PHD77NQ03T,118 [NXP]

PHD77NQ03T - N-channel TrenchMOS standard level FET DPAK 3-Pin;
PHD77NQ03T,118
型号: PHD77NQ03T,118
厂家: NXP    NXP
描述:

PHD77NQ03T - N-channel TrenchMOS standard level FET DPAK 3-Pin

开关 脉冲 晶体管
文件: 总13页 (文件大小:101K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
PHD/PHU77NQ03T  
N-channel TrenchMOS FET  
Rev. 01 — 28 November 2006  
Product data sheet  
1. Product profile  
1.1 General description  
N-channel enhancement mode Field-Effect Transistor (FET) in a plastic package using  
TrenchMOS technology.  
1.2 Features  
I Fast switching  
I Low thermal resistance  
I Computer motherboard  
1.3 Applications  
I DC-to-DC converters  
1.4 Quick reference data  
I VDS 25 V  
I ID 75 A  
I RDSon 9.5 mΩ  
I QGD = 3.2 nC (typ)  
2. Pinning information  
Table 1.  
Pinning  
Pin  
1
Description  
gate (G)  
Simplified outline  
Symbol  
mb  
[1]  
2
drain (D)  
mb  
3
source (S)  
D
S
mb  
mounting base; connected to  
drain (D)  
G
2
mbb076  
1
3
1
2
3
SOT428 (DPAK)  
SOT533 (IPAK)  
[1] It is not possible to make a connection to pin 2 of the SOT428 package.  
 
 
 
 
 
 
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
3. Ordering information  
Table 2.  
Ordering information  
Type number  
Package  
Name  
Description  
Version  
PHD77NQ03T  
PHU77NQ03T  
DPAK  
plastic single-ended surface-mounted package; 3 leads  
(one lead cropped)  
SOT428  
IPAK  
plastic single-ended package; 3 leads (in-line)  
SOT533  
4. Limiting values  
Table 3.  
Limiting values  
In accordance with the Absolute Maximum Rating System (IEC 60134).  
Symbol Parameter  
Conditions  
Min  
Max  
Unit  
VDS  
VDGR  
VGS  
ID  
drain-source voltage  
25 °C Tj 175 °C  
-
25  
V
drain-gate voltage (DC)  
gate-source voltage  
drain current  
25 °C Tj 175 °C; RGS = 20 kΩ  
-
25  
V
-
±20  
75  
V
Tmb = 25 °C; VGS = 10 V; see Figure 2 and 3  
Tmb = 100 °C; VGS = 10 V; see Figure 2  
Tmb = 25 °C; pulsed; tp 10 µs; see Figure 3  
Tmb = 25 °C; see Figure 1  
-
A
-
55.9  
240  
107  
+175  
+175  
A
IDM  
Ptot  
Tstg  
Tj  
peak drain current  
-
A
total power dissipation  
storage temperature  
junction temperature  
-
W
°C  
°C  
55  
55  
Source-drain diode  
IS  
source current  
peak source current  
Tmb = 25 °C  
-
-
75  
A
A
ISM  
Tmb = 25 °C; pulsed; tp 10 µs  
240  
Avalanche ruggedness  
EDS(AL)S non-repetitive drain-source  
avalanche energy  
unclamped inductive load; ID = 32 A;  
tp = 0.17 ms; VDS 25 V; RGS = 50 ;  
-
100  
mJ  
VGS = 10 V; starting at Tj = 25 °C  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
2 of 13  
 
