CLF1G0060-30U [NXP]
CLF1G0060-30;型号: | CLF1G0060-30U |
厂家: | NXP |
描述: | CLF1G0060-30 局域网 放大器 CD 晶体管 |
文件: | 总19页 (文件大小:202K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
CLF1G0060-30; CLF1G0060S-30
Broadband RF power GaN HEMT
Rev. 4 — 20 June 2013
Objective data sheet
1. Product profile
1.1 General description
The CLF1G0060-30 and CLF1G0060S-30 are 30 W general purpose broadband GaN
HEMTs usable from DC to 6.0 GHz.
Table 1.
CW and pulsed RF application information
Typical RF performance at Tcase = 25 C; IDq = 70 mA; VDS = 50 V in a class-AB broadband demo
board.
Test signal
f
PL
(W)
30
30
30
30
30
30
30
30
30
30
Gp
D
(MHz)
500
(dB)
15.6
13.9
13.7
12.6
14.2
16.6
15.8
15.5
14.5
15.9
(%)
60.7
50.3
50.8
49
1-Tone CW
1000
1500
2000
2500
500
55.6
61
1-Tone pulsed [1]
1000
1500
2000
2500
50
52.5
50
59
[1] Pulsed RF; tp = 100 s; = 10 %.
Table 2.
2-Tone CW application information
Typical 2-Tone performance at Tcase = 25 C; IDq = 150 mA; VDS = 50 V in a class-AB broadband
demo board.
Test signal
f
PL(PEP)
(W)
10
IMD3
(dBc)
38
(MHz)
500
2-Tone CW [1]
1000
1500
2000
2500
10
50
10
45
10
50
10
43
[1] 2-Tone CW; f = 1 MHz.
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
1.2 Features and benefits
Frequency of operation is from DC to 6.0 GHz
30 W general purpose broadband RF Power GaN HEMT
Excellent ruggedness (VSWR = 10 : 1)
High voltage operation (50 V)
Thermally enhanced package
1.3 Applications
Commercial wireless infrastructure
(cellular, WiMAX)
Industrial, scientific, medical
Radar
Jammers
Broadband general purpose amplifier
Public mobile radios
EMC testing
Defense application
2. Pinning information
Table 3.
Pin
CLF1G0060-30 (SOT1227A)
Pinning
Description
Simplified outline
Graphic symbol
1
2
3
drain
gate
ꢀ
ꢀ
ꢂ
[1]
source
ꢂ
ꢁ
ꢁ
DDDꢀꢁꢁꢂꢃꢄꢂ
CLF1G0060S-30 (SOT1227B)
1
2
3
drain
gate
ꢀ
ꢀ
ꢂ
ꢂ
[1]
source
ꢁ
DDDꢀꢁꢁꢂꢃꢄꢂ
[1] Connected to flange.
3. Ordering information
Table 4.
Ordering information
Type number
Package
Name Description
Version
CLF1G0060-30
CLF1G0060S-30
-
-
flanged ceramic package; 2 mounting holes; 2 leads SOT1227A
earless flanged ceramic package; 2 leads
SOT1227B
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
2 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
4. Limiting values
Table 5.
Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol
VDS
VGS
IGF
Parameter
Conditions
Min
Max
150
+3
Unit
V
drain-source voltage
gate-source voltage
forward gate current
storage temperature
junction temperature
-
8
V
external RG = 5
-
11
mA
Tstg
65
+150 C
Tj
measured via IR scan
-
250
C
5. Thermal characteristics
Table 6.
Thermal characteristics
Symbol Parameter
Rth(j-c)
Conditions
Typ
Unit
[1]
thermal resistance from junction to case
Tj = 200 C
3.1
K/W
[1] Tj is measured via IR scan with case temperature of 85 C and power dissipation of 34 W.
6. Characteristics
Table 7.
DC Characteristics
Tcase = 25 C; unless otherwise specified.
Symbol Parameter
Conditions
Min
Typ
Max Unit
V(BR)DSS drain-source breakdown voltage VGS = 7 V;
150
-
-
V
IDS = 7.2 mA
VGS(th)
gate-source threshold voltage
VDS = 0.1 V;
IDS = 7.2 mA
2.4 2
1.6
V
IDSX
gfs
drain cut-off current
VDS = 10 V; VGS = 3 V
VDS = 10 V; VGS = 0 V
-
-
5.1
1.1
-
-
A
S
forward transconductance
Table 8.
