MC33742DWR2 [NXP]
SPECIALTY TELECOM CIRCUIT, PDSO28, PLASTIC, MS-013AE, SOIC-28;型号: | MC33742DWR2 |
厂家: | NXP |
描述: | SPECIALTY TELECOM CIRCUIT, PDSO28, PLASTIC, MS-013AE, SOIC-28 电信 光电二极管 电信集成电路 |
文件: | 总71页 (文件大小:1014K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
Document Number: MC33742
Rev. 14.0, 6/2013
Freescale Semiconductor
Technical Data
System Basis Chip with
Enhanced High Speed CAN
Transceiver
33742
33742S
SYSTEM BASIS CHIP
The 33742 and the 33742S are SPI-controlled System Basis Chips
(SBCs), combining many frequently used functions, along with a CAN
2.0-compliant transceiver, used in many automotive electronic control
units (ECUs). The 33742 SBC has a fully protected fixed 5.0 V low
dropout internal regulator, with current limiting, over-temperature pre-
warning, and reset. A second 5.0 V regulator can be implemented using
external pass PNP bipolar junction pass transistor, driven by the SBC’s
external V2 sense input and V2 output drive pins.
EG SUFFIX (PB-FREE)
EP SUFFIX
(PB-FREE)
98ASA10825D
48-PIN QFN
98ASB42345B
28-PIN SOICW
The SBC has four main operating modes: Normal, Standby, Stop, and
Sleep mode. Additionally, there is an internally switched high side power
supply output, four wake-up inputs pins, a programmable window
watchdog, interrupt, reset, and a SPI module for communication and
control. The high speed CAN A and B transceiver is available for inter-
module communication.
ORDERING INFORMATION
Temperature
Range (TA)
Device
Package
Features
MC33742PEG/R2
MC33742SPEG/R2
MC33742PEP/R2
• 1.0 Mbps CAN transceiver bus interface with bus diagnostic capability
• SPI control at frequencies up to 4.0 Mhz
• 5.0 V low dropout voltage regulator with current limiting, over-
temperature prewarning, and output monitoring and reset
• A second 5.0 V regulator capability using an external series pass
transistor
28 SOICW
48 QFN
-40 to 125 °C
• Normal, Standby, Stop, and Sleep modes of operation with low Sleep
and Stop mode current
• A high side switch output driver for controlling external circuitry
VPWR
33742
V2
5.0V
VDD VSUP
V2CTRL
RST
V2
MCU
VPWR
CS
CS
L0
L1
L2
L3
SCLK
SCLK
SPI
MOSI
MISO
MOSI
MISO
Safe
WDOG
HS
Circuitry
INT
ECU Local
Circuitry
Twisted
TXD
RXD
CANH
CANL
GND
CAN Bus
Pair
GND
Figure 1. 33742 Simplified Application Diagram
* This document contains certain information on a new product.
Specifications and information herein are subject to change without notice.
© Freescale Semiconductor, Inc., 2007-2013. All rights reserved.
DEVICE VARIATIONS
DEVICE VARIATIONS
Table 1. Device Differences During a Reset Condition
Part No.
Reset Duration
Device Differences
See Page
33742
15 ms (typical)
page 18
The duration the RST pin is asserted low when the Reset mode is entered after
the SBC is powered up, a VDD under-voltage condition is detected, and the
watchdog register is not properly triggered.
33742S
3.5 ms (typical)
page 18
The duration the RST pin is asserted low when the Reset mode is entered after
the SBC is powered up, a VDD under-voltage condition is detected, and the
watchdog register is not properly triggered.
33742
Analog Integrated Circuit Device Data
2
Freescale Semiconductor
INTERNAL BLOCK DIAGRAM
INTERNAL BLOCK DIAGRAM
V2
V2CTRL
VSUP Monitor
Dual Voltage Regulator
VSUP
5.0V/200mA
V1 Monitor
HS Control
V1
Mode Control
Oscillator
HS
INT
Interrupt
Watchdog
Reset
WDOG
RST
MOSI
SCLK
MISO
CS
L1
L2
L3
L4
Programmable
Wake-up Input
SPI
High-speed
1.0 Mbps
CAN Physical
Interface
CANH
CANL
TXD
RXD
GND
Figure 2. 33742 Simplified Internal Block Diagram
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
3
PIN CONNECTIONS
PIN CONNECTIONS
1
28
27
26
25
24
23
22
21
20
19
18
17
16
15
WDOG
CS
RXD
TXD
VDD
RST
2
3
MOSI
MISO
SCLK
GND
GND
GND
GND
CANL
CANH
L3
4
5
INT
6
GND
GND
GND
GND
V2
7
8
9
10
11
12
13
14
V2CTRL
VSUP
HS
L2
L0
L1
Figure 3. 33742 28-Pin Connections
Table 2. 33742 28-Pin Definitions
A functional description of each pin can be found in the Functional Pin description section beginning on page 22.
Pin
Pin Name
Formal Name
Definition
CAN bus receive data output pin.
CAN bus transmit data input pin.
1
2
3
4
RXD
TXD
VDD
RST
Receive Data
Transmit Data
5.0 V regulator output pin. Supply pin for the MCU.
Voltage Digital Drain
This is the device reset output pin whose main function is to reset the MCU. This pin has
an internal
Reset Output
(Active LOW)
-up current source to VDD.
This output is asserted LOW when an enabled interrupt condition occurs. The output is
a push-pull structure.
5
INT
GND
V2
Interrupt Output
(Active LOW)
These device ground pins are internally connected to the package lead frame to provide
a 33742-to-PCB thermal path.
6–9
20–23
Ground
Sense input for the V2 regulator using an external series pass transistor. V2 is also the
internal supply for the CAN transceiver.
10
Voltage Source 2
Output drive source for the V2 regulator connected to the external series pass transistor.
Supply input pin for the 33742.
11
12
V2CTRL
VSUP
HS
Voltage Source 2 Control
Voltage Supply
Output of the internal high side switch. The output current is internally limited to 150 mA.
Inputs from external switches or from logic circuitry.
CAN high output pin.
13
High Side Output
Level 0-3 Inputs
14–17
18
L0-L3
CANH
CANL
SCLK
MISO
CAN High Output
CAN Low Output
Serial Data Clock
Master In Slave Out
CAN low output pin.
19
Clock input pin for the Serial Peripheral Interface (SPI).
24
SPI data sent to the MCU by the 33742. When CS is HIGH, the pin is in the high-
impedance state.
25
SPI data received by the 33742.
26
27
MOSI
CS
Master Out Slave In
Chip Select
(Active LOW)
The CS input pin is used with the SPI bus to select the 33742. When the CS is asserted
LOW, the 33742 is the selected device of the SPI bus.
The WDOG output pin is asserted LOW if the software watchdog is not correctly
triggered.
28
Watchdog Output
(Active LOW)
WDOG
33742
Analog Integrated Circuit Device Data
4
Freescale Semiconductor
PIN CONNECTIONS
36 NC
1
NC
SCLK 2
MISO
CANL
35
34
33
32
31
30
29
28
CANH
L3
3
MOSI 4
CS 5
L2
Transparent
Top View
L1
WDOG
RXD
6
7
8
9
L0
HS
TXD
VDD
VSUP
27 V2 CTRL
26 V2
RST 10
INT 11
25
NC
NC
12
Figure 4. 33742 48-Pin Connections
Table 3. 33742 48-Pin Definitions
A functional description of each pin can be found in the Functional Pin description section beginning on page 22.
Pin
Pin Name
NC
Formal Name
No Connect
Definition
No connection.
1, 12-16,
21-25,
36-40,
45-48
Clock input pin for the Serial Peripheral Interface (SPI).
2
3
SCLK
MISO
Serial Data Clock
SPI data sent to the MCU by the 33742. When CS is HIGH, the pin is in the high-
impedance state.
Master In Slave Out
SPI data received by the 33742.
4
5
MOSI
CS
Master Out Slave In
Chip Select
(Active LOW)
The CS input pin is used with the SPI bus to select the 33742. When the CS is asserted
LOW, the 33742 is the selected device of the SPI bus.
The WDOG output pin is asserted LOW if the software watchdog is not correctly
triggered.
6
Watchdog Output
(Active LOW)
WDOG
CAN bus receive data output pin.
7
8
RXD
TXD
VDD
RST
Receive Data
Transmit Data
CAN bus transmit data input pin.
5.0 V regulator output pin. Supply pin for the MCU.
9
Voltage Digital Drain
This is the device reset output pin whose main function is to reset the MCU. This pin has
an internal pull-up current source to VDD.
10
Reset Output
(Active LOW)
This output is asserted LOW when an enabled interrupt condition occurs. The output is
a push-pull structure.
11
INT
Interrupt Output
(Active LOW)
These device ground pins are internally connected to the package lead frame to provide
a 33742-to-PCB thermal path.
17-20
41-44
GND
Ground
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
5
PIN CONNECTIONS
Table 3. 33742 48-Pin Definitions (continued)
A functional description of each pin can be found in the Functional Pin description section beginning on page 22.
Pin
26
Pin Name
V2
Formal Name
Definition
Sense input for the V2 regulator using an external series pass transistor. V2 is also the
internal supply for the CAN transceiver.
Voltage Source 2
Output drive source for the V2 regulator connected to the external series pass
transistor.
27
V2CTRL
Voltage Source 2 Control
Supply input pin for the 33742.
28
29
VSUP
HS
Voltage Supply
High Side Output
Level 0-3 Inputs
CAN High Output
CAN Low Output
Output of the internal high side switch. The output current is internally limited to 150 mA.
Inputs from external switches or from logic circuitry.
CAN high output pin.
30-33
34
L0-L3
CANH
CANL
CAN low output pin.
35
33742
Analog Integrated Circuit Device Data
6
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 4. Maximum Ratings
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
ELECTRICAL RATINGS
Power Supply Voltage at VSUP
Continuous (Steady-state)
VSUP
V
-0.3 to 27
-0.3 to 40
Transient Voltage (Load Dump)
Logic Signals
VLOG
-0.3 to VDD + 0.3
V
(RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and INT)
Output Voltage at VDD
Output Current at VDD
VDD
IDD
0.0 to 5.3
V
A
Internally Limited
HS
Voltage
VHS
IHS
-0.3 to VSUP + 0.3
Internally Limited
V
A
Output Current
ESD Capability, Human Body Model(1)
MC33742 in 28-pin SOIC
HS, L0, L1, L2, L3, CANH, CANL pins
All Other pins
VESD1
V
±4000
±2000
MC33742 in 48-pin QFN
All pins
±2000
±200
ESD Capability, Machine Model(1)
VESD2
V
Input Voltage/Current at L0, L1, L2, L3
DC Input Voltage
VDCIN
IDCIN
-0.3 to 40
±2.0
V
mA
V
DC Input Current
Transient Input Voltage attached to external circuitry(2)
VTRINEC
±100
CANL and CANH
Continuous Voltage
Continuous Current
VCANH/L
ICANH/L
-27 to 40
200
V
mA
CANH and CANL Transient Voltage (Load Dump)(3)
CANH and CANL Transient Voltage(3)
Notes
VLDH/L
VTRH/L
40
V
V
±40
1. Testing done in accordance with the Human Body Model (CZAP=100 pF, RZAP=1500 ), Machine Model (CZAP=200 pF, RZAP=0 ).
2. Testing done in accordance with ISO 7637-1. See Figure 5.
3. Load dump testing done in accordance with ISO 7637-1, Transient test done in accordance with ISO 7637-1. See Figure 6.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
7
ELECTRICAL CHARACTERISTICS
MAXIMUM RATINGS
Table 4. Maximum Ratings (continued)
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or
permanent damage to the device.
Rating
Symbol
Value
Unit
THERMAL RATINGS
Operating Temperature
Ambient
C
TA
TJ
-40 to 125
-40 to 150
Junction
Storage Temperature
Thermal Resistance
TSTG
RJG
-55 to 165
20
C
C/W
C/W
Thermal Resistance Junction Case (QFN)
Power Dissipation(4)
RTJC-RJC
PD
TBD
1.0
W
Peak Package Reflow Temperature During Reflow(6) (7)
,
TPPRT
Note 7
°C
Notes
4. Maximum power dissipation is at 85 °C ambient temperature in free aIr and with no heatsink, according to JEDEC JESD51-2 and
JESD51-3 specifications.
5. The package is not designed for immersion soldering. The maximum soldering time is 10 seconds at 240 C on any pin. Exceeding the
maximum temperature and time limits may cause permanent damage to the device.
6. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may
cause malfunction or permanent damage to the device.
7. Freescale’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow
Temperature and Moisture Sensitivity Levels (MSL), Go to www.freescale.com, search by part number [e.g. remove prefixes/suffixes
and enter the core ID to view all orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.
33742
Transient Pulse
Generator
(Note)
1.0 nF
Lx
10 k
GND
GND
Note Waveform per ISO 7637-1. Test Pulses 1, 2, 3a, and 3b.
Figure 5. Transient Test Setup for L0:L3 Inputs
33742
1.0 nF
CANH
Transient Pulse
Generator
(Note)
CANL
GND
GND
1.0 nF
Note Waveform per ISO 7637-1. Test Pulses 1, 2, 3a, and 3b.
Figure 6. Transient Test Setup for CANH/CANL
33742
Analog Integrated Circuit Device Data
8
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
INPUT PIN (VSUP)
Supply Voltage
VSUP
V
Nominal DC Voltage
5.5
18
4.5
—
—
—
—
—
—
18
27
5.5
40
27
Extended DC Voltage: Full Functionality(8)
Extended DC Voltage: Reduced Functionality(9)
Load Dump
Jump Start
—
Supply Current in Standby Mode(10)
(IOUT at VDD = 40 mA, CAN Recessive or Sleep Mode)
ISUP(STDBY)
ISUP(NORM)
ISUP(SLP-WD)
mA
mA
A
TA 25 C
—
—
42
42
45
45
Supply Current in Normal Mode(10)
(IOUT at VDD = 40 mA, CAN Recessive or Sleep mode)
TA 25 C
Supply Current in Sleep Mode(10)
(VDD and V2 OFF, CAN in Sleep Mode with CAN Wake-up Disabled(11)
)
VSUP < 13.5 V, Oscillator Running(12)
VSUP < 13.5 V, Oscillator Not Running(13)
VSUP = 18 V, Oscillator Running(12)
—
—
—
85
53
105
80
110
140
Supply Current in Sleep Mode(10)
ISUP(SLP-WE)
A
A
(V1 and V2 OFF, VSUP < 13.5 V, Oscillator Not Running(13), CAN in Sleep
Mode with Wake-up Enabled)
TA = -40 C
TA = 25 C
TA = 125 C
—
—
—
80
65
55
—
—
—
Supply Current in Stop Mode(10)
ISUP(STOP-WD)
(IOUT at VDD < 2.0 mA, VDD ON, CAN in Sleep Mode with Wake-up
Disabled(11)
)
VSUP < 13.5 V, Oscillator Running(12)
VSUP < 13.5 V, Oscillator Not Running(13)
VSUP = 18 V, Oscillator Running(12)
—
—
—
—
80
160
160
210
100
Notes
8. All functions and modes available and operating: Watchdog, HS turn ON/turn OFF, CAN transceiver operating, L0:L3 inputs operating,
normal SPI operation. The 33742 may experience an over-temperature fault.
9. At VDD > 4.0 V, RST HIGH if reset 2 selected via SPI. The logic HIGH level will be degraded but the 33742 is functional.
10. Current measured at the VSUP pin.
11. If CAN Module is Sleep-enabled for wake-up, an additional current (ICAN-SLEEP) must be added to specified value.
12. Oscillator running means one of the following function is active: Forced Wake-up or Cyclic Sense or Software Watchdog in Stop mode.
13. Oscillator not running means none of the following functions are active: Forced Wake-up and Cyclic Sense and Software Watchdog in
Stop mode.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
9
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
INPUT PIN (VSUP) (CONTINUED)
Supply Current in Stop Mode(14)
ISUP(STOP-WE)
A
(IOUT at VDD < 2.0 mA, VDD ON, VSUP < 13.5 V, Oscillator Not Running,
CAN in Sleep Mode with Wake-up Enabled)(15)
TA = -40 C
TA = 25 C
TA = 125 C
—
—
—
100
92
—
—
—
80
BATFAIL Flag Internal Threshold
BATFAIL Flag Hysteresis(16)
VBF
1.5
—
3.0
1.0
4.0
—
V
V
V
VBF(HYS)
VBF(EW)
Battery Fall Early Warning Threshold
In Normal and Standby Modes
5.3
0.1
5.8
0.2
6.3
0.3
Battery Fall Early Warning Hysteresis
In Normal and Standby Modes(16)
VBF(EW-HYST)
V
V
OUTPUT PIN (VDD)(17)
VDD Output Voltage (2.0 mA < IV1 < 200 mA)
5.5 V < VSUP < 27 V
VDDOUT
4.9
4.0
5.0
—
5.1
—
4.5 V < VSUP < 5.5 V
Dropout Voltage
IDD = 200 mA
VDDDRP1
V
V
—
—
0.2
0.1
0.5
Dropout Voltage, Limited Output Current and Low VSUP
IDD = 50 mA, 4.5 V < VSUP
VDDDRP2
0.25
Output Current
IDD
TSD
TPW
mA
°C
Internally Limited
200
160
125
285
—
350
200
160
Thermal Shutdown (Junction)
Normal or Standby Mode
Over-temperature Pre-warning (Junction)
VDDTEMP Bit Set
°C
—
Notes
14. Current measured at the VSUP pin.
15. Oscillator not running means none of the following functions are active: Forced Wake-up and Cyclic Sense and Software Watchdog in
Stop mode.