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
03aa16  
003aab282  
120  
120  
Pder  
(%)  
Ider  
(%)  
80  
40  
0
80  
40  
0
0
50  
100  
150  
200  
0
50  
100  
150  
200  
mb (°C)  
T
Tmb ( C)  
°
Ptot  
ID  
Pder  
=
× 100 %  
Ider  
=
× 100 %  
-----------------------  
-------------------  
Ptot(25°C)  
ID(25°C)  
Fig 1. Normalized total power dissipation as a  
function of mounting base temperature  
Fig 2. Normalized continuous drain current as a  
function of mounting base temperature  
003aab283  
103  
ID  
Limit RDSon = VDS / ID  
(A)  
t =  
p
10 µs  
102  
100 µs  
DC  
10  
1 ms  
1
1
10  
102  
VDS (V)  
Tmb = 25 °C; IDM is single pulse  
Fig 3. Safe operating area; continuous and peak drain currents as a function of drain-source voltage  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
3 of 13  
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
5. Thermal characteristics  
Table 4.  
Symbol Parameter  
Rth(j-mb) thermal resistance from junction to mounting base see Figure 4  
Thermal characteristics  
Conditions  
Min  
Typ  
Max Unit  
-
-
1.4  
K/W  
Rth(j-a)  
thermal resistance from junction to ambient  
SOT428  
[1]  
[1]  
minimum footprint  
-
-
-
75  
50  
70  
-
-
-
K/W  
K/W  
K/W  
SOT404 minimum footprint  
vertical in free air  
SOT533  
[1] Mounted on a printed-circuit board; vertical in still air.  
003aab284  
10  
Zth(j-mb)  
(K/W)  
1
δ =0.5  
0.2  
0.1  
tp  
T
10-1  
P
0.05  
δ =  
0.02  
single pulse  
t
tp  
T
10-2  
10-5  
10-4  
10-3  
10-2  
10-1  
1
tp (s)  
Fig 4. Transient thermal impedance from junction to mounting base as a function of pulse duration  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
4 of 13  
 
