CD4071BCN [NSC]
Quad 2-Input OR, AND Buffered B Series Gate; 四2输入或和缓冲B系列门
| 型号： | CD4071BCN |
| 厂家： | 
National Semiconductor |
| 描述： | Quad 2-Input OR, AND Buffered B Series Gate |
| 文件： | 总8页 (文件大小：184K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
February 1988
CD4071BM/CD4071BC
Quad 2-Input OR Buffered B Series Gate
CD4081BM/CD4081BC
Quad 2-Input AND Buffered B Series Gate
General Description
Features
Y
Low power TTL
compatibility
Fan out of 2 driving 74L
or 1 driving 74LS
These quad gates are monolithic complementary MOS
(CMOS) integrated circuits constructed with N- and P-chan-
nel enhancement mode transistors. They have equal source
and sink current capabilities and conform to standard B se-
ries output drive. The devices also have buffered outputs
which improve transfer characteristics by providing very
high gain.
Y
5V–10V–15V parametric ratings
Y
Symmetrical output characteristics
Maximum input leakage 1 mA at 15V over full tempera-
ture range
Y
All inputs protected against static discharge with diodes to
.
SS
V
DD
and V
Connection Diagrams
CD4071B Dual-In-Line Package
TL/F/5977–3
Top View
CD4081B Dual-In-Line Package
TL/F/5977–6
Top View
Order Number CD4071B or CD4081B
C
1995 National Semiconductor Corporation
TL/F/5977
RRD-B30M105/Printed in U. S. A.
Absolute Maximum Ratings (Notes 1 & 2)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Lead Temperature (T )
L
(Soldering, 10 seconds)
260 C
§
b
a
0.5V
Operating Conditions
)
Voltage at Any Pin
0.5V to V
DD
Operating Range (V
3 V to 15 V
DC DC
Power Dissipation (P )
D
DD
Dual-In-Line
Small Outline
700 mW
500 mW
Operating Temperature Range (T )
A
CD4071BM, CD4081BM
CD4071BC, CD4081BC
b
b
a
55 C to 125 C
§
40 C to 85 C
§
a
b
a
V
Range
0.5 V to 18 V
DC DC
§
§
DD
b
a
65 C to 150 C
Storage Temperature (T )
S
§
§
DC Electrical Characteristics CD4071BM/CD4081BM (Note 2)
b
a
a
55 C
§
25 C
§
125 C
§
Symbol
Parameter
Conditions
Units
Min
Max
Min
Typ
Max
Min
Max
e
e
e
I
Quiescent Device
Current
V
DD
V
DD
V
DD
5V
0.25
0.50
1.0
0.004
0.005
0.006
0.25
0.50
1.0
7.5
15
30
mA
mA
mA
DD
10V
15V
e
e
e
V
V
V
V
Low Level
V
V
V
5V
0.05
0.05
0.05
0
0
0
0.05
0.05
0.05
0.05
0.05
0.05
V
V
V
OL
OH
IL
DD
DD
DD
k
k
Output Voltage
10V
15V
I
I
1 mA
1 mA
l
l
O
O
l
l
(
(
e
e
e
High Level
V
DD
V
DD
V
DD
5V
4.95
9.95
4.95
9.95
5
4.95
9.95
V
V
V
Output Voltage
10V
15V
10
15
14.95
14.95
14.95
e
e
e
e
0.5V
Low Level
V
DD
V
DD
V
DD
5V, V
1.5
3.0
4.0
2
4
6
1.5
3.0
4.0
1.5
3.0
4.0
V
V
V
O
e
e
Input Voltage
10V, V
15V, V
1.0V
1.5V
O
O
e
e
e
e
4.5V
High Level
V
DD
V
DD
V
DD
5V, V
O
3.5
7.0
3.5
7.0
3
6
9
3.5
7.0
V
V
V
IH
e
e
Input Voltage
10V, V
15V, V
9.0V
O
O
13.5V
11.0
11.0
11.0
e
e
e
e
0.4V
I
I
I
Low Level Output
Current
V
DD
V
DD
V
DD
5V, V
O
0.64
1.6
0.51
1.3
0.88
2.25
8.8
0.36
0.9
mA
mA
mA
OL
e
e
10V, V
15V, V
0.5V
1.5V
O
O
(Note 3)
4.2
3.4
2.4
e
e
e
e
b
b
b
b
b
0.36
High Level Output
Current
V
DD
V
DD
V
DD
5V, V
4.6V
0.64
0.51
0.88
2.25
mA
mA
mA
OH
IN
O
e
e
b
b
b
b
b
b
10V, V
15V, V
9.5V
1.6
4.2
1.3
3.4
0.9
2.4
O
O
b
(Note 3)
13.5V
8.8
b
5
e
e
e
e
b
b
b
b
Input Current
V
V
15V, V
0V
0.10
10
10b
5
0.10
1.0
mA
mA
DD
IN
15V, V
15V
0.10
0.10
1.0
DD
IN
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: All voltages measured with respect to V unless otherwise specified.
