74ABT834 [NXP]

Octal inverting transceiver with parity generator/checker 3-State; 八路反相收发器奇偶校验发生器/检验三态
74ABT834
型号: 74ABT834
厂家: NXP    NXP
描述:

Octal inverting transceiver with parity generator/checker 3-State
八路反相收发器奇偶校验发生器/检验三态

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Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
power dissipation with high speed and high  
output drive.  
sent to the input of a storage register. If a  
Low–to–High transition happens at the clock  
input (CP), the error data is stored in the  
register and the Open–collector error flag  
(ERROR) will go Low. The error flag register  
is cleared with a Low pulse on the CLEAR  
input.  
FEATURES  
Low static and dynamic power dissipation  
The 74ABT834 is an octal inverting  
transceiver with a parity generator/checker  
and is intended for bus–oriented applications.  
with high speed and high output drive  
Open–collector ERROR output  
Output capability: +64mA/–32mA  
When Output Enable A (OEA) is High, it will  
place the A outputs in a high impedance  
state. Output Enable B (OEB) controls the B  
outputs in the same way.  
Latch–up protection exceeds 500mA per  
If both OEA and OEB are Low, data will flow  
from the A bus to the B bus and the part is  
forced into an error condition which creates  
an inverted PARITY output. This error  
condition can be used by the designer for  
system diagnostics.  
Jedec JC40.2 Std 17  
ESD protection exceeds 2000 V per MIL  
STD 883C Method 3015.6 and 200 V per  
Machine Model  
The parity generator creates an odd parity  
output (PARITY) when OEB is Low. When  
OEA is Low, the parity of the B port, including  
the PARITY input, is checked for odd parity.  
When an error is detected, the error data is  
Power up/down 3–State  
DESCRIPTION  
The 74ABT834 high–performance BiCMOS  
device combines low static and dynamic  
QUICK REFERENCE DATA  
CONDITIONS  
= 25°C; GND = 0V  
SYMBOL  
PARAMETER  
TYPICAL  
3.4  
UNIT  
ns  
T
amb  
t
t
Propagation delay  
An to Bn or Bn to An  
PLH  
PHL  
C = 50pF; V = 5V  
L
CC  
t
t
Propagation delay  
An to PARITY  
PLH  
PHL  
C = 50pF; V = 5V  
7.4  
ns  
L
CC  
C
Input capacitance  
Output capacitance  
Total supply current  
V = 0V or V  
CC  
4
7
pF  
pF  
µA  
IN  
I
C
V = 0V or V  
I CC  
OUT  
CCZ  
I
Outputs disabled; V =5.5V  
50  
CC  
ORDERING INFORMATION  
CONDITIONS  
= 25°C; GND = 0V  
PACKAGES  
ORDER CODE  
T
amb  
24–pin plastic DIP (300mil)  
24–pin plastic SOL (300mil)  
–40°C to +85°C  
–40°C to +85°C  
74ABT834N  
74ABT834D  
PIN CONFIGURATION  
LOGIC SYMBOL  
OEA  
A0  
1
2
3
4
5
24  
23  
22  
21  
20  
V
CC  
B0  
B1  
B2  
B3  
2
3
4
5
6
7
8
9
A1  
A2  
A0 A1 A2 A3 A4 A5 A6 A7  
OEB  
A3  
14  
1
6
7
8
9
19 B4  
18 B5  
A4  
A5  
15  
10  
PARITY  
OEA  
CLEAR  
CP  
11  
13  
ERROR  
A6  
A7  
17  
16  
15  
14  
B6  
B0 B1 B2 B3 B4 B5 B6 B7  
B7  
ERROR 10  
CLEAR 11  
GND 12  
PARITY  
OEB  
23 22 21 20 19 18 17 16  
13 CP  
TOP VIEW  
1
June 9, 1992  
Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
PIN DESCRIPTION  
SYMBOL  
PIN NUMBER  
NAME AND FUNCTION  
2, 3, 4, 5,  
6, 7, 8, 9  
A0 – A7  
A port 3–State inputs/outputs  
23, 22, 21, 20,  
19, 18, 17, 16  
B0 – B7  
B port 3–State inputs/outputs  
OEA  
OEB  
1
Enables the A outputs when Low  
Enables the B outputs when Low  
Parity output  
14  
15  
10  
11  
13  
12  
24  
PARITY  
ERROR  
CLEAR  
CP  
Error output  
Clears the error flag register when Low  
Clock input  
GND  
Ground (0V)  
V
CC  
Positive supply voltage  
FUNCTION TABLE  
INPUTS  
An  
OUTPUTS  
Bn  
Bn + Parity  
Σ of Lows  
MODE  
OEB  
OEA  
An  
PARITY  
Σ of Highs  
A data to B bus and generate odd parity  
output  
Odd  
Even  
NA  
(output)  
NA  
(input)  
H
L
L
H
An  
NA  
(output)  
Odd  
Even  
NA  
(input)  
NA  
(input)  
1
B data to A bus and check for parity error  
H
H
L
L
H
L
Bn  
Z
2
A bus and B bus disabled  
X
X
Z
Z
A data to B bus and generate inverted  
parity output  
Odd  
Even  
NA  
(output)  
NA  
(input)  
L
H
An  
NOTES:  