16. Guaranteed by design; it is not production tested.
17. IDD is the total regulator output current. V1 specification with external capacitor. Stability requirement: Capacitance > 47 F, ESR < 1.3
(tantalum capacitor). In Reset, Normal Request, Normal and Standby modes. Measures with capacitance = 47 F tantalum.
33742
Analog Integrated Circuit Device Data
10
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
OUTPUT PIN (VDD) (CONTINUED)(18)
Symbol
Min
Typ
Max
Unit
Temperature Threshold Difference
TSD -TPW
VRSTTH
20
—
40
°C
V
Reset Threshold
Threshold 1, Default Value after Reset, RSTTH Bit Set to Logic [0]
Threshold 2, RSTTH Bit Set to Logic [1]
4.5
4.0
4.6
4.2
4.7
4.3
VDD for Reset Active
VDDR
VDDR
1.0
—
VRSTTH
V
Line Regulation (IDD = 10 mA, Capacitance = 47 F Tantalum at VDD)
9.0 V < VSUP < 18 V
mV
—
—
5.0
10
25
25
5.5 V < VSUP < 27 V
Load Regulation (Capacitance = 47 F Tantalum at V1)
VLD
mV
mV
1.0 mA < IDD < 200 mA
—
—
25
30
75
50
Thermal Stability
VTHERM-S
VSUP = 13.5 V, IDD = 100 mA(19)
OUTPUT PIN IN STOP MODE (VDD)(18)
VDD Output Voltage
IDD 2.0 mA
V
VDDSTOP
4.75
4.75
5.0
5.0
5.25
5.25
IDD 10 mA
IDD Output Current to Wake-up
10
17
25
mA
V
IDDS-WU
Reset Threshold(18)
VRST-STOP
Threshold 1, Default Value after Reset, RSTTH Bit Set to Logic [0]
Threshold 2, RSTTH Bit Set to Logic [1]
4.5
4.1
4.6
4.2
4.7
4.3
Line Regulation (Capacitance = 47 F Tantalum at VDD)
VLR-STOP
mV
mV
5.5 V < VSUP < 27 V, IDD = 2.0 mA
—
—
5.0
15
25
75
Load Regulation (Capacitance = 47 F Tantalum at V1)
VLD-STOP
1.0 mA < IDD < 10 mA
Notes
18. IDD is the total regulator output current. VDD specification with external capacitor. Stability requirement: capacitance > 47 F,
ESR < 1.3 (tantalum capacitor). In Reset, Normal Request, Normal and Standby modes, measures with capacitance = 47 F
tantalum.Selectable by RSTTH bit in SPI Register Reset Control Register (RCR).
19. Guaranteed by characterization and design; it is not production tested.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
11
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
TRACKING VOLTAGE REGULATOR (V2)(20)
V2 Output Voltage (Capacitance = 10 F Tantalum at V2)
2.0 mA IV2 200 mA, 5.5 V < VSUP < 27 V
VDD
V2
0.99
200
1.0
—
1.01
—
IV2 Output Current (for Information Only)
Depending on External Ballast Transistor
mA
mA
IV2
V2 Control Drive Current Capability(21)
Worst Case at TJ = 125 °C
IV2CTRL
0.0
—
10
V2LOW Flag Threshold
3.75
4.0
4.25
V
V2LTH
LOGIC OUTPUT PIN (MISO)(22)
Low-level Output Voltage
IOUT = 1.5 mA
VOL
VOH
IHZ
V
V
0.0
VDD-0.9
-2.0
—
—
—
1.0
VDD
2.0
High-level Output Voltage
IOUT = -250 A
Tri-stated MISO Leakage Current
0 V < VMISO < VDD
A
LOGIC INPUT PINS (MOSI, SCLK, CS)
High-level Input Voltage
VIH
VIL
IIH
0.7 VDD
-0.3
—
—
VDD + 0.3
0.3 VDD
V
V
Low-level Input Voltage
High-level Input Current on CS
VIN = 4.0 V
A
-100
-100
-10
—
—
—
-20
-20
10
Low-level Input Current on CS
VIN = 1.0 V
A
A
IIL
MOSI and SCLK Input Current
0 V < VIN < VDD
IIN
OUTPUT PIN (RST)(23)
High-level Output Current
0 V < VOUT < 0.7 VDD
IOH
A
-300
-250
-150
Low-level Output Voltage
VOL
V
IO = 1.5 mA, 5.5 V < VSUP < 27 V
IO = 0 mA, 1.0 V <VSUP < 5.5 V
0.0
0.0
—
—
0.9
0.9
RST Pull-down Current
V > 0.9 V
IPDW
mA
2.3
—
5.0
Notes
20. V2 specification with external capacitor. Stability requirement: capacitance > 42 F and ESR < 1.3 (tantalum capacitor), external
resistor between base and emitter required. Measurement conditions: ballast transistor MJD32C, capacitance > 10 F tantalum, 2.2 k
resistor between base and emitter of ballast transistor.
21. The guaranteed V2CTRL current capability is 10 mA. No active current limiting is used so the actual available current may be higher.
22. Push-pull structure with tri-state condition (CS HIGH).
23. Output pin only. Supply from VDD. Structure switch to ground with pull-up current source.
33742
Analog Integrated Circuit Device Data
12
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
OUTPUT PIN (WDOG)(24)
Low-level Output Voltage
VOL
V
V
IO = 1.5 mA, 1.0 V < VSUP < 27 V
0.0
—
—
0.9
High-level Output Voltage
VOH
IO = -250 A
VDD-0.9
VDD
OUTPUT PIN (INT)(24)
Low-level Output Voltage
IO = 1.5 mA
VOL
V
V
0.0
—
—
0.9
High-level Output Voltage
VOH
IO = -250 A
VDD -0.9
VDD
OUTPUT PIN (HS)
Driver Output ON Resistance
RDS(ON)
TA = 25 °C, IOUT - 150 mA, VSUP > 9.0 V
TA = 125 °C, IOUT - 150 mA, VSUP > 9.0 V
TA = 125 °C, IOUT - 120 mA, 5.5 V < VSUP < 9.0 V
—
—
—
2.0
—
2.5
4.5
5.5
3.5
Output Current Limitation
VSUP -VHS > 1.0 V
ILIM
mA
160
—
500
HS Thermal Shutdown
HS Leakage Current
TSD
ILEAK
VCL
155
—
—
—
190
10
°C
A
V
Output Clamp Voltage
IOUT = -10 mA, No Inductive Load Drive Capability
-1.5
—
-0.3
INPUT PINS (L0, L1, L2, AND L3)
Low-voltage Detection Threshold
5.5 V < VSUP < 6.0 V
VTHL
V
V
2.0
2.5
2.7
2.5
3.0
3.2
3.0
3.6
3.7
6.0 V < VSUP < 18 V
18 V < VSUP < 27 V
High-voltage Detection Threshold
5.5 V < VSUP < 6.0 V
VTHH
2.7
3.0
3.5
3.3
4.0
4.2
3.8
4.6
4.7
6.0 V < VSUP < 18 V
18 V < VSUP < 27 V
Hysteresis
VHYS
V
5.5 V < VSUP < 27 V
0.6
-10
—
—
1.3
10
Input Current
IIN
A
-0.2 V < VIN < 40 V
Notes
24. Push-pull structure.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
13
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
CAN TRANSCEIVER CURRENT
Symbol
Min
Typ
Max
Unit
Supply Current of CAN Module
IRES
IDOM
ICAN-SLEEP
IDIS
CAN in Normal mode, Bus Recessive State
—
—
—
—
1.3
1.5
12
—
3.0
3.5
24
mA
mA
A
CAN in Normal mode, Bus Dominant State without Bus Load
CAN in Sleep State, Wake-up Enabled, V2 Regulator OFF
CAN in Sleep State, Wake-up Disabled, V2 Regulator OFF(25)
1.0
A
PINS (CANH AND CANL)
Bus Pin Common Mode Voltage
VCM
-27
—
40
V
Differential Input Voltage (Common Mode Between -3.0 V and 7.0 V)
Recessive State at RXD
VCANH-VCANL
mV
—
—
—
500
—
Dominant State at RXD
900
Differential Input Hysteresis (RXD)
VHYS
RIN
100
—
—
mV
Input Resistance
28-pin SOIC
48-pin QFN
k
5.0
5.0
—
—
100
50
Differential Input Resistance
RIND
10
—
100
k
CANH Output Voltage
TXD Dominant State
TXD Recessive State
VCANH
V
2.75
—
—
—
4.5
3.0
CANL Output Voltage
TXD Dominant State
TXD Recessive State
VCANL
V
0.5
2.0
—
—
2.25
—
Differential Output Voltage
TXD Dominant State
VoH-VoL
1.5
—
—
—
3.0
V
TXD Recessive State
100
mV
Output Current Capability (Dominant State)
mA
ICANH
ICANL
CANH
CANL
—
—
—
-35
—
35
Over-temperature Shutdown
TSD
160
180
—
°C
CANL Over-current Detection(26)
mA
ICANL/OC
ICANH/OC
CANL
CANH
60
—
—
200
-60
-200
CANH and CANL Input Current, Device Supplied
(CAN Sleep mode with CAN Wake-up Enabled or Disabled)
ICAN1
A
VCANH, VCANL from 0 V to 5.0 V
VCANH, VCANL = -2.0 V
—
-60
—
3.0
-50
60
10
—
75
VCANH, VCANL = 7.0 V
Notes
25. Guaranteed by design; it is not production tested.
26. Reported in CAN register. For a description of the contents of the CAN register, refer to CAN Register (CAN) on page 49
33742
Analog Integrated Circuit Device Data
14
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
STATIC ELECTRICAL CHARACTERISTICS
Table 5. Static Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
PINS (CANH AND CANL) (CONTINUED)
Symbol
Min
Typ
Max
Unit
CANH and CANL Input Current, Device Unsupplied
VCANH, VCANL = 2.5 V
ICAN2
A
—
-60
—
40
100
—
VCANH, VCANL = -2.0 V
-50
190
240
VCANH, VCANL = 7.0 V
DIAGNOSTIC INFORMATION (CANH AND CANL)
CANL to GND Threshold
VLG
VHG
—
—
—
—
—
—
1.75
—
—
—
—
—
—
V
V
CANH to GND Threshold
1.75
CANL to VSUP Threshold
VLVB
VHVB
VL5
VSUP -2.0
VSUP -2.0
VDD-0.43
VDD -0.43
V
CANH to VSUP Threshold
V
CANL to VDD Threshold
V
CANH to VDD Threshold
VH5
V
RXD Weak Pull-down Current Source(27)
RXD Permanent Dominant Failure Condition
IRXDW
A
—
100
—
PINS (TXD AND RXD)
TXD Input High-voltage
TXD Input Low-voltage
VIH
VIL
IIH
0.7 VDD
-0.4
—
—
VDD + 0.4
0.3 VDD
V
V
TXD High-level Input Current
VTXD = V2
A
-10
-150
—
-100
—
10
-50
—
TXD Low-level Input Current
VTXD = 0 V
IIL
A
V
RXD Output High Voltage(28)
VOH
IRXD = 250 A
VDD -1.0
RXD Output Low-voltage
IRXD = 1.0 mA
VOL
V
—
—
0.5
Notes
27. Guaranteed by design; it is not production tested.
28. RXD is a push-pull structure between the V2 pin and GND.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
15
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 6. Dynamic Electrical Characteristics
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
DIGITAL INTERFACE TIMING (SCLK, CS, MOSI, MISO)(29)
SPI Operation Frequency
fREQ
tPCLK
tWSCLKH
tWSCLKL
tLEAD
tLAG
0.25
250
125
125
100
100
40
—
—
—
—
—
—
—
—
4.0
N/A
N/A
N/A
N/A
N/A
N/A
N/A
MHz
ns
SCLK Clock Period
SCLK Clock High Time
ns
SCLK Clock Low Time
ns
Falling Edge of CS to Rising Edge of SCLK
Falling Edge of SCLK to Rising Edge of CS
MOSI to Falling Edge of SCLK
Falling Edge of SCLK to MOSI
ns
ns
tSISU
ns
tSIH
40
ns
MISO Rise Time(30)
CL = 220 pF
tRSO
ns
—
—
25
25
50
50
MISO Fall Time(30)
CL = 220 pF
tFSO
ns
ns
Time from Falling or Rising Edges of CS
MISO Low-impedance
tSOEN
tSODIS
—
—
—
—
50
50
MISO High-impedance
Time from Rising Edge of SCLK to MISO Data Valid
tVALID
ns
0.2 VDD MISO 0.8 VDD, CL = 200 pF
—
—
—
50
34
STATE MACHINE TIMING (CS, SCLK, MOSI, MISO, WDOG, INT)
Delay Between CS LOW-to-HIGH Transition (at End of SPI Stop Command)
and Stop mode Activation(31)
tCS-STOP
s
s
18
Interrupt Low-level Duration
Stop Mode
tINT
7.0
—
10
13
—
Internal Oscillator Frequency(32)
fOSC
100
kHz
Notes
29. See Figure 7, SPI Timing Diagram, page 20.
30. Not production tested. Guaranteed by design.
31. Not production tested. Guaranteed by design. Detected by V2 OFF.
32. fOSC is indirectly measured (1.0 ms reset) and trimmed.
33742
Analog Integrated Circuit Device Data
16
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 6. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
STATE MACHINE TIMING (CS, SCLK, MOSI, MISO, WDOG, INT) (CONTINUED)
Watchdog Period Normal and Standby Modes
tWDOG
ms
28-pin SOIC
Period 1
Period 2
Period 3
Period 4
48-pin QFN
Period 1
Period 2
Period 3
Period 4
8.58
39.6
88
9.75
45
10.92
50.4
112
100
350
308
392
8.3
38.5
86
9.75
45
10.92
50.4
112
100
350
300
392
Normal Request Mode Timeout
28-pin SOIC
tNRTOUT
ms
ms
308
300
350
350
392
392
48-pin QFN
Watchdog Period Stop Mode
tWD-STOP
Period 1
Period 2
Period 3
Period 4
6.82
31.5
70
9.75
45
12.7
58.5
130
455
100
350
245
Watchdog Period Accuracy
Normal and Standby Modes
Stop Mode
tACC
%
-12
-30
—
—
12
30
Cyclic Sense/FWU Timing Sleep and Stop Modes
tCSFWU
ms
Timing 1
Timing 2
Timing 3
Timing 4
Timing 5
Timing 6
Timing 7
Timing 8
3.22
6.47
12.9
25.9
51.8
66.8
134
4.6
9.25
18.5
37
5.98
12
24
48.1
96.2
124
248
504
74
95.5
191
388
271
Cyclic Sense ON Time
Sleep and Stop modes.
tON
s
200
-30
350
—
500
30
Cyclic Sense/FWU Timing Accuracy
Sleep and Stop modes
tACC
%
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
17
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 6. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
STATE MACHINE TIMING (CS, SCLK, MOSI, MISO, WDOG, INT) (CONTINUED)
Delay Between SPI Command and HS Turn ON(33)
Normal or Standby mode, VSUP > 9.0 V
tS-HSON
—
—
—
—
s
s
22
22
Delay Between SPI Command and HS Turn OFF(33)
Normal or Standby mode, VSUP > 9.0 V
tS-HSOFF
Delay Between SPI and V2 Turn ON(33)
Standby mode
tS-V2ON
tS-V2OFF
tS-NR2N
s
s
s
9.0
9.0
—
—
22
22
Delay Between SPI and V2 Turn OFF(33)
Normal mode
Delay Between Normal Request and Normal mode After Watchdog Trigger
Command(33)
15
35
70
Normal Request mode
STATE MACHINE TIMING (CS, SCLK, MOSI, MISO, WDOG, INT) (CONTINUED)
Delay Between SPI and CAN Normal mode(34)
Normal mode(35)
tS-CAN_N
s
s
s
—
—
—
—
10
10
Delay Between SPI and CAN Sleep Mode(34)
Normal mode (35)
tS-CAN_S
Delay Between CS Wake-up (CS LOW to HIGH) and Device in Normal
Request mode (VDD ON and RST HIGH)
tW-CS
Stop mode
15
90
40
—
90
Delay Between CS Wake-up (CS LOW to HIGH) and First Accepted SPI
Command
tW-SPI
s
Device in Stop mode After Wake-up
N/A
Delay Between INT Pulse and First SPI Command Accepted
Device in Stop mode After Wake-up
tS-1STSPI
s
s
20
25
—
—
N/A
—
Delay Between Two SPI Messages Addressing the Same Register
t2SPI
OUTPUT PIN (VDD)
Reset Delay Time
s
s
tD
Measured at 50% of Reset Signal
4.0
40
—
30
75
IDD Over-current to Wake-up Deglitcher Time(35)
55
tIDD-DGLT
Notes
33. Delay starts at falling edge of clock cycle #8 of the SPI command and start of “Turn ON” or “Turn OFF” of HS or V2.
34. Delay starts at falling edge of clock cycle #8 of the SPI command and start of “Turn ON” or “Turn OFF” of HS or V2.
35. Guaranteed by design; it is not production tested.
33742
Analog Integrated Circuit Device Data
18
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
DYNAMIC ELECTRICAL CHARACTERISTICS
Table 6. Dynamic Electrical Characteristics (continued)
Characteristics noted under conditions 4.75 V V2 5.25 V, 5.5 V VSUP 18 V, and -40 C TA 125 C. Typical values
noted reflect the approximate parameter mean at TA = 25 C under nominal conditions, unless otherwise noted.