RF Characteristics
Test signal: pulsed RF; tp = 100 s; = 10 %; RF performance at VDS = 50 V; IDq = 70 mA;
case = 25 C; unless otherwise specified in a class-AB production circuit.
T
Symbol
Parameter
Conditions
Min
Typ
-
Max Unit
f
frequency
3
-
-
-
-
-
-
3.5
GHz
%
D
Gp
RLin
drain efficiency
power gain
PL = 30 W
PL = 30 W
PL = 30 W
PL = 30 W
PL = 30 W
PL = 30 W
50
13
7
0.04
5
-
-
-
-
-
-
dB
dB
dB
ns
input return loss
Pdroop(pulse) pulse droop power
tr
tf
rise time
fall time
5
ns
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
3 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
7. Application information
7.1 Demo circuit
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Printed-Circuit Board (PCB) material: Taconic RF35, r = 3.5, thickness 30 mils, 1 oz copper on
each side.
See Table 9 for list of components.
Fig 1. The broadband amplifier (500 MHz to 2500 MHz) demo circuit outline
Table 9.
List of components
See Figure 1.
Component Description
Value
-
Remarks
NXP
A1
GaN bias module v2
C1, C10
C2, C7
C3
multilayer ceramic chip capacitor 8.2 pF
multilayer ceramic chip capacitor 0.8 pF
ATC 600F
ATC 600F
SMD 0805
SMD 0805
SMD 0805
SMD 1206
ATC 600F
ATC 600F
electrolytic capacitor
electrolytic capacitor
electrolytic capacitor
electrolytic capacitor
100 nF, 50 V
C4
10 nF, 50 V
22 pF, 100 V
1 nF, 100 V
C5
C6
C8
multilayer ceramic chip capacitor 1.2 pF
multilayer ceramic chip capacitor 0.5 pF
C9
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
4 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
Table 9.
List of components …continued
See Figure 1.
Component Description
Value
Remarks
C11
C12
C14
C15
C16
C17
E1, E2
J1
multilayer ceramic chip capacitor 100 pF
multilayer ceramic chip capacitor 1 nF
ATC 100B
ATC 700B
SMD 1206
SMD 2220
SMD 1210
PCE3667CT-ND
electrolytic capacitor
electrolytic capacitor
electrolytic capacitor
electrolytic capacitor
drain voltage connection
RF in connector
RF out connector
inductor
1 F, 100V
10 F, 100 V
10 nF, 200 V
470 F, 63 V
-
-
J2
-
L1
330 nH
1008CS-100XJB
2743019447
L2
ferrite bead
-
-
L3
inductor
1 turn, 18 AWG,
inner diameter = 4.06 mm
Q1
Q2
Q3
R1
R2
R3
transistor
transistor
transistor
resistor
-
NXP CLF1G0060-30
NXP BC857B
-
-
NXP PSMN8R2-80YS
Vishay Dale
10 k
10
0.005
-
resistor
Vishay Dale
resistor
RL7520WT-R005-F
Z1, Z2, Z3,
Z4, Z5, Z6,
Z7, Z8, Z9,
Z10, Z11,
Z12, Z13
microstrip lines
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
5 of 19
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See Table 9 for a list of components.
Fig 2. The broadband amplifier (500 MHz to 2500 MHz) demo circuit schematic
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
7.2 Application test results
Table 10. CW and pulsed RF application information
Typical RF performance at Tcase = 25 C; IDq = 70 mA; VDS = 50 V in a class-AB broadband demo
board.
Test signal
f
PL
(W)
30
30
30
30
30
30
30
30
30
30
Gp
D
(MHz)
500
(dB)
15.6
13.9
13.7
12.6
14.2
16.6
15.8
15.5
14.5
15.9
(%)
60.7
50.3
50.8
49
1-Tone CW
1000
1500
2000
2500
500
55.6
61
1-Tone pulsed [1]
1000
1500
2000
2500
50
52.5
50
59
[1] Pulsed RF; tp = 100 s; = 10 %.
