74HC40105D

更新时间:2024-10-29 02:24:56
品牌:NXP
描述:4-bit x 16-word FIFO register

74HC40105D 概述

4-bit x 16-word FIFO register 4位x 16字FIFO寄存器 FIFO

74HC40105D 规格参数

是否无铅: 不含铅是否Rohs认证: 符合
生命周期:Transferred零件包装代码:SOIC
包装说明:3.90 MM, PLASITC, MS-012AC, SOT-109-1, SO-16针数:16
Reach Compliance Code:unknownECCN代码:EAR99
HTS代码:8542.39.00.01风险等级:5.24
最长访问时间:600 ns其他特性:REGISTER BASED; BUBBLE BACK 750NS
最大时钟频率 (fCLK):14 MHz周期时间:71.428 ns
JESD-30 代码:R-PDSO-G16长度:9.9 mm
内存密度:64 bit内存集成电路类型:OTHER FIFO
内存宽度:4湿度敏感等级:1
功能数量:1端子数量:16
字数:16 words字数代码:16
工作模式:ASYNCHRONOUS最高工作温度:125 °C
最低工作温度:-40 °C组织:16X4
输出特性:3-STATE可输出:YES
封装主体材料:PLASTIC/EPOXY封装代码:SOP
封装等效代码:SOP16,.25封装形状:RECTANGULAR
封装形式:SMALL OUTLINE并行/串行:PARALLEL
峰值回流温度(摄氏度):260电源:2/6 V
认证状态:Not Qualified座面最大高度:1.75 mm
子类别:FIFOs最大供电电压 (Vsup):6 V
最小供电电压 (Vsup):2 V标称供电电压 (Vsup):4.5 V
表面贴装:YES技术:CMOS
温度等级:AUTOMOTIVE端子面层:NICKEL/PALLADIUM/GOLD (NI/PD/AU)
端子形式:GULL WING端子节距:1.27 mm
端子位置:DUAL处于峰值回流温度下的最长时间:30
宽度:3.9 mmBase Number Matches:1

74HC40105D 数据手册

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INTEGRATED CIRCUITS  
DATA SHEET  
For a complete data sheet, please also download:  
The IC06 74HC/HCT/HCU/HCMOS Logic Family Specifications  
74HC/HCT40105  
4-bit x 16-word FIFO register  
1998 Jan 23  
Product specification  
Supersedes data of December 1990  
File under Integrated Circuits, IC06  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
different shifting rates. This feature makes it particularly  
useful as a buffer between asynchronous systems. Each  
word position in the register is clocked by a control flip-flop,  
which stores a marker bit. A “1” signifies that the position’s  
data is filled and a “0” denotes a vacancy in that position.  
The control flip-flop detects the state of the preceding  
flip-flop and communicates its own status to the  
FEATURES  
Independent asynchronous inputs and outputs  
Expandable in either direction  
Reset capability  
Status indicators on inputs and outputs  
3-state outputs  
succeeding flip-flop. When a control flip-flop is in the “0”  
state and sees a “1” in the preceding flip-flop, it generates  
a clock pulse that transfers data from the preceding four  
data latches into its own four data latches and resets the  
preceding flip-flop to “0”. The first and last control flip-flops  
have buffered outputs. Since all empty locations “bubble”  
automatically to the input end, and all valid data ripples  
through to the output end, the status of the first control  
flip-flop (data-in ready output - DIR) indicates if the FIFO is  
full, and the status of the last flip-flop (data-out ready  
output - DOR) indicates if the FIFO contains data. As the  
earliest data is removed from the bottom of the data stack  
(output end), all data entered later will automatically ripple  
toward the output.  
Output capability: standard  
ICC category: MSI  
GENERAL DESCRIPTION  
The 74HC/HCT40105 are high-speed Si-gate CMOS  
devices and are pin compatible with the “40105” of the  
“4000B” series. They are specified in compliance with  
JEDEC standard no. 7A.  
The 74HC/HCT40105 are first-in/first-out (FIFO) “elastic”  
storage registers that can store sixteen 4-bit words. The  
“40105” is capable of handling input and output data at  
QUICK REFERENCE DATA  
GND = 0 V; Tamb = 25 °C; tr = tf = 6 ns  
TYP.  
SYMBOL  
PARAMETER  
propagation delay  
CONDITIONS  
UNIT  
HC  
HCT  
t
PHL/ tPLH  
CL = 15 pF; VCC = 5 V  
MR to DIR, DOR  
SO to Qn  
16  
37  
15  
ns  
35  
ns  
tPHL  
propagation delay  
SI to DIR  
16  
17  
33  
18  
ns  
SO to DOR  
18  
ns  
fmax  
CI  
maximum clock frequency  
input capacitance  
31  
MHz  
pF  
3.5  
3.5  
145  
CPD  
power dissipation capacitance per package notes 1 and 2  
134  
pF  
Notes  
1. CPD is used to determine the dynamic power dissipation (PD in µW):  
PD = CPD × VCC2 × fi + ∑ (CL × VCC2 × fo) where:  
fi = input frequency in MHz.  
fo = output frequency in MHz.  
(CL × VCC2 × fo) = sum of outputs  
CL = output load capacitance in pF  
VCC = supply voltage in V  
2. For HC the condition is VI = GND to VCC  
For HCT the condition is VI = GND to VCC 1.5  
1998 Jan 23  
2
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
ORDERING INFORMATION  
PACKAGE  
TYPE NUMBER  
NAME  
DESCRIPTION  
VERSION  
74HC(T)40105N  
74HC(T)40105D  
74HC(T)40105DB  
DIP16  
SO16  
plastic dual in-line package; 16 leads (300 mil); long body  
plastic small outline package; 16 leads; body width 3.9 mm  
SOT38-1  
SOT109-1  
SOT338-1  
SSOP16 plastic shrink small outline package; 16 leads; body width 5.3 mm  
74HC(T)40105PW TSSOP16 plastic thin shrink small outline package; 16 leads; body width 4.4 mm SOT403-1  
PIN DESCRIPTION  
PIN NO.  
