PHP3055 [NXP]

N-channel TrenchMOS transistor; N沟道晶体管的TrenchMOS
PHP3055
型号: PHP3055
厂家: NXP    NXP
描述:

N-channel TrenchMOS transistor
N沟道晶体管的TrenchMOS

晶体 晶体管
文件: 总10页 (文件大小:104K)
中文:  中文翻译
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Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E, PHD3055E  
FEATURES  
SYMBOL  
QUICK REFERENCE DATA  
d
’Trench’ technology  
• Low on-state resistance  
• Fast switching  
VDSS = 55 V  
ID = 10.3 A  
g
RDS(ON) 150 m(VGS = 10 V)  
s
GENERAL DESCRIPTION  
N-channel enhancement mode, field-effect power transistor in a plastic envelope using ’trench’ technology.  
Applications:-  
• d.c. to d.c. converters  
• switched mode power supplies  
The PHP3055E is supplied in the SOT78 (TO220AB) conventional leaded package.  
The PHD3055E is supplied in the SOT428 (DPAK) surface mounting package.  
PINNING  
SOT78 (TO220AB)  
SOT428 (DPAK)  
PIN  
DESCRIPTION  
tab  
tab  
1
2
gate  
drain1  
3
source  
drain  
2
tab  
1
3
1 2 3  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDSS  
VDGR  
VGS  
ID  
Drain-source voltage  
Drain-gate voltage  
Gate-source voltage  
Continuous drain current  
Tj = 25 ˚C to 175˚C  
Tj = 25 ˚C to 175˚C; RGS = 20 k  
-
-
-
-
-
-
-
55  
55  
± 20  
10.3  
7.3  
41  
V
V
V
A
A
A
W
˚C  
Tmb = 25 ˚C  
Tmb = 100 ˚C  
Tmb = 25 ˚C  
Tmb = 25 ˚C  
IDM  
PD  
Tj, Tstg  
Pulsed drain current  
Total power dissipation  
Operating junction and  
storage temperature  
33  
175  
- 55  
1 It is not possible to make connection to pin:2 of the SOT428 package  
August 1999  
1
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
AVALANCHE ENERGY LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
EAS Non-repetitive avalanche  
CONDITIONS  
MIN.  
MAX.  
UNIT  
Unclamped inductive load, IAS = 3.3 A;  
tp = 220 µs; Tj prior to avalanche = 25˚C;  
-
25  
mJ  
energy  
VDD 25 V; RGS = 50 ; VGS = 10 V; refer  
to fig:15  
IAS  
Peak non-repetitive  
avalanche current  
-
10.3  
A
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP.  
MAX.  
UNIT  
Rth j-mb  
Thermal resistance junction  
to mounting base  
-
4.5  
K/W  
Rth j-a  
Thermal resistance junction SOT78 package, in free air  
to ambient SOT428 package, pcb mounted, minimum  
footprint  
60  
50  
-
-
K/W  
K/W  
ELECTRICAL CHARACTERISTICS  
Tj= 25˚C unless otherwise specified  
SYMBOL PARAMETER  
V(BR)DSS Drain-source breakdown  
CONDITIONS  
MIN. TYP. MAX. UNIT  
VGS = 0 V; ID = 0.25 mA;  
55  
50  
2.0  
1.0  
-
-
-
-
-
V
V
V
V
V
voltage  
Tj = -55˚C  
VGS(TO)  
Gate threshold voltage  
VDS = VGS; ID = 1 mA  
3.0  
-
-
4.0  
-
6
Tj = 175˚C  
Tj = -55˚C  
RDS(ON)  
Drain-source on-state  
resistance  
Forward transconductance  
Gate source leakage current VGS = ±10 V; VDS = 0 V  
Zero gate voltage drain  
current  
VGS = 10 V; ID = 5.5 A  
VDS = 25 V; ID = 5.5 A  
-
-
120  
250  
3.2  
10  
0.05  
-
150  
315  
-
100  
10  
500  
mΩ  
mΩ  
S
nA  
µA  
µA  
Tj = 175˚C  
gfs  
IGSS  
IDSS  
1.5  
-
-
VDS = 55 V; VGS = 0 V;  
Tj = 175˚C  
-
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 10 A; VDD = 44 V; VGS = 10 V  
-
-
-
5.8  
1.5  
3.2  
-
-
-
nC  
nC  
nC  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 30 V; RD = 2.7 ;  
RG = 5.6 ; VGS = 10 V  
Resistive load  
-
-
-
-
3
26  
8
10  
35  
15  
20  
ns  
ns  
ns  
ns  
10  
Ld  
Ld  
Internal drain inductance  
Internal drain inductance  
Measured from tab to centre of die  
Measured from drain lead to centre of die  
(SOT78 package only)  
-
-
3.5  
4.5  
-
-
nH  
nH  
Ls  
Internal source inductance  
Measured from source lead to source  
bond pad  
-
7.5  
-
nH  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz  
-
-
-
190  
55  
40  
250  
80  
50  
pF  
pF  
pF  
August 1999  
2
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IS  
Continuous source current  
(body diode)  
Pulsed source current (body  
diode)  
Diode forward voltage  
-
-
-
-
-
10.3  
41  
A
A
V
ISM  
VSD  
IF = 10 A; VGS = 0 V  
1.1  
1.5  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 10 A; -dIF/dt = 100 A/µs;  
VGS = 0 V; VR = 30 V  
-
-
32  
50  
-
-
ns  
nC  
August 1999  
3
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
Transient thermal impedance, Zth j-mb (K/W)  
Normalised Power Derating, PD (%)  
100  
10  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
D = 0.5  
0.2  
0.1  
1
P
D = tp/T  
D
tp  
0.05  
0.02  
single pulse  
T
0.1  
1E-06  
1E-05  
1E-04  
1E-03  
1E-02  
1E-01  
1E+00  
0
25  
50  
75  
100  
125  
150  
175  
Pulse width, tp (s)  
Mounting Base temperature, Tmb (C)  
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Tmb)  
Fig.4. Transient thermal impedance.  
