PHP50N06T [NXP]

TRANSISTOR 50 A, 55 V, 0.024 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-220AB, FET General Purpose Power;
PHP50N06T
型号: PHP50N06T
厂家: NXP    NXP
描述:

TRANSISTOR 50 A, 55 V, 0.024 ohm, N-CHANNEL, Si, POWER, MOSFET, TO-220AB, FET General Purpose Power

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Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
GENERAL DESCRIPTION  
QUICK REFERENCE DATA  
N-channel enhancement mode  
standard level field-effect power  
transistor in a plastic envelope using  
trench’ technology. The device  
features very low on-state resistance  
and has integral zener diodes giving  
ESD protection up to 2kV. It is  
intended for use in DC-DC  
converters and general purpose  
switching applications.  
SYMBOL  
PARAMETER  
MAX.  
UNIT  
VDS  
ID  
Ptot  
Tj  
Drain-source voltage  
Drain current (DC)  
Total power dissipation  
Junction temperature  
Drain-source on-state  
55  
50  
125  
175  
24  
V
A
W
˚C  
m  
RDS(ON)  
resistance  
VGS = 10 V  
PINNING - TO220AB  
PIN CONFIGURATION  
SYMBOL  
PIN  
1
DESCRIPTION  
d
tab  
gate  
2
drain  
g
3
source  
tab drain  
s
1 2 3  
LIMITING VALUES  
Limiting values in accordance with the Absolute Maximum System (IEC 134)  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VDS  
VDGR  
±VGS  
ID  
ID  
IDM  
Drain-source voltage  
Drain-gate voltage  
Gate-source voltage  
Drain current (DC)  
-
-
-
-
-
-
-
-
55  
55  
20  
50  
35  
200  
125  
175  
V
V
V
A
A
A
W
˚C  
RGS = 20 kΩ  
-
Tmb = 25 ˚C  
Tmb = 100 ˚C  
Tmb = 25 ˚C  
Tmb = 25 ˚C  
-
Drain current (DC)  
Drain current (pulse peak value)  
Total power dissipation  
Storage & operating temperature  
Ptot  
Tstg, Tj  
- 55  
ESD LIMITING VALUE  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
MAX.  
UNIT  
VC  
Electrostatic discharge capacitor  
voltage, all pins  
Human body model  
(100 pF, 1.5 k)  
-
2
kV  
THERMAL RESISTANCES  
SYMBOL PARAMETER  
CONDITIONS  
TYP.  
MAX.  
UNIT  
Rth j-mb  
Thermal resistance junction to  
mounting base  
-
-
1.2  
K/W  
Rth j-a  
Thermal resistance junction to  
ambient  
in free air  
60  
-
K/W  
November 1997  
1
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
STATIC CHARACTERISTICS  
Tj= 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
V(BR)DSS  
VGS(TO)  
Drain-source breakdown  
voltage  
Gate threshold voltage  
VGS = 0 V; ID = 0.25 mA;  
55  
50  
2.0  
1.0  
-
-
-
-
-
16  
-
-
-
-
-
-
V
V
V
V
Tj = -55˚C  
VDS = VGS; ID = 1 mA  
3.0  
-
-
0.05  
-
0.02  
-
-
4.0  
-
4.4  
10  
500  
1
20  
-
24  
50  
Tj = 175˚C  
Tj = -55˚C  
IDSS  
IGSS  
Zero gate voltage drain current VDS = 55 V; VGS = 0 V;  
Gate source leakage current VGS = ±10 V; VDS = 0 V  
Gate source breakdown voltage IG = ±1 mA;  
Drain-source on-state  
resistance  
µA  
µA  
µA  
µA  
V
mΩ  
mΩ  
Tj = 175˚C  
Tj = 175˚C  
±V(BR)GSS  
RDS(ON)  
VGS = 10 V; ID = 25 A  
19  
-
Tj = 175˚C  
DYNAMIC CHARACTERISTICS  
Tmb = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
gfs  
Forward transconductance  
VDS = 25 V; ID = 25 A  
4
11  
-
S
Qg(tot)  
Qgs  
Qgd  
Total gate charge  
Gate-source charge  
Gate-drain (Miller) charge  
ID = 50 A; VDD = 44 V; VGS = 10 V  
-
-
-
30  
6
12  
-
-
-
nC  
nC  
nC  
Ciss  
Coss  
Crss  
Input capacitance  
Output capacitance  
