MC34910BAC,557 [NXP]

Buffer/Inverter Based Peripheral Driver, 0.11A, PQFP32;
MC34910BAC,557
型号: MC34910BAC,557
厂家: NXP    NXP
描述:

Buffer/Inverter Based Peripheral Driver, 0.11A, PQFP32

驱动 接口集成电路
文件: 总100页 (文件大小:2084K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
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Document Number: MC33910  
Rev. 9.0, 7/2016  
NXP Semiconductors  
Technical Data  
LIN system basis chip with  
high-side drivers  
33910  
The 33910G5/BAC is a SMARTMOS Serial Peripheral Interface (SPI) controlled  
System Basis Chip (SBC), combining many frequently used functions in an MCU  
based system, plus a Local Interconnect Network (LIN) transceiver. The 33910  
has a 5.0 V, 50 mA/60 mA low dropout regulator with full protection and reporting  
features. The device provides full SPI readable diagnostics and a selectable  
timing watchdog for detecting errant operation. The LIN Protocol Specification  
2.0 and 2.1 compliant LIN transceiver has waveshaping circuitry which can be  
disabled for higher data rates.  
SYSTEM BASIS CHIP WITH LIN  
2ND GENERATION  
Two 50 mA/60 mA high-side switches with optional pulse-width modulated  
(PWM) are implemented to drive small loads. One high voltage input is available  
for use in contact monitoring, or as external wake-up input. This input can be  
used as high voltage Analog Input. The voltage on this pin is divided by a  
selectable ratio and available via an analog multiplexer.  
The 33910 has three main operating modes: Normal (all functions available),  
Sleep (VDD off, wake-up via LIN, wake-up inputs (L1), cyclic sense and forced  
wake-up), and Stop (VDD on with limited current capability, wake-up via CS, LIN  
bus, wake-up inputs, cyclic sense, forced wake-up and external reset).  
AC SUFFIX (Pb-FREE)  
98ASH70029A  
The 33910 is compatible with LIN Protocol Specification 2.0, 2.1, and  
SAEJ2602-2.  
32-PIN LQFP  
Features  
• Full-duplex SPI interface at frequencies up to 4.0 MHz  
• LIN transceiver capable of up to 100 kbps with wave shaping  
• Two 50 mA/60 mA high-side switches  
• One high voltage analog/logic Input  
• Configurable window watchdog  
Applications  
• Window lift  
• Mirror switch  
• Door lock  
• Sunroof  
• 5.0 V low drop regulator with fault detection and low voltage reset (LVR)  
circuitry  
• Light control  
• Switched/protected 5.0 V output (used for Hall sensors)  
33910  
VBAT  
VSENSE  
HS1  
VS1  
VS2  
L1  
VDD  
PWMIN  
ADOUT0  
LIN INTERFACE  
LIN  
MCU  
MOSI  
MISO  
SCLK  
CS  
RXD  
TXD  
IRQ  
HVDD  
HS2  
WDCONF  
RST  
Figure 1. 33910 simplified application diagram  
© 2016 NXP B.V.  
1
Orderable parts  
The 33910G5 data sheet is within MC33910G5 product specifications - page 3 to page 49  
The 33910BAC data sheet is within MC33911BAC product specifications - page 50 to page 95  
Table 1. Orderable part variations (1)  
Device  
Temperature  
Package  
Changes  
MC33910G5AC/R2  
-40 °C to 125 °C  
• Increase ESD GUN IEC61000-4-2 (gun test contact with 150 pF, 330 Ω test  
conditions) performance to achieve 6.0 kV min on the LIN pin.  
• Immunity against ISO7637 pulse 3b  
• Reduce EMC emission level on LIN  
• Improve EMC immunity against RF – target new specification including 3x68 pF  
• Comply with J2602 conformance test  
MC34910G5AC/R2  
-40 °C to 85 °C  
32 LQFP  
MC33910BAC/R2  
MC34910BAC/R2  
-40 °C to 125 °C  
-40 °C to 85 °C  
Initial release  
Notes  
1. To order parts in Tape & Reel, add the R2 suffix to the part number.  
33910  
2
NXP Semiconductors  
1
MC33910G5 product specifications - page 3 to page 49  
33910  
NXP Semiconductors  
3
2
Internal block diagram  
RST IRQ  
VS2  
VS1  
VDD  
INTERRUPT CONTROL  
MODULE  
AGND  
PGND  
VOLTAGE REGULATOR  
LVI, HVI,  
ALL OT (VDD, HS, LIN, SD)  
RESET CONTROL  
MODULE  
LVR, WD, EXT ΜC  
5.0 V OUTPUT  
MODULE  
HVDD  
WINDOW  
WATCHDOG  
MODULE  
VS2  
HIGH-SIDE  
CONTROL  
MODULE  
PWMIN  
HS1  
HS2  
VS2  
MISO  
MOSI  
SCLK  
SPI  
&
CONTROL  
VBAT  
SENSE MODULE  
VSENSE  
CS  
CHIP TEMPERATURE  
SENSE MODULE  
ADOUT0  
L1  
ANALOG INPUT  
MODULE  
WAKE-UP MODULE  
DIGITAL INPUT MODULE  
RXD  
TXD  
LIN PHYSICAL  
LAYER  
LIN  
LGND  
WDCONF  
Figure 2. 33910 simplified internal block diagram  
33910  
4
NXP Semiconductors  
3
Pin connections  
3.1  
Pinout diagram  
RXD  
TXD  
1
2
3
4
5
6
7
8
24  
23  
22  
21  
20  
19  
18  
17  
HS2  
L1  
MISO  
NC*  
NC*  
NC*  
NC*  
PGND  
NC*  
MOSI  
SCLK  
CS  
ADOUT0  
PWMIN  
* See Recommendation in Table below  
Figure 3. 33910 pin connections  
3.2  
Pin definitions  
A functional description of each pin can be found in the Functional pin description.  
Table 2. 33910 pin definitions  
Pin  
Pin name  
Formal name  
Definition  
This pin is the receiver output of the LIN interface which reports the state of the bus voltage  
to the MCU interface.  
1
2
3
RXD  
TXD  
Receiver Output  
Transmitter Input  
SPI Output  
This pin is the transmitter input of the LIN interface which controls the state of the bus output.  
SPI (Serial Peripheral Interface) data output. When CS is high, pin is in the high-impedance  
state.  
MISO  
4
5
6
7
8
MOSI  
SCLK  
SPI Input  
SPI Clock  
SPI (Serial Peripheral Interface) data input.  
SPI (Serial Peripheral Interface) clock Input.  
CS  
SPI Chip Select  
SPI (Serial Peripheral Interface) chip select input pin. CS is active low.  
ADOUT0  
PWMIN  
Analog Output Pin 0 Analog Multiplexer Output.  
PWM Input High-side Pulse Width Modulation Input.  
33910  
NXP Semiconductors  
5
Table 2. 33910 pin definitions (continued)  
Pin  
Pin name  
Formal name  
Definition  
Bidirectional Reset I/O pin - driven low when any internal reset source is asserted. RST is  
active low.  
9
RST  
Internal Reset I/O  
Internal Interrupt  
Output  
Interrupt output pin, indicating wake-up events from Stop modemode or events from Normal  
and Normal request modes. IRQ is active low.  
10  
11  
12  
IRQ  
NC  
Not Connected  
This pin must not be connected.  
Watchdog  
Configuration Pin  
This input pin is for configuration of the watchdog period and allows the disabling of the  
watchdog.  
WDCONF  
13  
14  
LIN  
LIN Bus  
This pin represents the single-wire bus transmitter and receiver.  
LGND  
LIN Ground Pin  
This pin is the device LIN ground connection. It is internally connected to the PGND pin.  
15, 16, 17, 19,  
20, 21 & 22  
NC  
PGND  
L1  
Not Connected  
Power Ground Pin  
Wake-up Input  
This pin must not be connected or connected to ground.  
18  
23  
This pin is the device low-side ground connection. It is internally connected to the LGND pin.  
This pin is the wake-up capable digital input(2). In addition, L1 input can be sensed analog  
via the analog multiplexer.  
24  
25  
HS2  
HS1  
High-side Outputs  
Power Supply Pin  
High-side switch outputs.  
26  
27  
VS2  
VS1  
These pins are device battery level power supply pins. VS2 is supplying the HSx drivers  
while VS1 supplies the remaining blocks.(3)  
28  
29  
NC  
Not Connected  
This pin can be left opening or connected to any potential ground or power supply  
Battery voltage sense input.(4)  
VSENSE  
Voltage Sense Pin  
Hall Sensor Supply  
Output  
30  
31  
HVDD  
+5.0 V switchable supply output pin.(5)  
Voltage Regulator  
Output  
VDD  
+5.0 V main voltage regulator output pin.(6)  
32  
AGND  
Analog Ground Pin  
This pin is the device analog ground connection.  
Notes  
2. When used as digital input, a series 33 kΩ resistor must be used to protect against automotive transients.  
3. Reverse battery protection series diodes must be used externally to protect the internal circuitry.  
4. This pin can be connected directly to the battery line for voltage measurements. The pin is self protected against reverse battery connections. It is  
strongly recommended to connect a 10 kΩ resistor in series with this pin for protection purposes.  
5. External capacitor (1.0 µF < C < 10 µF; 0.1 Ω < ESR < 5.0 Ω) required.  
6. External capacitor (2.0 µF < C < 100 µF; 0.1 Ω < ESR < 10 Ω) required.  
33910  
6
NXP Semiconductors  
4
Electrical characteristics  
4.1  
Maximum ratings  
Table 3. Maximum ratings  
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage  
to the device.  
Symbol  
Ratings  
Value  
Unit  
Notes  
Electrical ratings  
Supply Voltage at VS1 and VS2  
• Normal Operation (DC)  
• Transient Conditions (load dump)  
VSUP(SS)  
VSUP(PK)  
-0.3 to 27  
-0.3 to 40  
V
V
VDD  
Supply Voltage at VDD  
-0.3 to 5.5  
(7)  
(8)  
Input/Output Pins Voltage  
• CS, RST, SCLK, PWMIN, ADOUT0, MOSI, MISO, TXD, RXD, HVDD  
• Interrupt Pin (IRQ)  
VIN  
-0.3 to VDD +0.3  
-0.3 to 11  
V
V
VIN(IRQ)  
VHS  
-0.3 to VSUP +0.3  
HS1 and HS2 Pin Voltage (DC)  
L1 Pin Voltage  
• Normal Operation with a series 33 k resistor (DC)  
• Transient input voltage with external component (according to ISO7637-2)  
(See Figure 5)  
VL1DC  
VL1TR  
-18 to 40  
±100  
V
V
V
A
VVSENSE  
VSENSE Pin Voltage (DC)  
-27 to 40  
LIN Pin Voltage  
• Normal Operation (DC)  
• Transient input voltage with external component (according to ISO7637-2)  
(See Figure 5)  
VBUSDC  
VBUSTR  
-18 to 40  
-150 to 100  
IVDD  
VDD Output Current  
Internally Limited  
ESD Capability  
• AECQ100  
VESD1-1  
VESD1-2  
VESD1-3  
• Human Body Model - JESD22/A114 (C  
= 100 pF, R  
= 1500 Ω)  
ZAP  
ZAP  
±8.0 k  
±6.0 k  
±2000  
• LIN Pin  
• L1  
• all other Pins  
• Charge Device Model - JESD22/C101 (C  
= 4.0 pF)  
±750  
±500  
VESD2-1  
VESD2-2  
ZAP  
• Corner Pins (Pins 1, 8, 9, 16, 17, 24, 25 and 32)  
• All other Pins (Pins 2-7, 10-15, 18-23, 26-31)  
• According to LIN Conformance Test Specification / LIN EMC Test  
Specification, August 2004 (C = 150 pF, R = 330 Ω)  
V
ZAP  
ZAP  
±20 k  
±11 k  
>±12 k  
±6000  
• Contact Discharge, Unpowered  
• LIN pin with 220 pF  
• LIN pin without capacitor  
VESD3-1  
VESD3-2  
VESD3-3  
VESD3-4  
• VS1/VS2 (100 nF to ground)  
• L1 input (33 kΩ serial resistor)  
• According to IEC 61000-4-2 (C  
= 150 pF, R  
= 330 Ω)  
ZAP  
ZAP  
• Unpowered  
• LIN pin with 220 pF and without capacitor  
• VS1/VS2 (100 nF to ground)  
VESD4-1  
VESD4-2  
VESD4-3  
±8000  
±8000  
±8000  
• L1 input (33 kΩ serial resistor)  
Notes  
7. Exceeding voltage limits on specified pins may cause a malfunction or permanent damage to the device.  
8. Extended voltage range for programming purpose only.  
33910  
NXP Semiconductors  
7
Table 3. Maximum ratings (continued)  
All voltages are with respect to ground unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage  
to the device.  
Symbol  
Ratings  
Value  
Unit  
Notes  
Thermal ratings  
Operating Ambient Temperature  
• 33910  
• 34910  
(9)  
T
A
-40 to 125  
-40 to 85  
°C  
T
J
Operating Junction Temperature  
Storage Temperature  
-40 to 150  
-55 to 150  
°C  
°C  
TSTG  
Thermal Resistance, Junction to Ambient  
Natural Convection, Single Layer board (1s)  
Natural Convection, Four Layer board (2s2p)  
(9), (10)  
(9), (11)  
RθJA  
85  
56  
°C/W  
(12)  
RθJC  
Thermal Resistance, Junction to Case  
23  
°C/W  
(13), (14)  
TPPRT  
Peak Package Reflow Temperature During Reflow  
Note 14  
°C  
Notes  
9. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient  
temperature, air flow, power dissipation of other components on the board, and board thermal resistance.  
10. Per JEDEC JESD51-2 with the single layer board (JESD51-3) horizontal.  
11. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.  
12. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1).  
13. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause  
malfunction or permanent damage to the device.  
14. NXP’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and  
Moisture Sensitivity Levels (MSL), go to www.NXP.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all  
orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.  
33910  
8
NXP Semiconductors  
4.2  
Static electrical characteristics  
Table 4. Static electrical characteristics  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Supply voltage range (VS1, VS2)  
VSUP  
5.5  
18  
27  
40  
V
V
V
Nominal Operating Voltage  
Functional Operating Voltage  
Load Dump  
(15)  
VSUPOP  
VSUPLD  
Supply current range (VSUP = 13.5 V)  
(16)  
IRUN  
Normal Mode (IOUT at V  
= 10 mA), LIN Recessive State  
4.5  
10  
mA  
µA  
DD  
Stop Mode, VDD ON with IOUT = 100 µA, LIN Recessive State  
• 5.5 V < VSUP < 12 V  
(16), (17),  
47  
62  
180  
80  
90  
400  
ISTOP  
(18) (19)  
• VSUP = 13.5 V  
,
• 13.5 V < VSUP < 18 V  
Sleep Mode, VDD OFF, LIN Recessive State  
• 5.5 V < VSUP < 12 V  
27  
33  
160  
35  
48  
300  
(16), (18)  
(20)  
ISLEEP  
µA  
µA  
• VSUP = 13.5 V  
• 13.5 V VSUP < 18 V  
ICYCLIC  
Cyclic Sense Supply Current Adder  
10  
Supply under/overvoltage detections  
Power-On Reset (BATFAIL)  
VBATFAIL  
(21) (20)  
1.5  
3.0  
0.9  
3.9  
• Threshold (measured on VS1)  
• Hysteresis (measured on VS1)  
V
V
,
VBATFAIL_HYS  
VSUP Undervoltage Detection (VSUV Flag) (Normal and Normal  
Request Modes, Interrupt Generated)  
• Threshold (measured on VS1)  
• Hysteresis (measured on VS1)  
VSUV  
VSUV_HYS  
5.55  
6.0  
0.2  
6.6  
VSUP Overvoltage Detection (VSOV Flag) (Normal and Normal  
Request Modes, Interrupt Generated)  
• Threshold (measured on VS1)  
• Hysteresis (measured on VS1)  
V
VSOV  
VSOV_HYS  
18  
19.25  
1.0  
20.5  
Notes  
15. Device is fully functional. All features are operating.  
16. Total current (IVS1 + IVS2) measured at GND pins excluding all loads, cyclic sense disabled.  
17. Total IDD current (including loads) below 100 µA.  
18. Stop and Sleep modes current increases if VSUP exceeds13.5 V.  
19. This parameter is guaranteed after 90 ms.  
20. This parameter is guaranteed by process monitoring but not production tested.  
21. The Flag is set during power up sequence. To clear the flag, a SPI read must be performed.  
33910  
NXP Semiconductors  
9
Table 4. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Voltage regulator (22) (VDD)  
Normal Mode Output Voltage  
• 1.0 mA < I < 50 mA; 5.5 V < V  
VDDRUN  
IVDDRUN  
VDDDROP  
4.75  
60  
5.00  
110  
0.1  
5.25  
200  
V
mA  
V
< 27 V  
SUP  
VDD  
Normal Mode Output Current Limitation  
Dropout Voltage  
(23)  
0.25  
• I  
= 50 mA  
VDD  
Stop Mode Output Voltage  
• I < 5.0 mA  
V
4.75  
6.0  
5.0  
13  
5.25  
36  
V
DDSTOP  
VDD  
I
Stop Mode Output Current Limitation  
Line Regulation  
mA  
VDDSTOP  
LR  
• Normal mode, 5.5 V < V  
< 18 V; I  
= 10 mA  
VDD  
RUN  
25  
25  
mV  
SUP  
LR  
• Stop mode, 5.5 V < V  
< 18 V; I  
= 1.0 mA  
VDD  
STOP  
SUP  
Load Regulation  
LD  
• Normal mode, 1.0 mA < I  
< 50 mA  
RUN  
80  
50  
mV  
°C  
VDD  
LD  
• Stop mode, 0.1 mA < I  
< 5.0 mA  
STOP  
VDD  
Overtemperature Prewarning (Junction)  
• Interrupt generated, VDDOT Bit Set  
(24)  
T
PRE  
90  
115  
13  
140  
(24)  
(24)  
(24)  
T
Overtemperature Prewarning Hysteresis  
°C  
°C  
°C  
PRE_HYS  
T
Overtemperature Shutdown Temperature (Junction)  
Overtemperature Shutdown Hysteresis  
150  
170  
13  
190  
SD  
T
SD_HYS  
Hall sensor supply output (25) (HVDD)  
V
Voltage matching HVDDACC = (HVDD-VDD) / VDD * 100%  
DD  
H
-2.0  
20  
2.0  
50  
%
VDDACC  
• IHVDD = 15 mA  
I
Current Limitation  
35  
mA  
mV  
HVDD  
Dropout Voltage  
• IHVDD = 15 mA; IVDD = 5.0 mA  
H
160  
300  
VDDDROP  
Line Regulation  
• IHVDD = 5.0 mA; IVDD = 5.0 mA  
LR  
LD  
40  
20  
mV  
mV  
HVDD  
HVDD  
Load Regulation  
• 1.0 mA > IHVDD > 15 mA; IVDD = 5.0 mA  
Notes  
22. Specification with external capacitor 2.0 µF < C < 100 µF and 100 mΩ ≤ ESR 10 Ω.  
23. Measured when voltage has dropped 250 mV below its nominal Value (5.0 V).  
24. This parameter is guaranteed by process monitoring but not production tested.  
25. Specification with external capacitor 1.0 µF < C < 10 µF and 100 mΩ ≤ ESR 10 Ω.  
33910  
10  
NXP Semiconductors  
Table 4. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
RST input/output pin (RST)  
VRSTTH  
VOL  
VDD Low Voltage Reset Threshold  
4.3  
0.0  
4.5  
4.7  
0.9  
V
V
Low-state Output Voltage  
• IOUT = 1.5 mA; 3.5 V VSUP 27 V  
IOH  
High-state Output Current (0 V < VOUT < 3.5 V)  
-150  
1.5  
-250  
-350  
8.0  
µA  
mA  
Pull-down Current Limitation (internally limited)  
VOUT = VDD  
IPD_MAX  
VIL  
VIH  
0.3 x VDD  
VDD +0.3  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
MISO SPI output pin (MISO)  
Low-state Output Voltage  
• I = 1.5 mA  
VOL  
0.0  
1.0  
V
V
OUT  
High-state Output Voltage  
• IOUT = -250 µA  
VOH  
VDD -0.9  
VDD  
Tri-state Leakage Current  
ITRIMISO  
-10  
10  
µA  
• 0 V VMISO VDD  
SPI input pins (MOSI, SCLK, CS)  
VIL  
VIH  
0.3 x VDD  
VDD +0.3  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
MOSI, SCLK Input Current  
IIN  
-10  
10  
10  
30  
µA  
µA  
• 0 V VIN VDD  
CS Pull-up Current  
• 0 V < VIN < 3.5 V  
IPUCS  
20  
Interrupt output pin (IRQ)  
Low-state Output Voltage  
• IOUT = 1.5 mA  
VOL  
VOH  
IOUT  
0.0  
0.8  
V
V
High-state Output Voltage  
• IOUT = -250 µA  
VDD -0.8  
VDD  
Leakage Current  
• VDD VOUT ≤ 10 V  
2.0  
mA  
Pulse width modulation input pin (PWMIN)  
VIL  
VIH  
0.3 x VDD  
VDD +0.3  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
Pull-up current  
• 0 V < VIN < 3.5 V  
IPUPWMIN  
10  
20  
30  
µA  
33910  
NXP Semiconductors  
11  
Table 4. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
High-side outputs HS1 and HS2 pins (HS1, HS2)  
Output Drain-to-Source On Resistance  
• TJ = 25 °C, ILOAD = 50 mA; VSUP > 9.0 V  
7.0  
10  
14  
RDS(on)  
Ω
(26)  
(26)  
• TJ = 150 °C, ILOAD = 50 mA; VSUP > 9.0 V  
• TJ = 150 °C, ILOAD = 30 mA; 5.5 V < VSUP < 9.0 V  
Output Current Limitation  
ILIMHSX  
(27)  
(28)  
60  
90  
5.0  
250  
7.5  
10  
mA  
mA  
µA  
• 0 V < VOUT < VSUP - 2.0 V  
IOLHSX  
ILEAK  
Open Load Current Detection  
Leakage Current  
• -0.2 V < VHSX < VS2 + 0.2 V  
Short-circuit Detection Threshold  
• 5.5 V < VSUP < 27 V  
(29)  
VTHSC  
VSUP -2.0  
V
(30), (31)  
(31)  
THSSD  
THSSD_HYS  
Overtemperature Shutdown  
140  
160  
10  
180  
°C  
°C  
Overtemperature Shutdown Hysteresis  
L1 input pin (L1)  
Low Detection Threshold  
• 5.5 V < VSUP < 27 V  
(32)  
(32)  
(32)  
VTHL  
VTHH  
VHYS  
2.0  
3.0  
0.4  
2.5  
3.5  
0.8  
3.0  
4.0  
1.4  
V
V
V
High Detection Threshold  
• 5.5 V < VSUP < 27 V  
Hysteresis  
• 5.5 V < VSUP < 27 V  
Input Current  
• -0.2 V < VIN < VS1  
(33)  
(34)  
IIN  
-10  
10  
µA  
RL1IN  
Analog Input Impedance  
800  
1300  
2000  
kΩ  
Analog Input Divider Ratio (RATIOL1 = VL1 / VADOUT0  
• L1DS (L1 Divider Select) = 0  
• L1DS (L1 Divider Select) = 1  
)
RATIOL1  
0.95  
3.42  
1.0  
3.6  
1.05  
3.78  
Analog Output Offset Ratio  
• L1DS (L1 Divider Select) = 0  
• L1DS (L1 Divider Select) = 1  
VRATIOL1-OFFSET  
-80  
-22  
6.0  
2.0  
80  
22  
mV  
%
Analog Inputs Matching  
• L1DS (L1 Divider Select) = 0  
• L1DS (L1 Divider Select) = 1  
L1MATCHING  
96  
96  
100  
100  
104  
104  
Notes  
26. This parameter is production tested up to TA = 125 °C, and guaranteed by process monitoring up to TJ = 150 °C.  
27. When overcurrent occurs, the corresponding high-side stays ON with limited current capability and the HSxCL flag is set in the HSSR.  
