934055781127 [NXP]

TRANSISTOR 50 A, 200 V, 0.04 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-247, PLASTIC PACKAGE-3, FET General Purpose Power;
934055781127
型号: 934055781127
厂家: NXP    NXP
描述:

TRANSISTOR 50 A, 200 V, 0.04 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-247, PLASTIC PACKAGE-3, FET General Purpose Power

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Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
FEATURES  
SYMBOL  
QUICK REFERENCE DATA  
d
’Trench’ technology  
• Very low on-state resistance  
• Fast switching  
VDSS = 200 V  
ID = 50 A  
• Low thermal resistance  
g
RDS(ON) 40 mΩ  
s
GENERAL DESCRIPTION  
PINNING  
SOT429 (TO247)  
SiliconMAXproductsusethelatest  
Philips Trench technology to  
achieve the lowest possible  
on-state resistance in each  
package at each voltage rating.  
PIN  
DESCRIPTION  
1
2
gate  
drain  
Applications:-  
• d.c. to d.c. converters  
• switched mode power supplies  
3
source  
drain  
2
tab  
1
3
The PSMN040-200W is supplied in  
the SOT429 (TO247) conventional  
leaded package.  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDSS  
VDGR  
VGS  
ID  
Drain-source voltage  
Drain-gate voltage  
Gate-source voltage  
Continuous drain current  
Tj = 25 ˚C to 175˚C  
Tj = 25 ˚C to 175˚C; RGS = 20 kΩ  
-
-
-
-
-
-
-
200  
200  
± 20  
50  
V
V
V
A
A
A
W
˚C  
Tmb = 25 ˚C  
Tmb = 100 ˚C  
Tmb = 25 ˚C  
Tmb = 25 ˚C  
36  
IDM  
PD  
Tj, Tstg  
Pulsed drain current  
Total power dissipation  
Operating junction and  
storage temperature  
200  
300  
175  
- 55  
AVALANCHE ENERGY LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
EAS Non-repetitive avalanche  
CONDITIONS  
MIN.  
MAX.  
UNIT  
Unclamped inductive load, IAS = 50 A;  
tp = 100 µs; Tj prior to avalanche = 25˚C;  
-
661  
mJ  
energy  
VDD 25 V; RGS = 50 ; VGS = 10 V; refer  
to fig:15  
IAS  
Non-repetitive avalanche  
current  
-
50  
A
August 1999  
1
Rev 1.000  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
Rth j-mb Thermal resistance junction  
CONDITIONS  
TYP.  
MAX.  
UNIT  
-
0.5  
K/W  
to mounting base  
Thermal resistance junction in free air  
to ambient  
Rth j-a  
45  
-
K/W  
ELECTRICAL CHARACTERISTICS  
Tj= 25˚C unless otherwise specified  
SYMBOL PARAMETER  
V(BR)DSS Drain-source breakdown  
CONDITIONS  
MIN. TYP. MAX. UNIT  
VGS = 0 V; ID = 0.25 mA;  
200  
-
-
-
-
V
V
voltage  
Tj = -55˚C  
178  
VGS(TO)  
Gate threshold voltage  
VDS = VGS; ID = 1 mA  
2.0  
1.0  
3.0  
-
-
35  
-
2
0.05  
-
4.0  
-
6
40  
116  
100  
10  
500  
V
V
V
mΩ  
mΩ  
nA  
µA  
µA  
Tj = 175˚C  
Tj = -55˚C  
-
-
-
-
-
-
RDS(ON)  
Drain-source on-state  
resistance  
Gate source leakage current VGS = ±10 V; VDS = 0 V  
Zero gate voltage drain  
current  
VGS = 10 V; ID = 25 A  
Tj = 175˚C  
IGSS  
IDSS  
VDS = 200 V; VGS = 0 V;  
Tj = 175˚C  
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 50 A; VDD = 160 V; VGS = 10 V  
-
-
-
183  
40  
73  
-
-
-
nC  
nC  
nC  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 100 V; RD = 3.9 ;  
VGS = 10 V; RG = 5.6 Ω  
Resistive load  
-
-
-
-
43  
94  
230  
92  
-
-
-
-
ns  
ns  
ns  
ns  
Ld  
Ld  
Ls  
Internal drain inductance  
Internal drain inductance  
Internal source inductance  
Measured from tab to centre of die  
Measured from drain lead to centre of die  
Measured from source lead to source  
bond pad  
-
-
-
3.5  
4.5  
7.5  
-
-
-
nH  
nH  
nH  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz  
-
-
-
9530  
732  
380  
-
-
-
pF  
pF  
pF  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IS  
Continuous source current  
(body diode)  
Pulsed source current (body  
diode)  
Diode forward voltage  
-
-
-
-
50  
200  
1.2  
A
A
V
ISM  
VSD  
-
IF = 25 A; VGS = 0 V  
0.85  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 20 A; -dIF/dt = 100 A/µs;  
VGS = 0 V; VR = 30 V  
-
-
160  
1.4  
-
-
ns  
µC  
August 1999  
2
Rev 1.000  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
Transient thermal impedance, Zth j-mb (K/W)  
Normalised Power Derating, PD (%)  
100  
1
0.1  
D = 0.5  
0.2  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
0.1  
0.05  
0.02  
P
D = tp/T  
D
0.01  
tp  
single pulse  
1E-05  
T
0.001  
1E-06  
1E-04  
1E-03  
1E-02  
1E-01  
1E+00  
0
25  
50  
75  
100  
125  
150  
175  
Pulse width, tp (s)  
Mounting Base temperature, Tmb (C)  
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Tmb)  
Fig.4. Transient thermal impedance.  
Zth j-mb = f(t); parameter D = tp/T  
Drain Current, ID (A)  
Tj = 25 C  
60  
55  
50  
45  
40  
35  
30  
25  
20  
15  
10  
5
Normalised Current Derating, ID (%)  
VGS = 10V  
8 V  
