SSTUP32866EC/S_技术文档

SSTUP32866

1.8 V 25-bit 1 : 1 or 14-bit 1 : 2 conﬁgurable registered buffer

with parity and programmable output for DDR2-800 RDIMMs

Rev. 02 — 14 September 2006

Product data sheet

1. General description

The SSTUP32866 is a 1.8 V conﬁgurable register speciﬁcally designed for use on DDR2

memory modules requiring a parity checking function. It is deﬁned in accordance with the

JEDEC standard for the SSTUA32866 and SSTUB32866 registered buffers. The register

is conﬁgurable (using conﬁguration pins C0 and C1) to two topologies: 25-bit 1 : 1 or

14-bit 1 : 2, and in the latter conﬁguration can be designated as Register A or Register B

on the DIMM. It offers added features over the JEDEC standard register in that it can be

conﬁgured for high or normal output drive strength, as well as for operation to 667 MT/s or

800 MT/s, simply by tying two input pins HIGH or LOW as needed.

The SSTUP32866 accepts a parity bit from the memory controller on its parity bit

(PAR_IN) input, compares it with the data received on the DIMM-independent D-inputs

and indicates whether a parity error has occurred on its open-drain QERR pin

(active LOW). The convention is even parity, that is, valid parity is deﬁned as an even

number of ones across the DIMM-independent data inputs combined with the parity input

bit.

The SSTUP32866 is packaged in a 96-ball, 6 × 16 grid, 0.8 mm ball pitch LFBGA

package (13.5 mm × 5.5 mm).

2. Features

I Conﬁgurable register supporting DDR2 up to 667 MT/s or 800 MT/s Registered DIMM

applications

I Conﬁgurable to 25-bit 1 : 1 mode or 14-bit 1 : 2 mode

I Programmable for normal or high output drive

I Controlled multi-impedance output drivers enable optimal signal integrity and speed

I Programmable for 667 MT/s or 800 MT/s speed

I Excellent propagation delay performance

I Supports up to 450 MHz clock frequency of operation

I Optimized pinout for high-density DDR2 module design

I Chip-selects minimize power consumption by gating data outputs from changing state

I Supports SSTL_18 data inputs

I Checks parity on the DIMM-independent data inputs

I Partial parity output and input allows cascading of two SSTUP32866s for correct parity

error processing

I Differential clock (CK and CK) inputs

I Supports LVCMOS switching levels on the control and RESET inputs

I Single 1.8 V supply operation (1.7 V to 2.0 V)

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

I Available in 96-ball, 13.5 mm × 5.5 mm, 0.8 mm ball pitch LFBGA package

3. Applications

I 667 MT/s to 800 MT/s DDR2 registered DIMMs desiring parity checking functionality

4. Ordering information

Table 1.

Ordering information

Solder process

Type number

Package

Name

Description

Version

SSTUP32866EC/G Pb-free (SnAgCu solder LFBGA96 plastic low proﬁle ﬁne-pitch ball grid array package; SOT536-1

ball compound) 96 balls; body 13.5 × 5.5 × 1.05 mm

SSTUP32866EC/S Pb-free (SnAgCu solder LFBGA96 plastic low proﬁle ﬁne-pitch ball grid array package; SOT536-1

ball compound)

96 balls; body 13.5 × 5.5 × 1.05 mm

4.1 Ordering options

Table 2.

Ordering options

Type number

SSTUP32866EC/G

SSTUP32866EC/S

Temperature range

T_amb= 0 °C to +70 °C

T_amb= 0 °C to +85 °C

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

2 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

5. Functional diagram

RESET

CK

SSTUP32866

VREF

DCKE

1D

C1

QCKEA

QCKEB

(1)

R

DODT

DCS

CSR

D2

1D

QODTA

QODTB

C1

R

1D

QCSA

C1

(1)

QCSB

R

0

1

1D

Q2A

C1

(1)

Q2B

R

to 10 other channels

(D3, D5, D6, D8 to D14)

002aab869

(1) Disabled in 1 : 1 conﬁguration.