Characteristic
Symbol
Min
Typ
Max
Unit
OUTPUT PIN (RST)
Reset Duration After VDD HIGH
ms
33742
tRST
12
15
18
DUR
33742S
tRSTDURS
3.0
3.5
4.0
INPUT PINS (L0, L1, L2, AND L3)
Wake-up Filter Time
tWUF
8.0
20
38
s
CAN MODULE–SIGNAL EDGE RISE AND FALL TIMES (CANH, CANL)
Dominant State Timeout
tDOUT
tLRD
200
360
520
s
Propagation Loop Delay TXD to RXD (Recessive to Dominant)(36)
ns
60
70
100
110
130
200
210
225
255
310
Slew Rate 3
Slew Rate 2
Slew Rate 1
Slew Rate 0
80
110
Propagation Delay TXD to CAN (Recessive to Dominant)(37)
tTRD
ns
20
25
35
50
65
80
110
150
200
300
Slew Rate 3
Slew Rate 2
Slew Rate 1
Slew Rate 0
100
160
Propagation Delay CAN to RXD (Recessive to Dominant)(38)
tRRD
tLDR
10
50
140
ns
ns
Propagation Loop Delay TXD to RXD (Dominant to Recessive)(36)
100
120
140
250
150
165
200
340
200
220
250
410
Slew Rate 3
Slew Rate 2
Slew Rate 1
Slew Rate 0
Propagation Delay TXD to CAN (Dominant to Recessive)(37)
tTDR
ns
Slew Rate 3
Slew Rate 2
Slew Rate 1
Slew Rate 0
60
65
125
150
180
310
150
190
250
460
75
200
Propagation Delay CAN to RXD (Dominant to Recessive)(38)
tRDR
20
30
60
ns
Non-Differential Slew Rate (CANL or CANH)
V/s
Slew Rate 3
Slew Rate 2
Slew Rate 1
Slew Rate 0
tSL3
tSL2
tSL1
tSL0
4.0
3.0
2.0
1.0
19
13.5
8.0
40
20
15
10
5.0
Bus Communication Rate
tBUS
60k
—
1.0M
bps
36. See Figure 8, page 20.
37. See Figure 9, page 20.
38. See Figure 10, page 21.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
19
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
TIMING DIAGRAMS
tPCLK
CS
tWSCLKH
tLEAD
tLAG
SCLK
tWSCLKL
tSISU
tSIH
MOSI
MISO
Undefined
tVALID
DI 0
Don’t Care
DI 8
Don’t Care
tSODIS
tSOEN
DO 0
DO 8
Note Incoming data at MOSI pin is sampled by the 33742 at SCLK falling edge. Outgoing data at MISO pin
is set by the 33742 at SCLK rising edge (after tVALID delay time).
Figure 7. SPI Timing Diagram
t
LRD
2.0 V
TXD
RXD
0.8 V
t
LDR
2.0 V
0.8 V
Figure 8. Propagation Loop Delay TXD to RXD
t
TRD
2.0 V
TXD
0.8 V
t
TDR
0.9 V
V
DIFF
0.5 V
VDIFF = VCANH - VCANL
Figure 9. Propagation Delay TXD to CAN
33742
Analog Integrated Circuit Device Data
20
Freescale Semiconductor
ELECTRICAL CHARACTERISTICS
TIMING DIAGRAMS
t
RDR
0.9 V
V
DIFF
0.5 V
t
RRD
2.0 V
RXD
0.8 V
Figure 10. Propagation Delay CAN to RXD
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
21
FUNCTIONAL DESCRIPTION
INTRODUCTION
FUNCTIONAL DESCRIPTION
INTRODUCTION
The 33742 and the 33742S are system basis chips (SBCs) dedicated to automotive applications. Their functions include the
following:
• One fully protected 5.0 V voltage regulator with 200 mA total output current capability available at the VDD pin.
• VDD regulator under-voltage reset function, programmable window or time-out software watchdog function.
• Internal driver (V2) for an external series pass transistor to implement a second 5.0 V voltage regulator.
• Two running modes: Normal and Standby modes set by the system microcontroller.
• Sleep and Stop modes low power operating modes to reduce an application’s current consumption while providing a wake-
up capability from the CAN interface, L3:L0 wake-up inputs, or from a timer wake-up.
• Programmable wake-up input and cyclic sense wake-ups.
• CAN high-speed physical bus interface with TXD and RXD fault diagnostic capability and enhanced protection features.
• An SPI interface for use in communicating with a MCU and Interrupt outputs to report SBC status, perform diagnostics, and
report wake-up events.
FUNCTIONAL PIN DESCRIPTION
RECEIVE AND TRANSMIT DATA (RXD AND TXD)
The RXD and TXD pins (receive data and transmit data pins, respectively) are connected to a microcontroller’s CAN protocol
handler. TXD is an input and controls the CANH and CANL line state (dominant when TXD is LOW, recessive when TXD is
HIGH). RXD is an output and reports the bus state (RXD LOW when CAN bus is dominant, HIGH when CAN bus is recessive).
The RXD terminal is a push-pull structure between the V2 pin and GND.
Voltage Digital Drain (VDD)
The VDD pin is the output pin of the 5.0 V internal regulator. It can deliver up to 200 mA. This output is protected against over-
current and over-temperature. It includes an over-temperature pre-warning flag, which is set when the internal regulator
temperature exceeds 130 °C typical. When the temperature exceeds the over-temperature shutdown (170 °C typical), the
regulator is turned off.
VDD includes an under-voltage reset circuitry, which sets the RST pin LOW when VDD is below the under-voltage reset
threshold.
RESET OUTPUT (RST)
The RESET pin RST, is an output that is set LOW when the device is in reset mode. The RST pin is set HIGH when the device
is not in reset mode. RST includes an internal pull-up current source. When RST is LOW, the sink current capability is limited,
allowing RST to be shorted to 5.0 V for software debug or software download purposes.
INTERRUPT OUTPUT (INT)
The Interrupt pin INT, is an output that is set LOW when an interrupt occurs. INT is enabled using the Interrupt Register (INTR).
When an interrupt occurs, INT stays LOW until the interrupt source is cleared.
INT output also reports a wake-up event by a 10 s typical pulse when the device is in Stop mode.
VOLTAGE SOURCE 2 (V2)
The V2 pin is the input sense for the V2 regulator. It is connected to the external series pass transistor. V2 is also the 5.0 V
supply of the internal CAN interface. It is possible to connect V2 to an external 5.0 V regulator or to the VDD output when no
external series pass transistor is used. In this case, the V2CTRL pin must be left open. Refer to Figure 31, SBC Typical
Application Schematic, page 57.
VOLTAGE SOURCE 2 CONTROL (V2CTRL)
The V2CTRL pin is the output drive pin for the V2 regulator connected to the external series pass transistor.
33742
Analog Integrated Circuit Device Data
22
Freescale Semiconductor
FUNCTIONAL DESCRIPTION
FUNCTIONAL PIN DESCRIPTION
VOLTAGE SUPPLY (VSUP)
The VSUP pin is the battery supply input of the device.
HIGH SIDE OUTPUT (HS)
The HS pin is the internal high side driver output. It is internally protected against over-current and over-temperature.
LEVEL 0-3 INPUTS (L0: L3)
The L0:L3 pins can be connected to contact switches or the output of other ICs for external inputs. The input states can be
read by SPI. These inputs can be used as wake-up events for the SBC when operating in the Sleep or Stop mode.
CAN HIGH AND CAN LOW OUTPUTS (CANH AND CANL)
The CAN High and CAN Low pins are the interfaces to the CAN bus lines. They are controlled by TXD input level, and the
state of CANH and CANL is reported through RXD output. A 60 termination resistor is connected between CANH and CANL
pins.
SERIAL DATA CLOCK (SCLK)
SCLK is the Serial Data Clock input pin of the serial peripheral interface.
MASTER IN SLAVE OUT (MISO)
MISO is the Master In Slave Out pin of the serial peripheral interface. Data is sent from the SBC to the microcontroller through
the MISO pin.
MASTER OUT SLAVE IN (MOSI)
MOSI is the Master Out Slave In pin of the serial peripheral interface. Control data from a microcontroller is received through
this pin.
CHIP SELECT (CS)
CS is the Chip Select pin of the serial peripheral interface. When this pin is LOW, the SPI port of the device is selected.
WATCHDOG OUTPUT (WDOG)
The Watchdog output pin is asserted LOW to flag that the software watchdog has not been properly triggered.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
23
FUNCTIONAL DESCRIPTION
FUNCTIONAL INTERNAL BLOCK DESCRIPTION
FUNCTIONAL INTERNAL BLOCK DESCRIPTION
MC33742 - Functional Block Diagram
Outputs
Integrated Supply
5.0V Linear
VSUP Control & Monitor
Regulator (LDO)
Analog Circuitry
5.0V Regulator
Base PNP Drive
Oscillator
Mode Control
Programmable Wake-up
High-side
Switch
MCU Interface
SPI Interface
Reset & INT
CAN Physical Layer
Interface
CAN Interface / Control
Watchdog Timer
Integrated Supply
Analog Circuitry
MCU Interface
Outputs
OUTPUTS
5.0 V LINEAR REGULATOR (LDO)
This low dropout linear regulator (V1) outputs a regulated 5.0 V at 200 mA. The associated monitoring circuit provides
detection of under-voltage, over-current, and short-circuit conditions, as well as over-temperature and a reset function.
5.0 V REGULATOR BASE PNP DRIVE
The V2 linear regulator control circuitry provides drive for an external series pass transistor (PNP type). The 5.0 V output tracks
the V1 regulator
HIGH SIDE SWITCH
The high switch provides a 2.0 ohm (typ.) RDSON MOSFET driver connected to the VSUP pin. The output is protected against
short-circuit conditions and provides over-temperature shutdown.
CAN PHYSICAL LAYER INTERFACE
This circuitry provides communication between the TXD & RXD pins, from/to the MCU, and the CANL & CANH pins of the
CAN physical interface. The various modes of the CAN interface are controlled through the SPI control registers.
INTEGRATED SUPPLY
VSUP CONTROL & MONITOR
This circuitry protects the IC from transient conditions such as vehicle jump-start (27 V) and load dump (40 V). If the VSUP
voltage falls below 3.0 V (or a 6.0 V warning interrupt), an under-voltage detection is reported.
33742
Analog Integrated Circuit Device Data
24
Freescale Semiconductor
FUNCTIONAL DESCRIPTION
FUNCTIONAL INTERNAL BLOCK DESCRIPTION
ANALOG CIRCUITRY
OSCILLATOR
This circuit is used to generate the internal timings for reset, watchdog, cyclic wake-up, filtering time, etc.
MODE CONTROL
The 4 operating modes of the IC are controlled through the SPI control registers. There are also several special modes
possible.
PROGRAMMABLE WAKE-UP
The 4 inputs are used in conjunction with various SPI control register bits to determine the wake-up conditions and the reaction
of the IC. They can be connected to contact switches or other ICs.
MCU INTERFACE
SPI INTERFACE
The IC and the MCU communicate using the SPI control and status reporting registers. The clock speed (SCLK) can be as
high as 4.0 MHz.
RESET & INT
These 2 outputs notify the MCU when the IC is in reset mode, or when an enabled interrupt condition has occurred.
WATCHDOG TIMER
The timer can be used as a watchdog window or watchdog timeout function. The SPI control register provide the choice as
well as the timeout value. When the watchdog timer is not properly serviced by the MCU, an error signal (WDOGN low) and a
reset signal (RSTN low) are output.
CAN INTERFACE/CONTROL
The operation of the CAN interface is controlled by the MCU through the use of SPI control register bits.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
25
FUNCTIONAL DEVICE OPERATION
FUNCTIONAL INTERNAL BLOCK DESCRIPTION
FUNCTIONAL DEVICE OPERATION
SUPPLY VOLTAGE AT VSUP
The 33742 receives its operating voltage via the VSUP pin. An external diode is needed in series with the VSUP pin and the
supply voltage to protect the SBC against negative transients or from a reverse battery situation that can occur in a vehicle
application. The 33742 will operate from a supply voltage input as low as 4.5 VDC to as high as 27 VDC. The later voltage is
often encountered during a vehicle jump-start.
The VSUP pin can tolerate automotive transient conditions such as load dump to 40 V. The SBC is able to detect when VSUP
falls below 3.0 V typical. This under-voltage state is detected and retained in the parts Mode Control Register (MCR) as the
BATFAIL bit. This detection capability is available across all operating modes.
Note For a detailed description of all the registers mentioned in this section, refer to the section titled SPI Interface And
Register Description beginning on page 46.
The SBC incorporates a VSUP level early warning function, which provides a maskable interrupt if the VSUP voltage level falls
below 6.0 V typical. Hysteresis is used to reduce false detections. The early warning function works only in Normal and Standby
operation modes. An under-voltage at the VSUP pin is reported in the Input/Output Register (IOR).
VDD REGULATOR
The VDD regulator provides a 5.0 V low dropout voltage capable of supplying up to 200 mA with monitoring circuitry for under-
voltage detection and a reset function. The VDD regulator is protected against over-current and short-circuit conditions. It has
over-temperature detection and will set warning flags (bit VDDTEMP in the MCR and INTR registers) and has over-temperature
shutdown with hysteresis.
V2 REGULATOR
The V2 regulator feature provides for a second 5.0 VDC voltage source The internal V2 circuitry will drive an external series
pass transistor, substantially increasing the available supply current. Two pins, the V2 and the V2CTRL, are used to sense and
drive the series pass transistor. The output voltage is 5.0 V and tracks the VDD regulator. The MJD32C transistor is
recommended for use as the external pass device. Other PNP transistors can be used but depending on the device’s gain, an
external resistor-capacitor network might be needed. V2 is also the supply voltage for the on-board CAN module. An under-
voltage condition for the V2 voltage is reported in the IOR Register (bit V2LOW set to logic [1] if V2 falls below 4.0 V typical).
HS VSUP SWITCH OUTPUT
The HS output is a 2.0 typical switch tied to the VSUP pin. It can power or bias external switches and their associated pull-
up or put-downs or other circuitry. An example is biasing a set of switches connected to the L0:L3 wake-up input pins. The HS
VSUP output current is limited to 200 mA and is protected against short-circuits conditions and will report an over-temperature
shutdown condition (bit HSOT in the IOR register and bit HSOT-V2LOW in the INTR register).
The HS output “on” state is set by the HSON bit in the IOR register. A cyclic mode of operation can be implemented using an
internal timer in the Sleep and Stop operating modes. It can also be turned on in Normal or Standby modes to drive loads or
supply peripheral components. No internal protection circuitry is provided, however. Dedicated chip protection circuitry is required
for inductive load applications. The HS output pin should not go below -0.3 V.
BATTERY FAIL EARLY WARNING
Refer to the previous discussion under the heading, Supply Voltage at VSUP.
INTERNAL CLOCK
The 33742 has an internal clock used to generate all timings (reset, watchdog, cyclic wake-up, filtering time, etc.). There are
two on-board oscillators: a higher accuracy (±12 percent) oscillator used in Normal Request, Normal, and Standby modes, and
a lower accuracy (±30 percent) oscillator used during Sleep and Stop modes.
