74LV03D,112 [NXP]

74LV03 - Quad 2-input NAND gate SOIC 14-Pin;
74LV03D,112
型号: 74LV03D,112
厂家: NXP    NXP
描述:

74LV03 - Quad 2-input NAND gate SOIC 14-Pin

栅 光电二极管 逻辑集成电路 触发器
文件: 总7页 (文件大小:55K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
INTEGRATED CIRCUITS  
74LV03  
Quad 2-input NAND gate  
Product data  
2003 Mar 03  
Supersedes data of 1998 Apr 20  
Philips  
Semiconductors  
Philips Semiconductors  
Product data  
Quad 2-input NAND gate  
74LV03  
FEATURES  
Wide operating voltage: 1.0 V to 5.5 V  
Optimized for Low Voltage applications: 1.0 V to 3.6 V  
DESCRIPTION  
The 74LV03 is a low-voltage Si-gate CMOS device and is pin and  
function compatible with 74HC/HCT03.  
The 74LV03 provides the 2-input NAND function.  
Accepts TTL input levels between V = 2.7 V and V = 3.6 V  
CC  
CC  
The 74LV03 has open-drain N-transistor outputs, which are not  
Typical V  
(output ground bounce) < 0.8 V @ V = 3.3 V,  
clamped by a diode connected to V . In the OFF-state, i.e., when  
one input is LOW, the output may be pulled to any voltage between  
OLP  
CC  
CC  
T
= 25 °C  
amb  
GND and V  
. This allows the device to be used as a  
Omax  
Typical V  
(output V undershoot) > 2 V @ V = 3.3 V,  
OHV  
OH  
CC  
LOW-to-HIGH or HIGH-to-LOW level shifter. For digital operation  
and OR-tied output applications, these devices must have a pull-up  
resistor to establish a logic HIGH level.  
T
amb  
= 25 °C  
Level shifter capability  
Output capability: standard (open drain)  
I category: SSI  
CC  
QUICK REFERENCE DATA  
GND = 0 V; T  
= 25 °C; t =t 2.5 ns  
amb  
r f  
SYMBOL  
/t  
PARAMETER  
CONDITIONS  
TYPICAL  
UNIT  
Propagation delay  
nA, nB to nY  
C = 15 pF  
L
CC  
t
8
ns  
PZL PLZ  
V
= 3.3 V  
C
C
Input capacitance  
3.5  
4
pF  
pF  
I
Power dissipation capacitance per gate  
Notes 1, 2  
PD  
NOTES:  
1
C
is used to determine the dynamic power dissipation (P in µW)  
PD  
D
2
2
P
D
= C × V  
× f × N +Σ (C × V  
× f ) where:  
CC o  
PD  
CC  
i
L
N = the number of outputs switching;  
f = input frequency in MHz; C = output load capacitance in pF;  
i
L
f = output frequency in MHz; V = supply voltage in V;  
o
CC  
2
Σ (C × V  
× f ) = sum of the outputs.  
L
CC  
o
2
3
The condition is V = GND to V  
I CC  
The given value of C is obtained with : C = 0 pF and R = ∞  
PD  
L
L
ORDERING INFORMATION  
PACKAGES  
TEMPERATURE RANGE  
ORDER CODE  
PKG. DWG. #  
14-Pin Plastic SO  
–40 °C to +125 °C  
74LV03D  
SOT108-1  
PIN CONFIGURATION  
PIN DESCRIPTION  
PIN  
NUMBER  
SYMBOL  
FUNCTION  
1A  
1B  
1Y  
2A  
2B  
1
2
3
4
5
14  
V
CC  
1, 4, 9, 12  
2, 5, 10, 13  
3, 6, 8, 11  
7
1A to 4A  
1B to 4B  
1Y to 4Y  
GND  
Data inputs  
Data inputs  
13 4B  
12 4A  
11 4Y  
10 3B  
Data outputs  
Ground (0 V)  
14  
V
CC  
Positive supply voltage  
2Y  
6
7
9
8
3A  
3Y  
GND  
SV00354  
2
2003 Mar 03  
Philips Semiconductors  
Product data  
Quad 2-input NAND gate  
74LV03  
LOGIC SYMBOL  
LOGIC SYMBOL (IEEE/IEC)  
&
1
1A  
1B  
1
2
3
6
8
1Y  
2Y  
3Y  
4Y  
3
2
&
4
4
5
2A  
2B  
6
5
9
3A  
3B  
&
9
8
10  
10  
12  
13  
4A  
4B  
&
12  
11  
11  
13  
SV00356  
SV00355  
LOGIC DIAGRAM  
FUNCTION TABLE  
INPUTS  
OUTPUT  
Y
nA  
L
nB  
L
nY  
Z
A
B
L
H
L
Z
H
H
Z
H
L
NOTES:  
GND  
H = HIGH voltage level  
L = LOW voltage level  
Z = High impedance OFF-state  
SV00357  
70  
3
2003 Mar 03  
Philips Semiconductors  
Product data  
Quad 2-input NAND gate  
74LV03  
RECOMMENDED OPERATING CONDITIONS  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN  
1.0  
0
TYP.  