1. Error checking is detailed in the Error Flag Function Table below.  
2. When clocked, the error output is Low if the sum of A inputs is even or High if the sum of A inputs is odd.  
ERROR FLAG FUNCTION TABLE  
INPUTS  
CP  
Internal node  
Point ”P”  
Output  
Bn + Parity  
Σ of Lows  
Pre–state  
ERRORn–1  
ERROR  
OUTPUT  
MODE  
CLEAR  
H
H
H
X
Odd  
Even  
X
H
L
X
H
X
L
H
L
L
Sample  
Hold  
H
L
X
X
X
X
X
X
NC  
H
Clear  
X
H
L
X
NA  
NC  
Z
=
=
=
=
=
=
=
=
High voltage level steady state  
Low voltage level steady state  
Don’t care  
Not applicable  
No change  
High impedance ”off” state  
Low–to–High clock transition  
Not a Low–to–High clock transition  
2
June 9, 1992  
Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
LOGIC DIAGRAM  
8
8
A0 – A7  
B0 – B7  
8
OEB  
OEA  
PARITY  
8
8
MUX  
B
9–bit  
Odd  
Parity  
Tree  
}
}
9
”P”  
A
Sel A/B  
D
R
ERROR  
CP  
CLEAR  
1, 2  
ABSOLUTE MAXIMUM RATINGS  
SYMBOL  
PARAMETER  
DC supply voltage  
CONDITIONS  
RATING  
–0.5 to +7.0  
–18  
UNIT  
V
V
CC  
I
IK  
DC input diode current  
V < 0  
I
mA  
V
3
V
I
DC input voltage  
–1.2 to +7.0  
–50  
I
DC output diode current  
V
O
< 0  
mA  
V
OK  
3
V
DC output voltage  
output in Off or High state  
output in Low state  
–0.5 to +5.5  
128  
OUT  
OUT  
I
DC output current  
mA  
°C  
T
stg  
Storage temperature range  
–65 to 150  
NOTES:  
1. Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the  
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to abso-  
lute–maximum–rated conditions for extended periods may affect device reliability.  
2. The performance capability of a high–performance integrated circuit in conjunction with its thermal environment can create junction tempera-  
tures which are detrimental to reliability. The maximum junction temperature of this integrated circuit should not exceed 150°C.  