33742
Analog Integrated Circuit Device Data
26
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
OPERATIONAL MODES
INTRODUCTION
The 33742 has four modes of operation, all controllable via the SPI. The modes are Standby, Normal, Stop, and Sleep. An
additional temporary mode called Normal Request mode is automatically accessed by the device after reset or wake-up from
Stop mode. A Reset mode is also implemented. Special modes and configurations are possible for debug and program
microcontroller flash memory.
Table , page 28, offers a summary of the functional modes.
STANDBY MODE
In Standby mode only the VDD regulator is ON. The V2 regulator is turned OFF by disabling the V2CTRL pin. Other functions
available are the L0:L3 inputs read through via the SPI and HS output activation.
The CAN interface is not able to send messages. If a CAN message is received, the CANWU bit is set. The watchdog timer
is running.
NORMAL MODE
In Normal mode, both the VDD and V2 regulators are in the ON state. All functions are available in this operating mode
(watchdog, wake-up input reading through SPI, HS activation, and CAN communication). The watchdog timer is running and
must be periodically cleared through SPI.
STOP MODE
The V2 regulator is turned OFF by disabling the V2CTRL pin. The VDD regulator is activated in a special low power mode
supplying only a few mA of current. This maintains “keep alive” power for the application’s MCU while the MCU is in a power-
saving state (i.e., a MCU’s version of Stop or Wait). In the Stop mode, the supply current available from VSUP pin is very low.
Both parts (the SBC or the MCU) can be awakened from either the 33742 side (for example, cyclic sense, forced wake-up,
CAN message, wake-up inputs, and over-current on VDD) or from the MCU side (key wake-up, etc.).
Stop mode is always selected via SPI. In Stop mode, the watchdog software may be either running or not running depending
upon selection by SPI (Reset Control Register [RCR], bit WDSTOP). To clear a running watchdog timer, the SBC must be
awakened using the CS pin (SPI wake-up). In Stop mode, wake-up is identical to that in Sleep mode, with the addition of CS and
VDD over-current wake-up. Refer to Table , page 28.
SLEEP MODE
In Sleep mode, the VDD and V2 regulators are OFF. Current consumption from the VSUP pin is cut. In Sleep mode, the SBC
can be awakened by sensing individual level individual level changes in the L0:L3 inputs, by cyclic checking of the L0:L3 inputs,
by the forced wake-up timer, or from the CAN physical interface upon receiving a CAN message. When a wake-up occurs, the
SBC goes first into the Reset mode before entering Normal Request mode.
RESET MODE
In the Reset mode, the RST pin is LOW and a timer runs for tRSTDUR time. After tRSTDUR has elapsed, the 33742 enters the
Normal Request operating mode. The Reset mode is entered if a reset condition occurs (VDD LOW, watchdog time-out, or
watchdog trigger in a closed window).
NORMAL REQUEST MODE
The Normal Request mode is a temporary operating mode automatically entered by the SBC after the Reset mode or after the
33742 wakes up from the Stop mode.
After a wake-up from the Sleep mode or after a device power-up, the SBC enters the Reset mode prior to entering the Normal
Request mode. After a wake-up from the Stop mode, the 33742 enters the Normal Request mode directly.
In Normal Request mode, the VDD regulator is ON, the V2 regulator is OFF, and the RST pin is HIGH. As soon as the SBC
enters the Normal Request mode, an internal 350ms timer is started (parameter tNRTOUT). During this time, the application’s MCU
must address the 33742 via SPI and configure the TIM1 sub register to select the watchdog period. This is required of the SBC
to stop the 350 ms watchdog timer and enter the Normal or Standby mode and to set the watchdog timer configuration.
33742
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Freescale Semiconductor
27
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
NORMAL REQUEST ENTERED AND NO WATCHDOG CONFIGURATION OCCURS
If the Normal Request mode is entered after the SBC powers up or after a wake-up from Stop mode and no watchdog
configuration occurs before the 350 ms time period has expired, the device enters the Reset mode. If no watchdog configuration
is performed, the 33742 will cycle from the Normal Request mode to Reset mode to Normal Request mode.
If the Normal Request mode is entered after a wake-up from Sleep mode, and no watchdog configuration occurs while the
33742S is in Normal Request mode, the SBC returns to the Sleep mode.
Table 7. Table of Operations
Wake-up
Voltage Regulator
HS Switch
Watchdog
Software
Mode
Capabilities
(if Enabled)
RST Pin
INT Pin
CAN Cell
Normal
Request
VDD: ON,
V2: OFF,
HS: OFF
–
Low for tRSTDUR time,
then HIGH
–
–
–
Normal
VDD: ON,
V2: ON,
HS: Controllable
–
Normally HIGH.
Active LOW if WDOG
or VDD under-voltage
occurs
If enabled, signal
failure (VDD
Pre-warning
Running
TXD/RXD
Low power
Temp, CAN, HS)
Standby
Stop
VDD: ON,
V2: OFF,
HS: Controllable
–
Same as Normal
mode
Same as Normal
mode
Running
VDD: ON
(Limited Current
Capability),
CAN, SPI, L0:L3,
Cyclic Sense,
Forced Wake-up,
Normally HIGH.
Active LOW if
WDOG(41)
Signal 33742S
wake-up and
Running if
enabled.
Not running if
disabled
Low power.
Wake-up capability
if enabled
I
DD > IDDS-WU
V2: OFF,
HS:OFF or Cyclic Sense
I
DD Over-current(40) orVDDunder-voltage (not maskable)
occurs
Sleep
VDD: OFF,
V2: OFF,
HS: OFF or Cyclic
CAN, SPI,
L0:L3, Cyclic Sense
Forced Wake-up
LOW
Not Active
Not running
Low power.
Wake-up capability
if enabled
Normal
Same as Normal
Same as Standby
Same as Stop
–
Normally HIGH.
Active LOW if VDD
under-voltage occurs
Same as Normal Not running
Same as Normal
Debug(39)
Standby
–
Normally HIGH.
Active LOW if VDD
under-voltage occurs
Same as Standby Not running Same as Standby
Debug(39)
Stop
Same as Stop
Normally HIGH.
Active LOW if VDD
under-voltage occurs
Same as Stop
Not operating
Not running
Same as Stop
Not operating
Debug(39)
Flash
Forced externally
–
Not operating
Not operating
Programming
Notes
39. Mode entered via special sequence described under the heading Debug Mode: Hardware and Software Debug with the 33742,
beginning on page 34.
40. IDD over-current always enabled.
41. WDOG if enabled.
APPLICATION WAKE-UP FROM THE 33742
When the application is in Stop mode, it can be awakened from the SBC side. When a wake-up condition is detected by the
SBC (for example, CAN, wake-up input), the 33742 enters the Normal Request mode and generates an interrupt pulse at the
INT pin.
33742
Analog Integrated Circuit Device Data
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Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
APPLICATION WAKE-UP FROM THE MCU
When the device is in the Stop mode, a wake-up event may come from the system MCU. In this case the MCU selects the
device the using a LOW-to-HIGH transition on the 33742 CS pin. Then the 33742S goes into Normal Request mode and
generates an interrupt pulse at the INT pin.
STOP MODE CURRENT MONITOR
If the VDD output current exceeds an internal set threshold (IDDS-WU), the SBC automatically enters the Normal Request mode
and generates an interrupt at the INT pin. The interrupt is a non-maskable and the INTR register will have no flag set.
INTERRUPT GENERATION WHEN WAKE-UP FROM STOP MODE
When the SBC wakes from Stop mode, it first enters the Normal Request mode before generating a 10 s typical pulse on the
INT pin. These are non-maskable interrupts with the wake-up event read through the SPI registers, the CANWU bit in the CAN
Register (CANR), or the LCTRx bit in the Wake-up Register (WUR). In case of wake-up from Stop mode over-current situation
or from forced wake-up, no bits are set. After the INT pulse, the 33742 accepts SPI command after a time delay (tS-1STSPI).
WATCHDOG SOFTWARE IN STOP MODE
If the SBC watchdog is enabled, the application must provide a “system ok” response before the end of the 33742 watchdog
time. Typically an MCU initiates the wake-up of the 33742 through the SPI wake-up (CS activation). The SBC will awaken and
jump into the Normal Request mode. The MCU has to configure the 33742 to go to either Normal or Standby mode. The MCU
can then decide to return to the Stop mode.
If no MCU wake-up occurs within the watchdog time period, the SBC activates the RST pin and jumps into the Normal Request
mode. The MCU can then be re-initialized.
STOP MODE ENTER COMMAND
Stop mode is entered at the end of the SPI message at the rising edge of the CS. (Refer to the t CS-STOP data in the Dynamic
Electrical Characteristics table on page 16.) Once Stop mode is entered, the SBC can wake up from a VDD regulator over-current
detection state. In order to allow time for the MCU to complete the last CPU instruction and enter its low power mode, a deglitcher
time of 40 s typical is implemented.
Figure 11, page 29, depicts the operation of entering the Stop mode.
SPI Stop/Sleep
Command
SPI CS
t
t
CS-STOP
IDD-DGLT
33742 in Stop mode.
No IDD over IDD-DGLT
33742 in Normal
or Standby mode
33742 in Stop mode.
IDD over IDD-DGLT
Figure 11. Entering the Stop Mode
WATCHDOG SOFTWARE (RST AND WDOG)(SELECTABLE WATCHDOG WINDOW
OR WATCHDOG TIME-OUT)
A watchdog is used in the SBC Normal and Standby modes for monitoring the MCU operation. The watchdog timer may be
implemented as either a watchdog window or watchdog timeout, selectable by SPI (TIM1 sub register, bit WDW). Default
operation is a watchdog window.
The watchdog period can be set from 10 to 350 ms (TIM1 sub register, bits WDT0 and WDT1). When a watchdog window is
selected, the closed window is the first part of the selected period, and the open window is the second part of the period. (Refer
to Timing Register (TIM1/2) beginning on page 52.)
The watchdog can only be cleared within the open window time period. Any attempt to clear watchdog in the closed window
will generate a reset. The watchdog is cleared addressing the TIM1 sub register using the SPI
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
29
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
RST PIN DESCRIPTION
A 33742 output is available to perform a reset of the MCU. Reset can happen from:
• VDD Falling Out of Range—If VDD falls below the reset threshold (VRSTTH), the RST pin is pulled LOW until VDD returns to
the normal voltage.
• Power-ON Reset—At 33742 power-on or wake-up from Sleep mode, the RST pin is maintained LOW until VDD is within its
operation range.
• Watchdog Timeout—If watchdog is not cleared, the 33742 will pull the RST pin LOW for the duration of the reset time
(tRSTDUR).
RST AND WDOG OPERATION
Table 8 describes watchdog and reset output modes of operation. RST is activated in the event VDD fall or watchdog is not
triggered. WDOG output is active LOW as soon as RST goes LOW and stays LOW as long as the watchdog is not properly reset
via SPI. The WDOG output pin is designed as a push-pull structure that can drive off chip components signaling, for instance,
errant MCU operation.
Figure 12 illustrates the device behavior in the event the TIM1 register in not properly accessed. In this case, a software reset
occurs and the WDOG pin is set LOW until the TIM1 register is properly accessed.
Table 8. Watchdog and Reset Output Operation
WDOG
Events
RST Output
Output
Device Power up
VDD Normal, WDOG Properly Triggered
VDD < VRSTTH
LOW to HIGH
HIGH
LOW to HIGH
HIGH
HIGH
LOW
WDOG Timeout Reached
LOW (42)
LOW
Notes
42. WDOG stays LOW until the TIM1 register is properly addressed through SPI.
33742
Analog Integrated Circuit Device Data
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Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
Device power up
Device is in Normal mode, W/D refresh failure
V
SUP
V
DD
V
DD
RST
RST
Watchdog
Period
WDOG
WDOG
SPI
SPI
Mode
N-Request
RESET
Normal
SPI CS
Power up
Watchdog refresh failure
Device is in stop mode
Device is in sleep mode
V
SUP
V
V
SUP
V
DD
DD
INT
RST
WDOG
SPI
WDOG
SPI
Mode Stop
Mode Sleep
N-Request
N-Request Normal
RESET
Normal
Wake-up event
Wake-up event
Legend: TIM1 register write
Figure 12. RST and WDOG Output Operation
WAKE-UP CAPABILITIES
Several wake-up capabilities are available to the SBC when it is in Sleep or Stop mode. When a wake-up has occurred, the
wake-up event is stored in the Wake-up Register (WUR) or the CAN register and read by the MCU to determine the wake-up
source. The wake-up options are selectable through SPI while the 33742 is in Normal or Standby mode and prior to entering low
power modes (Sleep or Stop mode). When a wake-up occurs in Sleep mode, the SBC reactivates the VDD supply. It generates
an interrupt if a wake-up occurs from Stop mode.
WAKE-UP FROM WAKE-UP INPUTS (L0:L3) WITHOUT CYCLIC SENSE
The wake-up lines are used to determine the state of external switches and if changes occurred to wake up the MCU (in Sleep
or Stop modes). The wake-up pins L0:L3 are able to handle up to 40 VDC. The internalize” threshold is 3.0 V typical, and these
inputs can be used as an input port expander. The wake-up input states are read through SPI (WUR register).
In order to select and activate direct wake-up from the L0:L3 inputs, the WUR register must be configured with the appropriate
level sensitivity. Additionally, the Low Power Control (LPC) Register must be configured with 0xx0 data (bits LX2HS and
HSAUTO are set to 0).
The sensitivity of the L0:L3 inputs is selected by the WUR register. Level sensitivity is configured by L0:L3 input pairs: L0 and
L1 level sensitivity are configured together, while L2 and L3 are configured together.
CYCLIC SENSE WAKE-UP (CYCLIC SENSE TIMER AND WAKE-UP INPUTS L0:L3)
The 33742 can wake up upon state change of one of the four wake-up input lines (L0:L3). The external pull-up or pull-down
resistor of the switches associated with the wake-up input lines can be biased from the HS VSUP switch. The HS switch is
activated in Sleep or Stop modes from an internal timer. Cyclic Sense and Forced Wake-up are exclusive states. If Cyclic Sense
is enabled, Forced Wake-up cannot be enabled.
33742
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Freescale Semiconductor
31
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
In order to select and activate the cyclic sense wake-up from the L0:L3 inputs, the WUR register must be configured with the
appropriate level sensitivity and the LPC register must be configured with 1xx1 data (bit LX2HS set at 1 and bit HSAUTO set
at 1. The wake-up mode selection (direct or cyclic sense) is valid for all four wake-up inputs.
FORCED WAKE-UP
The SBC can wake-up automatically after a predetermined time spent in Sleep or Stop mode. Cyclic Sense and Forced Wake-
up are exclusive. If Forced Wake-up is enabled (FWU bit set to 1 in the LPC register), Cyclic Sense cannot be enabled.
CAN INTERFACE WAKE-UP
The SBC incorporates a high-speed 1.0 Mbps CAN physical interface. It is compatible with ISO 11898-2 standard. The
operation of the CAN physical interface is controlled through the SPI. The CAN operating modes are independent of the 33742
operational modes.
The SBC can wake up from a CAN message if the CAN wake-up feature is enabled. Refer to the section titled LOGIC
COMMANDS AND REGISTERS beginning on page 46 for details of the wake-up detection.
SPI WAKE-UP
The 33742 can be awakened by changes on the CS pin in Sleep or Stop modes. Wake-up is detected as a LOW-to-HIGH level
transition on the CS pin. In the Stop mode, this corresponds to a condition where an MCU and the SBC are both in the Stop mode
and when the application wake-up event comes through the MCU.
33742 POWER-UP AND WAKE-UP FROM SLEEP MODE
After device or system power-up, or after the SBC awakens from Sleep mode, the 33742S enters into the Reset mode prior
to moving into Normal Request mode.
Figure 13, shows the device state diagram. Figure 14, shows device operation after power-up.
33742
Analog Integrated Circuit Device Data
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Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
Watchdog: Timeout OR V
DD
Low
Watchdog: Timeout & Nostop &!BATFAIL
SPI: Standby and
Watchdog Trigger
2
Reset Counter (3.4 ms)
Expired
1
3
Standby
Reset
Normal Request
1
V
Low OR Watchdog:
DD
Timeout 350 ms & Nostop
4
2
Power
Down
1
Normal
Stop
SPI: Stop & CS
LOW to HIGH
Transition
1
Watchdog: Timeout OR V
Low
DD
Wake-Up
(V
DD
High Temperature OR [V
Low > 100 ms & V
> BFew]) & Nostop &!BATFAIL
DD
SUP
Sleep
Denotes priority
1
2
3
4
State Machine Description
Nostop = Nostop bit = 1
!Nostop = Nostop bit = 0
BATFAIL = Batfail bit = 1
!BATFAIL = Batfail bit = 0
Watchdog: Timeout = TIM1 register not written before watchdog timeout period
expired, or watchdog written in incorrect time window if watchdog window
selected (except Stop mode). In Normal Request mode, timeout is 355 ms
p2.2 (350 ms p3) ms.
