HEF4020B_08 [NXP]

14-stage binary counter; 14级二进制计数器
HEF4020B_08
型号: HEF4020B_08
厂家: NXP    NXP
描述:

14-stage binary counter
14级二进制计数器

计数器
文件: 总13页 (文件大小:88K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
HEF4020B  
14-stage binary counter  
Rev. 04 — 4 December 2008  
Product data sheet  
1. General description  
The HEF4020B is a 14-stage binary counter with a clock input (CP), an overriding  
asynchronous master reset input (MR) and twelve fully buffered outputs (Q0, and Q3 to  
Q13). The counter advances on the HIGH to LOW transition of CP. A HIGH on MR clears  
all counter stages and forces all outputs LOW, independent of the state of CP. Each  
counter stage is a static toggle flip-flop. A feature of the device is its high speed  
(typ. 35 MHz at VDD = 15 V).  
It operates over a recommended VDD power supply range of 3 V to 15 V referenced to VSS  
(usually ground). Unused inputs must be connected to VDD, VSS, or another input. It is  
also suitable for use over the full industrial (40 °C to +85 °C) temperature range.  
2. Features  
I High speed operation  
I Fully static operation  
I 5 V, 10 V, and 15 V parametric ratings  
I Standardized symmetrical output characteristics  
I Operates across the full industrial temperature range 40 °C to +85 °C  
I Complies with JEDEC standard JESD 13-B  
I ESD protection:  
N HBM JESD22-A114E exceeds 2000 V  
N MM JESD22-A115-A exceeds 200 V  
3. Applications  
I Industrial  
4. Ordering information  
Table 1.  
Ordering information  
All types operate from 40 °C to +85 °C.  
Type number Package  
Name  
DIP16  
SO16  
Description  
Version  
HEF4020BP  
HEF4020BT  
plastic dual in-line package; 16-leads (300 mil)  
plastic small outline package; 16 leads; body width 3.9 mm  
SOT38-4  
SOT109-1  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
5. Functional diagram  
10  
11  
CP  
T
14-STAGE COUNTER  
MR  
C
D
9
7
5
4
6
13 12 14 15  
1
2
3
Q0 Q3 Q4 Q5 Q6 Q7 Q8 Q9 Q10 Q11 Q12 Q13  
001aad722  
Fig 1. Functional diagram  
CTR14  
Q0  
Q3  
Q4  
9
7
5
0
9
7
5
+
CT  
10  
11  
Q5  
Q6  
Q7  
Q8  
4
6
4
6
10  
11  
CP  
13  
12  
14  
15  
1
13  
12  
14  
15  
1
CT  
Q9  
MR  
Q10  
Q11  
Q12  
Q13  
2
3
2
3
13  
001aad723  
001aad724  
Fig 2. Logic symbol  
Fig 3. IEC Logic symbol  
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
FF  
0
FF  
1
FF  
2
FF  
3
FF  
4
FF  
5
FF  
6
T
T
T
T
T
T
T
CP  
Q
Q
RD  
RD  
RD  
RD  
RD  
RD  
RD  
MR  
Q0  
Q3  
Q4  
Q5  
Q6  
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
Q
FF  
7
FF  
8
FF  
9
FF  
10  
FF  
11  
FF  
12  
FF  
13  
T
T
T
T
T
T
T
RD  
RD  
RD  
RD  
RD  
RD  
RD  
Q7  
Q8  
Q9  
Q10  
Q11  
Q12  
Q13  
001aad725  
Fig 4. Logic diagram  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
2 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
6. Pinning information  
6.1 Pinning  
HEF4020B  
1
2
3
4
5
6
7
8
16  
15  
14  
13  
12  
11  
10  
9
Q11  
Q12  
Q13  
Q5  
V
DD  
Q10  
Q9  
Q7  
Q8  
MR  
CP  
Q0  
Q4  
Q6  
Q3  
V
SS  
001aaj101  
Fig 5. Pin configuration  
6.2 Pin description  
Table 2.  
