BF904WR,135 [NXP]

N-channel dual-gate MOSFET;
BF904WR,135
型号: BF904WR,135
厂家: NXP    NXP
描述:

N-channel dual-gate MOSFET

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DISCRETE SEMICONDUCTORS  
DATA SHEET  
BF904WR  
N-channel dual-gate MOS-FET  
Product specification  
2010 Sep 15  
Supersedes data of 1995 Apr 25  
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
FEATURES  
PINNING  
Specially designed for use at 5 V supply voltage  
PIN  
1
SYMBOL  
DESCRIPTION  
Short channel transistor with high forward transfer  
admittance to input capacitance ratio  
s, b  
d
source  
drain  
2
Low noise gain controlled amplifier up to 1 GHz  
3
g2  
g1  
gate 2  
gate 1  
Superior cross-modulation performance during AGC.  
4
APPLICATIONS  
d
handbook, halfpage  
VHF and UHF applications with 3 to 7 V supply voltage  
such as television tuners and professional  
communications equipment.  
3
4
DESCRIPTION  
g
2
g
Enhancement type field-effect transistor in a plastic  
microminiature SOT343R package. The transistor  
consists of an amplifier MOS-FET with source and  
substrate interconnected and an internal bias circuit to  
ensure good cross-modulation performance during AGC.  
1
2
1
s,b  
Top view  
MAM192  
Marking code: MC*  
* = - : made in Hong Kong  
* = p : made in Hong Kong  
* = t : made in Malaysia  
CAUTION  
The device is supplied in an antistatic package. The  
gate-source input must be protected against static  
discharge during transport or handling.  
Fig.1 Simplified outline (SOT343R) and symbol.  
QUICK REFERENCE DATA  
SYMBOL  
VDS  
PARAMETER  
drain-source voltage  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
7
V
ID  
drain current  
30  
mA  
mW  
C  
Ptot  
Tj  
total power dissipation  
operating junction temperature  
forward transfer admittance  
input capacitance at gate 1  
reverse transfer capacitance  
noise figure  
280  
150  
30  
yfs  
Cig1-s  
Crs  
F
22  
25  
2.2  
25  
2
mS  
pF  
2.6  
35  
f = 1 MHz  
fF  
f = 800 MHz  
dB  
2010 Sep 15  
2
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
VDS  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
drain-source voltage  
drain current  
7
V
ID  
30  
mA  
mA  
mA  
mW  
IG1  
IG2  
Ptot  
gate 1 current  
10  
10  
280  
gate 2 current  
total power dissipation  
up to Tamb = 50 C; see Fig.2;  
note 1  
Tstg  
Tj  
storage temperature  
65  
+150  
+150  
C  
C  
operating junction temperature  
Note  
1. Device mounted on a printed-circuit board.  
MLD150  
300  
handbook, halfpage  
P
tot  
(mW)  
200  
100  
0
0
50  
100  
150  
200  
o
T
( C)  
amb  
Fig.2 Power derating curve.  
2010 Sep 15  
3
 
 
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
THERMAL CHARACTERISTICS  
SYMBOL  
Rth j-a  
PARAMETER  
CONDITIONS  
note 1  
Ts = 91 C; note 2  
VALUE  
UNIT  
K/W  
K/W  
thermal resistance from junction to ambient  
thermal resistance from junction to soldering point  
350  
210  
Rth j-s  
Notes  
1. Device mounted on a printed-circuit board.  
2. Ts is the temperature at the soldering point of the source lead.  
STATIC CHARACTERISTICS  
Tj = 25 C; unless otherwise specified.  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
MAX.  
15  
UNIT  
V(BR)G1-SS  
V(BR)G2-SS  
V(F)S-G1  
V(F)S-G2  
VG1-S(th)  
VG2-S(th)  
IDSX  
gate 1-source breakdown voltage VG2-S = VDS = 0; IG1-S = 10 mA  
gate 2-source breakdown voltage VG1-S = VDS = 0; IG2-S = 10 mA  
6
6
V
15  
1.5  
1.5  
1
V
forward source-gate 1 voltage  
forward source-gate 2 voltage  
gate 1-source threshold voltage  
gate 2-source threshold voltage  
drain-source current  
VG2-S = VDS = 0; IS-G1 = 10 mA  
VG1-S = VDS = 0; IS-G2 = 10 mA  
VG2-S = 4V; VDS = 5 V; ID = 20 A  
VG1-S = VDS = 5 V; ID = 20 A  
0.5  
0.5  
0.3  
0.3  
8
V
V
V
1.2  
13  
V
VG2-S = 4 V; VDS = 5 V; RG1 = 120 k;  