V
V
V
Over-temperature = V
thermal shutdown occurs
SPI: Sleep = SPI write command to MCR register, data sleep
SPI: Stop = SPI write command to MCR register, data stop
SPI: Normal = SPI write command to MCR register, data normal
SPI: Standby = SPI write command to MCR register, data standby
DD
DD
DD
DD
below reset threshold
LOW = V
DD
LOW > 100 ms = V
below reset threshold for more than 100 ms
DD
Watchdog: Trigger = TIM1 subregister write operation
> BFew = V > Battery Fail Early Warning (6.1 V typical)
V
SUP
SUP
Notes
43. These two SPI commands must be sent consecutively in this sequence.
44. If watchdog activated.
Figure 13. SBC State Diagram (Not Valid in Debug Modes)
Power-up
Reset
Operation after power-up if no trigger appears
Operation after reset of BATFAIL if no trigger appears
Normal
Request
Yes
Batfail
No
No
No
Yes
Trigger
Yes
No Stop
Sleep
Normal
Figure 14. Operation After SBC Power-up
33742
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Freescale Semiconductor
33
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
DEBUG MODE: HARDWARE AND SOFTWARE DEBUG WITH THE 33742
When a SBC, and the MCU it serves, is used on the same printed circuit board, both the MCU software and the 33742
operation must be debugged concurrently. The following features permit system debugging by allowing the disabling of the SBC
internal software watchdog timer.
DEVICE POWER-UP, RESET PIN CONNECTED TO VDD
The VDD voltage is available when the 33742 power-up but the 33742 will not have received any SPI communication to
configure itself. Until set up by the system MCU, the 33742 will generate a reset every 350 ms until the part is configured. To
avoid continuous MCU hardware resets, the 33742’s RST pin can be connected directly to the VDD pin by a hardware jumper.
DEBUG MODES WITH SOFTWARE WATCHDOG DISABLED THOUGH SPI (NORMAL DEBUG, STANDBY
DEBUG, AND STOP DEBUG)
The software configurable watchdog can be disabled through the SPI. To set the watchdog disable while limiting the risk of
inadvertently disabling the watchdog timer during normal 33742 operation, it is recommended that the disable be done using the
following sequence:
• Step 1–Power down the SBC.
• Step 2–Power up the SBC. This sets the BATFAIL bit, allowing the 33742 to enter Normal Request mode.
• Step 3–Write to the TIM1 sub register to allow the SBC to enter Normal mode.
• Step 4–Write to the MCR register with data 0000. This enables the debug mode. Complete SPI byte is 0001 0000.
• Step 5–Write to the MCR register normal debug. SPI byte is 0001 x101.
Important While in debug mode, the SBC can be used without having to clear the watchdog on a regular basis to facilitate
software and hardware debug.
• Step 6–To leave the debug mode, write 0000 to the MCR register.
At Step 2, the SBC is in Normal Request. Steps 3, 4, and 5 should be completed consecutively and within the 350 ms time
period of the Normal Request mode. If not, the 33742 will go into Reset mode and enter Normal Request again.
Figure 15, page 34, illustrates debug mode selection.
VSUP
VDD
BATFAIL
TIM1(Step 3)
MCR (Step 5)
SPI: Read BATFAIL
MCR (Step 6)
SPI
MCR (Step 4)
33742 not in Debug mode.
Watchdog ON
Debug Mode
33742 in Debug mode.
No Watchdog
Figure 15. Entering Debug Mode
When the SBC is operating in the debug mode and has been set into Stop Debug or Sleep mode, a wake-up causes the 33742
to enter the Normal Request mode for 350 ms. To avoid having the SBC generate an unwanted reset (enter Reset mode), the
next debug mode (Normal Debug or Standby Debug) should be configured within the 350 ms time window of the Normal Request
mode.
To avoid entering debug mode after a power-up, first read the BATFAIL bit (MCR read) and write 0000 into the MCR register.
Figures 16 and 17, page 35, show the detailed operation of the SBC once the debug mode has been selected.
33742
Analog Integrated Circuit Device Data
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Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
Watchdog: Timeout 350 ms
Power
Down
Reset Counter
(3.4 ms) Expired
Reset
Normal Request
SPI: MCR (0000) and Normal Debug
SPI: MCR (0000) and Standby Debug
Normal Debug
Normal
Standby Debug
Figure 16. Transitions to Enter Debug Modes
Watchdog: Timeout 350 ms
Wake-up
Wake-up
Reset Counter
(3.4 ms) Expired
Reset
Sleep
Stop (1)
Normal Request
R
R
R
R
R
R
Normal
Stop Debug
Standby
E
E
SPI: Standby Debug
SPI: Normal Debug
Normal Debug
Standby Debug
R
R
(1) If Stop mode is entered, it is entered without watchdog, no matter the WDSTOP bit.
(E) Debug mode entry point (Step 5 of the Debug mode entering sequence).
(R) Represents transitions to Reset mode due to V1 low.
Figure 17. Simplified 33742S State Diagram in Debug Modes
33742
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Freescale Semiconductor
35
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
MCU FLASH PROGRAMMING CONFIGURATION
To allow for new software to be loaded into a SBC’s MCU NVM or to standalone EEPROM or Flash, the 33742 is capable of
having (1) VSUP applied to it to from an external power 5.0 V supply and (2) having the RST and the WDOG outputs pins
eternally forced to 0.0 or 5.0 V without damaging the device.
This allows the SBC to be externally powered and off-board signals to be applied to the reset pins. No functions of the 33742
are operating. Figure 18 illustrates a typical configuration for the connection of programming and debugging tools.
The VSUP should be left open or forced to a value equal to or above V.
The VDD regulator uses an internal pass transistor between VSUP and the VDD output pin. Biasing the VDD output pin with
a voltage greater than VDD potential will force current through the body diode of the internal pass transistor to the VSUP pin.
The RST pin is periodically pulled LOW for the tRSTDUR time (device in Reset mode), before being pulled to VDD for 350 ms
typical (device in Normal Request mode). During the time reset is LOW, the RST pin sinks 5.0 mA maximum (IPDW).
VDD
VSUP (Open or > 5.0 V
RST
MCU with
Flash Memory
33742
WDOG
Programming Bus
5.0 V
Programming Tool
Note External supply and sources applied to VDD, RST, and WDOG test points on application circuit board.
Figure 18. Simplified Schematic for Microcontroller Flash Programming
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
36
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
CAN PHYSICAL INTERFACE
The SBC features a high-speed CAN physical interface for bus communication from 60kbps up to 1.0Mbps. Figure 19 is a
simplified block diagram of the CAN interface of the 33742.
V2
33742
V2
V2
SPI Control
TXD
RXD
Driver
QH
CANH
CANL
V2
CANH Line
Bus Termination (60
CANL Line
Differential
Receiver
2.5 V
)
V2
Driver
QL
SPI Control
VSUP
Internal
Wake-up
Signal
Wake-up
Pattern
Recognition
Wake-up
Receiver
SPI Control
Figure 19. Simplified Block Diagram of CAN Interface
CAN INTERFACE SUPPLY
The supply voltage for the CAN transceiver is the V2 pin. The CAN interface also has a supply path from the external supply
line through the VSUP pin. This path is used in CAN Sleep mode to allow wake-up detection.
During CAN communication (transmission and reception), the CAN interface current is sourced from the V2 pin. During CAN
low power mode, the current is sourced from the VSUP pin.
MAIN OPERATION MODES DESCRIPTION
The CAN interface of the SBC has two main operating modes: TXRX and Sleep mode. The modes are controlled by the CAN
SPI Register. In the TXRX mode, which is used for communication, four different slew rates are available for the user. In the
Sleep mode, the user has the option of enabling or disabling the remote CAN wake-up capability.
CAN DRIVER OPERATION IN TXRX MODE
When the CAN interface is in TXRX mode, the driver has two states: recessive or dominant. The driver state is controlled by
the TXD pin. The bus state is reported through the RXD pin.
When TXD is HIGH, the driver is set in recessive state, and CANH and CANL lines are biased to the voltage set at V2 divided
by 2, or approximately 2.5 V.
When TXD is LOW, the bus is set into dominant state: CANL and CANH drivers are active. CANL is pulled to ground, and
CANH is pulled HIGH toward 5.0 V (voltage at V2).
The RXD pin reports the bus state: CANH minus CANL voltage is compared versus an internal threshold (a few hundred
millivolts). If CANH minus CANL is below the threshold, the bus is recessive and RXD is set HIGH. If CANH minus CANL is above
the threshold, the bus is dominant and RXD is set LOW. This is illustrated in Figure 19.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
37
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
TXD
Typ 2.5 V
Typ 2.5 V
CANH
CANL
V
-V
< 500 mV
CANH CANL
V
-V
> 900 mV
CANH CANL
RXD
CAN Recessive State
CAN Recessive State
CAN Dominant State
Figure 20. CAN Interface Levels
TXD AND RXD PINS
The TXD pin has an internal pull-up to V2. The state of TXD depends on the V2 status. RXD is a push-pull structure, supplied
by V2. When V2 is set at 5.0 V and CAN is TXRX mode, RXD reports bus status. For details, refer to Table , page 28, Table 9,
below, and Table 10, page 39.
The TXD pin is a push-pull structure between the V2 pin and GND. The circuitry has a parasitic diode between RXD and V2.
It is illustrated in Figure 25. This parasitic diode is reversed biased in normal operation (TXD voltage is lower or equal to V2). In
case the TXD voltage is greater than V2, a current will flow into the diode.
If the V2 pin is low (e.g. in sleep mode, or in stop with a ballast transistor), the current leakage at V2 is low enough (10 A
max) to ensure than the RXD pin can be pulled up by an external resistor (i.e. the MCU RXD pin internal pull-up).
The states of the RXD pin in the following Table 9 and 10 is dependant upon external circuitry connected to the V2 and RXD
pins.
CAN TXRX MODE AND SLEW RATE SELECTION
The slew rate selection is done via CAN register (refer to Tables 22 through 24 on page 50). Four slew rates are available and
control the recessive-to-dominant and dominant-to-recessive transitions. The delay time from TXD pin to CAN bus, from CAN
bus to RXD, and from the TXD to RXD loop time is affected by the slew rate selection.
Table 9. CAN Interface/33742S Modes and Pin Status—Operation with Ballast on V2(45)
CANH/CANL
(Disconnected from
Other Node)
CAN Mode
(Controlled by SPI)
CAN
Communication
Mode
V2 Voltage
TXD Pin
RXD Pin(46)
Unpowered
–
–
–
0.0 V
0.0 V
0.0 V
LOW
LOW
LOW
LOW
LOW
LOW
Floating to GND
Floating to GND
Floating to GND
NO
NO
NO
Reset (with Ballast)
Normal Request
(with Ballast)
Normal
Normal
Sleep
5.0 V
5.0 V
0.0 V
5.0 V
Floating to GND
NO
Normal
Internal Pull-up Report Bus State
Bus Recessive
YES
Slew Rate 0, 1, 2, 3
to V2
HIGH if Bus
Recessive,
CANH = CANL = 2.5 V
LOW if dominant
33742
Analog Integrated Circuit Device Data
38
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
Table 9. CAN Interface/33742S Modes and Pin Status—Operation with Ballast on V2(45)
Standby with
External Ballast
Normal or Sleep
0.0 V
0.0 V
0.0 V
LOW
LOW
LOW
LOW
LOW
LOW
Floating to GND
NO
Sleep
Stop
Sleep
Floating to GND
Floating to GND
NO.
Wake-up if enabled
Sleep
NO.
Wake-up if enabled
Notes
45. See also Figure 31, page 57.
46. The state of the RXD pin is dependant upon: 1) the V2 voltage, 2) the external circuitry connected to RXD, (i.e. the MCU RXD pin), and
3) any external pull-up between RXD and the 5.0 V supply.
Table 10. CAN Interface/33742 Modes and Pin Status—Operation without Ballast on V2 (47)
CANH/CANL
CAN Mode
CAN
Communication
RXD Pin(48)
Mode
V2 Voltage
TXD Pin
(Disconnected from
Other Node)
(Controlled by SPI)
Unpowered
–
–
–
0.0 V
5.0 V
5.0 V
LOW
LOW
LOW
LOW
LOW
5.0 V
Floating to GND
Floating to GND
Floating to GND
NO
NO
NO
Reset (without Ballast)
Normal Request without
Ballast.
V2 Connected to VDD
StandbywithoutExternal
Ballast,.
V2 connected to VDD
Normal or Sleep
5.0 V
5.0 V
5.0 V
0.0 V
5.0 V
0.0 V
5.0 V
5.0 V
5.0 V
Floating to GND
NO
YES
NO
Normal without External
Ballast.
V2 Connected to VDD
Normal
Slew Rate 0, 1, 2,3
Bus Recessive
CANH = CANL = 2.5 V
Normal without External
Ballast,.
Sleep
Floating to GND
V2 Connected to VDD
Sleep
Sleep
Sleep
0.0 V
5.0 V
LOW
LOW
LOW
LOW
Floating to GND
Floating to GND
NO.
Wake-up if enabled
Stop
NO.
Wake-up if enabled
Notes
47. See also Figure 36, page 60.
48. The state of the RXD pin is dependant upon: 1) the V2 voltage, 2) the external circuitry connected to RXD, (i.e. the MCU RXD pin), and
3) any external pull-up between RXD and the 5.0 V supply.
CAN SLEEP MODE
The 33742 offers two CAN Sleep modes:
• Sleep mode with CAN wake-up enable: detection of incoming CAN message and SBC wake-up.
• Sleep mode with CAN wake-up disable: no detection of incoming CAN message.
The CAN Sleep modes are set via the CAN SPI register.
In CAN Sleep mode (with wake-up enable or disable), the CAN interface is internally supplied from the VSUP pin. The voltage
at V2 pin can be either 5.0 V or turned off. When the CAN is in Sleep mode, the current sourced from V2 is extremely low. In
most cases the V2 voltage is off; however, the CAN can be placed into Sleep mode even with 5.0 V applied on V2.
In CAN Sleep mode, the CANH and CANL drivers are disabled, and the receiver is also disabled. CANH and CANL are high-
impedance mode to ground.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
39
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
CAN SIGNALS IN TXRX AND SLEEP MODES
When the CAN interface is set back into TXRX mode by an SPI command, CAN H and CANL are set in recessive level. This
is illustrated in Figure 21.
TXD
CANH Dominant
CANH
CANL/CANH Recessive
2.5 V
CANL
CANL Dominant
Ground
RXD
CAN in TXRX Mode
CAN in Sleep Mode
(Controlled by SPI Command)
(Wake-up Enable or Disable)
CAN in TXRX Mode
Figure 21. CAN Signals in TXRX and Sleep Modes
CAN IN SLEEP MODE WITH WAKE-UP ENABLE
When the CAN interface is in Sleep mode with wake-up enable, the CAN bus traffic is detected. The CAN bus wake-up is a
pattern wake-up.
PATTERN WAKE-UP
In order to wake up the CAN interface, the following criteria must be fulfilled:
• The CAN interface wake-up receiver must receive a series of three consecutive valid dominant pulses, each of which must be
longer than 500 ns and shorter than 500 s.
• The distance between 2 pulses must be lower than 500 s.
• The three pulses must occur within a time frame of 1.0 ms.
The pattern wake-up of the 33742 CAN interface allow wake-up by any CAN message content.
Figure 22 below illustrates the CAN signals during a CAN bus Sleep state and wake-up sequence.
33742
Analog Integrated Circuit Device Data
40
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
TXD
CANH Dominant
CANL Dominant
CANH Dominant
Pulse # 1
CANH Dominant
CANH Dominant
Pulse # 3
CANH
CANL
CANL/CANH Recessive
Ground
Pulse # 2
2.5 V
CANL Dominant
CANL Dominant
CANL Dominant
CAN Bus Sleep State
Incoming CAN Message
RXD
CAN in TXRX Mode
CAN in Sleep Mode (Wake-up Enable)
WU Receiver
Min 500 ns
Max 500
s
Internal Wake-up Signal
Figure 22. CAN Bus Signal During Can Sleep State and Wake-up Sequence
Figure 23 illustrates how the wake-up signal is generated. First the CAN signal is detected by a low consumption receiver (WU
receiver). Then the signal passes through a pulse width filter, which discards the undesired pulses. The pulse must have a width
bigger than 0.5 s and smaller than 500 s to be accepted. When a pulse is discarded, the pulse counter is reset and no wake-
up signal is generated. When a pulse is accepted, the pulse counter is incremented and, after three pulses, the internal wake-up
signal is asserted.