28. When open load occurs, the flag (HSxOP) is set in the HSSR.  
29. HS automatically shutdown if HSOT occurs or if the HVSE flag is enabled and an overvoltage occurs.  
30. When overtemperature shutdown occurs, both high-sides are turned off. All flags in HSSR are set.  
31. Guaranteed by characterization but not production tested  
32. If L1 pin is unused it must be connected to ground.  
33. Analog multiplexer input disconnected from L1 input pin.  
34. Analog multiplexer input connected to L1 input pin.  
33910  
12  
NXP Semiconductors  
Table 4. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Window watchdog configuration pin (WDCONF) (35)  
R
External Resistor Range  
20  
200  
15  
kΩ  
EXT  
Watchdog Period Accuracy with External Resistor (Excluding Resistor  
Accuracy)  
(36)  
WD  
-15  
%
ACC  
Analog multiplexer  
Temperature Sense Analog Output Voltage  
• TA = -40 °C  
2.0  
2.8  
3.6  
-
3.0  
-
2.8  
3.6  
4.6  
VADOUT0_TEMP  
V
V
• TA = 25 °C  
• TA = 125 °C  
Temperature Sense Analog Output Voltage per characterization  
• TA = 25 °C  
(37)  
(37)  
VADOUT0_25  
3.1  
3.15  
3.2  
STTOV  
Internal Chip Temperature Sense Gain  
9.0  
9.9  
10.5  
10.2  
12  
mV/K  
mV/K  
Internal Chip Temperature Sense Gain per characterization at three  
temperatures. See Figure 16, Temperature sense gain  
STTOV_3T  
10.5  
VSENSE Input Divider Ratio (RATIOVSENSE = VVSENSE / VADOUT0  
• 5.5 V < VSUP < 27 V  
)
RATIOVSENSE  
5.0  
5.25  
5.25  
5.5  
VSENSE Input Divider Ratio (RATIOVSENSE=Vsense/Vadout0) per  
characterization  
• 5.5 <Vsup< 27 V  
(37)  
(37)  
RATIOVSENSECZ  
OFFSETVSENSE  
5.15  
5.35  
VSENSE Output Related Offset  
-30  
-30  
-10  
30  
0
mV  
mV  
OFFSETVSENSE  
VSENSE Output Related Offset per characterization  
-12.6  
_CZ  
Analog output (ADOUT0)  
Maximum Output Voltage  
VOUT_MAX  
VDD -0.35  
0.0  
VDD  
0.35  
V
V
• -5.0 mA < IO < 5.0 mA  
Minimum Output Voltage  
• -5.0 mA < IO < 5.0 mA  
VOUT_MIN  
RxD output pin (LIN physical layer) (RxD)  
Low-state Output Voltage  
• IOUT = 1.5 mA  
VOL  
0.0  
0.8  
V
V
High-state Output Voltage  
• IOUT = -250 µA  
VOH  
VDD -0.8  
VDD  
Notes  
35. For VSUP 4.7 V to 18 V  
36. Watchdog timing period calculation formula: tPWD [ms] = [0.466 * (REXT - 20)] + 10 with (REXT in kΩ)  
37. These limits have been defined after laboratory characterization on 3 lots and 30 samples. These tighten limits could not be guaranteed by  
production test.  
33910  
NXP Semiconductors  
13  
Table 4. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
TXD input pin (LIN physical layer) (TXD)  
VIL  
VIH  
0.3 x VDD  
VDD +0.3  
30  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
IPUIN  
Pin Pull-up Current, 0 V < VIN < 3.5 V  
10  
20  
µA  
LIN physical layer with J2602 feature enabled (bit DIS_J2602 = 0)  
VTH_UNDER_  
VOLTAGE  
LIN Undervoltage threshold  
• Positive and Negative threshold (VTHP, VTHN  
5.0  
6.0  
V
)
VJ2602_DEG  
Hysteresis (VTHP - VTHN  
)
400  
mV  
LIN physical layer, transceiver (LIN)(38)  
VBAT  
VSUP  
Operating Voltage Range  
Supply Voltage Range  
8.0  
7.0  
18  
18  
40  
V
V
V
VSUP_NON_OP  
Voltage Range within which the device is not destroyed  
-0.3  
Current Limitation for Driver Dominant State  
• Driver ON, VBUS = 18 V  
IBUS_LIM  
40  
-1.0  
90  
200  
mA  
mA  
µA  
Input Leakage Current at the receiver  
• Driver off; VBUS = 0 V; VBAT = 12 V  
IBUS_PAS_DOM  
IBUS_PAS_REC  
IBUS_NO_GND  
Leakage Output Current to GND  
20  
1.0  
• Driver Off; 8.0 V < VBAT < 18 V; 8.0 V < VBUS < 18 V; VBUS VBAT  
Control Unit Disconnected from Ground  
(39)  
(40)  
-1.0  
mA  
• GNDDEVICE = VSUP; VBAT = 12 V; 0 < V  
< 18 V  
BUS  
IBUSNO_BAT  
VBUSDOM  
V
Disconnected; VSUP_DEVICE = GND; 0 V < V  
< 18 V  
BUS  
100  
0.4  
µA  
BAT  
VSUP  
VSUP  
Receiver Dominant State  
Receiver Recessive State  
VBUSREC  
VBUS_CNT  
VHYS  
0.6  
0.475  
0.5  
Receiver Threshold Center  
• (VTH_DOM + VTH_REC)/2  
VSUP  
0.525  
0.175  
Receiver Threshold Hysteresis  
• (VTH_REC - VTH_DOM  
VSUP  
)
VSERDIODE  
VSHIFT_BAT  
VSHIFT_GND  
Voltage Drop at the Serial Diode in Pull-up Path  
0.4  
0
1.0  
V
VBAT  
VBAT  
VBAT_SHIFT  
GND_SHIFT  
11.5%  
11.5%  
0
Notes  
38. Parameters guaranteed for 7.0 V VSUP 18 V.  
39. Loss of local ground must not affect communication in the residual network.  
40. Node has to sustain the current which can flow under this condition. Bus must remain operational under this condition.  
33910  
14  
NXP Semiconductors  
Table 4. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
LIN physical layer, transceiver (LIN) (continued)(38)  
(41)  
VBUSWU  
RSLAVE  
LIN Wake-up threshold from Stop or Sleep Mode  
5.3  
30  
5.8  
60  
180  
V
LIN Pull-up Resistor to V  
SUP  
20  
140  
kΩ  
°C  
°C  
(42)  
TLINSD  
Overtemperature Shutdown  
160  
10  
TLINSD_HYS  
Overtemperature Shutdown Hysteresis  
Notes  
41. This parameter is 100% tested on an Automatic Tester. However, since it has not been monitored during reliability stresses, NXP does not  
guarantee this parameter during the product's life time.  
42. When overtemperature shutdown occurs, the LIN bus goes in recessive state and the flag LINOT in LINSR is set.  
33910  
NXP Semiconductors  
15  
4.3  
Dynamic electrical characteristics  
Table 5. Dynamic electrical characteristics  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
SPI interface timing (see Figure 13)  
f
t
SPI Operating Frequency  
SCLK Clock Period  
4.0  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
MHz  
ns  
SPIOP  
250  
110  
110  
100  
100  
40  
CLK  
PS  
(43)  
(43)  
(43)  
(43)  
(43)  
(43)  
t
SCLK Clock High Time  
SCLK Clock Low Time  
ns  
SCLKH  
W
t
ns  
SCLKL  
W
t
Falling Edge of CS to Rising Edge of SCLK  
Falling Edge of SCLK to CS Rising Edge  
MOSI to Falling Edge of SCLK  
Falling Edge of SCLK to MOSI  
MISO Rise Time  
ns  
LEAD  
tLAG  
ns  
t
ns  
SISU  
t
40  
ns  
SIH  
(43)  
(43)  
tRSO  
40  
40  
ns  
ns  
• C = 220 pF  
L
MISO Fall Time  
• C = 220 pF  
L
t
FSO  
Time from Falling or Rising Edges of CS to:  
• MISO Low-impedance  
• MISO High-impedance  
(43)  
(43)  
t
0.0  
0.0  
50  
50  
ns  
ns  
SOEN  
t
SODIS  
Time from Rising Edge of SCLK to MISO Data Valid  
• 0.2 x VDD MISO 0.8 x VDD, CL = 100 pF  
t
0.0  
75  
VALID  
RST output pin  
t
Reset Low-level Duration After VDD High (see Figure 12)  
Reset Deglitch Filter Time  
0.65  
350  
1.0  
1.35  
900  
ms  
ns  
RST  
t
480  
RSTDF  
Window watchdog configuration pin (WDCONF)  
Watchdog Time Period  
• External Resistor REXT = 20 kΩ (1%)  
• External Resistor REXT = 200 kΩ (1%)  
• Without External Resistor REXT (WDCONF Pin Open)  
8.5  
79  
110  
10  
94  
150  
11.5  
108  
205  
(44)  
t
ms  
PWD  
Notes  
43. This parameter is guaranteed by process monitoring but not production tested.  
44. Watchdog timing period calculation formula: tPWD [ms] = [0.466 * (REXT - 20)] + 10 with (REXT in kΩ)  
33910  
16  
NXP Semiconductors  
Table 5. Dynamic electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
L1 input  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
(45)  
t
L1 Filter Time Deglitcher  
8.0  
20  
38  
μs  
WUF  
State machine timing  
Delay Between CS LOW-to-HIGH Transition (at End of SPI Stop  
Command) and Stop Mode Activation  
(45)  
tSTOP  
5.0  
μs  
t
Normal Request Mode Timeout (see Figure 12)  
Cyclic Sense ON Time from Stop and Sleep Mode  
Cyclic Sense Accuracy  
110  
130  
-35  
150  
200  
205  
270  
+35  
ms  
µs  
%
NRTOUT  
TON  
(46)  
(45)  
Delay Between SPI Command and HS Turn On  
• 9.0 V < VSUP < 27 V  
(47)  
tS-ON  
10  
μs  
Delay Between SPI Command and HS Turn Off  
• 9.0 V < VSUP < 27 V  
(47)  
(45)  
tS-OFF  
10  
10  
μs  
μs  
Delay Between Normal Request and Normal Mode After a Watchdog  
Trigger Command (Normal Request Mode)  
tSNR2N  
Delay Between CS Wake-up (CS LOW to HIGH) in Stop Mode and:  
• Normal Request mode, VDD ON and RST HIGH  
• First Accepted SPI Command  
tWUCS  
tWUSPI  
9.0  
90  
15  
80  
N/A  
μs  
μs  
t2CS  
Minimum Time Between Rising and Falling Edge on the CS  
4.0  
J2602 deglitcher  
VSUP Deglitcher  
• (DIS_J2602 = 0)  
(48)  
tJ2602_DEG  
35  
50  
70  
μs  
LIN physical layer: driver characteristics for normal slew rate - 20.0 kBit/sec according to LIN physical layer specification(49), (50)  
Duty Cycle 1:  
• THREC(MAX) = 0.744 * VSUP  
D1  
D2  
0.396  
• THDOM(MAX) = 0.581 * VSUP  
• D1 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 50 µs, 7.0 V VSUP 18 V  
Duty Cycle 2:  
• THREC(MIN) = 0.422 * VSUP  
0.581  
• THDOM(MIN) = 0.284 * VSUP  
• D2 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 50 µs, 7.6 V VSUP 18 V  
Notes  
45. This parameter is guaranteed by process monitoring but not production tested.  
46. This parameter is 100% tested on an Automatic Tester. However, since it has not been monitored during reliability stresses, NXP does not  
guarantee this parameter during the product's life time.  
47. Delay between turn on or off command (rising edge on CS) and HS ON or OFF, excluding rise or fall time due to external load.  
48. This parameter has not been monitoring during operating life test.  
49. Bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold  
defined at each parameter. See Figure 6.  
50. See Figure 7.  
33910  
NXP Semiconductors  
17  
Table 5. Dynamic electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
LIN physical layer: driver characteristics for slow slew rate - 10.4 kBit/sec according to LIN physical layer specification (51), (52)  
Duty Cycle 3:  
• THREC(MAX) = 0.778 * VSUP  
D3  
D4  
0.417  
20  
0.590  
• THDOM(MAX) = 0.616 * VSUP  
• D3 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 96 µs, 7.0 V VSUP 18 V  
Duty Cycle 4:  
• THREC(MIN) = 0.389 * VSUP  
• THDOM(MIN) = 0.251 * VSUP  
• D4 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 96 µs, 7.6 V VSUP 18 V  
LIN physical layer: driver characteristics for fast slew rate  
SR  
LIN Fast Slew Rate (Programming Mode)  
V/μs  
FAST  
LIN physical layer: characteristics and wake-up timings (53)  
Propagation Delay and Symmetry  
tREC_PD  
(54)  
• Propagation Delay of Receiver, tREC_PD=MAX (tREC_PDR, tREC_PDF  
• Symmetry of Receiver Propagation Delay, tREC_PDF - tREC_PDR  
)
-2.0  
4.2  
6.0  
2.0  
μs  
μs  
tREC_SYM  
(55) (59)  
,
,
tPROPWL  
Bus Wake-Up Deglitcher (Sleep and Stop modes)  
42  
70  
95  
(56)  
Bus Wake-Up Event Reported  
• From Sleep mode  
• From Stop mode  
(57)  
(58)  
tWAKE_SLEEP  
tWAKE_STOP  
9.0  
27  
1500  
35  
μs  
tTXDDOM  
TXD Permanent Dominant State Delay  
0.65  
1.0  
1.35  
s
Pulse width modulation input pin (PWMIN)  
PWMIN pin  
fPWMIN  
(59)  
10  
kHz  
• Max. frequency to drive HS output pins  
Notes  
51. Bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold  
defined at each parameter. See Figure 6.  
52. See Figure 8.  
53. VSUP from 7.0 to 18 V, bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to  
LIN signal threshold defined at each parameter. See Figure 6.  
54. See Figure 9.  
55. See Figure 10, for Sleep and Figure 11, for Stop mode.  
56. This parameter is tested on automatic tester but has not been monitoring during operating life test.  
57. The measurement is done with 1.0 µF capacitor and 0 mA current load on VDD. The value takes into account the delay to charge the capacitor.  
The delay is measured between the bus wake-up threshold (VBUSWU) rising edge of the LIN bus and when V  
reaches 3.0 V. See Figure 10.  
DD  
The delay depends of the load and capacitor on VDD  
.
58. In Stop mode, the delay is measured between the bus wake-up threshold (VBUSWU) and the falling edge of the IRQ pin. See Figure 11.  
59. This parameter is guaranteed by process monitoring but not production tested.  
33910  
18  
NXP Semiconductors  
4.4  
Timing diagrams  
33910  
TRANSIENT PULSE  
GENERATOR  
1.0 nF  
LIN  
(
NOTE  
)
GND  
PGND LGND AGND  
Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.  
Figure 4. Test circuit for transient test pulses (LIN)  
33910  
Transient Pulse  
Generator  
(Note)  
1.0 nF  
L1  
10 k  
Ω
GND  
PGND LGND AGND  
Note Waveform per ISO 7637-2. Test Pulses 1, 2, 3a, 3b,.  
Figure 5. Test circuit for transient test pulses (L1)  
VSUP  
R0  
LIN  
TXD  
RXD  
R0 AND C0 COMBINATIONS:  
• 1.0 KΩ and 1.0 nF  
• 660 Ω and 6.8 nF  
• 500 Ω and 10 nF  
C0  
Figure 6. Test circuit for LIN timing measurements  
33910  
NXP Semiconductors  
19  
TXD  
tBIT  
tBIT  
t
t
BUS_REC  
(MAX)  
(MIN)  
BUS_DOM  
VLIN_REC  
74.4% VSUP  
Thresholds of  
receiving node 1  
TH  
REC(MAX)  
DOM(MAX)  
58.1% V  
SUP  
TH  
LIN  
Thresholds of  
receiving node 2  
42.2% V  
28.4% V  
SUP  
TH  
REC(MIN)  
SUP  
TH  
DOM(MIN)  
t
BUS_DOM(MIN)  
t
BUS_REC(MAX)  
RXD  
Output of receiving Node 1  
t
REC_PDF(1)  
t
REC_PDR(1)  
RXD  
Output of receiving Node 2  
t
REC_PDF(2)  
t
REC_PDR(2)  
Figure 7. LIN timing measurements for normal slew rate  
TXD  
tBIT  
tBIT  
t
t
BUS_REC(MIN)  
BUS_DOM(MAX)  
VLIN_REC  
77.8% VSUP  
Thresholds of  
receiving node 1  
TH  
REC(MAX)  
DOM(MAX)  
61.6% V  
SUP  
TH  
LIN  
Thresholds of  
receiving node 2  
38.9% V  
25.1% V  
SUP  
TH  
REC(MIN)  
SUP  
TH  
DOM(MIN)  
t
BUS_DOM(MIN)  
t
BUS_REC(MAX)  
RXD  
Output of receiving Node 1  
t
REC_PDF(1)  
t
REC_PDR(1)  
RXD  
Output of receiving Node 2  
t
REC_PDF(2)  
t
REC_PDR(2)  
Figure 8. LIN timing measurements for slow slew rate  
33910  
20  
NXP Semiconductors  
VLIN_REC  
0.6% V  
0.4% V  
SUP  
V
BUSREC  
V
SUP  
LIN BUS SIGNAL  
SUP  
V
BUSDOM  
RXD  
t
t
REC_PDF  
REC_PDR  
Figure 9. LIN receiver timing  
V
LIN_REC  
LIN  
5.0 V  
DOMINANT LEVEL  
VBUSWU  
3.0 V  
VDD  
t
WAKE_SLEEP  
t
WL  
PROP  
Figure 10. LIN wake-up sleep mode timing  
V
LIN_REC  
LIN  
5.0 V  
VBUSWU  
DOMINANT LEVEL  
t
IRQ  
WAKE_STOP  
t
WL  
PROP  
Figure 11. LIN wake-up stop mode timing  
33910  
NXP Semiconductors  
21  
V
SUP  
V
DD  
RST  
t
NRTOUT  
t
RST  
Figure 12. Power on reset and normal request timeout timing  
t
PSCLK  
CS  
t
t
WSCLKH  
LEAD  
t
LAG  
SCLK  
t
WSCLKL  
t
t
SIH  
SISU  
MOSI  
MISO  
UNDEFINED  
D0  
DON’T CARE  
D7  
DON’T CARE  
t
VALID  
t
SODIS  
t
SOEN  
D0  
D7  
DON’T CARE  
Figure 13. SPI timing characteristics  
33910  
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5
Functional description  
5.1  
Introduction  
The 33910 was designed and developed as a highly integrated and cost-effective solution for automotive and industrial applications. For  
automotive body electronics, the 33910 is well suited to perform keypad applications via the LIN bus. Power switches are provided on the  
device configured as high-side outputs. Other ports are also provided, which include a Hall Sensor port supply, and one wake-up capable  
pin. An internal voltage regulator provides power to a MCU device. Also included in this device is a LIN physical layer, which  
communicates using a single wire. This enables this device to be compatible with 3-wire bus systems, where one wire is used for  
communication, one for battery, and one for ground.  
5.2  
Functional pin description  
See Figure 1, 33910 simplified application diagram, for a graphic representation of the various pins referred to in the following paragraphs.  
Also, see Pin connections for a description of the pin locations in the package.  
5.2.1 Receiver output pin (RXD)  
The RXD pin is a digital output. It is the receiver output of the LIN interface and reports the state of the bus voltage: RXD Low when LIN  
bus is dominant, RXD High when LIN bus is recessive.  
5.2.2 Transmitter input pin (TXD)  
The TXD pin is a digital input. It is the transmitter input of the LIN interface and controls the state of the bus output (dominant when TXD  
is Low, recessive when TXD is High). This pin has an internal pull-up to force recessive state in case the input is left floating.  
5.2.3 LIN bus pin (LIN)  
The LIN pin represents the single-wire bus transmitter and receiver. It is suited for automotive bus systems and is compliant to the LIN  
bus specification 2.0, 2.1, and SAE J2602-2. The LIN interface is only active during Normal mode. See Table 6, Operating modes  
overview.  
5.2.4 Serial data clock pin (SCLK)  
The SCLK pin is the SPI clock input. MISO data changes on the positive transition of the SCLK. MOSI is sampled on the negative edge  
of the SCLK.  
5.2.5 Master out slave in pin (MOSI)  
The MOSI digital pin receives SPI data from the MCU. This data input is sampled on the negative edge of SCLK.  
5.2.6 Master in slave out pin (MISO)  
The MISO pin sends data to an SPI-enabled MCU. It is a digital tri-state output used to shift serial data to the microcontroller. Data on this  
output pin changes on the positive edge of the SCLK. When CS is High, this pin remains in the high-impedance state.  
5.2.7 Chip select pin (CS)  
CS is an active low digital input. It must remain low during a valid SPI communication and allow for several devices to be connected in the  
same SPI bus without contention. A rising edge on CS signals the end of the transmission and the moment the data shifted in is latched.  
A valid transmission must consist of 8 bits only. While in STOP mode, a low-to-high level transition on this pin generates a wake-up  
condition for the 33910.  
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5.2.8 Analog multiplexer pin (ADOUT0)  
The ADOUT0 pin can be configured via the SPI to allow the MCU A/D converter to read the several inputs of the Analog Multiplexer,  
including the VSENSE and L1 input voltages, and the internal junction temperature.  
5.2.9 PWM input control pin (PWMIN)  
This digital input can control the high-sides drivers in Normal Request and Normal mode. To enable PWM control, the MCU must perform  
a write operation to the High-side Control Register (HSCR). This pin has an internal 20 μA current pull-up.  
5.2.10 Reset pin (RST)  
This bidirectional pin is used to reset the MCU in case the 33910 detects a reset condition, or to inform the 33910 the MCU has just been  
reset. After release of the RST pin, Normal Request mode is entered. The RST pin is an active low filtered input and output formed by a  
weak pull-up and a switchable pull-down structure which allows this pin to be shorted either to VDD or to GND during software  
development, without the risk of destroying the driver.  
5.2.11 Interrupt pin (IRQ)  
The IRQ pin is a digital output used to signal events or faults to the MCU while in Normal and Normal Request mode or to signal a wake-  
up from Stop mode. This active low output transitions to high only after the interrupt is acknowledged by a SPI read of the respective status  
bits.  
5.2.12 Watchdog configuration pin (WDCONF)  
The WDCONF pin is the configuration pin for the internal watchdog. A resistor can be connected to this pin to configure the window  
watchdog period. When connected directly to ground, the watchdog is disabled. When this pin is left open, the watchdog period is fixed  
to its lower precision internal default value (150 ms typical).  
5.2.13 Ground connection pins (AGND, PGND, LGND)  
The AGND, PGND, and LGND pins are the Analog and Power ground pins. The AGND pin is the ground reference of the voltage regulator  
module. The PGND and LGND pins are used for high current load return as in the LIN interface pin.  
Note: PGND, AGND and LGND pins must be connected together.  
5.2.14 Digital/analog pin (L1)  
The L1 pin is multi purpose input. It can be used as a digital input, which can be sampled by reading the SPI and used for wake-up when  
33910 is in low power mode or used as analog input for the analog multiplexer. When used to sense voltage outside the module, a  
33 kohm series resistor must be used on the input.  
When used as wake-up input L1 can be configured to operate in cyclic-sense mode. In this mode one or both of the high-side switches  
are configured to be periodically turned on and sample the wake-up input. If a state change is detected between two cycles a wake-up is  
initiated. The 33910 can also wake-up from Stop or Sleep by a simple state change on L1. When used as analog input, the voltage present  
on the L1 pin is scaled down by an selectable internal voltage divider and can be routed to the ADOUT0 output through the analog  
multiplexer.  
Note: If L1 input is selected in the analog multiplexer, it is disabled as the digital input and remains disabled in low power mode. No wake-  
up feature is available in this condition. When the L1 input is not selected in the analog multiplexer, the voltage divider is disconnected  
from this input.  
5.2.15 High-side output pins (HS1 and HS2)  
These two high-side switches are able to drive loads such as relays or lamps. Their structures are connected to the VS2 supply pin. The  
pins are short-circuit protected and both outputs are also protected against overheating. HS1 and HS2 are controlled by SPI and can  
respond to a signal applied to the PWMIN input pin. HS1 and HS2 outputs can also be used during low-power mode for the cyclic-sense  
of the wake inputs.  
33910  
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5.2.16 Power supply pins (VS1 and VS2)  
Those are the battery level voltage supply pins. In an application, VS1 and VS2 pins must be protected against reverse battery connection  
and negative transient voltages with external components. These pins sustain standard automotive voltage conditions such as a load  
dump at 40 V. The high-side switches (HS1 and HS2) are supplied by the VS2 pin. All other internal blocks are supplied by the VS1 pin.  
5.2.17 Voltage sense pin (VSENSE)  
This input can be connected directly to the battery line. It is protected against battery reverse connection. The voltage present in this input  
is scaled down by an internal voltage divider, and can be routed to the ADOUT0 output pin and used by the MCU to read the battery  
voltage. The ESD structure on this pin allows for excursion up to +40 V and down to -27 V, allowing this pin to be connected directly to  
the battery line. It is strongly recommended to connect a 10 kΩ resistor in series with this pin for protection purposes.  
5.2.18 Hall sensor switchable supply pin (HVDD)  
This pin provides a switchable supply for external hall sensors. While in Normal mode, this current limited output can be controlled through  
the SPI. The HVDD pin needs to be connected to an external capacitor to stabilize the regulated output voltage.  
5.2.19 +5.0 V main regulator output pin (VDD)  
An external capacitor has to be placed on the VDD pin to stabilize the regulated output voltage. The VDD pin is intended to supply a  
microcontroller. The pin is current limited against shorts to GND and overtemperature protected. During Stop mode, the voltage regulator  
does not operate with its full drive capabilities and the output current is limited. During Sleep mode, the regulator output is completely shut  
down.  