SYMBOL  
NAME AND FUNCTION  
1
OE  
output enable input (active LOW)  
data-in ready output  
2
DIR  
3
SI  
shift-in input (LOW-to-HIGH, edge-triggered)  
parallel data inputs  
4, 5, 6, 7  
D0 to D3  
GND  
MR  
8
ground (0 V)  
9
asynchronous master reset input (active HIGH)  
3-state data outputs  
13, 12, 11, 10  
Q0 to Q3  
DOR  
SO  
14  
15  
16  
data-out ready output  
shift-out input (HIGH-to-LOW, edge-triggered)  
positive supply voltage  
VCC  
Fig.1 Pin configuration.  
Fig.2 Logic symbol.  
Fig.3 IEC logic symbol.  
1998 Jan 23  
3
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
LOW in order to complete the shift-in  
process.  
INPUT AND OUTPUTS  
Data inputs (D0 to D3)  
Shift-in control (SI)  
Data is loaded into the input stage on  
a LOW-to-HIGH transition of SI.  
It also triggers an automatic data  
transfer process (ripple through). If SI  
is held HIGH during reset, data will be  
loaded at the falling edge of the MR  
signal.  
With the FIFO full, SI can be held  
HIGH until a shift-out (SO) pulse  
occurs. Then, following a shift-out of  
data, an empty location appears at  
the FIFO input and DIR goes HIGH to  
allow the next data to be shifted-in.  
This remains at the first FIFO location  
until SI goes LOW (see Fig.7).  
As there is no weighting of the inputs,  
any input can be assigned as the  
MSB. The size of the FIFO memory  
can be reduced from the 4 × 16  
configuration, i.e. 3 × 16, down to  
1 × 16, by tying unused data input  
pins to VCC or GND.  
Shift-out control (SO)  
A HIGH-to-LOW transition of  
SO causes the DOR flags to go LOW.  
A HIGH-to-LOW transition of  
SO causes upstream data to move  
into the output stage, and empty  
locations to move towards the input  
stage (bubble-up).  
Data outputs (Q0 to Q3)  
Data transfer  
As there is no weighting of the  
outputs, any output can be assigned  
as the MSB. The size of the FIFO  
memory can be reduced from the  
4 × 16 configuration as described for  
data inputs. In a reduced format, the  
unused data outputs pins must be left  
open circuit.  
After data has been transferred from  
the input stage of the FIFO following  
SI = LOW, data moves through the  
FIFO asynchronously and is stacked  
at the output end of the register.  
Empty locations appear at the input  
end of the FIFO as data moves  
through the device.  
Output enable (OE)  
The outputs Q0 to Q3 are enabled  
when OE = LOW. When OE = HIGH  
the outputs are in the high impedance  
OFF-state.  
Master-reset (MR)  
Data output  
When MR is HIGH, the control  
The data-out-ready flag  
functions within the FIFO are cleared,  
and date content is declared invalid.  
The data-in ready (DIR) flag is set  
HIGH and the data-out-ready (DOR)  
flag is set LOW. The output stage  
remains in the state of the last word  
that was shifted out, or in the random  
state existing at power-up.  
(DOR = HIGH) indicates that there is  
valid data at the output (Q0 to Q3).  
The initial master-reset at power-on  
(MR = HIGH) sets DOR to LOW (see  
Fig.8). After MR = LOW, data shifted  
into the FIFO moves through to the  
output stage causing DOR to go  
HIGH.  
FUNCTIONAL DESCRIPTION  
Data input  
Following power-up, the master-reset  
(MR) input is pulsed HIGH to clear the  
FIFO memory (see Fig.8). The  
data-in-ready flag (DIR = HIGH)  
indicates that the FIFO input stage is  
empty and ready to receive data.  
When DIR is valid (HIGH), data  
present at D0 to D3 can be shifted-in  
using the SI control input.  
As the DOR flag goes HIGH, data can  
be shifted-out using the SO = HIGH,  
data in the output stage is shifted out  
and a busy indication is given by DOR  
going LOW. When SO is made LOW,  
data moves through the FIFO to fill  
the output stage and an empty  
location appears at the input stage.  
When the output stage is filled DOR  
goes HIGH, but if the last of the valid  
data has been shifted-out leaving the  
FIFO empty the DOR flag remains  
LOW (see Fig.9). With the FIFO  
empty, the last word that was  
Status flag outputs (DIR, DOR)  
Indication of the status of the FIFO is  
given by two status flags,  
data-in-ready (DIR) and  
data-out-ready (DOR):  
With SI = HIGH, data is shifted into  
the input stage and a busy indication  
is given by DIR going LOW.  
DIR = HIGH indicates the input stage  
is empty and ready to accept valid  
data;  
The data remains at the first location  
in the FIFO until DIR is set to HIGH  
and data moves through the FIFO to  
the output stage, or to the last empty  
location. If the FIFO is not full after the  
SI pulse, DIR again becomes valid  
(HIGH) to indicate that space is  
available in the FIFO. The DIR flag  
remains LOW if the FIFO is full (see  
Fig.6). The SI use must be made  
DIR = LOW indicates that the FIFO is  
full or that a previous shift-in  
operation is not complete (busy);  
DOR = HIGH assures valid data is  
present at the outputs Q0 to Q3 (does  
not indicate that new data is awaiting  
transfer into the output stage);  
shifted-out is latched at the output  
Q0 to Q3.  