 
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
6. Characteristics  
Table 5.  
Characteristics  
Tj = 25 °C unless otherwise specified.  
Symbol Parameter  
Conditions  
Min  
Typ  
Max Unit  
Static characteristics  
V(BR)DSS drain-source breakdown  
voltage  
ID = 250 µA; VGS = 0 V  
Tj = 25 °C  
25  
25  
-
-
-
-
V
V
Tj = 55 °C  
VGS(th)  
gate-source threshold voltage  
drain leakage current  
ID = 1 mA; VDS = VGS; see Figure 9 and 10  
Tj = 25 °C  
2.1  
1.35  
-
2.65 3.2  
V
V
V
Tj = 175 °C  
-
-
-
Tj = 55 °C  
3.65  
IDSS  
VDS = 25 V; VGS = 0 V  
Tj = 25 °C  
-
-
-
-
-
10  
500  
100  
-
µA  
µA  
nA  
Tj = 175 °C  
-
IGSS  
RG  
gate leakage current  
gate resistance  
VGS = ±20 V; VDS = 0 V  
f = 1 MHz  
-
1.2  
RDSon  
drain-source on-state  
resistance  
VGS = 10 V; ID = 25 A; see Figure 6 and 8  
Tj = 25 °C  
-
-
8.3  
15  
9.5  
mΩ  
Tj = 175 °C  
17.1 mΩ  
Dynamic characteristics  
QG(tot)  
QGS  
QGS1  
QGS2  
QGD  
VGS(pl)  
QG(tot)  
Ciss  
total gate charge  
ID = 25 A; VDS = 12 V; VGS = 10 V;  
see Figure 11 and 12  
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
17.1  
6
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
nC  
nC  
nC  
nC  
nC  
V
gate-source charge  
pre-VGS(th) gate-source charge  
post-VGS(th) gate-source charge  
gate-drain charge  
3.2  
2.8  
3.2  
5
gate-source plateau voltage  
total gate charge  
ID = 0 A; VDS = 0 V; VGS = 4.5 V  
6.2  
860  
400  
165  
1200  
8.3  
7.6  
24.8  
6.6  
nC  
pF  
pF  
pF  
pF  
ns  
ns  
ns  
ns  
input capacitance  
VGS = 0 V; VDS = 12 V; f = 1 MHz;  
see Figure 14  
Coss  
Crss  
output capacitance  
reverse transfer capacitance  
input capacitance  
Ciss  
VGS = 0 V; VDS = 0 V; f = 1 MHz  
td(on)  
tr  
td(off)  
tf  
turn-on delay time  
rise time  
VDS = 12 V; RL = 0.5 ; VGS = 10 V;  
RG = 5.6 Ω  
turn-off delay time  
fall time  
Source-drain diode  
VSD  
trr  
source-drain voltage  
IS = 25 A; VGS = 0 V; see Figure 13  
-
-
-
0.9  
34  
1.2  
V
reverse recovery time  
recovered charge  
IS = 20 A; dIS/dt = 100 A/µs; VGS = 0 V  
-
-
ns  
nC  
Qr  
12.5  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
5 of 13  
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
003aab285  
003aab286  
80  
20  
RDSon  
(m)  
8
7
5.6  
6
VGS (V) = 10  
VGS (V) = 5.2  
ID  
(A)  
60  
15  
6
5.6  
5.2  
7
8
40  
20  
0
10  
5
10  
4.8  
4.4  
4
3.8  
0
0
0.2  
0.4  
0.6  
0.8  
1
0
20  
40  
60  
80  
ID (A)  
V
DS (V)  
Tj = 25 °C  
Tj = 25 °C  
Fig 5. Output characteristics: drain current as a  
function of drain-source voltage; typical values  
Fig 6. Drain-source on-state resistance as a function  
of drain current; typical values  
003aab287  
03af18  
80  
2
ID  
a
(A)  
60  
40  
20  
1.5  
1
0.5  
0
Tj = 150 °C  
25 °C  
0
0
2
4
6
8
-60  
0
60  
120  
180  
Tj (°C)  
VGS (V)  
Tj = 25 °C and 175 °C; VDS > ID × RDSon  
RDSon  
a =  
-----------------------------  
RDSon(25°C)  
Fig 7. Transfer characteristics: drain current as a  
function of gate-source voltage; typical values  
Fig 8. Normalized drain-source on-state resistance  
factor as a function of junction temperature  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
6 of 13  
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
003aab303  
003aab304  
4
10-3  
VGS(th)  
ID  
(A)  
(V)  
max  
3
min  
typ  
max  
typ  
10-4  
min  
2
10-5  
1
0
10-6  
-60  
0
60  
120  
180  
0
1
2
3
4
Tj (°C)  
V
GS (V)  
ID = 1 mA; VDS = VGS  
Tj = 25 °C; VDS = 5 V  
Fig 9. Gate-source threshold voltage as a function of  
junction temperature  
Fig 10. Sub-threshold drain current as a function of  
gate-source voltage  
003aab288  
10  
ID = 25 A  
VGS  
(V)  
Tj = 25 °C  
8
6
4
2
0
V
DS  
12 V  
VDS = 19 V  
I
D
V
GS(pl)  
V
GS(th)  
GS  
V
Q
Q
GS1  
GS2  
Q
Q
GD  
GS  
Q
G(tot)  
0
4
8
12  
16  
20  
QG (nC)  
003aaa508  
ID = 25 A; VDS = 12 V and 19 V  
Fig 11. Gate-source voltage as a function of gate  
charge; typical values  
Fig 12. Gate charge waveform definitions  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
7 of 13  
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
003aab289  
003aab290  
80  
104  
IS  
(A)  
C
60  
40  
(pF)  
103  
Ciss  
Coss  
20  
150 °C  
Tj = 25 °C  
Crss  
0
0.2  
102  
10-1  
0.4  
0.6  
0.8  
1
1.2  
SD (V)  
1
10  
102  
V
VDS (V)  
Tj = 25 °C and 175 °C; VGS = 0 V  
VGS = 0 V; f = 1 MHz  
Fig 13. Source current as a function of source-drain  
voltage; typical values  
Fig 14. Input, output and reverse transfer capacitances  
as a function of drain-source voltage; typical  
values  
003aab291  
104  
C
(pF)  
Ciss  
103  
Crss  
102  
10-1  
1
10  
V
GS (V)  
VGS = 0 V; f = 1 MHz  
Fig 15. Input and reverse transfer capacitances as a function of gate-source voltage; typical values  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
8 of 13  
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
7. Package outline  
Plastic single-ended surface-mounted package (DPAK); 3 leads (one lead cropped)  
SOT428  
y
E
A
A
A
b
2
E
1
1
mounting  
base  
D
2
D
1
H
D
2
L
L
2
L
1
1
3
b
1
b
M
c
w
A
e
e
1
0
5
10 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
y
max  
D
min  
E
min  
L
1
min  
2
1
UNIT  
A
A
1
b
b
b
c
D
E
e
e
1
H
D
L
L
2
w
1
2
1
2.38  
2.22  
0.93  
0.46  
0.89  
0.71  
1.1  
0.9  
5.46  
5.00  
0.56  
0.20  
6.22  
5.98  
6.73  
6.47  
10.4  
9.6  
2.95  
2.55  
0.9  
0.5  
4.0  
4.45  
0.5  
mm  
2.285 4.57  
0.2  
0.2  
REFERENCES  
OUTLINE  
VERSION  
EUROPEAN  
PROJECTION  
ISSUE DATE  
IEC  
JEDEC  
JEITA  
06-02-14  
06-03-16  
SOT428  
SC-63  
TO-252  
Fig 16. Package outline SOT428 (DPAK)  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
9 of 13  
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
Plastic single-ended package (IPAK); 3 leads (in-line)  
SOT533  
E
A
E
A
1
1
D
1
mounting  
base  
D
2
L
1
Q
L
1
2
3
e
1
c
M
b
w
e
0
2.5  
scale  
5 mm  