Feedback capacitance  
VGS = 0 V; VDS = 25 V; f = 1 MHz  
-
-
-
1100 1500  
pF  
pF  
pF  
280  
130  
340  
180  
td on  
tr  
td off  
tf  
Turn-on delay time  
Turn-on rise time  
Turn-off delay time  
Turn-off fall time  
VDD = 30 V; ID = 25 A;  
VGS = 10 V; RG = 10 Ω  
Resistive load  
-
-
-
-
12  
19  
25  
18  
18  
35  
35  
25  
ns  
ns  
ns  
ns  
Ld  
Ld  
Ls  
Internal drain inductance  
Internal drain inductance  
Internal source inductance  
Measured from contact screw on  
tab to centre of die  
Measured from drain lead 6 mm  
from package to centre of die  
Measured from source lead 6 mm  
from package to source bond pad  
-
-
-
3.5  
4.5  
7.5  
-
-
-
nH  
nH  
nH  
REVERSE DIODE LIMITING VALUES AND CHARACTERISTICS  
Tj = 25˚C unless otherwise specified  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
IDR  
Continuous reverse drain  
current  
-
-
50  
A
IDRM  
VSD  
Pulsed reverse drain current  
Diode forward voltage  
-
-
-
-
200  
1.2  
-
A
V
IF = 25 A; VGS = 0 V  
IF = 40 A; VGS = 0 V  
0.95  
1.0  
trr  
Qrr  
Reverse recovery time  
Reverse recovery charge  
IF = 40 A; -dIF/dt = 100 A/µs;  
VGS = -10 V; VR = 30 V  
-
-
40  
0.07  
-
-
ns  
µC  
November 1997  
2
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
AVALANCHE LIMITING VALUE  
SYMBOL PARAMETER  
CONDITIONS  
MIN. TYP. MAX. UNIT  
WDSS  
Drain-source non-repetitive  
unclamped inductive turn-off  
energy  
ID = 40 A; VDD 25 V;  
-
-
80  
mJ  
VGS = 10 V; RGS = 50 ; Tmb = 25 ˚C  
November 1997  
3
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
Normalised Power Derating  
PD%  
Transient thermal impedance, Zth (K/W)  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
10  
1
0.5  
0.2  
0.1  
0.05  
0.1  
0.02  
tp  
T
tp  
P
D
D =  
0.01  
0.001  
0
t
T
0
20  
40  
60  
80  
Tmb /  
100 120 140 160 180  
C
10us  
1ms  
pulse width, tp (s)  
0.1s  
10s  
Fig.1. Normalised power dissipation.  
PD% = 100 PD/PD 25 ˚C = f(Tmb)  
Fig.4. Transient thermal impedance.  
Zth j-mb = f(t); parameter D = tp/T  
Normalised Current Derating  
ID%  
100  
ID/A  
9
10  
16  
12  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
VGS/V =  
8.5  
8.0  
80  
7.5  
7.0  
6.5  
60  
40  
20  
0
6.0  
5.5  
5.0  
4.5  
0
20  
40  
60  
80  
100 120 140 160 180  
Tmb /  
C
0
2
4
6
8
10  
VSD/V  
Fig.2. Normalised continuous drain current.  
ID% = 100 ID/ID 25 ˚C = f(Tmb); conditions: VGS 5 V  
Fig.5. Typical output characteristics, Tj = 25 ˚C.  
ID = f(VDS); parameter VGS  
RDS(ON)/mOhm  
40  
ID / A  
1000  
VGS/V =  
6
6.5  
35  
30  
25  
20  
15  
RDS(ON) = VDS / ID  
100  
7
tp = 10 us  
8
100 us  
1 ms  
9
10  
10  
DC  
10 ms  
100 ms  
1
1
10  
100  
1000  
0
10  
20  
30  
40  
ID/A  
50  
60  
70  
80  
VDS / V  
Fig.3. Safe operating area. Tmb = 25 ˚C  
ID & IDM = f(VDS); IDM single pulse; parameter tp  
Fig.6. Typical on-state resistance, Tj = 25 ˚C.  
RDS(ON) = f(ID); parameter VGS  
November 1997  
4
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
100  
VGS(TO) / V  
max.  
5
4
3
2
1
0
ID/A  
80  
60  
40  
20  
typ.  
min.  
Tj/C = 175  
4
25  
0
-100  
-50  
0
50  
100  
150  
200  
0
2
6
8
10  
12  
VGS/V  
Tj / C  
Fig.7. Typical transfer characteristics.  
ID = f(VGS) ; conditions: VDS = 25 V; parameter Tj  
Fig.10. Gate threshold voltage.  