mA  
note 1  
IG1-SS  
IG2-SS  
gate 1 cut-off current  
gate 2 cut-off current  
VG2-S = VDS = 0; VG1-S = 5 V  
VG1-S = VDS = 0; VG2-S = 5 V  
50  
50  
nA  
nA  
Note  
1. RG connects gate 1 to VGG = 5 V.  
DYNAMIC CHARACTERISTICS  
Common source; Tamb = 25 C; VDS = 5 V; VG2-S = 4 V; ID = 10 mA; unless otherwise specified.  
SYMBOL  
yfs  
Cig1-s  
Cig2-s  
Cos  
PARAMETER  
CONDITIONS  
MIN.  
22  
TYP.  
25  
MAX.  
UNIT  
forward transfer admittance pulsed; Tj = 25 C  
30  
2.6  
2
mS  
pF  
pF  
pF  
fF  
input capacitance at gate 1  
input capacitance at gate 2  
drain-source capacitance  
f = 1 MHz  
f = 1 MHz  
f = 1 MHz  
1
1
2.2  
1.5  
1.3  
25  
1
1.6  
35  
1.5  
2.8  
Crs  
reverse transfer capacitance f = 1 MHz  
noise figure f = 200 MHz; GS = 2 mS; BS = BSopt  
f = 800 MHz; GS = GSopt; BS = BSopt  
F
dB  
dB  
2
2010 Sep 15  
4
 
 
 
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MRA769  
MLD268  
40  
0
handbook, halfpage  
gain  
reduction  
Y
fs  
(dB)  
10  
(mS)  
30  
20  
30  
40  
20  
10  
0
50  
0
1
2
3
4
50  
0
50  
100  
150  
( C)  
o
V
(V)  
T
AGC  
j
f = 50 MHz.  
Tj = 25 C.  
Fig.3 Forward transfer admittance as a function  
of junction temperature; typical values.  
Fig.4 Typical gain reduction as a function of  
AGC voltage.  
MLD270  
MRA771  
120  
20  
handbook, halfpage  
V
= 4 V  
G2 S  
3 V 2.5 V  
2 V  
V
unw  
(dB μV)  
110  
I
D
(mA)  
15  
100  
90  
10  
5
1.5 V  
1 V  
0
80  
0
10  
20  
30  
40  
50  
0
0.4  
0.8  
1.2  
1.6  
V
2.0  
(V)  
gain reduction (dB)  
G1  
S
VGG = 5 V; fw = 50 MHz.  
funw = 60 MHz; Tamb = 25 C; RG1 = 120 k  
VDS = 5 V.  
Tj = 25 C.  
Fig.5 Unwanted voltage for 1% cross-modulation  
as a function of gain reduction; typical  
values; see Fig.19.  
Fig.6 Transfer characteristics; typical values.  
2010 Sep 15  
5
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MLD269  
MLD271  
20  
150  
handbook, halfpage  
handbook, halfpage  
V
= 1.4 V  
S
V
= 4 V  
G2 S  
I
G1  
D
I
3.5 V  
(mA)  
G1  
16  
(μA)  
1.3 V  
3 V  
100  
1.2 V  
1.1 V  
12  
8
2.5 V  
2 V  
1.0 V  
0.9 V  
50  
4
0
0
0
0
2
4
6
8
10  
(V)  
0.5  
1.0  
1.5  
2.0  
2.5  
(V)  
V
V
G1  
DS  
S
VDS = 5 V.  
VG2-S = 4 V.  
Tj = 25 C.  
Tj = 25 C.  
Fig.8 Gate 1 current as a function of gate 1  
voltage; typical values.  
Fig.7 Output characteristics; typical values.  
MLD272  
MLD273  
16  
40  
handbook, halfpage  
handbook, halfpage  
I
y
D
fs  
(mS)  
(mA)  
V
= 4 V  
S
G2  
12  
30  
3.5 V  
3 V  
8
4
0
20  
2.5 V  
10  
0
2 V  
0
10  
20  
30  
40  
50  
(μA)  
0
4
8
12  
16  
20  
(mA)  
I
I
G1  
D
VDS = 5 V.  