With the FIFO empty, the SO input  
can be held HIGH until the SI control  
input is used. Following an SI pulse,  
DOR = LOW indicates the output  
stage is busy or there is no valid data.  
1998 Jan 23  
4
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
data moves through the FIFO to the  
output stage, resulting in the DOR  
flag pulsing HIGH and a shift-out of  
data occurring. The SO control must  
be made LOW before additional data  
can be shifted-out (see Fig.10).  
pulses can be applied without regard  
Due to the part-to-part spread of the  
ripple through time, the SI signals of  
FIFOA and FIFOB will not always  
coincide and the AND-gate will not  
produce a composite flag signal. The  
solution is given in Fig.18.  
to the status flags but shift-in pulses  
that would overflow the storage  
capacity of the FIFO are not allowed  
(see Figs 11 and 12).  
Expanded format  
The “40105” is easily cascaded to  
increase the word capacity and no  
external components are needed. In  
the cascaded configuration, all  
necessary communications and  
timing are performed by the FIFOs.  
The intercommunication speed is  
determined by the minimum flag  
pulse widths and the flag delays. The  
data rate of cascaded devices is  
typically 25 MHz. Word-capacity can  
be expanded to and beyond 32-words  
× 4-bits (see Fig.19).  
High-speed burst mode  
With the addition of a logic gate, the  
FIFO is easily expanded to increase  
word length (see Fig.17). The basic  
operation and timing are identical to a  
single FIFO, with the exception of an  
additional gate delay on the flag  
outputs. If during application, the  
following occurs:  
If it is assumed that the  
shift-in/shift-out pulses are not  
applied until the respective status  
flags are valid, it follows that the  
shift-in/shift-out rates are determined  
by the status flags. However, without  
the status flags a high-speed burst  
mode can be implemented. In this  
mode, the burst-in/ burst-out rates are  
determined by the pulse widths of the  
shift-in/shift-out inputs and burst rates  
of 35 MHz can be obtained. Shift  
SI is held HIGH when the FIFO is  
empty, some additional logic is  
required to produce a composite  
DIR pulse (see Figs 7 and 18).  
1998 Jan 23  
5
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Fig.4 Functional diagram.  
(see control flip-flops)  
(1) LOW on S input of FF1, and FF5 will set Q output to HIGH independent of state on R input.  
(2) LOW on R input of FF2, FF3 and FF4 will set Q output to LOW independent of state on S input.  
Fig.5 Logic diagram.  
1998 Jan 23  
6
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
DC CHARACTERISTICS FOR 74HC  
For the DC characteristics see “74HC/HCT/HCU/HCMOS Logic Family Specifications”.  
Output capability: standard  
ICC category: MSI  
AC CHARACTERISTICS FOR 74HC  
GND = 0 V; tf = tf = 6 ns; CL = 50 pF  
Tamb (°C)  
TEST CONDITIONS  
74HC  
SYMBOL PARAMETER  
UNIT  
ns  
WAVEFORMS  
VCC  
(V)  
+25  
40 to +85 40 to +125  
min. typ. max. min. max. min. max.  
tPHL/ tPLH propagation delay  
MR to DIR, DOR  
52  
19  
15  
52  
19  
15  
55  
20  
16  
175  
35  
220  
44  
265  
53  
2.0 Fig.8  
4.5  
30  
37  
45  
6.0  
tPHL  
propagation delay  
SI to DIR  
210  
42  
265  
53  
315  
63  
ns  
2.0 Fig.6  
4.5  
36  
45  
54  
6.0  
tPHL  
propagation delay  
SO to DOR  
210  
42  
265  
53  
315  
63  
ns  
2.0 Fig.9  
4.5  
36  
45  
54  
6.0  
t
PHL/ tPLH propagation delay  
116 400  
500  
100  
85  
600  
120  
102  
ns  
2.0 Fig.14  
4.5  
SO to Qn  
42  
34  
80  
68  
6.0  
tPLH  
propagation delay/  
ripple through delay  
SI to DOR  
564 2000  
205 400  
165 340  
701 2500  
255 500  
204 425  
2500  
500  
425  
3125  
625  
532  
190  
38  
3000 ns  
600  
2.0 Fig.10  
4.5  
510  
6.0  
tPLH  
propagation delay/  
bubble-up delay  
SO to DIR  
3750 ns  
750  
2.0 Fig.7  
4.5  
638  
6.0  
t
t
t
PZH/ tPZL 3-state output enable time  
41  
15  
12  
41  
15  
12  
19  
7
150  
30  
225  
45  
ns  
ns  
ns  
ns  
2.0 Fig.16  
4.5  
OE to Qn  
26  
33  
38  
6.0  
PHZ/ tPLZ 3-state output disable  
140  
28  
175  
35  
210  
42  
2.0 Fig.16  
4.5  
time  
OE to Qn  
24  
30  
36  
6.0  
THL/ tTLH output transition time  
75  
95  
110  
22  
2.0 Fig.14  
4.5  
15  
19  
6
13  
16  
19  
6.0  
tW  
SI pulse width  
HIGH or LOW  
80  
16  
14  
19  
7
100  
20  
120  
24  
2.0 Fig.6  
4.5  
6
17  
20  
6.0  
1998 Jan 23  
7
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Tamb (°C)  
TEST CONDITIONS  
74HC  
SYMBOL PARAMETER  
UNIT  
ns  
WAVEFORMS  
VCC  
(V)  
+25  
40 to +85 40 to +125  
min. typ. max. min. max. min. max.  
