BUK7Y38-100E [NXP]

N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56; N沟道100伏,在LFPAK56 38英里©标准级MOSFET
BUK7Y38-100E
型号: BUK7Y38-100E
厂家: NXP    NXP
描述:

N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56
N沟道100伏,在LFPAK56 38英里©标准级MOSFET

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A
P
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
F
L
20 February 2013  
Product data sheet  
1. General description  
Standard level N-channel MOSFET in an LFPAK56 (Power SO8) package using  
TrenchMOS technology. This product has been designed and qualified to AEC Q101  
standard for use in high performance automotive applications.  
2. Features and benefits  
Q101 compliant  
Repetitive avalanche rated  
Suitable for thermally demanding environments due to 175 °C rating  
True standard level gate with VGS(th) rating of greater than 1 V at 175 °C  
3. Applications  
12 V, 24 V and 48 V Automotive systems  
Motors, lamps and solenoid control  
Transmission control  
Ultra high performance power switching  
4. Quick reference data  
Table 1.  
Symbol  
Quick reference data  
Parameter  
Conditions  
Min  
Typ  
Max  
100  
30  
Unit  
V
VDS  
ID  
drain-source voltage  
drain current  
Tj ≥ 25 °C; Tj ≤ 175 °C  
VGS = 10 V; Tmb = 25 °C; Fig. 1  
-
-
-
-
-
-
A
Ptot  
total power dissipation Tmb = 25 °C; Fig. 2  
95  
W
Static characteristics  
RDSon drain-source on-state  
resistance  
Dynamic characteristics  
QGD gate-drain charge  
VGS = 10 V; ID = 5 A; Tj = 25 °C; Fig. 11  
-
-
24.5  
11.3  
38  
-
mΩ  
nC  
VGS = 10 V; ID = 5 A; VDS = 80 V;  
Tj = 25 °C; Fig. 13; Fig. 14  
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NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
5. Pinning information  
Table 2.  
Pin  
Pinning information  
Symbol Description  
Simplified outline  
Graphic symbol  
mb  
D
S
1
S
S
S
G
D
source  
source  
source  
gate  
2
G
3
mbb076  
4
1
2 3 4  
mb  
mounting base; connected to  
drain  
LFPAK; Power-  
SO8 (SOT669)  
6. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
BUK7Y38-100E  
LFPAK;  
plastic single-ended surface-mounted package; 4 leads  
SOT669  
Power-SO8  
7. Marking  
Table 4.  
Marking codes  
Type number  
Marking code  
BUK7Y38-100E  
73810E  
8. Limiting values  
Table 5.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDS  
Parameter  
Conditions  
Min  
Max  
100  
100  
20  
Unit  
drain-source voltage  
drain-gate voltage  
gate-source voltage  
drain current  
Tj ≥ 25 °C; Tj ≤ 175 °C  
RGS = 20 kΩ  
-
V
VDGR  
VGS  
-
V
Tj ≤ 175 °C; DC  
-20  
V
ID  
Tmb = 25 °C; VGS = 10 V; Fig. 1  
Tmb = 100 °C; VGS = 10 V; Fig. 1  
Tmb = 25 °C; pulsed; tp ≤ 10 µs; Fig. 4  
Tmb = 25 °C; Fig. 2  
-
30  
A
-
21  
A
IDM  
Ptot  
Tstg  
peak drain current  
-
120  
95  
A
total power dissipation  
storage temperature  
-
W
°C  
-55  
175  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
2 / 13  
 
 
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
Symbol  
Parameter  
Conditions  
Min  
Max  
Unit  
Tj  
junction temperature  
-55  
175  
°C  
Source-drain diode  
IS  
source current  
peak source current  
Tmb = 25 °C  
-
-
30  
A
A
ISM  
pulsed; tp ≤ 10 µs; Tmb = 25 °C  
120  
Avalanche ruggedness  
EDS(AL)S non-repetitive drain-source  
avalanche energy  
ID = 30 A; Vsup ≤ 100 V; RGS = 50 Ω;  
VGS = 10 V; Tj(init) = 25 °C; unclamped;  
Fig. 3  
[1][2]  
-
45.2  
mJ  
[1] Single-pulse avalanche rating limited by maximum junction temperature of 175 °C.  
[2] Refer to application note AN10273 for further information.  
003aai565  
03aa16  
40  
30  
20  
10  
0
120  
I
D
(A)  
P
der  
(%)  
80  
40  
0
0
30  
60  
90  
120  
150  
T (°C)  
j
180  
0
50  
100  
150  
200  
T
(°C)  
mb  
Fig. 1. Continuous drain current as a function of  
mounting base temperature  
Fig. 2. Normalized total power dissipation as a  
function of mounting base temperature  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
3 / 13  
 
