BT136-500E [NXP]

Triacs sensitive gate; 三端双向可控硅敏感栅
BT136-500E
型号: BT136-500E
厂家: NXP    NXP
描述:

Triacs sensitive gate
三端双向可控硅敏感栅

栅极 可控硅 三端双向交流开关
文件: 总6页 (文件大小:41K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT136 series E  
GENERAL DESCRIPTION  
QUICK REFERENCE DATA  
Passivated, sensitive gate triacs in a  
plastic envelope, intended for use in  
SYMBOL PARAMETER  
MAX.  
MAX.  
UNIT  
general  
purpose  
and  
bidirectional  
phase control  
BT136-  
600E  
600  
800E  
800  
switching  
applications, where high sensitivity is  
required in all four quadrants.  
VDRM  
Repetitive peak off-state  
voltages  
V
IT(RMS)  
ITSM  
RMS on-state current  
Non-repetitive peak on-state  
current  
4
25  
4
25  
A
A
PINNING - TO220AB  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
main terminal 1  
tab  
T2  
T1  
2
main terminal 2  
gate  
3
G
1 2 3  
tab main terminal 2  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134).  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
V
-600  
-800  
800  
VDRM  
Repetitive peak off-state  
voltages  
-
-
6001  
IT(RMS)  
ITSM  
RMS on-state current  
Non-repetitive peak  
on-state current  
full sine wave; Tmb 107 ˚C  
full sine wave; Tj = 25 ˚C prior to  
surge  
4
A
t = 20 ms  
-
-
-
25  
27  
3.1  
A
A
t = 16.7 ms  
I2t  
dIT/dt  
I2t for fusing  
Repetitive rate of rise of  
on-state current after  
triggering  
t = 10 ms  
A2s  
ITM = 6 A; IG = 0.2 A;  
dIG/dt = 0.2 A/µs  
T2+ G+  
-
50  
50  
50  
10  
2
5
5
0.5  
150  
125  
A/µs  
A/µs  
A/µs  
A/µs  
A
T2+ G-  
-
T2- G-  
-
T2- G+  
-
IGM  
Peak gate current  
Peak gate voltage  
Peak gate power  
Average gate power  
Storage temperature  
Operating junction  
temperature  
-
VGM  
PGM  
PG(AV)  
Tstg  
Tj  
-
V
-
-
W
over any 20 ms period  
W
-40  
-
˚C  
˚C  
1 Although not recommended, off-state voltages up to 800V may be applied without damage, but the triac may  
switch to the on-state. The rate of rise of current should not exceed 3 A/µs.  
June 2001  
1
Rev 1.400  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT136 series E  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
Rth j-mb  
Thermal resistance  
full cycle  
-
-
-
-
-
60  
3.0  
3.7  
-
K/W  
K/W  
K/W  
junction to mounting base half cycle  
Rth j-a  
Thermal resistance  
junction to ambient  
in free air  
STATIC CHARACTERISTICS  
Tj = 25 ˚C unless otherwise stated  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IGT  
Gate trigger current  
VD = 12 V; IT = 0.1 A  
T2+ G+  
T2+ G-  
T2- G-  
T2- G+  
-
-
-
-
2.5  
4.0  
5.0  
11  
10  
10  
10  
25  
mA  
mA  
mA  
mA  
IL  
Latching current  
VD = 12 V; IGT = 0.1 A  
T2+ G+  
T2+ G-  
T2- G-  
T2- G+  
-
3.0  
10  
15  
20  
mA  
mA  
mA  
mA  
mA  
V
V
V
mA  
-
-
2.5  
4.0  
2.2  
1.4  
0.7  
0.4  
0.1  
15  
-
20  
IH  
VT  
VGT  
Holding current  
On-state voltage  
Gate trigger voltage  
VD = 12 V; IGT = 0.1 A  
IT = 5 A  
-
15  
-
1.70  
1.5  
-
VD = 12 V; IT = 0.1 A  
-
0.25  
-
VD = 400 V; IT = 0.1 A; Tj = 125 ˚C  
ID  
Off-state leakage current VD = VDRM(max); Tj = 125 ˚C  
0.5  
DYNAMIC CHARACTERISTICS  
Tj = 25 ˚C unless otherwise stated  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
dVD/dt  
tgt  
Critical rate of rise of  
off-state voltage  
Gate controlled turn-on  
time  
VDM = 67% VDRM(max); Tj = 125 ˚C;  
exponential waveform; gate open circuit  
ITM = 6 A; VD = VDRM(max); IG = 0.1 A;  
dIG/dt = 5 A/µs  
-
-
50  
2
-
-
V/µs  
µs  
June 2001  
2
Rev 1.400  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT136 series E  
Ptot / W  
8
Tmb(max) / C  
IT(RMS) / A  
101  
104  
107  
110  
113  
116  
119  
122  
125  
5
4
3
2
1
0
7
107 C  
= 180  
120  
1
6
5
4
3
2
1
0
90  
60  
30  
0
1
2
3
4
5
-50  
0
50  
Tmb / C  
100  
150  
IT(RMS) / A  
Fig.1. Maximum on-state dissipation, Ptot, versus rms  
on-state current, IT(RMS), where α = conduction angle.  
Fig.4. Maximum permissible rms current IT(RMS)  
versus mounting base temperature Tmb.  
,
IT(RMS) / A  
12  
ITSM / A  
1000  
I
TSM  
time  
I
T
10  
8
T
Tj initial = 25 C max  
100  
6
dIT/dt limit  
4
T2- G+ quadrant  
2
10  