tW  
SO pulse width  
HIGH or LOW  
120 39  
150  
30  
26  
10  
5
180  
36  
2.0 Fig.9  
4.5  
24  
20  
12  
6
14  
11  
58  
21  
17  
55  
20  
16  
22  
8
31  
6.0  
tW  
DIR pulse width  
HIGH  
180  
36  
225 10  
270  
54  
ns  
2.0 Fig.7  
4.5  
45  
38  
5
4
5
31  
4
46  
6.0  
tW  
DOR pulse width  
LOW  
12  
6
170  
34  
10  
5
215 10  
255  
51  
ns  
2.0 Fig.9  
4.5  
43  
37  
5
5
29  
4
4
43  
6.0  
tW  
MR pulse width  
HIGH  
80  
16  
14  
50  
10  
9
100  
20  
17  
65  
13  
11  
5  
5  
5  
155  
31  
26  
2.8  
14  
16  
120  
24  
20  
75  
15  
13  
5  
5  
5  
190  
38  
32  
2.4  
12  
14  
ns  
2.0 Fig.8  
4.5  
6
6.0  
trem  
tsu  
th  
removal time  
MR to SI  
14  
5
ns  
2.0 Fig.15  
4.5  
4
6.0  
set-up time  
Dn to SI  
5  
5  
5  
39  
14  
11  
ns  
2.0 Fig.13  
4.5  
6.0  
hold time  
Dn to SI  
125 44  
ns  
2.0 Fig.13  
4.5  
25  
21  
3.6  
18  
21  
16  
13  
10  
30  
36  
6.0  
fmax  
maximum pulse  
frequency  
MHz 2.0 Fig.6, 9, 11  
and 12  
4.5  
SI, SO using flags or  
burst mode  
6.0  
fmax  
maximum pulse  
frequency  
SI, SO cascaded  
3.6  
18  
21  
10  
30  
36  
2.8  
14  
16  
2.4  
12  
14  
MHz 2.0 Figs 6 and 9  
4.5  
6.0  
1998 Jan 23  
8
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
DC CHARACTERISTICS FOR 74HCT  
For the DC characteristics see “74HC/HCT/HCU/HCMOS Logic Family Specifications”.  
Output capability: standard  
ICC category: MSI  
Note to HCT types  
The value of additional quiescent supply current (ICC) for a unit load of 1 is given in the family specifications.  
To determine ICC per input, multiply this value by the unit load coefficient shown in the table below.  
INPUT  
UNIT LOAD COEFFICIENT  
OE  
SI  
0.75  
0.40  
0.30  
1.50  
0.40  
Dn  
MR  
SO  
AC CHARACTERISTICS FOR 74HCT  
GND = 0 V; tf = tf = 6 ns; CL = 50 pF  
Tamb (°C)  
TEST CONDITIONS  
74HCT  
SYMBOL PARAMETER  
UNIT  
WAVEFORMS  
VCC  
+25  
40 to +85 40 to +125  
(V)  
min. typ. max. min. max. min. max.  
tPHL/ tPLH propagation delay  
MR to DIR, DOR  
18  
21  
20  
40  
35  
42  
42  
80  
44  
53  
ns  
ns  
ns  
ns  
ns  
4.5 Fig.8  
4.5 Fig.6  
4.5 Fig.9  
4.5 Fig.14  
4.5 Fig.10  
tPHL  
propagation delay  
SI to DIR  
53  
63  
tPHL  
propagation delay  
SO to DOR  
53  
63  
tPHL/ tPLH propagation delay  
SO to Qn  
100  
500  
120  
600  
tPLH  
propagation delay/  
ripple through delay  
SI to DOR  
188 400  
244 500  
tPLH  
propagation delay/  
bubble-up delay  
SO to DIR  
625  
750  
ns  
4.5 Fig.7  
t
PZH/ tPZL 3-state output enable time  
OE to Qn  
18  
15  
35  
30  
44  
38  
53  
45  
ns  
ns  
4.5 Fig.16  
4.5 Fig.16  
tPHZ/ tPLZ 3-state output disable  
time  
OE to Qn  
tTHL/ tTLH output transition time  
7
15  
19  
22  
ns  
4.5 Fig.14  
1998 Jan 23  
9
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Tamb (°C)  
TEST CONDITIONS  
74HCT  
SYMBOL PARAMETER  
UNIT  
WAVEFORMS  
VCC  
(V)  
+25  
40 to +85 40 to +125  
min. typ. max. min. max. min. max.  
tW  
SI pulse width  
HIGH or LOW  
16  
16  
6
6
20  
20  
5
24  
24  
5
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
4.5 Fig.6  
4.5 Fig.9  
4.5 Fig.7  
4.5 Fig.9  
4.5 Fig.8  
4.5 Fig.15  
4.5 Fig.13  
4.5 Fig.13  
tW  
SO pulse width  
HIGH or LOW  
7
tW  
DIR pulse width  
HIGH or LOW  
20  
19  
7
34  
34  
43  
43  
51  
51  
tW  
DOR pulse width  
HIGH or LOW  
6
5
5
tW  
MR pulse width  
HIGH  
16  
15  
5  
27  
20  
19  
4  
34  
12  
24  
22  
4  
41  
10  
trem  
tsu  
th  
removal time  
MR to SI  
7
set-up time  
Dn to SI  
14  
16  
28  
hold time  
Dn to SI  
fmax  
maximum pulse frequency  
SI, SO using flags or  
burst mode  
MHz 4.5 Fig.6, 9, 11 and  
12  
fmax  
maximum pulse frequency  
SI, SO cascaded  
28  
12  
10  
MHz 4.5 Figs 6 and 9  
1998 Jan 23  
10  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
AC WAVEFORMS  
Shifting in sequence FIFO empty to FIFO full  
Notes to Fig.6  
1. DIR initially HIGH; FIFO is  
prepared for valid data.  