Table 11. 2-Tone CW application information
Typical 2-Tone performance at Tcase = 25 C; IDq = 150 mA; VDS = 50 V in a class-AB broadband
demo board.
Test signal
f
PL(PEP)
(W)
10
IMD3
(dBc)
38
(MHz)
500
2-Tone CW [1]
1000
1500
2000
2500
10
50
10
45
10
50
10
43
[1] 2-Tone CW; f = 1 MHz.
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
7 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
7.3 Graphical data
The following figures are measured in a broadband amplifier demo board from 500 MHz
to 2500 MHz.
7.3.1 1-Tone CW RF performance
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VDS = 50 V; IDq = 70 mA; PL = 30 W.
VDS = 50 V; IDq = 70 mA.
(1) Gp at f = 500 MHz
(2) Gp at f = 1500 MHz
(3) Gp at f = 2500 MHz
(4)
(5)
(6)
D at f = 500 MHz
D at f = 1500 MHz
D at f = 2500 MHz
Fig 3. Power gain and drain efficiency as function of
frequency; typical values
Fig 4. Power gain and drain efficiency as function of
output power; typical values
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
8 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
7.3.2 1-Tone pulsed RF performance
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VDS = 50 V; IDq = 70 mA; PL = 30 W; tp = 100 s;
= 10 %.
VDS = 50 V; IDq = 70 mA; tp = 100 s; = 10 %.
(1) Gp at f = 500 MHz
(2) Gp at f = 1500 MHz
(3) Gp at f = 2500 MHz
(4)
(5)
(6)
D at f = 500 MHz
D at f = 1500 MHz
D at f = 2500 MHz
Fig 5. Power gain and drain efficiency as function of
frequency; typical values
Fig 6. Power gain and drain efficiency gain as
function of output power; typical values
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
9 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
7.3.3 2-Tone CW performance
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VDS = 50 V; IDq = 150 mA; f = 1 MHz.
(1) f = 500 MHz
VDS = 50 V; IDq = 150 mA; PL(PEP) =10 W.
(1) f = 10 kHz
(2) f = 30 kHz
(3) f = 100 kHz
(4) f = 300 kHz
(5) f = 1 MHz
(6) f = 3 MHz
(2) f = 1500 MHz
(3) f = 2500 MHz
Fig 7. Third order intermodulation distortion as a
function of peak envelope power; typical
values
Fig 8. Third-order intermodulation distortion as
function of frequency and tone spacing;
typical values
7.4 Bias module
The bias module information for the GaN HEMT amplifier is described in application note
“AN11130”.
8. Test information
8.1 Ruggedness in class-AB operation
The CLF1G0060-30 and CLF1G0060S-30 are capable of withstanding a load mismatch
corresponding to VSWR = 10 : 1 through all phases under the following conditions:
V
DS = 50 V; PL = 30 W (pulsed RF), f = <tbd> MHz.
8.2 Load pull impedance information
The measured load pull impedances are shown below. Impedance reference plane
defined at device leads. Measurements performed with NXP test fixtures. Test
temperature set at 25 C with a pulsed CW signal; tp = 100 s; = 10 %; RF performance
at VDS = 50 V; IDq = 50 mA.
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
10 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
Table 12. Typical impedance
Typical values unless otherwise specified.
f
ZS
ZL (maximum PL(M)
)
ZL (maximum D)
MHz
2140
2500
2700
3000
3300
3500
3700
4000
1.4 4j
2.8 6j
2.8 7.5j
3.0 10j
3.0 11.5j
3.0 13j
3.5 14.4j
3.7 20.3j
14 + 5.4j
10.5 + 2.5j
10.7 + 1.3j
9.1 + 3.5j
9.4 + 1.2j
9.5
12.5 + 9.7j
7.6 + 5.6j
7.6 + 4.3j
7.7 + 4.2j
7.6 + 2.5j
7.2 + 1.35j
7.3 0.05j
7.7 1.2j
9.4 1.1j
9.3 2.4j
GUDLQ
JDWH
VRXUFH
=
=
/
6
DDDꢀꢁꢁꢂꢃꢄꢈ
Fig 9. Definition of transistor impedance
ZS is the measured source pull impedance presented to the device. ZL is the measured
load pull impedance presented to the device.