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6
Functional device operations  
6.1  
Operational modes  
6.1.1 Introduction  
The 33910 offers three main operating modes: Normal (Run), Stop, and Sleep (Low Power). In Normal mode, the device is active and is  
operating under normal application conditions. The Stop and Sleep modes are low power modes with wake-up capabilities. In Stop mode,  
the voltage regulator still supplies the MCU with VDD (limited current capability), while in Sleep mode the voltage regulator is turned off  
(VDD = 0 V).  
Wake-up from Stop mode is initiated by a wake-up interrupt. Wake-up from Sleep mode is done by a reset and the voltage regulator is  
turned back on. The selection of the different modes is controlled by the MOD1:2 bits in the Mode Control Register (MCR). Figure 14  
describes how transitions are done between the different operating modes. Table 6 gives an overview of the operating modes.  
6.1.2 Reset mode  
The 33910 enters the Reset mode after a power up. In this mode, the RST pin is low for 1.0 ms (typical value). After this delay, it enters  
the Normal Request mode and the RST pin is driven high. The Reset mode is entered if a reset condition occurs (VDD low, watchdog  
trigger fail, after wake-up from Sleep mode, Normal Request mode timeout occurs).  
6.1.3 Normal request mode  
This is a temporary mode automatically accessed by the device after the Reset mode, or after a wake-up from Stop mode. In Normal  
Request mode, the VDD regulator is ON, the RESET pin is High, and the LIN is operating in RX Only mode. As soon as the device enters  
in the Normal Request mode an internal timer is started for 150 ms (typical value). During these 150 ms, the MCU must configure the  
Timing Control Register (TIMCR) and the Mode Control Register (MCR) with MOD2 and MOD1 bits set = 0, to enter the Normal mode. If  
within the 150 ms timeout, the MCU does not command the 33910 to Normal mode, it enters in Reset mode. If the WDCONF pin is  
grounded in order to disable the watchdog function, it goes directly in Normal mode after the Reset mode.  
6.1.4 Normal mode  
In Normal mode, all 33910 functions are active and can be controlled by the SPI interface and the PWMIN pin. The VDD regulator is ON  
and delivers its full current capability. If an external resistor is connected between the WDCONF pin and the Ground, the window watchdog  
function is enabled. The wake-up input (L1) can be read as digital input or have its voltage routed through the analog-multiplexer.  
The LIN interface has slew rate and timing compatible with the LIN protocol specification 2.0, 2.1 and SAEJ2602. The LIN bus can transmit  
and receive information. The high-side switches are active and have PWM capability according to the SPI configuration. The interrupts  
are generated to report failures for VSUP over/undervoltage, thermal shutdown, or thermal shutdown prewarning on the main regulator.  
6.1.5 Sleep mode  
The Sleep mode is a low power mode. From Normal mode, the device enters into Sleep mode by sending one SPI command through the  
Mode Control Register (MCR), or (VDD low > 150 ms) with VSUV = 0. When in Reset mode, a VDD undervoltage condition with no VSUP  
undervoltage (VSUV = 0) sends the device to Sleep mode. All blocks are in their lowest power consumption condition. Only some wake-  
up sources (wake-up input with or without cyclic sense, forced wake-up and LIN receiver) are active. The 5.0 V regulator is OFF. The  
internal low-power oscillator may be active if the IC is configured for cyclic-sense. In this condition, one of the high-side switches is turned  
on periodically and the wake-up input is sampled. Wake-up from Sleep mode is similar to a power-up. The device goes in Reset mode  
except the SPI reports the wake-up source and the BATFAIL flag is not set.  
6.1.6 Stop mode  
The Stop mode is the second low power mode, but in this case the 5.0 V regulator is ON with limited current drive capability. The  
application MCU is always supplied while the 33910 is operating in Stop mode. The device can enter into Stop mode only by sending the  
SPI command. When the application is in this mode, it can wake-up from the 33910 side (for example: cyclic sense, force wake-up, LIN  
bus, wake inputs) or the MCU side (CS, RST pins). Wake-up from Stop mode transitions the 33910 to Normal Request mode and  
generates an interrupt except if the wake-up event is a low to high transition on the CS pin or comes from the RST pin.  
33910  
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Normal Request Timeout Expired (tNRTOUT  
)
V
Low  
DD  
VDD High and  
Power Up  
Reset Delay (t  
) Expired  
RST  
Power  
Down  
Normal  
Request  
Reset  
VDD Low  
Normal  
WD Failed  
VDDLOW(>tN  
T) Expired  
R  
T
O
U
and VSUV = 0  
Sleep Command  
Wake-up(Reset)  
Sleep  
Stop  
VLow  
DD  
Legend  
WD: Watchdog  
WD Disabled: Watchdog disabled (WDCONF pin connected to GND)  
WD Trigger: Watchdog is triggered by SPI command  
WD Failed: No watchdog trigger or trigger occurs in closed window  
Stop Command: Stop command sent via SPI  
Sleep Command: Sleep command sent via SPI  
Wake-up from Stop mode: L1 state change, LIN bus wake-up, Periodic wake-up, CS rising edge wake-up or RST wake-up.  
Wake-up from Sleep mode: L1 state change, LIN bus wake-up, Periodic wake-up.  
Figure 14. Operating modes and transitions  
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Table 6. Operating modes overview  
Function  
VDD  
Reset mode  
Normal request mode  
Normal mode  
Stop mode  
Sleep mode  
Full  
-
Full  
Full  
SPI  
Stop  
-
-
-
SPI (60)  
HVDD  
SPI/PWM (61)  
SPI  
Note (62)  
Note (63)  
HSx  
Analog Mux  
L1  
-
SPI/PWM  
SPI  
-
-
-
-
Input  
Input  
Wake-up  
Wake-up  
Wake-up  
-
LIN  
-
Rx-Only  
Full/Rx-Only  
Rx-Only/Wake-up  
On (64)/Off  
VSUP/VDD  
Watchdog  
-
150 ms (typ.) timeout  
VSUP/VDD  
-
VSUP/VDD  
VDD  
Voltage Monitoring  
-
Notes  
60. Operation can be enabled/controlled by the SPI.  
61. Operation can be controlled by the PWMIN input.  
62. HSx switches can be configured for cyclic sense operation in Stop mode.  
63. HSx switches can be configured for cyclic sense operation in Sleep mode.  
64. Windowing operation when enabled by an external resistor.  
6.1.7 Interrupts  
Interrupts are used to signal a microcontroller a peripheral needs to be serviced. The interrupts which can be generated, change according  
to the operating mode. While in Normal and Normal Request modes, the 33910 signals through interrupts special conditions which may  
require a MCU software action. Interrupts are not generated until all pending wake-up sources are read in the Interrupt Source Register  
(ISR).  
While in Stop mode, interrupts are used to signal wake-up events. Sleep mode does not use interrupts. Wake-up is performed by  
powering-up the MCU. In Normal and Normal Request mode the wake-up source can be read by SPI. The interrupts are signaled to the  
MCU by a low logic level of the IRQ pin, which remains low until the interrupt is acknowledged by a SPI read command of the ISR register.  
The IRQ pin is then driven high. Interrupts are only asserted while in Normal, Normal Request and Stop mode. Interrupts are not generated  
while the RST pin is low. The following is a list of the interrupt sources in Normal and Normal Request modes. Some of these can be  
masked by writing to the SPI - Interrupt Mask Register (IMR).  
6.1.7.1  
Low-voltage interrupt  
Signals when the supply line (VS1) voltage drops below the VSUV threshold (VSUV).  
6.1.7.2  
High-voltage interrupt  
Signals when the supply line (VS1) voltage increases above the VSOV threshold (VSOV).  
6.1.7.3  
Overtemperature prewarning  
Signals when the 33910 temperature has reached the pre-shutdown warning threshold. It is used to warn the MCU an overtemperature  
shutdown in the main 5.0 V regulator is imminent.  
6.1.7.4  
LIN overtemperature shutdown/TXD stuck at dominant/RXD short-circuit  
These signal fault conditions within the LIN interface causes the LIN driver to be disabled. In order to restart the operation, the fault must  
be removed and TXD must go recessive.  
6.1.7.5  
High-side overtemperature shutdown  
Signals a shutdown in the high-side outputs.  
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6.1.8 Reset  
To reset a MCU the 33910 drives the RST pin low for the time the reset condition lasts. After the reset source is removed, the state  
machine drives the RST output low for at least 1.0 ms (typical value) before driving it high. In the 33910, four main reset sources exist:  
6.1.8.1  
5.0 V regulator low-voltage-reset (V  
)
RSTTH  
The 5.0 V regulator output VDD is continuously monitored against brown outs. If the supply monitor detects the voltage at the VDD pin has  
dropped below the reset threshold VRSTTH the 33910 issues a reset. In case of overtemperature, the voltage regulator is disabled and the  
voltage monitoring issues a VDDOT Flag independently of the VDD voltage.  
6.1.8.2  
Window watchdog overflow  
If the watchdog counter is not properly serviced while its window is open, the 33910 detects an MCU software run-away and resets the  
microcontroller.  
6.1.8.3  
Wake-up from sleep mode  
During Sleep mode, the 5.0 V regulator is not active, hence all wake-up requests from Sleep mode require a power-up/reset sequence.  
6.1.8.4  
External reset  
The 33910 has a bidirectional reset pin which drives the device to a safe state (same as Reset mode) for as long as this pin is held low.  
The RST pin must be held low long enough to pass the internal glitch filter and get recognized by the internal reset circuit. This functionality  
is also active in Stop mode. After the RST pin is released, there is no extra tRST to be considered.  
6.1.9 Wake-up capabilities  
Once entered into one of the low-power modes (Sleep or Stop) only wake-up sources can bring the device into Normal mode operation.  
In Stop mode, a wake-up is signaled to the MCU as an interrupt, while in Sleep mode the wake-up is performed by activating the 5.0 V  
regulator and resetting the MCU. In both cases the MCU can detect the wake-up source by accessing the SPI registers and reading the  
Interrupt Source Register. There is no specific SPI register bit to signal a CS wake-up or external reset. If necessary this condition is  
detected by excluding all other possible wake-up sources.  
6.1.9.1  
Wake-up from wake-up input (L1) with cyclic sense disabled  
The wake-up line is dedicated to sense state changes of external switch and wake-up the MCU (in Sleep or Stop mode). In order to select  
and activate direct wake-up from L1 input, the Wake-up Control Register (WUCR) must be configured with appropriate L1WE input  
enabled or disabled. The wake-up input’s state is read through the Wake-up Status Register (WUSR). L1 input is also used to perform  
cyclic-sense wake-up.  
Note: Selecting an L1 input in the analog multiplexer before entering low power mode disables the wake-up capability of the L1 input  
6.1.9.2  
Wake-up from wake-up input (L1) with cyclic sense timer enabled  
The SBCLIN can wake-up at the end of a cyclic sense period if on the wake-up input line (L1) a state change occurs. One or both HSx  
switch can be activated in Sleep or Stop modes from an internal timer. Cyclic sense and force wake-up are exclusive. If cyclic sense is  
enabled, the force wake-up can not be enabled. In order to select and activate the cyclic sense wake-up from the L1 input, before entering  
in low power modes (Stop or Sleep modes), the following SPI set-up has to be performed:  
In WUCR: select the L1 input to WU-enable.  
In HSCR: enable the desired HSx.  
• In TIMCR: select the CS/WD bit and determine the cyclic sense period with CYSTx bits.  
• Perform Goto Sleep/Stop command.  
33910  
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6.1.9.3  
Forced wake-up  
The 33910 can wake-up automatically after a predetermined time spent in Sleep or Stop mode. Cyclic sense and Forced wake-up are  
exclusive. If Forced wake-up is enabled, the Cyclic Sense can not be enabled. To determine the wake-up period, the following SPI set-  
up has to be sent before entering in low power modes:  
• In TIMCR: select the CS/WD bit and determine the low power mode period with CYSTx bits.  
• In HSCR: all HSx bits must be disabled.  
6.1.9.4  
CS wake-up  
While in Stop mode, a rising edge on the CS causes a wake-up. The CS wake-up does not generate an interrupt, and is not reported on  
SPI.  
6.1.9.5  
LIN wake-up  
While in the low-power mode, the 33910 monitors the activity on the LIN bus. A dominant pulse larger than tPROPWL followed by a dominant  
to recessive transition causes a LIN wake-up. This behavior protects the system from a short to ground bus condition. The bit RXONLY = 1  
from LINCR Register disables the LIN wake-up from Stop mode.  
6.1.9.6  
RST wake-up  
While in Stop mode, the 33910 can wake-up when the RST pin is held low long enough to pass the internal glitch filter. Then, the 33910  
changes to Normal Request or Normal modes depending on the WDCONF pin configuration. The RST wake-up does not generate an  
interrupt and is not reported via SPI.  
From Stop mode, the following wake-up events can be configured:  
• Wake-up from L1 input without cyclic sense  
• Cyclic sense wake-up inputs  
• Force wake-up  
• CS wake-up  
• LIN wake-up  
• RST wake-up  
From Sleep mode, the following wake-up events can be configured:  
• Wake-up from L1 input without cyclic sense  
• Cyclic sense wake-up inputs  
• Force wake-up  
• LIN wake-up  
6.1.10 Window watchdog  
The 33910 includes a configurable window watchdog which is active in Normal mode. The watchdog can be configured by an external  
resistor connected to the WDCONF pin. The resistor is used to achieve higher precision in the timebase used for the watchdog. SPI clears  
are performed by writing through the SPI in the MOD bits of the Mode Control Register (MCR).  
During the first half of the SPI timeout, watchdog clears are not allowed, but after the first half of the SPI timeout window, the clear  
operation opens. If a clear operation is performed outside the window, the 33910 resets the MCU, in the same way as when the watchdog  
overflows.  
33910  
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WINDOW CLOSED  
NO WATCHDOG CLEAR  
ALLOWED  
WINDOW OPEN  
FOR WATCHDOG  
CLEAR  
WD TIMING X 50%  
WD TIMING X 50%  
WD PERIOD (t  
)
PWD  
WD TIMING SELECTED BY RESISTOR  
ON WDCONF PIN  
Figure 15. Window watchdog operation  
To disable the watchdog function in Normal mode the user must connect the WDCONF pin to ground. This measure effectively disables  
Normal Request mode. The WDOFF bit in the Watchdog Status Register (WDSR) is set. This condition is only detected during Reset  
mode. If neither a resistor nor a connection to ground is detected, the watchdog falls back to the internal lower precision timebase of  
150 ms (typ.) and signals the faulty condition through the Watchdog Status Register (WDSR).  
The watchdog timebase can be further divided by a prescaler which can be configured by the Timing Control Register (TIMCR). During  
Normal Request mode, the window watchdog is not active but there is a 150 ms (typ.) timeout for leaving the Normal Request mode. In  
case of a timeout, the 33910 enters into Reset mode, resetting the microcontroller before entering again into Normal Request mode.  
6.1.11 Faults detection management  
The 33910 has the capability to detect faults like an overvoltage or undervoltage on VS1, TxD in permanent Dominant State,  
Overtemperature on HS, LIN. It is able to take corrective actions accordingly. Most of faults are monitoring through SPI and the Interrupt  
pin. The microcontroller can also take actions. The following table summarizes all fault sources the device is able to detect with associated  
conditions. The status for a device recovery and the SPI or pins monitoring are also described.  
Table 7. Fault detection management conditions  
Monitoring (66)  
Block  
Fault  
Mode  
Condition  
Fallout  
Recovery  
Reg (flag, bit)  
Interrupt  
V
SUP<3.0 V (typ)  
VSR (BATFAIL,  
0)  
Battery Fail  
All modes  
-
Condition gone  
-
then power-up  
In Normal mode, Conditiongone,to  
IRQ low +  
ISR (0101) (67)  
VSUP > 19.25 V  
(typ)  
HS shutdown if bit  
HVSE=1 (reg  
MCR)  
re-enable HS  
write to HSCR  
registers  
Vsup Overvoltage  
VSR (VSOV,3)  
Normal, Normal  
Request  
VSUP  
Undervoltage  
IRQ low + ISR  
(0101)  
VSUP < 6.0 V (typ)  
VDD < 4.5 V (typ)  
Power Supply  
-
VSR (VSUV,2)  
Reset (65)  
-
V
DD Undervoltage  
All except Sleep  
-
-
Condition gone  
VDD Overtemp  
Prewarning  
Temperature >  
115 °C (typ)  
IRQ low + ISR  
(0101)  
VSR (VDDOT,1)  
All except Low  
Power modes  
VDD  
Temperature >  
170 °C (typ)  
VDD shutdown,  
Reset then Sleep  
-
-
Overtemperature  
Rxd Pin Short  
Circuit  
RXD pin shorted  
to GND or 5.0 V  
LIN trans  
shutdown  
LINSR,  
(RXSHORT,3)  
LIN transmitter re-  
enabled once the  
condition is gone  
and TXD is high  
Txd Pin  
Permanent  
Dominant  
TXD pin low for  
more than 1.0 s  
(typ)  
IRQ low + ISR  
(0100) (67)  
Normal, Normal  
Request  
LINSR  
(TXDOM,2)  
LIN  
LIN transmitter  
shutdown  
Lin Driver  
Overtemperature  
Temperature >  
160 °C (typ)  
LINSR (LINOT,1)  
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Table 7. Fault detection management conditions (continued)  
Monitoring (66)  
Block  
Fault  
Mode  
Condition  
Fallout  
Recovery  
Reg (flag, bit)  
Interrupt  
Conditiongone,to  
re-enable HS  
write to HSCR reg  
IRQ low + ISR  
(0010) (67)  
High-side Drivers  
Overtemperature  
Temperature >  
160 °C (typ)  
Both HS thermal  
shutdown  
All flags in HSSR  
are set  
Hs1 Open Load  
Detection  
HSSR  
(HS1OP,1)  
Current through  
HSx < 5.0 mA  
(typ)  
Normal, Normal  
Request  
-
High-side  
Hs2 Open-load  
Detection  
HSSR  
(HS2OP,3)  
Condition gone  
-
Hs1 Overcurrent  
Hs2 Overcurrent  
Current through  
HSx tends to rise  
above the current capability 60 mA  
HSx on with  
limited current  
HSSR (HS1CL,0)  
HSSR (HS2CL,2)  
limit 60 mA (min)  
(min)  
The MCU did not  
command the  
device to Normal  
mode within the  
150 ms timeout  
after reset  
Normal Request  
Time-out Expired  
Normal Request  
Reset  
-
-
WD timeout or  
WD clear within  
the window  
closed  
Watchdog  
-
Watchdog  
Timeout  
WDSR (WDTO,  
3)  
Normal  
Normal  
Reset  
WD internal lower  
precision  
timebase 150 ms  
(typ)  
Connect  
WDCONF to a  
resistor or to GND  
WDCONF pin is  
floating  
WDSR (WDERR,  
2)  
Watchdog Error  
Notes  
65. When in Reset mode a VDD undervoltage condition combined with no VSUP undervoltage (VSUV = 0) sends the device to Sleep mode.  
66. Registers to be read when back in Normal Request or Normal mode depending on the fault. Interrupts only generated in Normal, Normal Request  
and Stop modes  
67. Unless masked, If masked IRQ remains high and the ISR flags are not set.  
33910  
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NXP Semiconductors  
6.1.12 Temperature sense gain  
The analog multiplexer can be configured via SPI to allow the ADOUT0 pin to deliver the internal junction temperature of the device.  
Figure 16 illustrates the internal chip temp sense obtained per characterization at 3 temperatures with 3 different lots and 30 samples.  
Temperature Sense Analog Output Voltage  
5
4.5  
4
3.5  
3
2.5  
2
-50  
0
50  
100  
150  
Temperature (°C)  
Figure 16. Temperature sense gain  
6.1.13 High-side output pins HS1 and HS2  
These outputs are two high-side drivers intended to drive small resistive loads or LEDs incorporating the following features:  
• PWM capability (software maskable)  
• Open load detection  
• Current limitation  
• Overtemperature shutdown (with maskable interrupt)  
• High-voltage shutdown (software maskable)  
• Cyclic sense  
The high-side switches are controlled by the bits HS1:2 in the High-side Control Register (HSCR).  
6.1.13.1 PWM capability (direct access)  
Each high-side driver offers additional (to the SPI control) direct control via the PWMIN pin. If both the bits HS1 and PWMHS1 are set in  
the High-side Control Register (HSCR), then the HS1 driver is turned on if the PWMIN pin is high and turned of if the PWMIN pin is low.  
This applies to HS2 configuring HS2 and PWMHS2 bits.  
33910  
NXP Semiconductors  
33  
Interrupt  
Control  
Module  
VDD  
HVSE  
VDD  
PWMIN  
PWMHSx  
VS2  
MOD1:2  
HSx  
HIgh-side Driver  
charge pump  
open load detection  
current limitation  
on/off  
Control  
HSxOP  
HSxCL  
Status  
overtemperture shutdown (interrupt maskable)  
High-voltage shutdown (maskable)  
HSx  
Wake-up  
Module  
Figure 17. High-side drivers HS1 and HS2  
6.1.13.2 Open load detection  
Each high-side driver signals an open load condition if the current through the high-side is below the open load current threshold. The  
open load condition is indicated with the bits HS1OP and HS2OP in the High-side Status Register (HSSR).  
6.1.13.3 Current limitation  
Each high-side driver has an output current limitation. In combination with the overtemperature shutdown the high-side drivers are  
protected against overcurrent and short-circuit failures. When the driver operates in the current limitation area, it is indicated with the bits  
HS1CL and HS2CL in the HSSR.  
Note: If the driver is operating in current limitation mode, excessive power might be dissipated.  
6.1.13.4 Overtemperature protection (HS interrupt)  
Both high-side drivers are protected against overtemperature. In case of an overtemperature condition both high-side drivers are shut  
down and the event is latched in the Interrupt Control Module. The shutdown is indicated as HS Interrupt in the Interrupt Source Register  
(ISR). A thermal shutdown of the high-side drivers is indicated by setting all HSxOP and HSxCL bits simultaneously. If the bit HSM is set  
in the Interrupt Mask Register (IMR), then an interrupt (IRQ) is generated. A write to the High-side Control Register (HSCR), when the  
overtemperature condition is gone, re-enables the high-side drivers.  
6.1.13.5 High-voltage shutdown  
In case of a high voltage condition and if the high voltage shutdown is enabled (bit HVSE in the Mode Control Register (MCR) is set both  
high-side drivers are shut down. A write to the High-side Control Register (HSCR), when the high voltage condition is gone, re-enables  
the high-side drivers.  
6.1.13.6 Sleep and stop mode  
The high-side drivers can be enabled to operate in Sleep and Stop mode for cyclic sensing. Also see Table 6, Operating modes overview.  
33910  
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NXP Semiconductors  
6.1.14 Lin physical layer  
The LIN bus pin provides a physical layer for single-wire communication in automotive applications. The LIN physical layer is designed to  
meet the LIN physical layer specification and has the following features:  
LIN physical layer 2.0, 2.1 and SAEJ2602 compliant  
Slew rate selection  
Overtemperature shutdown  
Advanced diagnostics  
The LIN driver is a low-side MOSFET with thermal shutdown. An internal pull-up resistor with a serial diode structure is integrated, so no  
external pull-up components are required for the application in a slave node. The fall time from dominant to recessive and the rise time  
from recessive to dominant is controlled. The symmetry between both slopes is guaranteed.  
6.1.14.1 LIN pin  
The LIN pin offers a high susceptibility immunity level from external disturbance, guaranteeing communication during external disturbance.  
WAKE-UP  
MODULE  
LIN  
Wake-up  
MOD1:2  
LSR0:1  
VS1  
LIN DRIVER  
J2602  
Slope and Slew Rate Control  
RXONLY  
RXSHORT  
TXDOM  
LINOT  
Overtemperature Shutdown (interrupt maskable)  
30 K  
LIN  
TXD  
RXD  
SLOPE  
CONTROL  
LGND  
WAKE-UP  
FILTER  
RECEIVER  
Figure 18. LIN interface  
6.1.14.2 Slew rate selection  
The slew rate can be selected for optimized operation at 10.4 and 20 kBit/s as well as a fast baud rate for test and programming. The slew  
rate can be adapted with the bits LSR1:0 in the LIN Control Register (LINCR). The initial slew rate is optimized for 20 kBit/s.  
6.1.14.3 J2602 conformance  
To be compliant with the SAE J2602-2 specification, the J2602 feature has to be enabled in the LINCR Register (bit DIS_J2602 sets to  
0). The LIN transmitter is disabled in case of a VSUP undervoltage condition occurs and TXD is in Recessive State: the LIN bus goes in  
Recessive State and RXD goes high. The LIN transmitter is not disabled if TXD is in Dominant State. A deglitcher on VSUP (tJ2602_DEG  
)
is implemented to avoid false switching.  
