NELL SEMICONDUCTOR CO., LTD    NELL SEMICONDUCTOR CO., LTD
描述:

TRIACs, 10A Snubberless and Standard
三端双向可控硅, 10A无缓冲器和标准

可控硅 三端双向交流开关
文件: 总6页 (文件大小:287K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
RoHS  
RoHS  
10T Series  
SEMICONDUCTOR  
TRIACs, 10A  
Snubberless and Standard  
MAIN FEATURES  
SYMBOL  
VALUE  
UNIT  
A2  
IT(RMS)  
10  
A
VDRM/VRRM  
IGT(Q1)  
V
600 to 1000  
25 to 50  
mA  
A1  
A2  
1
2
3
G
DESCRIPTION  
TO-220AB (non-Insulated)  
TO-220AB (lnsulated)  
The 10T triac series is suitable for general purpose AC  
switching. They can be used as an ON/OFF function in  
applications such as static relays, heating regulation,  
induction motor starting circuits... or for phase control  
operation in light dimmers, motor speed controllers,...  
(10TxxA)  
(10TxxAI)  
The snubberless version are specially recommended  
for use on inductive loads, thanks to their high  
commutation performances.  
By using an internal ceramic pad, the 10T series provides  
voltage insulated tab (rated at 2500VRMS) complying  
with UL standards (File ref. :E320098)  
ABSOLUTE MAXIMUM RATINGS  
PARAMETER  
SYMBOL  
TEST CONDITIONS  
VALUE  
UNIT  
Tc = 105ºC  
TO-220AB  
RMS on-state current (full sine wave)  
IT(RMS)  
A
10  
Tc = 95ºC  
t = 20 ms  
t = 16.7 ms  
TO-220AB insulated  
F =50 Hz  
100  
105  
50  
Non repetitive surge peak on-state  
ITSM  
A
current (full cycle, T initial = 25°C)  
j
F =60 Hz  
I2t  
I2t Value for fusing  
A2s  
t
= 10 ms  
p
Critical rate of rise of on-state current  
IG = 2xlGT, tr≤100ns  
Tj =125ºC  
Tj =125ºC  
A/µs  
F =100 Hz  
50  
dI/dt  
Tp =20 µs  
Tj =125ºC  
Peak gate current  
IGM  
4
1
A
PG(AV)  
Average gate power dissipation  
Storage temperature range  
Operating junction temperature range  
W
Tstg  
Tj  
- 40 to + 150  
- 40 to + 125  
ºC  
www.nellsemi.com  
Page 1 of 6  
RoHS  
RoHS  
10T Series  
SEMICONDUCTOR  
(TJ= 25 ºC unless otherwise specified)  
ELECTRICAL CHARACTERISTICS  
SNUBBERLESS (3 quadrants)  
10Txxxx  
SYMBOL  
TEST CONDITIONS  
Unit  
QUADRANT  
BW  
CW  
(1)  
I - II - III  
I - II - III  
IGT  
MAX.  
MAX.  
35  
mA  
V
50  
VD = 12 V, RL = 30Ω  
VGT  
1.3  
0.2  
VD = VDRM, RL = 3.3KΩ  
Tj = 125°C  
I - II - III  
VGD  
MIN.  
MAX.  
MAX.  
V
(2)  
35  
IT = 500 mA  
IH  
mA  
50  
I - III  
50  
60  
70  
80  
IG = 1.2 IGT  
IL  
mA  
II  
dV/dt(2)  
MIN.  
MIN.  
500  
5.5  
VD = 67% VDRM, gate open, Tj = 125°C  
Without snubber, Tj = 125°C  
V/µs  
1000  
9
(dI/dt)c(2)  
A/ms  
ELECTRICAL CHARACTERISTICS (TJ= 25 ºC unless otherwise specified)  
Standard (4 quadrants)  
10Txxxx  
TEST CONDITIONS  
SYMBOL  
UNIT  
QUADRANT  
C
B
25  
50  
50  
I - II - III  
(1)  
IGT  
MAX.  
mA  
VD = 12 V, RL = 30Ω  
IV  
100  
VGT  
VGD  
1.3  
0.2  
V
V
ALL  
ALL  
VD = VDRM, RL = 3.3KΩ, Tj = 125°C  
IT = 500 mA  
(2)  
mA  
IH  
MAX.  