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
11 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
8.3 Packaged S-parameter data
Table 13. S-parameter
Small signal; VDS = 50 V; IDq = 50 mA; ZS = ZL = 50
f
S11
S21
S12
S22
(MHz)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
100
0.9302
76.396
115.47
134.97
146.22
153.57
158.81
162.82
166.05
168.77
171.15
173.27
175.22
177.04
178.75
179.61
178.03
176.49
175
44.515
29.415
21.02
135.22
111.96
98.876
89.855
82.761
76.739
71.392
66.516
61.995
57.758
53.759
49.966
46.356
42.911
39.616
36.459
33.428
30.514
27.709
25.005
22.395
19.872
17.429
15.062
12.766
10.534
8.3639
6.2502
4.1894
2.1779
0.21252
1.71
0.016195
0.021253
0.022516
0.02261
46.871
25.279
13.903
6.6529
1.4192
2.6237
5.8352
8.375
10.302
11.612
12.256
12.138
11.113
8.9845
5.505
0.40868
6.4893
15.099
24.853
34.74
0.7376
43.407
65.523
77.762
86.181
92.826
98.482
103.5
200
0.87436
0.8537
0.55438
0.47582
0.44954
0.44849
0.46041
0.47921
0.50159
0.5256
300
400
0.8464
16.096
12.919
10.71
500
0.8446
0.022198
0.021498
0.020604
0.019567
0.018424
0.017205
0.015936
0.014644
0.01336
600
0.84548
0.84785
0.85112
0.85494
0.85908
0.86338
0.86774
0.87206
0.8763
700
9.0883
7.8465
6.8655
6.0713
5.4157
4.866
800
108.06
112.27
116.19
119.86
123.33
126.6
900
1000
1100
1200
1300
1400
1500
1600
1700
1800
1900
2000
2100
2200
2300
2400
2500
2600
2700
2800
2900
3000
3100
3200
3300
3400
3500
3600
3700
0.5501
0.57433
0.59785
0.62038
0.64176
0.66191
0.68081
0.69846
0.7149
4.3993
3.9988
3.6521
3.3496
3.0841
2.8497
2.6416
2.4562
2.2902
2.1411
2.0067
1.8852
1.775
0.012117
0.010958
0.0099386
0.0091267
0.0085991
0.008424
0.0086339
0.0092114
0.0101
129.7
0.88039
0.88432
0.88806
0.8916
132.65
135.46
138.14
140.7
0.89493
0.89806
0.90098
0.9037
173.53
172.09
170.67
169.26
167.87
166.48
165.11
163.74
162.37
161
0.73019
0.74438
0.75755
0.76975
0.78106
0.79154
0.80125
0.81025
0.8186
143.15
145.5
43.73
147.76
149.93
152.02
154.04
155.99
157.88
159.71
161.49
163.22
164.91
166.55
168.16
169.73
171.27
172.78
174.26
175.72
51.208
57.053
61.439
64.635
66.902
68.455
69.459
70.039
70.288
70.278
70.06
0.90622
0.90856
0.91072
0.91272
0.91455
0.91623
0.91777
0.91917
0.92044
0.9216
0.011233
0.012549
0.014001
0.015556
0.017191
0.01889
1.6748
1.5835
1.5001
1.4237
1.3535
1.289
0.82634
0.83353
0.8402
159.63
158.27
156.89
155.52
154.14
152.75
151.35
149.94
148.53
0.020642
0.022441
0.024281
0.02616
0.84641
0.85218
0.85755
0.86255
0.8672
1.2296
1.1748
1.1241
1.0771
1.0336
0.99314
0.92264
0.92357
0.92441
0.92515
0.92579
3.5925
5.4376
7.2479
9.0257
10.773
0.028076
0.030027
0.032015
0.034039
0.036099
69.675
69.154
68.521
67.795
66.989
0.87155
0.87559
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
12 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
Table 13. S-parameter …continued
Small signal; VDS = 50 V; IDq = 50 mA; ZS = ZL = 50
f
S11
S21
S12
S22
(MHz)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
3800
3900
4000
4100
4200
4300
4400
4500
4600
4700
4800
4900
5000
5100
5200
5300
5400
5500
5600
5700
5800
5900
6000
0.92635
0.92683
0.92723
0.92756
0.92781
0.928
147.1
0.95551
0.92046
0.88777
0.85724
0.82871
0.802
12.493
14.186
15.855
17.501
19.126
20.732
22.32
0.038198
0.040336
0.042516
0.044737
0.047003
0.049315
0.051676
0.054087
0.05655
66.115
65.183
64.2
0.87937
0.8829
177.15
178.57
179.97
178.65
177.28
175.93
174.58
173.25
171.92
170.6
145.65
144.2
0.88619
0.88927
0.89215
0.89484
0.89735
0.8997
142.73
141.24
