BTA216-600B,127 [NXP]

BTA216-600B;
BTA216-600B,127
型号: BTA216-600B,127
厂家: NXP    NXP
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BTA216-600B

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DISCRETE SEMICONDUCTORSꢀ  
DATA SHEET  
BTA216 series B  
Three quadrant triacs  
high commutation  
Product specification  
October 1997  
ꢁꢂꢃ Semiconductorsꢀ  
Product specification  
Three quadrant triacs  
high commutation  
BTA216 series B  
GENERAL DESCRIPTION  
QUICK REFERENCE DATA  
Glass passivated high commutation  
triacs in a plastic envelope intended  
foruseincircuitswherehighstaticand  
dynamic dV/dt and high dI/dt can  
occur. These devices will commutate  
the full rated rms current at the  
maximum rated junction temperature,  
without the aid of a snubber.  
SYMBOL PARAMETER  
MAX. MAX. MAX. UNIT  
500B 600B 800B  
BTA216-  
Repetitive peak off-state  
voltages  
VDRM  
500  
600  
800  
V
IT(RMS)  
ITSM  
RMS on-state current  
Non-repetitive peak on-state  
current  
16  
140  
16  
140  
16  
140  
A
A
PINNING - TO220AB  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
main terminal 1  
tab  
T2  
T1  
2
main terminal 2  
gate  
3
G
1 2 3  
tab main terminal 2  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134).  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
V
-500  
5001  
-600  
-800  
800  
VDRM  
Repetitive peak off-state  
voltages  
-
-
6001  
IT(RMS)  
ITSM  
RMS on-state current  
full sine wave;  
Tmb 99 ˚C  
full sine wave;  
Tj = 25 ˚C prior to  
surge  
16  
A
Non-repetitive peak  
on-state current  
t = 20 ms  
t = 16.7 ms  
t = 10 ms  
ITM = 20 A; IG = 0.2 A;  
dIG/dt = 0.2 A/μs  
-
-
-
140  
150  
98  
A
A
I2t  
dIT/dt  
I2t for fusing  
Repetitive rate of rise of  
on-state current after  
triggering  
A2s  
A/μs  
100  
IGM  
Peak gate current  
Peak gate voltage  
Peak gate power  
Average gate power  
-
-
-
-
2
5
5
0.5  
A
V
W
W
VGM  
PGM  
PG(AV)  
over any 20 ms  
period  
Tstg  
Tj  
Storage temperature  
Operating junction  
temperature  
-40  
-
150  
125  
˚C  
˚C  
1 Although not recommended, off-state voltages up to 800V may be applied without damage, but the triac may  
switch to the on-state. The rate of rise of current should not exceed 15 A/μs.  
October 1997  
1
Rev 1.200  
ꢁꢂꢃ Semiconductors  
Product specification  
Three quadrant triacs  
high commutation  
BTA216 series B  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
Rth j-mb  
Rth j-a  
Thermal resistance full cycle  
junction to mounting base half cycle  
-
-
-
-
-
60  
1.2  
1.7  
-
K/W  
K/W  
K/W  
Thermal resistance  
junction to ambient  
in free air  
STATIC CHARACTERISTICS  
Tj = 25 ˚C unless otherwise stated  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IGT  
Gate trigger current2  
VD = 12 V; IT = 0.1 A  
T2+ G+  
T2+ G-  
T2- G-  
2
2
2
18  
21  
34  
50  
50  
50  
mA  
mA  
mA  
IL  
Latching current  
VD = 12 V; IGT = 0.1 A  
T2+ G+  
T2+ G-  
T2- G-  
-
-
-
-
31  
34  
30  
31  
1.2  
0.7  
0.4  
0.1  
60  
90  
60  
60  
1.5  
1.5  
-
mA  
mA  
mA  
mA  
V
V
V
mA  
IH  
VT  
VGT  
Holding current  
On-state voltage  
Gate trigger voltage  
VD = 12 V; IGT = 0.1 A  
IT = 20 A  
VD = 12 V; IT = 0.1 A  
-
-
0.25  
-
VD = 400 V; IT = 0.1 A; Tj = 125 ˚C  
Off-state leakage current VD = VDRM(max); Tj = 125 ˚C  
ID  
0.5  
DYNAMIC CHARACTERISTICS  
Tj = 25 ˚C unless otherwise stated  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
dVD/dt  
dIcom/dt  
tgt  
Critical rate of rise of  
off-state voltage  
Critical rate of change of  
commutating current  
Gate controlled turn-on  
time  
VDM = 67% VDRM(max); Tj = 125 ˚C;  
exponential waveform; gate open circuit  
VDM = 400 V; Tj = 125 ˚C; IT(RMS) = 16 A;  
without snubber; gate open circuit  
ITM = 20 A; VD = VDRM(max); IG = 0.1 A;  
dIG/dt = 5 A/μs  
1000 4000  
-
-
-
V/μs  
A/ms  
μs  
-
-
28  
2
2 Device does not trigger in the T2-, G+ quadrant.  
October 1997  
2
Rev 1.200  
ꢁꢂꢃ Semiconductors  
Product specification  
Three quadrant triacs  
high commutation  
BTA216 series B  
IT(RMS) / A  
Tmb(max) / C  
= 180  
Ptot / W  
20  
15  
10  
5
25  
95  
99 C  
101  
107  
20  
1
120  
90  
15  
10  
5
60  
30  
113  
119  
125  
0
0
-50  
0
50  
Tmb / C  
100  
150  
0
5
10  
IT(RMS) / A  
15  
20  
Fig.1. Maximum on-state dissipation, Ptot, versus rms  
on-state current, IT(RMS), where α = conduction angle.  