2. SI set HIGH; data loaded into  
input stage.  
3. DIR drops LOW, input stage  
“busy”.  
4. DIR goes HIGH, status flag  
indicates FIFO prepared for  
additional data; data from first  
location “ripple through”.  
5. SI set LOW; necessary to  
complete shift-in process.  
6. Repeat process to load 2nd word  
through to 16th word into FIFO.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
7. DIR remains LOW: with attempt  
to shift into full FIFO, no data  
transfer occurs.  
Fig.6 Waveforms showing the SI input to DIR output propagation  
delay. The SI pulse width and SI maximum pulse frequency.  
With FIFO full; SI held HIGH in anticipation of empty location  
Notes to Fig.7  
1. FIFO is initially, shift-in is held  
HIGH.  
2. SO pulse; data in the output  
stage is unloaded, “bubble-up  
process of empty locations  
begins”.  
3. DIR HIGH; when empty location  
reached input stage, flag  
indicates FIFO is prepared for  
data input.  
4. DIR returns to LOW; FIFO is full  
again.  
5. SI brought LOW; necessary to  
complete whidt-in process, DIR  
remains LOW, because FIFO is  
full.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.7 Waveforms showing bubble-up delay, SO input to DIR output  
and DIR output pulse width.  
1998 Jan 23  
11  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Master reset applied with FIFO full  
Notes to Fig.8  
1. DIR LOW, output ready HIGH;  
assume FIFO is full.  
2. MR pulse HIGH; clears FIFO.  
3. DIR goes HIGH; flag indicates  
input prepared for valid data.  
4. DOR drops LOW; flag indicates  
FIFO empty.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.8 Waveforms showing the MR input to DIR, DOR output  
propagation delays and the MR pulse width.  
Shifting out sequence; FIFO full to FIFO empty  
Notes to Fig.9  
1. DOR HIGH; no data transfer in  
progress, valid data is present at  
output stage.  
2. SO set HIGH.  
3. SO is set LOW; data in the input  
stage is unloaded, and new data  
replaces it as empty location  
“bubbles-up” to input stage.  
4. DOR drops LOW; output stage  
“busy”.  
5. DOR goes HIGH; transfer  
process completed, valid data  
present at output after the  
specified propagation delay.  
6. Repeat process to unloaded the  
3rd through to the 16th word from  
FIFO.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
7. DOR remains LOW; FIFO is  
empty.  
Fig.9 Waveforms showing the SO input to DIR output propagation  
delay. The SO pulse width and SO maximum pulse frequency.  
1998 Jan 23  
12  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
With FIFO empty; SO is held HIGH in anticipation  
Notes to Fig.10  
1. FIFO is initially empty, SO is held  
HIGH.  
(1)  
SI INPUT  
2
V
M
2. SI pulse; loads data into FIFO  
and initiates ripple through  
process.  
(1)  
SO INPUT  
1
V
M
5
3. DOR flag signals the arrival of  
valid data at the output stage.  
t
t
PHL  
6
PLH  
4. Output transition; data arrives at  
output stage after the specified  
propagation delay between the  
rising edge of the DOR pulse to  
the Qn output.  
ripple through  
delay  
(1)  
t
DOR OUTPUT  
V
M
4
/ t  
PHL PLH  
Q
OUTPUT  
3
n
5. SO set LOW; necessary to  
complete shift-out process. DOR  
remains LOW, because FIFO is  
empty.  
MBA337  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
6. DOR goes LOW; FIFO is empty  
again.  
Fig.10 Waveforms showing ripple through delay SI input to DOR output  
and propagation delay from the DOR pulse to the Qn output.  
Shift-in operation; high-speed burst mode  
Note to Fig.11  
In the high-speed mode, the burst-in  
rate is determined by the minimum  
shift-in HIGH and shift-in LOW  
specifications. The DIR status flag is  
a don’t care condition, and a shift-in  
pulse can be applied regardless of the  
flag. A SI pulse which would overflow  
the storage capacity of the FIFO is  
ignored.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.11 Waveforms showing SI minimum pulse width and SI maximum  
pulse frequency, in high-speed shift-in burst mode.  
1998 Jan 23  
13  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Shift-out operation; high-speed burst mode  
In the high-speed mode, the burst-out rate is determined by the  
minimum shift-out HIGH and shift-out LOW specifications. The  
DOR flag is a don’t care condition and a SO pulse can be applied  
without regard to the flag.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.12 Waveforms showing SO minimum pulse width and maximum pulse frequency, in high-speed shift-out  
burst mode.  
The shaded areas indicate when the input is permitted  
to change for predictable output performance.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.13 Waveforms showing hold and set up times for Dn input to SI input.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.14 Waveforms showing SO input to Qn output propagation delays and output transition time.  
1998 Jan 23  
14  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
handbook, halfpage  
MR INPUT  
(1)  
V
M
t
rem  
(1)  
V
SI INPUT  
M
MBA332  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.15 Waveforms showing the MR input to SI input removal time.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.16 Waveforms showing the 3-state enable and disable times for input OE.  
1998 Jan 23  
15  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
APPLICATION INFORMATION  
The PC74HC/HCT40105 is easily expanded to  
increase word length. Composite DIR and DOR  
flags are formed with the addition of an AND  
gate. The basic operation and timing are  
identical to a single FIFO, with the exception of  
an added gate delay on the flags.  