VDS = 5 V; VG2-S = 4 V.  
Tj = 25 C.  
Tj = 25 C.  
Fig.9 Forward transfer admittance as a  
function of drain current; typical values.  
Fig.10 Drain current as a function of gate 1 current;  
typical values.  
2010 Sep 15  
6
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MLD275  
MLD274  
12  
20  
handbook, halfpage  
handbook, halfpage  
R
= 47 kΩ 68 kΩ  
G1  
I
D
I
D
82 kΩ  
(mA)  
(mA)  
15  
100 kΩ  
120 kΩ  
150 kΩ  
8
10  
5
180 kΩ  
220 kΩ  
4
0
0
0
0
1
2
3
4
5
2
4
6
8
V
(V)  
V
= V  
(V)  
DS  
GG  
GG  
VDS = 5 V; VG2-S = 4 V.  
RG1 = 120 k(connected to VGG); Tj = 25 C.  
VG2-S = 4 V.  
RG1 connected to VGG; Tj = 25 C.  
Fig.11 Drain current as a function of gate 1  
supply voltage (= VGG); typical values;  
see Fig.19.  
Fig.12 Drain current as a function of gate 1  
(= VGG) and drain supply voltage;  
typical values; see Fig.19.  
MLD276  
MLB945  
12  
40  
handbook, halfpage  
handbook, halfpage  
V
= 5 V  
4.5 V  
GG  
I
G1  
(μA)  
I
D
V
= 5 V  
GG  
4 V  
(mA)  
30  
3.5 V  
3 V  
4.5 V  
8
4 V  
3.5 V  
3 V  
20  
10  
0
4
0
0
2
4
6
0
2
4
6
V
(V)  
S
V
(V)  
S
G2  
G2  
VDS = 5 V; Tj = 25 C.  
VDS = 5 V; Tj = 25 C.  
RG = 120 k(connected to VGG).  
RG = 120 k(connected to VGG).  
Fig.13 Drain current as a function of gate 2 voltage;  
typical values; see Fig.19.  
Fig.14 Gate 1 current as a function of gate 2  
voltage; typical values; see Fig.19.  
2010 Sep 15  
7
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
MLD277  
MLD278  
2
10  
3
2
3
10  
rs  
10  
handbook, halfpage  
y
y
ϕ
is  
(mS)  
rs  
(deg)  
(μS)  
ϕ
rs  
2
10  
10  
10  
y
rs  
b
is  
1
10  
10  
g
is  
1
1
3
10  
1
2
3
2
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 5 V; VG2 = 4 V.  
VDS = 5 V; VG2 = 4 V.  
ID =10 mA; Tamb = 25 C.  
ID = 10 mA; Tamb = 25 C.  
Fig.15 Input admittance as a function of frequency;  
typical values.  
Fig.16 Reverse transfer admittance and phase as  
a function of frequency; typical values.  
MLD280  
MLD279  
2
2
10  
fs  
10  
10  
handbook, halfpage  
y
os  
(mS)  
ϕ
(deg)  
y
fs  
y
fs  
fs  
b
g
(mS)  
os  
os  
1
ϕ
10  
10  
1
2
10  
10  
1
1
2
3
2
3
10  
10  
10  
10  
10  
10  
f (MHz)  
f (MHz)  
VDS = 5 V; VG2 = 4 V.  
VDS = 5 V; VG2 = 4 V.  
ID = 10 mA; Tamb = 25 C.  
ID = 10 mA; Tamb = 25 C.  
Fig.17 Forward transfer admittance and phase as  
a function of frequency; typical values.  
Fig.18 Output admittance as a function of  
frequency; typical values.  
2010 Sep 15  
8
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
V
AGC  
R1  
10 kΩ  
C1  
4.7 nF  
C3 12 pF  
R
L
L1  
C2  
DUT  
50 Ω  
450 nH  
C4  
4.7 nF  
R
R2  
GEN  
R
G1  
50 Ω  
50Ω  
4.7 nF  
V
I
V
MLD171  
GG  
V
DS  
Fig.19 Cross-modulation test set-up.  