Symbol  
Q3 to Q13  
VSS  
Pin description  
Pin  
Description  
7, 5, 4, 6, 13, 12, 14, 15, 1, 2, 3  
parallel output (Q3 to Q13)  
ground supply voltage  
parallel output  
8
Q0  
9
CP  
10  
11  
16  
clock input (HIGH-to-LOW edge triggered)  
master reset input (active HIGH)  
supply voltage  
MR  
VDD  
7. Functional description  
Table 3.  
Functional table[1]  
Input  
Output  
Q0, Q3 to Q13  
no change  
count  
CP  
MR  
L
L
X
H
L
[1] H = HIGH voltage level; L = LOW voltage level; X = don’t care; = positive-going transition; = negative-going transition.  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
3 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
1
2
4
8
16  
32  
64 128 256 512 1024 2048 4096 8192 16384  
CP input  
MR input  
Q0  
Q3  
Q4  
Q5  
Q6  
Q7  
Q8  
Q9  
Q10  
Q11  
Q12  
Q13  
001aad726  
Fig 6. Timing diagram  
8. Limiting values  
Table 4.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VDD  
IIK  
Parameter  
Conditions  
Min  
0.5  
-
Max  
+18  
Unit  
V
supply voltage  
input clamping current  
input voltage  
VI < 0.5 V or VI > VDD + 0.5 V  
VO < 0.5 V or VO > VDD + 0.5 V  
±10  
mA  
V
VI  
0.5  
-
VDD + 0.5  
±10  
IOK  
output clamping current  
input/output current  
supply current  
mA  
mA  
mA  
°C  
II/O  
-
±10  
IDD  
-
50  
Tstg  
Tamb  
Ptot  
storage temperature  
ambient temperature  
total power dissipation  
65  
40  
+150  
+85  
°C  
Tamb 40 °C to +85 °C  
[1]  
[2]  
DIP16 package  
-
-
-
750  
500  
100  
mW  
mW  
mW  
SO16 package  
P
power dissipation  
per output  
[1] For DIP16 package: Ptot derates linearly with 12 mW/K above 70 °C.  
[2] For SO16 package: Ptot derates linearly with 8 mW/K above 70 °C.  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
4 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
9. Recommended operating conditions  
Table 5.  
Symbol  
VDD  
Recommended operating conditions  
Parameter  
Conditions  
Min  
Typ  
Max  
15  
Unit  
V
supply voltage  
3
-
-
-
-
-
-
VI  
input voltage  
0
VDD  
+85  
3.75  
0.5  
V
Tamb  
ambient temperature  
input transition rise and fall rate  
in free air  
40  
°C  
t/V  
VDD = 5 V  
VDD = 10 V  
VDD = 15 V  
-
-
-
ns/V  
ns/V  
ns/V  
0.08  
10. Static characteristics  
Table 6.  
Static characteristics  
VSS = 0 V; VI = VSS or VDD; unless otherwise specified.  
Symbol Parameter  
Conditions  
VDD  
Tamb = 40 °C Tamb = 25 °C  
Tamb = 85 °C Unit  
Min  
Max  
Min  
Max  
Min  
Max  
VIH  
HIGH-level input voltage  
|IO| < 1 µA  
5 V  
10 V  
15 V  
5 V  
3.5  
-
3.5  
-
3.5  
-
V
7.0  
-
7.0  
-
7.0  
-
V
11.0  
-
11.0  
-
11.0  
-
V
VIL  
LOW-level input voltage  
HIGH-level output voltage  
LOW-level output voltage  
HIGH-level output current  
|IO| < 1 µA  
|IO| < 1 µA  
|IO| < 1 µA  
-
1.5  
-
1.5  
-
1.5  
V
10 V  
15 V  
5 V  
-
3.0  
-
3.0  
-
3.0  
V
-
4.0  
-
4.0  
-
4.0  
V
VOH  
VOL  
IOH  
4.95  
-
4.95  
-
4.95  
-
V
10 V  
15 V  
5 V  
9.95  
-
9.95  
-
9.95  
-
V
14.95  
-
14.95  
-
14.95  
-
V
-
0.05  
-
0.05  
-
0.05  
V
10 V  
15 V  
5 V  
-
0.05  
-
0.05  
-
0.05  
V
-
1.7  
0.52  
1.3  
3.6  
0.52  
1.3  
3.6  
-
0.05  
-
1.4  
0.44  
1.1  
3.0  
0.44  
1.1  
3.0  
-
0.05  
-
1.1  
0.36  
0.9  
2.4  
0.36  
0.9  
2.4  
-
0.05  
V
VO = 2.5 V  
VO = 4.6 V  
VO = 9.5 V  
VO = 13.5 V  
VO = 0.4 V  
VO = 0.5 V  
VO = 1.5 V  
-
-
-
-
-
-
-
-
-
-
mA  
mA  
mA  
mA  
mA  
mA  
mA  
5 V  
-
10 V  
15 V  
5 V  
-
-
-
-
-
IOL  
LOW-level output current  
-
10 V  
15 V  
15 V  
5 V  
-
-
-
-
II  
input leakage current  
supply current  
±0.3  
20  
40  
80  
-
±0.3  
20  
40  
80  
7.5  
±1.0 µA  
150 µA  
300 µA  
600 µA  
IDD  
IO = 0 A  
-
-
-
10 V  
15 V  
-
-
-
-
-
-
-
CI  
input capacitance  
-
-
-
-
pF  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
5 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
11. Dynamic characteristics  
Table 7.  