Fig.17 Expanded FIFO for increased word length; 16 words × 8 bits.  
This circuit is only required if the SI input is constantly held HIGH, when the FIFO is empty and the automatic shift-in cycles are started (see Fig.7).  
Fig.18 Expanded FIFO for increased word length.  
1998 Jan 23  
16  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Expanded format  
Fig.19 shows two cascaded FIFOs providing a capacity of 32 words × 4 bits  
Fig.20 shows the signals on the nodes of both FIFOs after the application of a SI pulse, when both FIFOs are initially  
empty. After a rippled through delay, date arrives at the output of FIFOA. Due to SOA being HIGH, a DOR pulse is  
generated. The requirements of SIB and DnB are satisfied by the DORA pulse width and the timing between the rising  
edge of DORA and QnA. After a second ripple through delay, data arrives at the output of FIFOB.  
Fig.21 shows the signals on the nodes of both FIFOs after the application of a SOR pulse, when both FIFOs are initially  
full. After a bubble-up delay a DIRR pulse is generated, which acts as a SOA pulse for FIFOA. One word is transferred  
from the output of FIFOA to the input of FIFOB. The requirements of the SOA pulse for FIFOA is satisfied by the pulse  
width of DORB. After a second bubble-up delay an empty space arrives at DnA, at which time DIRA goes HIGH.  
Fig.22 shows the waveforms at all external nodes of both FIFOs during a complete shift-in and shift-out sequence.  
The PC7HC/HCT40105 is easily cascaded to increase word capacity without any external circuitry. In cascaded format, all necessary  
communications are handled by the FIFOs. Figs 17 and 19 demonstrate the intercommunication timing between FIFOA and FIFOB. Fig.22 gives an  
overview of pulse and timing of two cascaded FIFOs, when shifted full and shifted empty again.  
Fig.19 Cascading for increased word capacity; 32 words × 4 bits.  
1998 Jan 23  
17  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Notes to Fig.20  
1. FIFOA and FIFOB initially empty, SOA held  
HIGH in anticipation of data.  
2. Load one word into FIFOA; SI pulse applied,  
results in DIR pulse.  
3. Data out A/data in B transition; valid data  
arrives at FIFOA output stage after a specified  
delay of the DOR flag, meeting data input  
set-up requirements of FIFOB.  
4. DORA and SIB pulse HIGH; (ripple through  
delay after SIA LOW) data is unloaded from  
FIFOA as a result of the data output ready  
pulse, data is shifted into FIFOB.  
5. DIRB and SOA go LOW; flag indicates input  
stage of FIFOB is busy, shift-out of FIFOA is  
complete.  
6. DIRB and SOA go HIGH automatically; the  
input stage of FIFOB is again able to receive  
data, SO is held HIGH in anticipation of  
additional data.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
7. DORB goes HIGH; (ripple through delay after  
SIB LOW) valid data is present one  
propagation delay later at the FIFOB output  
stage.  
Fig.20 FIFO to FIFO communication; input timing under  
empty condition.  
Notes to Fig.21  
1. FIFOA and FIFOB initially empty, SIB held  
HIGH in anticipation of shifting in new data as  
empty location bubbles-up.  
2. Unload one word into FIFOB; SO pulse  
applied, results in DOR pulse.  
3. DIRB and SOA pulse HIGH; (bubble-up delay  
after SOB LOW) data is loaded into FIFOB as  
a result of the DIR pulse, data is shifted out of  
FIFOA.  
4. DORA and SIB go LOW; flag indicates the  
output stage of FIFOA is busy, shift-in to  
FIFOR is complete.  
5. DORA and SIB go HIGH; flag indicates valid  
data is again available at FIFOA output stage,  
SIB is held HIGH, awaiting bubble-up of  
empty location.  
6. DIRA goes HIGH; (bubble-up delay after  
SOA LOW) an empty location is present at  
input stage of FIFOA.  
(1) HC : VM = 50%; VI = GND to VCC  
.
HCT : VM = 1.3 V; VI = GND to 3 V.  
Fig.21 FIFO to FIFO communication; output timing under  
full condition.  
1998 Jan 23  
18  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Fig.22 Waveforms  
showing the  
functionally and  
inter-  
communication  
between two  
FIFOs  
(refer to Fig.19).  
Note to Fig.22  
Sequence 4 (Both FIFOs full, starting shift-out process):  
SIA is held HIGH and two SOB pulses are applied (8).  
These pulses shift out two words and thus allow empty  
locations to bubble-up to the input stage of FIFOB, and  
proceed to FIFOA (9). When the first empty location arrives  
at the input of FIFOA, a DIRA pulse is generated (10) and  
a new word is shifted into FIFOA. SIA is made LOW and  
now the second empty location reaches the input stage of  
FIFOA, after which DIRA remains HIGH (11).  
Sequence 1 (Both FIFOs empty, starting shift-in process):  
After a MR pulse has been applied FIFOA and FIFOB are  
empty. The DOR flags of FIFOA and FIFOB go LOW due  
to no valid data being present at the outputs. The DIR flags  
are set HIGH due to the FIFOs being ready to accept data.  
SOB is held HIGH and two SIA pulses are applied (1).  
These pulses allow two data words to ripple through to the  
output stage of FIFOA and to the input stage of FIFOB (2).  
When data arrives at the output of FIFOB, a DORB pulse is  
generated (3). When SOB goes LOW, the first bit is shifted  
out and a second bit ripples through to the output after  
which DORB goes HIGH (4).  