3. The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
3
June 9, 1992  
Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
RECOMMENDED OPERATING CONDITIONS  
SYMBOL  
PARAMETER  
LIMITS  
UNIT  
Min  
4.5  
0
Max  
5.5  
V
DC supply voltage  
Input voltage  
V
V
CC  
V
V
CC  
I
V
High–level input voltage  
Input voltage  
2.0  
V
IH  
V
0.8  
5.5  
–32  
64  
V
IL  
V
High–level output voltage, ERROR  
High–level output current  
V
OH  
OH  
I
mA  
mA  
ns/V  
°C  
I
OL  
Low–level output current  
t/v  
Input transition rise or fall rate  
Operating free–air temperature range  
0
5
T
amb  
–40  
+85  
DC ELECTRICAL CHARACTERISTICS  
LIMITS  
T
= –40°C  
to +85°C  
amb  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
T
amb  
= +25°C  
UNIT  
Min  
Typ  
Max  
Min  
Max  
V
Input clamp voltage  
V
V
= 4.5V; I = –18mA  
–0.9  
–1.2  
–1.2  
V
IK  
CC  
IK  
High–level output current  
ERROR ONLY  
I
= 5.5V; V = 5.5V; V = V or V  
IH  
20  
20  
µA  
OH  
CC  
OH  
I
IL  
V
CC  
V
CC  
V
CC  
V
CC  
= 4.5V; I = –3mA; V = V or V  
2.5  
3.0  
2.0  
3.5  
4.0  
2.5  
3.0  
2.0  
V
V
V
V
OH  
I
IL  
IH  
V
High–level output voltage  
= 5.0V; I = –3mA; V = V or V  
OH I IL  
OH  
IH  
= 4.5V; I = –32mA; V = V or V  
IH  
2.6  
OH  
I
IL  
V
Low–level output voltage  
= 4.5V; I = 64mA; V = V or V  
IH  
0.42  
0.55  
0.55  
OL  
OL  
I
IL  
I
I
Input leakage Control pins  
V
V
= 5.5V; V = GND or 5.5V  
±0.01  
±5  
±1.0  
±1.0  
µA  
µA  
CC  
I
current  
Data pins  
= 5.5V; V = GND or 5.5V  
±100  
±100  
CC  
I
I
+ I  
+ I  
3–State output High current  
3–State output Low current  
V
V
V
V
V
V
= 5.5V; V = 2.7V; V = V or V  
IH  
5.0  
–5.0  
–80  
50  
50  
–50  
–180  
250  
30  
50  
–50  
–180  
250  
30  
µA  
µA  
IH  
OZH  
CC  
CC  
CC  
CC  
CC  
CC  
O
I
IL  
I
= 5.5V; V = 0.5V; V = V or V  
O I IL IH  
IL  
OZL  
1
I
O
Output current  
= 5.5V; V = 2.5V  
–50  
–50  
mA  
µA  
O
I
= 5.5V; Outputs High, V = GND or V  
CCH  
I
CC  
I
Quiescent supply current  
= 5.5V; Outputs Low, V = GND or V  
20  
mA  
CCL  
I
CC  
= 5.5V; Outputs 3–State;  
I
50  
250  
1.5  
250  
1.5  
µA  
CCZ  
V = GND or V  
I
CC  
Additional supply current per  
V
CC  
= 5.5V; one input at 3.4V,  
I  
CC  
0.3  
mA  
2
input pin  
other inputs at V or GND  
CC  
NOTES:  
1. Not more than one output should be tested at a time, and the duration of the test should not exceed one second.  
2. This is the increase in supply current for each input at 3.4V.  
4
June 9, 1992  
Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
AC CHARACTERISTICS  
GND = 0V; t = t = 2.5ns; C = 50pF, R = 500Ω  
R
F
L
L
LIMITS  
Max  
o
o
T
V
= +25 C  
T
V
= –40 to +85 C  
amb  
CC  
amb  
CC  
SYMBOL  
PARAMETER  
WAVEFORMS  
UNIT  
= +5.0V  
= +5.0V ±10%  
Min  
Typ  
Min  
Max  
t
t
Propagation delay  
An to Bn or Bn to An  
PLH  
PHL  
2
ns  
ns  
ns  
ns  
ns  
ns  
ns  
t
t
Propagation delay  
An to PARITY  
PLH  
PHL  
1, 2  
1, 2  
5
t
t
Propagation delay  
OEA to PARITY  
PLH  
PHL  
Propagation delay  
CLEAR to ERROR  
t
PLH  
Propagation delay  
CP to ERROR  
t
1
PHL  
PZH  
t
Output enable time  
OEA to An or OEB to Bn, PARITY  
3, 4  
3, 4  
t
PZL  
t
Output disable time  
OEA to An or OEB to Bn, PARITY  
PHZ  
t
PLZ  
AC SETUP REQUIREMENTS  
GND = 0V; t = t = 2.5ns; C = 50pF, R = 500Ω  
R
F
L
L
LIMITS  
Max  
o
o
T
V