If the (DIS_J2602) bit is set to 1, the J2602 feature is disabled and the communication TXD-LIN-RXD works for VSUP down to 4.6 V (typical  
value) and then the communication is interrupted. The (DIS_J2602) bit is set per default to 0.  
33910  
NXP Semiconductors  
35  
6.1.14.4 Overtemperature shutdown (LIN interrupt)  
The output low-side FET is protected against overtemperature conditions. In case of an overtemperature condition, the transmitter is shut  
down and the LINOT bit in the LIN Status Register (LINSR) is set. If the LINM bit is set in the Interrupt Mask Register (IMR), an Interrupt  
IRQ is generated. The transmitter is automatically re-enabled once the condition is gone and TXD is high.  
6.1.14.5 RXD short-circuit detection (LIN interrupt)  
The LIN transceiver has a short-circuit detection for the RXD output pin. If the device transmits and in case of a short-circuit condition,  
either 5.0 V or Ground, the RXSHORT bit in the LIN Status Register (LINSR) is set and the transmitter is shutdown. If the LINM bit is set  
in the Interrupt Mask Register (IMR), an Interrupt IRQ is generated. The transmitter is automatically re-enabled once the condition is gone  
(transition on RXD) and TXD is high. A read of the LIN Status Register (LINSR) without the RXD pin short-circuit condition clears the bit  
RXSHORT.  
6.1.14.6 TXD dominant detection (LIN interrupt)  
The LIN transceiver monitors the TXD input pin to detect a stuck in dominant (0 V) condition. In case of a stuck condition (TXD pin 0 V for  
more than 1 second (typ.)), the transmitter is shut down and the TXDOM bit in the LIN Status Register (LINSR) is set. If the LINM bit is  
set in the IMR, an Interrupt IRQ is generated. The transmitter is automatically re-enabled once TXD is high. A read of the LIN Status  
Register (LINSR) with the TXD pin at 5.0 V clears the bit TXDOM.  
6.1.14.7 LIN receiver operation only  
While in Normal mode, the activation of the RXONLY bit disables the LIN TXD driver. In case of a LIN error condition, this bit is  
automatically set. If Stop mode is selected with this bit set, the LIN wake-up functionality is disabled and the RXD pin reflects the state of  
the LIN bus.  
6.1.14.8 Stop mode and wake-up feature  
During Stop mode operation, the transmitter of the physical layer is disabled. The receiver is still active and able to detect wake-up events  
on the LIN bus line. A dominant level longer than TPROPWL followed by a rising edge generates a wake-up interrupt, and is reported in the  
Interrupt Source Register (ISR). Also see Figure 11.  
6.1.14.9 Sleep mode and wake-up feature  
During Sleep mode operation, the transmitter of the physical layer is disabled. The receiver must be active to detect wake-up events on  
the LIN bus line. A dominant level longer than TPROPWL followed by a rising edge generates a system wake-up (Reset), and is reported  
in the Interrupt Source Register (ISR). Also see Figure 10.  
6.2  
Logic commands and registers  
6.2.1 33910 SPI interface and configuration  
The serial peripheral interface creates the communication link between a microcontroller (master) and the 33910. The interface consists  
of four pins (see Figure 19):  
CS—Chip Select  
MOSI—Master-out Slave-in  
MISO—Master-in Slave-out  
SCLK—Serial Clock  
A complete data transfer via the SPI consists of 1 byte. The master sends 4 bits of address (A3:A0) + 4 bits of control information (C3:C0)  
and the slave replies with four system status bits (VMS, LINS, HSS, n.d.) + 4 bits of status information (S3:S0).  
33910  
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NXP Semiconductors  
CS  
Register Write Data  
A0 C3 C2  
MOSI  
MISO  
A3  
A2  
A1  
C1  
S1  
C0  
S0  
Register Read Data  
VMS LINS HSS S3 S2  
-
SCLK  
Read Data Latch  
Write Data Latch  
Rising: 33910 changes MISO/  
MCU changes MOSI  
Falling: 33910 samples MOSI/  
MCU samples MISO  
Figure 19. SPI protocol  
During the inactive phase of the CS (HIGH), the new data transfer is prepared. The falling edge of the CS indicates the start of a new data  
transfer and puts the MISO in the low-impedance state and latches the analog status data (Register read data). With the rising edge of  
the SPI clock (SCLK), the data is moved to MISO/MOSI pins. With the falling edge of the SPI clock (SCLK), the data is sampled by the  
receiver.  
The data transfer is only valid if exactly eight sample clock edges are present during the active (low) phase of CS. The rising edge of the  
Chip Select CS indicates the end of the transfer and latches the write data (MOSI) into the register. The CS high forces MISO to the high-  
impedance state. Register reset values are described along with the reset condition. Reset condition is the condition causing the bit to be  
set to its reset value. The main reset conditions are:  
- Power-On Reset (POR): the level at which the logic is reset and BATFAIL flag sets.  
- Reset mode  
- Reset done by the RST pin (ext_reset)  
33910  
NXP Semiconductors  
37  
6.3  
SPI register overview  
Table 8. System status register  
BIT  
Adress(A3:A0)  
Register Name / Read/Write Information  
SYSSR - System Status Register  
7
6
5
4
R
VMS  
LINS  
HSS  
-
$0 - $F  
Table 9 summarizes the SPI Register content for Control Information (C3:C0) = W and status information (S3:S0) = R.  
Table 9. SPI register overview  
BIT  
Adress(A3:A0)  
Register Name / Read/Write Information  
3
2
1
0
W
R
HVSE  
0
MOD2  
MOD1  
MCR - Mode Control Register  
VSR - Voltage Status Register  
VSR - Voltage Status Register  
WUCR - Wake-up Control Register  
WUSR - Wake-up Status Register  
WUSR - Wake-up Status Register  
LINCR - LIN Control Register  
LINSR - LIN Status Register  
$0  
$1  
$2  
$3  
$4  
$5  
$6  
$7  
VSOV  
VSOV  
VSUV  
VSUV  
0
VDDOT  
VDDOT  
0
BATFAIL  
BATFAIL  
L1WE  
L1  
R
W
R
0
-
-
-
R
-
-
-
L1  
W
R
DIS_J2602  
RXSHORT  
RXSHORT  
PWMHS2  
HS2OP  
HS2OP  
RXONLY  
TXDOM  
TXDOM  
PWMHS1  
HS2CL  
HS2CL  
WD2  
LSR1  
LINOT  
LINOT  
HS2  
LSR0  
0
LINSR - LIN Status Register  
R
0
HSCR - High-side Control Register  
HSSR - High-side Status Register  
HSSR - High-side Status Register  
W
R
HS1  
HS1OP  
HS1OP  
WD1  
CYST1  
WDOFF  
WDOFF  
MX1  
HS1CL  
HS1CL  
WD0  
CYST0  
WDWO  
WDWO  
MX0  
R
TIMCR - Timing Control Register  
W
CS/WD  
$A  
CYST2  
WDERR  
WDERR  
MX2  
WDSR - Watchdog Status Register  
WDSR - Watchdog Status Register  
AMUXCR - Analog Multiplexer Control Register  
CFR - Configuration Register  
R
R
WDTO  
WDTO  
L1DS  
HVDD  
HSM  
$B  
$C  
$D  
W
W
W
R
CYSX8  
0
0
0
IMR - Interrupt Mask Register  
LINM  
ISR1  
ISR1  
VMM  
ISR0  
ISR0  
$E  
$F  
ISR - Interrupt Source Register  
ISR3  
ISR2  
ISR - Interrupt Source Register  
R
ISR3  
ISR2  
33910  
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NXP Semiconductors  
6.3.1 Register definitions  
6.3.1.1  
System status register - SYSSR  
The System Status Register (SYSSR) is always transferred with every SPI transmission and gives a quick system status overview. It  
summarizes the status of the Voltage Monitor Status (VMS), LIN Status (LINS) and High-side Status (HSS).  
Table 10. System status register  
S7  
S6  
S5  
S4  
Read  
VMS  
LINS  
HSS  
-
This read-only bit indicates one or more bits in the VSR are set.  
1 = Voltage Monitor bit set  
0 = None  
BATFAIL  
VDDOT  
VSUV  
VMS  
VSOV  
Figure 20. Voltage monitor status  
This read-only bit indicates one or more bits in the LINSR are set.  
1 = LIN Status bit set  
0 = None  
LINOT  
LINS  
TXDOM  
RXSHORT  
Figure 21. LIN status  
This read-only bit indicates one or more bits in the HSSR are set.  
1 = High-side Status bit set  
0 = None  
HS1CL  
HS1OP  
HS2CL  
HS2OP  
HSS  
Figure 22. High-side status  
33910  
NXP Semiconductors  
39  
6.3.1.2  
Mode control register - MCR  
The Mode Control Register (MCR) allows switching between the operation modes and to configure the 33910. Writing the MCR returns  
the VSR.  
Table 11. Mode control register - $0  
C3  
HVSE  
1
C2  
0
C1  
C0  
Write  
MOD2  
MOD1  
Reset Value  
Reset Condition  
0
-
-
-
-
POR  
POR  
This write-only bit enables/disables automatic shutdown of the high-side drivers during a high-voltage VSOV condition.  
1 = automatic shutdown enabled  
0 = automatic shutdown disabled  
These write-only bits select the operating mode and allow clearing the watchdog in accordance with Table 9, Mode Control Bits.  
Table 12. Mode control bits  
MOD2  
MOD1  
Description  
0
0
1
1
0
1
0
1
Normal Mode  
Stop Mode  
Sleep Mode  
Normal Mode + Watchdog Clear  
6.3.1.3  
Voltage status register - VSR  
Returns the status of the several voltage monitors. This register is also returned when writing to the Mode Control Register (MCR).  
Table 13. Voltage status register - $0/$1  
S3  
S2  
S1  
S0  
Read  
VSOV  
VSUV  
VDDOT  
BATFAIL  
6.3.1.3.1  
VSOV - V  
overvoltage  
SUP  
This read-only bit indicates an overvoltage condition on the VS1 pin.  
1 = Overvoltage condition.  
0 = Normal condition.  
6.3.1.3.2  
VSUV - V  
undervoltage  
SUP  
This read-only bit indicates an undervoltage condition on the VS1 pin.  
1 = Undervoltage condition.  
0 = Normal condition.  
6.3.1.3.3  
VDDOT - main voltage regulator overtemperature warning  
This read-only bit indicates the main voltage regulator temperature reached the Overtemperature Prewarning Threshold.  
1 = Overtemperature Prewarning  
0 = Normal  
33910  
40  
NXP Semiconductors  
6.3.1.3.4  
BATFAIL - battery fail flag  
This read-only bit is set during power-up and indicates the 33910 had a Power-On-Reset (POR). Any access to the MCR or VSR clears  
the BATFAIL flag.  
1 = POR Reset has occurred  
0 = POR Reset has not occurred  
6.3.1.4  
Wake-up control register - WUCR  
This register is used to control the digital wake-up input. Writing the WUCR returns the Wake-Up Status Register (WUSR).  
Table 14. Wake-up Control Register - $2  
C3  
C2  
C1  
C0  
Write  
0
1
0
1
0
1
L1WE  
1
Reset Value  
Reset Condition  
POR, Reset mode or ext_reset  
6.3.1.4.1  
L1WE - wake-up input enable  
This write-only bit enables/disables the L1 input. In Stop and Sleep mode the L1WE bit activates the L1 input for wake-up. If the L1 input  
is selected on the analog multiplexer, the L1WE is masked to 0.  
1 = Wake-up Input enabled.  
0 = Wake-up Input disabled.  
6.3.1.5  
Wake-up status register - WUSR  
This register is used to monitor the digital wake-up input and is also returned when writing to the WUCR.  
Table 15. Wake-up status register - $2/$3  
S3  
S2  
S1  
S0  
Read  
-
-
-
L1  
6.3.1.5.1  
L1 - wake-up input 1  
This read-only bit indicates the status of the L1 input. If the L1 input is not enabled, then the Wake-up status returns 0. After a wake-up  
from Stop or Sleep mode this bit also allows to verify the L1 input has caused the wake-up, by first reading the Interrupt Status Register  
(ISR) and then reading the WUSR. The source of the wake-up is only reported on the first WUCR or WUSR access.  
1 = L1 pin high, or L1 is the source of the wake-up.  
0 = L1 pin low, disabled or selected as an analog input.  
33910  
NXP Semiconductors  
41  
6.3.1.6  
LIN control register - LINCR  
This register controls the LIN physical interface block. Writing the LIN Control Register (LINCR) returns the LIN Status Register (LINSR).  
Table 16. LIN control register - $4  
C3  
C2  
C1  
C0  
Write  
DIS_J2602  
0
RXONLY  
0
LSR1  
0
LSR0  
0
Reset Value  
POR, Reset mode, ext_reset  
or LIN failure gone*  
Reset Condition  
POR  
POR  
* LIN failure gone: if LIN failure (overtemp, TXD/RXD short) was set, the flag resets automatically when the failure is gone.  
6.3.1.6.1  
J2602 - LIN dominant voltage select  
This write-only bit controls the J2602 circuitry. If the circuitry is enabled (bit sets to 0), the TXD-LIN-RXD communication works down to  
the battery undervoltage condition is detected. Below, the bus is in recessive state. If the circuitry is disabled (bit sets to 1), the  
communication TXD-LIN-RXD works down to 4.6 V (typical value).  
0 = Enabled J2602 feature.  
1 = Disabled J2602 feature.  
6.3.1.6.2  
RXONLY - LIN receiver operation only  
This write-only bit controls the behavior of the LIN transmitter. In Normal mode, the activation of the RXONLY bit disables the LIN  
transmitter. In case of a LIN error condition, this bit is automatically set. In Stop mode this bit disables the LIN wake-up functionality, and  
the RXD pin reflects the state of the LIN bus.  
1 = only LIN receiver active (Normal mode) or LIN wake-up disabled (Stop mode).  
0 = LIN fully enabled.  
6.3.1.6.3  
LSRx - LIN slew rate  
This write-only bit controls the LIN driver slew rate in accordance with Table 18.  
Table 17. LIN slew rate control  
LSR1  
LSR0  
Description  
0
0
1
1
0
1
0
1
Normal Slew Rate (up to 20 kb/s)  
Slow Slew Rate (up to 10 kb/s)  
Fast Slew Rate (up to 100 kb/s)  
Reserved  
6.3.1.7  
LIN status register - LINSR  
This register returns the status of the LIN physical interface block and is also returned when writing to the LINCR.  
Table 18. LIN status register - $4/$5  
S3  
S2  
S1  
S0  
Read  
RXSHORT  
TXDOM  
LINOT  
0
33910  
42  
NXP Semiconductors  
6.3.1.7.1  
RXSHORT - RXD pin short-circuit  
This read-only bit indicates a short-circuit condition on the RXD pin (shorted either to 5.0 V or to Ground). The short-circuit delay must be  
a worst case of 8.0 µs to be detected and to shut down the driver. To clear this bit, it must be read after the condition is gone (transition  
detected on RXD pin). The LIN driver is automatically re-enabled once the condition is gone and TXD is high.  
1 = RXD short-circuit condition.  
0 = None.  
6.3.1.7.2  
TXDOM - TXD permanent dominant  
This read-only bit signals the detection of a TXD pin stuck at dominant (Ground) condition and the resultant shutdown in the LIN  
transmitter. This condition is detected after the TXD pin remains in dominant state for more than 1 second (typical value). To clear this bit,  
it must be read after TXD has gone high. The LIN driver is automatically re-enabled once TXD goes High.  
1 = TXD stuck at dominant fault detected.  
0 = None.  
6.3.1.7.3  
LINOT - LIN driver overtemperature  
This read-only bit signals the LIN transceiver was shutdown due to overtemperature. The transmitter is automatically re-enabled after the  
overtemperature condition is gone and TXD is high. The LINOT bit is cleared after SPI read once the condition is gone.  
1 = LIN overtemperature shutdown  
0 = None  
6.3.1.8  
High-side control register - HSCR  
This register controls the operation of the high-side drivers. Writing to this register returns the High-side Status Register (HSSR).  
Table 19. High-side control register - $6  
C3  
C2  
C1  
C0  
Write  
PWMHS2 PWMHS1  
HS2  
0
HS1  
0
Reset Value  
0
0
POR, Reset mode, ext_reset, HSx  
overtemp or (VSOV & HVSE)  
Reset Condition  
POR  
6.3.1.8.1  
PWMHSx - PWM input control enable  
This write-only bit enables/disables the PWMIN input pin to control the respective high-side switch. The corresponding high-side switch  
must be enabled (HSx bit).  
1 = PWMIN input controls HSx output.  
0 = HSx is controlled only by SPI.  
6.3.1.8.2  
HSx - HSx switch control  
This write-only bit enables/disables the corresponding high-side switch.  
1 = HSx switch on.  
0 = HSx switch off.  
6.3.1.9  
High-side status register - HSSR  
This register returns the status of the high-side switches and is also returned when writing to the HSCR.  
Table 20. High-side Status Register - $6/$7  
S3  
S2  
S1  
S0  
Read  
HS2OP  
HS2CL  
HS1OP  
HS1CL  
33910  
NXP Semiconductors  
43  
6.3.1.9.1  
High-side thermal shutdown  
A thermal shutdown of the high-side drivers is indicated by setting all HSxOP and HSxCL bits simultaneously.  
6.3.1.9.2  
HSxOP - high-side switch open load detection  
This read-only bit signals the high-side switches are conducting current below a certain threshold indicating possible load disconnection.  
1 = HSx Open Load detected (or thermal shutdown)  
0 = Normal  
6.3.1.9.3  
HSxCL - high-side current limitation  
This read-only bit indicates the respective high-side switch is operating in current limitation mode.  
1 = HSx in current limitation (or thermal shutdown)  
0 = Normal  
6.3.1.10 Timing control register - TIMCR  
This register allows to configure the watchdog, the cyclic sense and Forced Wake-up periods. Writing to the Timing Control Register  
(TIMCR) also returns the Watchdog Status Register (WDSR).  
Table 21. Timing control register - $A  
C3  
C2  
C1  
C0  
WD2  
CYST2  
0
WD1  
CYST1  
0
WD0  
CYST0  
0
Write  
CS/WD  
Reset Value  
-
-
Reset Condition  
POR  
6.3.1.10.1 CS/WD - cyclic sense or watchdog prescaler select  
This write-only bit selects which prescaler is being written to, the Cyclic Sense/Forced Wake-up prescaler or the Watchdog prescaler.  
1 = Cyclic Sense/Forced Wake-up Prescaler selected  
0 = Watchdog Prescaler select  
6.3.1.10.2 WDx - watchdog prescaler  
This write-only bits selects the divider for the watchdog prescaler and therefore selects the watchdog period in accordance with Table 22.  
This configuration is valid only if windowing watchdog is active.  
Table 22. Watchdog prescaler  
WD2  
WD1  
WD0  
Prescaler divider  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
2
4
6
8
10  
12  
14  
33910  
44  
NXP Semiconductors  
6.3.1.10.3 CYSTx - cyclic sense period prescaler select  
This write-only bits selects the interval for the wake-up cyclic sensing together with the bit CYSX8 in the Configuration Register (CFR)  
(See Configuration register - CFR on page 47). This option is only active if one of the high-side switches is enabled when entering in Stop  
or Sleep mode. Otherwise, a timed wake-up is performed after the period shown in Table 23.  
Table 23. Cyclic sense and force wake-up interval  
CYSX8 (68)  
CYST2  
CYST1  
CYST0  
Interval  
No cyclic sense (69)  
20 ms  
X
0
0
0
0
0
0
0
1
1
1
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
0
1
0
1
0
1
40 ms  
60 ms  
80 ms  
100 ms  
120 ms  
140 ms  
160 ms  
320 ms  
480 ms  
640 ms  
800 ms  
960 ms  
1120 ms  
Notes  
68. Bit CYSX8 is located in Configuration Register (CFR)  
69. No Cyclic Sense and no Force Wake-up available.  
6.3.1.11 Watchdog status register - WDSR  
This register returns the Watchdog status information and is also returned when writing to the TIMCR.  
Table 24. Watchdog status register - $A/$B  
S3  
S2  
S1  
S0  
Read  
WDTO  
WDERR WDOFF WDWO  
6.3.1.11.1 WDTO - watchdog timeout  
This read-only bit signals the last reset was caused by either a watchdog timeout or by an attempt to clear the Watchdog within the window  
closed. Any access to this register or the Timing Control Register (TIMCR) clears the WDTO bit.  
1 = Last reset caused by watchdog timeout  
0 = None  
6.3.1.11.2 WDERR - watchdog error  
This read-only bit signals the detection of a missing watchdog resistor. In this condition, the watchdog is using the internal, lower precision  
timebase. The Windowing function is disabled.  
1 = WDCONF pin resistor missing  
0 = WDCONF pin resistor not floating  
33910  
NXP Semiconductors  
45  
6.3.1.11.3 WDOFF - watchdog off  
This read-only bit signals the watchdog pin connected to Ground and therefore disabled. In this case watchdog timeouts are disabled and  
the device automatically enters Normal mode out of Reset. This might be necessary for software debugging and for programming the  
Flash memory.  
1 = Watchdog is disabled  
0 = Watchdog is enabled  
6.3.1.11.4 WDWO - watchdog window open  
This read-only bit signals when the watchdog window is open for clears. The purpose of this bit is for testing. Should be ignored in case  
WDERR is High.  
1 = Watchdog window open  
0 = Watchdog window closed  
6.3.1.12 Analog multiplexer control register - MUXCR  
This register controls the analog multiplexer and selects the divider ration for the L1 input divider.  
Table 25. Analog Multiplexer Control Register -$C  
C3  
C2  
C1  
C0  
Write  
L1DS  
1
MX2  
0
MX1  
0
MX0  
0
Reset Value  
POR, Reset mode or  
ext_reset  
Reset Condition  
POR  
6.3.1.12.1 L1DS - L1 analog input divider select  
This write-only bit selects the resistor divider for the L1 analog input. Voltage is internally clamped to VDD.  
0 = L1 Analog divider: 1  
1 = L1 Analog divider: 3.6 (typ.)  
6.3.1.13 MXx - analog multiplexer input select  
These write-only bits selects which analog input is multiplexed to the ADOUT0 pin according to Table 26. When disabled or when in Stop  
or Sleep mode, the output buffer is not powered and the ADOUT0 output is left floating to achieve lower current consumption.  
Table 26. Analog multiplexer channel select  
MX2  
MX1  
MX0  
Meaning  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Disabled  
Reserved  
Die Temperature Sensor (70)  
VSENSE input  
L1 input  
Reserved  
Reserved  
Reserved  
Notes  
70. Accessing the Die Temperature Sensor directly from the Disabled state is not  
recommended. If this transition must be performed and to avoid the intermediate  
state, wait at least 1.0 ms, then start the die temp measurement. Possible access is  
Disabled Vsense input Die Temperature Sensor.  
33910  
46  
NXP Semiconductors  
6.3.1.14 Configuration register - CFR  
This register controls the Hall Sensor Supply enable/disable and the cyclic sense timing multiplier.  
Table 27. Configuration register - $D  
C3  
C2  
C1  
C0  
Write  
HVDD  
0
CYSX8  
0
0
0
0
0
Reset Value  
POR, Reset mode  
or ext_reset  
Reset Condition  
POR  
POR  
POR  
6.3.1.14.1 HVDD - hall sensor supply enable  
This write-only bit enables/disables the state of the hall sensor supply.  
1 = HVDD on  
0 = HVDD off  
6.3.1.14.2 CYSX8 - cyclic sense timing x eight  
This write-only bit influences the cyclic sense and Forced Wake-up period as shown in Table 23.  
1 = Multiplier enabled  
0 = None  
6.3.1.15 Interrupt mask register - IMR  
This register allows masking of some of the interrupt sources. No interrupt is generated to the MCU and no flag is set in the ISR register.  
The 5.0 V Regulator overtemperature prewarning interrupt and undervoltage (VSUV) interrupts can not be masked and always causes  
an interrupt. Writing to the IMR returns the ISR.  
Table 28. Interrupt mask register - $E  
C3  
C2  
C1  
C0  
Write  
HSM  
1
0
1
LINM  
1
VMM  
1
Reset Value  
Reset Condition  
POR  
6.3.1.15.1 HSM - high-side interrupt mask  
This write-only bit enables/disables interrupts generated in the high-side block.  
1 = HS Interrupts Enabled  
0 = HS Interrupts Disabled  
6.3.1.15.2 LINM - LIN interrupts mask  
This write-only bit enables/disables interrupts generated in the LIN block.  
1 = LIN Interrupts Enabled  
0 = LIN Interrupts Disabled  
33910  
NXP Semiconductors  
47  
6.3.1.15.3 VMM - voltage monitor interrupt mask  
This write-only bit enables/disables interrupts generated in the Voltage Monitor block. The only maskable interrupt in the Voltage Monitor  
Block is the VSUP overvoltage interrupt.  