Dynamic characteristics  
VSS = 0 V; Tamb = 25 °C; for test circuit see Figure 8.  
Symbol Parameter  
Conditions  
VDD  
5 V  
Extrapolation formula[1]  
78 ns + (0.55 ns/pF) CL  
34 ns + (0.23 ns/pF) CL  
22 ns + (0.16 ns/pF) CL  
53 ns + (0.55 ns/pF) CL  
19 ns + (0.23 ns/pF) CL  
12 ns + (0.16 ns/pF) CL  
153 ns + (0.55 ns/pF) CL  
79 ns + (0.23 ns/pF) CL  
62 ns + (0.16 ns/pF) CL  
78 ns + (0.55 ns/pF) CL  
39 ns + (0.23 ns/pF) CL  
27 ns + (0.16 ns/pF) CL  
43 ns + (0.55 ns/pF) CL  
14 ns + (0.23 ns/pF) CL  
12 ns + (0.16 ns/pF) CL  
10 ns + (1.00 ns/pF) CL  
9 ns + (0.42 ns/pF) CL  
6 ns + (0.28 ns/pF) CL  
Min  
Typ  
105  
45  
30  
80  
30  
20  
180  
90  
70  
105  
50  
35  
70  
25  
20  
60  
30  
20  
25  
15  
10  
65  
50  
45  
60  
35  
25  
10  
25  
35  
Max Unit  
tPHL  
HIGH to LOW  
CP to Q0;  
see Figure 7  
-
210  
90  
65  
160  
60  
40  
360  
180  
140  
210  
95  
70  
140  
50  
40  
120  
60  
40  
-
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
MHz  
MHz  
MHz  
propagation delay  
10 V  
15 V  
5 V  
-
-
Qn to Qn + 1  
-
10 V  
15 V  
5 V  
-
-
MR to Qn;  
see Figure 7  
-
10 V  
15 V  
5 V  
-
-
tPLH  
LOW to HIGH  
CP to Q0;  
see Figure 7  
-
propagation delay  
10 V  
15 V  
5 V  
-
-
Qn to Qn + 1  
see Figure 7  
-
10 V  
15 V  
5 V  
-
-
tt  
transition time  
pulse width  
-
10 V  
15 V  
5 V  
-
-
tW  
CP = HIGH;  
minimum width;  
see Figure 7  
50  
25  
20  
130  
95  
90  
115  
65  
55  
5
10 V  
15 V  
5 V  
-
-
MR = HIGH;  
minimum width;  
see Figure 7  
-
10 V  
15 V  
5 V  
-
-
trec  
recovery time  
MR input;  
see Figure 7  
-
10 V  
15 V  
5 V  
-
-
fmax  
maximum  
frequency  
see Figure 7  
-
10 V  
15 V  
13  
18  
-
-
[1] The typical values of the propagation delay and transition times are calculated from the extrapolation formulas shown (CL in pF).  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
6 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
Table 8.  
Dynamic power dissipation PD  
PD can be calculated from the formulas shown. VSS = 0 V; tr = tf 20 ns; Tamb = 25 °C.  