= +25 C  
= +5.0V  
T
V
= –40 to +85 C  
amb  
CC  
amb  
CC  
SYMBOL  
PARAMETER  
WAVEFORMS  
UNIT  
= +5.0V ±10%  
Min  
Typ  
Min  
Max  
t (H)  
t (L)  
s
Setup time, High or Low  
Bn or PARITY to CP  
s
6
6
6
5
5
ns  
ns  
ns  
ns  
ns  
t (H)  
Hold time, High or Low  
Bn or PARITY to CP  
h
t (L)  
h
t (H)  
Pulse width, High or Low  
CP  
w
t (L)  
w
Pulse width, Low  
CLEAR  
t (L)  
w
Recovery time  
CLEAR to CP  
t
rec  
5
June 9, 1992  
Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
AC WAVEFORMS  
V
M
= 1.5V, V = GND to 3.0V  
IN  
INPUT  
INPUT  
V
V
V
V
M
M
t
M
M
t
t
t
PHL  
PLH  
PLH  
PHL  
V
V
OUTPUT  
V
V
OUTPUT  
M
M
M
M
Waveform 1. Propagation Delay For Inverting Output  
Waveform 2. Propagation Delay For Non–Inverting  
Output  
V
V
OEA, OEB  
V
OEA, OEB  
V
M
M
M
t
M
t
t
t
PHZ  
PZH  
PZL  
PLZ  
V
–0.3V  
0V  
OH  
V
V
M
OUTPUT  
OUTPUT  
M
V
+0.3V  
0V  
OL  
Waveform 3. 3–State Output Enable Time to High Level  
and Output Disable Time from High Level  
Waveform 4. 3–State Output Enable Time to Low Level  
and Output Disable Time from Low Level  
V
V
CLEAR  
M
M
t
(L)  
t
REC  
w
V
V
V
V
Bn, PARITY  
M
M
t
M
M
V
CP  
M
t
(H)  
t
(L)  
t
t
(H)  
t (L)  
h
s
s
h
(H)  
(L)  
t
w
w
PLH  
CP  
ERROR  
V
V
M
V
V
M
M
M
Waveform 6. Data Setup and Hold Times and  
Clock Pulse Width  
Waveform 5. CLEAR Pulse Width, CLEAR to ERROR  
Delay and CLEAR to Clock Recovery Time  
NOTE: The shaded areas indicate when the input is permitted to change for predictable output performance.  
6
June 9, 1992  
Philips Semiconductors Advanced BiCMOS Products  
Objective specification  
Octal inverting transceiver with parity  
generator/checker (3–State)  
74ABT834  
TYPICAL PROPAGATION DELAYS VERSUS LOAD FOR OPEN COLLECTOR OUTPUTS  
18  
16  
14  
12  
t
PLH  
10  
8
6
4
t
PHL  
2
0
0
100  
200  
300  
400  
500  
600  
Load resistor ()  
NOTE:  
When using Open–Collector parts, the value of the pull–up resistor greatly affects the value of the t  
. For example, changing the  
PLH  
specified pull–up resistor value from 500to 100will improve the t  
over 300% with only a slight change in the t  
. However,  
PHL  
PLH  
if the value of the pull–up resistor is changed, the user must make certain that the total I current through the resistor and the total  
OL  
I ’s of the receivers does not exceed the I maximum specification.  
IL  
OL  
TEST CIRCUIT AND WAVEFORM  
V
t
W
AMP (V)  
CC  
90%  
90%  
V
X
V
V
M
NEGATIVE  
PULSE  
M
10%  
10%  
90%  
R
R
X
L
0V  
(t  
V
V
OUT  
IN  
PULSE  
D.U.T  
t
t
(t  
(t  
)
t
TLH  
)
GENERATOR  
THL  
F
R
)
t
(t )  
R
T
C
TLH  
R
THL F  
L
AMP (V)  
90%  
M
POSITIVE  
PULSE  
V
V
M
Test Circuit for 3–State Outputs  
10%  
10%  
t
W
0V  
SWITCH POSITION  
LOAD VALUES  
V
= 1.5V  
M
TEST  
SWITCH  
closed  
closed  
open  
OUTPUT  
ERROR 100Ω  
All other 5007.0V  
R
V
X
X
Input Pulse Definition  
t
t
PLZ  
PZL  
V
CC  
All other  
INPUT PULSE REQUIREMENTS  
DEFINITIONS  
R = Load resistor; see AC CHARACTERISTICS for value.  
L
FAMILY  
Amplitude  
3.0V  
Rep. Rate  
1MHz  
t
t
t
F
W
R
C = Load capacitance includes jig and probe capacitance;  
L
74ABT  
500ns 2.5ns 2.5ns  
see AC CHARACTERISTICS for value.  
R = Termination resistance should be equal to Z  
T
of  
OUT  
pulse generators.  
7
June 9, 1992  

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