DIMENSIONS (mm are the original dimensions)  
(2)  
L
1
UNIT  
A
A
1
b
c
D
D
E
E
e
e
1
L
Q
w
1
2
1
max  
2.38 0.93 0.89 0.56 1.10 6.22 6.73 5.21  
2.22 0.46 0.71 0.46 0.96 5.98 6.47 5.00  
4.57  
BSC  
2.285 9.6  
(1)  
1.1  
1.0  
2.7  
0.3  
mm  
(1)  
9.2  
BSC  
Notes  
1. Basic spacing between centers.  
2. Terminal dimensions are uncontrolled within zone L .  
1
REFERENCES  
OUTLINE  
VERSION  
EUROPEAN  
PROJECTION  
ISSUE DATE  
IEC  
JEDEC  
JEITA  
05-02-11  
06-02-14  
SOT533  
TO-251  
Fig 17. Package outline SOT533 (IPAK)  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
10 of 13  
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
8. Revision history  
Table 6.  
Revision history  
Document ID  
Release date  
Data sheet status  
Change notice  
Supersedes  
PHD_PHU77NQ03T_1  
20061128  
Product data sheet  
-
-
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
11 of 13  
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
9. Legal information  
9.1  
Data sheet status  
Document status[1][2]  
Product status[3]  
Definition  
Objective [short] data sheet  
Development  
This document contains data from the objective specification for product development.  
This document contains data from the preliminary specification.  
This document contains the product specification.  
Preliminary [short] data sheet Qualification  
Product [short] data sheet Production  
[1]  
[2]  
[3]  
Please consult the most recently issued document before initiating or completing a design.  
The term ‘short data sheet’ is explained in section “Definitions”.  
The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status  
information is available on the Internet at URL http://www.nxp.com.  
result in personal injury, death or severe property or environmental damage.  
NXP Semiconductors accepts no liability for inclusion and/or use of NXP  
Semiconductors products in such equipment or applications and therefore  
9.2  
Definitions  
Draft — The document is a draft version only. The content is still under  
internal review and subject to formal approval, which may result in  
modifications or additions. NXP Semiconductors does not give any  
representations or warranties as to the accuracy or completeness of  
information included herein and shall have no liability for the consequences of  
use of such information.  
such inclusion and/or use is at the customer’s own risk.  
Applications — Applications that are described herein for any of these  
products are for illustrative purposes only. NXP Semiconductors makes no  
representation or warranty that such applications will be suitable for the  
specified use without further testing or modification.  
Limiting values — Stress above one or more limiting values (as defined in  
the Absolute Maximum Ratings System of IEC 60134) may cause permanent  
damage to the device. Limiting values are stress ratings only and operation of  
the device at these or any other conditions above those given in the  
Characteristics sections of this document is not implied. Exposure to limiting  
values for extended periods may affect device reliability.  
Short data sheet — A short data sheet is an extract from a full data sheet  
with the same product type number(s) and title. A short data sheet is intended  
for quick reference only and should not be relied upon to contain detailed and  
full information. For detailed and full information see the relevant full data  
sheet, which is available on request via the local NXP Semiconductors sales  
office. In case of any inconsistency or conflict with the short data sheet, the  
full data sheet shall prevail.  
Terms and conditions of sale — NXP Semiconductors products are sold  
subject to the general terms and conditions of commercial sale, as published  
at http://www.nxp.com/profile/terms, including those pertaining to warranty,  
intellectual property rights infringement and limitation of liability, unless  
explicitly otherwise agreed to in writing by NXP Semiconductors. In case of  
any inconsistency or conflict between information in this document and such  
terms and conditions, the latter will prevail.  
9.3  
Disclaimers  
General — Information in this document is believed to be accurate and  
reliable. However, NXP Semiconductors does not give any representations or  
warranties, expressed or implied, as to the accuracy or completeness of such  
information and shall have no liability for the consequences of use of such  
information.  
No offer to sell or license — Nothing in this document may be interpreted  
or construed as an offer to sell products that is open for acceptance or the  
grant, conveyance or implication of any license under any copyrights, patents  
or other industrial or intellectual property rights.  
Right to make changes — NXP Semiconductors reserves the right to make  
changes to information published in this document, including without  
limitation specifications and product descriptions, at any time and without  
notice. This document supersedes and replaces all information supplied prior  
to the publication hereof.  
9.4  
Trademarks  
Notice: All referenced brands, product names, service names and trademarks  
are the property of their respective owners.  
Suitability for use — NXP Semiconductors products are not designed,  
authorized or warranted to be suitable for use in medical, military, aircraft,  
space or life support equipment, nor in applications where failure or  
malfunction of a NXP Semiconductors product can reasonably be expected to  
TrenchMOS — is a trademark of NXP B.V.  
10. Contact information  
For additional information, please visit: http://www.nxp.com  
For sales office addresses, send an email to: salesaddresses@nxp.com  
PHD_PHU77NQ03T_1  
© NXP B.V. 2006. All rights reserved.  
Product data sheet  
Rev. 01 — 28 November 2006  
12 of 13  
 
