PBHV8118T [NXP]

180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor; 180 V ,1 A NPN高电压低VCEsat晶体管( BISS )晶体管
PBHV8118T
型号: PBHV8118T
厂家: NXP    NXP
描述:

180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor
180 V ,1 A NPN高电压低VCEsat晶体管( BISS )晶体管

晶体 晶体管 开关 光电二极管
文件: 总13页 (文件大小:173K)
中文:  中文翻译
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PBHV8118T  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
Rev. 01 — 7 May 2010  
Product data sheet  
1. Product profile  
1.1 General description  
NPN high-voltage low VCEsat Breakthrough In Small Signal (BISS) transistor in a small  
SOT23 (TO-236AB) Surface-Mounted Device (SMD) plastic package.  
1.2 Features and benefits  
„ High voltage  
„ Low collector-emitter saturation voltage VCEsat  
„ High collector current capability IC and ICM  
„ High collector current gain (hFE) at high IC  
„ AEC-Q101 qualified  
„ Small SMD plastic package  
1.3 Applications  
„ LED driver for LED chain module  
„ LCD backlighting  
„ Automotive power management  
„ Hook switch for wired telecom  
„ Switch Mode Power Supply (SMPS)  
1.4 Quick reference data  
Table 1.  
Symbol  
VCEO  
IC  
Quick reference data  
Parameter  
Conditions  
Min  
Typ  
Max Unit  
collector-emitter voltage  
collector current  
open base  
-
-
180  
V
A
-
-
1
-
[1]  
hFE  
DC current gain  
VCE = 10 V;  
IC = 50 mA  
100  
250  
[1] Pulse test: tp 300 μs; δ ≤ 0.02.  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
2. Pinning information  
Table 2.  
Pinning  
Pin  
1
Description  
base  
Simplified outline  
Graphic symbol  
3
3
2
emitter  
3
collector  
1
1
2
2
sym021  
3. Ordering information  
Table 3.  
Ordering information  
Type number  
Package  
Name  
-
Description  
Version  
PBHV8118T  
plastic surface-mounted package; 3 leads  
SOT23  
4. Marking  
Table 4.  
Marking codes  
Type number  
Marking code[1]  
PBHV8118T  
LZ*  
[1] * = -: made in Hong Kong  
* = p: made in Hong Kong  
* = t: made in Malaysia  
* = W: made in China  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
2 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
5. Limiting values  
Table 5.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol  
VCBO  
VCEO  
VEBO  
IC  
Parameter  
Conditions  
open emitter  
open base  
Min  
Max  
400  
180  
6
Unit  
V
collector-base voltage  
collector-emitter voltage  
emitter-base voltage  
collector current  
-
-
-
-
-
V
open collector  
V
1
A
ICM  
peak collector current  
single pulse;  
2
A
tp 1 ms  
IBM  
peak base current  
single pulse;  
-
400  
mA  
tp 1 ms  
[1]  
Ptot  
Tj  
total power dissipation  
junction temperature  
ambient temperature  
storage temperature  
Tamb 25 °C  
-
300  
mW  
°C  
-
150  
Tamb  
Tstg  
55  
65  
+150  
+150  
°C  
°C  
[1] Device mounted on an FR4 Printed-Circuit Board (PCB), single-sided copper, tin-plated and standard  
footprint.  
006aab150  
400  
P
tot  
(mW)  
300  
200  
100  
0
75  
25  
25  
75  
125  
175  
(°C)  
T
amb  
FR4 PCB, standard footprint  
Fig 1. Power derating curve  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
3 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
6. Thermal characteristics  
Table 6.  
Symbol  
Rth(j-a)  
Thermal characteristics  
Parameter  
Conditions  
Min  
Typ  
Max Unit  
[1]  
thermal resistance from  
junction to ambient  
in free air  
-
-
417  
K/W  
Rth(j-sp)  
thermal resistance from  
junction to solder point  
-
-
70  
K/W  
[1] Device mounted on an FR4 PCB, single-sided copper, tin-plated and standard footprint.  
006aab151  
3
10  
duty cycle = 1  
Z
th(j-a)  
0.75  
0.5  
0.33  
(K/W)  
2
10  
0.2  
0.1  
0.05  
10  
0.02  
0.01  
0
1
1  
10  
10  
5  
4  
3  
2  
1  
2
3
10  
10  
10  
10  
1
10  
10  
10  
t
p
(s)  
FR4 PCB, standard footprint  
Fig 2. Transient thermal impedance from junction to ambient as a function of pulse duration; typical values  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
4 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
7. Characteristics  
Table 7.  
Characteristics  
Tamb = 25 °C unless otherwise specified.  
