LPC2919FBD144 [NXP]

ARM9 microcontroller with CAN and LIN; ARM9微控制器,带有CAN和LIN
LPC2919FBD144
型号: LPC2919FBD144
厂家: NXP    NXP
描述:

ARM9 microcontroller with CAN and LIN
ARM9微控制器,带有CAN和LIN

微控制器和处理器 外围集成电路 时钟
文件: 总68页 (文件大小:1413K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
LPC2917/19  
ARM9 microcontroller with CAN and LIN  
Rev. 1.01 — 15 November 2007  
Preliminary data sheet  
1. Introduction  
1.1 About this document  
This document lists detailed information about the LPC2917/19 device. It focuses on  
factual information like pinning, characteristics etc. Short descriptions are used to outline  
the concept of the features and functions. More details and background on developing  
applications for this device are given in the LPC2917/19 User Manual (see Ref. 1). No  
explicit references are made to the User Manual.  
1.2 Intended audience  
This document is written for engineers evaluating and/or developing systems, hard-  
and/or software for the LPC2917/19. Some basic knowledge of ARM processors and  
architecture and ARM968E-S in particular is assumed (see Ref. 2).  
2. General description  
2.1 Architectural overview  
The LPC2917/19 consists of:  
An ARM968E-S processor with real-time emulation support  
An AMBA multi-layer Advanced High-performance Bus (AHB) for interfacing to the  
on-chip memory controllers  
Two DTL buses (a universal NXP interface) for interfacing to the interrupt controller  
and the Power, Clock and Reset Control cluster (also called subsystem)  
Three VLSI Peripheral Buses (VPB - a compatible superset of ARM's AMBA  
advanced peripheral bus) for connection to on-chip peripherals clustered in  
subsystems.  
The LPC2917/19 configures the ARM968E-S processor in little-endian byte order. All  
peripherals run at their own clock frequency to optimize the total system power  
consumption. The AHB2VPB bridge used in the subsystems contains a write-ahead buffer  
one transaction deep. This implies that when the ARM968E-S issues a buffered write  
action to a register located on the VPB side of the bridge, it continues even though the  
actual write may not yet have taken place. Completion of a second write to the same  
subsystem will not be executed until the first write is finished.  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
2.2 ARM968E-S processor  
The ARM968E-S is a general purpose 32-bit RISC processor, which offers high  
performance and very low power consumption. The ARM architecture is based on  
Reduced Instruction Set Computer (RISC) principles, and the instruction set and related  
decode mechanism are much simpler than those of micro-programmed Complex  
Instruction Set Computers (CISC). This simplicity results in a high instruction throughput  
and impressive real-time interrupt response from a small and cost-effective controller  
core.  
Amongst the most compelling features of the ARM968E-S are:  
Separate directly connected instruction and data Tightly Coupled Memory (TCM)  
interfaces  
Write buffers for the AHB and TCM buses  
Enhanced 16 x 32 multiplier capable of single-cycle MAC operations and 16-bit fixed-  
point DSP instructions to accelerate signal-processing algorithms and applications.  
Pipeline techniques are employed so that all parts of the processing and memory systems  
can operate continuously. The ARM968E-S is based on the ARMv5TE five-stage pipeline  
architecture. Typically, in a three-stage pipeline architecture, while one instruction is being  
executed its successor is being decoded and a third instruction is being fetched from  
memory. In the five-stage pipeline additional stages are added for memory access and  
write-back cycles.  
The ARM968E-S processor also employs a unique architectural strategy known as  
THUMB, which makes it ideally suited to high-volume applications with memory  
restrictions or to applications where code density is an issue.  
The key idea behind THUMB is that of a super-reduced instruction set. Essentially, the  
ARM968E-S processor has two instruction sets:  
Standard 32-bit ARMv5TE set  
16-bit THUMB set  
The THUMB set's 16-bit instruction length allows it to approach twice the density of  
standard ARM code while retaining most of the ARM's performance advantage over a  
traditional 16-bit controller using 16-bit registers. This is possible because THUMB code  
operates on the same 32-bit register set as ARM code.  
THUMB code can provide up to 65 % of the code size of ARM, and 160 % of the  
performance of an equivalent ARM controller connected to a 16-bit memory system.  
The ARM968E-S processor is described in detail in the ARM968E-S data sheet Ref. 2.  
2.3 On-chip flash memory system  
The LPC2917/19 includes a 512 kB or 768 kB flash memory system. This memory can be  
used for both code and data storage. Programming of the flash memory can be  
accomplished in several ways. It may be programmed in-system via a serial port; e.g.  
CAN.  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
2 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
2.4 On-chip static RAM  
In addition to the two 16 kB TCMs the LPC2917/19 includes two static RAM memories:  
one of 32 kB and one of 16 kB. Both may be used for code and/or data storage. Each  
internal SRAM has its own controller, so both memories can be accessed simultaneously  
from different AHB system bus layers.  
3. Features  
3.1 General  
„ ARM968E-S processor at 80 MHz maximum  
„ Multi-layer AHB system bus at 80 MHz with three separate layers  
„ On-chip memory:  
‹ Two Tightly Coupled Memories (TCM), 16 kB Instruction (ITCM), 16 kB Data TCM  
(DTCM)  
‹ Two separate internal Static RAM (SRAM) instances; 32 kB SRAM and 16 kB  
SRAM  
‹ Up to 768 kB flash-program memory  
„ Two-channel CAN controller supporting Full-CAN and extensive message filtering  
„ Two LIN master controllers with full hardware support for LIN communication  
„ Two 550 UARTs with 16-byte Tx and Rx FIFO depths  
„ Three full-duplex Q-SPIs with four slave-select lines; 16 bits wide; 8 locations deep; Tx  
FIFO and Rx FIFO  
„ Four 32-bit timers each containing four capture-and-compare registers linked to I/Os  
„ 32-bit watchdog with timer change protection, running on safe clock.  
„ Up to 108 general-purpose I/O pins with programmable pull-up, pull-down or bus  
keeper  
„ Vectored Interrupt Controller (VIC) with 16 priority levels  
„ Two 8-channel 10-bit ADCs provide a total of up to 16 analog inputs, with conversion  
times as low as 2.44 μs per channel. Each channel provides a compare function to  
minimize interrupts  
„ Up to 24 level-sensitive external interrupt pins, including CAN and LIN wake- up  
features  
„ External Static Memory Controller (SMC) with eight memory banks; up to 32-bit data  
bus; up to 24-bit address bus  
„ Processor wake-up from power-down via external interrupt pins; CAN or LIN activity  
„ Flexible Reset Generator Unit (RGU) able to control resets of individual modules  
„ Flexible Clock-Generation Unit (CGU) able to control clock frequency of individual  
modules  
‹ On-chip very low-power ring oscillator; fixed frequency of 0.4 MHz; always on to  
provide a Safe_Clock source for system monitoring  
‹ On-chip crystal oscillator with operating range from 10 MHz to 50 MHz - max. PLL  
input 15 MHz  
‹ On-chip PLL allows CPU operation up to a maximum CPU rate of 80 MHz  
‹ Generation of up to 10 base clocks  
‹ Seven fractional dividers  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
3 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
„ Highly configurable system Power Management Unit (PMU),  
‹ clock control of individual modules  
‹ allows minimization of system operating power consumption in any configuration  
„ Standard ARM test and debug interface with real-time in-circuit emulator  
„ Boundary-scan test supported  
„ Dual power supply:  
‹ CPU operating voltage: 1.8 V ± 5%  
‹ I/O operating voltage: 2.7 V to 3.6 V; inputs tolerant up to 5.5 V  
„ 144-pin LQFP package  
„
40 °C to 85 °C ambient operating temperature range  
4. Ordering information  
Table 1.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
LPC2917FBD144  
LPC2919FBD144  
LQFP144  
plastic low profile quad flat package; 144 leads; body 20 × 20 × 1.4 mm, pin SOT486-1  
pitch 0.5 mm  
LQFP144  
plastic low profile quad flat package; 144 leads; body 20 × 20 × 1.4 mm, pin SOT486-1  
pitch 0.5 mm  
4.1 Ordering options  
Table 2.  
Part options  
Type number  
Flash memory  
(kB)  
RAM (kB)  
SMC  
LIN 2.0  
Package  
LPC2917FBD144 512  
LPC2919FBD144 768  
80 (incl TCMs)  
80 (incl TCMs)  
32-bit  
32-bit  
2
2
LQFP144  
LQFP144  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
4 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
5. Block diagram  
ITCM  
16 Kb  
DTCM  
16 Kb  
ARM968E-S  
m
LPC2917/19  
s
IEEE 1149.1 JTAG TEST and  
DEBUG INTERFACE  
s
Vectored Interrupt  
Controller (VIC)  
s
External Static Memory  
Embedded  
FLASH Memory  
512/768 Kb  
Controller (SMC)  
s
Embedded  
FLASH Memory Controller (FMC)  
SRAM Memory 16 Kb  
s
SRAM Controller #1  
Embedded  
SRAM Memory 32 Kb  
Timer 0, 1 (MTMR)  
PWM 0, 1, 2, 3  
ADC 1, 2  
s
SRAM Controller #0  
s
Chip Feature ID (CFID)  
s
System Control Unit (SCU)  
Event Router (ER)  
CAN Controller  
0, 1  
s
GLOBAL ACCEPTANCE  
FILTER  
General Purpose IO (GPIO)  
0, 1, 2, 3  
2 Kbyte Static RAM  
LIN MASTER 0/1  
Timer (TMR)  
0, 1, 2, 3  
s
SPI 0, 1, 2  
UART 0, 1  
Watchdog Timer (WDT)  
Clock Generation Unit (CGU)  
s
Reset Generation Unit (RGU)  
Power Management Unit (PMU)  
Multi-layer AHB  
system bus  
m = master port  
s = slave port  
Fig 1. LPC2917/19 block diagram  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
5 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
6. Pinning information  
6.1 Pinning  
1
108  
LPC2917FBD144  
LPC2919FBD144  
36  
73  
144PINS  
Fig 2. Pin configuration for SOT486-1 (LQFP144)  
6.2 Pin description  
6.2.1 General description  
The LPC2917/19 has up to four ports: two of 32 pins each, one of 28 pins and one of 16  
pins. The pin to which each function is assigned is controlled by the SFSP registers in the  
SCU. The functions combined on each port pin are shown in the pin description tables in  
this section.  
6.2.2 LQFP144 pin assignment  
Table 3.  
Symbol  
LQFP144 pin assignment  
Pin  
Description  
Function 0 (default) Function 1  
IEEE 1149.1 test data out  
Function 2  
Function 3  
TDO  
1
P2.21  
P0.24  
P0.25  
P0.26  
P0.27  
P0.28  
P0.29  
VDD(IO)  
P2.22  
P2.23  
P3.6  
2
GPIO 2, pin 21  
GPIO 0, pin 24  
GPIO 0, pin 25  
GPIO 0, pin 26  
GPIO 0, pin 27  
GPIO 0, pin 28  
GPIO 0, pin 29  
-
PWM2 CAP1  
CAN1 TxD  
CAN1 RxD  
-
EXTBUS D19  
SPI2 SCS0  
SPI2 SDO  
3
UART1 TxD  
4
UART1 RxD  
5
-
-
-
-
SPI2 SDI  
6
-
SPI2 SCK  
7
TIMER0 CAP0  
TIMER0 CAP1  
TIMER0 MAT0  
TIMER0 MAT1  
8
9
3.3 V power supply for I/O  
10  
11  
12  
13  
14  
15  
GPIO 2, pin 22  
GPIO 2, pin 23  
GPIO 3, pin 6  
GPIO 3, pin 7  
GPIO 0, pin 30  
GPIO 0, pin 31  
-
PWM2 CAP2  
PWM3 CAP0  
PWM1 MAT0  
PWM1 MAT1  
TIMER0 CAP2  
TIMER0 CAP3  
EXTBUS D20  
EXTBUS D21  
LIN1 TxD  
-
SPI0 SCS3  
P3.7  
SPI2 SCS1  
LIN1 RxD  
P0.30  
P0.31  
-
-
TIMER0 MAT2  
TIMER0 MAT3  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
6 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 3.  
Symbol  
LQFP144 pin assignment …continued  
Pin  
Description  
Function 0 (default) Function 1  
Function 2  
Function 3  
P2.24  
16  
17  
18  
19  
20  
21  
22  
23  
24  
25  
GPIO 2, pin 24  
GPIO 2, pin 25  
-
-
PWM3 CAP1  
PWM3 CAP2  
EXTBUS D22  
EXTBUS D23  
P2.25  
VDD(CORE)  
VSS(CORE)  
P1.31  
1.8 V power supply for digital core  
ground for digital core  
GPIO 1, pin 31  
ground for I/O  
GPIO 1, pin 30  
GPIO 3, pin 8  
GPIO 3, pin 9  
GPIO 1, pin 29  
TIMER0 CAP1  
TIMER0 MAT1  
EXTINT5  
VSS(IO)  
P1.30  
TIMER0 CAP0  
SPI2 SCS0  
SPI2 SDO  
TIMER0 MAT0  
PWM1 MAT2  
PWM1 MAT3  
PWM TRAP0  
EXTINT4  
P3.8  
-
P3.9  
-
P1.29  
TIMER1 CAP0, EXT  
START  
PWM3 MAT5  
P1.28  
26  
GPIO 1, pin 28  
TIMER1 CAP1, ADC1 PWM TRAP1  
EXT START  
PWM3 MAT4  
P2.26  
P2.27  
P1.27  
27  
28  
29  
GPIO 2, pin 26  
GPIO 2, pin 27  
GPIO 1, pin 27  
TIMER0 CAP2  
TIMER0 CAP3  
TIMER0 MAT2  
TIMER0 MAT3  
EXTINT6  
EXTINT7  
TIMER1 CAP2, ADC2 PWM TRAP2  
EXT START  
PWM3 MAT3  
P1.26  
VDD(IO)  
P1.25  
P1.24  
P1.23  
P1.22  
TMS  
30  
31  
32  
33  
34  
35  
36  
37  
38  
GPIO 1, pin 26  
PWM2 MAT0  
PWM TRAP3  
PWM3 MAT2  
3.3 V power supply for I/O  
GPIO 1, pin 25  
GPIO 1, pin 24  
GPIO 1, pin 23  
GPIO 1, pin 22  
PWM1 MAT0  
-
-
-
-
PWM3 MAT1  
PWM3 MAT0  
EXTBUS CS5  
EXTBUS CS4  
PWM0 MAT0  
UART0 RxD  
UART0 TxD  
IEEE 1149.1 test mode select, pulled up internally.  
IEEE 1149.1 test clock  
TCK  
P1.21  
GPIO 1, pin 21  
TIMER3 CAP3  
TIMER1 CAP3,  
MSCSS PAUSE  
EXTBUS D7  
P1.20  
P1.19  
P1.18  
P1.17  
VSS(IO)  
P1.16  
P2.0  
39  
40  
41  
42  
43  
44  
45  
46  
47  
48  
49  
50  
51  
52  
GPIO 1, pin 20  
GPIO 1, pin 19  
GPIO 1, pin 18  
GPIO 1, pin 17  
ground for I/O  
GPIO 1, pin 16  
GPIO 2, pin 0  
GPIO 2, pin 1  
GPIO 3, pin 10  
GPIO 3, pin 11  
GPIO 1, pin 15  
GPIO 1, pin 14  
GPIO 1, pin 13  
GPIO 1, pin 12  
TIMER3 CAP2  
TIMER3 CAP1  
TIMER3 CAP0  
TIMER2 CAP3  
SPI0 SCS1  
SPI0 SCS2  
SPI0 SDO  
SPI0 SDI  
EXTBUS D6  
EXTBUS D5  
EXTBUS D4  
EXTBUS D3  
TIMER2 CAP2  
TIMER2 MAT0  
TIMER2 MAT1  
SPI2 SDI  
SPI0 SCK  
PWM TRAP3  
PWM TRAP2  
PWM1 MAT4  
PWM1 MAT5  
SPI0 SCS0  
SPI0 SCS3  
-
EXTBUS D2  
EXTBUS D8  
EXTBUS D9  
-
P2.1  
P3.10  
P3.11  
P1.15  
P1.14  
P1.13  
P1.12  
SPI2 SCK  
-
TIMER2 CAP1  
TIMER2 CAP0  
EXTINT3  
EXTBUS D1  
EXTBUS D0  
EXTBUS WEN  
EXTBUS OEN  
EXTINT2  
-
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
7 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 3.  