3.3  
MAX  
5.5  
UNIT  
V
CC  
DC supply voltage  
See Note1  
V
V
V
V
I
Input voltage  
V
CC  
CC  
V
O
Output voltage  
0
V
–40  
–40  
+85  
+125  
T
amb  
Operating ambient temperature range in free air See DC and AC characteristics  
°C  
V
CC  
V
CC  
V
CC  
V
CC  
= 1.0 V to 2.0 V  
= 2.0 V to 2.7 V  
= 2.7 V to 3.6 V  
= 3.6 V to 5.5 V  
500  
200  
100  
50  
ns/V  
t , t  
r
Input rise and fall times  
f
NOTES:  
1
The LV is guaranteed to function down to V = 1.0 V (input levels GND or V ); DC characteristics are guaranteed from V = 1.2 V to  
CC CC CC  
V
CC  
= 5.5 V.  
1, 2  
ABSOLUTE MAXIMUM RATINGS  
In accordance with the Absolute Maximum Rating System (IEC 134).  
Voltages are referenced to GND (ground = 0 V).  
SYMBOL  
PARAMETER  
DC supply voltage  
CONDITIONS  
RATING  
–0.5 to +7.0  
20  
UNIT  
V
V
CC  
±I  
IK  
DC input diode current  
DC output diode current  
V < –0.5 or V > V + 0.5 V  
mA  
mA  
I
I
CC  
±I  
OK  
V
O
< –0.5 or V > V + 0.5 V  
50  
O
CC  
DC output source or sink current  
– standard outputs  
±I  
O
–0.5V < V < V + 0.5 V  
mA  
O
CC  
25  
±I  
±I  
,
DC V or GND current for types with  
–standard outputs  
GND  
CC  
CC  
mA  
°C  
50  
T
Storage temperature range  
–65 to +150  
stg  
Power dissipation per package  
–plastic mini-pack (SO)  
for temperature range: –40 °C to +125 °C  
above +70 °C derate linearly with 8 mW/K  
P
TOT  
500  
mW  
NOTES:  
1
Stresses beyond those listed may cause permanent damage to the device. These are stress ratings only and functional operation of the  
device at these or any other conditions beyond those indicated under “recommended operating conditions” is not implied. Exposure to  
absolute-maximum-rated conditions for extended periods may affect device reliability.  
2
The input and output voltage ratings may be exceeded if the input and output current ratings are observed.  
4
2003 Mar 03  
Philips Semiconductors  
Product data  
Quad 2-input NAND gate  
74LV03  
DC CHARACTERISTICS  
Over recommended operating conditions voltages are referenced to GND (ground = 0 V)  
LIMITS  
MAX  
–40°C to +85°C  
–40°C to +125°C  
SYMBOL  
PARAMETER  
TEST CONDITIONS  
= 1.2 V  
UNIT  
1
MIN  
0.9  
1.4  
2.0  
TYP  
MIN  
0.9  
1.4  
2.0  
MAX  
V
V
V
V
V
V
V
V
V
V
V
V
V
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
CC  
= 2.0 V  
HIGH level Input  
voltage  
V
IH  
V
= 2.7 V to 3.6 V  
= 4.5 V to 5.5 V  
= 1.2 V  
0.7*V  
0.7*V  
CC  
CC  
0.3  
0.6  
0.8  
0.3  
0.6  
0.8  
= 2.0 V  
LOW level Input  
voltage  
V
IL  
V
= 2.7 V to 3.6 V  
= 4.5 V to 5.5 V  
0.3*V  
0.3*V  
CC  
CC  
= 1.2 V; V = V or V –I = 100 µA  
1.2  
2.0  
2.7  
3.0  
4.5  
I
IH  
IL;  
O
= 2.0 V; V = V or V –I = 100 µA  
1.8  
2.5  
2.8  
4.3  
1.8  
2.5  
2.8  
4.3  
I
IH  