Each one of the pulses must be spaced by no more than 500 s. If not, the counter will be reset and no wake-up signal will be
generated. This is accomplished by the wake-up timeout generator. The wake-up cycle is completed (and the wake-up flag reset)
when the CAN interface is brought to CAN Normal mode.
Pulse OK
Counter
RST
Latch
RST
Internal Wake-up
Signal
CANH
CANL
Pulse Width
Filter
Timeout
Narrow
Pulse
+
WU Receiver
Standby
Timeout
Generator
Figure 23. Wake-up Functional Block Diagram
CAN WAKE-UP REPORT
The CAN wake-up reporting depend upon the low power mode the SBC is in.
If the SBC is placed into Sleep mode (VDD and V2 off), the CAN wake-up or any wake-up results in the VDD regulator turning
on, leading to turning on the MCU supply and releasing reset. If the 33742 is in Stop mode (V2 off and VDD active), the CAN
wake-up or any wake-up is signalled by a pulse on the INT output. In addition the CANWU bit is set in the CAN register.
If the SBC is in Normal or Standby mode and the CAN interface is in Sleep mode with wake-up enabled, the CAN wake-up is
reported by the CANWU bit in the CAN register.
In the event the SBC is in Normal mode and CAN Sleep mode with wake-up enabled, it is recommended that the user check
for the CANWU bit prior to placing the 33742 in Sleep or Stop mode in case bus traffic has occurred while the CAN interface was
in Sleep mode.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
41
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
After a CAN wake-up, a flag is set in the CAN register. Bit CANWU reports the CAN wake-up event while the 33742 was in
Sleep or Stop mode. This bit is set until the CAN is in placed by SPI command into TXRX mode and the CAN register can be read.
CAN BUS DIAGNOSTIC
The SBC can diagnose CANH or CANL lines short to GND, shorts to VSUP or VDD.
As illustrated in Figure 24, several single-ended comparators are implemented on the CANH and CANL bus lines. These
comparators monitor the bus voltage level in the recessive and dominant states. This information is then managed by a logic
circuit to determine if a failure has occurred and to report it. Table 11 indicates the state of the comparators in the event of bus
failure and the state of the drivers; that is, whether they are recessive or dominant.
V
V
R5
H5
VSUP (12V–14 V)
RVB
VDD
Hb
V
V
(VSUP -2.0 V)
RVB
RG
CANH
TXD
Hg
Lg
VDD (5.0 V)
V
(VDD -0.43 V)
Logic
R5
Diagnostic
CANH Dominant Level (3.6 V)
CANL
V
RG
Recessive Level (2.5 V)
Lb
V
RVB
V
(1.75 V)
RG
CANL Dominant Level (1.4 V)
GND (0.0 V)
L5
V
R5
Figure 24. CAN Bus Simplified Structure
Table 11. Short to GND, Short to VSUP, and Short to 5.0 V (VDD) Detection Truth Table
Driver Recessive State
Driver Dominant State
Failure Description
Lg (Threshold 1.75 V)
Hg (Threshold 1.75 V)
Lg (Threshold 1.75 V)
Hg (Threshold 1.75 V)
No failure
1
0
0
1
0
0
0
0
0
1
1
0
CANL to GND
CANH to GND
Lb (Threshold VSUP-2.0 V) Hb (Threshold VSUP-2.0 V) Lb (Threshold VSUP-2.0 V) Hb (Threshold VSUP-2.0 V)
No failure
0
1
1
0
1
1
0
1
0
0
1
1
CANL to VSUP
CANH to VSUP
H5
L5 (Threshold VDD-0.43 V) H5 (Threshold VDD-0.43 V) L5 (Threshold VDD-0.43 V)
(Threshold VDD-0.43 V)
No failure
0
1
1
0
1
1
0
1
0
0
1
1
CANL to VDD
CANH to VDD
DETECTION PRINCIPLE
In the recessive state, if one of the two bus lines is shorted to GND, VDD, or VSUP, then voltage at the other line follows the
shorted line due to bus termination resistance and the high-impedance of the driver. For example, if CANL is shorted to GND,
CANL voltage is zero, and CANH voltage, as measured by the Hg comparator, is also close to zero.
33742
Analog Integrated Circuit Device Data
42
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
In the recessive state the failure detection to GND or VSUP is possible. However, it is impossible to distinguish which bus line,
CANL or CANH, is shorted to GND or VSUP. In the dominant state, the complete diagnostic is possible once the driver is turned
on.
CAN BUS FAILURE REPORTING
CANL bus line failures (for example, CANL short to GND) is reported in the SPI register TIM1/2. CANH bus line (for example,
CANH short to VSUP) is reported in the LPC register.
In addition CAN-F and CAN-UF bits in the CAN register indicate that a CAN bus failure has been detected.
NON-IDENTIFIED AND FULLY IDENTIFIED BUS FAILURES
As indicated in Table 11, page 42, when the bus is in a recessive state it is possible to detect an error condition; however, is
it not possible to fully identify the specific error. This is called “non-identified” or “under-acquisition” bus failure. If there is no
communication (i.e., bus idle), it is still possible to warn the MCU that the SBC has started to detect a bus failure.
In the CAN register, bits D2 and D1 (CAN-F and CAN-UF, respectively) are used to signal bus failure. Bit D2 reports a bus
failure and bit D1 indicates if the failure is identified or not (bit D1 is set to logic [1} if the error is not identified).
When the detection mechanism is fully operating any bus error will be detected and reported in the TIM1/2 and LPC registers
and bit D1 will be reset to logic [0].
NUMBER OF SAMPLES FOR PROPER FAILURE DETECTION
The failure detector requires at least one cycle of recessive and dominant state to properly recognize the bus failure. The error
will be fully detected after five cycles of recessive-dominant states. As long as the failure detection circuitry has not detected the
same error for five recessive-dominant cycles, the bit “non-identified failure” (CAN-UF) will be set.
RXD PERMANENT RECESSIVE FAILURE
The purpose of this detection mechanism is to diagnose an external hardware failure at the RXD output pin and to ensure that
a permanent failure at the RXD pin does not disturb network communication.In the event RXD is shorted to a permanent high
level signal (i.e., 5.0 V), the CAN protocol module within the MCU cannot receive any incoming message. Additionally, the CAN
protocol module cannot distinguish the bus idle state and could start communication at any time. To prevent this, an RXD failure
detection, as illustrated in Figure 25 and explained below, is necessary.
TXD
CANL
CANH
Diag
TXD
Driver
Logic
Diff Output
Sampling
Sampling
Sampling
Sampling
2.0 V
V
2
V
2
RXD Sense
RXD Output
RXD Short to V1
CANH
CANL
RXD
RXD Flag Latched
RXD
Driver
Diff
60
RXD Flag
GND
Prop Delay
Note The RXD Flag is neither the RXPR bit in the LPC register, nor the CANF bit in the INTR register.
Figure 25. RXD Path and RXD Permanent Recessive Detection Principle
RXD FAILURE DETECTION
The SBC senses the RXD output voltage at each LOW-to-HIGH transition of the differential receiver. Excluding internal
propagation delay, RXD output should be LOW when the differential receiver is LOW. In the event RXD is shorted to 5.0 V (e.g.,
to VDD), RXD will be tied to a high level and the RXD short to 5.0 V can be detected at the next LOW-to-HIGH transition of the
differential receiver. Compete detection requires three samples.
When the error is detected, an error flag is latched and the CAN driver is disabled. The error is reported through the SPI
register LPC, bit RXPR.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
43
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
RECOVERY CONDITION
The SBC will try to recover from a bus fault condition by sampling for a correct low level at TXD, as illustrated in Figure 26.
As soon as an RXD permanent recessive is detected, the RXD driver is deactivated and a weak pull-down current source is
activated in order to allow recovery conditions. The driver stays disabled until the failure is cleared (RXD no longer permanent
recessive) and the bus driver is activated by an SPI register command (write 1 to the CANCLR bit in the CAN register).
CANL
CANH
Diff Output
Sampling
Sampling
RXD Short to V
DD
RXD Output
RXD no longer shorted to V
DD
RXD Flag Latched
RXD Flag
Note RXD Flag is neither the RXPR bit in the LPC register
nor the CANF bit in INTR register.
Figure 26. RXD Recovery Conditions
TXD PERMANENT DOMINANT FAILURE
PRINCIPLE
In the event TXD is set to a permanent low level, the CAN bus is set into dominant level, and no communication is possible.
The SBC has a TXD permanent timeout detector. After timeout, the bus driver is disabled and the bus is released in a recessive
state. The TXD permanent dominant failure is reported in the TIM1 register.
RECOVERY
The TXD permanent dominant is used and activated also in case of TXD short to RXD. The recovery condition for TXD
permanent dominant (recovery means the reactivation of the CAN drivers) is done by an SPI command and is controlled by the
MCU.
The driver stays disabled until the failure is cleared (TXD no longer permanent dominant) and the bus driver is activated by
an SPI register command (write logic [1] to CANCLR bit in the CAN register).
TXD TO RXD SHORT CIRCUIT FAILURE
PRINCIPLE
In the event the TXD is shorted to RXD when an incoming CAN message is received, the RXD will be at a LOW. Consequently,
the TXD pin is LOW and drives CANH and CANL into the dominant state. The bus is stuck in dominant mode and no further
communication is possible.
DETECTION AND RECOVERY
The TXD permanent dominant timeout will be activated and release the CANL and CANH drivers. However, at the next
incoming dominant bit, the bus will be stuck again in dominant. In order to avoid this situation, the recovery from a failure
(recovery means the reactivation of the CAN drivers) is done by an SPI command and controlled by the MCU.
INTERNAL ERROR OUTPUT FLAGS
There are internal error flags to signal whenever thermal protection is activated or over-current detection occurs on the CANL
or CANH pins (THERM-CUR bit). The errors are reported in the CAN register.
33742
Analog Integrated Circuit Device Data
44
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
OPERATIONAL MODES
DEVICE FAULT OPERATION
Table 12 describes the relationship between device fault or warning and the operation of the VDD, V2, CAN, and HS interface.
Table 12. Fault/Warning
Fault/Warning
VDD
V2
CAN
HS
Battery Fail
Turn OFF
Turn OFF
Turn OFF due to V2.
No communication
OFF
VDD Temperature
Pre-warning
Warning flag only.
Leave as is
No change
Turn OFF
No change
No change
OFF
VDD Over-temperature
Turn OFF
Turn OFF due to V2.
No communication
VDD Over-current
VDD regulator enters linear Turn OFF if VDD under-
If V2 is OFF, turn OFF
and no communication
Turn OFF if VDD under-
voltage reset occurs
mode. VDD under-voltage
reset may occurs. VDD
over-temperature Pre-
warning or shutdown may
occur
voltage reset occurs
VDD Short-circuit
Watchdog Reset
VDD under-voltage reset
occurs. VDD over-
temperaturePre-warningor
shutdown may occur
Turn OFF
Turn OFF
Turn OFF due to V2.
No communication
OFF
OFF
ON
Turn OFF due to V2.
No communication
V2LOW (e.g., V2 < 4.0 V)
HS Over-temperature
HS Over-current
No change
No change
No change
V2 out of range
No change
Turn OFF due to V2 low
No change
No change
OFF
No change
No change
HS over-temperature
may occur
VSUP LOW
No change
No change
No change
No change
No change
No change
No change
CAN Over-temperature
Disable. As soon as
temperature falls, CAN is
re-enabled automatically
(49)
CAN Over-current
CANH Short to GND
CANH Short to VDD
CANH Short to VSUP
CANL Short to GND
CANL Short to VDD
CANL Short to VSUP
Notes
No change
No change
No change
No change
No change
No change
No change
No change
No change(50)
No change
No change
No change
No change
No change
No change
No change
No change
No change
No change
No change
No change
No communication(51)
Communication OK
Communication OK
Communication OK
No communication(51)
No communication(51)
49. Refer to descriptions of CANH and CANL short to GND, VDD, and VSUP elsewhere in table.
50. Peak current 150 mA during TXD dominant only. Due to loss of communication, CAN controller reaches bus OFF state. Average current
out of V2 is below 10 mA.
51. Over-current might be detected. THERM-CUR bit set in CAN register.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
45
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
LOGIC COMMANDS AND REGISTERS
SPI INTERFACE AND REGISTER DESCRIPTION
DATA FORMAT DESCRIPTION
Figure 27 illustrates an 8-bit byte corresponding to the 8 bits in a SPI register. The first three bits are used to identify the
internal SBC register address. Bit 4 is a read/write bit. The last four bits are data sent from the MCU to the SBC or read back
from the 33742 to the MCU.
The state of the MISO has no significance during the write operation. However, during a read operation the final four bits of
MISO have meaning; namely, they contain the content of the accessed register.
Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0
MISO
MOSI
A2
A1
A0 R/W D3
D2
D1
D0
Address
Data
Note Read operation: R/W bit = logic [0]
Write operation: R/W = logic [1]
:
Figure 27. Data Format Description.
Table 13. Possible Reset Conditions
Condition
Name
Definition
Power-ON Reset
33742 Reset
POR
NR2R
33742 Mode
Transition
Normal Request to Reset mode
Normal Request to Normal mode
Normal Request to Standby mode
Normal to Reset mode
NR2N
NR2STB
N2R
Standby to Reset mode
STB2R
STO2R
STO2NR
RESET
Stop to Reset mode
Stop to Normal Request
33742S in Reset mode
33742 Mode
REGISTER DESCRIPTIONS
The following tables in this section describe the SPI register list and register bit meaning. Register reset values are also
described, along with the reset condition. A reset condition is the condition causing the bit to be set at the reset value.
Table 14. List of Registers
Comment and Use
Formal Name
Register
MCR
Address
$000
and Link
Write
Read
Selection for Normal, Standby, Sleep,
Stop, and Debug modes
BATFAIL, general failure, VDD pre-
warning, and Watchdog flag
Mode Control Register (MCR)
on page 48
Configuration for reset voltage level, CAN Sleep and Stop modes
RCR
$001
Reset Control Register (RCR)
on page 49
CAN slew rate, Sleep and Wake-up
enable/disable modes, drive enable after
failure
CAN wake-up and CAN failure status bits
CAN
$010
CAN Register (CAN) on page
49
33742
Analog Integrated Circuit Device Data
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Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
Table 14. List of Registers
HS (high side switch) control in Normal
and Standby mode
HS over-temperature bit, VSUP, and V2
LOW status
IOR
WUR
TIM
$011
$100
$101
Input/Output Register (IOR)
on page 50
Control of wake-up input polarity
Wake-up input and real time Lx input
state
on page 51
•
•
TIM1: Watchdog timing control, Watch-
dog Window (WDW) or Watchdog Tim-
eout (WTO) mode
CANL and TXD failure reporting
Timing Register (TIM1/2) on
page 52
TIM2: Cyclic Sense and Forced Wake-
up timing selection
Control HS periodic activation in Sleep
and Stop modes, Forced Wake-up mode
activation, CAN-INT mode selection
CANH and RXD failure reporting
Interrupt source
LPC
$110
$111
Low Power Control Register
(LPC) on page 54
Enable or Disable of Interrupts
INTR
Interrupt Register (INTR) on
page 56
NOTE: For SPI Operation
In case a low pulse is asserted by the device on the RST output pin during a SPI message,
the SPI message can be corrupted. An RST low pulse is asserted in 2 cases:
Case 1: W/D refresh issue: The MCU does not perform the SPI watchdog refresh command
before the expiration of the timeout (in Normal mode or Normal Request mode and if the
“Timeout watchdog” option is selected), or the SPI watchdog refresh command is performed
in the closed window (in Normal mode and if “Window watchdog” option is selected).
Case 2: VDD undervoltage condition: VDD falls below the VDD undervoltage threshold.
Message corruption means that the targeted register address can be changed, and another
register is written. Table 15 shows the various cases and impacts on SPI register address:
Table 15. Possible Corrupted Registers In Case of RST Pulse During SPI Communication
Resulting Written register
Register
Address
MCR
$000
RCR
$001
CAN
$010
IOR
$011
Target
written
register
Register
CAN
Address
$010
$011
$100
$101
$110
$111
X
X
X
IOR
X
X
X
WUR
TIM1/2
LPC
X
INTR
X
Four registers can be corrupted: MCR, RCR, CAN, and IOR registers. As examples:
•
•
write to CAN register can end up as write to MCR register, or
write to TIM1 register can end up as write to RCR register
To avoid the previously described behavior, it is recommended to write into the MCR, RCR,
CAN, and IOR registers with the expected configuration, after each RST assertion.
In the application, a RST low pulse leads to an MCU reset and a software restart. By
applying this recommendation, all registers will be written with the expected configuration.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
47
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
MODE CONTROL REGISTER (MCR)
Tables 16 through 18 describes the various Mode Control Registers.