Symbol  
LQFP144 pin assignment …continued  
Pin  
Description  
Function 0 (default) Function 1  
3.3 V power supply for I/O  
Function 2  
Function 3  
VDD(IO)  
P2.2  
53  
54  
55  
56  
57  
58  
59  
60  
61  
62  
63  
64  
65  
66  
67  
68  
69  
70  
71  
72  
73  
74  
75  
76  
77  
78  
79  
80  
81  
82  
83  
84  
85  
86  
87  
88  
89  
90  
91  
92  
GPIO 2, pin 2  
TIMER2 MAT2  
TIMER2 MAT3  
SPI1 SCK  
PWM TRAP1  
EXTBUS D10  
EXTBUS D11  
EXTBUS CS3  
EXTBUS CS2  
-
P2.3  
GPIO 2, pin 3  
PWM TRAP0  
P1.11  
P1.10  
P3.12  
VSS(CORE)  
VDD(CORE)  
P3.13  
P2.4  
GPIO 1, pin 11  
GPIO 1, pin 10  
GPIO 3, pin 12  
ground for digital core  
-
SPI1 SDI  
-
SPI1 SCS0  
EXTINT4  
1.8 V power supply for digital core  
GPIO 3, pin 13  
GPIO 2, pin 4  
GPIO 2, pin 5  
GPIO 1, pin 9  
ground for I/O  
GPIO 1, pin 8  
GPIO 1, pin 7  
GPIO 1, pin 6  
GPIO 2, pin 6  
GPIO 1, pin 5  
GPIO 1, pin 4  
SPI1 SDO  
EXTINT5  
EXTINT0  
EXTINT1  
LIN1 RxD  
-
TIMER1 MAT0  
TIMER1 MAT1  
SPI1 SDO  
EXTBUS D12  
EXTBUS D13  
EXTBUS CS1  
P2.5  
P1.9  
VSS(IO)  
P1.8  
SPI1 SCS0  
SPI1 SCS3  
SPI1 SCS2  
TIMER1 MAT2  
SPI1 SCS1  
SPI2 SCS2  
LIN1 TxD  
EXTBUS CS0  
EXTBUS A7  
EXTBUS A6  
EXTBUS D14  
EXTBUS A5  
EXTBUS A4  
P1.7  
UART1 RxD  
UART1 TxD  
EXTINT2  
P1.6  
P2.6  
P1.5  
PWM3 MAT5  
PWM3 MAT4  
P1.4  
TRSTN  
RSTN  
VSS(OSC)  
XOUT_OSC  
XIN_OSC  
VDD(OSC)  
VSS(PLL)  
P2.7  
IEEE 1149.1 test reset NOT; active LOW; pulled up internally  
asynchronous device reset; active LOW; pulled up internally  
ground for oscillator  
crystal out for oscillator  
crystal in for oscillator  
1.8 V supply for oscillator  
ground for PLL  
GPIO 2, pin 7  
GPIO 3, pin 14  
GPIO 3, pin 15  
TIMER1 MAT3  
SPI1 SDI  
EXTINT3  
EXTINT6  
EXTINT7  
EXTBUS D15  
CAN0 TxD  
P3.14  
P3.15  
VDD(IO)  
P2.8  
SPI1 SCK  
CAN0 RxD  
3.3 V power supply for I/O  
GPIO 2, pin 8  
GPIO 2, pin 9  
GPIO 1, pin 3  
GPIO 1, pin 2  
GPIO 1, pin 1  
ground for digital core  
-
PWM0 MAT0  
PWM0 MAT1  
PWM3 MAT3  
PWM3 MAT2  
PWM3 MAT1  
SPI0 SCS2  
SPI0 SCS1  
EXTBUS A3  
EXTBUS A2  
EXTBUS A1  
P2.9  
-
P1.3  
SPI2 SCS1  
SPI2 SCS3  
EXTINT1  
P1.2  
P1.1  
VSS(CORE)  
VDD(CORE)  
P1.0  
1.8 V power supply for digital core  
GPIO 1, pin 0  
GPIO 2, pin 10  
GPIO 2, pin 11  
EXTINT0  
PWM3 MAT0  
PWM0 MAT2  
PWM0 MAT3  
EXTBUS A0  
SPI0 SCS0  
SPI0 SCK  
P2.10  
P2.11  
-
-
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
8 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 3.  
Symbol  
LQFP144 pin assignment …continued  
Pin  
Description  
Function 0 (default) Function 1  
Function 2  
Function 3  
P0.0  
93  
GPIO 0, pin 0  
ground for I/O  
GPIO 0, pin 1  
GPIO 0, pin 2  
GPIO 0, pin 3  
GPIO 3, pin 0  
GPIO 3, pin 1  
GPIO 2, pin 12  
GPIO 2, pin 13  
GPIO 0, pin 4  
GPIO 0, pin 5  
-
CAN0 TxD  
EXTBUS D24  
VSS(IO)  
P0.1  
94  
95  
-
-
-
-
-
-
-
-
-
CAN0 RxD  
EXTBUS D25  
EXTBUS D26  
EXTBUS D27  
EXTBUS CS6  
EXTBUS CS7  
SPI0 SDI  
P0.2  
96  
PWM0 MAT0  
PWM0 MAT1  
PWM2 MAT0  
PWM2 MAT1  
PWM0 MAT4  
PWM0 MAT5  
PWM0 MAT2  
PWM0 MAT3  
P0.3  
97  
P3.0  
98  
P3.1  
99  
P2.12  
P2.13  
P0.4  
100  
101  
102  
103  
104  
105  
106  
107  
108  
SPI0 SDO  
EXTBUS D28  
EXTBUS D29  
P0.5  
VDD(IO)  
P0.6  
3.3 V power supply for I/O  
GPIO 0, pin 6  
GPIO 0, pin 7  
-
-
PWM0 MAT4  
PWM0 MAT5  
EXTBUS D30  
EXTBUS D31  
P0.7  
VDD(A3V3)  
JTAGSEL  
3.3 V power supply for AD Converters  
TAP controller select input; LOW-level selects the ARM debug mode; HIGH-level selects  
boundary scan and flash programming; pulled up internally  
NC  
109  
110  
111  
112  
113  
114  
115  
116  
117  
118  
119  
120  
121  
122  
123  
124  
125  
126  
127  
128  
129  
130  
131  
-
VREFP  
VREFN  
P0.8  
HIGH reference for AD Converters  
LOW reference for AD Converters  
GPIO 0, pin 8  
GPIO 0, pin 9  
GPIO 0, pin 10  
GPIO 0, pin 11  
GPIO 2, pin 14  
GPIO 2, pin 15  
GPIO 3, pin 2  
ground for I/O  
GPIO 3, pin 3  
GPIO 0, pin 12  
GPIO 0, pin 13  
GPIO 0, pin 14  
GPIO 0, pin 15  
GPIO 0, pin 16  
GPIO 0, pin 17  
ADC1 IN0  
ADC1 IN1  
ADC1 IN2  
ADC1 IN3  
-
LIN0 TxD  
EXTBUS A20  
EXTBUS A21  
EXTBUS A8  
EXTBUS A9  
EXTBUS BLS0  
EXTBUS BLS1  
-
P0.9  
LIN0 RxD  
P0.10  
P0.11  
P2.14  
P2.15  
P3.2  
PWM1 MAT0  
PWM1 MAT1  
PWM0 CAP0  
PWM0 CAP1  
PWM2 MAT2  
-
TIMER3 MAT0  
VSS(IO)  
P3.3  
TIMER3 MAT1  
ADC1 IN4  
ADC1 IN5  
ADC1 IN6  
ADC1 IN7  
ADC2 IN0  
ADC2 IN1  
PWM2 MAT3  
PWM1 MAT2  
PWM1 MAT3  
PWM1 MAT4  
PWM1 MAT5  
UART0 TXD  
UART0 RXD  
-
P0.12  
P0.13  
P0.14  
P0.15  
P0.16  
P0.17  
VDD(CORE)  
VSS(CORE)  
P2.16  
P2.17  
VDD(IO)  
EXTBUS A10  
EXTBUS A11  
EXTBUS A12  
EXTBUS A13  
EXTBUS A22  
EXTBUS A23  
1.8 V power supply for digital core  
ground for digital core  
GPIO 2, pin 16  
GPIO 2, pin 17  
UART1 TxD  
UART1 RxD  
PWM0 CAP2  
PWM1 CAP0  
EXTBUS BLS2  
EXTBUS BLS3  
3.3 V power supply for I/O  
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Table 3.  
Symbol  
LQFP144 pin assignment …continued  
Pin  
Description  
Function 0 (default) Function 1  
Function 2  
Function 3  
P0.18  
P0.19  
P3.4  
132  
133  
134  
135  
136  
137  
138  
139  
140  
141  
142  
143  
144  
GPIO 0, pin 18  
GPIO 0, pin 19  
GPIO 3, pin 4  
GPIO 3, pin 5  
GPIO 2, pin 18  
GPIO 2, pin 19  
GPIO 0, pin 20  
GPIO 0, pin 21  
GPIO 0, pin 22  
ground for I/O  
GPIO 0, pin 23  
GPIO 2, pin 20  
ADC2 IN2  
ADC2 IN3  
TIMER3 MAT2  
TIMER3 MAT3  
-
PWM2 MAT0  
PWM2 MAT1  
PWM2 MAT4  
PWM2 MAT5  
PWM1 CAP1  
PWM1 CAP2  
PWM2 MAT2  
PWM2 MAT3  
PWM2 MAT4  
EXTBUS A14  
EXTBUS A15  
CAN1 TxD  
P3.5  
CAN1 RxD  
P2.18  
P2.19  
P0.20  
P0.21  
P0.22  
VSS(IO)  
P0.23  
P2.20  
TDI  
EXTBUS D16  
EXTBUS D17  
EXTBUS A16  
EXTBUS A17  
EXTBUS A18  
-
ADC2 IN4  
ADC2 IN5  
ADC2 IN6  
ADC2 IN7  
-
PWM2 MAT5  
PWM2 CAP0  
EXTBUS A19  
EXTBUS D18  
IEEE 1149.1 data in, pulled up internally.  
7. Functional description  
7.1 Reset, debug, test and power description  
7.1.1 Reset and power-up behavior  
The LPC2917/19 contains external reset input and internal power-up reset circuits. This  
ensures that a reset is extended internally until the oscillators and flash have reached a  
stable state. See Section 11 for trip levels of the internal power-up reset circuit1. See  
Section 12 for characteristics of the several start-up and initialization times. Table 4 shows  
the reset pin.  
Table 4.  
Symbol  
RSTN  
Reset pin  
Direction  
in  
Description  
external reset input, active LOW; pulled up internally  
At activation of the RSTN pin the JTAGSEL pin is sensed as logic LOW. If this is the case  
the LPC2917/19 is assumed to be connected to debug hardware, and internal circuits  
re-program the source for the BASE_SYS_CLK to be the crystal oscillator instead of the  
Low-Power Ring Oscillator (LP_OSC). This is required because the clock rate when  
running at LP_OSC speed is too low for the external debugging environment.  
7.1.2 Reset strategy  
The LPC2917/19 contains a central module, the Reset Generator Unit (RGU) in the  
Power, Clock and Reset Control Subsystem (PCRSS), which controls all internal reset  
signals towards the peripheral modules. The RGU provides individual reset control as well  
as the monitoring functions needed for tracing a reset back to source.  
1. Only for 1.8 V power sources  
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7.1.3 IEEE 1149.1 interface pins (JTAG boundary-scan test)  
The LPC2917/19 contains boundary-scan test logic according to IEEE 1149.1, also  
referred to in this document as Joint Test Action Group (JTAG). The boundary-scan test  
pins can be used to connect a debugger probe for the embedded ARM processor. Pin  
JTAGSEL selects between boundary-scan mode and debug mode. Table 5 shows the  
boundary- scan test pins.  
Table 5.  
Symbol  
JTAGSEL  
IEEE 1149.1 boundary-scan test and debug interface  
Description  
TAP controller select input. LOW level selects ARM debug mode and HIGH level  
selects boundary scan and flash programming; pulled up internally  
TRSTN  
TMS  
TDI  
test reset input; pulled up internally (active LOW)  
test-mode select input; pulled up internally  
test data input, pulled up internally  
test data output  
TDO  
TCK  
test clock input  
7.1.4 Power supply pins description  
Table 6 shows the power supply pins.  
Table 6.  
Symbol  
VDD(CORE)  
VSS(CORE)  
VDD(IO)  
Power supplies  
Description  
digital core supply 1.8 V  
digital core ground (digital core, ADC 1)  
I/O pins supply 3.3 V  
I/O pins ground  
VSS(IO)  
VDD(OSC)  
VSS(OSC)  
VDD(A3V3)  
VSS(PLL)  
oscillator and PLL supply  
oscillator ground  
ADC 3.3 V supply  
PLL ground  
7.2 Clocking strategy  
7.2.1 Clock architecture  
The LPC2917/19 contains several different internal clock areas. Peripherals like Timers,  
SPI, UART, CAN and LIN have their own individual clock sources called Base Clocks. All  
base clocks are generated by the Clock Generator Unit (CGU). They may be unrelated in  
frequency and phase and can have different clock sources within the CGU.  
The system clock for the CPU and AHB Multilayer Bus infrastructure has its own base  
clock. This means most peripherals are clocked independently from the system clock. See  
Figure 3 for an overview of the clock areas within the device.  
Within each clock area there may be multiple branch clocks, which offers very flexible  
control for power-management purposes. All branch clocks are outputs of the Power  
Management Unit (PMU) and can be controlled independently. Branch clocks derived  
from the same base clock are synchronous in frequency and phase. See Section 8.8 for  
more details of clock and power control within the device.  
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ITCM  
16 Kb  
DTCM  
16 Kb  
ARM968E-S  
LPC2917/19  
s
m
SYS_CLK  
IEEE 1149.1 JTAG TEST and  
DEBUG INTERFACE  
s
Vectored Interrupt  
Controller (VIC)  
s
External Static Memory  
Controller (SMC)  
Embedded  
FLASH Memory  
512 - 768 Kb  
s
Embedded  
FLASH Memory Controller (FMC)  
SRAM Memory 16 Kb  
s
SRAM Controller #1  
Modulation and Sampling  
Control Subsystem  
Embedded  
SRAM Memory 32 Kb  
MSCSS_CLK  
ADC_CLK  
Timer 0, 1 (MTMR)  
PWM 0, 1, 2, 3  
ADC 1, 2  
s
SRAM Controller #0  
s
General Subsystem  
Chip Feature ID (CFID)  
s
System Control Unit (SCU)  
Event Router (ER)  
CAN Controller  
0, 1  
IVNSS_CLK  
GLOBAL ACCEPTANCE  
FILTER  
s
Peripheral Subsystem  
2 Kbyte Static RAM  
General Purpose IO (GPIO)  
0, 1, 2, 3  
LIN MASTER 0/1  
Timer (TMR)  
0, 1, 2, 3  
TMR_CLK  
s
SPI_CLK  
UART_CLK  
SAFE_CLK  
SPI 0, 1, 2  
UART 0, 1  
Watchdog Timer (WDT)  
Power Clock Reset  
Control Subsystem  
Clock Generation Unit (CGU)  
Reset Generation Unit (RGU)  
Power Management Unit (PMU)  
PCR_CLK  
s
Fig 3. LPC2917/19 block diagram, overview of clock areas  
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7.2.2 Base clock and branch clock relationship  
The next table contains an overview of all the base blocks in the LPC2917/19 and their  
derived branch clocks. A short description is given of the hardware parts that are clocked  
with the individual branch clocks. In relevant cases more detailed information can be  
found in the specific subsystem description. Some branch clocks have special protection  
since they clock vital system parts of the device and should (for example) not be switched  
off. See Section 8.8.6 for more details of how to control the individual branch clocks.  
Table 7.  
Base clock and branch clock overview  
Branch clock name  
Base clock  
Parts of the device clocked by Remark  
this branch clock  
[1]  
BASE_SAFE_CLK  
BASE_SYS_CLK  
CLK_SAFE  
Watchdog Timer  
CLK_SYS_CPU  
CLK_SYS_SYS  
CLK_SYS_PCRSS  
CLK_SYS_FMC  
CLK_SYS_RAM0  
ARM968E-S and TCMs  
AHB Bus infrastructure  
AHB side of bridge in PCRSS  
Flash-Memory Controller  
Embedded SRAM Controller 0  
(32 KByte)  
CLK_SYS_RAM1  
CLK_SYS_SMC  
Embedded SRAM Controller 1  
(16 KByte)  
External Static-Memory  
Controller  
CLK_SYS_GESS  
CLK_SYS_VIC  
General Subsystem  
Vectored Interrupt Controller  
[2] [4]  
CLK_SYS_PESS  
CLK_SYS_GPIO0  
CLK_SYS_GPIO1  
CLK_SYS_GPIO2  
CLK_SYS_GPIO3  
CLK_SYS_IVNSS_A  
CLK_PCR_SLOW  
Peripheral Subsystem  
GPIO bank 0  
GPIO bank 1  
GPIO bank 2  
GPIO bank 3  
AHB side of bridge of IVNSS  
[1] [3]  
BASE_PCR_CLK  
PCRSS, CGU, RGU and PMU  
logic clock  
,
BASE_IVNSS_CLK  
CLK_IVNSS_VPB  
CLK_IVNSS_CANCA  
CLK_IVNSS_CANC0  
CLK_IVNSS_CANC1  
CLK_IVNSS_LIN0  
CLK_IVNSS_LIN1  
VPB side of the IVNSS  
CAN controller Acceptance Filter  
CAN channel 0  
CAN channel 1  
LIN channel 0  
LIN channel 1  
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Table 7.  
Base clock and branch clock overview …continued  
Base clock  
Branch clock name  
Parts of the device clocked by Remark  
this branch clock  
BASE_MSCSS_CLK  
CLK_MSCSS_VPB  
VPB side of the MSCSS  
CLK_MSCSS_MTMR0 Timer 0 in the MSCSS  
CLK_MSCSS_MTMR1 Timer 1 in the MSCSS  
CLK_MSCSS_PWM0  
CLK_MSCSS_PWM1  
CLK_MSCSS_PWM2  
CLK_MSCSS_PWM3  
PWM 0  
PWM 0  
PWM 0  
PWM 0  
CLK_MSCSS_ADC1_V VPB side of ADC 1  
PB  
CLK_MSCSS_ADC2_V VPB side of ADC 2  
PB  
BASE_UART_CLK  
BASE_SPI_CLK  
CLK_UART0  
CLK_UART1  
CLK_SPI0  
UART 0 interface clock  
UART 1 interface clock  
SPI 0 interface clock  
CLK_SPI1  
SPI 1 interface clock  
CLK_SPI2  
SPI 2 interface clock  
BASE_TMR_CLK  
BASE_ADC_CLK  
CLK_TMR0  
CLK_TMR1  
CLK_TMR2  
CLK_TMR3  
CLK_ADC1  
Timer 0 clock for counter part  
Timer 1 clock for counter part  
Timer 2 clock for counter part  
Timer 3 clock for counter part  
Control of ADC 1, capture sample  
result  
CLK_ADC2  
Control of ADC 2, capture sample  
result  
BASE_CLK_TESTSHELL CLK_TESTSHELL_IP  
[1] This clock is always on (cannot be switched off for system safety reasons)  
[2] In the peripheral subsystem parts of the Timers, Watchdog Timer, SPI and UART have their own clock  
source. See Section 8.4 for details.  