MAX.  
25  
50  
I - III - IV  
40  
50  
IL  
IG = 1.2 IGT  
mA  
80  
100  
II  
dV/dt(2)  
VD = 67% VDRM, gate open, Tj = 125°C  
V/µs  
V/µs  
MIN.  
MIN.  
200  
5
400  
10  
(dV/dt)c(2)  
(dI/dt)c = 4.4 A/ms,  
Tj = 125°C  
STATIC CHARACTERISTICS  
SYMBOL  
TEST CONDITIONS  
UNIT  
V
VALUE  
1.55  
0.85  
40  
(2)  
ITM = 14 A, tP = 380 µs  
Threshold voltage  
Tj = 25°C  
VTM  
MAX.  
MAX.  
MAX.  
(2)  
Tj = 125°C  
Vt0  
V
(2)  
Dynamic resistance  
Rd  
Tj = 125°C  
Tj = 25°C  
mΩ  
µA  
5
IDRM  
IRRM  
VDRM = VRRM  
MAX.  
Tj = 125°C  
1
mA  
Note 1: Minimum lGT is guaranted at 5% of lGT max.  
Note 2: For both polarities of A2 referenced to A1.  
www.nellsemi.com  
Page 2 of 6  
RoHS  
RoHS  
10T Series  
SEMICONDUCTOR  
THERMAL RESISTANCE  
UNIT  
SYMBOL  
VALUE  
TO-220AB  
TO-220AB Insulated  
TO-220AB  
TO-220AB Insulated  
1.5  
2.4  
Rth(j-c)  
Rth(j-a)  
Junction to case (AC)  
°C/W  
Junction to ambient  
60  
°C/W  
PRODUCT SELECTOR  
VOLTAGE (xx)  
PART NUMBER  
SENSITIVITY  
TYPE  
PACKAGE  
TO-220AB  
1000 V  
600 V  
800 V  
V
V
V
V
V
V
V
V
V
V
V
V
50 mA  
50 mA  
25 mA  
35 mA  
Standard  
Snubberless  
Standard  
10TxxA-B/10TxxAl-B  
10TxxA-BW/10TxxAl-BW  
10TxxA-C/10TxxAl-C  
TO-220AB  
TO-220AB  
TO-220AB  
Snubberless  
10TxxA-CW/10TxxAl-CW  
ORDERING INFORMATION  
,
WEIGHT  
2.0g  
PACKAGE  
DELIVERY MODE  
ORDERING TYPE  
MARKING  
10TxxA-yy  
10TxxAI-yy  
BASE Q TY  
10TxxA-yy  
TO-220AB  
50  
50  
Tube  
Tube  
10TxxAI-yy  
TO-220AB (insulated)  
2.3g  
Note: xx = voltage, yy = sensitivity  
ORDERING INFORMATION SCHEME  
-
BW  
10 T 06  
A
Current  
10 = 10A  
Triac series  
Voltage  
06 = 600V  
08 = 800V  
10 = 1000V  
Package type  
A = TO-220AB (non-insulated)  
AI = TO-220AB ( insulated)  
I
Sensitivity  
GT  
B = 50mA Standard  
C = 25mA Standard  
BW = 50mA Standard  
CW = 35mA Standard  
www.nellsemi.com  
Page 3 of 6  
RoHS  
RoHS  
10T Series  
SEMICONDUCTOR  
Fig.1 Maximum power dissipation versus RMS on-state  
current (full cycle)  
Fig.2 RMS on-state current versus case temperature  
(full cycle)  
I
(A)  
T(RMS)  
P(W)  
13  
12  
11  
10  
9
8
7
6
5
4
3
2
1
0
12  
11  
10  
9
8
7
6
5
4
3
2
1
TO-220AB  
TO-220AB  
insulated  
I
(A)  
T(RMS)  
T (°C)  
c
0
0
25  
50  
75  
100  
125  
4
5
6
8
9
0
1
2
3
7
10  
Fig.4 On-state characteristics (maximum values)  
Fig.3 Relative variation of thermal impedance  
versus pulse duration  
I
(A)  
TM  
K=[Z /R  
th th  
]
1E+0  
1E-1  
1E-2  
100  
10  
1
T
max  
=0.85V  
=40mΩ  
j
Z
th(j-c)  
V
to  
R
d
T =T max  
j
j
Z
th(j-a)  
T =25°C  
j
tp(s)  
V
(V)  
TM  
2.5  
0.5  
1.0  
1.5  
2.0  
3.0  
3.5  
4.0  
4.5  
5.0  
1E-3  
1E-2  
1E-1  
1E+0  
1E+1  
1E+2  
5E+2  
Fig.5 Surge peak on-state current versus number  
of cycles  
Fig.6 Non-repetitive surge peak on-state current  
for a sinusoidal pulse with width tp < 10ms.  