1 = Interrupts Enabled  
0 = Interrupts Disabled  
6.3.1.16 Interrupt source register - ISR  
This register allows the MCU to determine the source of the last interrupt or wake-up respectively. A read of the register acknowledges  
the interrupt and leads IRQ pin to high, if there are no other pending interrupts. If there are pending interrupts, IRQ is driven high for 10 µs  
and then be driven low again.  
This register is also returned when writing to the Interrupt Mask Register (IMR).  
Table 29. Interrupt source register - $E/$F  
S3  
S2  
S1  
S0  
Read  
ISR3  
ISR2  
ISR1  
ISR0  
6.3.1.16.1 ISRx - interrupt source register  
These read-only bits indicate the interrupt source following Table 30. If no interrupt is pending then all bits are 0. If more than one interrupt  
is pending, the interrupt sources are handled sequentially multiplex.  
Table 30. Interrupt sources  
Interrupt source  
ISR3 ISR2 ISR1 ISR0  
Priority  
none maskable  
maskable  
0
0
0
0
0
0
0
0
0
1
0
0
1
1
0
0
1
0
1
0
no interrupt  
no interrupt  
none  
L1 Wake-up from Stop and Sleep mode  
-
highest  
-
HS Interrupt (Overtemperature)  
Reserved  
-
LIN Wake-up  
LIN Interrupt (RXSHORT, TXDOM, LIN OT)  
Voltage Monitor Interrupt  
(Low Voltage and VDD overtemperature)  
Voltage Monitor Interrupt  
(High Voltage)  
0
0
1
1
0
1
1
0
Forced Wake-up  
-
lowest  
33910  
48  
NXP Semiconductors  
7
Typical application  
The 33910 can be configured in several applications. The figure below shows the 33910 in the typical slave node application.  
V
BAT  
D1  
C2  
C1  
VDD  
IRQ  
Interrupt  
Control Module  
LVI, HVI, HTI, OCI  
Voltage Regulator  
C5  
C4  
C3  
AGND  
HVDD  
5.0 V Output Module  
Hall Sensor Supply  
VDD  
Reset  
Control Module  
LVR, HVR, HTR, WD,  
RST  
IRQ  
RST  
Window  
R1  
Watchdog Module  
PWMIN  
TIMER  
High-side Control  
Module  
HS1  
HS2  
MISO  
MOSI  
SCLK  
CS  
Chip Temp Sense Module  
SPI  
&
CONTROL  
SPI  
VSENSE  
VBAT Sense Module  
Analog Input Module  
MCU  
R2  
L1  
ADOUT0  
A/D  
Wake-up Module  
Digital Input Module  
RXD  
TXD  
LIN Physical Layer  
SCI  
A/D  
LIN  
LIN  
C6  
Typical Component Values:  
C1 = 47 µF; C2 = C4 = 100 nF; C3 = 10 µF; C5 = 220 pF  
R1 = 10 kΩ; R2 = 20 kΩ-200 kΩ  
R7  
Recommended Configuration of the not Connected Pins (NC):  
Pin 15, 16, 17, 19, 20, 21, 22 = GND  
Pin 11 = open (floating)  
Pin 28 = this pin is not internally connected and may be used for PCB routing  
optimization.  
33910  
NXP Semiconductors  
49  
8
MC33911BAC product specifications - page 50 to page 95  
33910  
50  
NXP Semiconductors  
9
Internal block diagram  
RST IRQ  
VS2  
VS1  
VDD  
INTERRUPT  
CONTROL  
MODULE  
AGND  
PGND  
VOLTAGE REGULATOR  
LVI, HVI, HTI, OCI  
RESET CONTROL  
MODULE  
LVR, HVR, HTR, WD  
5V OUTPUT  
MODULE  
HVDD  
WINDOW  
WATCHDOG  
MODULE  
VS2  
HIGH-SIDE  
CONTROL  
MODULE  
PWMIN  
HS1  
HS2  
VS2  
MISO  
MOSI  
SCLK  
SPI  
&
CONTROL  
VBAT  
SENSE MODULE  
VSENSE  
CS  
CHIP TEMPERATURE  
SENSE MODULE  
ADOUT0  
L1  
ANALOG INPUT  
MODULE  
WAKE-UP MODULE  
DIGITAL INPUT MODULE  
RXD  
TXD  
LIN PHYSICAL  
LAYER  
LIN  
LGND  
WDCONF  
Figure 23. 33910 Simplified internal block diagram  
33910  
NXP Semiconductors  
51  
10 Pin connections  
10.1 Pinout diagram  
RXD  
TXD  
1
2
3
4
5
6
7
8
24  
23  
22  
21  
20  
19  
18  
17  
HS2  
L1  
MISO  
NC*  
NC*  
NC*  
NC*  
PGND  
NC*  
MOSI  
SCLK  
CS  
ADOUT0  
PWMIN  
* Special Configuration Recommended /  
Mandatory for Marked NC Pins  
Figure 24. 33910 pin connections  
10.2 Pin definitions  
A functional description of each pin can be found in the Functional pin description.  
Table 31. 33910 pin definitions  
Pin  
Pin name  
Formal name  
Definition  
This pin is the receiver output of the LIN interface which reports the state of the bus  
voltage to the MCU interface.  
1
RXD  
Receiver Output  
This pin is the transmitter input of the LIN interface which controls the state of the bus  
output.  
2
TXD  
Transmitter Input  
3
4
5
6
7
8
MISO  
MOSI  
SPI Output  
SPI Input  
SPI data output. When CS is high, the pin is in the high-impedance state.  
SPI data input.  
SCLK  
SPI Clock  
SPI clock Input.  
CS  
SPI Chip Select  
SPI chip select input pin. CS is active low.  
ADOUT0  
PWMIN  
Analog Output Pin 0 Analog multiplexer output.  
PWM Input High-side pulse width modulation input.  
33910  
52  
NXP Semiconductors  
Table 31. 33910 pin definitions (continued)  
Pin  
Pin name  
Formal name  
Definition  
Bidirectional reset I/O pin - driven low when any internal reset source is asserted. RST  
is active low.  
9
RST  
Internal Reset I/O  
Internal Interrupt  
Output  
Interrupt output pin, indicating wake-up events from Stop mode or events from Normal  
and Normal Request modes. IRQ is active low.  
10  
IRQ  
NC  
11, 15-17,  
19-22, 28  
No connect  
Watchdog  
Configuration Pin  
This input pin is for configuration of the watchdog period and allows the disabling of the  
watchdog.  
12  
WDCONF  
13  
14  
LIN  
LIN Bus  
This pin represents the single-wire bus transmitter and receiver.  
LGND  
LIN Ground Pin  
This pin is the device LIN ground connection. It is internally connected to the PGND pin.  
This pin is the device power ground connection. It is internally connected to the LGND  
pin.  
18  
PGND  
Power Ground Pin  
This pin is a wake-up capable digital input (71). In addition, L1 can be sensed analog via  
the analog multiplexer.  
23  
24, 25  
26, 27  
29  
L1  
Wake-up Input  
High-side Outputs  
Power Supply Pin  
Voltage Sense Pin  
HS2, HS1  
VS2, VS1  
VSENSE  
HVDD  
High-side switch outputs.  
These pins are device battery level power supply pins. VS2 is supplying the HS1 driver  
while VS1 supplies the remaining blocks.(72)  
Battery voltage sense input.(73)  
Hall Sensor Supply  
Output  
30  
+5.0 V switchable supply output pin.(74)  
Voltage Regulator  
Output  
31  
32  
VDD  
+5.0 V main voltage regulator output pin.(75)  
This pin is the device analog ground connection.  
AGND  
Analog Ground Pin  
Notes  
71. When used as digital input, a series 33 kΩ resistor must be used to protect against automotive transients.  
72. Reverse battery protection series diodes must be used externally to protect the internal circuitry.  
73. This pin can be connected directly to the battery line for voltage measurements. The pin is self protected against reverse battery connections. It is  
strongly recommended to connect a 10 kΩ resistor in series with this pin for protection purposes.  
74. External capacitor (1.0 µF < C < 10 µF; 0.1 Ω < ESR < 5.0 Ω) required.  
75. External capacitor (2.0 µF < C < 100 µF; 0.1 Ω < ESR < 10 Ω) required.  
33910  
NXP Semiconductors  
53  
11 Electrical characteristics  
11.1 Maximum ratings  
Table 32. Maximum ratings  
All voltages are with respect to ground, unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage  
to the device.  
Symbol  
Ratings  
Value  
Unit  
Notes  
Electrical ratings  
Supply Voltage at VS1 and VS2  
• Normal Operation (DC)  
• Transient Conditions (load dump)  
V
-0.3 to 27  
-0.3 to 40  
SUP(SS)  
V
V
VSUP(PK)  
VDD  
Supply Voltage at VDD  
-0.3 to 5.5  
(76)  
(77)  
Input / Output Pins Voltage  
• CS, RST, SCLK, PWMIN, ADOUT0, MOSI, MISO, TXD, RXD  
• Interrupt Pin (IRQ)  
V
-0.3 to VDD+0.3  
-0.3 to 11  
IN  
V
V
IN(IRQ)  
V
-0.3 to VSUP+0.3  
-0.3 to VSUP+0.3  
HS1 Pin Voltage (DC)  
HS2 Pin Voltage (DC)  
V
V
HS1  
V
HS2  
L1 Pin Voltage  
V
-18 to 40  
±100  
L1DC  
• Normal Operation with a series 33 kΩ resistor (DC)  
• Transient input voltage with external component (according to ISO7637-2)  
(See Figure 26)  
V
V
V
A
V
L1TR  
VVSENSE  
VSENSE Pin Voltage (DC)  
-27 to 40  
LIN Pin Voltage  
• Normal Operation (DC)  
• Transient input voltage with external component (according to ISO7637-2)  
(See Figure 26)  
VBUSDC  
VBUSTR  
-18 to 40  
-150 to 100  
I
VDD output current  
Internally Limited  
VDD  
ESD Voltage  
V
V
ESD1-1  
ESD1-2  
±8000  
±2000  
±150  
• Human Body Model - LIN Pin  
• Human Body Model - all other Pins  
• Machine Model  
(78)  
(79)  
V
V
ESD2  
• Charge Device Model  
±750  
±500  
V
V
• Corner Pins (Pins 1, 8, 9, 16, 17, 24, 25, and 32)  
• All other Pins (Pins 2-7, 10-15, 18-23, 26-31)  
ESD3-1  
ESD3-2  
VNC  
NC Pin Voltage (NC pins 11, 15, 16, 17, 19, 20, 21, 22, and 28)  
Note 79  
Notes  
76. Exceeding voltage limits on specified pins may cause a malfunction or permanent damage to the device.  
77. Extended voltage range for programming purpose only.  
78. Testing is performed in accordance with the Human Body Model (C  
= 100 pF, R  
= 1500 Ω), the Machine Model (C = 200 pF,  
ZAP  
ZAP  
ZAP  
R
= 0 Ω), and the Charge Device Model, Robotic (C  
= 4.0 pF).  
ZAP  
ZAP  
79. Special configuration recommended / mandatory for marked NC pins. Please refer to the typical application.  
33910  
54  
NXP Semiconductors  
Table 32. Maximum ratings (continued)  
All voltages are with respect to ground, unless otherwise noted. Exceeding these ratings may cause a malfunction or permanent damage  
to the device.  
Symbol  
Ratings  
Value  
Unit  
Notes  
Thermal ratings  
Operating Ambient Temperature  
• 33910  
• 34910  
(80)  
(80)  
T
A
-40 to 125  
-40 to 85  
°C  
T
J
Operating Junction Temperature  
Storage Temperature  
-40 to 150  
-55 to 150  
°C  
°C  
TSTG  
Thermal Resistance, Junction to Ambient  
• Natural Convection, Single Layer board (1s)  
• Natural Convection, Four Layer board (2s2p)  
(81), (82)  
(81), (83)  
RθJA  
85  
56  
°C/W  
(84)  
RθJC  
Thermal Resistance, Junction to Case  
23  
°C/W  
(85), (86)  
TPPRT  
Peak Package Reflow Temperature During Reflow  
Note 86  
°C  
Notes  
80. The limiting factor is junction temperature; taking into account the power dissipation, thermal resistance, and heat sinking.  
81. Junction temperature is a function of on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient  
temperature, air flow, power dissipation of other components on the board, and board thermal resistance.  
82. Per JEDEC JESD51-2 with the single layer board (JESD51-3) horizontal.  
83. Per JEDEC JESD51-6 with the board (JESD51-7) horizontal.  
84. Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1).  
85. Pin soldering temperature limit is for 10 seconds maximum duration. Not designed for immersion soldering. Exceeding these limits may cause  
malfunction or permanent damage to the device.  
86. NXP’s Package Reflow capability meets Pb-free requirements for JEDEC standard J-STD-020C. For Peak Package Reflow Temperature and  
Moisture Sensitivity Levels (MSL), Go to www.NXP.com, search by part number [e.g. remove prefixes/suffixes and enter the core ID to view all  
orderable parts. (i.e. MC33xxxD enter 33xxx), and review parametrics.  
33910  
NXP Semiconductors  
55  
11.2 Static electrical characteristics  
Table 33. Static electrical characteristics  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Supply voltage range (VS1, VS2)  
VSUP  
5.5  
18  
27  
40  
V
V
V
Nominal Operating Voltage  
Functional Operating Voltage  
Load Dump  
(87)  
VSUPOP  
VSUPLD  
Supply current range (VSUP = 13.5 V)  
(88)  
IRUN  
Normal Mode (IOUT at V  
= 10 mA), LIN Recessive State  
4.5  
10  
mA  
µA  
DD  
Stop Mode, VDD ON with IOUT = 100 µA, LIN Recessive State  
• 5.5 V < VSUP < 12 V  
(88), (89),  
(90)  
ISTOP  
48  
58  
80  
90  
• VSUP = 13.5 V  
Sleep Mode, VDD OFF, LIN Recessive State  
• 5.5 V < VSUP < 12 V  
(88), (90)  
(91)  
ISLEEP  
27  
37  
35  
48  
µA  
µA  
• 12 V VSUP < 13.5 V  
ICYCLIC  
Cyclic Sense Supply Current Adder  
10  
Supply under/overvoltage detections  
Power-On Reset (BATFAIL)  
• Threshold (measured on VS1)  
• Hysteresis (measured on VS1)  
VBATFAIL  
(92), (91)  
1.5  
3.0  
0.9  
3.9  
V
V
VBATFAIL_HYS  
VSUP undervoltage detection (VSUV Flag) (Normal and Normal  
Request modes, Interrupt Generated)  
• Threshold (measured on VS1)  
• Hysteresis (measured on VS1)  
VSUV  
VSUV_HYS  
5.55  
6.0  
1.0  
6.6  
VSUP overvoltage detection (VSOV Flag) (Normal and Normal  
Request modes, Interrupt Generated)  
• Threshold (measured on VS1)  
• Hysteresis (measured on VS1)  
V
VSOV  
VSOV_HYS  
18  
19.25  
1.0  
20.5  
Notes  
87. Device is fully functional. All features are operating.  
88. Total current (IVS1 + IVS2) measured at GND pins excluding all loads, Cyclic Sense disabled.  
89. Total IDD current (including loads) below 100 µA.  
90. Stop and Sleep mode currents increases if VSUP exceeds 13.5 V.  
91. This parameter is guaranteed by process monitoring but, not production tested.  
92. The flag is set during power up sequence. To clear the flag, a SPI read must be performed.  
33910  
56  
NXP Semiconductors  
Table 33. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Voltage regulator (93) (VDD)  
Normal Mode Output Voltage  
• 1.0 mA < I < 50 mA; 5.5 V < V  
VDDRUN  
IVDDRUN  
VDDDROP  
4.75  
60  
5.00  
110  
0.1  
5.25  
200  
V
mA  
V
< 27 V  
SUP  
VDD  
Normal Mode Output Current Limitation  
Dropout Voltage  
(94)  
0.25  
• I  
= 50 mA  
VDD  
Stop Mode Output Voltage  
• I < 5.0 mA  
V
4.75  
6.0  
5.0  
12  
5.25  
36  
V
DDSTOP  
VDD  
I
Stop Mode Output Current Limitation  
Line Regulation  
mA  
VDDSTOP  
LR  
• Normal mode, 5.5 V < V  
< 18 V; I  
= 10 mA  
VDD  
RUN  
20  
5.0  
25  
25  
mV  
SUP  
LR  
• Stop mode, 5.5 V < V  
< 18 V; I  
= 1.0 mA  
VDD  
STOP  
SUP  
Load Regulation  
LD  
• Normal mode, 1.0 mA < I  
< 50 mA  
RUN  
15  
10  
80  
50  
mV  
°C  
VDD  
LD  
• Stop mode, 0.1 mA < I  
< 5.0 mA  
STOP  
VDD  
Overtemperature Prewarning (Junction)  
• Interrupt generated, Bit VDDOT Set  
(95)  
T
110  
125  
140  
PRE  
(95)  
(95)  
(95)  
T
Overtemperature Prewarning hysteresis  
155  
10  
170  
10  
185  
°C  
°C  
°C  
PRE_HYS  
T
Overtemperature Shutdown Temperature (Junction)  
Overtemperature Shutdown hysteresis  
SD  
T
SD_HYS  
Hall sensor supply output (96) (HVDD)  
V
Voltage matching HVDDACC = (HVDD-VDD) / VDD * 100%  
DD  
H
-2.0  
20  
2.0  
50  
%
VDDACC  
• IHVDD = 15 mA  
I
Current Limitation  
30  
mA  
mV  
HVDD  
Dropout Voltage  
• IHVDD = 15 mA; IVDD = 5.0 mA  
H
160  
300  
VDDDROP  
Line Regulation  
• IHVDD = 5.0 mA; IVDD = 5.0 mA  
LR  
25  
10  
40  
20  
mV  
mV  
HVDD  
HVDD  
Load Regulation  
• 1.0 mA > IHVDD > 15 mA; IVDD = 5.0 mA  
LD  
Notes  
93. Specification with external capacitor 2.0 µF < C < 100 µF and 100 mΩ ≤ ESR 10 Ω.  
94. Measured when voltage has dropped 250 mV below its nominal Value (5.0 V).  
95. This parameter is guaranteed by process monitoring but, not production tested.  
96. Specification with external capacitor 1.0 µF < C < 10 µF and 100 mΩ ≤ ESR 10 Ω.  
33910  
NXP Semiconductors  
57  
Table 33. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
RST input/output pin (RST)  
VRSTTH  
VOL  
VDD Low Voltage Reset Threshold  
4.3  
0.0  
4.5  
4.7  
0.9  
V
V
Low-state Output Voltage  
• IOUT = 1.5 mA; 3.5 V VSUP 27 V  
IOH  
High-state Output Current (0 < VOUT < 3.5 V)  
-150  
1.5  
-250  
-350  
8.0  
µA  
mA  
Pull-down Current Limitation (internally limited)  
VOUT = VDD  
IPD_MAX  
VIL  
VIH  
0.3 x VDD  
VDD + 0.3  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
MISO SPI output pin (MISO)  
Low-state Output Voltage  
• I = 1.5 mA  
VOL  
0.0  
1.0  
V
V
OUT  
High-state Output Voltage  
• IOUT = -250 µA  
VOH  
VDD - 0.9  
VDD  
Tri-state Leakage Current  
ITRIMISO  
-10  
10  
µA  
• 0 V VMISO VDD  
SPI input pins (MOSI, SCLK, CS)  
VIL  
VIH  
0.3 x VDD  
VDD + 0.3  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
MOSI, SCLK Input Current  
IIN  
-10  
10  
10  
30  
µA  
µA  
• 0 V VIN VDD  
CS Pull-up current  
• 0 V < VIN < 3.5 V  
IPUCS  
20  
Interrupt output pin (IRQ)  
Low-state Output Voltage  
• IOUT = 1.5 mA  
VOL  
VOH  
VOH  
0.0  
0.8  
V
V
High-state Output Voltage  
• IOUT = -250 µA  
VDD - 0.8  
VDD  
Leakage current  
• VDD VOUT ≤ 10 V  
2.0  
mA  
Pulse width modulation input pin (PWMIN)  
VIL  
VIH  
0.3 x VDD  
VDD + 0.3  
Low-state Input Voltage  
High-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
Pull-up current  
• 0 V < VIN < 3.5 V  
IPUPWMIN  
10  
20  
30  
µA  
33910  
58  
NXP Semiconductors  
Table 33. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
High-side output HS1 and HS2 pins (HS1, HS2)  
Output Drain-to-Source On Resistance  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
• TJ = 25 °C, ILOAD = 50 mA; VSUP > 9.0 V  
• TJ = 150 °C, ILOAD = 50 mA; VSUP > 9.0 V  
• TJ = 150 °C, ILOAD = 30 mA; 5.5 V < VSUP < 9.0 V  
7.0  
10  
14  
(97)  
RDS(on)  
Ω
Output Current Limitation  
• 0 V < VOUT < VSUP - 2.0 V  
(98)  
(99)  
ILIMHS1  
60  
120  
250  
mA  
IOLHSx  
ILEAK  
Open Load Current Detection  
5.0  
7.5  
10  
mA  
µA  
Leakage Current (-0.2 V < VHSx < VS2 + 0.2 V)  
Short-circuit Detection Threshold  
• 5.5 V < VSUP < 27 V  
(100)  
VTHSC  
VSUP - 2  
V
(101),  
(102)  
THSSD  
Overtemperature Shutdown  
150  
165  
10  
180  
°C  
°C  
(102)  
THSSD_HYS  
Overtemperature Shutdown Hysteresis  
L1 input pin (L1)  
Low Detection Threshold  
• 5.5 V < VSUP < 27 V  
VTHL  
VTHH  
VHYS  
2.0  
3.0  
0.5  
2.5  
3.5  
1.0  
3.0  
4.0  
1.5  
V
V
V
High Detection Threshold  
• 5.5 V < VSUP < 27 V  
Hysteresis  
• 5.5 V < VSUP < 27 V  
Input Current  
• -0.2 V < VIN < VS1  
(103)  
(104)  
IIN  
-10  
10  
µA  
RL1IN  
Analog Input Impedance  
800  
1550  
kΩ  
Analog Input Divider Ratio (RATIOL1 = VL1 / VADOUT0  
• L1DS (L1 Divider Select) = 0  
• L1DS (L1 Divider Select) = 1  
)
RATIOL1  
0.95  
3.42  
1.0  
3.6  
1.05  
3.78  
Analog Output Offset Ratio  
• L1DS (L1 Divider Select) = 0  
• L1DS (L1 Divider Select) = 1  
VRATIOL1-OFFSET  
-80  
-22  
0.0  
0.0  
80  
22  
mV  
%
Analog Inputs Matching  
• L1DS (L1 Divider Select) = 0  
• L1DS (L1 Divider Select) = 1  
L1MATCHING  
96  
96  
100  
100  
104  
104  
Notes  
97. This parameter is production tested up to TA = 125 °C and guaranteed by process monitoring up to TJ = 150 °C.  
98. When overcurrent occurs, the high-side stays ON with limited current capability and the HS1CL flag is set in the HSSR.  