Table 16. Mode Control Register
MCR
R/W
D3
D2
D1
D0
$000b
W
R
–
–
MCTR2
VDDTEMP
0
MCTR1
GFAIL
MCTR0
WDRST
0
BATFAIL(52)
Reset Value
Reset Condition (Write)(53)
Notes
–
–
0
–
POR, RESET
POR, RESET
POR, RESET
52. BATFAIL bit cannot be set by SPI. BATFAIL is set when VSUP falls below 3.0 V.
53. See Table 13 page 46, for definitions of reset conditions
Table 17. Mode Control Register Control Bits
MCTR MCTR MCTR
33742S Mode
Description
2
1
0
To enter/exit Debug Mode, refer to detailed description in Debug Mode: Hardware and
Software Debug with the 33742, page 34.
0
0
0
Enter/Exit Debug Mode
0
0
1
1
1
0
0
1
1
1
0
1
1
0
1
0
1
Normal
Standby
–
0
–
0
Stop, Watchdog OFF(54)
Stop, Watchdog ON(54)
Sleep(55)
–
0
–
1
–
No Watchdog running. Debug mode.
1
1
Normal
Standby
1
Stop
Notes
54. Watchdog ON or OFF depends on RCR bit D3.
55. Before entering Sleep mode, BATFAIL bit in MCR must be previously cleared (MCR read operation), and NOSTOP bit in RCR must be
previously set to logic [1].
Table 18. Mode Control Register Status Bits
Name
Logic
Description
VSUP was not below VBF
VSUP has been below VBF
No over-temperature pre-warning.
.
0
1
0
1
0
1
0
1
BATFAIL
.
VDDTEMP
GFAIL
Temperature pre-warning on VDD regulator (bit latched).
No failure.
CAN Failure or HS over-temperature or V2 low.
No watchdog reset occurred.
WDRST
Watchdog reset occurred.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
48
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
RESET CONTROL REGISTER (RCR)
Tables 19 and 20 contain various Reset Control Register information.
Table 19. Reset Control Register
RCR
R/W
D3
D2
D1
D0
W
R
–
$001b
WDSTOP
1
NOSTOP
0
CAN SLEEP
RSTTH
Reset Value
Reset Condition (Write)(56)
Notes
0
0
–
POR, RESET, STO2NR POR, NR2N, NR2STB
POR, NR2N, NR2STB
POR
56. See Table 13 page 46, for definitions of reset conditions.
Table 20. Reset Control Register Control Bits
Name
Logic
Description
No Watchdog in Stop mode.
Watchdog runs in Stop mode.
Device cannot enter Sleep mode.
0
1
0
1
0
1
0
1
WDSTOP
NOSTOP
CAN SLEEP
RSTTH
Sleep mode allowed. Device can enter Sleep mode.
CAN Sleep mode disable (despite D0 bit in CAN register).
CAN Sleep mode enabled (in addition to D0 in CAN register).
Reset Threshold 1 selected (typ 4.6 V).
Reset Threshold 2 selected (typ 4.2 V).
CAN REGISTER (CAN)
Tables 21 through 24 contain the information on the CAN register. Table 21 describes control of the high-speed CAN module,
mode, slew rate, and wake-up.
Table 21. CAN Register
CAN
R/W
D3
D2
D1
D0
W
R
–
CANCLR
CANWU
0
SC1
CAN-F
0
SC0
CAN-UF
0
MODE
THERM-CUR
1
$010b
Reset Value
Reset Condition (Write)(57)
Notes
–
POR
POR
POR
NR2N, STB2N
57. See Table 13, page 46, for definitions of reset conditions.
Table 22. CANCLR Control Bits
Logic
Description
No effect.
0
1
Re-enables CAN driver after TXD permanent dominant or RXD permanent recessive failure occurred. Failure
recovery conditions must occur to re-enable.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
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FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
HIGH-SPEED CAN TRANSCEIVER MODES
The MODE bit (D0) controls the state of the CAN interface, TXRX or Sleep mode (Table 23). SC0 bit (D1) defines the slew
rate when the CAN module is in TXRX, and it controls the wake-up option (wake-up enable or disable) when the CAN module is
in Sleep mode.
Table 23. CAN High Speed Transceiver Modes
CAN Mode
SC1
SC0
MODE
(Pass 1.1)
0
0
1
0
1
1
0
0
0
0
0
1
1
CAN TXRX, Slew Rate 0
CAN TXRX, Slew Rate 1
0
1
CAN TXRX, Slew Rate 2
1
CAN TXRX, Slew Rate 3
x
CAN Sleep and CAN Wake-up Disable
CAN Sleep and CAN Wake-up Enable
x
x = Don’t care.
Table 24. CAN Register Status Bits
Name
Logic
Description
No CAN wake-up occurred.
0
1
0
1
0
CANWU
CAN wake-up occurred.
No CAN failure.
CAN-F
CAN failure(58)
Identified CAN failure(58)
.
.
CAN-UF
Non-identified CAN failure.
1
0
1
No over-temperature or over-current on CANH or CANL drivers.
Over-temperature or over-current on CANH or CANL drivers.
THERM-CUR
Notes
58. Error bits are latched in the CAN register.
INPUT/OUTPUT REGISTER (IOR)
Tables 25 through 27 contain the Input/Output Register information. Table 26 provides information about information HS
control in Normal and Standby modes, while Table 27 provides status bit information.
Table 25. Input/Output Register
IOR
R/W
D3
D2
D1
D0
W
R
–
–
HSON
HSOT
0
–
–
$011b
V2LOW
VSUPLOW
DEBUG
Reset Value
Reset Condition (Write)(59)
Notes
–
–
–
–
–
–
–
POR
59. See Table 13, page 46, for definitions of reset conditions.
33742
Analog Integrated Circuit Device Data
50
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
Table 26. HSON Control Bits
Logic
HS State
HS OFF, in Normal and Standby modes.
HS ON, in Normal and Standby modes.(60)
0
1
Notes
60. When HS is turned OFF due to an over-temperature condition, it can be turned ON again by setting the appropriate control bit to 1. Error
bits are latched in the IOR register.
Table 27. Input/Output Register Status Bits
Name
Logic
Description
V2LTH > 4.0V.
0
1
0
1
0
1
0
1
V2LOW
V2LTH < 4.0V.
No HS over-temperature.
HS over-temperature.
VBF(EW) > 5.8V.
HSOT
VSUPLOW
DEBUG
VBF(EW) < 5.8V.
SBC not in Debug mode.
SBC accepts command to go to Debug modes (no Watchdog).
WAKE-UP REGISTER (WUR)
Tables 28 through 30 contain the Wake-up Register information. Local wake-up inputs L0:L3 can be used in both Normal and
Standby modes as port expander, as well as for waking up the SBC from Sleep or Stop modes (Table 28).
Table 28. Wake-up Register
WUR
R/W
D3
D2
D1
D0
W
R
–
LCTR3
L3WU
0
LCTR2
L2WU
0
LCTR1
L1WU
0
LCTR0
L0WU
0
$100b
Reset Value
Reset Condition (Write)(61)
Notes
–
POR, NR2R, N2R, STB2R, STO2R
61. See Table 13, page 46, for definitions of reset conditions.
Wake-up inputs can be configured by pair. L0 and L1 can be configured together, and L1 and L2, and L2 and L3 can be
configured together (Table 29).
Table 29. Wake-up Register Control Bits
LCTR3
LCTR2
LCTR1
LCTR0
L0 L1:L1 L2 Config
L2 L3:L3 L4 Config
x
x
x
x
x
x
x
x
0
0
1
1
0
1
0
1
Inputs Disabled
High Level Sensitive
Low Level Sensitive
Both Level Sensitive
–
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
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FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
Table 29. Wake-up Register Control Bits (continued)
0
0
1
0
1
x
x
x
x
x
x
x
x
–
Inputs Disabled
High Level Sensitive
Low Level Sensitive
Both Level Sensitive
0
1
1
x = Don’t care.
Table 30. Wake-up Register Status Bits (62)
Name
Logic
Description
If bit = 1, wake-up occurred from Sleep or Stop modes; if bit = 0, no wake-up has
occurred.
L3WU
L2WU
L1WU
L0WU
0 or 1
0 or 1
0 or 1
0 or 1
When device is in Normal or Standby mode, bit reports the State on Lx pin (LOW
or HIGH) (0 = Lx LOW, 1 = Lx HIGH)
Notes
62. WUR status bits have two functions. After SBC wake-up, they indicate the wake-up source; for example, L2WU set at logic [1] if wake-
up source is L2 input. After SBC wake-up and once the WUR register has been read, status bits indicate the real-time state of the Lx
inputs (1 = Lx is above threshold, 0 = Lx input is below threshold). If after a wake-up from Lx input a watchdog timeout occurs before the
first reading of the WUR register, the LxWU bits are reset. This can occur only if the SBC was in Stop mode.
TIMING REGISTER (TIM1/2)
Tables 31 through 35 contain the Timing Register information. The TIM register is composed of two sub registers:
• TIM1—Controls the watchdog timing selection as well as either the watchdog window or the watchdog timeout option
(Figure 28 and Figure 29, respectively). TIM1 is selected when bit D3 is 0 (Table 31). Watchdog timing characteristics are
described in Table 32.
• TIM2—Selects an appropriate timing for sensing the wake-up circuitry or cyclically supplying devices by switching the HS on
or off. TIM2 is selected when bit D3 is 1 (Table 33). Figure 30, page 54, describes HS operation when cyclic sense is selected
Cyclic sense timing characteristics are described in Table 35, page 54.
Both subregisters also report the CANL and TXD diagnostics.
Table 31. TIM1 Timing and CANL Failure Diagnostic Register
TIM1
R/W
D3
D2
D1
D0
$101b
W
R
–
0
WDW
WDT1
WDT0
TXPD
CANL2VDD
CANL2BAT
CANL2GND
Reset Value
Reset Condition (Write)(63)
Notes
–
–
0
0
0
–
POR, RESET
POR, RESET
POR, RESET
63. See Table 13, page 46, for definitions of reset conditions.
33742
Analog Integrated Circuit Device Data
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Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
Table 32. TIM1 Control Bits
WDW
WDT1
WDT0
Timing (ms typ)
Parameter
Description
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
9.75
45
Watchdog Period 1
Watchdog Period 2
Watchdog Period 3
Watchdog Period 4
Watchdog Period 1
Watchdog Period 2
Watchdog Period 3
Watchdog Period 4
No Window Watchdog
100
350
9.75
45
Watchdog Window enabled
(Window length is half the
Watchdog Timing).
100
350
Window Closed
No Watchdog Clear Allowed
Window Open for Watchdog Clear
Watchdog Timing x 50%
Watchdog Timing x 50%
Watchdog Period
(Watchdog Timing Selected by TIM1 Bit WDW=1)
Figure 28. Window Watchdog
Window Open for Watchdog Clear
Watchdog Period
(Watchdog Timing Selected by TIM1 Bit WDW = 0)
Figure 29. Timeout Watchdog
Table 33. Timing Register Status Bits
Name
Logic
Failure Description
No CANL short to VDD.
0
1
0
1
0
1
0
1
CANL2VDD
CANL2BAT
CANL2GND
TXPD
CANL short to VDD.
No CANL short to VSUP.
CANL short to VSUP.
No CANL short to GND.
CANL short to GND.
No TXD dominant.
TXD dominant.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
53
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
Table 34. TIM2 Timing and CANL Failure Diagnostic Register
TIM2
R/W
D3
D2
D1
D0
W
R
–
1
CSP2
CANL2BAT
0
CSP1
CANL2GND
0
CSP0
TXPD
$101b
CANL2VDD
Reset Value
Reset Condition (Write)(64)
Notes
–
–
0
–
POR, RESET
POR, RESET
POR, RESET
64. See Table 13, page 46, for definitions of reset conditions.
Cyclic Sense Timing,
ON Time
HS ON
Cyclic Sense Timing, OFF Time
HS OFF
HS
10 s
Lx Sampling Point
Sample
time
Figure 30. HS Operation When Cyclic Sense Is Selected
Table 35. TIM2 Control Bits
Parameter
CSP2
CSP1
CSP0
Cyclic Sense Timing (ms)
Cyclic Sense/FWU Timing 1
Cyclic Sense/FWU Timing 2
Cyclic Sense/FWU Timing 3
Cyclic Sense/FWU Timing 4
Cyclic Sense/FWU Timing 5
Cyclic Sense/FWU Timing 6
Cyclic Sense/FWU Timing 7
Cyclic Sense/FWU Timing 8
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
4.6
9.25
18.5
37
74
95.5
191
388
LOW POWER CONTROL REGISTER (LPC)
Tables 36 through 40 contain the Low Power Control Register information. The LPC register controls:
• The state of HS in Stop and Sleep modes (HS permanently OFF or HS cyclic).
• Enable or disable of the forced wake-up function (SBC automatic wake-up after time spent in Sleep or Stop modes; time is
defined by the TIM2 sub register).
• Enable or disable the sense of the wake-up inputs (Lx) at the sampling point of the Cyclic Sense period (LX2HS bit). (Refer to
Reset Control Register (RCR) on page 49 for details of the LPC register setup required for proper cyclic sense or direct wake-
up operation.
The LPC register also reports the CANH and RXD diagnostic.
33742
Analog Integrated Circuit Device Data
54
Freescale Semiconductor
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
Table 36. Low Power Control Register
LPC
R/W
D3
D2
D1
D0
W
R
LX2HS
FWU
CAN-INT
HSAUTO
RXPR
$110b
CANH2VDD
CANH2BAT
CANH2GND
–
–
0
0
0
0
Reset Value
Reset Condition (Write)(65)
POR, NR2R, N2R,
STB2R, STO2R
POR, NR2R, N2R,
STB2R, STO2R
POR, NR2R, N2R,
STB2R, STO2R
POR, NR2R, N2R,
STB2R, STO2R
Notes
65. See Table 13, page 46, for definitions of reset conditions.
Table 37. LX2HS Control Bits
Logic
Wake-up Inputs Supplied by HS
No.
Yes. Lx inputs sensed at sampling point.
0
1
Table 38. HSAUTO Control Bits
Logic
Auto-timing HS in Sleep and Stop modes
OFF.
ON, HS Cyclic, period defined in TIM2 subregister.
0
1
Table 39. CAN-INT Control Bits
Logic(66)
Description
Interrupt as soon as CAN bus failure detected.
0
1
Interrupt when CAN bus failure detected and fully identified.
Notes
66. If CAN-INT is at logic [0], any undetermined CAN failure will be latched in the CAN register (bit D1: CAN-UF) and can be accessed by
SPI (refer to CAN Register (CAN) on page 49). After reading the CAN register or setting CAN-INT to logic [1], it will be cleared
automatically. The existence of CAN-UF always has priority over clearing, meaning that a further undetermined CAN failure does not
allow clearing the CAN-UF bit.
Table 40. LPC Status Bits
Name
Logic
Failure Description
No CANH short to VDD
CANH short to VDD
.
0
1
0
1
0
1
0
1
CANH2VDD
.
No CANH short to VSUP.
CANH short to VSUP.
No CANH short to GND.
CANH short to GND.
CANH2BAT
CANH2GND
RXPR
No RXD permanent recessive.
RXD permanent recessive.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
55
FUNCTIONAL DEVICE OPERATION
LOGIC COMMANDS AND REGISTERS
INTERRUPT REGISTER (INTR)
Tables 41 through 43 contain the Interrupt Register information. The INTR register allows masking or enabling the interrupt
source. A read operation identifies the interrupt source. Table 43 provides status bit information. The status bits of the INTR
register content are copies of the IOR, CAN, TIM, and LPC registers status content. To clear the Interrupt Register bits, the IOR,
CAN, TIM, and/or LPC registers must be cleared (read register) and the recovery condition must occur. Errors bits are latched
in the CAN register and the IOR register.
Table 41. Interrupt Register
INTR
R/W
D3
D2
HSOT-V2LOW
HSOT
D1
D0
(67)
VSUPLOW
VSUPLOW
V1TEMP
V1TEMP
W
R
–
CANF
CANF
0
$111b
Reset Value
Reset Condition (Write)(68)
Notes
0
0
0
–
POR, RST
POR, RST
POR, RST
POR, RST
67. If only HSOT-V2LOW interrupt is selected (only bit D2 set in INTR register), reading INTR register bit D2 leads to two possibilities:
1. Bit D2 = 1: Interrupt source is HSOT.
2. Bit D2 = 0: Interrupt source is V2LOW.
HSOT and V2LOW bits status are available in the IOR register.
68. See Table 13, page 46, for definitions of reset conditions.
Table 42. Interrupt Register Control Bits
Name
Description
Mask bit for CAN failures.
