N74F3040N [NXP]
Dual 4-input NAND 30 ohm line driver; 双4输入与非30欧姆线路驱动器
| 型号： | N74F3040N |
| 厂家： | 
NXP |
| 描述： | Dual 4-input NAND 30 ohm line driver |
| 文件： | 总8页 (文件大小：75K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
INTEGRATED CIRCUITS
74F3040
Dual 4-input NAND 30 Ω line driver
Product specification
IC15 Data Handbook
1990 Jan 29
Philips
Semiconductors
Philips Semiconductors
Product specification
Dual 4-input NAND 30Ω line driver
74F3040
FEATURES
PIN CONFIGURATION
• 30Ω line driver
D0a
D0b
Q0
1
2
3
4
5
16 NC
• 160mA output drive capability in the Low state
• 67mA output drive capability in the High state
• High speed
15 D0d
14 D0c
GND
GND
13
12
V
V
CC
CC
• Facilitates incident wave switching
Q1
D1a
D1b
6
7
8
11 D1d
10 D1c
• 3nh lead inductance each on V and GND when both side pins
CC
are used
9
NC
SF01362
DESCRIPTION
The 74F3040 is a high current Line Driver composed of two 4-input
NAND gates. It has been designed to deal with the transmission line
effects of PC boards which appear when fast edge rates are used.
TYPICAL
PROPAGATION
DELAY
TYPICAL
SUPPLY CURRENT
(TOTAL)
TYPE
The drive capability of the 74F3040 is 67mA source and 160mA sink
74F3040
2.0ns
10mA
with a V as low as 4.5V. This guarantees incident wave switching
CC
with V not less than 2.0V and V not more than 0.8V while
OH
OL
driving impedances as low as 30Ω. This is applicable with any
combination of outputs using continuous duty.
ORDERING INFORMATION
COMMERCIAL RANGE
= 5V ±10%,
PACKAGE
DRAWING
NUMBER
The propagation delay of the part is minimally affected by reflections
when terminated only by the TTL inputs of other devices.
V
DESCRIPTION
CC
T
amb
= 0°C to +70°C
Performance may be improved by full or partial line termination.
16-pin Plastic DIP
16-pin Plastic SOL
N74F3040N
N74F3040D
SOT38-4
SOT162-1
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
74F(U.L.)
HIGH/LOW
LOAD VALUE
PINS
DESCRIPTION
HIGH/LOW
20µA/0.6mA
67mA/160mA
Dna, Dnb, Dnc, Dnd
Qn
Data inputs
1.0/1.0
Data outputs
3350/266
NOTE: One (1.0) FAST unit load is defined as: 20µA in the High state and 0.6mA in the Low state.
LOGIC SYMBOL
IEC/IEEE SYMBOL
1
&
1
2
14 15
7
8
10 11
2
3
14
15
D0a D0b D0c D0d D1a D1b D1c D1d
7
Q0 Q1
8
6
10
3
6
11
V
= Pin 12, 13
CC
GND = Pin 4, 5
NC = Pin 9, 16
SF01364
SF01363
2
1990 Jan 29
853–0023 98639
Philips Semiconductors
Product specification
Dual 4-input NAND 30Ω line driver
74F3040
LOGIC DIAGRAM
FUNCTION TABLE
INPUTS
Dnb
OUTPUT
1
D0a
Dna
L
Dnc
X
Dnd
X
Qn
H
2
D0b
3
X
L
Q0
14
D0c
X
X
X
H
15
D0d
X
X
X
H
L
X
H
7
X
X
L
H
D1a
8
H
H
H
L
D1b
6
Q1
10
H
L
X
=
=
=
High voltage level
Low voltage level
Don’t care
D1c
11
D1d
V
= Pin 12, 13
CC
GND = Pin 4, 5
NC = Pin 9, 16
SF01365
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
–0.5 to +7.0
–0.5 to +7.0
–30 to +5
UNIT
V
V
Supply voltage
Input voltage
Input current
CC
IN
V
V
I
mA
V
IN
V
Voltage applied to output in High output state
Current applied to output in Low output state
Operating free-air temperature range
Storage temperature range
–0.5 to V
320
OUT
OUT
CC
I
mA
°C
°C
T
amb
0 to +70
T
stg
–65 to +150
RECOMMENDED OPERATING CONDITIONS
LIMITS
SYMBOL
PARAMETER
UNIT
MIN
4.5
NOM
MAX
V
Supply voltage
5.0
5.5
V
V
CC
IH
IL
V
V
High-level input voltage
Low-level input voltage
Input clamp current
2.0
0.8
–18
–67
160
+70
V
I
I
I
mA
mA
mA
°C
IK
High-level output current
Low-level output current
OH
OL
T
amb
Operating free-air temperature range
0
3
1990 Jan 29
Philips Semiconductors
Product specification
Dual 4-input NAND 30Ω line driver
74F3040
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
LIMITS
1
SYMBOL
PARAMETER
TEST CONDITIONS
UNIT
MAX
2
MIN
2.5
2.7
2.0
TYP
±10% V
±5% V
V
V
V
CC
V
V
V
= MIN
= MAX
= MIN
CC
IL
I
= –45mA
OH
V
OH
High-level output current
3.4
CC
IH
3
I
= –67mA
±10% V
OH1
CC
CC
V
CC
= MIN
= MAX
= MIN
I
OL
= 100mA
±10% V
±5% V
0.30
0.30
0.50
0.50
–1.2
V
V
V
V
V
V
OL
Low-level output current
Input clamp voltage
IL
4
I
= 160mA
OL1
CC
IH
V
IK
V
CC
= MIN, I = I
IK
–0.73
I
Input current at maximum input
voltage
I
I
V
CC
= MAX, V = 7.0V
100
µA
I
I
High-level input current
Low-level input current
V
V
= MAX, V = 2.7V
20
–0.6
–200
5.0
µA
mA
mA
mA
mA
IH
CC
I
I
= MAX, V = 0.5V
I
IL
CC
5
I
Output current
V
CC
= MAX, V = 2.25V
–100
O
O
I
I
3.0
16
CCH
I
Supply current (total)
V
CC
= MAX
CC
22
CCL
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V = 5V, T = 25°C.