[3] In the Power Clock and Reset Control subsystem parts of the CGU, RGU PMU have their own clock  
source. See Section 8.8 for details.  
[4] The clock should remain activated when system wake-up on timer or UART is required.  
8. Block description  
8.1 Flash memory controller  
8.1.1 Overview  
The Flash Memory Controller (FMC) interfaces to the embedded flash memory for two  
tasks:  
Providing memory data transfer  
Memory configuration via triggering, programming and erasing  
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The flash memory has a 128-bit wide data interface and the flash controller offers two  
128-bit buffer lines to improve system performance. The flash has to be programmed  
initially via JTAG. In-system programming must be supported by the boot loader.  
In-application programming is possible. Flash memory contents can be protected by  
disabling JTAG access. Suspension of burning or erasing is not supported.  
The key features are:  
Programming by CPU via AHB  
Programming by external programmer via JTAG  
JTAG access protection  
Burn-finished and erase-finished interrupt  
8.1.2 Description  
After reset flash initialization is started, which takes tinit time, see Section 12. During this  
initialization flash access is not possible and AHB transfers to flash are stalled, blocking  
the AHB bus.  
During flash initialization the index sector is read to identify the status of the JTAG access  
protection and sector security. If JTAG access protection is active the flash is not  
accessible via JTAG. ARM debug facilities are disabled to protect the flash-memory  
contents against unwanted reading out externally. If sector security is active only the  
concerned sections are read.  
Flash can be read synchronously or asynchronously to the system clock. In synchronous  
operation the flash goes into standby after returning the read data. Started reads cannot  
be stopped, and speculative reading and dual buffering are therefore not supported.  
With asynchronous reading, transfer of the address to the flash and of read data from the  
flash is done asynchronously, giving the fastest possible response time. Started reads can  
be stopped, so speculative reading and dual buffering are supported.  
Buffering is offered because the flash has a 128-bit wide data interface while the AHB  
interface has only 32 bits. With buffering a buffer line holds the complete 128-bit flash  
word, from which four words can be read. Without buffering every AHB data port read  
starts a flash read. A flash read is a slow process compared to the minimum AHB cycle  
time, so with buffering the average read time is reduced. This can improve system  
performance.  
With single buffering the most recently read flash word remains available until the next  
flash read. When an AHB data-port read transfer requires data from the same flash word  
as the previous read transfer, no new flash read is done and the read data is given without  
wait cycles.  
When an AHB data-port read transfer requires data from a different flash word to that  
involved in the previous read transfer, a new flash read is done and wait states are given  
until the new read data is available.  
With dual buffering a secondary buffer line is used, the output of the flash being  
considered as the primary buffer. On a primary buffer hit data can be copied to the  
secondary buffer line, which allows the flash to start a speculative read of the next flash  
word.  
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Both buffer lines are invalidated after:  
Initialization  
Configuration-register access  
Data-latch reading  
Index-sector reading  
The modes of operation are listed in Table 8.  
Table 8.  
Flash read modes  
Synchronous timing  
No buffer line  
for single (non-linear) reads; one flash-word read per word read  
Single buffer line  
default mode of operation; most recently read flash word is kept until  
another flash word is required  
Asynchronous timing  
No buffer line  
one flash-word read per word read  
Single buffer line  
most recently read flash word is kept until another flash word is  
required  
Dual buffer line, single  
speculative  
on a buffer miss a flash read is done, followed by at most one  
speculative read; optimized for execution of code with small loops  
(less than eight words) from flash  
Dual buffer line, always  
speculative  
most recently used flash word is copied into second buffer line; next  
flash-word read is started; highest performance for linear reads  
8.1.3 Flash memory controller pin description  
The flash memory controller has no external pins. However, the flash can be programmed  
via the JTAG pins, see Section 7.1.3.  
8.1.4 Flash memory controller clock description  
The flash memory controller is clocked by CLK_SYS_FMC, see Section 7.2.2.  
8.1.5 Flash layout  
The ARM processor can program the flash for ISP (In-System Programming) and IAP (In-  
Application Programming). Note that the flash always has to be programmed by ‘flash  
words’ of 128 bits (four 32-bit AHB bus words, hence 16 bytes).  
The flash memory is organized into eight ‘small’ sectors of 8 kB each and up to 11 ‘large’  
sectors of 64 kB each. The number of large sectors depends on the device type. A sector  
must be erased before data can be written to it. The flash memory also has sector-wise  
protection. Writing occurs per page which consists of 4096 bits (32 flash words). A small  
sector contains 16 pages; a large sector contains 128 pages.  
Table 9 gives an overview of the flash-sector base addresses.  
Table 9.  
Flash sector overview  
Sector number  
Sector size (kB)  
Sector base address  
0000 0000h  
0
1
2
8
8
8
0000 2000h  
0000 4000h  
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Table 9.  
Flash sector overview …continued  
Sector number  
Sector size (kB)  
Sector base address  
0000 6000h  
0000 8000h  
0000 A000h  
0000 C000h  
0000 E000h  
0001 0000h  
0002 0000h  
0003 0000h  
0004 0000h  
0005 0000h  
0006 0000h  
0007 0000h  
0008 0000h  
0009 0000h  
000A 0000h  
000B 0000h  
3
8
4
8
5
8
6
8
7
8
8
64  
64  
64  
64  
64  
64  
64  
64  
64  
64  
64  
9
10  
11  
12  
13  
14  
15[1]  
16[1]  
17[1]  
18[1]  
[1] Availability of sector 15 to sector 18 depends on device type, see Section 4 “Ordering information”.  
The index sector is a special sector in which the JTAG access protection and sector  
security are located. The address space becomes visible by setting the FS_ISS bit and  
overlaps the regular flash sector’s address space.  
Note that the index sector cannot be erased, and that access to it has to be performed via  
code outside the flash.  
8.1.6 Flash bridge wait-states  
To eliminate the delay associated with synchronizing flash-read data, a predefined  
number of wait-states must be programmed. These depend on flash-memory response  
time and system clock period. The minimum wait-states value can be calculated with the  
following formulas:  
Synchronous reading:  
tacc(clk)  
------------------  
WST >  
1  
tt  
tclk(sys)  
Asynchronous reading:  
tacc(addr)  
---------------------  
ttclk(sys)  
WST >  
1  
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Remark: If the programmed number of wait-states is more than three, flash-data reading  
cannot be performed at full speed (i.e. with zero wait-states at the AHB bus) if speculative  
reading is active.  
8.2 External static memory controller  
8.2.1 Overview  
The LPC2917/19 contains an external Static Memory Controller (SMC) which provides an  
interface for external (off-chip) memory devices.  
Key features are:  
Supports static memory-mapped devices including RAM, ROM, flash, burst ROM and  
external I/O devices  
Asynchronous page-mode read operation in non-clocked memory subsystems  
Asynchronous burst-mode read access to burst-mode ROM devices  
Independent configuration for up to eight banks, each up to 16 MB  
Programmable bus-turnaround (idle) cycles (one to 16)  
Programmable read and write wait states (up to 32), for static RAM devices  
Programmable initial and subsequent burst-read wait state for burst-ROM devices  
Programmable write protection  
Programmable burst-mode operation  
Programmable external data width: 8-bit, 16-bit or 32-bit  
Programmable read-byte lane enable control  
8.2.2 Description  
The SMC simultaneously supports up to eight independently configurable memory banks.  
Each memory bank can be 8, 16 or 32 bits wide and is capable of supporting SRAM,  
ROM, burst-ROM memory or external I/O devices.  
A separate chip-select output is available for each bank. The chip-select lines are  
configurable to be active HIGH or LOW. Memory-bank selection is controlled by memory  
addressing. Table 10 shows how the 32-bit system address is mapped to the external bus  
memory base addresses, chip selects and bank internal addresses.  
Table 10. External memory-bank address bit description  
32 bit  
Symbol  
Description  
System  
Address Bit  
field  
31 to 29  
BA[2:0]  
external static-memory base address (three most significant bits);  
the base address can be found in the memory map; see Ref. 1. This  
field contains ’010’ when addressing an external memory bank.  
28 to 26  
25 and 24  
23 to 0  
CS[2:0]  
-
chip-select address space for eight memory banks; see [1]  
always ’00’; other values are ’mirrors’ of the 16 MByte bank address  
16-MByte memory banks address space  
A[23:0]  
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Table 11. External static-memory controller banks  
CS[2:0]  
Bank  
000  
001  
010  
011  
100  
101  
110  
111  
bank 0  
bank 1  
bank 2  
bank 3  
bank 4  
bank 5  
bank 6  
bank 7  
8.2.3 External static-memory controller pin description  
The external static-memory controller module in the LPC2917/19 has the following pins,  
which are combined with other functions on the port pins of the LPC2917/19. Table 12  
shows the external memory controller pins.  
Table 12. External memory controller pins  
Symbol  
Direction  
out  
Description  
EXTBUS CSx  
EXTBUS BLSy  
memory-bank x select, x runs from 0 to 7  
byte-lane select input y, y runs from 0 to 3  
write enable (active LOW)  
output enable (active LOW)  
address bus  
out  
EXTBUS WE_N out  
EXTBUS OE_N out  
EXTBUS A[23:0] out  
EXTBUS D[31:0] in/out  
data bus  
8.2.4 External static-memory controller clock description  
The External Static-Memory Controller is clocked by CLK_SYS_SMC, see Section 7.2.2.  
8.2.5 External memory timing diagrams  
A timing diagram for reading from external memory is shown in Figure 4. The relationship  
between the wait-state settings is indicated with arrows.  
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CLK(SYS)  
CS  
OE_N  
ADDR  
DATA  
WSTOEN  
WST1  
WSTOEN=3, WST1=7  
Fig 4. Reading from external memory  
A timing diagram for writing to external memory is shown In Figure 5. The relationship  
between wait-state settings is indicated with arrows.  
CLK(SYS)  
CS  
WE_N / BLS  
ADDR  
DATA  
WSTWEN  
WST2  
WSTWEN=3, WST2=7  
Fig 5. Writing to external memory  
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Usage of the idle/turn-around time (IDCY) is demonstrated In Figure 6. Extra wait states  
are added between a read and a write cycle in the same external memory device.  
CLK(SYS)  
CS  
WE_N / BLS  
OE_N  
ADDR  
DATA  
WSTOEN  
WST1  
WSTWEN  
WST2  
IDCY  
WSTOEN=5, WSTWEN=5, WST1=7, WST2=6, IDCY=5  
Fig 6. Reading/writing external memory  
Address pins on the device are shared with other functions. When connecting external  
memories, check that the I/O pin is programmed for the correct function. Control of these  
settings is handled by the SCU.  
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8.3 General subsystem  
8.3.1 General subsystem clock description  
The general subsystem is clocked by CLK_SYS_GESS, see Section 7.2.2.  
8.3.2 Chip and feature identification  
8.3.2.1 Overview  
The key features are:  
Identification of product  
Identification of features enabled  
8.3.2.2 Description  
The Chip/Feature ID (CFID) module contains registers which show and control the  
functionality of the chip. It contains an ID to identify the silicon, and also registers  
containing information about the features enabled or disabled on the chip.  
8.3.2.3 CFID pin description  
The CFID has no external pins.  
8.3.3 System Control Unit (SCU)  
8.3.3.1 Overview  
The system control unit takes care of system-related functions.The key feature is  
configuration of the I/O port-pins multiplexer.  
8.3.3.2 Description  
The system control unit defines the function of each I/O pin of the LPC2917/19. The I/O  
pin configuration should be consistent with peripheral function usage.  
8.3.3.3 SCU pin description  
The SCU has no external pins.  
8.3.4 Event router  
8.3.4.1 Overview  
The event router provides bus-controlled routing of input events to the vectored interrupt  
controller for use as interrupt or wake-up signals.  
Key features:  
Up to 24 level-sensitive external interrupt pins, including CAN, LIN and RxD wake-up  
features plus three internal event sources  
Input events can be used as interrupt source either directly or latched (edge-detected)  
Direct events disappear when the event becomes inactive  
Latched events remain active until they are explicitly cleared  
Programmable input level and edge polarity  
Event detection maskable  
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Event detection is fully asynchronous, so no clock is required  
8.3.4.2 Description  
The event router allows the event source to be defined, its polarity and activation type to  
be selected and the interrupt to be masked or enabled. The event router can be used to  
start a clock on an external event.  
The vectored interrupt-controller inputs are active HIGH.  
8.3.4.3 Event-router pin description and mapping to register bit positions  
The event router module in the LPC2917/19 is connected to the pins listed below. The  
pins are combined with other functions on the port pins of the LPC2917/19. Table 13  
shows the pins connected to the event router, and also the corresponding bit position in  
the event-router registers and the default polarity.  
Table 13. Event-router pin connections  
Symbol  
Direction  
Bit position  
Description  
Default  
polarity  
EXTINT0  
EXTINT1  
EXTINT2  
EXTINT3  
EXTINT4  
EXTINT5  
EXTINT6  
EXTINT7  
CAN0 RXD  
CAN1 RXD  
-
in  
in  
in  
in  
in  
in  
in  
in  
in  
in  
-
0
external interrupt input 0  
external interrupt input 1  
external interrupt input 2  
external interrupt input 3  
external interrupt input 4  
external interrupt input 5  
external interrupt input 6  
external interrupt input 7  
CAN0 receive data input wake-up  
CAN1 receive data input wake-up  
reserved  
1
1
1
1
1
1
1
1
0
0
-
1
2
3
4
5
6
7
8
9
13 - 10  
14  
LIN0 RXD  
LIN1 RXD  
-
in  
in  
-
LIN0 receive data input wake-up  
LIN1 receive data input wake-up  
reserved  
0
0
-
15  
21 - 16  
22  
-
na  
na  
na  
-
CAN interrupt (internal)  
VIC FIQ (internal)  
1
1
1
-
-
23  
-
24  
VIC IRQ (internal)  
-
26 - 25  
reserved  
8.4 Peripheral subsystem  
8.4.1 Peripheral subsystem clock description  
The peripheral subsystem is clocked by a number of different clocks:  
CLK_SYS_PESS  
CLK_UART0/1  
CLK_SPI0/1/2  
CLK_TMR0/1/2/3  
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CLK_SAFE see Section 7.2.2  
8.4.2 Watchdog timer  
8.4.2.1 Overview  
The purpose of the watchdog timer is to reset the ARM9 processor within a reasonable  
amount of time if the processor enters an error state. The watchdog generates a system  
reset if the user program fails to trigger it correctly within a predetermined amount of time.  
Key features:  
Internal chip reset if not periodically triggered  
Timer counter register runs on always-on safe clock  
Optional interrupt generation on watchdog timeout  
Debug mode with disabling of reset  
Watchdog control register change-protected with key  
Programmable 32-bit watchdog timer period with programmable 32-bit prescaler.  
8.4.2.2 Description  
The watchdog timer consists of a 32-bit counter with a 32-bit prescaler.  
The watchdog should be programmed with a time-out value and then periodically  
restarted. When the watchdog times out it generates a reset through the RGU.  
To generate watchdog interrupts in watchdog debug mode the interrupt has to be enabled  
via the interrupt enable register. A watchdog-overflow interrupt can be cleared by writing  
to the clear-interrupt register.  
Another way to prevent resets during debug mode is via the Pause feature of the  
Watchdog Timer. The watchdog is stalled when the ARM9 is in debug mode and the  
PAUSE_ENABLE bit in the Watchdog Timer Control register is set.  
The Watchdog Reset output is fed to the Reset Generator Unit (RGU). The RGU contains  
a reset source register to identify the reset source when the device has gone through a  
reset. See Section 8.8.5.  
8.4.2.3 Pin description  
The watchdog has no external pins.  
8.4.2.4 Watchdog timer clock description  
The Watchdog Timer is clocked by two different clocks; CLK_SYS_PESS and  
CLK_SAFE, see Section 7.2.2. The register interface towards the system bus is clocked  
by CLK_SYS_PESS. The timer and prescale counters are clocked by CLK_SAFE which  
is always on.  
8.4.3 Timer  
8.4.3.1 Overview  
The LPC2917/19 contains six identical timers: four in the peripheral subsystem and two in  
the Modulation and Sampling Control SubSystem (MSCSS) located at different peripheral  
base addresses. This section describes the four timers in the peripheral subsystem. Each  
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timer has four capture inputs and/or match outputs. Connection to device pins depends on  
the configuration programmed into the port function-select registers. The two timers  
located in the MSCSS have no external capture or match pins, but the memory map is  
identical, see Section 8.7.7. One of these timers has an external input for a pause  
function.  
The key features are:  
32-bit timer/counter with programmable 32-bit prescaler  
Up to four 32-bit capture channels per timer. These take a snapshot of the timer value  
when an external signal connected to the TIMERx CAPn input changes state. A  
capture event may also optionally generate an interrupt  
Four 32-bit match registers per timer that allow:  
Continuous operation with optional interrupt generation on match  
Stop timer on match with optional interrupt generation  
Reset timer on match with optional interrupt generation  
Up to four external outputs per timer corresponding to match registers, with the  
following capabilities:  
Set LOW on match  
Set HIGH on match  
Toggle on match  
Do nothing on match  
Pause input pin (MSCSS timers only)  
8.4.3.2 Description  
The timers are designed to count cycles of the clock and optionally generate interrupts or  
perform other actions at specified timer values, based on four match registers. They also  
include capture inputs to trap the timer value when an input signal changes state,  
optionally generating an interrupt. The core function of the timers consists of a 32 bit  
‘prescale counter’ triggering the 32 bit ‘timer counter’. Both counters run on clock  
CLK_TMRx (x runs from 0 to 3) and all time references are related to the period of this  
clock. Note that each timer has its individual clock source within the Peripheral  
SubSystem. In the Modulation and Sampling SubSystem each timer also has its own  
individual clock source. See section Section 8.8.6 for information on generation of these  
clocks.  