CANF
Mask bit for VDD medium temperature (pre-warning).
Mask bit for HS over-temperature AND V2LTH < 4.0 V.
Mask bit for VBF(EW) < 5.8 V.
VDDTEMP
HSOT- V2LOW
VSUPLOW
When the mask bit is set, the INT pin goes LOW if the appropriate condition occurs. Upon a wake-up condition from Stop mode
due to over-current detection (IDDS-WU1 or IDDS-WU2), an INT pulse is generated; however, INTR register content remains at 0000
(not bit set into the INTR register).
Table 43. Interrupt Register Status Bits
Name
Logic
Description
No VBF(EW) < 5.8 V.
VBF(EW) < 5.8 V.
0
1
0
1
0
1
0
1
VSUPLOW
No HS over-temperature.
HS over-temperature.
HSOT
VDDTEMP
CANF
No VDD medium temperature (pre-warning).
VDD medium temperature (pre-warning).
No CAN failure.
CAN failure.
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
56
TYPICAL APPLICATIONS
TYPICAL APPLICATIONS
SBC POWER SUPPLY
The 33742 is supplied from the battery line. A serial diode is necessary to protect the device against negative transient pulses
and from reverse battery. This is illustrated in Figure 31.
V
Q1
PWR
V2
33742
VSUP Monitor
Dual Voltage Regulator
VDD Monitor
R5
D1
C1
V2CTRL
V2
V
SUP
C2
Rp
Rp
C10 C5
R1
VDD
to L1
C6
5.0V/200mA
Mode Control
SW1
C3
HS
Control
C4
Oscillator
HS
INT
Interrupt
Watchdog
Reset
WDOG
RST
L0
L1
L2
L3
Programmable
Wake-up Input
R2
to L1
MOSI
SCLK
MISO
CS
MCU
SPI Interface
SW2
SW3
C7
CANH
CANL
TXD
RXD
1.0 Mbps CAN
Physical Interface
GND
R3
Internal
Module
Supply
to L2
Rd
Rd
C8
C9
Safe Circuitry
SW4
Clamp (1)
to L3
R4
Connector
Legend
D1: Example: 1N4002 type
Q1: MJD32C
C2: 100 nF
C3: 47 F
C4: 100 nF
R1, R2, R3, R4: 10k
C5: 47 F tantalum or 100 F chemical
Rp, Rd: Example: 1.0k depending on switch type.
C6, C7, C8, C9, C10: 100 nF
R5: 2.2 k
C1: 10 F
(1) Clamp circuit to ensure max ratings for HS (HS from
-0.3V to VSUP +0.3) are respected.
Figure 31. SBC Typical Application Schematic
VOLTAGE REGULATOR
The SBC contains two 5.0 V regulators: a V1 regulator, fully integrated and protected, and a V2 regulator, which operates with
an external ballast transistor.
VDD REGULATOR
The VDD regulator provides 5.0 V output, 2.0% accuracy with current capability of 200 mA max. It requires external decoupling
and stabilizing capacitors. The minimum recommended values are as follows:
• C4: 100 nF
• C3: 10 F < C3 <22 F, ESR < 1.0 or
• C3: 22 F < C3 <47 F, ESR < 5.0 or
33742
Analog Integrated Circuit Device Data
Freescale Semiconductor
57
TYPICAL APPLICATIONS
• C3: 47 F, ESR < 10
V2 REGULATOR: OPERATING WITH EXTERNAL BALLAST TRANSISTOR
The V2 regulator is a tracking regulator of the VDD output. Its accuracy relative to VDD is ±1.0%. It requires external
decoupling and stabilizing capacitors.
The recommended value are as follows:
• 22 F, ESR < 5.0
• 47 F, ESR < 10
The V2 pin has two functions: it is a sense input for the V2 regulator and is a 5.0 V power supply input to the CAN interface.
With respect to ballast transistor selection, either PNP or PMOS transistors may be used. A resistor between base and emitter
(or source and drain) is necessary to ensure proper operation and optimized performances. Recommended bipolar transistor is
MJD32C.
V2 REGULATOR: OPERATION WITHOUT BALLAST TRANSISTOR
The external ballast transistor is optional. If the application does not requires more than the maximum output current capability
of the VDD regulator, then the ballast transistor can be omitted. The thermal aspects must be analyzed as well.
The electrical connection is illustrated in Figure 32.
No Connect
33742
V
PWR
V2CTRL
VSUP
V2
Components List
C1: 22 F
VDD
C2
C1
C3
C4
C2: 100 nF
V
DD
C3: >10 F
C4: 100 nF
RESET
RST
MCU
Figure 32. V2 Regulator Electrical Connection
FAILURE ON VDD, WDOG, RESET, AND INT PINS
The paragraphs below describe the behavior of the device and of the INT, RST, and WDOG pins at power-up and under failure
of the VDD regulator.
POWER-UP AND SBC ENTERING NORMAL OPERATION
After power-up the 33742 enters Normal Request mode (CAN interface is in TXRX mode): VDD is on and V2 is off.
After 350 ms if no watchdog is written (no TIM1 register write), a reset occurs and the 33742 returns to Normal Request mode.
During this sequence WDOG is active (low level).
Once watchdog is written, the 33742 goes to Normal mode: VDD is still on and V2 turns on, WDOG is no longer active, and
the RST pin is HIGH. If watchdog is not refreshed, the 33742 generates a reset and returns to Normal Request mode. Figure 33,
illustrates the operation.
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TYPICAL APPLICATIONS
Missing Watchdog Refresh
Watchdog Refresh
VDD
SPI (CS)
Watchdog
Refresh
WD
RST
350ms
INT
SBC in Normal Request
& Reset modes
SBC in Normal
mode
SBC in Normal
Request & Reset
mode
SBC in
Reset
mode
Reset each 350 ms
Figure 33. Power up sequence, No W/D write at first
POWER UP AND VDD GOING LOW WITH STOP MODE AS DEFAULT LOW POWER MODE IS SELECTED
The first part of Figure 34 is identical to Figure 33. If VDD is pulled below VDD under-voltage reset (typ 4.6 V), say by an over-
current or short-circuit (for instance, short to 4.0 V), and if a low power mode previously selected was Stop mode, the 33742
enters Reset mode (RST pin is active). The WDOG pin stays HIGH, but the high level (Voh) follows V1 level. The INT pin goes
LOW.
When the VDD overload condition is removed, the 33742 restarts in Normal Request mode.
Under-voltage at VDD (VDD < VRSTTH
)
Watchdog Refresh
VDD
350 ms
SPI (CS)
WD
RST
INT
SBC in
Reset
mode
SBC in Normal Request
& Reset modes
SBC in Normal
Reset mode
SBC in Normal
mode
Reset each 350 ms
Figure 34. Under-voltage on VDD
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TYPICAL APPLICATIONS
POWER-UP AND VDD GOING LOW WITH SLEEP MODE AS DEFAULT LOW POWER MODE IS SELECTED
The first part of Figure 35 is identical to Figure 34. If VDD is pulled below the VDD under-voltage reset (typ 4.6 V), say by an
over-current or short-circuit (for instance, short to 4.0 V), and if the low power mode previously selected was Sleep mode and if
the BATFAIL flag has been cleared, the 33742 enters in Reset mode for a time period of 100 ms. The WDOG pin stays HIGH,
but the high level (VOH) follows VDD level. The RST and INT pins are low. After 100 ms the 33742 goes into Sleep mode, and
the VDD and V2 are off.
Figure 35 shows an example wherein VDD is shorted to 4.0 V, and after 100 ms the 33742 enters Sleep mode.
.
Under-voltage at VDD
Watchdog Refresh
VDD
SPI (CS)
100 ms
WD
RST
Reset mode
INT
SBC in Sleep mode
SBC in
Reset
mode
SBC in Normal Request
& Reset modes
SBC in Normal
mode
SBC in Reset mode for
100ms, then enter
Sleep mode
Reset each 350 ms
Figure 35. Under-voltage at VDD. Sleep mode selected.
CANH (33742)
CANL (33742)
CANH
CH
CL
R5
CANL
CAN Connector
Legend
R5: 60
CL, CH: 220 pF
Figure 36. CAN Bus Standard Termination
CANH
CANH (33742)
CANL (33742)
Legend
R6, R7: 30
CL, CH: 220 pF
CS: > 470 pF
R6
R7
CH
CL
CANL
CAN Connector
CS
Figure 37. CAN Bus Split Termination
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PACKAGING
PACKAGE AND THERMAL CONSIDERATIONS
PACKAGING
PACKAGE AND THERMAL CONSIDERATIONS
The 33742 SBC is a standard surface mount 28-pin SOIC wide body. In order to improve the thermal performances of the
SOIC package, eight of the 28 pins are internally connected to the package lead frame for heat transfer to the printed circuit
board.
PACKAGING DIMENSIONS
Important For the most current revision of the package, visit www.freescale.com and perform a keyword search on the
98ASB42345B drawing number below. Dimensions shown are provided for reference ONLY.
EG SUFFIX (PB-FREE)
28-LEAD SOICW
98ASB42345B
ISSUE G
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PACKAGING
PACKAGING DIMENSIONS
EG SUFFIX (PB-FREE)
28-LEAD SOICW
98ASB42345B
ISSUE G
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PACKAGING
PACKAGING DIMENSIONS
EP SUFFIX (PB-FREE)
48-LEAD QFN
98ASA10825D
ISSUE 0
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63
PACKAGING
PACKAGING DIMENSIONS
EP SUFFIX (PB-FREE)
48-LEAD QFN
98ASA10825D
ISSUE 0
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PACKAGING
PACKAGING DIMENSIONS
EP SUFFIX (PB-FREE)
48-LEAD QFN
98ASA10825D
ISSUE 0
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65
ADDITIONAL DOCUMENTATION
THERMAL ADDENDUM (REV 2.0)
ADDITIONAL DOCUMENTATION
33742SOICW
THERMAL ADDENDUM (REV 2.0)
Introduction
This thermal addendum is provided as a supplement to the MC33742
technical datasheet. The addendum provides thermal performance
information that may be critical in the design and development of system
applications. All electrical, application, and packaging information is
provided in the data sheet.
28-PIN SOICW
Packaging and Thermal Considerations
The MC33742 is offered in a 28 pin SOICW exposed pad, single die
package. There is a single heat source (P), a single junction temperature
(TJ), and thermal resistance (RJA).
TJ
.
=
RJA
P
EG SUFFIX (PB-FREE)
98ASB42345B
The stated values are solely for a thermal performance comparison of
one package to another in a standardized environment. This methodology
is not meant to and will not predict the performance of a package in an
application-specific environment. Stated values were obtained by
measurement and simulation according to the standards listed below.
28-PIN SOICW
Note For package dimensions, refer to
98ASB42345B.
Standards
Table 44. Thermal Performance Comparison
Thermal Resistance
[C/W]
41
(1), (2)
R
R
R
R
JA
JB
JA
JC
(2), (3)
(1), (4)
(5)
10
68
220
Notes:
1. Per JEDEC JESD51-2 at natural convection, still air
condition.
2. 2s2p thermal test board per JEDEC JESD51-7.
3. Per JEDEC JESD51-8, with the board temperature on the
center trace near the center lead.
4. Single layer thermal test board per JEDEC JESD51-3.
5. Thermal resistance between the die junction and the
package top surface; cold plate attached to the package top
surface and remaining surfaces insulated.
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ADDITIONAL DOCUMENTATION
THERMAL ADDENDUM (REV 2.0)
1.0
0.2
1.0
0.2
* All measurements
are in millimeters
28 Pin SOICW
1.27 mm Pitch
16.0 mm x 7.5 mm Body
Figure 38. Surface Mount for SOIC Wide Body non-Exposed Pad
1
28
RXD
TXD
VDD
RST
INT
GND
GND
GND
GND
V2
WDOG
CS
2
27
26
25
24
23
22
21
20
19
18
17
16
15
3
MOSI
MISO
SCLK
GND
GND
GND
GND
CANL
CANH
L3
4
A
5
6
7
8
9
10
11
12
13
14
V2CTRL
VSUP
HS
L2
L1
L0
33742 Pin Connections
28-Pin SOICW
1.27 mm Pitch
18.0 mm x 7.5 mm Body
Figure 39. Thermal Test Board
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ADDITIONAL DOCUMENTATION
THERMAL ADDENDUM (REV 2.0)
Device on Thermal Test Board
Material:
Single layer printed circuit board
FR4, 1.6 mm thickness
Cu traces, 0.07 mm thickness
Outline:
80 mm x 100 mm board area,
including edge connector for thermal
testing
Area A:
Cu heat-spreading areas on board
surface
Ambient Conditions: Natural convection, still air
Table 45. Thermal Resistance Performance
RθJA [°C/W]
[mm²]
0
300
600
A
68
52
47
RJAis the thermal resistance between die junction and ambient air.
80
70
60
50
40
30
x
R
JA
20
10
0
0
300
Heat spreading area [mm²]
600
A
Figure 40. Device on Thermal Test Board RJA
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ADDITIONAL DOCUMENTATION
THERMAL ADDENDUM (REV 2.0)
100
10
1
x
RJA
0.1
1.00E-03 1.00E-02 1.00E-01 1.00E+00 1.00E+01 1.00E+02 1.00E+03 1.00E+04
Time[s]
Figure 41. Transient Thermal Resistance R A,
J
1 W Step response, Device on Thermal Test Board Area A = 600 (mm2)
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REVISION HISTORY
REVISION HISTORY
REVISION
DATE
DESCRIPTION OF CHANGES
•
•
Converted to Freescale format
Implemented Revision History page
2/2006
3
•
•
Added Thermal Addendum (Rev. 1.0)
Changed Data Sheet from “Advanced” to “Final”
6/2006
4
8/2006
8/2006
•
•
Added MCZ33742EG/R2 and MCZ33742SEG/R2 to the Ordering Information block
5
6
Replaced label for Logic Inputs to Logic Signals (RXD, TXD, MOSI, MISO, CS, SCLK, RST, WDOG, and
INT) on page 7
•
•
Removed all references to the 54 pin package.
Removed Peak Package Reflow Temperature During Reflow (solder reflow) parameter from Maximum
Ratings on page 7. Added note with instructions from www.freescale.com.
10/2006
2/2007
7
8
•
•
Revised () and (),
Restated notes in Maximum Ratings on page 7
3/2007
5/2007
•
Text corrections to the included thermal addendum
9
•
•
•
Added EP 48 pin QFN package
Added 98ARH99048A Package drawing
Added PCZ33742EP/R2 to the ordering information
10
•
•
•
Made changes defining RXD as a push-pull structure on page 15, 22, 38, and 39
Updated figures Figure 12 and Figure 25
Added provisions of differentiation for 28-pin SOIC and 48-pin QFN for ESD Capability, Human Body
Model(1) on page 7, Watchdog Period Normal and Standby Modes on page 17, and Normal Request
Mode Timeout on page 17
6/2008
11
•
•
•
Update the Freescale format and style to the current standards
Added the Functional Internal Block Description section
Changed PCZ33742EP/R2 to MC33742EP/R2 in the ordering information
2/2011
7/2011
•
Added MC33742PEG/R2, MC33742SPEG/R2, and MC33742PEP/R2 to the ordering information
12.0
13.0
•
•
Updated Freescale form and style
Removed MCZ33742EG/R2, MC33742SDW/R2, MCZ33742SEG/R2, and MCZ33742EP/R2 from the
ordering information
•
•
Added a For SPI Operation on page 47
Updated document properties.
6/2013
14.0
33742
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Freescale Semiconductor
Information in this document is provided solely to enable system and software implementers to use Freescale products.
There are no express or implied copyright licenses granted hereunder to design or fabricate any integrated circuits based
on the information in this document.
How to Reach Us:
Home Page:
freescale.com
Web Support:
freescale.com/support
Freescale reserves the right to make changes without further notice to any products herein. Freescale makes no
warranty, representation, or guarantee regarding the suitability of its products for any particular purpose, nor does
Freescale assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any
and all liability, including without limitation consequential or incidental damages. “Typical” parameters that may be
provided in Freescale data sheets and/or specifications can and do vary in different applications, and actual performance
may vary over time. All operating parameters, including “typicals,” must be validated for each customer application by
customer’s technical experts. Freescale does not convey any license under its patent rights nor the rights of others.
Freescale sells products pursuant to standard terms and conditions of sale, which can be found at the following address:
freescale.com/SalesTermsandConditions.
Freescale and the Freescale logo, are trademarks of Freescale Semiconductor, Inc., Reg. U.S. Pat. & Tm. Off.
SMARTMOS is a trademark of Freescale Semiconductor, Inc. All other product or service names are the property of their
respective owners.
© 2013 Freescale Semiconductor, Inc.
Document Number: MC33742
Rev. 14.0
6/2013
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