600F1R8BW250XT [NXP]

Airfast RF Power LDMOS Transistor;
600F1R8BW250XT
型号: 600F1R8BW250XT
厂家: NXP    NXP
描述:

Airfast RF Power LDMOS Transistor

文件: 总13页 (文件大小:313K)
中文:  中文翻译
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A3V26S004N  
Airfast RF Power LDMOS Transistor  
Rev. 0 — December 2020  
Data Sheet: Technical Data  
This 26 dBm RF power LDMOS transistor is designed for cellular base  
station applications covering the frequency range of 2496 to 2690 MHz.  
2600 MHz  
A3V26S004N  
Typical Single--Carrier W--CDMA Reference Circuit Performance:  
DD = 42 Vdc, IDQ = 17 mA, Pout = 23.5 dBm Avg., Input Signal PAR =  
9.9 dB @ 0.01% Probability on CCDF.(1)  
V
G
(%)  
Output PAR  
(dB)  
ACPR  
(dBc)  
ps  
D
2496–2690 MHz, 26 dBm Avg., 48 V  
AIRFAST RF POWER LDMOS  
TRANSISTOR  
Frequency  
2515 MHz  
2595 MHz  
2675 MHz  
(dB)  
23.2  
23.0  
22.0  
15.1  
15.5  
14.8  
10.3  
9.6  
–35.0  
–37.0  
–37.7  
9.3  
1. All data measured in reference circuit with device soldered to printed circuit board.  
Features  
Designed for low complexity analog or digital linearization systems  
Universal broadband driver  
Optimized for massive MIMO active antenna systems for 5G base stations  
DFN 4.5 4  
PLASTIC  
V
1
2
3
6
5
4
N.C.  
GS  
N.C.  
V
DS  
GND  
N.C.  
(Top View)  
Note: Exposed backside of the package is  
the source terminal for the transistor.  
Figure 1. Pin Connections  
NXP reserves the right to change the detail specifications as may be required to permit  
improvements in the design of its products.  
NXP Semiconductors  
Table 1. Maximum Ratings  
Rating  
Symbol  
Value  
Unit  
Vdc  
Vdc  
Vdc  
C  
Drain--Source Voltage  
V
–0.5, +105  
–6.0, +10  
55, +0  
DSS  
Gate--Source Voltage  
V
GS  
DD  
Operating Voltage  
V
Storage Temperature Range  
Case Operating Temperature Range  
T
stg  
–65 to +150  
–40 to +150  
–40 to +225  
T
C
C  
(1,2)  
Operating Junction Temperature Range  
T
J
C  
Table 2. Thermal Characteristics  
(2,3)  
Characteristic  
Symbol  
Value  
Unit  
Thermal Resistance, Junction to Case  
R
8.0  
C/W  
JC  
Case Temperature 125C, 26.0 dBm Avg., W--CDMA, 48 Vdc, I = 17 mA,  
DQ  
2595 MHz  
Table 3. ESD Protection Characteristics  
Test Methodology  
Class  
1C  
Human Body Model (per JS--001--2017)  
Charge Device Model (per JS--002--2014)  
C2a  
Table 4. Moisture Sensitivity Level  
Test Methodology  
Rating  
Package Peak Temperature  
Unit  
Per JESD22--A113, IPC/JEDEC J--STD--020  
3
260  
C  
Table 5. Electrical Characteristics (T = 25C unless otherwise noted)  
A
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
Off Characteristics  
Zero Gate Voltage Drain Leakage Current  
I
I
10  
1
Adc  
Adc  
Adc  
DSS  
DSS  
GSS  
(V = 105 Vdc, V = 0 Vdc)  
DS  
GS  
Zero Gate Voltage Drain Leakage Current  
(V = 55 Vdc, V = 0 Vdc)  
DS  
GS  
Gate--Source Leakage Current  
I
1
(V = 8 Vdc, V = 0 Vdc)  
GS  
DS  
On Characteristics  
Gate Threshold Voltage  
(V = 10 Vdc, I = 10 Adc)  
V
V
0.7  
1.6  
0.2  
1.2  
1.78  
0.6  
1.7  
1.9  
0.9  
Vdc  
Vdc  
Vdc  
GS(th)  
GS(Q)  
DS(on)  
DS  
D
Gate Quiescent Voltage  
(V = 48 Vdc, I = 16 mAdc, Measured in Functional Test)  
DD  
D
Drain--Source On--Voltage  
(V = 10 Vdc, I = 75 mAdc)  
V
GS  
D
1. Continuous use at maximum temperature will affect MTTF.  
2. MTTF calculator available at http://www.nxp.com.  
3. Refer to AN1955, Thermal Measurement Methodology of RF Power Amplifiers. Go to http://www.nxp.com/RF and search for AN1955.  
(continued)  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
2 / 13  
NXP Semiconductors  
Table 5. Electrical Characteristics (T = 25C unless otherwise noted) (continued)  
A
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
(1)  
Functional Tests  
(In NXP Production Test Fixture, 50 ohm system) V = 48 Vdc, I = 16 mA, P = 26 dBm Avg., f = 2690 MHz,  
DD  
DQ  
out  
1--tone CW.  
Power Gain  
G
19.5  
18.0  
33.5  
23.3  
21.9  
35.0  
26.0  
dB  
%
ps  
D
Drain Efficiency  
P
@ 6 dB Compression Point  
P6dB  
dBm  
out  
Wideband Ruggedness (In NXP Reference Circuit, 50 ohm system) I = 17 mA, f = 2595 MHz, Additive White Gaussian Noise (AWGN)  
DQ  
with 10 dB PAR  
ISBW of 400 MHz at 55 Vdc, 1.5 W Avg. Modulated Output Power  
(3 dB Input Overdrive from 0.7 W Avg. Modulated Output Power)  
No Device Degradation  
(2)  
Typical Performance  
(In NXP Reference Circuit, 50 ohm system) V = 42 Vdc, I = 17 mA, 2515–2675 MHz Bandwidth  
DD DQ  
VBW Resonance Point  
(IMD Third Order Intermodulation Inflection Point)  
VBW  
170  
MHz  
dB  
res  
Gain Flatness in 160 MHz Bandwidth @ P = 23.5 dBm Avg.  
G
F
0.7  
out  
Fast CW, 27 ms Sweep  
P
@ 3 dB Compression Point  
P3dB  
3.1  
W
out  
AM/PM  
(Maximum value measured at the P3dB compression point across  