8.4.3.3 Pin description  
The four timers in the peripheral subsystem of the LPC2917/19 have the pins described  
below. The two timers in the modulation and sampling subsystem have no external pins  
except for the pause pin on MSCSS timer 1. See Section 8.7.7 for a description of these  
timers and their associated pins. The timer pins are combined with other functions on the  
port pins of the LPC2917/19, see Section 8.3.3. Table Table 14 shows the timer pins (x  
runs from 0 to 3).  
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Table 14. Timer pins  
Symbol Direction  
Description  
TIMERx CAP[0] IN  
TIMERx CAP[1] IN  
TIMERx CAP[2] IN  
TIMERx CAP[3] IN  
TIMERx MAT[0] OUT  
TIMERx MAT[1] OUT  
TIMERx MAT[2] OUT  
TIMERx MAT[3] OUT  
TIMER x capture input 0  
TIMER x capture input 1  
TIMER x capture input 2  
TIMER x capture input 3  
TIMER x match output 0  
TIMER x match output 1  
TIMER x match output 2  
TIMER x match output 3  
8.4.3.4 Timer clock description  
The timer modules are clocked by two different clocks; CLK_SYS_PESS and CLK_TMRx  
(x = 0-3), see Section 7.2.2. Note that each timer has its own CLK_TMRx branch clock for  
power management. The frequency of all these clocks is identical as they are derived  
from the same base clock BASE_CLK_TMR. The register interface towards the system  
bus is clocked by CLK_SYS_PESS. The timer and prescale counters are clocked by  
CLK_TMRx.  
8.4.4 UARTs  
8.4.4.1 Overview  
The LPC2917/19 contains two identical UARTs located at different peripheral base  
addresses. The key features are:  
16-byte receive and transmit FIFOs  
Registers conform to industry standard 550  
Receiver FIFO trigger points at 1 byte, 4 bytes, 8 bytes and 14 bytes  
Built-in baud-rate generator  
8.4.4.2 Description  
The UART is commonly used to implement a serial interface such as RS232. The  
LPC2917/19 contains two industry-standard 550 UARTs with 16-byte transmit and receive  
FIFOs, but they can also be put into 450 mode without FIFOs.  
8.4.4.3 UART pin description  
The two UARTs in the LPC2917/19 have the following pins. The UART pins are combined  
with other functions on the port pins of the LPC2917/19. Table 15 shows the UART pins (x  
runs from 0 to 1).  
Table 15. UART pins  
Symbol  
Direction  
Description  
UARTx TXD out  
UARTx RXD in  
UART channel x transmit data output  
UART channel x receive data input  
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8.4.4.4 UART clock description  
The UART modules are clocked by two different clocks; CLK_SYS_PESS and  
CLK_UARTx (x = 0-1), see Section 7.2.2. Note that each UART has its own CLK_UARTx  
branch clock for power management. The frequency of all CLK_UARTx clocks is identical  
since they are derived from the same base clock BASE_CLK_UART. The register  
interface towards the system bus is clocked by CLK_SYS_PESS. The baud generator is  
clocked by the CLK_UARTx.  
8.4.5 Serial peripheral interface  
8.4.5.1 Overview  
The LPC2917/19 contains three Serial Peripheral Interface modules (SPIs) to allow  
synchronous serial communication with slave or master peripherals.  
The key features are:  
Master or slave operation  
Supports up to four slaves in sequential multi-slave operation  
Supports timer-triggered operation  
Programmable clock bit rate and prescale based on SPI source clock  
(BASE_SPI_CLK), independent of system clock  
Separate transmit and receive FIFO memory buffers; 16 bits wide, 32 locations deep  
Programmable choice of interface operation: Motorola SPI or Texas Instruments  
Synchronous Serial Interfaces  
Programmable data-frame size from 4 to 16 bits  
Independent masking of transmit FIFO, receive FIFO and receive overrun interrupts  
Serial clock-rate master mode: fserial_clk fCLK(SPI)*/2  
Serial clock-rate slave mode: fserial_clk = fCLK(SPI)*/4  
Internal loopback test mode  
8.4.5.2 Functional description  
The SPI module is a master or slave interface for synchronous serial communication with  
peripheral devices that have either Motorola SPI or Texas Instruments Synchronous  
Serial Interfaces.  
The SPI module performs serial-to-parallel conversion on data received from a peripheral  
device. The transmit and receive paths are buffered with FIFO memories (16 bits wide x  
32 words deep). Serial data is transmitted on SPI_TxD and received on SPI_RxD.  
The SPI module includes a programmable bit-rate clock divider and prescaler to generate  
the SPI serial clock from the input clock CLK_SPIx.  
The SPI module’s operating mode, frame format, and word size are programmed through  
the SLVn_SETTINGS registers.  
A single combined interrupt request SPI_INTREQ output is asserted if any of the  
interrupts are asserted and unmasked.  
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Depending on the operating mode selected, the SPI_CS_OUT outputs operate as an  
active-HIGH frame synchronization output for Texas Instruments synchronous serial  
frame format or an active-LOW chip select for SPI.  
Each data frame is between four and 16 bits long, depending on the size of words  
programmed, and is transmitted starting with the MSB.  
There are two basic frame types that can be selected:  
Texas Instruments synchronous serial  
Motorola Serial Peripheral Interface  
8.4.5.3 Modes of operation  
The SPI module can operate in:  
Master mode:  
Normal transmission mode  
Sequential slave mode  
Slave mode  
8.4.5.4 SPI pin description  
The three SPI modules in the LPC2917/19 have the pins listed below. The pins are  
combined with other functions on the port pins of the LPC2917/19, see Section 8.3.3.  
Table 16 shows the SPI pins (x runs from 0 to 2; y runs from 0 to 3).  
Table 16. SPI pins  
Symbol  
Direction  
in/out  
in/out  
in  
Description  
SPIx SCSy  
SPIx SCK  
SPIx SDI  
SPIx SDO  
SPIx chip select[1][2]  
SPIx clock[1]  
SPIx data input  
SPIx data output  
out  
[1] Direction of SPIx SCS and SPIx SCK pins depends on master or slave mode. These pins are output in  
master mode, input in slave mode.  
[2] In slave mode there is only one chip-select input pin, SPIx SCS0. The other chip selects have no function in  
slave mode.  
8.4.5.5 SPI clock description  
The SPI modules are clocked by two different clocks; CLK_SYS_PESS and CLK_SPIx (x  
= 0-2), see Section 7.2.2. Note that each SPI has its own CLK_SPIx branch clock for  
power management. The frequency of all clocks CLK_SPIx is identical as they are derived  
from the same base clock BASE_CLK_SPI. The register interface towards the system bus  
is clocked by CLK_SYS_PESS. The serial-clock rate divisor is clocked by CLK_SPIx.  
The SPI clock frequency can be controlled by the CGU. In master mode the SPI clock  
frequency (CLK_SPIx) must be set to at least twice the SPI serial clock rate on the  
interface. In slave mode CLK_SPIx must be set to four times the SPI serial clock rate on  
the interface.  
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8.4.6 General-purpose I/O  
8.4.6.1 Overview  
The LPC2917/19 contains four general-purpose I/O ports located at different peripheral  
base addresses. In the 144-pin package all four ports are available. All I/O pins are  
bi-directional, and the direction can be programmed individually. The I/O pad behavior  
depends on the configuration programmed in the port function-select registers.  
The key features are:  
General-purpose parallel inputs and outputs  
Direction control of individual bits  
Synchronized input sampling for stable input-data values  
All I/O defaults to input at reset to avoid any possible bus conflicts  
8.4.6.2 Description  
The general-purpose I/O provides individual control over each bi-directional port pin.  
There are two registers to control I/O direction and output level. The inputs are  
synchronized to achieve stable read-levels.  
To generate an open-drain output, set the bit in the output register to the desired value.  
Use the direction register to control the signal. When set to output, the output driver  
actively drives the value on the output: when set to input the signal floats and can be  
pulled up internally or externally.  
8.4.6.3 GPIO pin description  
The five GPIO ports in the LPC2917/19 have the pins listed below. The GPIO pins are  
combined with other functions on the port pins of the LPC2917/19. Table 17 shows the  
GPIO pins.  
Table 17. GPIO pins  
Symbol  
Direction  
Description  
GPIO0 pin[31:0] in/out  
GPIO1 pin[31:0] in/out  
GPIO2 pin[27:0] in/out  
GPIO3 pin[15:0] in/out  
GPIO port x pins 31 to 0  
GPIO port x pins 31 to 0  
GPIO port x pins 27 to 0  
GPIO port x pins 15 to 0  
8.4.6.4 GPIO clock description  
The GPIO modules are clocked by several clocks, all of which are derived from  
BASE_SYS_CLK; CLK_SYS_PESS and CLK_SYS_GPIOx (x = 0-3), see Section 7.2.2.  
Note that each GPIO has its own CLK__SYS_GPIOx branch clock for power  
management. The frequency of all clocks CLK_SYS_GPIOx is identical to  
CLK_SYS_PESS since they are derived from the same base clock BASE_SYS_CLK.  
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8.5 CAN gateway  
8.5.1 Overview  
Controller Area Network (CAN) is the definition of a high-performance communication  
protocol for serial data communication. The two CAN controllers in the LPC2917/19  
provide a full implementation of the CAN protocol according to the CAN specification  
version 2.0B. The gateway concept is fully scalable with the number of CAN controllers,  
and always operates together with a separate powerful and flexible hardware acceptance  
filter.  
The key features are:  
Supports 11-bit as well as 29-bit identifiers  
Double receive buffer and triple transmit buffer  
Programmable error-warning limit and error counters with read/write access  
Arbitration-lost capture and error-code capture with detailed bit position  
Single-shot transmission (i.e. no re-transmission)  
Listen-only mode (no acknowledge; no active error flags)  
Reception of ‘own’ messages (self-reception request)  
Full CAN mode for message reception  
8.5.2 Global acceptance filter  
The global acceptance filter provides look-up of received identifiers - called acceptance  
filtering in CAN terminology - for all the CAN controllers. It includes a CAN ID look-up table  
memory, in which software maintains one to five sections of identifiers. The CAN ID  
look-up table memory is 2 kB large (512 words, each of 32 bits). It can contain up to 1024  
standard frame identifiers (SFF) or 512 extended frame identifiers (EFF) or a mixture of  
both types. It is also possible to define identifier groups for standard and extended  
message formats.  
8.5.3 CAN pin description  
The two CAN controllers in the LPC2917/19 have the pins listed below. The CAN pins are  
combined with other functions on the port pins of the LPC2917/19. Table 18 shows the  
CAN pins (x runs from 0 to 1).  
Table 18. CAN pins  
Symbol  
Direction  
Description  
CANx TXDC out  
CANx RXDC in  
CAN channel x transmit data output  
CAN channel x receive data input  
8.6 LIN  
8.6.1 Overview  
The LPC2917/19 contain two LIN 2.0 master controllers. These can be used as dedicated  
LIN 2.0 master controllers with additional support for sync break generation and with  
hardware implementation of the LIN protocol according to spec 2.0.  
The key features are:  
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Complete LIN 2.0 message handling and transfer  
One interrupt per LIN message  
Slave response time-out detection  
Programmable sync-break length  
Automatic sync-field and sync-break generation  
Programmable inter-byte space  
Hardware or software parity generation  
Automatic checksum generation  
Fault confinement  
Fractional baud-rate generator  
8.6.2 LIN pin description  
The two LIN 2.0 master controllers in the LPC2917/19 have the pins listed below. The LIN  
pins are combined with other functions on the port pins of the LPC2917/19. Table 19  
shows the LIN pins. For more information see Ref. 1 subsection 3.43, LIN master  
controller.  
Table 19. LIN controller pins  
Symbol  
Direction  
Description  
LIN0/1 TXDL out  
LIN0/1 RXDL in  
LIN channel 0/1 transmit data output  
LIN channel 0/1 receive data input  
8.7 Modulation and sampling control subsystem  
8.7.1 Overview  
The Modulation and Sampling Control Subsystem (MSCSS) in the LPC2917/19 includes  
four Pulse-Width Modulators (PWMs), three10-bit successive approximation  
Analog-to-Digital Converters (ADCs) and two timers.  
The key features of the MSCSS are:  
Two 10-bit, 400 ksamples/s, 8-channel ADCs with 3.3 V inputs and various trigger-  
start options  
Four 6-channel PWMs (Pulse-Width Modulators) with capture and trap functionality  
Two dedicated timers to schedule and synchronize the PWMs and ADCs  
8.7.2 Description  
The MSCSS contains Pulse-Width Modulators (PWMs), Analog-to-Digital Converters  
(ADCs) and timers.  
Figure 7 provides an overview of the MSCSS. An AHB-to-VPB bus bridge takes care of  
communication with the AHB system bus. Two internal timers are dedicated to this  
subsystem. MSCSS timer 0 can be used to generate start pulses for the ADCs and the  
first PWM. The second timer (MSCSS timer 1) is used to generate ‘carrier’ signals for the  
PWMs. These carrier patterns can be used, for example, in applications requiring current  
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control. Several other trigger possibilities are provided for the ADCs (external, cascaded  
or following a PWM). The capture inputs of both timers can also be used to capture the  
start pulse of the ADCs.  
The PWMs can be used to generate waveforms in which the frequency, duty cycle and  
rising and falling edges can be controlled very precisely. Capture inputs are provided to  
measure event phases compared to the main counter. Depending on the applications,  
these inputs can be connected to digital sensor motor outputs or digital external signals.  
Interrupt signals are generated on several events to closely interact with the CPU.  
The ADCs can be used for any application needing accurate digitized data from analog  
sources. To support applications like motor control, a mechanism to synchronize several  
PWMs and ADCs is available (sync_in and sync_out).  
Note that the PWMs run on the PWM clock and the ADCs on the ADC clock, see  
Section 8.8.4.  
ADC2 IN[7:0]  
ADC2_EXT_START  
ADC1 IN[7:0]  
ADC1_EXT_START  
ADC clock  
MSCSS  
TIMER 0  
ADC  
CONTROL  
ADC  
1
ADC  
2
3.3 V  
AHB  
system bus  
VPB sub system bus  
(to all sub blocks)  
SYNCS  
3.3 V  
AHB2VPB  
BRIDGE  
PWM0 MAT[5:0]  
PWM1 MAT[5:0]  
PWM2 MAT[5:0]  
PWM3 MAT[5:0]  
MSCSS  
TIMER 1  
PWM  
0
PWM  
1
PWM  
CONTROL  
PWM  
2
PWM  
3
CARRIERS  
PWM0 TRAP  
PWM0 CAP[2:0]  
PWM1 TRAP  
PWM1 CAP[2:0]  
PWM2 TRAP  
PWM2 CAP[2:0]  
PWM3 TRAP  
PWM3 CAP[2:0]  
002aad348  
Fig 7. Modulation and sampling control subsystem block diagram  
8.7.2.1 Synchronization and trigger features of the MSCSS  
The MSCSS contains two internal timers to generate synchronization and carrier pulses  
for the ADCs and PWMs. Figure 8 shows how the timers are connected to the ADC and  
PWM modules.  
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Each ADC module has four start inputs. An ADC conversion is started when one of the  
start ADC conditions is valid:  
start 0: ADC external start input pin; can be triggered at a positive or negative edge.  
Note that this signal is captured in the ADC clock domain  
start 1: If the ‘preceding’ ADC conversion is ended, the sync_out signal starts an ADC  
conversion. This signal is captured in the MSCSS subsystem clock domain, see  
Section 8.7.5.2. As can be seen in Figure 8, the sync_out of ADC1 is connected to the  
start 1 input of ADC2 and the sync_out of ADC2 is connected to the start 1 input of  
ADC1.  
start 2: The PWM sync_out can start an ADC conversion. The sync_out signal is  
synchronized to the ADC clock in the ADC module. This signal is captured in the  
MSCSS subsystem clock domain.  
start 3: The match outputs from MSCSS timer 0 are connected to the start 3 inputs of  
the ADCs. This signal is captured in the ADC clock domain.  
The PWM_sync and trans_enable_in of PWM 0 are connected to the 4th match output of  
MSCSS timer 0 to start the PWM after a pre-programmed delay. This sync signal is  
cascaded through all PWMs, allowing a programmable delay offset between subsequent  
PWMs. The sync delay of each PWM can be programmed synchronously or with a  
different phase for spreading the power load.  
The match outputs of MSCSS timer 1 (PWM control) are connected to the corresponding  
carrier inputs of the PWM modules. The carrier signal is modulated with the PWM-  
generated waveforms.  
The pause input of MSCSS timer 1 (PWM Control) is connected to an external input pin.  
Generation of the carrier signal is stopped by asserting the pause of this timer.  
The pause input of MSCSS timer 0 (ADC Control) is connected to a ‘NOR’ of the  
PWM_sync outputs (start 2 input on the ADCs). If the pause feature of this timer is  
enabled the timer only counts when one of the PWM_sync outputs is active HIGH. This  
feature can be used to start the ADC once every x PWM cycles, where x corresponds to  
the value in the match register of the timer. In this case the start 3 input of the ADC should  
be enabled (start on match output of MSCSS timer 0).  
The signals connected to the capture inputs of the timers (both MSCSS timer 0 and  
MSCSS timer 1) are intended for debugging.  