Fig.4. Maximum permissible rms current IT(RMS)  
versus mounting base temperature Tmb.  
,
ITSM / A  
IT(RMS) / A  
1000  
50  
40  
30  
20  
10  
0
dIT/dt limit  
100  
I
TSM  
time  
I
T
T
Tj initial = 25 C max  
10ms 100ms  
10  
10us  
100us  
1ms  
T / s  
0.01  
0.1  
surge duration / s  
1
10  
Fig.2. Maximum permissible non-repetitive peak  
on-state current ITSM, versus pulse width tp, for  
sinusoidal currents, tp 20ms.  
Fig.5. Maximum permissible repetitive rms on-state  
current IT(RMS), versus surge duration, for sinusoidal  
currents, f = 50 Hz; Tmb 99˚C.  
VGT(Tj)  
VGT(25 C)  
ITSM / A  
150  
100  
50  
1.6  
1.4  
1.2  
1
I
TSM  
time  
I
T
T
Tj initial = 25 C max  
0.8  
0.6  
0.4  
0
1
10 100  
Number of cycles at 50Hz  
1000  
-50  
0
50  
Tj / C  
100  
150  
Fig.3. Maximum permissible non-repetitive peak  
on-state current ITSM, versus number of cycles, for  
sinusoidal currents, f = 50 Hz.  
Fig.6. Normalised gate trigger voltage  
VGT(Tj)/ VGT(25˚C), versus junction temperature Tj.  
October 1997  
3
Rev 1.200  
ꢁꢂꢃ Semiconductors  
Product specification  
Three quadrant triacs  
high commutation  
BTA216 series B  
IGT(Tj)  
IGT(25 C)  
typ  
IT / A  
50  
40  
30  
20  
10  
0
Tj = 125 C  
Tj = 25 C  
3
2.5  
2
T2+ G+  
T2+ G-  
T2- G-  
max  
Vo = 1.195 V  
Rs = 0.018 Ohms  
1.5  
1
0.5  
0
0
0.5  
1
1.5  
VT / V  
2
2.5  
3
-50  
0
50  
Tj / C  
100  
150  
Fig.7. Normalised gate trigger current  
IGT(Tj)/ IGT(25˚C), versus junction temperature Tj.  
Fig.10. Typical and maximum on-state characteristic.  
IL(Tj)  
IL(25 C)  
Zth j-mb (K/W)  
10  
1
3
2.5  
2
unidirectional  
bidirectional  
0.1  
1.5  
1
t
P
D
p
0.01  
0.001  
t
0.5  
0
10us  
0.1ms  
1ms  
10ms  
tp / s  
0.1s  
1s  
10s  
-50  
0
50  
Tj / C  
100  
150  
Fig.8. Normalised latching current IL(Tj)/ IL(25˚C),  
versus junction temperature Tj.  
Fig.11. Transient thermal impedance Zth j-mb, versus  
pulse width tp.  
IH(Tj)  
dIcom/dt (A/ms)  
1000  
100  
10  
IH(25C)  
3
2.5  
2
1.5  
1
0.5  
0
1
20  
40  
60  
80  
100  
120  
140  
-50  
0
50  
Tj / C  
100  
150  
Tj / C  
Fig.9. Normalised holding current IH(Tj)/ IH(25˚C),  
versus junction temperature Tj.  
Fig.12. Typical, critical rate of change of commutating  
current dIcom/dt versus junction temperature.  
October 1997  
4
Rev 1.200  
ꢁꢂꢃ Semiconductors  
Product specification  
Three quadrant triacs  
high commutation  
BTA216 series B  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 2 g  
4,5  
max  
10,3  
max  
1,3  
3,7  
2,8  
5,9  
min  
15,8  
max  
3,0 max  
not tinned  
3,0  
13,5  
min  
1,3  
1 2 3  
max  
(2x)  
0,9 max (3x)  
0,6  
2,4  
2,54 2,54  
Fig.13. TO220AB; pin 2 connected to mounting base.  
Notes  
1. Refer to mounting instructions for TO220 envelopes.  
2. Epoxy meets UL94 V0 at 1/8".  
October 1997  
5
Rev 1.200  
NXP Semiconductors  
Legal information  
DATA SHEET STATUS  
DOCUMENT  
STATUS(1)  
PRODUCT  
STATUS(2)  
DEFINITION  
Objective data sheet  
Development  
This document contains data from the objective specification for product  
development.  
Preliminary data sheet  
Product data sheet  
Qualification  
Production  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Notes  
1. Please consult the most recently issued document before initiating or completing a design.  
2. The product status of device(s) described in this document may have changed since this document was published  
and may differ in case of multiple devices. The latest product status information is available on the Internet at  
URL http://www.nxp.com.  
DEFINITIONS  
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not designed, authorized or warranted to be suitable for  
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equipment, nor in applications where failure or malfunction  
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extract of the product data given in the Limiting values and  
Characteristics sections of this document, and as such is  
not complete, exhaustive or legally binding.  
Limiting values Stress above one or more limiting  
values (as defined in the Absolute Maximum Ratings  
System of IEC 60134) will cause permanent damage to  
the device. Limiting values are stress ratings only and  
(proper) operation of the device at these or any other  
conditions above those given in the Recommended  
operating conditions section (if present) or the  
Characteristics sections of this document is not warranted.  
Constant or repeated exposure to limiting values will  
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