IL;  
O
HIGH level output  
voltage; all outputs  
= 2.7 V; V = V or V –I = 100 µA  
V
V
V
V
V
V
I
IH  
IL;  
O
OH  
= 3.0 V; V = V or V –I = 100 µA  
I
IH  
IL;  
O
= 4.5 V; V = V or V –I = 100 µA  
I
IH  
IL;  
O
HIGH level output  
voltage;  
STANDARD  
V
V
= 3.0 V; V = V or V –I = 6 mA  
2.40  
3.60  
2.82  
4.20  
2.20  
3.50  
CC  
I
IH  
IL;  
O
OH  
= 4.5 V;V = V or V –I = 12 mA  
CC  
I
IH  
IL;  
O
outputs  
V
CC  
V
CC  
V
CC  
V
CC  
V
CC  
= 1.2 V; V = V or V I  
IL; O  
= 100 µA  
= 100 µA  
= 100 µA  
= 100 µA  
= 100 µA  
0
0
0
0
0
I
IH  
= 2.0 V; V = V or V  
I
0.2  
0.2  
0.2  
0.2  
0.2  
I
IH  
IL; O  
LOW level output  
voltage; all outputs  
= 2.7 V; V = V or V  
I
0.2  
0.2  
0.2  
V
V
I
IH  
IL; O  
OL  
= 3.0 V; V = V or V I  
IL; O  
I
IH  
= 4.5 V; V = V or V I  
IL; O  
I
IH  
LOW level output  
voltage;  
STANDARD  
V
V
= 3.0 V; V = V or V I = 6 mA  
IL; O  
0.25  
0.35  
0.40  
0.55  
5.0  
0.50  
0.65  
10  
CC  
I
IH  
OL  
= 4.5 V; V = V or V I = 12 mA  
IL; O  
CC  
I
IH  
outputs  
HIGH level output  
leakage current  
V
V
= 2.0 V to 3.6 V; V = V  
I
CC  
O
IL;  
IL;  
I
I
µA  
µA  
µA  
µA  
OZ  
= V or GND  
CC  
HIGH level output  
leakage current  
V
= 2.0 V to 3.6 V; V = V  
CC I  
10  
1.0  
20  
1.0  
40  
OZ  
2
V
O
= 6.0 V  
Input leakage  
current  
I
I
V
= 5.5 V; V = V or GND  
CC I CC  
Quiescent supply  
current; SSI  
I
V
CC  
= 5.5 V; V = V or GND; I = 0  
20.0  
CC  
I
CC  
O
Additional  
quiescent supply  
current per input  
I  
CC  
V
CC  
= 2.7 V to 3.6 V; V = V – 0.6 V  
500  
850  
µA  
I
CC  
NOTES:  
1
2
All typical values are measured at T  
The maximum operating output voltage (V  
= 25 °C.  
O(max)  
amb  
) is 6.0 V.  
5
2003 Mar 03  
Philips Semiconductors  
Product data  
Quad 2-input NAND gate  
74LV03  
AC CHARACTERISTICS FOR 74LV03  
GND = 0 V; t = t 2.5 ns; C = 50 pF; R = 1 kΩ  
r
f
L
L
LIMITS  
–40 to +85 °C  
LIMITS  
–40 to +125 °C  
CONDITION  
(V)  
SYMBOL  
PARAMETER  
WAVEFORM  
UNIT  
1
V
CC  
MIN  
TYP  
MAX  
MIN  
MAX  
1.2  
50  
17  
13  
2.0  
2.7  
26  
19  
16  
13  
31  
23  
19  
16  
Propagation delay  
nA, nB, to nY  
t
t
Figures, 1, 2  
ns  
PZL/ PLZ  
2
3.0 to 3.6  
4.5 to 5.5  
10  
3
NOTE:  
1
2
3
Unless otherwise stated, all typical values are at T  
= 25 °C.  
amb  
Typical value measured at V = 3.3 V.  
CC  
Typical value measured at V = 5.0 V.  
CC  
AC WAVEFORMS  
TEST CIRCUIT  
V
V
V
= 1.5 V at V 2.7 V 3.6 V  
M
CC  
= 0.5 V * V at V < 2.7 V and 4.5 V  
M
CC  
CC  
V
CC  
2 * V  
and V are the typical output voltage drop that occur with the  
CC  
OL  
OH  
Open  
GND  
output load.  
V
X
V
X
= V + 0.3 V at V 2.7 V and 3.6 V  
OL CC  
R
R
= 1k  
L
L
= V + 0.1 * V at V < 2.7 V and 4.5 V  
V
V
O
OL  
CC  
CC  
I
PULSE  
GENERATOR  
D.U.T.  