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
003aai566  
2
10  
I
AL  
(A)  
(1)  
10  
(2)  
(3)  
1
-1  
10  
-2  
10  
-3  
-2  
-1  
10  
10  
10  
1
AL  
10  
t
(ms)  
Fig. 3. Avalanche rating; avalanche current as a function of avalanche time  
003aai567  
3
10  
I
D
(A)  
Limit R  
= V / I  
DS  
DSon  
D
2
10  
t
= 10 us  
p
10  
100 us  
1
DC  
1 ms  
-1  
10  
10 ms  
100 ms  
-2  
10  
2
3
1
10  
10  
10  
V
(V)  
DS  
Fig. 4. Safe operating area; continuous and peak drain currents as a function of drain-source voltage  
9. Thermal characteristics  
Table 6.  
Symbol  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
K/W  
Rth(j-mb)  
thermal resistance  
from junction to  
mounting base  
Fig. 5  
-
-
1.58  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
4 / 13  
 
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
003aai568  
10  
Z
th(j-mb)  
(K/W)  
1
δ = 0.5  
0.2  
0.1  
-1  
10  
10  
10  
0.05  
0.02  
single shot  
t
p
P
δ =  
T
-2  
t
t
p
T
-3  
-6  
-5  
-4  
-3  
-2  
-1  
10  
10  
10  
10  
10  
10  
1
t
p
(s)  
Fig. 5. Transient thermal impedance from junction to mounting base as a function of pulse duration  
10. Characteristics  
Table 7.  
Symbol  
Characteristics  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Static characteristics  
V(BR)DSS drain-source  
breakdown voltage  
ID = 250 µA; VGS = 0 V; Tj = 25 °C  
ID = 250 µA; VGS = 0 V; Tj = -55 °C  
100  
90  
-
-
V
V
V
-
-
VGS(th)  
gate-source threshold ID = 1 mA; VDS = VGS; Tj = 25 °C;  
2.4  
3
4
voltage  
Fig. 9; Fig. 10  
ID = 1 mA; VDS = VGS; Tj = -55 °C;  
Fig. 9  
-
-
-
4.5  
-
V
V
ID = 1 mA; VDS = VGS; Tj = 175 °C;  
Fig. 9  
1
IDSS  
drain leakage current  
gate leakage current  
VDS = 100 V; VGS = 0 V; Tj = 25 °C  
VDS = 100 V; VGS = 0 V; Tj = 175 °C  
VGS = 20 V; VDS = 0 V; Tj = 25 °C  
VGS = -20 V; VDS = 0 V; Tj = 25 °C  
VGS = 10 V; ID = 5 A; Tj = 25 °C; Fig. 11  
-
-
-
-
-
-
0.05  
1
µA  
µA  
nA  
-
500  
100  
100  
38  
IGSS  
2
2
nA  
RDSon  
drain-source on-state  
resistance  
24.5  
-
mΩ  
mΩ  
VGS = 10 V; ID = 5 A; Tj = 175 °C;  
Fig. 12; Fig. 11  
105  
Dynamic characteristics  
QG(tot) total gate charge  
QGS  
ID = 5 A; VDS = 80 V; VGS = 10 V;  
Tj = 25 °C; Fig. 13; Fig. 14  
-
-
-
30.9  
5
-
-
-
nC  
nC  
nC  
gate-source charge  
gate-drain charge  
QGD  
11.3  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
5 / 13  
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
Symbol  
Ciss  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
input capacitance  
output capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz;  
Tj = 25 °C; Fig. 15  
-
-
-
1293 1720 pF  
Coss  
145  
109  
174  
149  
pF  
pF  
Crss  
reverse transfer  
capacitance  
td(on)  
tr  
td(off)  
tf  
turn-on delay time  
rise time  
VDS = 80 V; RL = 10 Ω; VGS = 10 V;  
RG(ext) = 5 Ω; Tj = 25 °C  
-
-
-
-
6.6  
9.9  
22  
-
-
-
-
ns  
ns  
ns  
ns  
turn-off delay time  
fall time  
12.6  
Source-drain diode  
VSD source-drain voltage  
trr  
IS = 5 A; VGS = 0 V; Tj = 25 °C; Fig. 16  
-
-
-
0.79  
34.2  
45.5  
1.2  
V
reverse recovery time IS = 10 A; dIS/dt = -100 A/µs; VGS = 0 V;  
-
-
ns  
nC  
VDS = 25 V  
Qr  
recovered charge  
003aai569  
003aai570  
80  
64  
48  
32  
16  
0
100  
R
DSon  
10 V  
I
D
6 V  
(A)  
5.5 V  
80  
5 V  
60  
40  
20  
0
4.5 V  
= 4 V  
V
GS  
0
1.5  
3
4.5  
DS  
6
0
4
8
12  
16  
V (V)  
GS  
20  
V
(V)  
Tj = 25 °C; tp = 300 μs  
Fig. 7. Drain-source on-state resistance as a function  
of gate-source voltage; typical values  
Fig. 6. Output characteristics; drain current as a  
function of drain-source voltage; typical values  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
6 / 13  
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
003aai572  
003aah027  
50  
5
I
D
V
GS(th)  
(V)  
(A)  
max  
40  
30  
20  
10  
0
4
3
2
1
0
typ  
min  
175°C  
T = 25°C  
j
-60  
0
60  
120  
180  
0
1
2
3
4
5
6
T ( C)  
V
(V)  
°
GS  
j
Fig. 8. Transfer characteristics; drain current as a  
function of gate-source voltage; typical values  
Fig. 9. Gate-source threshold voltage as a function of  
junction temperature  
003aah028  
003aai575  
-1  
100  
10  
R
DSon  
I
D
4.5 V  
5 V  
(A)  
-2  
80  
10  
typ  
max  
min  
-3  
-4  
-5  
-6  
10  
10  
10  
10  
60  
40  
20  
0
5.5 V  
6 V  
V
= 10 V  
GS  
0
2
4
6
0
10  
20  
30  
40  
(A)  
50  
V
(V)  
I
D
GS  
Tj = 25 °C; tp = 300 μs  
Fig. 10. Sub-threshold drain current as a function of  
gate-source voltage  
Fig. 11. Drain-source on-state resistance as a function  
of drain current; typical values  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
7 / 13  
 