Symbol  
Parameter  
VDD  
5 V  
Typical formula for PD (µW)  
PD = 600 × fi + Σ(fo × CL) × VDD  
where:  
2
PD  
dynamic power  
dissipation  
fi = input frequency in MHz,  
fo = output frequency in MHz,  
CL = output load capacitance in pF,  
VDD = supply voltage in V,  
2
2
10 V  
15 V  
PD = 2800 × fi + Σ(fo × CL) × VDD  
PD = 8200 × fi + Σ(fo × CL) × VDD  
Σ(CL × fo) = sum of the outputs.  
12. Waveforms  
V
I
MR INPUT  
V
M
V
SS  
t
W
t
1/f  
max  
rec  
V
I
CP INPUT  
V
M
V
SS  
t
W
t
t
t
PHL  
PHL  
PLH  
V
OH  
Q0 or Qn  
OUTPUT  
V
M
V
OL  
t
t
t
t
001aae591  
Measurement points are given in Table 9.  
Fig 7. Propagation delays, minimum pulse widths, transition and recovery times and maximum clock frequency  
Table 9. Measurement points  
Supply voltage  
VDD  
Input  
VM  
Output  
VM  
5 V to 15 V  
0.5VDD  
0.5VDD  
V
DD  
V
V
O
I
G
DUT  
C
L
R
T
001aag182  
Test data is given in Table 10.  
Definitions for test circuit:  
DUT = Device Under Test.  
CL = load capacitance including jig and probe capacitance.  
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.  
Fig 8. Test circuit  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
7 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
Table 10. Test data  
Supply voltage  
VDD  
Input  
Load  
VI  
tr, tf  
CL  
5 V to 15 V  
VSS or VDD  
20 ns  
50 pF  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
8 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
13. Package outline  
DIP16: plastic dual in-line package; 16 leads (300 mil)  
SOT38-4  
D
M
E
A
2
A
A
1
L
c
e
w M  
Z
b
1
(e )  
1
b
b
2
16  
9
M
H
pin 1 index  
E
1
8
0
5
10 mm  
scale  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
(1)  
A
A
A
2
(1)  
(1)  
Z
1
w
UNIT  
mm  
b
b
b
c
D
E
e
e
L
M
M
H
1
2
1
E
max.  
min.  
max.  
max.  
1.73  
1.30  
0.53  
0.38  
1.25  
0.85  
0.36  
0.23  
19.50  
18.55  
6.48  
6.20  
3.60  
3.05  
8.25  
7.80  
10.0  
8.3  
4.2  
0.51  
3.2  
2.54  
0.1  
7.62  
0.3  
0.254  
0.01  
0.76  
0.068 0.021 0.049 0.014  
0.051 0.015 0.033 0.009  
0.77  
0.73  
0.26  
0.24  
0.14  
0.12  
0.32  
0.31  
0.39  
0.33  
inches  
0.17  
0.02  
0.13  
0.03  
Note  
1. Plastic or metal protrusions of 0.25 mm (0.01 inch) maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
JEITA  
95-01-14  
03-02-13  
SOT38-4  
Fig 9. Package outline SOT38-4 (DIP16)  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
9 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
SO16: plastic small outline package; 16 leads; body width 3.9 mm  
SOT109-1  
D
E
A
X
c
y
H
v
M
A
E
Z
16  
9
Q
A
2
A
(A )  
3
A
1
pin 1 index  
θ
L
p
L
1
8
e
w
M
detail X  
b
p
0
2.5  
scale  
5 mm  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
A
(1)  
(1)  
(1)  
UNIT  
A
A
A
b
c
D
E
e
H
L
L
p
Q
v
w
y
Z
θ
1
2
3
p
E
max.  
