1N829AT/R [NXP]

DIODE 6.2 V, SILICON, VOLTAGE REFERENCE DIODE, DO-34, HERMETIC SEALED, GLASS PACKAGE-2, Voltage Reference Diode;
1N829AT/R
型号: 1N829AT/R
厂家: NXP    NXP
描述:

DIODE 6.2 V, SILICON, VOLTAGE REFERENCE DIODE, DO-34, HERMETIC SEALED, GLASS PACKAGE-2, Voltage Reference Diode

文件: 总5页 (文件大小:29K)
中文:  中文翻译
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DISCRETE SEMICONDUCTORS  
DATA SHEET  
halfpage  
1N821 to 1N829  
1N821A to 1N829A  
Voltage reference diodes  
1996 Mar 20  
Product specification  
Supersedes data of March 1991  
Philips Semiconductors  
Product specification  
1N821 to 1N829  
1N821A to 1N829A  
Voltage reference diodes  
FEATURES  
DESCRIPTION  
Temperature compensated  
Voltage reference diode in a hermetically-sealed SOD68 (DO-34) glass  
package.  
Reference voltage range:  
5.89 to 6.51 V (typ. 6.20 V)  
Low temperature coefficient range:  
max. 0.0005 to 0.01 %/K.  
k
a
handbook, halfpage  
APPLICATION  
MAM216  
Voltage reference sources in  
measuring instruments such as  
digital voltmeters.  
Fig.1 Simplified outline (SOD68; DO-34) and symbol.  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
PARAMETER  
working current  
CONDITIONS  
MIN.  
MAX.  
50  
UNIT  
mA  
IZ  
Ptot  
Tstg  
Tj  
total power dissipation  
storage temperature  
Tamb = 50 °C  
400  
mW  
°C  
65  
+200  
200  
junction temperature  
°C  
Tamb  
operating ambient temperature  
55  
+100  
°C  
1996 Mar 20  
2
Philips Semiconductors  
Product specification  
1N821 to 1N829  
1N821A to 1N829A  
Voltage reference diodes  
ELECTRICAL CHARACTERISTICS  
Tj = 25 °C unless otherwise specified.  
SYMBOL  
PARAMETER  
reference voltage  
CONDITIONS  
IZ =7.5 mA  
IZ =7.5 mA; test points for  
amb: 55; +25; +75; +100 °C;  
MIN.  
TYP.  
MAX.  
UNIT  
Vref  
5.89  
6.20  
6.51  
V
Vref  
reference voltage excursion  
1N821; 1N821A  
T
96  
mV  
mV  
mV  
mV  
mV  
see Fig.2; notes 1 and 2  
1N823; 1N823A  
48  
19  
9
1N825; 1N825A  
1N827; 1N827A  
1N829; 1N829A  
5
SZ  
temperature coefficient  
1N821; 1N821A  
IZ = 7.5 mA: see Fig.3;  
notes 1 and 2  
0.01  
%/K  
1N823; 1N823A  
0.005 %/K  
0.002 %/K  
0.001 %/K  
0.0005 %/K  
1N825; 1N825A  
1N827; 1N827A  
1N829; 1N829A  
rdif  
differential resistance  
1N821 to 1N829  
1N821A to 1N829A  
IZ = 7.5 mA; see Fig.4  
15  
10  
Notes  
1. The quoted values of Vref are based on a constant current IZ. Two factors can cause Vref to change, namely the  
differential resistance rdif and the temperature coefficient SZ.  
a) As the max. rdif of the device can be 15 , a change of 0.01 mA in the current through the reference diode will  
result in a Vref of 0.01 mA × 15 = 0.15 mV. This level of Vref is not significant on a 1N821 (Vref < 96 mV),  
it is however very significant on a 1N829 (Vref < 5 mV).  
b) The temperature coefficient of the reference voltage SZ is a function of IZ. Reference diodes are classified at the  
specified test current and the SZ of the reference diode will be different at different levels of IZ. The absolute value  
of IZ is important, however, the stability of IZ, once the level has been set, is far more significant. This applies  
particularly to the 1N829. The effect of the stability of IZ on SZ is shown in Fig.3.  
2. All reference diodes are characterized by the ‘box method’. This guarantees a maximum voltage excursion (Vref)  
over the specified temperature range, at the specified test current (IZ), verified by tests at indicated temperature  
points within the range. VZ is measured and recorded at each temperature specified. The Vref between the highest  
and lowest values must not exceed the maximum Vref given. Therefore the temperature coefficient is only given as  
V
ref1 Vref2  
100  
------------------------------------- -------------------  
amb2 Tamb1 Vref nom  
a reference. It may be derived from: SZ  
=
×
%/K  
T
THERMAL CHARACTERISTICS  
SYMBOL  
PARAMETER  
CONDITIONS  
VALUE  
UNIT  
Rth j-tp  
Rth j-a  
thermal resistance from junction to tie-point 8 mm from the body  
thermal resistance from junction to ambient lead length 10 mm  
300  
375  
K/W  
K/W  
1996 Mar 20  
3
Philips Semiconductors  
Product specification  
1N821 to 1N829  
1N821A to 1N829A  
Voltage reference diodes  
GRAPHICAL DATA  
MBG534  
MBG536  
10  
0.002  
handbook, halfpage  
handbook, halfpage  
(2)  
S  
Z
(3)  
(1)  
I
(%/K)  
0.001  
Z
(mA)  
7.5  
0
0.001  
5
(1)  
(2)  
(3)  
0.002  
2.5  
-75  
0.003  
-50  
-25  
0
25  
50  
4
5
6
7
8
9
I
10  
(mA)  
Z
11  
V  
(mV)  
ref(max)  
Referenced to IZ = 7.5 mA.  
(1) Tj = 100 °C.  
(2) Tj = 25 °C.  
(3) Tj = 55 °C.  
Fig.2 Working current as a function of the  
maximum reference voltage excursion.  
Fig.3 Temperature coefficient change as a  
function of working current; typical values.  
MBG535  
3
10  
handbook, halfpage  
r
dif  
()  
2
10  
(1)  
(2)  
(3)  
10  
1
2
1
10  
10  
I
(mA)  
Z
(1) Tj = 100 °C.  
(2) Tj = 25 °C.  
(3) Tj = 55 °C.  
Fig.4 Differential resistance as a function of  
working current; typical values.  
1996 Mar 20  
4
Philips Semiconductors  
Product specification  
1N821 to 1N829  
1N821A to 1N829A  
Voltage reference diodes  
PACKAGE OUTLINE  
0.55  
max  
1.6  
max  
3.04  
max  
25.4 min  
25.4 min  
MSA212 - 1  
Dimensions in mm.  
The marking band indicates the cathode.  
The diodes are type branded.  
Fig.5 SOD68 (DO-34).  
DEFINITIONS  
Data Sheet Status  
Objective specification  
Preliminary specification  
Product specification  
This data sheet contains target or goal specifications for product development.  
This data sheet contains preliminary data; supplementary data may be published later.  
This data sheet contains final product specifications.  
Limiting values  
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or  
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation  
of the device at these or at any other conditions above those given in the Characteristics sections of the specification  
is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices, or systems where malfunction of these  
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for  
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such  
improper use or sale.  
1996 Mar 20  
5

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