Fig 1. Functional diagram of SSTUP32866; 1 : 2 Register A conﬁguration with C0 = 0 and

C1 = 1 (positive logic)

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

3 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

RESET

CK

LPS0

(internal node)

Q2A, Q3A,

Q5A, Q6A,

Q8A to Q14A

D2, D3, D5, D6,

11

CE

D

D8 to D14

VREF

11

D2, D3, D5, D6,

D8 to D14

11

CLK

R

Q2B, Q3B,

Q5B, Q6B,

Q8B to Q14B

D2, D3, D5, D6,

D8 to D14

11

PARITY

CHECK

C1

1

0

1

PPO

D

CLK

R

CLK

R

CLK

R

CE

PAR_IN

QERR

C0

CLK

2-BIT

COUNTER

R

0

LPS1

(internal node)

D

1

CLK

R

002aaa650

Fig 2. Parity logic diagram for 1 : 2 Register A conﬁguration (positive logic); C0 = 0, C1 = 1

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

4 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

6. Pinning information

6.1 Pinning

SSTUP32866EC/G

SSTUP32866EC/S

ball A1

index area

1 2 3 4 5 6

A

B

C

D

E

F

G

H

J

K

L

M

N

P

R

T

002aab870

Transparent top view

Fig 3. Pin conﬁguration for LFBGA96

1

2

3

4

5

QCKE

Q2

6

A

B

C

D

E

F

DCKE

PPO

VREF

GND

V

DNU

Q15

Q16

DNU

Q17

Q18

C0

DD

D2

D3

D15

D16

GND

V

Q3

DD

DODT

D5

QERR

D17

GND

QODT

Q5

V

DD

D6

D18

GND

Q6

G

H

J

PAR_IN RESET

V

C1

DD

CK

DCS

CSR

D19

D20

D21

D22

D23

D24

D25

GND

QCS

DNU

V

SELAB SELDR

DD

K

L

D8

GND

Q8

Q9

Q19

Q20

Q21

Q22

Q23

Q24

D9

V

DD

M

N

P

R

T

D10

D11

D12

D13

D14

GND

Q10

Q11

Q12

Q13

Q14

V

DD

GND

V

DD

VREF

Q25

002aab871

Fig 4. Ball mapping, 1 : 1 register (C0 = 0, C1 = 0)

Rev. 02 — 14 September 2006

SSTUP32866_2

Product data sheet

5 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

1

DCKE

D2

2

3

4

5

6

A

B

C

D

E

F

PPO

DNU

QERR

n.c.

VREF

GND

V

QCKEA QCKEB

DD

GND

Q2A

Q3A

Q2B

Q3B

D3

V

DD

DODT

D5

GND

QODTA QODTB

V

Q5A

Q6A

C1

Q5B

Q6B

C0

DD

D6

n.c.

GND

G

H

J

PAR_IN RESET

V

DD

CK

DCS

CSR

DNU

GND

QCSA

QCSB

V

SELAB SELDR

DD

K

L

D8

GND

Q8A

Q9A

Q8B

Q9B

D9

V

DD

M

N

P

R

T

D10

D11

D12

D13

D14

GND

Q10A

Q11A

Q12A

Q13A

Q14A

Q10B

Q11B

Q12B

Q13B

V

DD

GND

V

DD

VREF

Q14B

002aab872

Fig 5. Ball mapping, 1 : 2 Register A (C0 = 0, C1 = 1)

1

2

3

4

5

6

A

B

C

D

E

F

D1

D2

D3

D4

D5

D6

PPO

DNU

QERR

DNU

VREF

GND

V

Q1A

Q2A

Q3A

Q4A

Q5A

Q6A

C1

Q1B

Q2B

Q3B

Q4B

Q5B

Q6B

C0

DD

GND

V

DD

GND

V

DD

GND

G

H

J

PAR_IN RESET

V

DD

CK

DCS

CSR

DNU

GND

QCSA

QCSB

V

SELAB SELDR

DD

K

L

D8

GND

Q8A

Q9A

Q8B

Q9B

D9

V

DD

M

N

P

R

T

D10

DODT

D12

D13

DCKE

GND

Q10A

Q10B

V

QODTA QODTB

DD

GND

Q12A

Q13A

Q12B

Q13B

V

DD

VREF

QCKEA QCKEB

002aab873

Fig 6. Ball mapping, 1 : 2 Register B (C0 = 1, C1 = 1)

Rev. 02 — 14 September 2006

SSTUP32866_2

Product data sheet

6 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

6.2 Pin description

Table 3.