Sequence 5 (FIFOA runs empty):  
At the start of sequence 5 FIFOA contains 15 valid words  
due to two words being shifted out and one word being  
shifted in sequence 4. An additional series of SOB pulses  
are applied. After 15 SOB pulses, all words from FIFOA are  
shifted into FIFOB. DORA remains LOW (12).  
Sequence 2 (FIFOB runs full):  
After the MR pulse, a series of 16 SI pulses are applied.  
When 16 words are shifted in, DIRB remains LOW due to  
FIFOB being full (5). DORA goes LOW due to FIFOA being  
empty.  
Sequence 6 (FIFOB runs empty):  
After the next SOB pulse, DIRB remains HIGH due to the  
input stage of FIFOB being empty (13). After another 15  
SOB pulses, DORB remains LOW due to both FIFOs being  
empty (14). Additional SOB pulses have no effect. The last  
word remains available at the output Qn.  
Sequence 3 (FIFOA runs full):  
When 17 words are shifted in, DORA remains HIGH due to  
valid data remaining at the output of FIFOA. QnA remains  
HIGH, being the polarity of the 17th data word (6). After the  
32th SI pulse, DIR remains LOW and both FIFOs are full  
(7). Additional pulses have no effect.  
1998 Jan 23  
19  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
PACKAGE OUTLINES  
DIP16: plastic dual in-line package; 16 leads (300 mil); long body  
SOT38-1  
D
M
E
A
2
A
A
1
L
c
e
w M  
Z
b
1
(e )  
1
b
16  
9
M
H
pin 1 index  
E
1
8
0
5
10 mm  
scale  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
(1)  
A
A
A
2
(1)  
(1)  
Z
1
w
UNIT  
mm  
b
b
c
D
E
e
e
L
M
M
H
1
1
E
max.  
max.  
min.  
max.  
1.40  
1.14  
0.53  
0.38  
0.32  
0.23  
21.8  
21.4  
6.48  
6.20  
3.9  
3.4  
8.25  
7.80  
9.5  
8.3  
4.7  
0.51  
3.7  
2.54  
0.10  
7.62  
0.30  
0.254  
0.01  
2.2  
0.021  
0.015  
0.013  
0.009  
0.86  
0.84  
0.32  
0.31  
0.055  
0.045  
0.26  
0.24  
0.15  
0.13  
0.37  
0.33  
inches  
0.19  
0.020  
0.15  
0.087  
Note  
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
92-10-02  
95-01-19  
SOT38-1  
050G09  
MO-001AE  
1998 Jan 23  
20  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
SO16: plastic small outline package; 16 leads; body width 3.9 mm  
SOT109-1  
D
E
A
X
c
y
H
v
M
A
E
Z
16  
9
Q
A
2
A
(A )  
3
A
1
pin 1 index  
θ
L
p
L
1
8
e
w
M
detail X  
b
p
0
2.5  
scale  
5 mm  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
A
(1)  
(1)  
(1)  
UNIT  
A
A
A
b
c
D
E
e
H
L
L
p
Q
v
w
y
Z
θ
1
2
3
p
E
max.  
0.25  
0.10  
1.45  
1.25  
0.49  
0.36  
0.25  
0.19  
10.0  
9.8  
4.0  
3.8  
6.2  
5.8  
1.0  
0.4  
0.7  
0.6  
0.7  
0.3  
mm  
1.27  
0.050  
1.05  
0.041  
1.75  
0.25  
0.01  
0.25  
0.01  
0.25  
0.1  
8o  
0o  
0.010 0.057  
0.004 0.049  
0.019 0.0100 0.39  
0.014 0.0075 0.38  
0.16  
0.15  
0.244  
0.228  
0.039 0.028  
0.016 0.020  
0.028  
0.012  
inches  
0.069  
0.01 0.004  
Note  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
95-01-23  
97-05-22  
SOT109-1  
076E07S  
MS-012AC  
1998 Jan 23  
21  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
SSOP16: plastic shrink small outline package; 16 leads; body width 5.3 mm  
SOT338-1  
D
E
A
X
c
y
H
v
M
A
E
Z
9
16  
Q
A
2
A
(A )  
3
A
1
pin 1 index  
θ
L
p
L
8
1
detail X  
w M  
b
p
e
0
2.5  
5 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
(1)  
(1)  
(1)  
UNIT  
A
A
A
b
c
D
E
e
H
L
L
Q
v
w
y
Z
θ
p
p
1
2
3
E
max.  
8o  
0o  
0.21  
0.05  
1.80  
1.65  
0.38  
0.25  
0.20  
0.09  
6.4  
6.0  
5.4  
5.2  
7.9  
7.6  
1.03  
0.63  
0.9  
0.7  
1.00  
0.55  
mm  
2.0  
0.25  
0.65  
1.25  
0.2  
0.13  
0.1  
Note  
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
94-01-14  
95-02-04  
SOT338-1  
MO-150AC  
1998 Jan 23  
22  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
TSSOP16: plastic thin shrink small outline package; 16 leads; body width 4.4 mm  
SOT403-1  
D
E
A
X
c
y
H
v
M
A
E
Z
9
16  
Q
(A )  
3
A
2
A
A
1
pin 1 index  
θ
L
p
L
1
8
detail X  
w
M
b
p
e
0
2.5  
5 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
(1)  
(2)  
(1)  
UNIT  
A
A
A
b
c
D
E
e
H
L
L
Q
v
w
y
Z
θ
1
2
3
p
E
p
max.  