2
and corresponding value of l t  
(A), I2t (A2s)  
I
(A)  
TSM  
I
TSM  
110  
100  
90  
1000  
Tj initial=25°C  
t=20ms  
80  
70  
60  
Non repetitive  
initial=25°C  
I
One cycle  
TSM  
T
j
dl/dt limitation  
50A/µs  
100  
10  
50  
40  
30  
20  
10  
0
l²t  
Repetitive  
=95°C  
T
c
Number of cycles  
t (ms)  
p
0.01  
0.10  
1.00  
10.00  
1
10  
100  
1000  
www.nellsemi.com  
Page 4 of 6  
RoHS  
RoHS  
10T Series  
SEMICONDUCTOR  
Fig.8 Relative variation of critical rate of decrease  
of main current versus (dV/dt)c (typical values)  
Fig.7 Relative variation of gate trigger current,holding  
current and latching current versus junction  
temperature (typical values)  
I
,I ,I [T ] / I ,I ,I [T =25°C ]  
GT  
H
L
j
GT  
H
L
j
(dI/dt)c [(dV/dt)c] / Specified (dI/dt)c  
2.5  
2.0  
1.5  
1.0  
2.0  
1.8  
1.6  
C
B
l
GT  
1.4  
1.2  
1.0  
BW/CW  
I
&I  
H
L
0.8  
0.6  
0.4  
0.5  
0.0  
T (°C)  
(dV/dt)c (V/µs)  
j
0.1  
1.0  
10.0  
100.0  
-40  
-20  
0
20  
40  
60  
80  
100  
120  
140  
Fig.9 Relative variation of critical rate of decrease of  
main current versus junction temperature  
(dI/dt)c [T ] / (dI/dt)c [T specified]  
j
j
6
5
4
3
2
1
0
T (°C)  
j
0
25  
50  
75  
100  
125  
www.nellsemi.com  
Page 5 of 6  
RoHS  
RoHS  
10T Series  
SEMICONDUCTOR  
Case Style  
TO-220AB  
10.54 (0.415) MAX.  
4.70 (0.185)  
9.40 (0.370)  
9.14 (0.360)  
3.91 (0.154)  
3.74 (0.148)  
4.44 (0.1754)  
1.39 (0.055)  
1.14 (0.045)  
2.87 (0.113)  
2.62 (0.103)  
RoHS  
3.68 (0.145)  
3.43 (0.135)  
15.32 (0.603)  
14.55 (0.573)  
16.13 (0.635)  
15.87 (0.625)  
PIN  
8.89 (0.350)  
8.38 (0.330)  
1
2
3
4.06 (0.160)  
3.56 (0.140)  
29.16 (1.148)  
28.40 (1.118)  
2.79 (0.110)  
2.54 (0.100)  
1.45 (0.057)  
1.14 (0.045)  
14.22 (0.560)  
13.46 (0.530)  
2.67 (0.105)  
2.41 (0.095)  
0.90 (0.035)  
0.70 (0.028)  
5.20 (0.205)  
4.95 (0.195)  
2.65 (0.104)  
2.45 (0.096)  
0.56 (0.022)  
0.36 (0.014)  
www.nellsemi.com  
Page 6 of 6  

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