Symbol  
Parameter  
Conditions  
Min  
Typ  
Max Unit  
ICBO  
collector-base cut-off  
current  
VCB = 144 V; IE = 0 A  
-
-
-
-
100  
10  
nA  
VCB = 144 V; IE = 0 A;  
μA  
Tj = 150 °C  
ICES  
IEBO  
hFE  
collector-emitter cut-off VCE = 144 V; VBE = 0 V  
current  
-
-
-
-
100  
100  
nA  
nA  
emitter-base cut-off  
current  
VEB = 4 V; IC = 0 A  
[1]  
DC current gain  
VCE = 10 V  
IC = 50 mA  
100  
250  
250  
100  
40  
-
IC = 100 mA  
100  
-
IC = 0.5 A  
50  
-
-
[1]  
[1]  
[1]  
VCEsat  
collector-emitter  
saturation voltage  
IC = 100 mA; IB = 10 mA  
IC = 100 mA; IB = 20 mA  
60  
50  
1.2  
mV  
mV  
V
-
33  
VBEsat  
base-emitter saturation IC = 0.5 A; IB = 100 mA  
voltage  
-
1
td  
tr  
delay time  
VCC = 6 V; IC = 0.5 A;  
IBon = 0.1 A; IBoff = 0.1 A  
-
-
-
-
-
-
-
7
-
-
-
-
-
-
-
ns  
rise time  
565  
572  
1320  
740  
2060  
30  
ns  
ton  
ts  
turn-on time  
storage time  
fall time  
ns  
ns  
tf  
ns  
toff  
fT  
turn-off time  
transition frequency  
ns  
VCE = 10 V; IC = 10 mA;  
f = 100 MHz  
MHz  
Cc  
Ce  
collector capacitance  
emitter capacitance  
VCB = 20 V; IE = ie = 0 A;  
f = 1 MHz  
-
-
5.7  
-
-
pF  
pF  
VEB = 0.5 V; IC = ic = 0 A;  
f = 1 MHz  
150  
[1] Pulse test: tp 300 μs; δ ≤ 0.02.  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
5 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
006aac366  
006aac367  
500  
2.0  
I
(mA) = 320  
B
h
I
FE  
288  
256  
224  
192  
C
(A)  
400  
1.5  
(1)  
160  
128  
300  
96  
64  
(2)  
1.0  
0.5  
0.0  
200  
32  
(3)  
100  
0
10  
1  
2
3
4
1
10  
10  
10  
10  
(mA)  
0.0  
1.0  
2.0  
3.0  
4.0  
V
CE  
5.0  
(V)  
I
C
VCE = 10 V  
Tamb = 25 °C  
(1) Tamb = 100 °C  
(2) Tamb = 25 °C  
(3) Tamb = 55 °C  
Fig 3. DC current gain as a function of collector  
current; typical values  
Fig 4. Collector current as a function of  
collector-emitter voltage; typical values  
006aac368  
006aac369  
1.2  
1.3  
V
(V)  
V
BEsat  
(V)  
BE  
(1)  
(2)  
(3)  
0.8  
0.9  
0.5  
0.1  
(1)  
(2)  
(3)  
0.4  
0
10  
1  
2
3
4
1  
2
3
4
1
10  
10  
10  
10  
(mA)  
10  
1
10  
10  
10  
10  
I (mA)  
C
I
C
VCE = 10 V  
IC/IB = 5  
(1) Tamb = 55 °C  
(2) Tamb = 25 °C  
(3) Tamb = 100 °C  
(1) Tamb = 55 °C  
(2) Tamb = 25 °C  
(3) Tamb = 100 °C  
Fig 5. Base-emitter voltage as a function of collector  
current; typical values  
Fig 6. Base-emitter saturation voltage as a function  
of collector current; typical values  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
6 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
006aac370  
006aac371  
1
10  
V
CEsat  
(V)  
V
CEsat  
(V)  
1
1  
10  
(1)  
(2)  
1  
2  
3  
10  
10  
10  
(1)  
(2)  
2  
10  
(3)  
(3)  
3  
10  
10  
1  
2
3
4
1  
2
3
4
1
10  
10  
10  
10  
(mA)  
10  
1
10  
10  
10  
10  
I (mA)  
C
I
C
IC/IB = 5  
Tamb = 25 °C  
(1) Tamb = 100 °C  
(2) Tamb = 25 °C  
(3) Tamb = 55 °C  
(1) IC/IB = 20  
(2) IC/IB = 10  
(3) IC/IB = 5  
Fig 7. Collector-emitter saturation voltage as a  
function of collector current; typical values  
Fig 8. Collector-emitter saturation voltage as a  
function of collector current; typical values  
006aac372  
006aac373  
3
3
10  
10  
R
CEsat  
R
CEsat  
(Ω)  
(Ω)  
2
2
10  
10  
10  
10  
(1)  
(2)  
1
1
(1)  
(3)  
(2)  
(3)  
1  
1  
10  
10  
10  
1  
2
3
4
1  
2
3
4
10  
1
10  
10  
10  
10  
(mA)  
1
10  
10  
10  
10  
I (mA)  
C
I
C
IC/IB = 5  
Tamb = 25 °C  
(1) IC/IB = 20  
(1) Tamb = 100 °C  
(2) Tamb = 25 °C  
(3) Tamb = 55 °C  
(2) IC/IB = 10  
(3) IC/IB = 5  
Fig 9. Collector-emitter saturation resistance as a  
function of collector current; typical values  
Fig 10. Collector-emitter saturation resistance as a  
function of collector current; typical values  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
7 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
8. Test information  
V
V
CC  
BB  
R
R
C
B
V
o
(probe)  
(probe)  
oscilloscope  
oscilloscope  
450 Ω  
450 Ω  
R2  
V
I
DUT  
R1  
mlb826  
Fig 11. Test circuit for switching times  
8.1 Quality information  
This product has been qualified in accordance with the Automotive Electronics Council  
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is  
suitable for use in automotive applications.  