SS
Note 3: I
OH
and I are tested one output at a time.
OL
2
DC Electrical Characteristics CD4071BC/CD4081BC (Note 2)
b
a
a
85 C
40 C
§
25 C
§
§
Symbol
Parameter
Conditions
Units
Min
Max
Min
Typ
Max
Min
Max
e
e
e
I
Quiescent Device
Current
V
DD
V
DD
V
DD
5V
1
2
4
0.004
0.005
0.006
1
2
4
7.5
15
30
mA
mA
mA
DD
10V
15V
e
e
e
V
V
V
V
Low Level
V
V
V
5V
0.05
0.05
0.05
0
0
0
0.05
0.05
0.05
0.05
0.05
0.05
V
V
V
OL
OH
IL
DD
DD
DD
k
k
Output Voltage
10V
15V
I
I
1 mA
1 mA
l
l
O
O
l
l
(
(
e
e
e
High Level
V
DD
V
DD
V
DD
5V
4.95
9.95
4.95
9.95
5
4.95
9.95
V
V
V
Output Voltage
10V
15V
10
15
14.95
14.95
14.95
e
e
e
e
0.5V
Low Level
V
DD
V
DD
V
DD
5V, V
1.5
3.0
4.0
2
4
6
1.5
3.0
4.0
1.5
3.0
4.0
V
V
V
O
e
e
Input Voltage
10V, V
15V, V
1.0V
1.5V
O
O
e
e
e
e
4.5V
High Level
V
DD
V
DD
V
DD
5V, V
O
3.5
7.0
3.5
7.0
3
6
9
3.5
7.0
V
V
V
IH
e
e
Input Voltage
10V, V
15V, V
9.0V
O
O
13.5V
11.0
11.0
11.0
e
e
e
e
0.4V
I
I
I
Low Level Output
Current
V
DD
V
DD
V
DD
5V, V
O
0.52
1.3
0.44
1.1
0.88
2.25
8.8
0.36
0.9
mA
mA
mA
OL
e
e
10V, V
15V, V
0.5V
1.5V
O
O
(Note 3)
3.6
3.0
2.4
e
e
e
e
b
b
b
b
b
0.36
High Level Output
Current
V
DD
V
DD
V
DD
5V, V
4.6V
0.52
0.44
0.88
2.25
mA
mA
mA
OH
IN
O
e
e
b
b
b
b
b
b
10V, V
15V, V
9.5V
1.3
3.6
1.1
3.0
0.9
2.4
O
O
b
(Note 3)
13.5V
8.8
b
5
e
e
e
e
b
b
b
b
Input Current
V
V
15V, V
0V
0.30
10
10b
5
0.30
1.0
mA
mA
DD
IN
15V, V
15V
0.30
0.30
1.0
DD
IN
AC Electrical Characteristics* CD4071BC/CD4071BM
e
e
e
e
50 pF, R 200 kX, Typical temperature coefficient is 0.3%/ C
L
T
25 C, Input t ; t
§
20 ns, C
§
A
r
f
L
Symbol
Parameter
Conditions
Typ
Max
Units
e
e
e
t
t
t
Propagation Delay Time,
High-to-Low Level
V
V
V
5V
100
40
250
100
70
ns
ns
ns
PHL
DD
DD
DD
10V
15V
30
e
e
e
Propagation Delay Time,
Low-to-High Level
V
DD
V
DD
V
DD
5V
90
40
30
250
100
70
ns
ns
ns
PLH
10V
15V
e
e
e
, t
THL TLH
Transition Time
V
DD
V
DD
V
DD
5V
90
50
40
200
100
80
ns
ns
ns
10V
15V
C
C
Average Input Capacitance
Power Dissipation Capacity
Any Input
Any Gate
5
7.5
pF
pF
IN
18
PD
*AC Parameters are guaranteed by DC correlated testing.
Note 1: ‘‘Absolute Maximum Ratings’’ are those values beyond which the safety of the device cannot be guaranteed. Except for ‘‘Operating Temperature Range’’
they are not meant to imply that the devices should be operated at these limits. The table of ‘‘Electrical Characteristics’’ provides conditions for actual device
operation.