–23  
the 2515–2675 MHz bandwidth)  
Gain Variation over Temperature  
(–40C to +85C)  
G  
0.017  
0.004  
dB/C  
dB/C  
Output Power Variation over Temperature  
P1dB  
(–40C to +85C)  
Table 6. Ordering Information  
Device  
Tape and Reel Information  
T6 Suffix = 5,000 Units, 12 mm Tape Width, 13--inch Reel  
Package  
A3V26S004NT6  
DFN 4.5 4  
1. Part internally input matched.  
2. All data measured in fixture with device soldered to printed circuit board.  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
3 / 13  
NXP Semiconductors  
C14  
C11  
C13 C12  
V
GG  
V
DD  
C10  
C5  
C9  
C8  
C7  
C6  
Q1  
C2  
C1  
C4  
C3  
D135421  
A3V26S004N  
Rev. B  
aaa--037822  
Note: All data measured in reference circuit with device soldered to printed circuit board.  
Figure 2. A3V26S004N Reference Circuit Component Layout  
Table 7. A3V26S004N Reference Circuit Component Designations and Values  
Part  
Description  
6.8 pF Chip Capacitor  
Part Number  
Manufacturer  
C1  
600F6R8BW250XT  
ATC  
C2  
1.0 pF Chip Capacitor  
1.8 pF Chip Capacitor  
10 pF Chip Capacitor  
20 pF Chip Capacitor  
0.1 F Chip Capacitor  
1 F Chip Capacitor  
10 F Chip Capacitor  
10 F Chip Capacitor  
1 F Chip Capacitor  
0.1 F Chip Capacitor  
2.2 nF Chip Capacitor  
RF Power LDMOS Transistor  
600F1R0BW250XT  
600F1R8BW250XT  
600F100FW250XT  
600F200FW250XT  
GRM319R71H104KA  
GRM32ER72A105KA  
GRM31CR61H106KA  
GRM21BR61C106KE  
08055C105KAT2A  
GRM188R71H104KA  
GRM1885C1H222JA  
A3V26S004N  
ATC  
C3  
ATC  
C4  
ATC  
C5, C6  
C7  
ATC  
Murata  
Murata  
Murata  
Murata  
AVX  
C8  
C9, C10  
C11  
C12  
C13  
C14  
Q1  
Murata  
Murata  
NXP  
PCB  
Rogers RO4350B, 0.020, = 3.66  
D135421  
MTL  
r
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
4 / 13  
NXP Semiconductors  
A3V26S4  
ALYWZ  
Figure 3. Product Marking  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
5 / 13  
NXP Semiconductors  
Package Information  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
6 / 13  
NXP Semiconductors  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
7 / 13  
NXP Semiconductors  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
8 / 13  
NXP Semiconductors  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
9 / 13  
NXP Semiconductors  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
10 / 13  
NXP Semiconductors  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
11 / 13  
NXP Semiconductors  
Product Documentation, Software and Tools  
Refer to the following resources to aid your design process.  
Application Notes  
AN1907: Solder Reflow Attach Method for High Power RF Devices in Plastic Packages  
AN1955: Thermal Measurement Methodology of RF Power Amplifiers  
Software  
Electromigration MTTF Calculator  
.s2p File  
Development Tools  
Printed Circuit Boards  
Revision History  
The following table summarizes revisions to this document.  
Revision  
Date  
Description  
0
Dec. 2020  
Initial release of data sheet  
A3V26S004N Airfast RF Power LDMOS Transistor, Rev. 0, December 2020  
Data Sheet: Technical Data  
12 / 13  
Information in this document is provided solely to enable system and software  
implementers to use NXP products. There are no express or implied copyright licenses  
granted hereunder to design or fabricate any integrated circuits based on the information  
in this document. NXP reserves the right to make changes without further notice to any  
products herein.  
How to Reach Us  
Home Page  
nxp.com  
Web Support:  
nxp.com/support  
NXP makes no warranty, representation, or guarantee regarding the suitability of its  
products for any particular purpose, nor does NXP assume any liability arising out of the  
application or use of any product or circuit, and specifically disclaims any and all liability,  
including without limitation consequential or incidental damages. “Typical” parameters  
that may be provided in NXP data sheets and/or specifications can and do vary in  
different applications, and actual performance may vary over time. All operating  
parameters, including “typicals,” must be validated for each customer application by  
customer’s technical experts. NXP does not convey any license under its patent rights  
nor the rights of others. NXP sells products pursuant to standard terms and conditions of  
sale, which can be found at the following address: nxp.com/SalesTermsandConditions.  
NXP, the NXP logo, Freescale, the Freescale logo and Airfast are trademarks of  
NXP B.V. All other product or service names are the property of their respective owners.  
E NXP B.V. 2020  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: December2020  
Document identifier: A3V26S004N  

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