Symbol

GND

Pin description

Type

Description

B3, B4, D3, D4, ground input

F3, F4, H3, H4,

ground

K3, K4, M3, M4,

P3, P4

V_DD

A4, C3, C4, E3, 1.8 V nominal

E4, G3, G4, J3,

J4, L3, L4, N3,

power supply voltage

input reference voltage

N4, R3, R4, T4

VREF

CK

A3, T3

H1

0.9 V nominal

differential input positive master clock input

differential input negative master clock input

CK

J1

C0

G6

LVCMOS inputs Conﬁguration control inputs; Register A

or Register B and 1 : 1 mode or

C1

G5

1 : 2 mode select.

SELDR

SELAB

RESET

J6

J5

G2

LVCMOS input

Selects output drive strength: HIGH for

normal drive, LOW for high drive. This pin

will default HIGH if left open-circuit

(built-in weak pull-up resistor).

LVCMOS input

Selects speed grade: HIGH for

DDR2-667, LOW for DDR2-800. This pin

will default HIGH if left open-circuit

(built-in weak pull-up resistor).

LVCMOS input

SSTL_18 input

Asynchronous reset input (active LOW).

Resets registers and disables VREF data

and clock.

CSR

DCS

J2

Chip select inputs (active LOW). Disables

D1 to D25^[1]outputs switching when both

inputs are HIGH.

H2

[2]

D1 to D25

Data input. Clocked in on the crossing of

the rising edge of CK and the falling edge

of CK.

[2]

DODT

DCKE

PAR_IN

SSTL_18 input

The outputs of this register bit will not be

suspended by the DCS and CSR control.

The outputs of this register bit will not be

suspended by the DCS and CSR control.

G1

Parity input. Arrives one clock cycle after

the corresponding data input.

[2]

Q1 to Q25,

Q2A to Q14A,

Q1B to Q14B

1.8 V CMOS

outputs

Data outputs that are suspended by the

DCS and CSR control^[3].

PPO

A2

1.8 V CMOS

output

Partial parity out. Indicates odd parity of

inputs D1 to D25^[1].

[2]

QCS, QCSA,

QCSB

1.8 V CMOS

output

Data output that will not be suspended by

the DCS and CSR control.

[2]

QODT, QODTA,

QODTB

1.8 V CMOS

output

Data output that will not be suspended by

the DCS and CSR control.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

7 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

Table 3.

Symbol

Pin description …continued

Type

Description

[2]

QCKE, QCKEA,

QCKEB

1.8 V CMOS

output

Data output that will not be suspended by

the DCS and CSR control.

QERR

D2

open-drain

output

Output error bit (active LOW). Generated

one clock cycle after the corresponding

data output

[2]

DNU

-

Do not use. Inputs are in

standby-equivalent mode and outputs

are driven LOW.

[1] Data inputs = D2, D3, D5, D6, D8 to D25 when C0 = 0 and C1 = 0.

Data inputs = D2, D3, D5, D6, D8 to D14 when C0 = 0 and C1 = 1.

Data inputs = D1 to D6, D8 to D10, D12, D13 when C0 = 1 and C1 = 1.

[2] Depends on conﬁguration. See Figure 4, Figure 5, and Figure 6 for ball number.

[3] Data outputs = Q2, Q3, Q5, Q6, Q8 to Q25 when C0 = 0 and C1 = 0.

Data outputs = Q2, Q3, Q5, Q6, Q8 to Q14 when C0 = 0 and C1 = 1.