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ADC2_EXT_START  
ADC1_EXT_START  
pause_0  
pause  
(2)  
ADC1  
(1)  
MSCSS  
st0  
st1  
st2  
st3  
(2)  
so  
TIMER 0  
ADC2  
c0  
m0  
st0  
st1  
st2  
st3  
so0  
so  
c1  
c2  
c3  
m1  
m2  
m3  
so1  
so2  
pause_0  
(3)  
PWM0  
s_i  
TE_i  
(1)  
(3)  
MSCSS  
TIMER 1  
c0  
PWM1  
s_i  
TE_i  
s_o  
TE_o  
c_i  
trap  
(3)  
PWM2  
m0  
m1  
m2  
s_o  
TE_o  
s_i  
c_i  
trap  
(3)  
PWM3  
s_i  
c1  
c2  
TE_i  
s_o  
TE_o  
c_i  
TE_i  
trap  
s_o  
TE_o  
c_i  
trap  
c3  
m3  
pause  
MSCSS PAUSE  
PWM0 TRAP  
PWM1 TRAP  
PWM2 TRAP  
PWM3 TRAP  
002aad347  
(1) Timers:  
c0 to c3 = capture in 0 to capture in 3  
m0 to m3 = match out 0 to match out 3  
(2) ADCs:  
st0 to st3 = start 0 to start 3 inputs  
s0 to s3 = sync_out 0 to sync_out 3  
(3) PWMs:  
c_i = carrier in  
s_i = sync_in  
s_o = sync_out  
TE_i = trans_enable_in  
TE_o = trans_enable_out  
Fig 8. Modulation and sampling-control subsystem synchronization and triggering  
8.7.3 MSCSS pin description  
The pins of the LPC2917/19 MSCSS associated with the two ADC modules are described  
in Section 8.7.5.3. Pins directly connected to the four PWM modules are described in  
Section 8.7.6.5: pins directly connected to the MSCSS timer 1 module are described in  
Section 8.7.7.3.  
8.7.4 MSCSS clock description  
The MSCSS is clocked from a number of different sources:  
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CLK_SYS_MSCSS_A clocks the AHB side of the AHB-to-VPB bus bridge  
CLK_MSCSS_VPB clocks the subsystem VPB bus  
CLK_MSCSS_MTMR0/1 clocks the timers  
CLK_MSCSS_PWM0..3 clocks the PWMs.  
Each ADC has two clock areas; a VPB part clocked by CLK_MSCSS_ADCx_VPB (x = 1  
or 2) and a control part for the analog section clocked by CLK_ADCx = 1 or 2), see  
Section 7.2.2.  
All clocks are derived from the BASE_MSCSS_CLK, except for CLK_SYS_MSCSS_A  
which is derived form BASE_SYS_CLK, and the CLK_ADCx clocks which are derived  
from BASE_CLK_ADC. If specific PWM or ADC modules are not used their corresponding  
clocks can be switched off.  
8.7.5 Analog-to-digital converter  
8.7.5.1 Overview  
The MSCSS in the LPC2917/19 includes two 10-bit successive-approximation  
analog-to-digital converters.  
The key features of the ADC interface module are:  
ADC1 and ADC2: Eight analog inputs; time-multiplexed; measurement range up to  
3.3 V  
External reference-level inputs  
400 ksamples per second at 10-bit resolution up to 1500 ksamples per second at 2-bit  
resolution  
Programmable resolution from 2-bit to 10-bit  
Single analog-to-digital conversion scan mode and continuous analog-to-digital  
conversion scan mode  
Optional conversion on transition on external start input, timer capture/match signal,  
PWM_sync or ‘previous’ ADC  
Converted digital values are stored in a register for each channel  
Optional compare condition to generate a ‘less than’ or an ‘equal to or greater than’  
compare-value indication for each channel  
Power-down mode  
8.7.5.2 Description  
The ADC block diagram, Figure 9, shows the basic architecture of each ADC. The ADC  
functionality is divided into two major parts; one part running on the MSCSS Subsystem  
clock, the other on the ADC clock. This split into two clock domains affects the behavior  
from a system-level perspective. The actual analog-to-digital conversions take place in the  
ADC clock domain, but system control takes place in the system clock domain.  
A mechanism is provided to modify configuration of the ADC and control the moment at  
which the updated configuration is transferred to the ADC domain.  
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The ADC clock is limited to 4.5 MHz maximum frequency and should always be lower  
than or equal to the system clock frequency. To meet this constraint or to select the  
desired lower sampling frequency the clock generation unit provides a programmable  
fractional system-clock divider dedicated to the ADC clock. Conversion rate is determined  
by the ADC clock frequency divided by the number of resolution bits plus one. Accessing  
ADC registers requires an enabled ADC clock, which is controllable via the clock  
generation unit, see Section 8.8.4.  
Each ADC has four start inputs. Note that start 0 and start 2 are captured in the system  
clock domain while start 1 and start 3 are captured in the ADC domain. The start inputs  
are connected at MSCSS level, see Section 8.7.2.1 for details.  
CLK_ADCx  
(ADC clock)  
(upto 4.5 MHz)  
CLK_ADCx_VPB  
(MSCSS SubSystem clock)  
VPB SubSystem  
domain  
ADC domain  
update  
Conversion data  
Config data  
IRQ  
ADC  
control  
&
ADC  
control  
&
3.3 V  
Analog  
to  
Digital  
convertor  
Analog  
inputs  
ADC1: 8  
ADC2: 8  
VPB  
system  
bus  
Analog  
mux  
registers  
registers  
ADC  
IRQ  
Start 0  
Start 2  
Start 1  
Start 3  
Sync_out  
001aad331 **  
Fig 9. ADC block diagram  
8.7.5.3 ADC pin description  
The two ADC modules in the MSCSS have the pins described below. The ADCx input  
pins are combined with other functions on the port pins of the LPC2917/19. The VREFN  
and VREFP pins are common for both ADCs. Table 20 shows the ADC pins.  
Table 20. Analog to digital converter pins  
Symbol  
Direction  
Description  
ADCn IN[7:0]  
in  
analog input for ADCn, channel 7 to channel 0 (n is 1 or 2)  
ADC external start-trigger input (n is 1 or 2)  
ADC LOW reference level  
ADCn_EXT_START in  
VREFN  
VREFP  
in  
in  
ADC HIGH reference level  
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8.7.5.4 ADC clock description  
The ADC modules are clocked from two different sources; CLK_MSCSS_ADCx_VPB and  
CLK_ADCx (x = 1 or 2), see Section 7.2.2. Note that each ADC has its own CLK_ADCx  
and CLK_MSCSS_ADCx_VPB branch clocks for power management. If an ADC is  
unused both its CLK_MSCSS_ADCx_VPB and CLK_ADCx can be switched off.  
The frequency of all the CLK_MSCSS_ADCx_VPB clocks is identical to  
CLK_MSCSS_VPB since they are derived from the same base clock  
BASE_MSCSS_CLK. Likewise the frequency of all the CLK_ADCx clocks is identical  
since they are derived from the same base clock BASE_ADC_CLK.  
The register interface towards the system bus is clocked by CLK_MSCSS_ADCx_VPB.  
Control logic for the analog section of the ADC is clocked by CLK_ADCx, see also  
Figure 9.  
8.7.6 PWM  
8.7.6.1 Overview  
The MSCSS in the LPC2917/19 includes four PWM modules with the following features.  
Six pulse-width modulated output signals  
Double edge features (rising and falling edges programmed individually)  
Optional interrupt generation on match (each edge)  
Different operation modes: continuous or run-once  
16-bit PWM counter and 16-bit prescale counter allow a large range of PWM periods  
A protective mode (TRAP) holding the output in a software-controllable state and with  
optional interrupt generation on a trap event  
Three capture registers and capture trigger pins with optional interrupt generation on  
a capture event  
Interrupt generation on match event, capture event, PWM counter overflow or trap  
event  
A burst mode mixing the external carrier signal with internally generated PWM  
Programmable sync-delay output to trigger other PWM modules (master/slave  
behavior)  
8.7.6.2 Description  
The ability to provide flexible waveforms allows PWM blocks to be used in multiple  
applications; e.g. automotive dimmer/lamp control and fan control. Pulse-width  
modulation is the preferred method for regulating power since no additional heat is  
generated and it is energy-efficient when compared with linear-regulating voltage control  
networks.  
The PWM delivers the waveforms/pulses of the desired duty cycles and cycle periods. A  
very basic application of these pulses can be in controlling the amount of power  
transferred to a load. Since the duty cycle of the pulses can be controlled, the desired  
amount of power can be transferred for a controlled duration. Two examples of such  
applications are:  
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Automotive dimmer controller: The flexibility of providing waves of a desired duty  
cycle and cycle period allows the PWM to control the amount of power to be  
transferred to the load. The PWM functions as a dimmer controller in this application  
Motor controller: The PWM provides multi-phase outputs, and these outputs can be  
controlled to have a certain pattern sequence. In this way the force/torque of the  
motor can be adjusted as desired. This makes the PWM function as a motor drive.  
Sync_in Transfer_enable_in  
VPB domain  
PWM domain  
update  
PWM  
Counter,  
prescale  
counter  
&
Match outputs  
Capture inputs  
Capture data  
PWM  
control  
&
VPB system bus  
PWM counter value  
registers  
Config data  
IRQ’s  
shadow  
registers  
IRQ pwm  
IRQ capt_match  
Trap input  
Carier inputs  
Sync_out Transfer_enable_out  
Fig 10. PWM block diagram  
The PWM block diagram in Figure 10 shows the basic architecture of each PWM. PWM  
functionality is split into two major parts, a VPB domain and a PWM domain, both of which  
run on clocks derived from the BASE_MSCSS_CLK. This split into two domains affects  
behavior from a system-level perspective. The actual PWM and prescale counters are  
located in the PWM domain but system control takes place in the VPB domain.  
The actual PWM consists of two counters; a 16-bit prescale counter and a 16-bit PWM  
counter. The position of the rising and falling edges of the PWM outputs can be  
programmed individually. The prescale counter allows high system bus frequencies to be  
scaled down to lower PWM periods. Registers are available to capture the PWM counter  
values on external events.  
Note that in the Modulation and Sampling SubSystem, each PWM has its individual clock  
source CLK_MSCSS_PWMx (x runs from 0 to 3). Both the prescale and the timer  
counters within each PWM run on this clock CLK_MSCSS_PWMx, and all time references  
are related to the period of this clock. See Section 8.8 for information on generation of  
these clocks.  
8.7.6.3 Synchronizing the PWM counters  
A mechanism is included to synchronize the PWM period to other PWMs by providing a  
sync input and a sync output with programmable delay. Several PWMs can be  
synchronized using the trans_enable_in/trans_enable_out and sync_in/sync_out ports.  
See Section 8.7.2.1 for details of the connections of the PWM modules within the MSCSS  
in the LPC2917/19. PWM 0 can be master over PWM 1; PWM 1 can be master over  
PWM 2, etc.  
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ARM9 microcontroller with CAN and LIN  
8.7.6.4 Master and slave mode  
A PWM module can provide synchronization signals to other modules (also called Master  
mode). The signal sync_out is a pulse of one clock cycle generated when the internal  
PWM counter (re)starts. The signal trans_enable_out is a pulse synchronous to sync_out,  
generated if a transfer from system registers to PWM shadow registers occurred when the  
PWM counter restarted. A delay may be inserted between the counter start and  
generation of trans_enable_out and sync_out.  
A PWM module can use input signals trans_enable_in and sync_in to synchronize its  
internal PWM counter and the transfer of shadow registers (Slave mode).  
8.7.6.5 PWM pin description  
Each of the four PWM modules in the MSCSS has the following pins. These are combined  
with other functions on the port pins of the LPC2917/19. Table 21 shows the PWM0 to  
PWM3 pins.  
Table 21. PWM pins  
Symbol  
Direction  
Description  
PWMn CAP[0]  
PWMn CAP[1]  
PWMn CAP[2]  
PWMn MAT[0]  
PWMn MAT[1]  
PWMn MAT[2]  
PWMn MAT[3]  
PWMn MAT[4]  
PWMn MAT[5]  
PWMn TRAP  
in  
PWM n capture input 0  
PWM n capture input 1  
PWM n capture input 2  
PWM n match output 0  
PWM n match output 1  
PWM n match output 2  
PWM n match output 3  
PWM n match output 4  
PWM n match output 5  
PWM n trap input  
in  
in  
out  
out  
out  
out  
out  
out  
in  
8.7.6.6 PWM clock description  
The PWM modules are clocked by CLK_MSCSS_PWMx (x = 0-3), see Section 7.2.2.  
Note that each PWM has its own CLK_MSCSS_PWMx branch clock for power  
management. The frequency of all these clocks is identical to CLK_MSCSS_VPB since  
they are derived from the same base clock BASE_MSCSS_CLK.  
Also note that unlike the timer modules in the Peripheral SubSystem, the actual timer  
counter registers of the PWM modules run at the same clock as the VPB system interface  
CLK_MSCSS_VPB. This clock is independent of the AHB system clock.  
If a PWM module is not used its CLK_MSCSS_PWMx branch clock can be switched off.  
8.7.7 Timers in the MSCSS  
8.7.7.1 Overview  
The two timers in the MSCSS are functionally identical to the timers in the peripheral  
subsystem, see Section 8.4.3. The features of the timers in the MSCSS are the same as  
the timers in the peripheral subsystem, but the capture inputs and match outputs are not  
available on the device pins. These signals are instead connected to the ADC and PWM  
modules as outlined in the description of the MSCSS, see Section 8.7.2.  
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ARM9 microcontroller with CAN and LIN  
8.7.7.2 Description  
See section Section 8.4.3.2 for a description of the timers.  
8.7.7.3 MSCSS timer-pin description  
MSCSS timer 0 has no external pins.  
MSCSS timer 1 has a PAUSE pin available as external pin. The PAUSE pin is combined  
with other functions on the port pins of the LPC2917/19. Table 22 shows the MSCSS  
timer 1 external pin.  
Table 22. MSCSS timer 1 pin  
Symbol  
Direction  
Description  
MSCSS PAUSE  
in  
pause pin for MSCSS timer 1  
8.7.7.4 MSCSS timer-clock description  
The Timer modules in the MSCSS are clocked by CLK_MSCSS_MTMRx (x = 0-1), see  
Section 7.2.2. Note that each timer has its own CLK_MSCSS_MTMRx branch clock for  
power management. The frequency of all these clocks is identical to CLK_MSCSS_VPB  
since they are derived from the same base clock BASE_MSCSS_CLK.  
Note that, unlike the timer modules in the Peripheral SubSystem, the actual timer counter  
registers run at the same clock as the VPB system interface CLK_MSCSS_VPB. This  
clock is independent of the AHB system clock.  
If a timer module is not used its CLK_MSCSS_MTMRx branch clock can be switched off.  
8.8 Power, clock and reset control subsystem  
8.8.1 Overview  
The Power, Clock and Reset Control Subsystem (PCRSS) in the LPC2917/19 includes a  
Clock Generator Unit (CGU), a Reset Generator Unit (RGU) and a Power Management  
Unit (PMU).  
8.8.2 Description  
Figure 11 provides an overview of the PCRSS. An AHB-to-DTL bridge takes care of  
communication with the AHB system bus.  
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Power, Clock & Reset  
CGU  
PMU  
Xtal Oscillator  
PLL  
base  
out0  
out1  
clocks  
branch  
clocks  
Low Power  
Ring Oscillator  
(Ringo)  
out9  
AHB Master  
Disable Grant  
FDIV[6:0]  
CGU  
registers  
AHB Master  
Disable Req  
AHB2DTL  
Bridge  
wakeup_a  
RGU  
AHB_RST  
RGU  
...  
registers  
...  
SCU_RST  
Reset Output  
Delay Logic  
WARM_RST  
COLD_RST  
PCR_RST  
RGU_RST  
POR_RST  
Input Deglitch/  
Sync  
POR  
RSTN (device pin)  
Reset from Watchdog counter  
Fig 11. PCRSS block diagram  
8.8.3 PCR subsystem clock description  
The PCRSS is clocked by a number of different clocks. CLK_SYS_PCRSS clocks the  
AHB side of the AHB to DTL bus bridge and CLK_PCR_SLOW clocks the CGU, RGU and  
PMU internal logic, see Section 7.2.2. CLK_SYS_PCRSS is derived from  
BASE_SYS_CLK, which can be switched off in low-power modes. CLK_PCR_SLOW is  
derived from BASE_PCR_CLK and is always on in order to be able to wake up from  
low-power modes.  
8.8.4 Clock Generation Unit (CGU)  
8.8.4.1 Overview  
The key features are:  
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Generation of 10 and 2 test-base clocks, selectable from several embedded clock  
sources  
Crystal oscillator with power-down  
Control PLL with power-down  
Very low-power ring oscillator, always on to provide a ’safe clock’  
Seven fractional clock dividers with L/D division  
Individual source selector for each base clock, with glitch-free switching  
Autonomous clock-activity detection on every clock source  
Protection against switching to invalid or inactive clock sources  
Embedded frequency counter  
Register write-protection mechanism to prevent unintentional alteration of clocks  
Remark: Any clock-frequency adjustment has a direct impact on the timing of on-board  
peripherals such as the UARTs, SPI, watchdog, timers, CAN controller, LIN master  
controller, ADCs or flash-memory interface.  
8.8.4.2 Description  
The clock generation unit provides 10 internal clock sources as described in Table 23.  
Table 23. CGU base clocks  
Number Name  
Frequency  
(MHz) [1]  
Description  
0
1
2
3
4
5
6
7
8
BASE_SAFE_CLK  
0.4  
Base safe clock (always on)  
Base system clock  
BASE_SYS_CLK  
BASE_PCR_CLK  
BASE_IVNSS_CLK  
BASE_MSCSS_CLK  
BASE_UART_CLK  
BASE_SPI_CLK  
80  
0.4 [2]  
80  
Base PCR subsystem clock  
Base IVNSS subsystem clock  
Base MSCSS subsystem clock  
Base UART clock  
80  
80  
40  
Base SPI clock  
BASE_TMR_CLK  
BASE_ADC_CLK  
80  
Base timers clock  
4.5  
Base ADCs clock  
[1] Maximum frequency that guarantees stable operation of the LPC2917/19.  
[2] Fixed to low-power oscillator.  
For generation of these base clocks, the CGU consists of primary and secondary clock  
generators and one output generator for each base clock.  
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Clock Source Bus  
LP_OSC  
Xtal  
PLL  
FDIV0  
FDIV1  
OUT 0  
OUT 1  
Oscilator  
FDIV6  
OUT 9  
Frequency  
Monitor  
Clock  
Detection  
DTL MMIO Interface  
Fig 12. Block diagram of the CGU  
There are two primary clock generators: a low-power ring oscillator (LP_OSC) and a  
crystal oscillator. See Figure 12.  