2010 Sep 15  
9
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
Table 1 Scattering parameters: VDS =5 V; VG2-S = 4 V; ID = 10 mA  
s11  
s21  
s12  
s22  
f
MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE MAGNITUDE ANGLE  
(MHz)  
(ratio)  
(deg)  
(ratio)  
(deg)  
(ratio)  
(deg)  
(ratio)  
(deg)  
40  
100  
0.989  
0.985  
0.976  
0.958  
0.942  
0.918  
0.899  
0.876  
0.852  
0.823  
0.800  
0.750  
0.719  
0.682  
0.642  
0.602  
0.547  
0.596  
0.682  
0.771  
0.793  
3.4  
8.3  
2.420  
2.414  
2.368  
2.301  
2.251  
2.170  
2.080  
2.001  
1.924  
1.829  
1.747  
1.621  
1.535  
1.424  
1.349  
1.283  
1.130  
1.018  
0.979  
0.804  
0.541  
175.7  
169.1  
158.8  
148.5  
138.8  
129.5  
120.7  
112.1  
103.2  
94.7  
0.000  
0.001  
0.003  
0.004  
0.005  
0.005  
0.005  
0.005  
0.005  
0.005  
0.005  
0.005  
0.008  
0.010  
0.013  
0.018  
0.014  
0.040  
0.077  
0.120  
0.149  
79.9  
78.3  
0.993  
0.992  
0.987  
0.980  
0.974  
0.966  
0.958  
0.951  
0.944  
0.937  
0.933  
0.928  
0.930  
0.924  
0.928  
0.928  
0.887  
0.837  
0.778  
0.629  
0.479  
1.6  
3.9  
200  
16.4  
24.1  
32.0  
39.3  
46.0  
52.6  
58.8  
64.9  
70.9  
82.4  
92.7  
102.5  
109.8  
116.5  
124.9  
128.7  
132.6  
142.5  
157.5  
80.3  
7.8  
300  
73.7  
11.4  
15.2  
18.7  
22.2  
25.5  
28.9  
32.1  
35.2  
41.7  
48.4  
54.9  
62.9  
73.1  
81.0  
95.8  
109.6  
119.5  
119.9  
400  
70.7  
500  
67.2  
600  
67.8  
700  
68.6  
800  
72.9  
900  
78.7  
1000  
1200  
1400  
1600  
1800  
2000  
2200  
2400  
2600  
2800  
3000  
86.5  
88.3  
70.7  
120.5  
139.8  
137.8  
156.8  
175.1  
172.6  
163.9  
164.0  
178.8  
158.3  
54.6  
39.4  
22.5  
1.1  
15.1  
49.1  
79.4  
116.2  
153.5  
Table 2 Noise data: VDS = 5 V; VG2-S = 4 V; ID = 10 mA  
opt  
f
Fmin  
(dB)  
rn  
50.40  
(MHz)  
(ratio)  
(deg)  
49.6  
800  
2.00  
.686  
2010 Sep 15  
10  
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
PACKAGE OUTLINE  
Plastic surface-mounted package; reverse pinning; 4 leads  
SOT343R  
D
B
E
A
X
H
v
M
A
y
E
e
3
4
Q
A
A
1
c
2
1
L
w
M
B
b
b
1
p
p
e
1
detail X  
0
1
2 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
1
max  
A
UNIT  
b
b
c
D
E
e
e
H
E
L
Q
v
w
y
p
p
1
1
0.4  
0.3  
1.1  
0.8  
0.7  
0.5  
0.25  
0.10  
2.2  
1.8  
1.35  
1.15  
2.2  
2.0  
0.45  
0.15  
0.23  
0.13  
mm  
0.1  
1.15  
0.2  
0.2  
0.1  
1.3  
REFERENCES  
JEDEC  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
EIAJ  
97-05-21  
06-03-16  
SOT343R  
2010 Sep 15  
11  
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
DATA SHEET STATUS  
DOCUMENT  
STATUS(1)  
PRODUCT  
STATUS(2)  
DEFINITION  
Objective data sheet  
Development  
This document contains data from the objective specification for product  
development.  
Preliminary data sheet  
Product data sheet  
Qualification  
Production  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Notes  
1. Please consult the most recently issued document before initiating or completing a design.  
2. The product status of device(s) described in this document may have changed since this document was published  
and may differ in case of multiple devices. The latest product status information is available on the Internet at  
URL http://www.nxp.com.  