139.73
138.2
63.171
62.101
60.994
59.853
58.68
0.92812
0.92818
0.92818
0.92812
0.928
0.77698
0.75351
0.73149
0.71079
0.69133
0.67301
0.65576
0.63949
0.62415
0.60968
0.596
136.66
135.09
133.5
23.891
25.447
26.99
57.477
56.245
54.986
53.699
52.387
51.047
49.682
48.291
46.874
45.43
0.9019
0.059068
0.061644
0.064279
0.066975
0.069736
0.072563
0.075459
0.078426
0.081467
0.084583
0.087778
0.091053
0.094411
0.097853
0.90396
0.90588
0.90767
0.90935
0.91092
0.91238
0.91375
0.91502
0.9162
131.89
130.25
128.59
126.9
28.519
30.038
31.546
33.046
34.537
36.022
37.501
38.975
40.446
41.914
43.38
169.28
167.97
166.66
165.35
164.04
162.73
161.42
160.1
0.92783
0.92761
0.92734
0.92701
0.92664
0.92622
0.92576
0.92525
0.9247
125.17
123.42
121.64
119.83
117.98
116.1
0.58307
0.57085
0.55929
0.54834
0.53797
0.52814
43.959
42.461
40.935
39.381
37.797
0.9173
158.78
157.45
156.12
154.77
153.42
0.91832
0.91927
0.92014
0.92095
0.92411
0.92348
0.92282
114.18
112.22
110.23
44.846
46.311
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
13 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
9. Package outline
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CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
14 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
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Fig 11. Package outline SOT1227B
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
15 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
10. Handling information
10.1 ESD Sensitivity
Table 14. ESD sensitivity
ESD model
Class
Human Body Model (HBM); According JEDEC standard JESD22-A114F 1B [1]
[1] Classification 1B is granted to any part that passes after exposure to an ESD pulse of 500 V, but fails after
exposure to an ESD pulse of 1000 V.
11. Abbreviations
Table 15. Abbreviations
Acronym
AWG
Description
American Wire Gauge
CW
Continuous Wave
EMC
ElectroMagnetic Compatibility
ElectroStatic Discharge
Gallium Nitride
ESD
GaN
HEMT
SMD
High Electron Mobility Transistor
Surface-Mounted Device
Voltage Standing-Wave Ratio
Worldwide Interoperability for Microwave Access
VSWR
WiMAX
12. Revision history
Table 16. Revision history
Document ID
Release date Data sheet status
Change notice Supersedes
CLF1G0060-30_1G0060S-30 v.4 20130620
Objective data sheet -
CLF1G0060-30_1G0060S-30 v.3
Modifications:
• Figure 7 on page 10: value IDq corrected to 150.
CLF1G0060-30_1G0060S-30 v.3 20130327
CLF1G0060-30_1G0060S-30 v.2 20130129
CLF1G0060-30_1G0060S-30 v.1 20121008
Objective data sheet -
Objective data sheet -
Objective data sheet -
CLF1G0060-30_1G0060S-30 v.2
CLF1G0060-30_1G0060S-30 v.1
-
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
16 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
13. Legal information
13.1 Data sheet status
Document status[1][2]
Product status[3]
Development
Definition
Objective [short] data sheet
This document contains data from the objective specification for product development.
This document contains data from the preliminary specification.
This document contains the product specification.
Preliminary [short] data sheet Qualification
Product [short] data sheet Production
[1]
[2]
[3]
Please consult the most recently issued document before initiating or completing a design.
The term ‘short data sheet’ is explained in section “Definitions”.
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status
information is available on the Internet at URL http://www.nxp.com.