Zth j-mb = f(t); parameter D = tp/T  
Drain Current, ID (A)  
Tj = 25 C  
15  
14  
13  
12  
11  
10  
9
8
7
6
5
Normalised Current Derating, ID (%)  
VGS = 10V  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
8 V  
7 V  
6.5 V  
6 V  
5.5 V  
5 V  
4
3
2
1
4.5 V  
0
0
25  
50  
75  
100  
125  
150  
175  
0
0.2  
0.4  
0.6  
0.8  
1
1.2  
1.4  
1.6  
1.8  
2
Mounting Base temperature, Tmb (C)  
Drain-Source Voltage, VDS (V)  
Fig.2. Normalised continuous drain current.  
ID% = 100 ID/ID 25 ˚C = f(Tmb); conditions: VGS 10 V  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
ID = f(VDS)  
Peak Pulsed Drain Current, IDM (A)  
100  
Drain-Source On Resistance, RDS(on) (Ohms)  
0.5  
5.5V  
5 V  
Tj = 25 C  
0.45  
0.4  
RDS(on) = VDS/ ID  
6 V  
tp = 10 us  
10  
0.35  
0.3  
6.5 V  
100 us  
0.25  
0.2  
7 V  
D.C.  
1 ms  
8 V  
1
0.15  
0.1  
10 ms  
100 ms  
VGS = 10V  
0.05  
0
0.1  
1
10  
100  
0
1
2
3
4
5
6
7
8
9
10  
Drain-Source Voltage, VDS (V)  
Drain Current, ID (A)  
Fig.3. Safe operating area. Tmb = 25 ˚C  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
RDS(ON) = f(ID)  
August 1999  
4
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
Threshold Voltage, VGS(TO) (V)  
Drain current, ID (A)  
10  
4.5  
4
VDS > ID X RDS(ON)  
9
maximum  
8
7
6
5
4
3.5  
3
typical  
2.5  
2
minimum  
1.5  
1
3
175 C  
2
Tj = 25 C  
0.5  
0
1
0
0
1
2
3
4
5
6
7
8
9
10  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
Junction Temperature, Tj (C)  
Gate-source voltage, VGS (V)  
Fig.7. Typical transfer characteristics.  
ID = f(VGS)  
Fig.10. Gate threshold voltage.  
GS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
V
Transconductance, gfs (S)  
VDS > ID X RDS(ON)  
Drain current, ID (A)  
4
1.0E-01  
1.0E-02  
1.0E-03  
1.0E-04  
1.0E-05  
1.0E-06  
3.5  
3
Tj = 25 C  
minimum  
2.5  
2
175 C  
typical  
1.5  
1
maximum  
0.5  
0
0
0.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
5
0
1
2
3
4
5
6
7
8
9
10  
Gate-source voltage, VGS (V)  
Drain current, ID (A)  
Fig.8. Typical transconductance, Tj = 25 ˚C.  
gfs = f(ID)  
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS  
Normalised On-state Resistance  
2.4  
2.2  
2
Capacitances, Ciss, Coss, Crss (pF)  
1000  
1.8  
1.6  
1.4  
1.2  
1
Ciss  
100  
Coss  
Crss  
0.8  
0.6  
0.4  
0.2  
0
10  
-60 -40 -20  
0
20 40 60 80 100 120 140 160 180  
0.1  
1
10  
100  
Junction temperature, Tj (C)  
Drain-Source Voltage, VDS (V)  
Fig.9. Normalised drain-source on-state resistance.  