GS(TO) = f(Tj); conditions: ID = 1 mA; VDS = VGS  
V
25  
Sub-Threshold Conduction  
1E-01  
1E-02  
1E-03  
1E-04  
1E-05  
1E-06  
gfs/S  
20  
15  
10  
5
2%  
typ  
98%  
0
0
20  
40  
60  
80  
100  
ID/A  
0
1
2
3
4
5
Fig.8. Typical transconductance, Tj = 25 ˚C.  
gfs = f(ID); conditions: VDS = 25 V  
Fig.11. Sub-threshold drain current.  
ID = f(VGS); conditions: Tj = 25 ˚C; VDS = VGS  
3
Rds(on) normlised to 25degC  
a
2.5  
2
2.5  
2
1.5  
1
1.5  
1
hTounsadFp  
5
0.5  
-100  
0
0.01  
-50  
0
50  
Tmb / degC  
100  
150  
200  
0.1  
1
10  
100  
VDS/V  
Fig.9. Normalised drain-source on-state resistance.  
a = RDS(ON)/RDS(ON)25 ˚C = f(Tj); ID = 25 A; VGS = 5 V  
Fig.12. Typical capacitances, Ciss, Coss, Crss.  
C = f(VDS); conditions: VGS = 0 V; f = 1 MHz  
November 1997  
5
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
WDSS%  
12  
120  
110  
100  
90  
80  
70  
60  
50  
40  
30  
20  
10  
0
VGS/V  
10  
VDS = 14V  
VDS = 44V  
8
6
4
2
0
20  
40  
60  
80  
100  
120  
140  
160  
180  
0
5
10  
15  
20  
QG/nC  
25  
30  
35  
Tmb /  
C
Fig.13. Typical turn-on gate-charge characteristics.  
VGS = f(QG); conditions: ID = 50 A; parameter VDS  
Fig.15. Normalised avalanche energy rating.  
WDSS% = f(Tmb); conditions: ID = 75 A  
100  
IF/A  
80  
VDD  
+
L
VDS  
60  
40  
-
VGS  
-ID/100  
T.U.T.  
0
Tj/C =  
175  
25  
R 01  
20  
0
RGS  
shunt  
0
0.5  
1
1.5  
VSDS/V  
Fig.16. Avalanche energy test circuit.  
WDSS = 0.5 LID2 BVDSS/(BVDSS VDD  
Fig.14. Typical reverse diode current.  
IF = f(VSDS); conditions: VGS = 0 V; parameter Tj  
)
VDD  
+
-
RD  
VDS  
VGS  
0
RG  
T.U.T.  
Fig.17. Switching test circuit.  
November 1997  
6
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
MECHANICAL DATA  
Dimensions in mm  
Net Mass: 2 g  
4,5  
max  
10,3  
max  
1,3  
3,7  
2,8  
5,9  
min  
15,8  
max  
3,0 max  
not tinned  
3,0  
13,5  
min  
1,3  
1 2 3  
max  
(2x)  
0,9 max (3x)  
0,6  
2,4  
2,54 2,54  
Fig.18. SOT78 (TO220AB); pin 2 connected to mounting base.  
Notes  
1. Observe the general handling precautions for electrostatic-discharge sensitive devices (ESDs) to prevent  
damage to MOS gate oxide.  
2. Refer to mounting instructions for SOT78 (TO220) envelopes.  
3. Epoxy meets UL94 V0 at 1/8".  
November 1997  
7
Rev 1.100  
Philips Semiconductors  
Product specification  
TrenchMOS transistor  
Standard level FET  
PHP50N06T  
DEFINITIONS  
Data sheet status  
Objective specification  
This data sheet contains target or goal specifications for product development.  
Preliminary specification This data sheet contains preliminary data; supplementary data may be published later.  
Product specification  
This data sheet contains final product specifications.  
Limiting values  
Limiting values are given in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one  
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and  
operation of the device at these or at any other conditions above those given in the Characteristics sections of  
this specification is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
Philips Electronics N.V. 1997  
All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the  
copyright owner.  
The information presented in this document does not form part of any quotation or contract, it is believed to be  
accurate and reliable and may be changed without notice. No liability will be accepted by the publisher for any  
consequence of its use. Publication thereof does not convey nor imply any license under patent or other  
industrial or intellectual property rights.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices or systems where malfunction of these  
products can be reasonably expected to result in personal injury. Philips customers using or selling these products  
for use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting  
from such improper use or sale.  
November 1997  
8
Rev 1.100  

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