10us  
0
100us  
1ms  
T / s  
10ms  
100ms  
0.01  
0.1  
surge duration / s  
1
10  
Fig.2. Maximum permissible non-repetitive peak  
on-state current ITSM, versus pulse width tp, for  
sinusoidal currents, tp 20ms.  
Fig.5. Maximum permissible repetitive rms on-state  
current IT(RMS), versus surge duration, for sinusoidal  
currents, f = 50 Hz; Tmb 107˚C.  
VGT(Tj)  
VGT(25 C)  
ITSM / A  
30  
25  
20  
15  
10  
5
1.6  
I
TSM  
time  
I
T
1.4  
1.2  
1
T
Tj initial = 25 C max  
0.8  
0.6  
0.4  
0
1
10  
100  
1000  
-50  
0
50  
Tj / C  
100  
150  
Number of cycles at 50Hz  
Fig.3. Maximum permissible non-repetitive peak  
on-state current ITSM, versus number of cycles, for  
sinusoidal currents, f = 50 Hz.  
Fig.6. Normalised gate trigger voltage  
VGT(Tj)/ VGT(25˚C), versus junction temperature Tj.  
June 2001  
3
Rev 1.400  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT136 series E  
IT / A  
IGT(Tj)  
IGT(25 C)  
12  
10  
8
Tj = 125 C  
Tj = 25 C  
3
T2+ G+  
T2+ G-  
T2- G-  
T2- G+  
typ  
max  
Vo = 1.27 V  
Rs = 0.091 ohms  
2.5  
2
6
1.5  
1
4
2
0.5  
0
0
0
0.5  
1
1.5  
VT / V  
2
2.5  
3
-50  
0
50  
Tj / C  
100  
150  
Fig.7. Normalised gate trigger current  
IGT(Tj)/ IGT(25˚C), versus junction temperature Tj.  
Fig.10. Typical and maximum on-state characteristic.  
Zth j-mb (K/W)  
10  
IL(Tj)  
IL(25 C)  
3
unidirectional  
2.5  
2
bidirectional  
1
1.5  
1
t
P
D
0.1  
p
t
0.5  
0
0.01  
10us  
0.1ms  
1ms  
10ms  
tp / s  
0.1s  
1s  
10s  
-50  
0
50  
Tj / C  
100  
150  
Fig.8. Normalised latching current IL(Tj)/ IL(25˚C),  
Fig.11. Transient thermal impedance Zth j-mb, versus  
pulse width tp.  
versus junction temperature Tj.  
dVD/dt (V/us)  
1000  
IH(Tj)  
IH(25C)  
3
2.5  
2
100  
10  
1
1.5  
1
0.5  
0
-50  
0
50  
100  
150  
0
50  
100  
150  
Tj / C  
Tj / C  
Fig.9. Normalised holding current IH(Tj)/ IH(25˚C),  
Fig.12. Typical, critical rate of rise of off-state voltage,  
dVD/dt versus junction temperature Tj.  
versus junction temperature Tj.  
June 2001  
4
Rev 1.400  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT136 series E  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 2 g  
4,5  
max  
10,3  
max  
1,3  
3,7  
2,8  
5,9  
min  
15,8  
max  
3,0 max  
not tinned  
3,0  
13,5  
min  
1,3  
1 2 3  
max  
(2x)  
0,9 max (3x)  
0,6  
2,4  
2,54 2,54  
Fig.13. SOT78 (TO220AB). pin 2 connected to mounting base.  
Notes  
1. Refer to mounting instructions for SOT78 (TO220) envelopes.  
2. Epoxy meets UL94 V0 at 1/8".  
June 2001  
5
Rev 1.400  
Philips Semiconductors  
Product specification  
Triacs  
sensitive gate  
BT136 series E  
DEFINITIONS  
DATA SHEET STATUS  
DATA SHEET  
STATUS2  
PRODUCT  
DEFINITIONS  
STATUS3  
Objective data  
Development  
This data sheet contains data from the objective specification for  
product development. Philips Semiconductors reserves the right to  
change the specification in any manner without notice  
Preliminary data  
Qualification  
Production  
This data sheet contains data from the preliminary specification.  
Supplementary data will be published at a later date. Philips  
Semiconductors reserves the right to change the specification without  
notice, in ordere to improve the design and supply the best possible  
product  
Product data  
This data sheet contains data from the product specification. Philips  
Semiconductors reserves the right to make changes at any time in  
order to improve the design, manufacturing and supply. Changes will  
be communicated according to the Customer Product/Process  
Change Notification (CPCN) procedure SNW-SQ-650A  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 2001  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
2 Please consult the most recently issued datasheet before initiating or completing a design.  
3 The product status of the device(s) described in this datasheet may have changed since this datasheet was  
published. The latest information is available on the Internet at URL http://www.semiconductors.philips.com.  
June 2001  
6
Rev 1.400  

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