0.25  
0.10  
1.45  
1.25  
0.49  
0.36  
0.25  
0.19  
10.0  
9.8  
4.0  
3.8  
6.2  
5.8  
1.0  
0.4  
0.7  
0.6  
0.7  
0.3  
mm  
1.27  
0.05  
1.05  
0.041  
1.75  
0.25  
0.01  
0.25  
0.01  
0.25  
0.1  
8o  
0o  
0.010 0.057  
0.004 0.049  
0.019 0.0100 0.39  
0.014 0.0075 0.38  
0.16  
0.15  
0.244  
0.228  
0.039 0.028  
0.016 0.020  
0.028  
0.012  
inches  
0.069  
0.01 0.004  
Note  
1. Plastic or metal protrusions of 0.15 mm (0.006 inch) maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
JEITA  
99-12-27  
03-02-19  
SOT109-1  
076E07  
MS-012  
Fig 10. Package outline SOT109-1 (SO16)  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
10 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
14. Abbreviations  
Table 11. Abbreviations  
Acronym  
DUT  
Description  
Device Under Test  
ElectroStatic Discharge  
Human Body Model  
Machine Model  
ESD  
HBM  
MM  
15. Revision history  
Table 12. Revision history  
Document ID  
HEF4020B_4  
Modifications:  
Release date  
20081204  
Data sheet status  
Change notice  
Supersedes  
Product data sheet  
-
HEF4020B_CNV_3  
The format of this data sheet has been redesigned to comply with the new identity  
guidelines of NXP Semiconductors.  
Legal texts have been adapted to the new company name where appropriate.  
Parallel output pins renamed Q0 to Q13 throughout.  
Temperature statement added to Section 1 “General description”.  
Section 2 “Features” added.  
Table 1 “Ordering information” restructured.  
Package version SOT38-1 changed to SOT38-4 in Section 4, and Figure 9. Package  
SOT74 removed from Section 4.  
Figure 1 “Functional diagram”, Figure 4 “Logic diagram”, Figure 5 “Pin configuration”,  
Figure 7 “Propagation delays, minimum pulse widths, transition and recovery times and  
maximum clock frequency” and Figure 6 “Timing diagram” changed for pin name changes.  
Figure 2 “Logic symbol” and Figure 3 “IEC Logic symbol” added.  
Table 2 “Pin description” edited for pin name changes.  
Section 7 “Functional description” added.  
Section 8 “Limiting values” and Section 10 “Static characteristics” added, taken from the  
HE4000B Family Specifications data sheet.  
tRMR, tWCPH and tWMRH changed to trec and tW for Table 7 “Dynamic characteristics” and  
Figure 7 “Propagation delays, minimum pulse widths, transition and recovery times and  
maximum clock frequency”.  
50 % replaced by VM for Figure 7 “Propagation delays, minimum pulse widths, transition  
and recovery times and maximum clock frequency”.  
Table 9 “Measurement points”, Figure 8 “Test circuit” and Table 10 “Test data” added.  
HEF4020B_CNV_3  
HEF4020B_CNV_2  
19950101  
Product specification  
-
HEF4020B_CNV_2  
19950101  
Product specification  
-
-
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
11 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
16. Legal information  
16.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
malfunction of a NXP Semiconductors product can reasonably be expected to  
16.2 Definitions  
result in personal injury, death or severe property or environmental damage.  
NXP Semiconductors accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or applications and therefore  
such inclusion and/or use is at the customer’s own risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
16.3 Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
16.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
17. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
HEF4020B_4  
© NXP B.V. 2008. All rights reserved.  
Product data sheet  
Rev. 04 — 4 December 2008  
12 of 13  
HEF4020B  
NXP Semiconductors  
14-stage binary counter  
18. Contents  
1
2
3
4
5
General description . . . . . . . . . . . . . . . . . . . . . . 1  
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Ordering information. . . . . . . . . . . . . . . . . . . . . 1  
Functional diagram . . . . . . . . . . . . . . . . . . . . . . 2  
6
6.1  
6.2  
Pinning information. . . . . . . . . . . . . . . . . . . . . . 3  
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 3  
7
Functional description . . . . . . . . . . . . . . . . . . . 3  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 4  
Recommended operating conditions. . . . . . . . 5  
Static characteristics. . . . . . . . . . . . . . . . . . . . . 5  
Dynamic characteristics . . . . . . . . . . . . . . . . . . 6  
Waveforms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 7  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 11  
8
9
10  
11  
12  
13  
14  
15  
16  
Legal information. . . . . . . . . . . . . . . . . . . . . . . 12  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
16.1  
16.2  
16.3  
16.4  
17  
18  
Contact information. . . . . . . . . . . . . . . . . . . . . 12  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2008.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 4 December 2008  
Document identifier: HEF4020B_4  

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