LP_OSC is the source for the BASE_PCR_CLK that clocks the CGU itself and for  
BASE_SAFE_CLK that clocks a minimum of other logic in the device (like the watchdog  
timer). To prevent the device from losing its clock source LP_OSC cannot be put into  
power-down. The crystal oscillator can be used as source for high-frequency clocks or as  
an external clock input if a crystal is not connected.  
Secondary clock generators are a PLL and seven fractional dividers (FDIV0..6). The PLL  
has three clock outputs: normal, 120° phase-shifted and 240° phase-shifted.  
Configuration of the CGU: For every output generator - generating the base clocks - a  
choice can be made from the primary and secondary clock generators according to  
Figure 13.  
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OSC1M  
XO50M  
FDIV0..6  
PLL160M  
clkout /  
clkout120 /  
clkout240  
Output  
Control  
Clock  
outputs  
Fig 13. Structure of the clock generation scheme  
Any output generator (except for BASE_SAFE_CLK and BASE_PCR_CLK) can be  
connected to either a fractional divider (FDIV0..6) or to one of the outputs of the PLL or to  
LP_OSC/crystal oscillator directly. BASE_SAFE_CLK and BASE_PCR_CLK can use only  
LP_OSC as source.  
The fractional dividers can be connected to one of the outputs of the PLL or directly to  
LP_OSC/crystal Oscillator.  
The PLL can be connected to the crystal oscillator.  
In this way every output generating the base clocks can be configured to get the required  
clock. Multiple output generators can be connected to the same primary or secondary  
clock source, and multiple secondary clock sources can be connected to the same PLL  
output or primary clock source.  
Invalid selections/programming - connecting the PLL to an FDIV or to one of the PLL  
outputs itself for example - will be blocked by hardware. The control register will not be  
written, the previous value will be kept, although all other fields will be written with new  
data. This prevents clocks being blocked by incorrect programming.  
Default Clock Sources: Every secondary clock generator or output generator is  
connected to LP_OSC at reset. In this way the device runs at a low frequency after reset.  
It is recommended to switch BASE_SYS_CLK to a high-frequency clock generator as  
(one of) the first step(s) in the boot code after verifying that the high-frequency clock  
generator is running.  
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Clock Activity Detection: Clocks that are inactive are automatically regarded as invalid,  
and values of ’CLK_SEL’ that would select those clocks are masked and not written to the  
control registers. This is accomplished by adding a clock detector to every clock  
generator. The RDET register keeps track of which clocks are active and inactive, and the  
appropriate ‘CLK_SEL’ values are masked and unmasked accordingly. Each clock  
detector can also generate interrupts at clock activation and deactivation so that the  
system can be notified of a change in internal clock status.  
Clock detection is done using a counter running at the BASE_PCR_CLK frequency. If no  
positive clock edge occurs before the counter has 32 cycles of BASE_PCR_CLK the clock  
is assumed to be inactive. As BASE_PCR_CLK is slower than any of the clocks to be  
detected, normally only one BASE_PCR_CLK cycle is needed to detect activity. After  
reset all clocks are assumed to be ‘non-present’, so the RDET status register will be  
correct only after 32 BASE_PCR_CLK cycles.  
Note that this mechanism cannot protect against a currently-selected clock going from  
active to inactive state. Therefore an inactive clock may still be sent to the system under  
special circumstances, although an interrupt can still be generated to notify the system.  
Glitch-Free Switching: Provisions are included in the CGU to allow clocks to be  
switched glitch-free, both at the output generator stage and also at secondary source  
generators.  
In the case of the PLL the clock will be stopped and held low for long enough to allow the  
PLL to stabilize and lock before being re-enabled. For all non-PLL Generators the switch  
will occur as quickly as possible, although there will always be a period when the clock is  
held low due to synchronization requirements.  
If the current clock is high and does not go low within 32 cycles of BASE_PCR_CLK it is  
assumed to be inactive and is asynchronously forced low. This prevents deadlocks on the  
interface.  
8.8.4.3 PLL functional description  
A block diagram of the PLL is shown in Figure 14. The input clock is fed directly to the  
analog section. This block compares the phase and frequency of the inputs and generates  
the main clock2. These clocks are either divided by 2*P by the programmable post divider  
to create the output clock, or sent directly to the output. The main output clock is then  
divided by M by the programmable feedback divider to generate the feedback clock. The  
output signal of the analog section is also monitored by the lock detector to signal when  
the PLL has locked onto the input clock.  
2. Generation of the main clock is restricted by the frequency range of the PLL clock input. See Table 31, Dynamic characteristics.  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
45 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
PSEL  
P23EN  
clkout120 /  
clkout240  
Input clock  
CCO  
/ 2PDIV  
P23  
clkout  
Bypass  
Direct  
/ MDIV  
MSEL  
Fig 14. PLL block diagram  
Triple output phases  
For applications that require multiple clock phases two additional clock outputs can be  
enabled by setting register P23EN to ’1’, thus giving three clocks with a 120° phase  
difference. In this mode all three clocks generated by the analog section are sent to the  
output dividers. When the PLL has not yet achieved lock the second and third phase  
output dividers run unsynchronized, which means that the phase relation of the output  
clocks is unknown. When the PLL LOCK register is set the second and third phase of the  
output dividers are synchronized to the main output clock CLKOUT PLL, thus giving three  
clocks with a 120° phase difference.  
Direct output mode  
In normal operating mode (with DIRECT set to ’0’) the CCO clock is divided by 2, 4, 8 or  
16 depending on the value on the PSEL[1:0] input, giving an output clock with a 50% duty  
cycle. If a higher output frequency is needed the CCO clock can be sent directly to the  
output by setting DIRECT to ’1’. Since the CCO does not directly generate a 50% duty  
cycle clock, the output clock duty cycle in this mode can deviate from 50%.  
Power-down control  
A power-down mode has been incorporated to reduce power consumption when the PLL  
clock is not needed. This is enabled by setting the PD control register bit. In this mode the  
analog section of the PLL is turned off, the oscillator and the phase-frequency detector are  
stopped and the dividers enter a reset state. While in power-down mode the LOCK output  
is low, indicating that the PLL is not in lock. When power-down mode is terminated by  
clearing the PD control-register bit the PLL resumes normal operation, and makes the  
LOCK signal high once it has regained lock on the input clock.  
8.8.4.4 CGU pin description  
The CGU module in the LPC2917/19 has the pins listed in Table 24 below.  
Table 24. CGU pins  
Symbol  
Direction  
Description  
XOUT_OSC  
XIN_OSC  
out  
in  
Oscillator crystal output  
Oscillator crystal input or external clock input  
LPC2917_19_1  
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Preliminary data sheet  
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46 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
8.8.5 Reset Generation Unit (RGU)  
8.8.5.1 Overview  
The key features of the Reset Generation Unit (RGU) are:  
Reset controlled individually per subsystem  
Automatic reset stretching and release  
Monitor function to trace resets back to source  
Register write-protection mechanism to prevent unintentional resets  
8.8.5.2 Description  
The RGU controls all internal resets.  
Each reset output is defined as a (combination of) reset input sources including the  
external reset input pins and internal power-on reset, see Table 25. The first five resets  
listed in this table form a sort of cascade to provide the multiple levels of impact that a  
reset may have. The combined input sources are logically OR-ed together so that  
activating any of the listed reset sources causes the output to go active.  
Table 25. Reset output configuration  
Reset Output  
POR_RST  
Reset Source  
parts of the device reset when activated  
LP_OSC; is source for RGU_RST  
power-on reset module  
POR_RST, RSTN pin  
RGU_RST  
RGU internal; is source for PCR_RST  
PCR_RST  
RGU_RST, WATCHDOG PCR internal; is source for COLD_RST  
COLD_RST  
WARM_RST  
SCU_RST  
PCR_RST  
parts with COLD_RST as reset source below  
parts with WARM_RST as reset source below  
SCU  
COLD_RST  
COLD_RST  
COLD_RST  
COLD_RST  
COLD_RST  
COLD_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
WARM_RST  
CFID_RST  
CFID  
FMC_RST  
embedded Flash-Memory Controller (FMC)  
embedded SRAM-Memory Controller  
external Static-Memory Controller (SMC)  
GeSS AHB-to-VPB bridge  
PeSS AHB-to-VPB bridge  
all GPIO modules  
EMC_RST  
SMC_RST  
GESS_A2V_RST  
PESS_A2V_RST  
GPIO_RST  
UART_RST  
all UART modules  
TMR_RST  
all Timer modules in PeSS  
all SPI modules  
SPI_RST  
IVNSS_A2V_RST  
IVNSS_CAN_RST  
IVNSS_LIN_RST  
MSCSS_A2V_RST  
IVNSS AHB-to-VPB bridge  
all CAN modules including Acceptance filter  
all LIN modules  
MSCSS AHB to VPB bridge  
all PWM modules  
MSCSS_PWM_RST WARM_RST  
MSCSS_ADC_RST WARM_RST  
MSCSS_TMR_RST WARM_RST  
all ADC modules  
all Timer modules in MSCSS  
Vectored Interrupt Controller (VIC)  
CPU and AHB Multilayer Bus infrastructure  
VIC_RST  
AHB_RST  
WARM_RST  
WARM_RST  
LPC2917_19_1  
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Preliminary data sheet  
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47 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
8.8.5.3 RGU pin description  
The RGU module in the LPC2917/19 has the following pins. Table 26 shows the RGU  
pins.  
Table 26. RGU pins  
Symbol  
Directio Description  
n
RSTN  
IN  
external reset input, Active LOW; pulled up internally  
8.8.6 Power Management Unit (PMU)  
8.8.6.1 Overview  
This module enables software to actively control the system’s power consumption by  
disabling clocks not required in a particular operating mode.  
Using the base clocks from the CGU as input, the PMU generates branch clocks to the  
rest of the LPC2917/19. Output clocks branched from the same base clock are phase-  
and frequency-related. These branch clocks can be individually controlled by software  
programming.  
The key features are:  
Individual clock control for all LPC2917/19 sub-modules  
Activates sleeping clocks when a wake-up event is detected  
Clocks can be individually disabled by software  
Supports AHB master-disable protocol when AUTO mode is set  
Disables wake-up of enabled clocks when power-down mode is set  
Activates wake-up of enabled clocks when a wake-up event is received  
Status register is available to indicate if an input base clock can be safely switched off  
(i.e. all branch clocks are disabled)  
8.8.6.2 Description  
The PMU controls all internal clocks of the device for power-mode management. With  
some exceptions, each branch clock can be switched on or off individually under control of  
software register bits located in its individual configuration register. Some branch clocks  
controlling vital parts of the device operate in a fixed mode. Table 27 shows which mode-  
control bits are supported by each branch clock.  
By programming the configuration register the user can control which clocks are switched  
on or off, and which clocks are switched off when entering power-down mode.  
Note that the standby-wait-for-interrupt instructions of the ARM968E-S processor (putting  
the ARM CPU into a low-power state) are not supported. Instead putting the ARM CPU  
into power-down should be controlled by disabling the branch clock for the CPU.  
Remark: For any disabled branch clocks to be re-activated their corresponding base  
clocks must be running (controlled by the CGU).  
Table 27 shows the relation between branch and base clocks, see also Section 7.2.1.  
Every branch clock is related to one particular base clock: it is not possible to switch the  
source of a branch clock in the PMU.  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
48 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 27. Branch clock overview  
Legend:  
"1" Indicates that the related register bit is tied off to logic HIGH, all writes are ignored  
"0" Indicates that the related register bit is tied off to logic LOW, all writes are ignored  
“+” Indicates that the related register bit is readable and writable  
Branch Clock Name  
Base Clock  
Implemented Switch On/Off  
Mechanism  
WAKEUP  
AUTO  
0
RUN  
1
CLK_SAFE  
BASE_SAFE_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_SYS_CLK  
BASE_PCR_CLK  
BASE_IVNSS_CLK  
BASE_IVNSS_CLK  
BASE_IVNSS_CLK  
BASE_IVNSS_CLK  
BASE_IVNSS_CLK  
BASE_MSCSS_CLK  
BASE_MSCSS_CLK  
BASE_MSCSS_CLK  
BASE_MSCSS_CLK  
BASE_MSCSS_CLK  
BASE_MSCSS_CLK  
BASE_MSCSS_CLK  
0
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
CLK_SYS_CPU  
+
1
CLK_SYS  
+
1
CLK_SYS_PCR  
+
1
CLK_SYS_FMC  
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
1
CLK_SYS_RAM0  
CLK_SYS_RAM1  
CLK_SYS_SMC  
+
+
+
CLK_SYS_GESS  
CLK_SYS_VIC  
+
+
CLK_SYS_PESS  
CLK_SYS_GPIO0  
CLK_SYS_GPIO1  
CLK_SYS_GPIO2  
CLK_SYS_GPIO3  
CLK_SYS_IVNSS_A  
CLK_SYS_MSCSS_A  
CLK_SYS_CHCA  
CLK_SYS_CHCB  
CLK_PCR_SLOW  
CLK_IVNSS_VPB  
CLK_IVNSS_CANC0  
CLK_IVNSS_CANC1  
CLK_IVNSS_LIN0  
CLK_IVNSS_LIN1  
CLK_MSCSS_VPB  
CLK_MSCSS_MTMR0  
CLK_MSCSS_MTMR1  
CLK_MSCSS_PWM0  
CLK_MSCSS_PWM1  
CLK_MSCSS_PWM2  
CLK_MSCSS_PWM3  
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
+
CLK_MSCSS_ADC1_VPB BASE_MSCSS_CLK  
CLK_MSCSS_ADC2_VPB BASE_MSCSS_CLK  
+
+
CLK_UART0  
CLK_UART1  
BASE_UART_CLK  
BASE_UART_CLK  
+
+
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
49 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 27. Branch clock overview …continued  
Legend:  
"1" Indicates that the related register bit is tied off to logic HIGH, all writes are ignored  
"0" Indicates that the related register bit is tied off to logic LOW, all writes are ignored  
“+” Indicates that the related register bit is readable and writable  
Branch Clock Name  
Base Clock  
Implemented Switch On/Off  
Mechanism  
WAKEUP  
AUTO  
RUN  
+
CLK_SPI0  
BASE_SPI_CLK  
BASE_SPI_CLK  
+
+
+
+
+
+
+
+
+
0
+
+
+
+
+
+
+
+
+
0
CLK_SPI1  
+
CLK_SPI2  
BASE_SPI_CLK  
+
CLK_TMR0  
CLK_TMR1  
CLK_TMR2  
CLK_TMR3  
CLK_ADC1  
CLK_ADC2  
CLK_TESTSHELL_IP  
BASE_TMR_CLK  
BASE_TMR_CLK  
BASE_TMR_CLK  
BASE_TMR_CLK  
BASE_ADC_CLK  
BASE_ADC_CLK  
BASE_CLK_TESTSHELL  
+
+
+
+
+
+
1
8.8.6.3 PMU pin description  
The PMU has no external pins.  
8.9 Vectored interrupt controller  
8.9.1 Overview  
The LPC2917/19 contains a very flexible and powerful Vectored Interrupt Controller (VIC)  
to interrupt the ARM processor on request.  
The key features are:  
Level-active interrupt request with programmable polarity  
56 interrupt-request inputs  
Software-interrupt request capability associated with each request input  
Observability of interrupt-request state before masking  
Software-programmable priority assignments to interrupt requests up to 15 levels  
Software-programmable routing of interrupt requests towards the ARM-processor  
inputs IRQ and FIQ  
Fast identification of interrupt requests through vector  
Support for nesting of interrupt service routines  
8.9.2 Description  
The Vectored Interrupt Controller routes incoming interrupt requests to the ARM  
processor. The interrupt target is configured for each interrupt request input of the VIC.  
The targets are defined as follows:  
Target 0 is ARM processor FIQ (fast interrupt service)  
Target 1 is ARM processor IRQ (standard interrupt service)  
LPC2917_19_1  
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Preliminary data sheet  
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LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Interrupt-request masking is performed individually per interrupt target by comparing the  
priority level assigned to a specific interrupt request with a target-specific priority  
threshold. The priority levels are defined as follows:  
Priority level 0 corresponds to ‘masked’ (i.e. interrupt requests with priority 0 never  
lead to an interrupt)  
Priority 1 corresponds to the lowest priority  
Priority 15 corresponds to the highest priority  
Software interrupt support is provided and can be supplied for:  
Testing RTOS interrupt handling without using device-specific interrupt service  
routines  
Software emulation of an interrupt-requesting device, including interrupts  
8.9.3 VIC pin description  
The VIC module in the LPC2917/19 has no external pins.  
8.9.4 VIC clock description  
The VIC is clocked by CLK_SYS_VIC, see Section 7.2.2.  
9. Limiting values  
Table 28. Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
Parameter  
Conditions  
Min  
Max  
Unit  
Supply pins  
Ptot  
[1]  
Total power dissipation.  
Core supply voltage.  
-
1
W
V
VDD(CORE)  
VDD(OSC_PLL)  
0.5  
0.5  
+2.0  
+2.0  
Oscillator and PLL supply  
voltage.  
V
VDD(ADC3V3)  
VDD(IO)  
IDD  
3.3 V ADC supply voltage.  
I/O digital supply voltage.  
Supply current.  
0.5  
0.5  
-
+4.6  
+4.6  
98  
V
V
[2]  
[2]  
Average value per supply  
pin.  
mA  
ISS  
Ground current.  
Average value per ground  
pin.  
-
98  
mA  
Input pins and I/O pins  
VXIN_OSC  
VXIN_RTC  
VI(IO)  
Voltage on pin XIN_OSC.  
0.5  
0.5  
0.5  
0.5  
0.5  
0.5  
-
+2.0  
V
Voltage on pin XIN_RTC.  
I/O input voltage.  
+2.0  
V
[3][4][5]  
[4][5]  
VDD(IO) + 3.0  
V
VI(ADC)  
VVREFP  
VVREFN  
II(ADC)  
ADC input voltage.  
I/O port 0.  
VDD(ADC3V3) + 0.5  
V
Voltage on pin VREFP.  
Voltage on pin VREFN.  