Note 2: All voltages measured with respect to V unless otherwise specified.
SS
Note 3: I
OH
and I are tested one output at a time.
OL
3
AC Electrical Characteristics* CD4081BC/CD4081BM
e
e
e
e
50 pF, R 200 kX, Typical temperature coefficient is 0.3%/ C
L
T
25 C, Input t ; t
§
20 ns, C
§
A
r
f
L
Symbol
Parameter
Conditions
Typ
Max
Units
e
e
e
t
t
t
Propagation Delay Time,
High-to-Low Level
V
V
V
5V
100
40
250
100
70
ns
ns
ns
PHL
DD
DD
DD
10V
15V
30
e
e
e
Propagation Delay Time,
Low-to-High Level
V
DD
V
DD
V
DD
5V
120
50
250
100
70
ns
ns
ns
PLH
10V
15V
35
e
e
e
, t
THL TLH
Transition Time
V
DD
V
DD
V
DD
5V
90
50
40
200
100
80
ns
ns
ns
10V
15V
C
C
Average Input Capacitance
Power Dissipation Capacity
Any Input
Any Gate
5
7.5
pF
pF
IN
18
PD
*AC Parameters are guaranteed by DC correlated testing.
Typical Performance Characteristics
TL/F/5977–7
TL/F/5977–8
TL/F/5977–9
FIGURE 1. Typical Transfer
Characteristics
FIGURE 2. Typical Transfer
Characteristics
FIGURE 3. Typical Transfer
Characteristics
TL/F/5977–11
TL/F/5977–12
FIGURE 5
FIGURE 6
TL/F/5977–10
FIGURE 4. Typical Transfer
Characteristics
4
Typical Performance Characteristics (Continued)
TL/F/5977–13
TL/F/5977–15
TL/F/5977–14
FIGURE 7
FIGURE 9
FIGURE 8
TL/F/5977–16
TL/F/5977–18
TL/F/5977–17
FIGURE 10
FIGURE 12
FIGURE 11
TL/F/5977–19
TL/F/5977–20
FIGURE 13
FIGURE 14
5
Schematic Diagrams
CD4071B
(/4 of device shown
e
a
B
J
A
e
e
Logical ‘‘1’’
Logical ‘‘0’’
High
Low
*All inputs protected by standard
CMOS protection circuit.
TL/F/5977–2
TL/F/5977–1
CD4081B
(/4 of device shown
e
J
A
B
#
e
e
Logical ‘‘1’’
Logical ‘‘0’’
High
Low
*All inputs protected by standard
CMOS protection circuit.
TL/F/5977–5
TL/F/5977–4
6
Physical Dimensions inches (millimeters)
Ceramic Dual-In-Line Package (J)
Order Number CD4071BMJ, CD4071BCJ
CD4081BMJ or CD4081BCJ
NS Package Number J14A
7
Physical Dimensions inches (millimeters) (Continued)
Molded Dual-In-Line Package (N)
Order Number CD4071BMN, CD4071BCN
CD4081BMN or CD4081BCN
NS Package Number N14A
LIFE SUPPORT POLICY
NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL
SEMICONDUCTOR CORPORATION. As used herein:
1. Life support devices or systems are devices or
systems which, (a) are intended for surgical implant
into the body, or (b) support or sustain life, and whose
failure to perform, when properly used in accordance
with instructions for use provided in the labeling, can
be reasonably expected to result in a significant injury
to the user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
National Semiconductor
Corporation
National Semiconductor
Europe
National Semiconductor
Hong Kong Ltd.
National Semiconductor
Japan Ltd.
a
1111 West Bardin Road
Arlington, TX 76017
Tel: 1(800) 272-9959
Fax: 1(800) 737-7018
Fax:
(
49) 0-180-530 85 86
@
13th Floor, Straight Block,
Ocean Centre, 5 Canton Rd.
Tsimshatsui, Kowloon
Hong Kong
Tel: (852) 2737-1600
Fax: (852) 2736-9960
Tel: 81-043-299-2309
Fax: 81-043-299-2408
Email: cnjwge tevm2.nsc.com
a
a
a
a
Deutsch Tel:
English Tel:
Fran3ais Tel:
Italiano Tel:
(
(
(
(
49) 0-180-530 85 85
49) 0-180-532 78 32
49) 0-180-532 93 58
49) 0-180-534 16 80
National does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and National reserves the right at any time without notice to change said circuitry and specifications.
相关型号：
CD4071BC_02
Quad 2-Input OR Buffered B Series Gate Quad 2-Input AND Buffered B Series Gate
FAIRCHILD
©2020 ICPDF网 联系我们和版权申明