= 1k  
R
T
50 pF  
C
L
Test Circuit for Outputs  
DEFINITIONS  
V
I
R
C
R
= Load resistor  
L
L
T
= Load capacitance includes jig and probe capacitiance.  
= Termination resistance should be equal to Z  
nA, nB INPUT  
V
M
t
of pulse generators.  
OUT  
V
SWITCH POSITION  
CC  
S
t
TEST  
V
V
I
PLZ  
PZL  
1
CC  
GND  
t
t
Open  
< 2.7V  
V
CC  
PLH/ PHL  
nY OUTPUT  
V
M
t
t
t
2 * V  
2.7V  
PLZ/ PZL  
CC  
2.7–3.6V  
V
X
V
V
CC  
OL  
w 4.5V  
t
GND  
PHZ/ PZH  
SV00896  
Figure 2. Load circuitry for switching times  
SV00358  
Figure 1. Input (nA, nB) to output (nY) propagation delays.  
6
2003 Mar 03  
Philips Semiconductors  
Product data  
Quad 2-input NAND gate  
74LV03  
REVISION HISTORY  
Rev  
Date  
Description  
_3  
20030303  
Product data (9397 750 11191). ECN 853-1963 29494 of 07 February 2003.  
Supersedes data of 1998 Apr 20 (9397 750 04403).  
Modifications:  
Delete DIL, SSOP and TSSOP package ordering and package outlines (discontinued options).  
Correct power dissipation formula.  
_2  
19980420 Product specification (9397 750 04403). ECN 853-1963 19257 of 20 April 1998. Supersedes data of 1997 Mar 28.  
Data sheet status  
Product  
status  
Definitions  
[1]  
Level  
Data sheet status  
[2] [3]  
I
Objective data  
Development  
This data sheet contains data from the objective specification for product development.  
Philips Semiconductors reserves the right to change the specification in any manner without notice.  
II  
Preliminary data  
Qualification  
Production  
This data sheet contains data from the preliminary specification. Supplementary data will be published  
at a later date. Philips Semiconductors reserves the right to change the specification without notice, in  
order to improve the design and supply the best possible product.  
III  
Product data  
This data sheet contains data from the product specification. Philips Semiconductors reserves the  
right to make changes at any time in order to improve the design, manufacturing and supply. Relevant  
changes will be communicated via a Customer Product/Process Change Notification (CPCN).  
[1] Please consult the most recently issued data sheet before initiating or completing a design.  
[2] The product status of the device(s) described in this data sheet may have changed since this data sheet was published. The latest information is available on the Internet at URL  
http://www.semiconductors.philips.com.  
[3] For data sheets describing multiple type numbers, the highest-level product status determines the data sheet status.  
Definitions  
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For detailed information see  
the relevant data sheet or data handbook.  
LimitingvaluesdefinitionLimiting values given are in accordance with the Absolute Maximum Rating System (IEC 60134). Stress above one or more of the limiting  
values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or at any other conditions above those given  
in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips Semiconductors make no  
representation or warranty that such applications will be suitable for the specified use without further testing or modification.  
Disclaimers  
Life support — These products are not designed for use in life support appliances, devices, or systems where malfunction of these products can reasonably be  
expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications do so at their own risk and agree  
to fully indemnify Philips Semiconductors for any damages resulting from such application.  
Right to make changes — Philips Semiconductors reserves the right to make changes in the products—including circuits, standard cells, and/or software—described  
or contained herein in order to improve design and/or performance. When the product is in full production (status ‘Production’), relevant changes will be communicated  
viaaCustomerProduct/ProcessChangeNotification(CPCN).PhilipsSemiconductorsassumesnoresponsibilityorliabilityfortheuseofanyoftheseproducts,conveys  
nolicenseortitleunderanypatent, copyright, ormaskworkrighttotheseproducts, andmakesnorepresentationsorwarrantiesthattheseproductsarefreefrompatent,  
copyright, or mask work right infringement, unless otherwise specified.  
Koninklijke Philips Electronics N.V. 2003  
Contact information  
All rights reserved. Printed in U.S.A.  
For additional information please visit  
http://www.semiconductors.philips.com.  
Fax: +31 40 27 24825  
Date of release: 03-03  
9397 750 11191  
For sales offices addresses send e-mail to:  
sales.addresses@www.semiconductors.philips.com.  
Document order number:  
Philips  
Semiconductors  

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