ADC input current.  
+3.6  
+3.6  
35  
V
V
[2]  
Average value per input pin.  
mA  
Output pins and I/O pins configured as output  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
51 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 28. Limiting values …continued  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
Parameter  
Conditions  
Min  
Max  
Unit  
[9]  
[9]  
IOHS  
HIGH-state short-circuit  
output current.  
Drive HIGH, output shorted  
to VSS(IO).  
-
33  
mA  
IOLS  
LOW-state short-circuit  
output current.  
Drive LOW, output shorted  
to VDD(IO).  
-
+38  
mA  
General  
Tstg  
Storage temperature.  
40  
40  
40  
+150  
+85  
°C  
°C  
°C  
Tamb  
Ambient temperature.  
Virtual junction temperature.  
[6]  
Tvj  
+125  
Memory  
nendu(fl)  
tret(fl)  
Endurance of flash memory.  
-
-
100000  
20  
cycle  
year  
Flash memory retention  
time.  
Electrostatic discharge  
Vesd Electrostatic discharge  
voltage.  
On all pins.  
[7]  
[8]  
Human body model.  
Machine model.  
2000  
200  
500  
+2000  
+200  
+500  
V
V
V
Charged device model.  
On corner pins.  
Charged device model.  
-750  
+750  
V
[1] Based on package heat transfer, not device power consumption.  
[2] Peak current must be limited at 25 times average current.  
[3] For I/O Port 0, the maximum input voltage is defined by VI(ADC)  
.
[4] Only when VDD(IO) is present.  
[5] Note that pull-up should be off. With pull-up do not exceed 3.6 V.  
[6] In accordance with IEC 60747-1. An alternative definition of the virtual junction temperature is: Tvj = Tamb + Ptot × Rth(j-a) where Rth(j-a) is  
a fixed value; see Section 10. The rating for Tvj limits the allowable combinations of power dissipation and ambient temperature.  
[7] Human-body model: discharging a 100 pF capacitor via a 10 kΩ series resistor.  
[8] Machine model: discharging a 200 pF capacitor via a 0.75 μH series inductance and 10 Ω resistor.  
[9] 112 mA per VDD(IO) or VSS(IO) should not be exceeded.  
10. Thermal characteristics  
Table 29. Thermal characteristics  
Symbol  
Parameter  
Conditions  
in free air  
package;  
LQFP144  
Value  
Unit  
Rth(j-a)  
thermal resistance from  
junction to ambient  
62  
K/W  
LPC2917_19_1  
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Preliminary data sheet  
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52 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
11. Static characteristics  
Table 30. Static characteristics  
VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = -40 °C to +125 °C; all voltages are  
measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1]  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Supplies  
Core supply  
VDD(CORE)  
IDDD(CORE)  
Core supply voltage.  
Core supply current.  
1.71  
-
1.80  
1.1  
1.89  
2.5  
V
ARM9 and all  
mA/  
peripherals active at  
max clock speeds.  
MHz  
[2]  
All clocks off.  
-
30  
-
450  
3.6  
μA  
V
I/O supply  
VDD(IO)  
I/O digital supply voltage.  
2.7  
1.71  
Oscillator supply  
VDD(OSC_PLL) Oscillator and PLL supply  
voltage.  
1.80  
1.89  
V
IDDD(OSC_PLL) Oscillator and PLL supply start-up  
current.  
1.5  
-
-
-
3
1
2
mA  
mA  
μA  
Normal mode  
Power-down mode  
-
-
Analog-to-digital converter supply  
VDD(A3V3) 3.3 V ADC supply voltage  
IDDA(A3V3) 3.3 V ADC analog supply Normal mode  
current.  
Input pins and I/O pins configured as input  
3.0  
3.3  
3.6  
1.9  
4
V
-
-
-
-
mA  
μA  
Power-down mode  
[7][8]  
VI  
Input voltage.  
All port pins and VDD(IO)  
applied except port 0  
pins 16 to 31.  
-0.5  
-
+ 5.5  
V
see Section 9  
[8]  
Port 0 pins 16 to 31.  
VVREFP  
+3.6  
All port pins and VDD(IO)  
not applied.  
-0.5  
-0.5  
-
-
V
V
All other I/O pins,  
RESET_N, TRST_N,  
TDI, JTAGSEL, TMS,  
TCK.  
VDD(IO)  
VIH  
VIL  
HIGH-state input voltage. All port pins, RESET_N,  
TRST_N, TDI,  
2.0  
-
-
-
-
V
V
JTAGSEL, TMS, TCK.  
LOW-state input voltage. All port pins, RESET_N,  
TRST_N, TDI,  
0.8  
JTAGSEL, TMS, TCK.  
Vhys  
ILIH  
Hysteresis voltage.  
0.4  
-
-
-
-
V
HIGH-state input leakage  
current.  
1
μA  
LPC2917_19_1  
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Preliminary data sheet  
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53 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 30. Static characteristics …continued  
VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = -40 °C to +125 °C; all voltages are  
measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1]  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
ILIL  
LOW-state input leakage  
current.  
-
-
1
μA  
II(pd)  
II(pu)  
Pull-down input current.  
All port pins, VI = 3.3 V;  
VI = 5.5 V.  
25  
50  
100  
μA  
μA  
Pull-up input current.  
All port pins, RESET_N,  
TRST_N, TDI,  
25  
50  
100  
JTAGSEL, TMS: VI = 0  
V; VI > 3.6 V is not  
allowed.  
[3]  
Ci  
Input capacitance.  
-
3
8
pF  
Output pins and I/O pins configured as output  
VO  
Output voltage.  
0
-
-
VDD(IO)  
-
V
V
VOH  
HIGH-state output  
voltage.  
IOH = 4 mA  
VDD(IO) – 0.4  
VOL  
CL  
LOW-state output voltage. IOL = 4 mA  
Load capacitance.  
-
-
-
-
0.4  
25  
V
pF  
Analog-to-digital converter supply  
VVREFN  
VVREFP  
VI(ADC)  
Voltage on pin VREFN.  
Voltage on pin VREFP.  
0
-
-
-
VVREFP 2  
VDD(A3V3)  
VVREFP  
V
V
V
VVREFN + 2  
VVREFN  
ADC input voltage on  
port 0 pins  
Port 0.  
Zi  
Input impedance.  
Between VREFN and  
VREFP  
4.4  
-
-
-
kΩ  
kΩ  
Between VREFN and  
VDD(A5V)  
13.7  
23.6  
FSR  
Full scale range.  
2
-
-
-
-
-
10  
bit  
INL  
Integral non-linearity.  
Differential non-linearity.  
Offset error voltage.  
Full-scale error voltage.  
1  
+1  
LSB  
LSB  
mV  
mV  
DNL  
1  
+1  
Verr(offset)  
Verr(FS)  
20  
20  
+20  
+20  
LPC2917_19_1  
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Preliminary data sheet  
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54 of 68  
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NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 30. Static characteristics …continued  
VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = -40 °C to +125 °C; all voltages are  
measured with respect to ground; positive currents flow into the IC; unless otherwise specified.[1]  
Symbol  
Oscillator  
Rs(xtal)  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
[5]  
Crystal series resistance. fosc = 10 MHz to 15 MHz  
Cxtal = 10 pF;  
Cext = 18 pF  
-
-
-
-
160  
60  
Ω
Ω
Cxtal = 20 pF;  
Cext = 39 pF  
[5]  
[9]  
fosc = 15 MHz to 20 MHz  
Cxtal = 10 pF;  
Cext = 18 pF  
-
-
-
80  
2
Ω
Ci  
Input capacitance of  
XIN_OSC.  
pF  
Power-up reset  
[6]  
[6]  
[6]  
Vtrip(high)  
Vtrip(low)  
Vtrip(dif)  
High trip-level voltage.  
1.2  
1.1  
50  
1.4  
1.3  
120  
1.6  
1.5  
180  
V
Low trip-level voltage.  
V
Difference between high  
and low trip-level  
voltages.  
mV  
[1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 125 °C on wafer  
level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated test conditions to cover  
the specified temperature and power-supply voltage range.  
[2] Leakage current is exponential to temperature; worst-case value is at 125 C Tvj. All clocks off. Analog modules and FLASH powered  
down.  
[3] For Port 0, pin 0 to pin 15 add maximum 1.5 pF for input capacitance to ADC. For Port 0, pin 16 to pin 31 add maximum 1.0 pF for input  
capacitance to ADC.  
[4] This value is the minimum drive capability. Maximum short-circuit output current is 33 mA (drive HIGH-level, shorted to ground) or  
38 mA. (drive LOW-level, shorted to VDD(IO)). The device will be damaged if multiple outputs are shorted.  
[5] Cxtal is crystal load capacitance and Cext are the two external load capacitors.  
[6] The power-up reset has a time filter: VDD(CORE) must be above Vtrip(high) for 2 μs before reset is de-asserted; VDD(CORE) must be below  
V
trip(low) for 11 μs before internal reset is asserted.  
[7] Not 5 V-tolerant when pull-up is on.  
[8] For I/O Port 0, the maximum input voltage is defined by VI(ADC)  
.
[9] This parameter is not part of production testing or final testing, hence only a typical value is stated. Maximum and minimum values are  
based on simulation results.  
12. Dynamic characteristics  
Table 31. Dynamic characteristics  
VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = 40 °C; all voltages are measured with  
respect to ground; positive currents flow into the IC; unless otherwise specified.  
Symbol  
I/O pins  
tTHL  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
HIGH-to-LOW  
transition time.  
CL = 30 pF  
CL = 30 pF  
4
4
-
-
13.8  
13.8  
ns  
ns  
tTLH  
LOW-to-HIGH  
transition time.  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
55 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 31. Dynamic characteristics …continued  
VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = 40 °C; all voltages are measured with  
respect to ground; positive currents flow into the IC; unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
Internal clock  
fclk(sys)  
System clock  
frequency. See  
Table 23.  
10  
-
80  
MHz  
Tclk(sys)  
System clock period.  
See Table 23.  
12.5  
-
100  
ns  
Low-Power Ring Oscillator  
fref(RO) RO reference  
0.36  
-
0.4  
6
0.42  
100  
MHz  
frequency.  
tstartup  
Start-up time.  
At maximum frequency  
.
μs  
[2]  
Oscillator  
fi(osc)  
Oscillator input  
frequency.  
Maximum frequency is  
the clock input of an  
external clock source  
applied to the Xin pin.  
10  
-
-
80  
-
MHz  
tstartup  
Start-up time.  
At maximum frequency.  
[2] [3]  
500  
μs  
PLL  
fi(PLL)  
fo(PLL)  
PLL input frequency.  
PLL output frequency.  
10  
-
-
-
25  
MHz  
MHz  
MHz  
10  
160  
320  
CCO; direct mode.  
156  
Analog-to-digital converter  
fi(ADC) ADC input frequency.  
fs(max)  
[4]  
4
-
4.5  
MHz  
Maximum sampling  
rate.  
fi(ADC) = 4.5 MHz;  
fs = fi(ADC)/(n+1) with  
n = resolution  
resolution 2 bit  
resolution 10 bit  
-
-
-
-
1500  
400  
11  
ksample/s  
ksample/s  
cycles  
-
tconv  
Conversion time.  
In number of ADC clock  
cycles.  
3
In number of bits.  
2
-
10  
bits  
Flash memory  
tinit  
Initialization time.  
Page write time.  
-
-
150  
1.05  
105  
70  
μs  
ms  
ms  
ns  
ns  
ns  
twr(pg)  
0.95  
1
ter(sect)  
Sector erase time.  
Flash word BIST time.  
clock access time  
address access time  
95  
-
100  
38  
-
tfl(BIST)  
tacc(clk)  
-
63.4  
60.3  
tacc(addr)  
-
-
external static memory controller  
ta(R)int  
Internal read-access  
time.  
-
-
20.5  
ns  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
56 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 31. Dynamic characteristics …continued  
VDD(CORE) = VDD(OSC_PLL) ; VDD(IO) = 2.7 V to 3.6 V; VDD(A3V3) = 3.0 V to 3.6 V; Tvj = 40 °C; all voltages are measured with  
respect to ground; positive currents flow into the IC; unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max  
Unit  
ta(W)int  
Internal write-access  
time.  
-
-
24.9  
ns  
UART  
fUART  
SPI  
1
UART frequency.  
65024fclk(uart)  
-
12fclk(uart) MHz  
1
1
fSPI  
SPI operating  
frequency.  
Master operation.  
Slave operation.  
65024fclk(spi)  
65024fclk(spi)  
-
-
12fclk(spi) MHz  
14fclk(spi) MHz  
Jitter Specification  
[2]  
CANtjit(cc)(p-p)  
CAN TXD pin  
-
0.4  
1
ns  
Cycle-to-cycle jitter  
(peak-to-peak value).  
[1] All parameters are guaranteed over the virtual junction temperature range by design. Pre-testing is performed at Tamb = 125 °C ambient  
temperature on wafer level. Cased products are tested at Tamb = 25 °C (final testing). Both pre-testing and final testing use correlated  
test conditions to cover the specified temperature and power supply voltage range.  
[2] This parameter is not part of production testing or final testing, hence only a typical value is stated.  
[3] Oscillator start-up time depends on the quality of the crystal. For most crystals it takes about 1000 clock pulses until the clock is fully  
stable.  
[4] Duty cycle clock should be as close as possible to 50%.  
LPC2917_19_1  
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Preliminary data sheet  
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57 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
13. Package outline  
LQFP144: plastic low profile quad flat package; 144 leads; body 20 x 20 x 1.4 mm  
SOT486-1  
y
X
A
108  
109  
73  
72  
Z
E
e
H
A
E
2
A
E
(A )  
3
A
1
θ
w M  
p
L
p
b
L
pin 1 index  
detail X  
37  
144  
1
36  
v M  
Z
A
w M  
D
b
p
e
D
B
H
v M  
B
D
0
5
10 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
A
(1)  
(1)  
(1)  
(1)  
UNIT  
A
A
A
b
c
D
E
e
H
D
H
L
L
v
w
y
Z
Z
E
θ
1
2
3
p
E
p
D
max.  
7o  
0o  
0.15 1.45  
0.05 1.35  
0.27 0.20 20.1 20.1  
0.17 0.09 19.9 19.9  
22.15 22.15  
21.85 21.85  
0.75  
0.45  
1.4  
1.1  
1.4  
1.1  
mm  
1.6  
0.25  
1
0.2 0.08 0.08  
0.5  
Note  
1. Plastic or metal protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
JEDEC JEITA  
OUTLINE  
VERSION  
EUROPEAN  
PROJECTION  
ISSUE DATE  
IEC  
00-03-14  
03-02-20  
SOT486-1  
136E23  
MS-026  
Fig 15. Package outline SOT486-1 (LQFP144)  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
58 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
14. Soldering  
14.1 Introduction  
There is no soldering method that is ideal for all surface mount IC packages. Wave  
soldering can still be used for certain surface mount ICs, but it is not suitable for fine pitch  
SMDs. In these situations reflow soldering is recommended.  
14.2 Through-hole mount packages  
14.2.1 Soldering by dipping or by solder wave  
Typical dwell time of the leads in the wave ranges from 3 seconds to 4 seconds at 250 °C  
or 265 °C, depending on solder material applied, SnPb or Pb-free respectively.  
The total contact time of successive solder waves must not exceed 5 seconds.  
The device may be mounted up to the seating plane, but the temperature of the plastic  
body must not exceed the specified maximum storage temperature (Tstg(max)). If the  
printed-circuit board has been pre-heated, forced cooling may be necessary immediately  
after soldering to keep the temperature within the permissible limit.  
14.2.2 Manual soldering  
Apply the soldering iron (24 V or less) to the lead(s) of the package, either below the  
seating plane or not more than 2 mm above it. If the temperature of the soldering iron bit is  
less than 300 °C it may remain in contact for up to 10 seconds. If the bit temperature is  
between 300 °C and 400 °C, contact may be up to 5 seconds.  
14.3 Surface mount packages  
14.3.1 Reflow soldering  
Key characteristics in reflow soldering are:  
Lead-free versus SnPb soldering; note that a lead-free reflow process usually leads to  
higher minimum peak temperatures (see Figure 16) than a PbSn process, thus  
reducing the process window  
Solder paste printing issues including smearing, release, and adjusting the process  
window for a mix of large and small components on one board  
Reflow temperature profile; this profile includes preheat, reflow (in which the board is  
heated to the peak temperature) and cooling down. It is imperative that the peak  
temperature is high enough for the solder to make reliable solder joints (a solder paste  
characteristic). In addition, the peak temperature must be low enough that the  
packages and/or boards are not damaged. The peak temperature of the package  
depends on package thickness and volume and is classified in accordance with  
Table 32 and 33  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
59 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 32. SnPb eutectic process (from J-STD-020C)  
Package thickness (mm) Package reflow temperature (°C)  
Volume (mm3)  
< 350  
350  
220  
< 2.5  
235  
220  
2.5  
220  
Table 33. Lead-free process (from J-STD-020C)  
Package thickness (mm) Package reflow temperature (°C)  
Volume (mm3)  
< 350  
260  
350 to 2000  
> 2000  
260  
< 1.6  
260  
250  
245  
1.6 to 2.5  
> 2.5  
260  
245  
250  
245  
Moisture sensitivity precautions, as indicated on the packing, must be respected at all  
times.  
Studies have shown that small packages reach higher temperatures during reflow  
soldering, see Figure 16.  
maximum peak temperature  
= MSL limit, damage level  
temperature  
minimum peak temperature  
= minimum soldering temperature  
peak  
temperature  
time  
001aac844  
MSL: Moisture Sensitivity Level  
Fig 16. Temperature profiles for large and small components  
For further information on temperature profiles, refer to Application Note AN10365  
“Surface mount reflow soldering description”.  
14.3.2 Wave soldering  
Conventional single wave soldering is not recommended for surface mount devices  
(SMDs) or printed-circuit boards with a high component density, as solder bridging and  
non-wetting can present major problems.  