DISCLAIMERS  
property or environmental damage. NXP Semiconductors  
accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or  
applications and therefore such inclusion and/or use is at  
the customer’s own risk.  
Limited warranty and liability Information in this  
document is believed to be accurate and reliable.  
However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to  
the accuracy or completeness of such information and  
shall have no liability for the consequences of use of such  
information.  
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any of these products are for illustrative purposes only.  
NXP Semiconductors makes no representation or  
warranty that such applications will be suitable for the  
specified use without further testing or modification.  
In no event shall NXP Semiconductors be liable for any  
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damages (including - without limitation - lost profits, lost  
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accepts no liability for any assistance with applications or  
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Semiconductors product is suitable and fit for the  
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NXP Semiconductors does not accept any liability related  
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on any weakness or default in the customer’s applications  
or products, or the application or use by customer’s third  
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reserves the right to make changes to information  
published in this document, including without limitation  
specifications and product descriptions, at any time and  
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information supplied prior to the publication hereof.  
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not designed, authorized or warranted to be suitable for  
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equipment, nor in applications where failure or malfunction  
of an NXP Semiconductors product can reasonably be  
expected to result in personal injury, death or severe  
2010 Sep 15  
12  
 
 
NXP Semiconductors  
Product specification  
N-channel dual-gate MOS-FET  
BF904WR  
Limiting values Stress above one or more limiting  
values (as defined in the Absolute Maximum Ratings  
System of IEC 60134) will cause permanent damage to  
the device. Limiting values are stress ratings only and  
(proper) operation of the device at these or any other  
conditions above those given in the Recommended  
operating conditions section (if present) or the  
Characteristics sections of this document is not warranted.  
Constant or repeated exposure to limiting values will  
permanently and irreversibly affect the quality and  
reliability of the device.  
Quick reference data The Quick reference data is an  
extract of the product data given in the Limiting values and  
Characteristics sections of this document, and as such is  
not complete, exhaustive or legally binding.  
Non-automotive qualified products Unless this data  
sheet expressly states that this specific NXP  
Semiconductors product is automotive qualified, the  
product is not suitable for automotive use. It is neither  
qualified nor tested in accordance with automotive testing  
or application requirements. NXP Semiconductors accepts  
no liability for inclusion and/or use of non-automotive  
qualified products in automotive equipment or  
applications.  
Terms and conditions of commercial sale NXP  
Semiconductors products are sold subject to the general  
terms and conditions of commercial sale, as published at  
http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an  
individual agreement is concluded only the terms and  
conditions of the respective agreement shall apply. NXP  
Semiconductors hereby expressly objects to applying the  
customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
In the event that customer uses the product for design-in  
and use in automotive applications to automotive  
specifications and standards, customer (a) shall use the  
product without NXP Semiconductors’ warranty of the  
product for such automotive applications, use and  
specifications, and (b) whenever customer uses the  
product for automotive applications beyond NXP  
Semiconductors’ specifications such use shall be solely at  
customer’s own risk, and (c) customer fully indemnifies  
NXP Semiconductors for any liability, damages or failed  
product claims resulting from customer design and use of  
the product for automotive applications beyond NXP  
Semiconductors’ standard warranty and NXP  
No offer to sell or license Nothing in this document  
may be interpreted or construed as an offer to sell products  
that is open for acceptance or the grant, conveyance or  
implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
Semiconductors’ product specifications.  
Export control This document as well as the item(s)  
described herein may be subject to export control  
regulations. Export might require a prior authorization from  
national authorities.  
2010 Sep 15  
13  
NXP Semiconductors  
provides High Performance Mixed Signal and Standard Product  
solutions that leverage its leading RF, Analog, Power Management,  
Interface, Security and Digital Processing expertise  
Customer notification  
This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal  
definitions and disclaimers. No changes were made to the technical content, except for the marking codes  
and the package outline drawings which were updated to the latest version.  
Contact information  
For additional information please visit: http://www.nxp.com  
For sales offices addresses send e-mail to: salesaddresses@nxp.com  
© NXP B.V. 2010  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.  
The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changed  
without notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any license  
under patent- or other industrial or intellectual property rights.  
Printed in The Netherlands  
R77/02/pp14  
Date of release: 2010 Sep 15  

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