6 V  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
5 V  
4.8 V  
4.6 V  
4.4 V  
4.2 V  
0
0
25  
50  
75  
100  
125  
150  
175  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1.6  
1.8  
2
Mounting Base temperature, Tmb (C)  
Drain-Source Voltage, VDS (V)  
Fig.2. Normalised continuous drain current.  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
ID = f(VDS)  
ID% = 100 ID/ID 25 ˚C = f(Tmb); VGS 10 V  
Peak Pulsed Drain Current, IDM (A)  
1000  
Drain-Source On Resistance, RDS(on) (Ohms)  
0.2  
4.6 V  
4.4 V  
4.2 V  
Tj = 25 C  
0.18  
0.16  
0.14  
0.12  
0.1  
RDS(on) = VDS/ ID  
tp = 10 us  
100  
10  
1
4.8 V  
100 us  
1 ms  
0.08  
0.06  
0.04  
0.02  
0
5 V  
D.C.  
10 ms  
6V  
100 ms  
VGS = 10V  
1
10  
100  
1000  
0
5
10  
15  
20  
25  
30  
35  
40  
Drain-Source Voltage, VDS (V)  
Drain Current, ID (A)  
Fig.3. Safe operating area  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
RDS(ON) = f(ID)  
August 1999  
3
Rev 1.000  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
Threshold Voltage, VGS(TO) (V)  
Drain current, ID (A)  
60  
4.5  
4
VDS > ID X RDS(ON)  
55  
maximum  
typical  
50  
45  
40  
3.5  
3
35  
2.5  
2
175 C  
30  
25  
minimum  
1.5  
1
20  
Tj = 25 C  
15  
10  
5
0.5  
0
0
0
1
2
3
4
5
6
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
Junction Temperature, Tj (C)  
Gate-source voltage, VGS (V)  
Fig.7. Typical transfer characteristics.  
ID = f(VGS)  
Fig.10. Gate threshold voltage.  
VGS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
Transconductance, gfs (S)  
VDS > ID X RDS(ON)  
Tj = 25 C  
Drain current, ID (A)  
100  
1.0E-01  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
1.0E-06  
175 C  
minimum  
typical  
maximum  
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
0
5
10 15 20 25 30 35 40 45 50 55 60  
Drain current, ID (A)  
Gate-source voltage, VGS (V)  
Fig.8. Typical transconductance, Tj = 25 ˚C.  
gfs = f(ID)  
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C  
Capacitances, Ciss, Coss, Crss (nF)  
Normalised On-state Resistance  
100  
10  
1
2.9  
2.7  
2.5  
2.3  
2.1  
1.9  
1.7  
1.5  
1.3  
1.1  
0.9  
0.7  
0.5  
Ciss  
Coss  
Crss  
0.1  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
0.1  
1
10  
100  
Junction temperature, Tj (C)  
Drain-Source Voltage, VDS (V)  
Fig.9. Normalised drain-source on-state resistance.  
RDS(ON)/RDS(ON)25 ˚C = f(Tj)  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
August 1999  
4
Rev 1.000  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
Gate-source voltage, VGS (V)  
15  
Maximum Avalanche Current, IAS (A)  
100  
10  
1
14  
13  
12  
11  
10  
9
8
7
6
5
ID = 50 A  
Tj = 25 C  
VDD = 40 V  
25 C  
VDD = 160 V  
Tj prior to avalanche = 150 C  
4
3
2
1
0
0
20  
40  
60  
80  
100 120 140 160 180 200  
0.001  
0.01  
0.1  
Avalanche time, tAV (ms)  
1
10  
Gate charge, QG (nC)  
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG)  
Fig.15. Maximum permissible non-repetitive  
avalanche current (IAS) versus avalanche time (tAV);  
unclamped inductive load  
Source-Drain Diode Current, IF (A)  
60  
VGS = 0 V  
55  
50  
45  
175 C  
40  
35  
Tj = 25 C  
30  
25  
20  
15  
10  
5
0
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9  
Source-Drain Voltage, VSDS (V)  
1
1.1 1.2  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
August 1999  
5
Rev 1.000  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
MECHANICAL DATA  
Plastic single-ended through-hole package; heatsink mounted; 1 mounting hole; 3-lead TO-247  
SOT429  
α
E
P
A
A
1
β
q
S
R
D
Y
(1)  
L
1
Q
b
2
L
1
2
3
c
b
1
w
M
b
e
e
0
10  
20 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
β
A
A
b
b
b
2
c
D
E
e
L
L
1
P
Q
q
R
S
w
Y
α
UNIT  
mm  
1
1
1.9  
1.7  
1.2  
0.9  
3.7  
3.3  
2.6  
2.4  
7.5  
7.1  
15.7  
15.3  
6°  
4°  
17°  
13°  
5.3  
4.7  
2.2  
1.8  
3.2  
2.8  
0.9  
0.6  
21  
20  
16  
15  
16  
15  
4.0  
3.6  
3.5  
3.3  
5.45  
5.3  
0.4  
Note  
1. Tinning of terminals are uncontrolled within zone L  
.
1
REFERENCES  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
JEDEC  
EIAJ  
98-04-07  
99-08-04  
SOT429  
TO-247  
Fig.16. SOT429; pin 2 connected to mounting base  
Notes  
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent  
damage to MOS gate oxide.  
2. Refer to mounting instructions for SOT429 envelope.  
3. Epoxy meets UL94 V0 at 1/8".  
August 1999  
6
Rev 1.000  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PSMN040-200W  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1999  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
August 1999  
7
Rev 1.000  

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