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
003aaj819  
3
V
DS  
a
I
D
2.4  
1.8  
1.2  
0.6  
0
V
GS(pl)  
V
GS(th)  
GS  
V
Q
Q
GS1  
GS2  
Q
Q
GD  
GS  
Q
G(tot)  
003aaa508  
Fig. 13. Gate charge waveform definitions  
-60  
0
60  
120  
180  
Tj °C)  
(
Fig. 12. Normalized drain-source on-state resistance  
factor as a function of junction temperature  
003aai577  
003aai578  
4
10  
10  
V
GS  
(V)  
C
(pF)  
8
6
4
2
0
C
iss  
3
10  
V
= 14 V  
GS  
80 V  
C
C
oss  
rss  
2
10  
10  
-1  
2
0
5
10  
15  
20  
25  
Q
30  
(nC)  
35  
10  
1
10  
10  
V
(V)  
DS  
G
Fig. 14. Gate-source voltage as a function of gate  
charge; typical values  
Fig. 15. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
8 / 13  
 
 
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
003aai579  
120  
100  
80  
60  
40  
20  
0
I
S
(A)  
175°C  
T = 25°C  
j
0
0.2  
0.4  
0.6  
0.8  
1
(V)  
1.2  
V
SD  
Fig. 16. Source-drain (diode forward) current as a function of source-drain (diode forward) voltage; typical values  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
9 / 13  
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
11. Package outline  
Plastic single-ended surface-mounted package (LFPAK; Power-SO8); 4 leads  
SOT669  
A
2
E
A
C
c
E
b
b
2
1
2
L
3
1
mounting  
base  
b
4
D
1
D
H
L
2
1
2
3
4
X
e
w
M
c
A
b
1/2 e  
A
(A )  
3
C
A
1
θ
L
detail X  
y
C
0
2.5  
5 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
D
(1)  
D
(1)  
(1)  
1
A
A
A
H
L
L
L
2
w
y
θ
UNIT  
A
b
b
b
b
c
c
E
E
1
e
1
2
3
1
2
3
4
2
max  
1.20 0.15 1.10  
1.01 0.00 0.95  
0.50 4.41 2.2 0.9 0.25 0.30 4.10  
0.35 3.62 2.0 0.7 0.19 0.24 3.80  
5.0 3.3  
4.8 3.1  
6.2 0.85 1.3  
5.8 0.40 0.8  
1.3  
0.8  
8°  
0°  
mm  
0.25  
4.20  
1.27  
0.25 0.1  
Note  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
JEITA  
06-03-16  
11-03-25  
SOT669  
MO-235  
Fig. 17. Package outline LFPAK; Power-SO8 (SOT669)  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
10 / 13  
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
In no event shall NXP Semiconductors be liable for any indirect, incidental,  
punitive, special or consequential damages (including - without limitation -  
lost profits, lost savings, business interruption, costs related to the removal  
or replacement of any products or rework charges) whether or not such  
damages are based on tort (including negligence), warranty, breach of  
contract or any other legal theory.  
12. Legal information  
12.1 Data sheet status  
Notwithstanding any damages that customer might incur for any reason  
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards  
customer for the products described herein shall be limited in accordance  
with the Terms and conditions of commercial sale of NXP Semiconductors.  
Document  
Product  
Definition  
status [1][2] status [3]  
Objective  
[short] data  
sheet  
Development This document contains data from  
the objective specification for product  
development.  
Right to make changes — NXP Semiconductors reserves the right to  
make changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
Preliminary  
[short] data  
sheet  
Qualification This document contains data from the  
preliminary specification.  
Suitability for use in automotive applications — This NXP  
Product  
[short] data  
sheet  
Production  
This document contains the product  
specification.  
Semiconductors product has been qualified for use in automotive  
applications. Unless otherwise agreed in writing, the product is not designed,  
authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
malfunction of an NXP Semiconductors product can reasonably be expected  
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applications and therefore such inclusion and/or use is at the customer's own  
risk.  
[1] Please consult the most recently issued document before initiating or  
completing a design.  
[2] The term 'short data sheet' is explained in section "Definitions".  
[3] The product status of device(s) described in this document may have  
changed since this document was published and may differ in case of  
multiple devices. The latest product status information is available on  
the Internet at URL http://www.nxp.com.  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