99. When open-load occurs, the flag (HS1OP) is set in the HSSR.  
100. When short circuit occurs and if HVSE flag is enabled, HS1 automatic shutdown.  
101. When overtemperature shutdown occurs, both high-sides are turned off. All flags in HSSR are set.  
102. Guaranteed by characterization but, not production tested  
103. Analog multiplexer input disconnected from L1 input pin.  
104. Analog multiplexer input connected to L1 input pin.  
33910  
NXP Semiconductors  
59  
Table 33. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Window watchdog configuration pin (WDCONF)  
R
External Resistor Range  
20  
200  
15  
kΩ  
EXT  
Watchdog Period Accuracy with External Resistor (Excluding Resistor  
Accuracy)  
(105)  
WD  
-15  
%
ACC  
Analog multiplexer  
STTOV  
Internal Chip Temperature Sense Gain  
10.5  
5.25  
mV/K  
mV  
VSENSE Input Divider Ratio (RATIOVSENSE = VVSENSE / VADOUT0  
• 5.5 V < VSUP < 27 V  
)
RATIOVSENSE  
5.0  
5.5  
VSENSE Output Related Offset  
• -40 °C < TA < -20 °C  
-30  
-45  
30  
45  
OFFSETVSENSE  
Analog output (ADOUT0)  
Maximum Output Voltage  
VOUT_MAX  
VDD - 0.35  
0.0  
VDD  
0.35  
V
V
• -5.0 mA < IO < 5.0 mA  
Minimum Output Voltage  
• -5.0 mA < IO < 5.0 mA  
VOUT_MIN  
RXD output pin (LIN physical layer) (RXD)  
Low-state Output Voltage  
• IOUT = 1.5 mA  
VOL  
0.0  
0.8  
V
V
High-state Output Voltage  
• IOUT = -250 µA  
VOH  
VDD-0.8  
VDD  
TXD input pin (LIN physical layer) (TXD)  
VIL  
VIH  
0.3 x nVDD  
VDD + 0.3  
30  
Low-state Input Voltage  
-0.3  
V
V
0.7 x VDD  
High-state Input Voltage  
IPUIN  
Pin Pull-up Current, 0 < VIN < 3.5 V  
10  
20  
µA  
Notes  
105. Watchdog timing period calculation formula: tPWD [ms] = 0.466 * (REXT - 20) + 10 (REXT in kΩ)  
33910  
60  
NXP Semiconductors  
Table 33. Static electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
LIN physical layer, transceiver (LIN)(106)  
Output Current Limitation  
IBUSLIM  
40  
120  
200  
mA  
• Dominant State, VBUS = 18 V  
Leakage Output Current to GND  
• Dominant State; VBUS = 0 V; VBAT = 12 V  
IBUS_PAS_DOM  
IBUS_PAS_REC  
-1.0  
20  
mA  
µA  
• Recessive State; 8.0 V < VBAT < 18 V; 8.0 V < VBUS < 18 V;  
VBUS VBAT  
• GND Disconnected; GNDDEVICE = VSUP; VBAT = 12 V; 0 < V  
18 V  
IBUS_NO_GND  
IBUS  
-1.0  
1.0  
mA  
µA  
<
BUS  
100  
• V  
disconnected; VSUP_DEVICE = GND; 0 < V  
< 18 V  
BUS  
BAT  
Receiver Input Voltages  
• Receiver Dominant State  
• Receiver Recessive State  
• Receiver Threshold Center (VTH_DOM + VTH_REC)/2  
• Receiver Threshold Hysteresis (VTH_REC - VTH_DOM  
VBUSDOM  
VBUSREC  
VBUS_CNT  
VHYS  
0.6  
0.475  
0.5  
0.4  
0.525  
0.175  
VSUP  
)
LIN Transceiver Output Voltage  
• Recessive State, TXD HIGH, I  
VLIN_REC  
VSUP-1  
= 1.0 µA  
OUT  
VLIN_DOM_0  
1.1  
1.4  
• Dominant State, TXD LOW, 500 Ω External Pull-up Resistor,  
LDVS = 0  
V
VLIN_DOM_1  
1.7  
2.0  
• Dominant State, TXD LOW, 500 Ω External Pull-up Resistor,  
LDVS = 1  
RSLAVE  
TLINSD  
LIN Pull-up Resistor to V  
SUP  
20  
150  
30  
165  
10  
60  
180  
kΩ  
°C  
°C  
(107)  
Overtemperature Shutdown  
TLINSD_HYS  
Overtemperature Shutdown Hysteresis  
Notes  
106. Parameters guaranteed for 7.0 V VSUP 18 V.  
107. When Overtemperature shutdown occurs, the LIN bus goes in recessive state and the flag LINOT in LINSR is set.  
33910  
NXP Semiconductors  
61  
11.3 Dynamic electrical characteristics  
Table 34. Dynamic electrical characteristics  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
SPI interface timing (Figure 34)  
fSPIOP  
tPSCLK  
tWSCLKH  
tWSCLKL  
tLEAD  
SPI Operating Frequency  
SCLK Clock Period  
4.0  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
N/A  
MHz  
ns  
250  
110  
110  
100  
100  
40  
(108)  
(108)  
(108)  
(108)  
(108)  
(108)  
SCLK Clock High Time  
SCLK Clock Low Time  
ns  
ns  
Falling Edge of CS to Rising Edge of SCLK  
Falling Edge of SCLK to CS Rising Edge  
MOSI to Falling Edge of SCLK  
Falling Edge of SCLK to MOSI  
MISO Rise Time  
ns  
tLAG  
ns  
tSISU  
ns  
tSIH  
40  
ns  
(108)  
(108)  
tRSO  
40  
40  
ns  
ns  
• C = 220 pF  
L
MISO Fall Time  
• C = 220 pF  
L
tFSO  
Time from Falling or Rising Edges of CS to:  
• MISO Low-impedance  
• MISO High-impedance  
(108)  
(108)  
tSOEN  
tSODIS  
0.0  
0.0  
50  
50  
ns  
ns  
Time from Rising Edge of SCLK to MISO Data Valid  
• 0.2 x VDD MISO 0.8 x VDD, CL = 100 pF  
tVALID  
0.0  
75  
RST output pin  
tRST  
Reset Low-level Duration after VDD High (See Figure 33)  
Reset Deglitch Filter Time  
0.65  
350  
1.0  
1.35  
900  
ms  
ns  
tRSTDF  
600  
Window watchdog configuration pin (WDCONF)  
Watchdog Time Period  
• External Resistor REXT = 20 kΩ (1%)  
• External Resistor REXT = 200 kΩ (1%)  
• Without External Resistor REXT (WDCONF Pin Open)  
8.5  
79  
110  
10  
94  
150  
11.5  
108  
205  
(109)  
tPWD  
ms  
Notes  
108. This parameter is guaranteed by process monitoring but, not production tested.  
109. Watchdog timing period calculation formula: tPWD [ms] = 0.466 * (REXT - 20) + 10 (REXT in kΩ)  
33910  
62  
NXP Semiconductors  
Table 34. Dynamic electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
L1 input  
tWUF  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
Wake-up Filter Time  
8.0  
20  
38  
μs  
State machine timing  
Delay Between CS LOW-to-HIGH Transition (at End of SPI Stop  
Command) and Stop Mode Activation  
(110)  
(111)  
tSTOP  
μs  
5.0  
tNRTOUT  
Normal Request Mode Timeout (see Figure 33)  
110  
150  
205  
ms  
Delay Between SPI Command and HS Turn On  
• 9.0 V < VSUP < 27 V  
tS-ON  
10  
μs  
Delay Between SPI Command and HS Turn Off  
• 9.0 V < VSUP < 27 V  
(111)  
(110)  
tS-OFF  
10  
10  
μs  
μs  
Delay Between Normal Request and Normal Mode After a Watchdog  
Trigger Command (Normal Request mode)  
tSNR2N  
Delay Between CS Wake-up (CS LOW to HIGH) in Stop Mode and:  
• Normal Request mode, VDD ON and RST HIGH  
• First Accepted SPI Command  
tWUCS  
tWUSPI  
9.0  
90  
15  
80  
N/A  
μs  
μs  
t2CS  
Minimum Time Between Rising and Falling Edge on the CS  
4.0  
LIN physical layer: driver characteristics for normal slew rate - 20.0 kBit/sec (112), (113)  
Duty Cycle 1: D1 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 50 µs  
D1  
0.396  
• 7.0 V VSUP 18 V  
Duty Cycle 2: D2 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 50 µs  
D2  
0.581  
• 7.6 V VSUP 18 V  
LIN physical layer: driver characteristics for slow slew rate - 10.4 kBit/sec (112),(114)  
Duty Cycle 3: D3 = tBUS_REC(MIN)/(2 x tBIT), tBIT = 96 µs  
D3  
0.417  
μs  
μs  
• 7.0 V VSUP 18 V  
Duty Cycle 4: D4 = tBUS_REC(MAX)/(2 x tBIT), tBIT = 96 µs  
D4  
0.590  
• 7.6 V VSUP 18 V  
Notes  
110. This parameter is guaranteed by process monitoring but, not production tested.  
111. Delay between turn on or off command (rising edge on CS) and HS ON or OFF, excluding rise or fall time due to external load.  
112. Bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to LIN signal threshold  
defined at each parameter. See Figure 27.  
113. See Figure 28.  
114. See Figure 29.  
33910  
NXP Semiconductors  
63  
Table 34. Dynamic electrical characteristics (continued)  
Characteristics noted under conditions 5.5 V VSUP 18 V, -40 °C TA 125 °C for the 33910 and -40 °C TA 85 °C for the 34910,  
unless otherwise noted. Typical values noted reflect the approximate parameter mean at TA = 25 °C under nominal conditions, unless  
otherwise noted.  
Symbol  
LIN physical layer: driver characteristics for fast slew rate  
SRFAST  
Characteristic  
Min.  
Typ.  
Max.  
Unit  
Notes  
LIN Fast Slew Rate (Programming mode)  
20  
V/μs  
LIN physical layer: characteristics and wake-up timings (115)  
Propagation Delay and Symmetry  
tREC_PD  
(116)  
(117)  
• Propagation Delay Receiver, tREC_PD = max (tREC_PDR, tREC_PDF  
• Symmetry of Receiver Propagation Delay tREC_PDF - tREC_PDR  
)
-2.0  
3.0  
6.0  
2.0  
μs  
μs  
μs  
s
tREC_SYM  
tPROPWL  
Bus Wake-up Deglitcher (Sleep and Stop modes)  
42  
70  
95  
Bus Wake-up Event Reported  
• From Sleep mode  
• From Stop mode  
(118)  
(119)  
tWAKE  
tWAKE  
9.0  
13  
1500  
17  
tTXDDOM  
TXD Permanent Dominant State Delay  
0.65  
1.0  
1.35  
Pulse width modulation input pin (PWMIN)  
PWMIN pin  
fPWMIN  
(120)  
10  
kHz  
• Max. frequency to drive HS output pins  
Notes  
115.  
V
SUP from 7.0 V to 18 V, bus load RBUS and CBUS 1.0 nF / 1.0 kΩ, 6.8 nF / 660 Ω, 10 nF / 500 Ω. Measurement thresholds: 50% of TXD signal to  
LIN signal threshold defined at each parameter. See Figure 6.  
116. See Figure 9.  
117. See Figure 10, for Sleep and Figure 11, for Stop mode.  
118. The measurement is done with 1.0 µF capacitor and 0 mA current load on VDD. The value takes into account the delay to charge the capacitor.  
The delay is measured between the bus wake-up threshold (VBUSWU) rising edge of the LIN bus and when V reaches 3.0 V. See Figure 10. The  
DD  
delay depends of the load and capacitor on VDD  
.
119. In Stop mode, the delay is measured between the bus wake-up threshold (VBUSWU) and the falling edge of the IRQ pin. See Figure 11.  
120. This parameter is guaranteed by process monitoring but, not production tested.  
11.4 Timing diagrams  
33910  
TRANSIENT PULSE  
GENERATOR  
1.0 nF  
LIN  
(
NOTE  
)
GND  
PGND LGND AGND  
NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.  
Figure 25. Test circuit for transient test pulses (LIN)  
33910  
64  
NXP Semiconductors  
33910  
TRANSIENT PULSE  
GENERATOR  
(NOTE)  
1.0 nF  
L1  
10 kΩ  
GND  
PGND LGND AGND  
NOTE: Waveform Per ISO 7637-2. Test Pulses 1, 2, 3a, 3b.  
Figure 26. Test circuit for transient test pulses (L1)  
VSUP  
R0  
LIN  
TXD  
RXD  
R0 AND C0 COMBINATIONS:  
• 1.0 kΩ and 1.0 nF  
• 660 Ω and 6.8 nF  
• 500 Ω and 10 nF  
C0  
Figure 27. Test circuit for LIN timing measurements  
TXD  
t
t
BIT  
BIT  
t
(MAX)  
t
(MIN)  
BUS_REC  
BUS_DOM  
VLIN_REC  
t
- MAX  
t
- MIN  
REC  
DOM  
74.4% V  
60.0% V  
SUP  
SUP  
t
- MIN  
DOM  
LIN  
58.1% V  
40.0% V  
58.1% V  
40.0% V  
SUP  
SUP  
SUP  
SUP  
28.4% V  
SUP  
28.4% V  
SUP  
42.2% V  
SUP  
t
- MIN  
REC  
t
- MAX  
t
(MIN)  
BUS_DOM  
DOM  
t
(MAX)  
BUS_REC  
RXD  
t
t
RREC  
RDOM  
Figure 28. LIN timing measurements for normal slew rate  
33910  
NXP Semiconductors  
65  
TXD  
t
t
BIT  
BIT  
t
(MAX)  
t
(MIN)  
BUS_REC  
BUS_DOM  
VLIN_REC  
t
- MAX  
t
- MIN  
REC  
DOM  
77.8% V  
60.0% V  
SUP  
SUP  
t
- MIN  
DOM  
LIN  
61.6% V  
40.0% V  
61.6% V  
40.0% V  
SUP  
SUP  
SUP  
SUP  
25.1% V  
SUP  
25.1% V  
SUP  
38.9% V  
SUP  
t
- MIN  
REC  
t
- MAX  
t
(MIN)  
BUS_DOM  
DOM  
t
(MAX)  
BUS_REC  
RXD  
t
t
RREC  
RDOM  
Figure 29. LIN timing measurements for slow slew rate  
VLIN_REC  
V
BUSrec  
V
SUP  
LIN BUS SIGNAL  
V
BUSdom  
RXD  
t
RX_PDF  
t
RX_PDR  
Figure 30. LIN receiver timing  
33910  
66  
NXP Semiconductors  
V
LIN_REC  
LIN  
0.4 V  
SUP  
DOMINANT LEVEL  
VDD  
t
WL  
t
WAKE  
PROP  
Figure 31. LIN wake-up sleep mode timing  
V
LIN_REC  
LIN  
0.4 V  
SUP  
DOMINANT LEVEL  
IRQ  
t
WL  
t
WAKE  
PROP  
Figure 32. LIN wake-up stop mode timing  
V
SUP  
V
DD  
RST  
t
NRTOUT  
t
RST  
Figure 33. Power on reset and normal request timeout timing  
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t
PSCLK  
CS  
t
t
WSCLKH  
LEAD  
t
LAG  
SCLK  
t
WSCLKL  
t
t
SIH  
SISU  
MOSI  
MISO  
UNDEFINED  
D0  
DON’T CARE  
D7  
DON’T CARE  
t
VALID  
t
SODIS  
t
SOEN  
D0  
D7  
DON’T CARE  
Figure 34. SPI timing characteristics  
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12 Functional description  
12.1 Introduction  
The 33910 is designed and developed as a highly integrated and cost-effective solution for automotive and industrial applications. For  
automotive body electronics, the 33910 is well suited to perform keypad applications via the LIN bus. Two power switches are provided  
on the device configured as high-side outputs. Other ports are also provided, which include a wake-up capable pin and a Hall Sensor port  
supply. An internal voltage regulator provides power to a MCU device. Also included in this device is a LIN physical layer, which  
communicates using a single wire. This enables this device to be compatible with 3-wire bus systems, where one wire is used for  
communication, one for battery, and one for ground.  
12.2 Functional pin description  
See Table 1, 33910 simplified application diagram, for a graphic representation of the various pins referred to in the following paragraphs.  
Also, see the 33910 pin connections for a description of the pin locations in the package.  
12.2.1 Receiver output (RXD)  
The RXD pin is a digital output. It is the receiver output of the LIN interface and reports the state of the bus voltage: RXD low when LIN  
bus is dominant, RXD high when LIN bus is recessive.  
12.2.2 Transmitter input (TXD)  
The TXD pin is a digital input. It is the transmitter input of the LIN interface and controls the state of the bus output (dominant when TXD  
is Low, recessive when TXD is High). This pin has an internal pull-up to force recessive state in case the input is left floating.  
12.2.3 LIN bus (LIN)  
The LIN pin represents the single-wire bus transmitter and receiver. It is suited for automotive bus systems and is compliant to the LIN  
bus specification 2.0. The LIN interface is only active during Normal and Normal Request modes.  
12.2.4 Serial data clock (SCLK)  
The SCLK pin is the SPI clock input pin. MISO data changes on the negative transition of the SCLK. MOSI is sampled on the positive  
edge of the SCLK.  
12.2.5 Master out slave in (MOSI)  
The MOSI digital pin receives SPI data from the MCU. This data input is sampled on the positive edge of SCLK.  
12.2.6 Master in slave out (MISO)  
The MISO pin sends data to an SPI-enabled MCU. It is a digital tri-state output used to shift serial data to the microcontroller. Data on this  
output pin changes on the negative edge of the SCLK. When CS is High, this pin remains in high-impedance state.  
12.2.7 Chip select (CS)  
CS is a active low digital input. It must remain low during a valid SPI communication and allow for several devices to be connected in the  
same SPI bus without contention. A rising edge on CS signals the end of the transmission and the moment the data shifted in is latched.  
A valid transmission must consist of 8 bits only. While in STOP mode a low-to-high level transition on this pin generates a wake-up  
condition for the 33910.  
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12.2.8 Analog multiplexer (ADOUT0)  
The ADOUT0 pin can be configured via the SPI to allow the MCU A/D converter to read the several inputs of the Analog Multiplexer,  
including the L1 input voltage and the internal junction temperature.  
12.2.9 PWM input control (PWMIN)  
This digital input can control the high-sides in Normal Request and Normal mode. To enable PWM control, the MCU must perform a write  
operation to the high-side control register (HSCR). This pin has an internal 20 μA current pull-up.  
12.2.10Reset (RST)  
This bidirectional pin is used to reset the MCU in case the 33910 detects a reset condition, or to inform the 33910 the MCU has just been  
reset. After release of the RST pin Normal Request mode is entered. The RST pin is an active low filtered input and output formed by a  
weak pull-up and a switchable pull-down structure which allows this pin to be shorted either to VDD or to GND during software development  
without the risk of destroying the driver.  
12.2.11Interrupt (IRQ)  
The IRQ pin is a digital output used to signal events or faults to the MCU while in Normal and Normal Request mode or to signal a wake-  
up from Stop mode. This active low output transitions to high, only after the interrupt is acknowledged by a SPI read of the respective  
status bits.  
12.2.12Watchdog configuration (WDCONF)  
The WDCONF pin is the configuration pin for the internal watchdog. A resistor can be connected to this pin to configure the window  
watchdog period. When connected directly to ground, the watchdog is disabled. When this pin is left open, the watchdog period is fixed  
to its lower precision internal default value (150 ms typical).  
12.2.13Ground connection (AGND, PGND, LGND)  
The AGND, PGND and LGND pins are the Analog and Power ground pins. The AGND pin is the ground reference of the voltage regulator.  
The PGND and LGND pins are used for high current load return as in the LIN interface pin.  
Note: PGND, AGND and LGND pins must be connected together.  
12.2.14Digital/analog (L1)  
The L1 pin is a multi purpose input. It can be used as a digital input, which can be sampled by reading the SPI and used for wake-up when  
33910 is in Low Power mode or used as analog inputs for the analog multiplexer. When used to sense voltage outside the module, a  
33kohm series resistor must be used on each input.  
When used as a wake-up input L1 can be configured to operate in Cyclic-sense mode. In this mode, one of the high-side switches is  
configured to be periodically turned on and sample the wake-up input. If a state change is detected between two cycles a wake-up is  
initiated. The 33910 can also wake-up from Stop or Sleep by a simple state change on L1. When used as analog input, the voltage present  
on the L1 pins is scaled down by an selectable internal voltage divider and can be routed to the ADOUT0 output through the analog  
multiplexer.  
Note: If L1 input is selected in the analog multiplexer, it is disabled as digital input and remains disabled in Low-power mode. No wake-  
up feature is available in this condition.  
When the L1 input is not selected in the analog multiplexer, the voltage divider is disconnected from this input.  
12.2.15High-side outputs (HS1 and HS2)  
These high-side switches are able to drive loads such as relays or lamps. Their structure is connected to the VS2 supply pin. The pins  
are short-circuit protected and also protected against overheating. HS1and HS2 are controlled by SPI and can respond to a signal applied  
to the PWMIN input pin. The HS1 and HS2 outputs can also be used during Low-power mode for the cyclic-sense of the WAKE input.  
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12.2.16Power supply (VS1 and VS2)  
Those are the battery level voltage supply pins. In an application, VS1 and VS2 pins must be protected against reverse battery connection  
and negative transient voltages, with external components. These pins sustain standard automotive voltage conditions such as load dump  
at 40 V. The high-side switches (HS1 and HS2) are supplied by the VS2 pin, all other internal blocks are supplied by VS1 pin.  
12.2.17Voltage sense pin (VSENSE)  
This input can be connected directly to the battery line. It is protected against battery reverse connection. The voltage present in this input  
is scaled down by an internal voltage divider, and can be routed to the ADOUT0 output pin and used by the MCU to read the battery  
voltage. The ESD structure on this pin allows for excursion up to +40 V, and down to -27 V, allowing this pin to be connected directly to  
the battery line. It is strongly recommended to connect a 10 kΩ resistor in series with this pin for protection purposes.  
12.2.18Hall sensor switchable supply pin (HVDD)  
This pin provides a switchable supply for external hall sensors. While in Normal mode, this current limited output can be controlled through  
the SPI. The HVDD pin needs to be connected to an external capacitor to stabilize the regulated output voltage.  
12.2.19+5.0 V main regulator output (VDD)  
An external capacitor has to be placed on the VDD pin to stabilize the regulated output voltage. The VDD pin is intended to supply a  
microcontroller. The pin is current limited against shorts to GND and overtemperature protected. During Stop mode the voltage regulator  
does not operate with its full drive capabilities and the output current is limited. During Sleep mode the regulator output is completely shut  
down.  
12.3 Functional internal block description  
MC33910 - Functional Block Diagram  
Integrated Supply  
Hall Sensor Supply  
Voltage Regulator  
HVDD  
VDD  
Analog Circuitry  
Window Watchdog  
Wake-Up  
High Side Drivers  
HS1 - HS2  
Digital / Analog Input  
Voltage & Temperature Sense  
LIN Physical Layer  
Interface  
MCU Interface and Output Control  
SPI Interface  
Reset & IRQ Logic  
HS - PWM Control  
LIN Interface / Control  
Analog Output 0  
Integrated Supply  
Analog Circuitry  
MCU Interface and Output Control  
Drivers  
Figure 35. Functional internal block diagram  
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12.3.1 Analog circuitry  
The 33910 is designed to operate under automotive operating conditions. A fully configurable window watchdog circuit resets the  
connected MCU in case of an overflow. Two Low-power modes are available with several different wake-up sources to reactivate the  
device. One analog / digital input can be sensed or used as the wake-up source. The device is capable of sensing the supply voltage  
(VSENSE) and the internal chip temperature (CTEMP).  
12.3.2 High-side drivers  
Two current and temperature protected High-side drivers with PWM capability are provided to drive small loads such as Status LED’s or  
small lamps. Both Drivers can be configured for periodic sense during Low-power modes.  
12.3.3 MCU interface  
The 33910 is providing its control and status information through a standard 8-bit SPI interface. Critical system events such as Low- or  
High-voltage/Temperature conditions as well as overcurrent conditions in any of the driver stages can be reported to the connected MCU  
via IRQ or RST. The high-side driver outputs can be controlled via the SPI register as well as the PWMIN input. The integrated LIN physical  
layer interface can be configured via SPI register and its communication is driven through the RXD and TXD device pins. All internal  
analog sources are multiplexed to the ADOUT0 pin.  
12.3.4 Voltage regulator outputs  
Two independent voltage regulators are implemented on the 33910. The VDD main regulator output is designed to supply a MCU with a  
precise 5.0 V. The switchable HVDD output is dedicated to supply small peripherals as hall sensors.  
12.3.5 LIN physical layer interface  
The 33910 provides a LIN 2.0 compatible LIN physical layer interface with selectable slew rate and various diagnostic features.  
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13 Functional device operations  
13.1 Operational modes  
13.1.1 introduction  
The 33910 offers three main operating modes: Normal (Run), Stop, and Sleep (Low Power). In Normal mode the device is active and is  
operating under normal application conditions. The Stop and Sleep modes are Low-power modes with wake-up capabilities. In Stop mode  
the voltage regulator still supplies the MCU with VDD (limited current capability) and in Sleep mode the voltage regulator is turned off  
(VDD = 0 V).  
Wake-up from Stop mode is initiated by a wake-up interrupt. Wake-up from Sleep mode is done by a reset and the voltage regulator is  
turned back on. The selection of the different modes is controlled by the MOD1:2 bits in the mode control register (MCR). Figure 36  
describes how transitions are done between the different operating modes and Table 35, gives an overview of the Operating mode.  
13.1.2 Reset mode  
The 33910 enters the Reset mode after a power up. In this mode, the RST pin is low for 1.0 ms (typical value). After this delay, the 33910  
enters the Normal Request mode and the RST pin is driven high. The Reset mode is entered if a reset condition occurs (VDD low,  
watchdog trigger fail, after a wake-up from Sleep mode, Normal Request mode timeout occurs).  
13.1.3 Normal request mode  
This is a temporary mode automatically accessed by the device after the Reset mode or after a wake-up from Stop mode. In Normal  
Request mode, the VDD regulator is ON, the Reset pin is high and the LIN is operating in Rx Only mode.  
As soon as the device enters the Normal Request mode an internal timer is started for 150 ms (typical value). During these 150 ms, the  
MCU must configure the timing control register (TIMCR) and the MCR with MOD2 and MOD1 bits ste = 0 to enter in Normal mode. If  
within the 150 ms timeout the MCU does not command the 33910 to Normal mode, it enters in Reset mode. If the WDCONF pin is  
grounded in order to disable the watchdog function, the 33910 goes directly in Normal mode after the Reset mode. If the WDCONF pin is  
open, the 33910 stays typically for 150 ms in Normal Request before entering in Normal mode.  