Suitability for use — NXP Semiconductors products are not designed,
13.2 Definitions
authorized or warranted to be suitable for use in life support, life-critical or
safety-critical systems or equipment, nor in applications where failure or
malfunction of an NXP Semiconductors product can reasonably be expected
to result in personal injury, death or severe property or environmental
damage. NXP Semiconductors and its suppliers accept no liability for
inclusion and/or use of NXP Semiconductors products in such equipment or
applications and therefore such inclusion and/or use is at the customer’s own
risk.
Draft — The document is a draft version only. The content is still under
internal review and subject to formal approval, which may result in
modifications or additions. NXP Semiconductors does not give any
representations or warranties as to the accuracy or completeness of
information included herein and shall have no liability for the consequences of
use of such information.
Short data sheet — A short data sheet is an extract from a full data sheet
with the same product type number(s) and title. A short data sheet is intended
for quick reference only and should not be relied upon to contain detailed and
full information. For detailed and full information see the relevant full data
sheet, which is available on request via the local NXP Semiconductors sales
office. In case of any inconsistency or conflict with the short data sheet, the
full data sheet shall prevail.
Applications — Applications that are described herein for any of these
products are for illustrative purposes only. NXP Semiconductors makes no
representation or warranty that such applications will be suitable for the
specified use without further testing or modification.
Customers are responsible for the design and operation of their applications
and products using NXP Semiconductors products, and NXP Semiconductors
accepts no liability for any assistance with applications or customer product
design. It is customer’s sole responsibility to determine whether the NXP
Semiconductors product is suitable and fit for the customer’s applications and
products planned, as well as for the planned application and use of
customer’s third party customer(s). Customers should provide appropriate
design and operating safeguards to minimize the risks associated with their
applications and products.
Product specification — The information and data provided in a Product
data sheet shall define the specification of the product as agreed between
NXP Semiconductors and its customer, unless NXP Semiconductors and
customer have explicitly agreed otherwise in writing. In no event however,
shall an agreement be valid in which the NXP Semiconductors product is
deemed to offer functions and qualities beyond those described in the
Product data sheet.
NXP Semiconductors does not accept any liability related to any default,
damage, costs or problem which is based on any weakness or default in the
customer’s applications or products, or the application or use by customer’s
third party customer(s). Customer is responsible for doing all necessary
testing for the customer’s applications and products using NXP
Semiconductors products in order to avoid a default of the applications and
the products or of the application or use by customer’s third party
customer(s). NXP does not accept any liability in this respect.
13.3 Disclaimers
Limited warranty and liability — Information in this document is believed to
be accurate and reliable. However, NXP Semiconductors does not give any
representations or warranties, expressed or implied, as to the accuracy or
completeness of such information and shall have no liability for the
consequences of use of such information. NXP Semiconductors takes no
responsibility for the content in this document if provided by an information
source outside of NXP Semiconductors.
Limiting values — Stress above one or more limiting values (as defined in
the Absolute Maximum Ratings System of IEC 60134) will cause permanent
damage to the device. Limiting values are stress ratings only and (proper)
operation of the device at these or any other conditions above those given in
the Recommended operating conditions section (if present) or the
Characteristics sections of this document is not warranted. Constant or
repeated exposure to limiting values will permanently and irreversibly affect
the quality and reliability of the device.
In no event shall NXP Semiconductors be liable for any indirect, incidental,
punitive, special or consequential damages (including - without limitation - lost
profits, lost savings, business interruption, costs related to the removal or
replacement of any products or rework charges) whether or not such
damages are based on tort (including negligence), warranty, breach of
contract or any other legal theory.
Terms and conditions of commercial sale — NXP Semiconductors
products are sold subject to the general terms and conditions of commercial
sale, as published at http://www.nxp.com/profile/terms, unless otherwise
agreed in a valid written individual agreement. In case an individual
agreement is concluded only the terms and conditions of the respective
agreement shall apply. NXP Semiconductors hereby expressly objects to
applying the customer’s general terms and conditions with regard to the
purchase of NXP Semiconductors products by customer.
Notwithstanding any damages that customer might incur for any reason
whatsoever, NXP Semiconductors’ aggregate and cumulative liability towards
customer for the products described herein shall be limited in accordance
with the Terms and conditions of commercial sale of NXP Semiconductors.