RDS(ON)/RDS(ON)25 ˚C = f(Tj)  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
August 1999  
5
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
Gate-source voltage, VGS (V)  
15  
Maximum Avalanche Current, IAS (A)  
100  
10  
1
ID = 10A  
14  
13  
12  
11  
10  
9
Tj = 25 C  
VDD = 11 V  
VDD = 44 V  
25 C  
8
7
6
5
4
3
Tj prior to avalanche = 150 C  
2
1
0
0.1  
0
1
2
3
4
5
6
7
8
0.001  
0.01  
0.1  
Avalanche time, tAV (ms)  
1
10  
Gate charge, QG (nC)  
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG)  
Fig.15. Maximum permissible non-repetitive  
avalanche current (IAS) versus avalanche time (tAV);  
unclamped inductive load  
Source-Drain Diode Current, IF (A)  
10  
VGS = 0 V  
9
8
7
6
5
4
3
2
1
0
175 C  
Tj = 25 C  
0
0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9  
Source-Drain Voltage, VSDS (V)  
1
1.1 1.2  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
August 1999  
6
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
MECHANICAL DATA  
Plastic single-ended package; heatsink mounted; 1 mounting hole; 3-lead TO-220  
SOT78  
E
P
A
A
1
q
D
1
D
(1)  
L
L
1
2
Q
b
1
L
1
2
3
b
c
e
e
0
5
10 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
(1)  
L
2
b
e
A
b
D
E
L
D
1
L
1
A
1
c
UNIT  
P
q
Q
1
max.  
4.5  
4.1  
1.39  
1.27  
0.9  
0.7  
1.3  
1.0  
0.7  
0.4  
15.8  
15.2  
6.4  
5.9  
10.3  
9.7  
15.0  
13.5  
3.30  
2.79  
3.8  
3.6  
3.0  
2.7  
2.6  
2.2  
mm  
3.0  
2.54  
Note  
1. Terminals in this zone are not tinned.  
REFERENCES  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
JEDEC  
EIAJ  
97-06-11  
SOT78  
TO-220  
Fig.16. SOT78 (TO220AB); pin 2 connected to mounting base (Net mass:2g)  
Notes  
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static  
discharge during transport or handling.  
2. Refer to mounting instructions for SOT78 (TO220AB) package.  
3. Epoxy meets UL94 V0 at 1/8".  
August 1999  
7
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
MECHANICAL DATA  
Plastic single-ended surface mounted package (Philips version of D-PAK); 3 leads  
(one lead cropped)  
SOT428  
seating plane  
A
y
A
2
E
A
A
1
b
D
1
2
mounting  
base  
E
1
D
H
E
L
2
2
L
1
L
1
3
b
1
b
w
M
A
c
e
e
1
0
10  
20 mm  
scale  
DIMENSIONS (mm are the original dimensions)  
b
E
H
E
max.  
D
L
1
min.  
A
max.  
E
max.  
y
w
D
max.  
1
1
(1)  
1
A
b
2
A
UNIT  
mm  
b
c
e
e
1
L
L
2
2
1
max.  
max.  
min.  
max.  
0.65 0.89  
0.45 0.71  
0.7  
0.5  
2.38  
2.22  
0.89 1.1  
0.71 0.9  
5.36  
5.26  
0.4 6.22  
0.2 5.98  
6.73  
6.47  
2.95  
2.55  
10.4  
9.6  
4.81  
4.45  
4.57  
0.2  
0.2  
4.0 2.285  
0.5  
Note  
1. Measured from heatsink back to lead.  
REFERENCES  
JEDEC  
EUROPEAN  
PROJECTION  
OUTLINE  
VERSION  
ISSUE DATE  
IEC  
EIAJ  
SOT428  
98-04-07  
Fig.17. SOT428 surface mounting package. Centre pin connected to mounting base.  
Notes  
1. This product is supplied in anti-static packaging. The gate-source input must be protected against static  
discharge during transport or handling.  
2. Refer to SMD Footprint Design and Soldering Guidelines, Data Handbook SC18.  
3. Epoxy meets UL94 V0 at 1/8".  
August 1999  
8
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
MOUNTING INSTRUCTIONS  
Dimensions in mm  
7.0  
7.0  
2.15  
2.5  
1.5  
4.57  
Fig.18. SOT428 : soldering pattern for surface mounting.  
August 1999  
9
Rev 1.200  
Philips Semiconductors  
Product specification  
N-channel TrenchMOS transistor  
PHP3055E PHD3055E  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1999  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
August 1999  
10  
Rev 1.200  

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