13.1.4 Normal mode  
In Normal mode, all 33910 functions are active and can be controlled by the SPI and the PWMIN pin. The VDD regulator is ON and delivers  
its full current capability. If an external resistor is connected between the WDCONF pin and the Ground, the window watchdog function is  
enabled. The wake-up input (L1) can be read as a digital input or have its voltage routed through the analog-multiplexer.  
The LIN interface has slew rate and timing compatible with the LIN protocol specification 2.0. The LIN bus can transmit and receive  
information. The high-side switches are active and have PWM capability according to the SPI configuration. The interrupts are generated  
to report failures 5 for VSUP over/undervoltage, thermal shutdown, or thermal shutdown prewarning on the main regulator.  
13.1.5 Sleep mode  
The Sleep mode is a Low-power mode. From Normal mode, the device enters the Sleep mode by sending one SPI command through the  
MCR. All blocks are in their lowest power consumption condition. Only some wake-up sources (wake-up input with or without cyclic sense,  
forced wake-up and LIN receiver) are active. The 5.0 V regulator is OFF. The internal Low-power oscillator may be active if the IC is  
configured for cyclic-sense. In this condition, one of the high-side switches is turned on periodically and the wake-up inputs are sampled.  
Wake-up from Sleep mode is similar to a power-up. The device goes in Reset mode except the SPI reports the wake-up source and the  
BATFAIL flag is not set.  
13.1.6 Stop mode  
The Stop mode is the second Low-power mode, but in this case the 5.0 V regulator is ON with limited current drive capability. The  
application MCU is always supplied while the 33910 is operating in Stop mode. The device can enter in Stop mode only by sending the  
SPI command. When the application is in this mode, it can wake-up from the 33910 side (for example: cyclic sense, force wake-up, LIN  
bus, wake inputs) or the MCU side (CS, RST pins). Wake-up from Stop mode transitions the 33910 to Normal Request mode and  
generates an interrupt except if the wake-up event is a low to high transition on the CS pin or comes from the RST pin.  
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Normal Request Timeout Expired (t  
)
NRTOUT  
V
LOW  
DD  
V
HIGH AND  
DD  
Power Up  
RESET DELAY (tRST) EXPIRED  
POWER  
DOWN  
NORMAL  
REQUEST  
RESET  
V
LOW  
DD  
NORMAL  
WD FAILED  
V
LOW (>t ) EXPIRED  
NRTOUT  
DD  
AND VSUV = 0  
SLEEP COMMAND  
WAKE-UP (RESET)  
STOP  
SLEEP  
V
LOW  
DD  
Legend  
WD: Watchdog  
WD Disabled: Watchdog disabled (WDCONF pin connected to GND)  
WD Trigger: Watchdog is triggered by SPI command  
WD Failed: No watchdog trigger or trigger occurs in closed window  
Stop Command: Stop command sent via the SPI  
Sleep Command: Sleep command sent via the SPI  
Wake-up from Stop mode: L1 state change, LIN bus wake-up, Periodic wake-up, CS rising edge wake-up or RST wake-up.  
Wake-up from Sleep mode: L1 state change, LIN bus wake-up, Periodic wake-up.  
Figure 36. Operating modes and transitions  
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Table 35. Operating modes overview  
Function  
VDD  
Reset mode Normal request mode Normal mode  
Stop mode  
Sleep mode  
-
full  
-
full  
full  
stop  
-
SPI(121)  
HVDD  
SPI  
-
SPI/PWM(122)  
Note (123)  
-
Note (124)  
HSx  
Analog Mux  
L1  
-
SPI/PWM  
SPI  
-
-
SPI  
Input  
-
Input  
Wake-up  
Wake-up  
LIN  
-
Rx-Only  
full/Rx-Only Rx-Only/Wake-up  
Wake-up  
On(64)/Off  
-
Watchdog  
VSENSE  
-
150 ms (typ.) timeout  
On  
-
-
On  
On  
VDD  
Notes  
121. Operation can be enabled/controlled by the SPI.  
122. Operation can be controlled by the PWMIN input.  
123. HSx switches can be configured for cyclic sense operation in Stop mode.  
124. HSx switches can be configured for cyclic sense operation in Sleep mode.  
125. Windowing operation when enabled by an external resistor.  
13.1.7 Interrupts  
Interrupts are used to signal a microcontroller a peripheral needs to be serviced. The interrupts which can be generated change according  
to the Operating mode. While in Normal and Normal Request modes the 33910 signals through interrupts special conditions which may  
require a MCU software action. Interrupts are not generated until all pending wake-up sources are read in the interrupt source register  
(ISR).  
While in Stop mode, interrupts are used to signal wake-up events. Sleep mode does not use interrupts, wake-up is performed by powering-  
up the MCU. In Normal and Normal Request mode the wake-up source can be read by SPI. The interrupts are signaled to the MCU by a  
low logic level of the IRQ pin, which remains low until the interrupt is acknowledged by a SPI read. The IRQ pin is then driven high.  
Interrupts are only asserted while in Normal-, Normal Request and Stop mode. Interrupts are not generated while the RST pin is low. The  
following is a list of the interrupt sources in Normal and Normal Request modes. Some of those can be masked by writing to the SPI-  
interrupt mask register (IMR).  
13.1.7.1 Low voltage interrupt  
Signals when the supply line (VS1) voltage drops below the VSUV threshold (VSUV).  
13.1.7.2 High voltage interrupt  
Signals when the supply line (VS1) voltage increases above the VSOV threshold (VSOV).  
13.1.7.3 Overtemperature prewarning  
Signals when the 33910 temperature has reached the pre-shutdown warning threshold. It is used to warn the MCU an overtemperature  
shutdown in the main 5.0 V regulator is imminent.  
13.1.7.4 LIN overcurrent shutdown/overtemperature shutdown/TXD stuck at dominant/  
RXD short-circuit  
These signal faulty conditions in the LIN interface (except the LIN overcurrent) which led to disable the LIN driver. In order to restart  
operation, the fault must be removed and must be acknowledged by reading the SPI. The LINOC bit functionality in the LIN status register  
(LINSR) is to indicate an LIN overcurrent occurred and the driver stays enabled.  
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13.1.7.5 High-side overtemperature shutdown  
Signals a shutdown of the high-side outputs.  
13.1.8 Reset  
To reset an MCU, the 33910 drives the RST pin low for the time the reset condition lasts. After the reset source has been removed the  
state machine drives the RST output low for at least 1.0 ms typical value before driving it high. In the 33910 four main reset sources exist:  
13.1.8.1 5.0 V regulator low-voltage-reset (V  
)
RSTTH  
The 5.0 V regulator output VDD is continuously monitored against brown outs. If the supply monitor detects the voltage at the VDD pin  
has dropped below the reset threshold VRSTTH the 33910 issues a reset. In case of overtemperature, the voltage regulator is disabled and  
the voltage monitoring issues a VDDOT Flag independently of the VDD voltage.  
13.1.8.2 Window watchdog overflow  
If the watchdog counter is not properly serviced while its window is open, the 33910 detects a MCU software runaway and resets the  
microcontroller.  
13.1.8.3 Wake-up from sleep mode  
During Sleep mode, the 5.0 V regulator is not active, hence all wake-up requests from Sleep mode require a power-up/reset sequence.  
13.1.8.4 External reset  
The 33910 has a bidirectional reset pin which drives the device to a safe state (same as Reset mode) for as long as this pin is held low.  
The RST pin must be held low long enough to pass the internal glitch filter and get recognized by the internal reset circuit. This functionality  
is also active in Stop mode. After the RST pin is released, there is no extra tRST to be considered.  
13.1.9 Wake-up capabilities  
Once entered in to one of the Low-power modes (Sleep or Stop) only wake-up sources can bring the device into Normal mode operation.  
In Stop mode, a wake-up is signaled to the MCU as an interrupt, while in Sleep mode the wake-up is performed by activating the 5.0 V  
regulator and resetting the MCU. In both cases the MCU can detect the wake-up source by accessing the SPI registers. There is no  
specific SPI register bit to signal a CS wake-up or external reset. If necessary this condition is detected by excluding all other possible  
wake-up sources.  
13.1.9.1 Wake-up from wake-up input (L1) with cyclic sense disabled  
The wake-up line is dedicated to sense state changes of external switches and wake-up the MCU (in Sleep or Stop mode). In order to  
select and activate direct wake-up from the L1 input, the wake-up control register (WUCR) must be configured with L1WE input enabled.  
The wake-up input state is read through the wake-up status register (WUSR). L1 input is also used to perform cyclic-sense wake-up.  
Note: Selecting the L1 input in the analog multiplexer before entering Low-power mode disables the wake-up capability of the L1 input.  
13.1.9.2 Wake-up from wake-up input (L1) with cyclic sense timer enabled  
The SBCLIN can wake-up at the end of a cyclic sense period if on the wake-up input lines (L1) a state change occurs. The HSx switch is  
activated in Sleep or Stop modes from an internal timer. Cyclic sense and force wake-up are exclusive. If cyclic sense is enabled, the  
force wake-up can not be enabled. To select and activate the cyclic sense wake-up from the L1 input, prior to entering in low power modes  
(Stop or Sleep modes), the following SPI set-up has to be performed:  
In WUCR: select the L1 input to WU-enable.  
In HSCR: enable HSx.  
In TIMCR: select the CS/WD bit and determine the cyclic sense period with CYSTx bits.  
Perform Goto Sleep/Stop command.  
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13.1.9.3 Forced wake-up  
The 33910 can wake-up automatically after a predetermined time spent in Sleep or Stop mode. Cyclic sense and forced wake-up are  
exclusive. If forced wake-up is enabled, the cyclic sense can not be enabled. To determine the wake-up period, the following SPI set-up  
has to be sent before entering in Low-power modes:  
In TIMCR: select the CS/WD bit and determine the Low-power mode period with CYSTx bits.  
In HSCR: the HSx bit must be disabled.  
13.1.9.4 CS wake-up  
While in Stop mode, a rising edge on the CS causes a wake-up. The CS wake-up does not generate an interrupt and is not reported on  
the SPI.  
13.1.9.5 LIN wake-up  
While in the Low-power modes the 33910 monitors the activity on the LIN bus. A dominant pulse larger than tPROPWL followed by a  
dominant to recessive transition causes a LIN wake-up. This behavior protects the system from a short-to-ground bus condition.  
13.1.9.6 RST wake-up  
While in Stop mode, the 33910 can wake-up when the RST pin is held low long enough to pass the internal glitch filter. Then, the 33910  
changes to Normal Request or Normal modes depending on the WDCONF pin configuration. The RST wake-up does not generate an  
interrupt and is not reported via the SPI.  
From Stop mode, the following wake-up events can be configured:  
Wake-up from L1 input without cyclic sense  
Cyclic sense wake-up inputs  
Force wake-up  
CS wake-up  
LIN wake-up  
RST wake-up  
From Sleep mode, the following wake-up events can be configured:  
Wake-up from L1 input without cyclic sense  
Cyclic sense wake-up inputs  
Force wake-up  
LIN wake-up  
13.1.10Window watchdog  
The 33910 includes a configurable window watchdog which is active in Normal mode. The watchdog can be configured by an external  
resistor connected to the WDCONF pin. The resistor is used to achieve higher precision in the timebase used for the watchdog. SPI clears  
are performed by writing through the SPI in the MOD bits of the MCR.  
During the first half of the SPI timeout watchdog clears are not allowed; but after the first half of the PSPI-timeout window the clear  
operation opens. If a clear operation is performed outside the window, the 33910 resets the MCU, in the same way as when the watchdog  
overflows.  
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WINDOW CLOSED  
NO WATCHDOG CLEAR  
ALLOWED  
WINDOW OPEN  
FOR WATCHDOG  
CLEAR  
WD TIMING X 50%  
WD TIMING X 50%  
WD PERIOD (t  
)
PWD  
WD TIMING SELECTED BY REGISTER  
ON WDCONF PIN  
Figure 37. Window watchdog operation  
To disable the watchdog function in Normal mode, the user must connect the WDCONF pin to ground. This measure effectively disables  
Normal Request mode. The WDOFF bit in the WDSR is set. This condition is only detected during Reset mode. If neither a resistor nor a  
connection to ground is detected, the watchdog falls back to the internal lower precision timebase of 150 ms (typ.) and signals the faulty  
condition through the WDSR.  
The watchdog timebase can be further divided by a prescaler which can be configured by the TIMCR. During Normal Request mode, the  
window watchdog is not active but there is a 150 ms (typ.) timeout for leaving the Normal Request mode. In case of a timeout, the 33910  
enters into Reset mode, resetting the microcontroller before entering again into Normal Request mode.  
13.1.11High-side output pins HS1 and HS2  
These outputs are two high-side drivers intended to drive small resistive loads or LEDs incorporating the following features:  
PWM capability (software maskable)  
Open load detection  
Current limitation  
Overtemperature shutdown (with maskable interrupt)  
High-voltage shutdown (software maskable)  
Cyclic sense  
The high-side switches are controlled by the bits HS1:2 in the High-side Control Register (HSCR).  
13.1.11.1 PWM capability (direct access)  
Each high-side driver offers additional (to the SPI control) direct control via the PWMIN pin. If both the bits HS1 and PWMHS1 are set in  
the High-side Control Register (HSCR), the HS1 driver is turned on if the PWMIN pin is high and turned off if the PWMIN pin is low. This  
applies to HS2 configuring HS2 and PWMHS2 bits.  
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Interrupt  
Control  
Module  
VDD  
HVSE  
VDD  
PWMIN  
PWMHSx  
VS2  
MOD1:2  
HSx  
HIgh-side - Driver  
charge pump  
open load detection  
current limitation  
on/off  
Control  
HSxOP  
HSxCL  
Status  
overtemperture shutdown (interrupt maskable)  
High-voltage shutdown (maskable)  
HSx  
Wake-up  
Module  
Figure 38. High-side drivers HS1 and HS2  
13.1.11.2 Open load detection  
Each high-side driver signals an open load condition if the current through the high-side is below the open load current threshold. The  
open load condition is indicated with the bits HS1OP and HS2OP in the High-side Status Register (HSSR).  
13.1.11.3 Current limitation  
Each high-side driver has an output current limitation. In combination with the overtemperature shutdown the high-side drivers are  
protected against overcurrent and short-circuit failures. When the driver operates in the current limitation area, it is indicated with the bits  
HS1CL and HS2CL in the HSSR.  
Note: If the driver is operating in current limitation mode, excessive power might be dissipated.  
13.1.11.4 Overtemperature protection (HS interrupt)  
Both high-side drivers are protected against overtemperature. If an overtemperature condition occurs, both high-side drivers are shut  
down and the event is latched in the Interrupt Control Module. The shutdown is indicated as HS Interrupt in the Interrupt Source Register  
(ISR).  
A thermal shutdown of the high-side drivers is indicated by setting all HSxOP and HSxCL bits simultaneously. If the bit HSM is set in the  
Interrupt Mask Register (IMR), then an interrupt (IRQ) is generated. A write to the High-side Control Register (HSCR), when the  
overtemperature condition is gone, re-enables the high-side drivers.  
13.1.11.5 High-voltage shutdown  
In case of a high-voltage condition and if the high-voltage shutdown is enabled (bit HVSE in the Mode Control Register (MCR) is set) both  
high-side drivers are shutdown. A write to the High-side Control Register (HSCR), when the high-voltage condition is gone, re-enables  
the high-side drivers.  
13.1.11.6 Sleep and stop mode  
The high-side driver can be enabled to operate in Sleep and Stop mode for cyclic sensing. Also see Table 35, Operating modes overview.  
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13.1.12LIN physical layer  
The LIN bus pin provides a physical layer for single-wire communication in automotive applications. The LIN physical layer is designed to  
meet the LIN physical layer specification and has the following features:  
LIN physical layer 2.0 compliant  
Slew rate selection  
Overcurrent shutdown  
Overtemperature shutdown  
LIN pull-up disable in Stop and Sleep modes  
Advanced diagnostics  
LIN dominant voltage level selection  
The LIN driver is a low-side MOSFET with overcurrent and thermal shutdown. An internal pull-up resistor with a serial diode structure is  
integrated, so no external pull-up components are required for the application in a Slave mode. The fall time from dominant to recessive  
and the rise time from recessive to dominant is controlled. The symmetry between both slopes is guaranteed.  
13.1.12.1 LIN pin  
The LIN pin offers a high susceptibility immunity level from external disturbance, guaranteeing communication.  
INTERRUPT  
CONTROL  
WAKE-UP  
MODULE  
MODULE  
High-voltage  
Shutdown  
High-side  
Interrupt  
LIN  
Wake-up  
MOD1:2  
LSR0:1  
LINPE  
VS1  
LIN DRIVER  
LDVS  
Slope and Slew Rate Control  
Overcurrent Shutdown (interrupt maskable)  
Overtemperature Shutdown (interrupt maskable)  
RXONLY  
RXSHORT  
TXDOM  
LINOT  
LINOC  
30K  
LIN  
TXD  
RXD  
SLOPE  
CONTROL  
LGND  
WAKE-UP  
FILTER  
RECEIVER  
Figure 39. LIN interface  
13.1.12.2 Slew rate selection  
The slew rate can be selected for optimized operation at 10.4 and 20 kBit/s as well as a fast baud rate for test and programming. The slew  
rate can be adapted with the bits LSR1:0 in the LIN control register (LINCR). The initial slew rate is optimized for 20 kBit/s.  
33910  
80  
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13.1.12.3 LIN pull-up disable in stop and sleep mode  
To improve performance and for safe behavior in case of LIN bus short to ground or LIN bus leakage during Low-power mode the internal  
pull-up resistor on the LIN pin can be disconnected by clearing the LINPE bit in the MCR. The bit LINPE also changes the bus wake-up  
threshold (VBUSWU). In case of a LIN bus short to GND, this feature reduces the current consumption in Stop and Sleep modes.  
13.1.12.4 Overcurrent shutdown (LIN interrupt)  
The output low-side FET is protected against overcurrent conditions. In case of an overcurrent condition (e.g. LIN bus short to VBAT), the  
transmitter does not shut down. The bit LINOC in the LIN status register (LINSR) is set. If the bit LINM is set in the interrupt mask register  
(IMR) an Interrupt IRQ is generated.  
13.1.12.5 Overtemperature shutdown (LIN interrupt)  
The output low-side FET is protected against overtemperature conditions. In case of an overtemperature condition, the transmitter is shut  
down and the bit LINOT in the LIN status register (LINSR) is set. If the bit LINM is set in the interrupt mask register (IMR) an Interrupt IRQ  
is generated. The transmitter is automatically re-enabled once the condition is gone and TXD is high. A read of the LIN status register  
(LINSR) with the TXD pin re-enables the transmitter.  
13.1.12.6 RXD short-circuit detection (LIN interrupt)  
The LIN transceiver has a short-circuit detection for the RXD output pin. In case of an short-circuit condition, either 5.0 V or ground, the  
bit RXSHORT in the LIN status register (LINSR) is set and the transmitter is shutdown. If the bit LINM is set in the interrupt mask register  
(IMR) an interrupt IRQ is generated. The transmitter is automatically re-enabled once the condition is gone (transition on RXD) and TXD  
is high. A read of the LIN status register (LINSR) without the RXD pin short-circuit condition clears the bit RXSHORT.  
13.1.12.7 TXD Dominant Detection (LIN interrupt)  
The LIN transceiver monitors the TXD input pin to detect stuck in dominant (0 V) condition. In case of a stuck condition (TXD pin 0V for  
more than 1 second (typ.)) the transmitter is shut down and the bit TXDOM in the LIN status register (LINSR) is set. If the bit LINM is set  
in the interrupt mask register (IMR) an interrupt IRQ is generated. The transmitter is automatically re-enabled once TXD is high. A read  
of the LIN status register (LINSR) with the TXD pin is high clears the bit TXDOM.  
13.1.12.8 LIN dominant voltage level selection  
The LIN dominant voltage level can be selected by the bit LDVS in the LIN control register (LINCR).  
13.1.12.9 LIN receiver operation only  
While in Normal mode the activation of the RXONLY bit disables the LIN TX driver. In the case of a LIN error condition this bit is  
automatically set. If a Low-power mode is selected with this bit set, the LIN wake-up functionality is disabled, then, in Stop mode, the RXD  
pin reflects the state of the LIN bus.  
13.1.12.10Stop mode and wake-up feature  
During Stop mode operation the transmitter of the physical layer is disabled. In case the bit LIN-PU was set in the Stop mode sequence  
the internal pull-up resistor is disconnected from VSUP and a small current source keeps the LIN pin in the recessive state. The receiver  
is still active and able to detect wake-up events on the LIN bus line. A dominant level longer than tPROPWL followed by a rising edge  
generates a wake-up interrupt and is reported in the ISR. Also see Figure 32.  
13.1.12.11Sleep mode and wake-up feature  
During Sleep mode operation the transmitter of the physical layer is disabled. If the bit LIN-PU was set in the Sleep mode sequence, the  
internal pull-up resistor is disconnected from VSUP and a small current source keeps the LIN pin in recessive state. The receiver is still  
active to be able to detect wake-up events on the LIN bus line. A dominant level longer than tPROPWL followed by a rising edge generates  
a system wake-up (Reset) and is reported in the ISR. Also see Figure 31.  
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13.2 Logic commands and registers  
13.2.1 SPI and configuration  
The SPI creates the communication link between a microcontroller (master) and the 33910. The interface consists of four pins (see  
Figure 40):  
CS—Chip Select  
MOSI—Master-Out Slave-In  
MISO—Master-In Slave-Out  
SCLK—Serial Clock  
A complete data transfer via the SPI consists of 1 byte. The master sends 4 bits of address (A3:A0) + 4 bits of control information (C3:C0)  
and the slave replies with three system status bits and one not defined bit (VMS,LINS,HSS,n.d.) + 4 bits of status information (S3:S0).  
CS  
Register Write Data  
MOSI  
MISO  
A3  
A2  
A1  
A0  
C3  
C2  
C1  
S1  
C0  
S0  
Register Read Data  
VMS LINS HSS S3 S2  
SCLK  
Read Data Latch  
Write Data Latch  
Rising Edge of SCLK  
Change MISO/MISO Output  
Falling Edge of SCLK  
Sample MISO/MISO Input  
Figure 40. SPI protocol  
During the inactive phase of the CS (HIGH), the new data transfer is prepared. The falling edge of the CS indicates the start of a new data  
transfer and puts the MISO in the low-impedance state and latches the analog status data (Register read data). With the rising edge of  
the SPI clock (SCLK), the data is moved to MISO/MOSI pins. With the falling edge of the SPI clock (SCLK) the data is sampled by the  
receiver. The data transfer is only valid if exactly eight sample clock edges are present during the active (low) phase of CS.  
The rising edge of the chip select CS indicates the end of the transfer and latches the write data (MOSI) into the register. The CS high  
forces MISO to the high-impedance state. Register reset values are described along with the reset condition. Reset condition is the  
condition causing the bit to be set to its reset value. The main reset conditions are:  
- Power-On Reset (POR): level at which the logic is reset and BATFAIL flag sets.  
- Reset mode  
- Reset done by the RST pin (ext_reset)  
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13.3 SPI register overview  
.
Table 36. System Status Register  
BIT  
Adress(A3:A0)  
Register Name / Read/Write Information  
7
6
5
4
$0 - $F  
SYSSR - System Status Register  
R
VMS  
LINS  
HSS  
-
Table 9 summarizes the SPI Register content for Control Information (C3:C0)=W and status information (S3:S0) = R.  
Table 37. SPI register overview  
BIT  
Adress(A3:A0)  
Register Name / Read/Write Information  
3
2
1
0
MCR - Mode Control Register  
VSR - Voltage Status Register  
VSR - Voltage Status Register  
WUCR - Wake-up Control Register  
WUSR - Wake-up Status Register  
WUSR - Wake-up Status Register  
LINCR - LIN Control Register  
LINSR - LIN Status Register  
W
R
HVSE  
VSOV  
VSOV  
-
LINPE  
VSUV  
VSUV  
-
MOD2  
VDDOT  
VDDOT  
-
MOD1  
BATFAIL  
BATFAIL  
L1WE  
L1  
$0  
$1  
$2  
$3  
$4  
$5  
$6  
$7  
R
W
R
-
-
-
R
-
-
-
L1  
W
R
LDVS  
RXSHORT  
RXSHORT  
PWMHS2  
HS2OP  
HS2OP  
RXONLY  
TXDOM  
TXDOM  
PWMHS1  
HS2CL  
HS2CL  
WD2  
LSR1  
LINOT  
LINOT  
HS2  
LSR0  
LINOC  
LINOC  
HS1  
LINSR - LIN Status Register  
R
HSCR - High-side Control Register  
HSSR - High-side Status Register  
HSSR - High-side Status Register  
W
R
HS1OP  
HS1OP  
WD1  
CYST1  
WDOFF  
WDOFF  
MX1  
HS1CL  
HS1CL  
WD0  
R
TIMCR - Timing Control Register  
W
CS/WD  
$A  
CYST2  
WDERR  
WDERR  
MX2  
CYST0  
WDWO  
WDWO  
MX0  
WDSR - Watchdog Status Register  
WDSR - Watchdog Status Register  
AMUXCR - Analog Multiplexer Control Register  
CFR - Configuration Register  
R
R
WDTO  
WDTO  
L1DS  
HVDD  
HSM  
$B  
$C  
$D  
W
W
W
R
CYSX8  
-
-
-
IMR - Interrupt Mask Register  
LINM  
ISR1  
ISR1  
VMM  
$E  
$F  
ISR - Interrupt Source Register  
ISR3  
ISR2  
ISR0  
ISR - Interrupt Source Register  
R
ISR3  
ISR2  
ISR0  
Note: Address $8 and $9 are reserved and must not be used.  