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products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
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the accuracy or completeness of information included herein and shall have  
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the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those  
given in the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
12.3 Disclaimers  
Terms and conditions of commercial sale — NXP Semiconductors  
products are sold subject to the general terms and conditions of commercial  
sale, as published at http://www.nxp.com/profile/terms, unless otherwise  
agreed in a valid written individual agreement. In case an individual  
agreement is concluded only the terms and conditions of the respective  
agreement shall apply. NXP Semiconductors hereby expressly objects to  
applying the customer’s general terms and conditions with regard to the  
purchase of NXP Semiconductors products by customer.  
Limited warranty and liability — Information in this document is believed  
to be accurate and reliable. However, NXP Semiconductors does not give  
any representations or warranties, expressed or implied, as to the accuracy  
or completeness of such information and shall have no liability for the  
consequences of use of such information. NXP Semiconductors takes no  
responsibility for the content in this document if provided by an information  
source outside of NXP Semiconductors.  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
11 / 13  
 
 
 
 
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Export control — This document as well as the item(s) described herein  
may be subject to export control regulations. Export might require a prior  
authorization from competent authorities.  
Translations — A non-English (translated) version of a document is for  
reference only. The English version shall prevail in case of any discrepancy  
between the translated and English versions.  
12.4 Trademarks  
Notice: All referenced brands, product names, service names and  
trademarks are the property of their respective owners.  
Adelante, Bitport, Bitsound, CoolFlux, CoReUse, DESFire, EZ-HV,  
FabKey, GreenChip, HiPerSmart, HITAG, I²C-bus logo, ICODE, I-CODE,  
ITEC, Labelution, MIFARE, MIFARE Plus, MIFARE Ultralight, MoReUse,  
QLPAK, Silicon Tuner, SiliconMAX, SmartXA, STARplug, TOPFET,  
TrenchMOS, TriMedia and UCODE — are trademarks of NXP B.V.  
HD Radio and HD Radio logo — are trademarks of iBiquity Digital  
Corporation.  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
12 / 13  
 
NXP Semiconductors  
BUK7Y38-100E  
N-channel 100 V, 38 mΩ standard level MOSFET in LFPAK56  
13. Contents  
1
General description ............................................... 1  
2
Features and benefits ............................................1  
Applications ........................................................... 1  
Quick reference data ............................................. 1  
Pinning information ...............................................2  
Ordering information .............................................2  
Marking ...................................................................2  
Limiting values .......................................................2  
Thermal characteristics .........................................4  
Characteristics .......................................................5  
Package outline ................................................... 10  
3
4
5
6
7
8
9
10  
11  
12  
Legal information .................................................11  
Data sheet status ............................................... 11  
Definitions ...........................................................11  
Disclaimers .........................................................11  
Trademarks ........................................................ 12  
12.1  
12.2  
12.3  
12.4  
© NXP B.V. 2013. All rights reserved  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 20 February 2013  
BUK7Y38-100E  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2013. All rights reserved  
Product data sheet  
20 February 2013  
13 / 13  

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