CC
amb
3. I
4. I
is the current necessary to guarantee the Low-to-High transition in a 30Ω transmission line on the incident wave.
is the current necessary to guarantee the High-to-Low transition in a 30Ω transmission line on the incident wave.
OH1
OL1
5. I is tested under conditions that produce current approximately one half of the true short-circuit output current (I ).
O
OS
AC ELECTRICAL CHARACTERISTICS
LIMITS
T
V
= +25°C
= +5.0V
T
V
= 0°C to +70°C
= +5.0V ± 10%
amb
CC
amb
CC
TEST
CONDITION
SYMBOL
PARAMETER
UNIT
C
= 50pF, R = 500Ω
C = 50pF, R = 500Ω
L L
L
L
MIN
TYP
MAX
MIN
MAX
t
t
Propagation delay
Dna, Dnb, Dnc, Dnd to Qn
1.0
1.0
2.0
2.0
5.0
4.5
1.0
1.0
5.5
5.0
PLH
PHL
Waveform 1
ns
AC WAVEFORMS
For all waveforms, V = 1.5V.
M
Dna, Dnb, Dnc, Dnd
V
V
M
M
t
t
PHL
PLH
V
V
M
M
Qn
SF00069
Waveform 1. Propagation Delay for Inputs to Output
4
1990 Jan 29
Philips Semiconductors
Product specification
Dual 4-input NAND 30Ω line driver
74F3040
TEST CIRCUIT AND WAVEFORMS
t
w
AMP (V)
90%
V
CC
90%
NEGATIVE
PULSE
V
V
M
M
10%
10%
V
V
OUT
IN
0V
PULSE
GENERATOR
D.U.T.
t
t )
t
t )
THL ( f
TLH ( r
R
C
R
L
t
t )
T
L
t
t )
TLH ( r
THL ( f
AMP (V)
90%
M
90%
POSITIVE
PULSE
V
V
M
10%
10%
0V
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
t
w
Input Pulse Definition
INPUT PULSE REQUIREMENTS
R
L
C
L
R
T
=
=
=
Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
Termination resistance should be equal to Z
pulse generators.
family
74F
V
rep. rate
t
t
t
amplitude
M
w
TLH
THL
of
OUT
2.5ns 2.5ns
3.0V
1.5V
1MHz
500ns
SF00006
5
1990 Jan 29
Philips Semiconductors
Product specification
Dual 4-input NAND 30 Ω line driver
74F3040
DIP20: plastic dual in-line package; 20 leads (300 mil)
SOT146-1
6
1990 Jan 29
Philips Semiconductors
Product specification
Dual 4-input NAND 30 Ω line driver
74F3040
SO20: plastic small outline package; 20 leads; body width 7.5 mm
SOT163-1
7
1990 Jan 29
Philips Semiconductors
Product specification
Dual 4-input NAND 30 Ω line driver
74F3040
Data sheet status
[1]
Data sheet
status
Product
status
Definition
Objective
specification
Development
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
Preliminary
specification
Qualification
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
Product
specification
Production
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
[1] Please consult the most recently issued datasheet before initiating or completing a design.
Definitions
Short-form specification — The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition — Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information — Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support — These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Righttomakechanges—PhilipsSemiconductorsreservestherighttomakechanges, withoutnotice, intheproducts, includingcircuits,standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
Sunnyvale, California 94088–3409
Telephone 800-234-7381
print code
Date of release: 05-96
9397-750-05205
Document order number:
Philips
Semiconductors
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