LPC2917_19_1  
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Preliminary data sheet  
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60 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
To overcome these problems the double-wave soldering method was specifically  
developed.  
If wave soldering is used the following conditions must be observed for optimal results:  
Use a double-wave soldering method comprising a turbulent wave with high upward  
pressure followed by a smooth laminar wave.  
For packages with leads on two sides and a pitch (e):  
larger than or equal to 1.27 mm, the footprint longitudinal axis is preferred to be  
parallel to the transport direction of the printed-circuit board;  
smaller than 1.27 mm, the footprint longitudinal axis must be parallel to the  
transport direction of the printed-circuit board.  
The footprint must incorporate solder thieves at the downstream end.  
For packages with leads on four sides, the footprint must be placed at a 45° angle to  
the transport direction of the printed-circuit board. The footprint must incorporate  
solder thieves downstream and at the side corners.  
During placement and before soldering, the package must be fixed with a droplet of  
adhesive. The adhesive can be applied by screen printing, pin transfer or syringe  
dispensing. The package can be soldered after the adhesive is cured.  
Typical dwell time of the leads in the wave ranges from 3 seconds to 4 seconds at 250 °C  
or 265 °C, depending on solder material applied, SnPb or Pb-free respectively.  
A mildly-activated flux will eliminate the need for removal of corrosive residues in most  
applications.  
14.3.3 Manual soldering  
Fix the component by first soldering two diagonally-opposite end leads. Use a low voltage  
(24 V or less) soldering iron applied to the flat part of the lead. Contact time must be  
limited to 10 seconds at up to 300 °C.  
When using a dedicated tool, all other leads can be soldered in one operation within  
2 seconds to 5 seconds between 270 °C and 320 °C.  
14.4 Package related soldering information  
Table 34. Suitability of IC packages for wave, reflow and dipping soldering methods  
Mounting  
Package[1]  
Soldering method  
Wave  
Reflow[2]  
Dipping  
Through-hole mount  
CPGA, HCPGA  
suitable  
DBS, DIP, HDIP, RDBS, SDIP, SIL suitable[3]  
suitable  
Through-hole-surface  
mount  
PMFP[4]  
not suitable  
not suitable  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
61 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
Table 34. Suitability of IC packages for wave, reflow and dipping soldering methods …continued  
Mounting  
Package[1]  
Soldering method  
Wave  
Reflow[2]  
Dipping  
Surface mount  
BGA, HTSSON..T[5], LBGA,  
LFBGA, SQFP, SSOP..T[5],  
TFBGA, VFBGA, XSON  
not suitable  
suitable  
DHVQFN, HBCC, HBGA, HLQFP, not suitable[6]  
HSO, HSOP, HSQFP, HSSON,  
HTQFP, HTSSOP, HVQFN,  
suitable  
HVSON, SMS  
PLCC[7], SO, SOJ  
suitable  
suitable  
LQFP, QFP, TQFP  
not recommended[7][8]  
not recommended[9]  
not suitable  
suitable  
SSOP, TSSOP, VSO, VSSOP  
CWQCCN..L[10], WQCCN..L[10]  
suitable  
not suitable  
[1] For more detailed information on the BGA packages refer to the (LF)BGA Application Note (AN01026); order a copy from your NXP  
Semiconductors sales office.  
[2] All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the maximum temperature (with  
respect to time) and body size of the package, there is a risk that internal or external package cracks may occur due to vaporization of  
the moisture in them (the so called popcorn effect).  
[3] For SDIP packages, the longitudinal axis must be parallel to the transport direction of the printed-circuit board.  
[4] Hot bar soldering or manual soldering is suitable for PMFP packages.  
[5] These transparent plastic packages are extremely sensitive to reflow soldering conditions and must on no account be processed  
through more than one soldering cycle or subjected to infrared reflow soldering with peak temperature exceeding 217 °C ± 10 °C  
measured in the atmosphere of the reflow oven. The package body peak temperature must be kept as low as possible.  
[6] These packages are not suitable for wave soldering. On versions with the heatsink on the bottom side, the solder cannot penetrate  
between the printed-circuit board and the heatsink. On versions with the heatsink on the top side, the solder might be deposited on the  
heatsink surface.  
[7] If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave direction. The package footprint  
must incorporate solder thieves downstream and at the side corners.  
[8] Wave soldering is suitable for LQFP, QFP and TQFP packages with a pitch (e) larger than 0.8 mm; it is definitely not suitable for  
packages with a pitch (e) equal to or smaller than 0.65 mm.  
[9] Wave soldering is suitable for SSOP, TSSOP, VSO and VSSOP packages with a pitch (e) equal to or larger than 0.65 mm; it is definitely  
not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.  
[10] Image sensor packages in principle should not be soldered. They are mounted in sockets or delivered pre-mounted on flex foil.  
However, the image sensor package can be mounted by the client on a flex foil by using a hot bar soldering process. The appropriate  
soldering profile can be provided on request.  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
62 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
15. Abbreviations  
Table 35. Abbreviations list  
Abbreviation  
Description  
AHB  
BCL  
Advanced High-performance Bus  
Buffer Control List  
BDL  
Buffer Descriptor List  
CISC  
DTL  
Complex Instruction Set Computers  
Device Transaction Level  
SFSP  
SCL  
SCU Function Select Port x,y (use without the P if there are no x,y)  
Slot Control List  
BEL  
Buffer Entry List  
CCO  
BIST  
RISC  
UART  
VPB  
Current Controlled Oscillator  
Built-In Self Test  
Reduced Instruction Set Computer  
Universal Asynchronous Receiver Transmitter  
VLSI Peripheral bus  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
63 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
16. References  
[1] UM LPC2917/19 user manual  
[2] ARM ARM web site  
[3] ARM-SSP ARM primecell synchronous serial port (PL022) technical reference  
manual  
[4] CAN ISO 11898-1: 2002 road vehicles - Controller Area Network (CAN) - part 1:  
data link layer and physical signalling  
[5] LIN LIN specification package, revision 2.0  
LPC2917_19_1  
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Preliminary data sheet  
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64 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
17. Revision history  
Table 36. Revision history  
Document ID  
LPC2917_19_1.01  
Modifications  
Release date  
<tbd>  
Data sheet status  
Change notice  
Supersedes  
Preliminary data sheet  
LPC2915_17_19_1  
Part LPC2915 removed  
Editorial updates  
20070917 Preliminary data sheet  
LPC2915_17_19_1  
LPC2917_19_1  
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Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
65 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
18. Legal information  
18.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
result in personal injury, death or severe property or environmental damage.  
18.2 Definitions  
NXP Semiconductors accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or applications and therefore  
such inclusion and/or use is at the customer’s own risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
18.3 Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
No offer to sell or license — Nothing in this document may be interpreted or  
construed as an offer to sell products that is open for acceptance or the grant,  
conveyance or implication of any license under any copyrights, patents or  
other industrial or intellectual property rights.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
18.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
malfunction of a NXP Semiconductors product can reasonably be expected to  
I2C-bus — logo is a trademark of NXP B.V.  
19. Contact information  
For additional information, please visit: http://www.nxp.com  
For sales office addresses, send an email to: salesaddresses@nxp.com  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
66 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
20. Contents  
1
1.1  
1.2  
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
About this document. . . . . . . . . . . . . . . . . . . . . 1  
Intended audience . . . . . . . . . . . . . . . . . . . . . . 1  
8.3.2  
Chip and feature identification . . . . . . . . . . . . 22  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
CFID pin description . . . . . . . . . . . . . . . . . . . 22  
System Control Unit (SCU) . . . . . . . . . . . . . . 22  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
SCU pin description . . . . . . . . . . . . . . . . . . . . 22  
Event router . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 22  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 23  
Event-router pin description and mapping to  
8.3.2.1  
8.3.2.2  
8.3.2.3  
8.3.3  
8.3.3.1  
8.3.3.2  
8.3.3.3  
8.3.4  
2
General description. . . . . . . . . . . . . . . . . . . . . . 1  
Architectural overview . . . . . . . . . . . . . . . . . . . 1  
ARM968E-S processor. . . . . . . . . . . . . . . . . . . 2  
On-chip flash memory system . . . . . . . . . . . . . 2  
On-chip static RAM. . . . . . . . . . . . . . . . . . . . . . 3  
2.1  
2.2  
2.3  
2.4  
3
3.1  
4
4.1  
5
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
General. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Ordering information. . . . . . . . . . . . . . . . . . . . . 4  
Ordering options. . . . . . . . . . . . . . . . . . . . . . . . 4  
Block diagram . . . . . . . . . . . . . . . . . . . . . . . . . . 5  
8.3.4.1  
8.3.4.2  
8.3.4.3  
register bit positions. . . . . . . . . . . . . . . . . . . . 23  
Peripheral subsystem . . . . . . . . . . . . . . . . . . 23  
Peripheral subsystem clock description. . . . . 23  
Watchdog timer . . . . . . . . . . . . . . . . . . . . . . . 24  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Pin description . . . . . . . . . . . . . . . . . . . . . . . . 24  
Watchdog timer clock description . . . . . . . . . 24  
Timer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 24  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 25  
Pin description . . . . . . . . . . . . . . . . . . . . . . . . 25  
Timer clock description . . . . . . . . . . . . . . . . . 26  
UARTs . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 26  
UART pin description. . . . . . . . . . . . . . . . . . . 26  
UART clock description . . . . . . . . . . . . . . . . . 27  
Serial peripheral interface . . . . . . . . . . . . . . . 27  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 27  
Functional description . . . . . . . . . . . . . . . . . . 27  
Modes of operation . . . . . . . . . . . . . . . . . . . . 28  
SPI pin description. . . . . . . . . . . . . . . . . . . . . 28  
SPI clock description . . . . . . . . . . . . . . . . . . . 28  
General-purpose I/O . . . . . . . . . . . . . . . . . . . 29  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 29  
Description. . . . . . . . . . . . . . . . . . . . . . . . . . . 29  
GPIO pin description . . . . . . . . . . . . . . . . . . . 29  
GPIO clock description . . . . . . . . . . . . . . . . . 29  
CAN gateway. . . . . . . . . . . . . . . . . . . . . . . . . 30  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30  
Global acceptance filter . . . . . . . . . . . . . . . . . 30  
CAN pin description . . . . . . . . . . . . . . . . . . . . 30  
LIN . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30  
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30  
LIN pin description . . . . . . . . . . . . . . . . . . . . . 31  
8.4  
8.4.1  
8.4.2  
6
6.1  
6.2  
6.2.1  
6.2.2  
Pinning information. . . . . . . . . . . . . . . . . . . . . . 6  
Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 6  
Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 6  
General description . . . . . . . . . . . . . . . . . . . . . 6  
LQFP144 pin assignment. . . . . . . . . . . . . . . . . 6  
8.4.2.1  
8.4.2.2  
8.4.2.3  
8.4.2.4  
8.4.3  
8.4.3.1  
8.4.3.2  
8.4.3.3  
8.4.3.4  
8.4.4  
8.4.4.1  
8.4.4.2  
8.4.4.3  
8.4.4.4  
8.4.5  
8.4.5.1  
8.4.5.2  
8.4.5.3  
8.4.5.4  
8.4.5.5  
8.4.6  
8.4.6.1  
8.4.6.2  
8.4.6.3  
8.4.6.4  
8.5  
8.5.1  
8.5.2  
8.5.3  
8.6  
7
7.1  
7.1.1  
7.1.2  
7.1.3  
Functional description . . . . . . . . . . . . . . . . . . 10  
Reset, debug, test and power description . . . 10  
Reset and power-up behavior . . . . . . . . . . . . 10  
Reset strategy . . . . . . . . . . . . . . . . . . . . . . . . 10  
IEEE 1149.1 interface pins (JTAG boundary-scan  
test). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Power supply pins description . . . . . . . . . . . . 11  
Clocking strategy . . . . . . . . . . . . . . . . . . . . . . 11  
Clock architecture. . . . . . . . . . . . . . . . . . . . . . 11  
Base clock and branch clock relationship. . . . 13  
7.1.4  
7.2  
7.2.1  
7.2.2  
8
8.1  
Block description. . . . . . . . . . . . . . . . . . . . . . . 14  
Flash memory controller. . . . . . . . . . . . . . . . . 14  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 14  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 15  
Flash memory controller pin description. . . . . 16  
Flash memory controller clock description . . . 16  
Flash layout . . . . . . . . . . . . . . . . . . . . . . . . . . 16  
Flash bridge wait-states . . . . . . . . . . . . . . . . . 17  
External static memory controller . . . . . . . . . . 18  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 18  
External static-memory controller pin  
description . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
External static-memory controller clock  
description . . . . . . . . . . . . . . . . . . . . . . . . . . . 19  
External memory timing diagrams . . . . . . . . . 19  
General subsystem. . . . . . . . . . . . . . . . . . . . . 22  
General subsystem clock description. . . . . . . 22  
8.1.1  
8.1.2  
8.1.3  
8.1.4  
8.1.5  
8.1.6  
8.2  
8.2.1  
8.2.2  
8.2.3  
8.2.4  
8.2.5  
8.3  
8.3.1  
8.6.1  
8.6.2  
continued >>  
LPC2917_19_1  
© NXP B.V. 2007. All rights reserved.  
Preliminary data sheet  
Rev. 1.01 — 15 November 2007  
67 of 68  
LPC2917/19  
NXP Semiconductors  
ARM9 microcontroller with CAN and LIN  
8.7  
Modulation and sampling control subsystem . 31  
13  
Package outline. . . . . . . . . . . . . . . . . . . . . . . . 58  
8.7.1  
8.7.2  
8.7.2.1  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 31  
Synchronization and trigger features of the  
14  
14.1  
14.2  
14.2.1  
14.2.2  
14.3  
14.3.1  
14.3.2  
14.3.3  
14.4  
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 59  
Introduction . . . . . . . . . . . . . . . . . . . . . . . . . . 59  
Through-hole mount packages . . . . . . . . . . . 59  
Soldering by dipping or by solder wave . . . . . 59  
Manual soldering . . . . . . . . . . . . . . . . . . . . . . 59  
Surface mount packages . . . . . . . . . . . . . . . . 59  
Reflow soldering . . . . . . . . . . . . . . . . . . . . . . 59  
Wave soldering . . . . . . . . . . . . . . . . . . . . . . . 60  
Manual soldering . . . . . . . . . . . . . . . . . . . . . . 61  
Package related soldering information. . . . . . 61  
MSCSS. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32  
MSCSS pin description. . . . . . . . . . . . . . . . . . 34  
MSCSS clock description . . . . . . . . . . . . . . . . 34  
Analog-to-digital converter . . . . . . . . . . . . . . . 35  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 35  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 35  
ADC pin description . . . . . . . . . . . . . . . . . . . . 36  
ADC clock description . . . . . . . . . . . . . . . . . . 37  
PWM. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 37  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 37  
Synchronizing the PWM counters. . . . . . . . . . 38  
Master and slave mode . . . . . . . . . . . . . . . . . 39  
PWM pin description. . . . . . . . . . . . . . . . . . . . 39  
PWM clock description . . . . . . . . . . . . . . . . . . 39  
Timers in the MSCSS . . . . . . . . . . . . . . . . . . . 40  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 40  
MSCSS timer-pin description . . . . . . . . . . . . . 40  
MSCSS timer-clock description . . . . . . . . . . . 40  
Power, clock and reset control subsystem . . . 40  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 40  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 40  
PCR subsystem clock description . . . . . . . . . 41  
Clock Generation Unit (CGU) . . . . . . . . . . . . . 41  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 42  
PLL functional description . . . . . . . . . . . . . . . 45  
CGU pin description . . . . . . . . . . . . . . . . . . . . 46  
Reset Generation Unit (RGU). . . . . . . . . . . . . 47  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 47  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 47  
RGU pin description . . . . . . . . . . . . . . . . . . . . 48  
Power Management Unit (PMU). . . . . . . . . . . 48  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 48  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 48  
PMU pin description . . . . . . . . . . . . . . . . . . . . 50  
Vectored interrupt controller . . . . . . . . . . . . . . 50  
Overview. . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50  
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . 50  
VIC pin description . . . . . . . . . . . . . . . . . . . . . 51  
VIC clock description . . . . . . . . . . . . . . . . . . . 51  
8.7.3  
8.7.4  
8.7.5  
8.7.5.1  
8.7.5.2  
8.7.5.3  
8.7.5.4  
8.7.6  
8.7.6.1  
8.7.6.2  
8.7.6.3  
8.7.6.4  
8.7.6.5  
8.7.6.6  
8.7.7  
8.7.7.1  
8.7.7.2  
8.7.7.3  
8.7.7.4  
8.8  
15  
16  
17  
Abbreviations . . . . . . . . . . . . . . . . . . . . . . . . . 63  
References. . . . . . . . . . . . . . . . . . . . . . . . . . . . 64  
Revision history . . . . . . . . . . . . . . . . . . . . . . . 65  
18  
Legal information . . . . . . . . . . . . . . . . . . . . . . 66  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 66  
Definitions . . . . . . . . . . . . . . . . . . . . . . . . . . . 66  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . 66  
Trademarks . . . . . . . . . . . . . . . . . . . . . . . . . . 66  
18.1  
18.2  
18.3  
18.4  
19  
20  
Contact information . . . . . . . . . . . . . . . . . . . . 67  
Contents. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 68  
8.8.1  
8.8.2  
8.8.3  
8.8.4  
8.8.4.1  
8.8.4.2  
8.8.4.3  
8.8.4.4  
8.8.5  
8.8.5.1  
8.8.5.2  
8.8.5.3  
8.8.6  
8.8.6.1  
8.8.6.2  
8.8.6.3  
8.9  
8.9.1  
8.9.2  
8.9.3  
8.9.4  
9
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 51  
Thermal characteristics . . . . . . . . . . . . . . . . . 52  
Static characteristics. . . . . . . . . . . . . . . . . . . . 53  
Dynamic characteristics . . . . . . . . . . . . . . . . . 55  
10  
11  
12  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2007.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 15 November 2007  
Document identifier: LPC2917_19_1  

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