9. Package outline  
3.0  
2.8  
1.1  
0.9  
3
0.45  
0.15  
2.5 1.4  
2.1 1.2  
1
2
0.48  
0.38  
0.15  
0.09  
1.9  
Dimensions in mm  
04-11-04  
Fig 12. Package outline SOT23 (TO-236AB)  
10. Packing information  
Table 8.  
Packing methods  
The indicated -xxx are the last three digits of the 12NC ordering code.[1]  
Type number Package  
Description  
Packing quantity  
3000  
-215  
10000  
PBHV8118T  
SOT23  
4 mm pitch, 8 mm tape and reel  
-235  
[1] For further information and the availability of packing methods, see Section 14.  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
8 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
11. Soldering  
3.3  
2.9  
1.9  
solder lands  
solder resist  
2
3
1.7  
solder paste  
occupied area  
0.6  
0.7  
(3×)  
(3×)  
Dimensions in mm  
0.5  
(3×)  
0.6  
(3×)  
1
sot023_fr  
Fig 13. Reflow soldering footprint SOT23 (TO-236AB)  
2.2  
1.2  
(2×)  
1.4  
(2×)  
solder lands  
solder resist  
occupied area  
2.6  
4.6  
Dimensions in mm  
1.4  
preferred transport direction during soldering  
2.8  
4.5  
sot023_fw  
Fig 14. Wave soldering footprint SOT23 (TO-236AB)  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
9 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
12. Revision history  
Table 9.  
Revision history  
Document ID  
Release date  
Data sheet status  
Change notice  
Supersedes  
PBHV8118T v.1  
20100507  
Product data sheet  
-
-
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
10 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
13. Legal information  
13.1 Data sheet status  
Document status[1][2]  
Product status[3]  
Development  
Definition  
Objective [short] data sheet  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
malfunction of an NXP Semiconductors product can reasonably be expected  
13.2 Definitions  
to result in personal injury, death or severe property or environmental  
damage. NXP Semiconductors accepts no liability for inclusion and/or use of  
NXP Semiconductors products in such equipment or applications and  
therefore such inclusion and/or use is at the customer’s own risk.  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
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Product specification — The information and data provided in a Product  
data sheet shall define the specification of the product as agreed between  
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damage, costs or problem which is based on any weakness or default in the  
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13.3 Disclaimers  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) will cause permanent  
damage to the device. Limiting values are stress ratings only and (proper)  
operation of the device at these or any other conditions above those given in  
the Recommended operating conditions section (if present) or the  
Characteristics sections of this document is not warranted. Constant or  
repeated exposure to limiting values will permanently and irreversibly affect  
the quality and reliability of the device.  
Limited warranty and liability — Information in this document is believed to  
be accurate and reliable. However, NXP Semiconductors does not give any  
representations or warranties, expressed or implied, as to the accuracy or  
completeness of such information and shall have no liability for the  
consequences of use of such information.  
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authorized or warranted to be suitable for use in life support, life-critical or  
safety-critical systems or equipment, nor in applications where failure or  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
11 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
Quick reference data — The Quick reference data is an extract of the  
product data given in the Limiting values and Characteristics sections of this  
document, and as such is not complete, exhaustive or legally binding.  
13.4 Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
14. Contact information  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
PBHV8118T  
All information provided in this document is subject to legal disclaimers.  
© NXP B.V. 2010. All rights reserved.  
Product data sheet  
Rev. 01 — 7 May 2010  
12 of 13  
PBHV8118T  
NXP Semiconductors  
180 V, 1 A NPN high-voltage low VCEsat (BISS) transistor  
15. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
1.4  
General description . . . . . . . . . . . . . . . . . . . . . 1  
Features and benefits. . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Quick reference data . . . . . . . . . . . . . . . . . . . . 1  
2
Pinning information. . . . . . . . . . . . . . . . . . . . . . 2  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Marking. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 3  
Thermal characteristics . . . . . . . . . . . . . . . . . . 4  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Test information. . . . . . . . . . . . . . . . . . . . . . . . . 8  
Quality information . . . . . . . . . . . . . . . . . . . . . . 8  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 8  
Packing information . . . . . . . . . . . . . . . . . . . . . 8  
Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 10  
3
4
5
6
7
8
8.1  
9
10  
11  
12  
13  
Legal information. . . . . . . . . . . . . . . . . . . . . . . 11  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 11  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Disclaimers. . . . . . . . . . . . . . . . . . . . . . . . . . . 11  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
13.1  
13.2  
13.3  
13.4  
14  
15  
Contact information. . . . . . . . . . . . . . . . . . . . . 12  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2010.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 7 May 2010  
Document identifier: PBHV8118T  

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