 
 
 
 
 
PHD/PHU77NQ03T  
NXP Semiconductors  
N-channel TrenchMOS FET  
11. Contents  
1
Product profile . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
1.1  
1.2  
1.3  
1.4  
General description. . . . . . . . . . . . . . . . . . . . . . 1  
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . 1  
Quick reference data. . . . . . . . . . . . . . . . . . . . . 1  
2
3
4
5
6
7
8
Pinning information. . . . . . . . . . . . . . . . . . . . . . 1  
Ordering information. . . . . . . . . . . . . . . . . . . . . 2  
Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . . 2  
Thermal characteristics. . . . . . . . . . . . . . . . . . . 4  
Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . . 5  
Package outline . . . . . . . . . . . . . . . . . . . . . . . . . 9  
Revision history. . . . . . . . . . . . . . . . . . . . . . . . 11  
9
Legal information. . . . . . . . . . . . . . . . . . . . . . . 12  
Data sheet status . . . . . . . . . . . . . . . . . . . . . . 12  
Definitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 12  
9.1  
9.2  
9.3  
9.4  
10  
11  
Contact information. . . . . . . . . . . . . . . . . . . . . 12  
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13  
Please be aware that important notices concerning this document and the product(s)  
described herein, have been included in section ‘Legal information’.  
© NXP B.V. 2006.  
All rights reserved.  
For more information, please visit: http://www.nxp.com  
For sales office addresses, please send an email to: salesaddresses@nxp.com  
Date of release: 28 November 2006  
Document identifier: PHD_PHU77NQ03T_1  
 

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