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13.3.1 Register definitions  
13.3.1.1 System status register - SYSSR  
The system status register (SYSSR) is always transferred with every SPI transmission and gives a quick system status overview. It  
summarizes the status of the voltage status register (VSR), LIN status register (LINSR) and the HSSR.  
Table 38. System Status Register  
S7  
S6  
S5  
S4  
Read  
VMS  
LINS  
HSS  
–.  
13.3.1.1.1 VMS - voltage monitor status  
This read-only bit indicates one or more bits in the voltage status register (VSR) are set.  
1 = Voltage Monitor bit set  
0 = None  
BATFAIL  
VDDOT  
VMS  
VSUV  
VSOV  
Figure 41. Voltage monitor status  
13.3.1.1.2 LINS - LIN status  
This read-only bit indicates one or more bits in the LIN status register (LINSR) are set.  
1 = LIN Status bit set  
0 = None  
LINOC  
LINOT  
LINS  
TXDOM  
RXSHORT  
Figure 42. LIN status  
13.3.1.1.3 HSS - high-side switch status  
This read-only bit indicates one or more bits in the HSSR are set.  
1 = High-side Status bit set  
0 = None  
HS1CL  
HS1OP  
HSS  
HS2CL  
HS2OP  
Figure 43. High-side status  
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13.3.1.2 Mode control register - MCR  
The MCR allows to switch between the operation modes and to configure the 33910. Writing the MCR returns the voltage status register  
(VSR).  
Table 39. Mode control register - $0  
C3  
C2  
C1  
C0  
Write  
HVSE  
1
LINPE  
1
MOD2  
MOD1  
Reset Value  
Reset Condition  
-
-
-
-
POR  
POR  
13.3.1.2.1 HVSE - high-voltage shutdown enable  
This write-only bit enables/disables automatic shutdown of the high-side and the low-side drivers during a high-voltage VSOV condition.  
1 = automatic shutdown enabled  
0 = automatic shutdown disabled  
13.3.1.2.2 LINPE - LIN pull-up enable  
This write-only bit enables/disables the 30 kΩ LIN pull-up resistor in Stop and Sleep modes. This bit also controls the LIN bus wake-up  
threshold.  
1 = LIN pull-up resistor enabled  
0 = LIN pull-up resistor disabled  
13.3.1.2.3 MOD2, MOD1 - mode control bits  
These write-only bits select the Operating mode and allow to clear the watchdog in accordance with Table 38 Mode Control Bits.  
Table 40. Mode control bits  
MOD2  
MOD1  
Description  
0
0
1
1
0
1
0
1
Normal Mode  
Stop Mode  
Sleep Mode  
Normal Mode + watchdog Clear  
13.3.1.3 Voltage status register - VSR  
Returns the status of the several voltage monitors. This register is also returned when writing to the MCR.  
Table 41. Voltage status register - $0/$1  
S3  
S2  
S1  
S0  
Read  
VSOV  
VSUV  
VDDOT  
BATFAIL  
13.3.1.3.1 VSOV - V  
overvoltage  
SUP  
This read-only bit indicates an overvoltage condition on the VS1 pin.  
1 = Overvoltage condition.  
0 = Normal condition.  
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13.3.1.3.2 VSUV - V  
undervoltage  
SUP  
This read-only bit indicates an undervoltage condition on the VS1 pin.  
1 = Undervoltage condition.  
0 = Normal condition.  
13.3.1.3.3 VDDOT - main voltage regulator overtemperature warning  
This read-only bit indicates the main voltage regulator temperature reached the overtemperature prewarning threshold.  
1 = Overtemperature prewarning  
0 = Normal  
13.3.1.3.4 BATFAIL - battery fail flag  
This read-only bit is set during power-up and indicates the 33910 had a power on reset (POR). Any access to the MCR or voltage status  
register (VSR) clears the BATFAIL flag.  
1 = POR Reset has occurred  
0 = POR Reset has not occurred  
13.3.1.4 Wake-up control register - WUCR  
This register is used to control the digital wake-up input. Writing the wake-up control register (WUCR) returns the wake-up status register  
(WUSR).  
Table 42. Wake-up Control Register - $2  
C3  
C2  
C1  
C0  
Write  
0
1
0
1
0
1
L1WE  
1
Reset Value  
Reset Condition  
POR, Reset mode or ext_reset  
13.3.1.4.1 L1WE - wake-up input enable  
This write-only bit enables/disables the L1 input. In Stop and Sleep mode the L1WE bit activates the L1 input for wake-up. If the L1 input  
is selected on the analog multiplexer, the L1WE is masked to 0.  
1 = Wake-up Input enabled.  
0 = Wake-up Input disabled.  
13.3.1.5 Wake-up status register - WUSR  
This register is used to monitor the digital wake-up inputs and also returned when writing to the wake-up control register (WUCR).  
Table 43. Wake-up Status Register - $2/$3  
S3  
S2  
S1  
S0  
Read  
-
-
-
L1  
13.3.1.5.1 L1 - wake-up input  
This read-only bit indicates the status of the L1 input. If the L1 input is not enabled then the wake-up status returns 0. After a wake-up  
form Stop or Sleep mode this bit also allows to verify the L1 input has caused the wake-up, by first reading the interrupt status register  
(ISR) and then reading the wake-up status register (WUSR).  
1 = L1 Wake-up.  
0 = L1 Wake-up disabled or selected as analog input.  
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13.3.1.6 LIN control register - LINCR  
This register controls the LIN physical interface block. Writing the LIN control register (LINCR) returns the LIN status register (LINSR).  
Table 44. LIN control register - $4  
C3  
C2  
C1  
C0  
Write  
LDVS  
0
RXONLY  
0
LSR1  
0
LSR0  
0
Reset Value  
POR, Reset mode,  
ext_reset or LIN  
failure gone*  
POR,Resetmode  
or ext_reset  
Reset Condition  
POR  
* LIN failure gone: if LIN failure (overtemp, TXD/RXD short) was set, the flag resets automatically when the failure is gone.  
13.3.1.6.1 LDVS - LIN dominant voltage select  
This write-only bit controls the LIN Dominant voltage:  
1 = LIN Dominant Voltage = VLIN_DOM_1 (1.7 V typ)  
0 = LIN Dominant Voltage = VLIN_DOM_0 (1.1 V typ)  
13.3.1.6.2 RXONLY - LIN receiver operation only  
This write-only bit controls the behavior of the LIN transmitter. In Normal mode the activation of the RXONLY bit disables the LIN  
transmitter. In case of a LIN error condition, this bit is automatically set. In Stop mode, this bit disables the LIN wake-up functionality and  
the RXD pin reflects the state of the LIN bus.  
1 = only LIN receiver active (Normal mode) or LIN wake-up disabled (Stop mode)  
0 = LIN fully enabled  
13.3.1.6.3 LSRx - LIN slew rate  
This write-only bit controls the LIN driver slew rate in accordance with Table 45.  
Table 45. LIN slew rate control  
LSR1  
LSR0  
Description  
0
0
1
1
0
1
0
1
Normal Slew Rate (up to 20 kb/s)  
Slow Slew Rate (up to 10 kb/s)  
Fast Slew Rate (up to 100 kb/s)  
Reserved  
13.3.1.7 LIN status register - LINSR  
This register returns the status of the LIN physical interface block and is also returned when writing to the LIN control register (LINCR).  
Table 46. LIN status register - $4/$5  
S3  
S2  
S1  
S0  
Read  
RXSHORT  
TXDOM  
LINOT  
LINOC  
33910  
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13.3.1.7.1 RXSHORT - RXD pin short-circuit  
This read-only bit indicates a short-circuit condition on the RXD pin (shorted either to 5.0 V or to Ground). The short-circuit delay must be  
8.0 µs worst case to be detected and to shutdown the driver. To clear this bit, it must be read after the condition is gone (transition detected  
on RXD pin). The LIN driver is automatically re-enabled once the condition is gone.  
1 = RXD short-circuit condition.  
0 = None.  
13.3.1.7.2 TXDOM - TXD permanent dominant  
This read-only bit signals the detection of a TXD pin stuck at dominant (Ground) condition and the resultant shutdown in the LIN  
transmitter. This condition is detected after the TXD pin remains in dominant state for more than 1 second typical value. To clear this bit,  
it must be read after TXD has gone high. The LIN driver is automatically re-enabled once TXD goes High.  
1 = TXD stuck at dominant fault detected.  
0 = None.  
13.3.1.7.3 LINOT - LIN driver overtemperature shutdown  
This read-only bit signals the LIN transceiver was shutdown due to overtemperature. The transmitter is automatically re-enabled after the  
overtemperature condition is gone and TXD is high. The LINOT bit is cleared after SPI read once the condition is gone.  
1 = LIN overtemperature shutdown  
0 = None  
13.3.1.7.4 LINOC - LIN driver overcurrent shutdown  
This read-only bit signals an overcurrent condition occurred on the LIN pin. The LIN driver is not shutdown but an IRQ is generated. To  
clear this bit, it must be read after the condition is gone.  
1 = LIN overcurrent shutdown  
0 = None  
13.3.1.8 High-side control register - HSCR  
This register controls the operation of the high-side drivers. Writing to this register returns the High-side Status Register (HSSR).  
Table 47. High-side control register - $6  
C3  
C2  
C1  
C0  
Write  
PWMHS2 PWMHS1  
HS2  
0
HS1  
0
Reset Value  
0
0
POR, Reset mode, ext_reset, HSx  
overtemp or (VSOV & HVSE)  
Reset Condition  
POR  
13.3.1.8.1 PWMHSx - PWM input control enable  
This write-only bit enables/disables the PWMIN input pin to control the high-side switch. The high-side switch must be enabled (HSx bit).  
1 = PWMIN input controls HS1 output.  
0 = HSx is controlled only by SPI.  
13.3.1.8.2 HSx - high-side switch control  
This write-only bit enables/disables the high-side switch.  
1 = HSx switch on.  
0 = HSx switch off.  
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NXP Semiconductors  
13.3.1.9 High-side status register - HSSR  
This register returns the status of the high-side switch and is also returned when writing to the HSCR.  
Table 48. High-side Status Register - $6/$7  
S3  
S2  
S1  
S0  
Read  
HS2OP  
HS2CL  
HS1OP  
HS1CL  
13.3.1.9.1 High-side thermal shutdown  
A thermal shutdown of the high-side drivers is indicated by setting the HSxOP and HSxCL bits simultaneously.  
13.3.1.9.2 HSxOP - high-side switch open load detection  
This read-only bit signals the high-side switch is conducting current below a certain threshold indicating possible load disconnection.  
1 = HSx Open Load detected (or thermal shutdown)  
0 = Normal  
13.3.1.9.3 HSxCL - high-side current limitation  
This read-only bit indicates the high-side switch is operating in current Limitation mode.  
1 = HSx in current limitation (or thermal shutdown)  
0 = Normal  
13.3.1.10 Timing control register - TIMCR  
This register is a double purpose register which allows to configure the watchdog and the cyclic sense periods. Writing to the TIMCR also  
returns the WDSR.  
Table 49. Timing control register - $A  
C3  
C2  
C1  
C0  
WD2  
CYST2  
0
WD1  
CYST1  
0
WD0  
CYST0  
0
Write  
CS/WD  
Reset Value  
-
-
Reset Condition  
POR  
13.3.1.10.1 CS/WD - cyclic sense or watchdog prescaler select  
This write-only bit selects which prescaler is being written to, the cyclic sense prescaler or the watchdog prescaler.  
1 = Cyclic Sense Prescaler selected  
0 = Watchdog Prescaler select  
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13.3.1.10.2 WDx - watchdog prescaler  
This write-only bits selects the divider for the watchdog prescaler and therefore selects the watchdog period in accordance with Table 50.  
This configuration is valid only if windowing watchdog is active.  
Table 50. Watchdog prescaler  
WD2  
WD1  
WD0  
Prescaler Divider  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
2
4
6
8
10  
12  
14  
13.3.1.10.3 CYSTx - cyclic sense period prescaler select  
This write-only bits selects the interval for the wake-up cyclic sensing together with the bit CYSX8 in the configuration register (CFR) (See  
Configuration register - CFR on page 92). This option is only active if the high-side switch is enabled when entering in Stop or Sleep mode.  
Otherwise a timed wake-up is performed after the period shown in Table 51.  
Table 51. Cyclic sense interval  
CYSX8 (126) CYST2  
CYST1  
CYST0  
Interval  
X
0
0
0
0
0
0
0
1
1
1
1
1
1
1
0
0
0
0
1
1
1
1
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
1
0
1
0
1
0
1
No Cyclic Sense  
20 ms  
40 ms  
60 ms  
80 ms  
100 ms  
120 ms  
140 ms  
160 ms  
320 ms  
480 ms  
640 ms  
800 ms  
960 ms  
1120 ms  
Notes  
126. bit CYSX8 is located in configuration register (CFR)  
33910  
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NXP Semiconductors  
13.3.1.11 Watchdog status register  
This register returns the watchdog status information and is also returned when writing to the TIMCR.  
Table 52. Watchdog status register - $A/$B  
S3  
S2  
S1  
S0  
Read  
WDTO  
WDERR  
WDOFF  
WDWO  
13.3.1.11.1 WDTO - watchdog timeout  
This read-only bit signals the last reset was caused by either a watchdog timeout or by an attempt to clear the watchdog within the window  
closed. Any access to this register or the TIMCR clears the WDTO bit.  
1 = Last reset caused by watchdog timeout  
0 = None  
13.3.1.11.2 WDERR - watchdog error  
This read-only bit signals the detection of a missing watchdog resistor. In this condition the watchdog is using the internal, lower precision  
timebase. The windowing function is disabled.  
1 = WDCONF pin resistor missing  
0 = WDCONF pin resistor not floating  
13.3.1.11.3 WDOFF - watchdog off  
This read-only bit signals the watchdog pin connected to GND and therefore disabled. If watchdog timeouts are disabled, the device  
automatically enters Normal mode out of Reset. This might be necessary for software debugging and for programming the Flash memory.  
1 = Watchdog is disabled  
0 = Watchdog is enabled  
13.3.1.11.4 WDWO - watchdog window open  
This read-only bit signals when the watchdog window is open for clears. The purpose of this bit is for testing. Should be ignored in case  
WDERR is High.  
1 = Watchdog window open  
0 = Watchdog window closed  
13.3.1.12 Analog multiplexer control register - MUXCR  
This register controls the analog multiplexer and selects the divider ration for the L1 input divider.  
Table 53. Analog multiplexer control register -$C  
C3  
C2  
C1  
C0  
Write  
L1DS  
1
MX2  
0
MX1  
0
MX0  
0
Reset Value  
Reset Condition  
POR  
POR, Reset mode or ext_reset  
13.3.1.12.1 L1DS - L1 analog input divider select  
This write-only bit selects the resistor divider for the L1 analog input. Voltage is internally clamped to VDD.  
0 = L1 Analog divider: 1  
1 = L1 Analog divider: 3.6 (typ.)  
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13.3.1.13 MXx - analog multiplexer input select  
These write-only bits selects which analog input is multiplexed to the ADOUT0 pin according to Table 54. When disabled or when in Stop  
or Sleep mode, the output buffer is not powered and the ADOUT0 output is left floating to achieve lower current consumption.  
Table 54. Analog multiplexer channel select  
MX2  
MX1  
MX0  
Meaning  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
Disabled  
Reserved  
Die Temperature Sensor  
VSENSE input  
L1 input  
Reserved  
Reserved  
Reserved  
13.3.1.14 Configuration register - CFR  
This register controls the cyclic sense timing multiplier.  
Table 55. Configuration Register - $D  
C3  
C2  
C1  
C0  
Write  
0
0
CYSX8  
0
0
0
0
0
Reset Value  
POR, Reset mode  
or ext_reset  
Reset Condition  
POR  
POR  
POR  
13.3.1.14.1 HVDD - hall sensor supply enable  
This write-only bit enables/disables the state of the hall sensor supply.  
1 = HVDD on  
0 = HVDD off  
13.3.1.14.2 CYSX8 - cyclic sense timing x eight  
This write-only bit influences the Cyclic Sense period as shown in Table 51.  
1 = Multiplier enabled  
0 = None  
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13.3.1.15 Interrupt mask register - IMR  
This register allow to mask some of interrupt sources. The respective flags within the ISR continues to work, but does not generate  
interrupts to the MCU. The 5.0 V Regulator overtemperature prewarning interrupt and undervoltage (VSUV) interrupts can not be masked  
and always causes an interrupt. Writing to the interrupt mask register (IMR) returns the ISR.  
Table 56. Interrupt mask register - $E  
C3  
C2  
C1  
C0  
Write  
HSM  
1
-.  
1
LINM  
1
VMM  
1
Reset Value  
Reset Condition  
POR  
13.3.1.15.1 HSM - high-side interrupt mask  
This write-only bit enables/disables interrupts generated in the high-side block.  
1 = HS Interrupts Enabled  
0 = HS Interrupts Disabled  
13.3.1.15.2 LINM - LIN interrupts mask  
This write-only bit enables/disables interrupts generated in the LIN block.  
1 = LIN Interrupts Enabled  
0 = LIN Interrupts Disabled  
13.3.1.15.3 VMM - voltage monitor interrupt mask  
This write-only bit enables/disables interrupts generated in the voltage monitor block. The only maskable interrupt in the voltage monitor  
block is the VSUP overvoltage interrupt.  
1 = Interrupts Enabled  
0 = Interrupts Disabled  
13.3.1.16 Interrupt source register - ISR  
This register allows the MCU to determine the source of the last interrupt or wake-up respectively. A read of the register acknowledges  
the interrupt and leads IRQ pin to high, if there are no other pending interrupts. If there are pending interrupts, IRQ is driven high for 10 µs  
and then be driven low again. This register is also returned when writing to the interrupt mask register (IMR).  
Table 57. Interrupt source register - $E/$F  
S3  
S2  
S1  
S0  
Read  
ISR3  
ISR2  
ISR1  
ISR0  
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13.3.1.16.1 ISRx - interrupt source register  
These read-only bits indicate the interrupt source are described in Table 58. If no interrupt is pending than all bits are 0. If more than one  
interrupt is pending, the interrupt sources are handled sequentially multiplex.  
Table 58. Interrupt sources  
Interrupt source  
ISR3 ISR2 ISR1 ISR0  
Priority  
none maskable  
maskable  
0
0
0
0
0
0
0
0
0
0
1
1
0
1
0
1
no interrupt  
no interrupt  
L1 wake-up from Stop mode  
HS interrupt (Overtemperature)  
Reserved  
none  
-
-
-
highest  
LIN interrupt (RXSHORT, TXDOM, LIN OT, LIN  
OC) or LIN wake-up  
0
1
0
0
Voltage monitor interrupt (Low-voltage and VDD  
overtemperature)  
0
0
1
1
0
1
1
0
Voltage monitor interrupt (High-voltage)  
Forced wake-up  
-
lowest  
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14 Typical applications  
The 33910 can be configured in several applications. The figure below shows the 33910 in the typical slave node application.  
V
BAT  
D1  
C2  
C1  
VDD  
IRQ  
Interrupt  
Control Module  
LVI, HVI, HTI, OCI  
Voltage Regulator  
5V Output Module  
C5  
C4  
C3  
AGND  
HVDD  
Hall Sensor Supply  
VDD  
Reset  
Control Module  
LVR, HVR, HTR, WD,  
RST  
IRQ  
RST  
Window  
R1  
Watchdog Module  
PWMIN  
TIMER  
High Side Control  
Module  
HS1  
HS2  
MISO  
MOSI  
SCLK  
CS  
Chip Temp Sense Module  
VBAT Sense Module  
SPI  
&
CONTROL  
SPI  
VSENSE  
MCU  
R2  
L1  
Analog Input Module  
ADOUT0  
A/D  
Wake Up Module  
Digital Input Module  
RXD  
TXD  
LIN Physical Layer  
SCI  
A/D  
LIN  
LIN  
C6  
Typical Component Values:  
C1 = 47 µF; C2 = C4 = 100 nF; C3 = 10 µF; C5 = 220 pF  
R1 = 10 kΩ; R2 = 20 kΩ-200 kΩ  
Recommended Configuration of the not Connected Pins (NC):  
R7  
Pin 15, 16, 17, 19, 20, 21, 22 = GND  
Pin 11 = open (floating)  
Pin 28 = this pin is not internally connected and may be used for PCB routing  
optimization.  
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15 Packaging  
15.1 Package dimensions  
Important For the most current revision of the package, visit www.nxp.com and select Documentation, then under Available  
Documentation column select Packaging Information.  
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NXP Semiconductors  
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16 Revision history  
Revision  
Date  
5/2007  
Description of changes  
1.0  
Initial Release  
Several textual corrections  
Page 11: “Analog Output offset Ratio” changed to “Analog Output offset” +/-22mV  
Page 11: VSENSE Input Divider Ratio adjusted to 5,0/5,25/5,5  
Page 12: Common mode input impedance corrected to 75kΩ  
Page 13/15: LIN PHYSICAL LAYER parameters adjusted to final LIN specification release  
2.0  
9/2007  
3.0  
4.0  
9/2007  
2/2008  
Revision number incremented at engineering request.  
Changed Functional Block Diagram on page 24.  
Datasheet updated according to the Pass1.2 silicon version electrical parameters  
Add Maximum Rating on IBUS_NO_GND parameter  
Added L1, Temperature Sense Analog Output Voltage per characterization, Internal Chip Temperature Sense  
Gain per characterization at three temperatures. See Figure 16, Temperature sense gain, VSENSE Input  
Divider Ratio (RATIOVSENSE=Vsense/Vadout0) per characterization, and VSENSE Output Related Offset  
per characterization parameters  
Added Temperature sense gain section  
5.0  
11/2008  
Minor corrections to ESD Capability, (19), Cyclic Sense ON Time from Stop and Sleep Mode, LIN bus pin  
(LIN), Serial data clock pin (SCLK), Master out slave in pin (MOSI), Master in slave out pin (MISO), Digital/  
analog pin (L1), Normal request mode, Sleep mode, LIN overtemperature shutdown/TXD stuck at dominant/  
RXD short-circuit, Fault detection management conditions, Lin physical layer, LIN interface, Overtemperature  
shutdown (LIN interrupt), LIN receiver operation only, SPI protocol, L1 - wake-up input 1, LIN control register  
- LINCR, and RXSHORT - RXD pin short-circuit  
Updated Freescale form and style  
6.0  
7.0  
2/2009  
3/2009  
Added explanation for pins Not Connected (NC).  
Changed VBAT_SHIFT and GND_SHIFT maximum from 10% to 11.5% for both parameters on page 13.  
Combined Complete Data sheet for Part Numbers MC33910BAC and MC34910BAC to the back of this data  
8.0  
9.0  
3/2010  
sheet.  
Changed ESD Voltage for Machine Model from ±200 to ±150  
Added note (70) to Table 26  
9/2015  
7/2016  
Updated to NXP document form and style  
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99  
Information in this document is provided solely to enable system and software implementers to use NXP products.  
There are no expressed or implied copyright licenses granted hereunder to design or fabricate any integrated circuits  
based on the information in this document. NXP reserves the right to make changes without further notice to any  
products herein.  
How to Reach Us:  
Home Page:  
NXP.com  
Web Support:  
http://www.nxp.com/support  
NXP makes no warranty, representation, or guarantee regarding the suitability of its products for any particular  
purpose, nor does NXP assume any liability arising out of the application or use of any product or circuit, and  
specifically disclaims any and all liability, including without limitation, consequential or incidental damages. "Typical"  
parameters that may be provided in NXP data sheets and/or specifications can and do vary in different applications,  
and actual performance may vary over time. All operating parameters, including "typicals," must be validated for each  
customer application by the customer's technical experts. NXP does not convey any license under its patent rights nor  
the rights of others. NXP sells products pursuant to standard terms and conditions of sale, which can be found at the  
following address:  
http://www.nxp.com/terms-of-use.html.  
NXP, the NXP logo, Freescale, the Freescale logo and SMARTMOS are trademarks of NXP B.V. All other product or  
service names are the property of their respective owners. All rights reserved.  
© 2016 NXP B.V.  
Document Number: MC33910  
Rev. 9.0  
7/2016  

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