8o  
0o  
0.15  
0.05  
0.95  
0.80  
0.30  
0.19  
0.2  
0.1  
5.1  
4.9  
4.5  
4.3  
6.6  
6.2  
0.75  
0.50  
0.4  
0.3  
0.40  
0.06  
mm  
1.10  
0.65  
0.25  
1.0  
0.2  
0.13  
0.1  
Notes  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
2. Plastic interlead protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
94-07-12  
95-04-04  
SOT403-1  
MO-153  
1998 Jan 23  
23  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
Typical reflow temperatures range from 215 to 250 °C.  
Preheating is necessary to dry the paste and evaporate  
the binding agent. Preheating duration: 45 minutes at  
45 °C.  
SOLDERING  
Introduction  
There is no soldering method that is ideal for all IC  
packages. Wave soldering is often preferred when  
through-hole and surface mounted components are mixed  
on one printed-circuit board. However, wave soldering is  
not always suitable for surface mounted ICs, or for  
printed-circuits with high population densities. In these  
situations reflow soldering is often used.  
WAVE SOLDERING  
Wave soldering can be used for all SO packages. Wave  
soldering is not recommended for SSOP and TSSOP  
packages, because of the likelihood of solder bridging due  
to closely-spaced leads and the possibility of incomplete  
solder penetration in multi-lead devices.  
This text gives a very brief insight to a complex technology.  
A more in-depth account of soldering ICs can be found in  
our “IC Package Databook” (order code 9398 652 90011).  
If wave soldering is used - and cannot be avoided for  
SSOP and TSSOP packages - the following conditions  
must be observed:  
DIP  
A double-wave (a turbulent wave with high upward  
pressure followed by a smooth laminar wave) soldering  
technique should be used.  
SOLDERING BY DIPPING OR BY WAVE  
The maximum permissible temperature of the solder is  
260 °C; solder at this temperature must not be in contact  
with the joint for more than 5 seconds. The total contact  
time of successive solder waves must not exceed  
5 seconds.  
The longitudinal axis of the package footprint must be  
parallel to the solder flow and must incorporate solder  
thieves at the downstream end.  
Even with these conditions:  
The device may be mounted up to the seating plane, but  
the temperature of the plastic body must not exceed the  
specified maximum storage temperature (Tstg max). If the  
printed-circuit board has been pre-heated, forced cooling  
may be necessary immediately after soldering to keep the  
temperature within the permissible limit.  
Only consider wave soldering SSOP packages that  
have a body width of 4.4 mm, that is  
SSOP16 (SOT369-1) or SSOP20 (SOT266-1).  
Do not consider wave soldering TSSOP packages  
with 48 leads or more, that is TSSOP48 (SOT362-1)  
and TSSOP56 (SOT364-1).  
REPAIRING SOLDERED JOINTS  
During placement and before soldering, the package must  
be fixed with a droplet of adhesive. The adhesive can be  
applied by screen printing, pin transfer or syringe  
dispensing. The package can be soldered after the  
adhesive is cured.  
Apply a low voltage soldering iron (less than 24 V) to the  
lead(s) of the package, below the seating plane or not  
more than 2 mm above it. If the temperature of the  
soldering iron bit is less than 300 °C it may remain in  
contact for up to 10 seconds. If the bit temperature is  
between 300 and 400 °C, contact may be up to 5 seconds.  
Maximum permissible solder temperature is 260 °C, and  
maximum duration of package immersion in solder is  
10 seconds, if cooled to less than 150 °C within  
6 seconds. Typical dwell time is 4 seconds at 250 °C.  
SO, SSOP and TSSOP  
A mildly-activated flux will eliminate the need for removal  
of corrosive residues in most applications.  
REFLOW SOLDERING  
Reflow soldering techniques are suitable for all SO, SSOP  
and TSSOP packages.  
REPAIRING SOLDERED JOINTS  
Reflow soldering requires solder paste (a suspension of  
fine solder particles, flux and binding agent) to be applied  
to the printed-circuit board by screen printing, stencilling or  
pressure-syringe dispensing before package placement.  
Fix the component by first soldering two diagonally-  
opposite end leads. Use only a low voltage soldering iron  
(less than 24 V) applied to the flat part of the lead. Contact  
time must be limited to 10 seconds at up to 300 °C. When  
using a dedicated tool, all other leads can be soldered in  
one operation within 2 to 5 seconds between  
270 and 320 °C.  
Several techniques exist for reflowing; for example,  
thermal conduction by heated belt. Dwell times vary  
between 50 and 300 seconds depending on heating  
method.  
1998 Jan 23  
24  
Philips Semiconductors  
Product specification  
4-bit x 16-word FIFO register  
74HC/HCT40105  
DEFINITIONS  
Data sheet status  
Objective specification  
Preliminary specification  
Product specification  
This data sheet contains target or goal specifications for product development.  
This data sheet contains preliminary data; supplementary data may be published later.  
This data sheet contains final product specifications.  
Limiting values  
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or  
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation  
of the device at these or at any other conditions above those given in the Characteristics sections of the specification  
is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices, or systems where malfunction of these  
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for  
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such  
improper use or sale.  
1998 Jan 23  
25  

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74HC40105D,653 NXP 74HC(T)40105 - 4-bit x 16-word FIFO register SOP 16-Pin 获取价格
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74HC40105DB NXP 4-bit x 16-word FIFO register 获取价格
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74HC40105DB-T NXP IC 16 X 4 OTHER FIFO, 600 ns, PDSO16, 5.30 MM, PLASTIC, MO-150AC, SOT-338-1, SSOP-16, FIFO 获取价格
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74HC40105N,652 NXP 74HC(T)40105 - 4-bit x 16-word FIFO register DIP 16-Pin 获取价格
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