Right to make changes — NXP Semiconductors reserves the right to make
changes to information published in this document, including without
limitation specifications and product descriptions, at any time and without
notice. This document supersedes and replaces all information supplied prior
to the publication hereof.
No offer to sell or license — Nothing in this document may be interpreted or
construed as an offer to sell products that is open for acceptance or the grant,
conveyance or implication of any license under any copyrights, patents or
other industrial or intellectual property rights.
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
17 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
Export control — This document as well as the item(s) described herein
may be subject to export control regulations. Export might require a prior
authorization from competent authorities.
NXP Semiconductors’ specifications such use shall be solely at customer’s
own risk, and (c) customer fully indemnifies NXP Semiconductors for any
liability, damages or failed product claims resulting from customer design and
use of the product for automotive applications beyond NXP Semiconductors’
standard warranty and NXP Semiconductors’ product specifications.
Non-automotive qualified products — Unless this data sheet expressly
states that this specific NXP Semiconductors product is automotive qualified,
the product is not suitable for automotive use. It is neither qualified nor tested
in accordance with automotive testing or application requirements. NXP
Semiconductors accepts no liability for inclusion and/or use of
Translations — A non-English (translated) version of a document is for
reference only. The English version shall prevail in case of any discrepancy
between the translated and English versions.
non-automotive qualified products in automotive equipment or applications.
In the event that customer uses the product for design-in and use in
automotive applications to automotive specifications and standards, customer
(a) shall use the product without NXP Semiconductors’ warranty of the
product for such automotive applications, use and specifications, and (b)
whenever customer uses the product for automotive applications beyond
13.4 Trademarks
Notice: All referenced brands, product names, service names and trademarks
are the property of their respective owners.
14. Contact information
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
CLF1G0060-30_1G0060S-30
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2013. All rights reserved.
Objective data sheet
Rev. 4 — 20 June 2013
18 of 19
CLF1G0060-30; CLF1G0060S-30
NXP Semiconductors
Broadband RF power GaN HEMT
15. Contents
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1
General description . . . . . . . . . . . . . . . . . . . . . 1
Features and benefits. . . . . . . . . . . . . . . . . . . . 2
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 2
1.1
1.2
1.3
2
3
4
5
6
Pinning information. . . . . . . . . . . . . . . . . . . . . . 2
Ordering information. . . . . . . . . . . . . . . . . . . . . 2
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3
Thermal characteristics . . . . . . . . . . . . . . . . . . 3
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 3
7
7.1
7.2
7.3
7.3.1
7.3.2
7.3.3
7.4
Application information. . . . . . . . . . . . . . . . . . . 4
Demo circuit . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Application test results . . . . . . . . . . . . . . . . . . . 7
Graphical data . . . . . . . . . . . . . . . . . . . . . . . . . 8
1-Tone CW RF performance. . . . . . . . . . . . . . . 8
1-Tone pulsed RF performance . . . . . . . . . . . . 9
2-Tone CW performance . . . . . . . . . . . . . . . . 10
Bias module . . . . . . . . . . . . . . . . . . . . . . . . . . 10
8
Test information. . . . . . . . . . . . . . . . . . . . . . . . 10
Ruggedness in class-AB operation . . . . . . . . 10
Load pull impedance information . . . . . . . . . . 10
Packaged S-parameter data. . . . . . . . . . . . . . 12
8.1
8.2
8.3
9
Package outline . . . . . . . . . . . . . . . . . . . . . . . . 14
Handling information. . . . . . . . . . . . . . . . . . . . 16
ESD Sensitivity. . . . . . . . . . . . . . . . . . . . . . . . 16
Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 16
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 16
10
10.1
11
12
13
Legal information. . . . . . . . . . . . . . . . . . . . . . . 17
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 17
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 18
13.1
13.2
13.3
13.4
14
15
Contact information. . . . . . . . . . . . . . . . . . . . . 18
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 19
Please be aware that important notices concerning this document and the product(s)
described herein, have been included in section ‘Legal information’.
© NXP B.V. 2013.
All rights reserved.
For more information, please visit: http://www.nxp.com
For sales office addresses, please send an email to: salesaddresses@nxp.com
Date of release: 20 June 2013
Document identifier: CLF1G0060-30_1G0060S-30
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