Data outputs = Q1 to Q6, Q8 to Q10, Q12, Q13 when C0 = 1 and C1 = 1.

7. Functional description

The SSTUP32866 is a 25-bit 1 : 1 or 14-bit 1 : 2 conﬁgurable registered buffer with parity,

designed for 1.7 V to 2.0 V V_DDoperation. Additionally, the SSTUP32866 can be

programmed to deliver either normal or high output drive, and either 600 MT/s or

800 MT/s speeds.

Two programming pins, SELAB and SELDR, allow the user to respectively select speed

and drive strength options by tying these pins either LOW or HIGH on the DIMM. The truth

table for these options is shown in Table 6.

All clock and data inputs are compatible with the JEDEC standard for SSTL_18. The

control and reset (RESET) inputs are LVCMOS. All data outputs are 1.8 V CMOS drivers

that have been optimized to drive the DDR2 DIMM load, and meet SSTL_18

speciﬁcations. The error (QERR) output is 1.8 V open-drain driver.

The SSTUP32866 operates from a differential clock (CK and CK). Data are registered at

the crossing of CK going HIGH, and CK going LOW.

The C0 input controls the pinout conﬁguration for the 1 : 2 pinout from A conﬁguration

(when LOW) to B conﬁguration (when HIGH). The C1 input controls the pinout

conﬁguration from 25-bit 1 : 1 (when LOW) to 14-bit 1 : 2 (when HIGH).

The SSTUP32866 accepts a parity bit from the memory controller on its parity bit

(PAR_IN) input, compares it with the data received on the DIMM-independent D-inputs

and indicates whether a parity error has occurred on its open-drain QERR pin

(active LOW). The convention is even parity, that is, valid parity is deﬁned as an even

number of ones across the DIMM-independent data inputs combined with the parity input

bit.

When used as a single device, the C0 and C1 inputs are tied LOW. In this conﬁguration,

parity is checked on the PAR_IN input which arrives one cycle after the input data to which

it applies. The Partial-Parity-Out (PPO) and QERR signals are produced three cycles after

the corresponding data inputs.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

8 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

When used in pairs, the C0 input of the ﬁrst register is tied LOW and the C0 input of the

second register is tied HIGH. The C1 input of both registers are tied HIGH. Parity, which

arrives one cycle after the data input to which it applies, is checked on the PAR_IN input of

the ﬁrst device. The PPO and QERR signals are produced on the second device three

clock cycles after the corresponding data inputs. The PPO output of the ﬁrst register is

cascaded to the PAR_IN of the second register. The QERR output of the ﬁrst register is

left ﬂoating and the valid error information is latched on the QERR output of the second

register.

If an error occurs and the QERR output is driven LOW, it stays latched LOW for two clock

cycles or until RESET is driven LOW. The DIMM-dependent signals (DCKE, DCS, DODT,

and CSR) are not included in the parity check computation.

The device supports low-power standby operation. When RESET is LOW, the differential

input receivers are disabled, and undriven (ﬂoating) data, clock and reference voltage

(VREF) inputs are allowed. In addition, when RESET is LOW all registers are reset, and

all outputs are forced LOW. The LVCMOS RESET input must always be held at a valid

logic HIGH or LOW level.

The device also supports low-power active operation by monitoring both system chip

select (DCS and CSR) inputs and will gate the Qn and PPO outputs from changing states

when both DCS and CSR inputs are HIGH. If either DCS or CSR input is LOW, the Qn

and PPO outputs will function normally. The RESET input has priority over the DCS and

CSR control and when driven LOW will force the Qn and PPO outputs LOW, and the

QERR output HIGH. If the DCS control functionality is not desired, then the CSR input can

be hard-wired to ground, in which case, the setup time requirement for DCS would be the

same as for the other Dn data inputs. To control the low-power mode with DCS only, then

the CSR input should be pulled up to V_DDthrough a pull-up resistor.

To ensure deﬁned outputs from the register before a stable clock has been supplied,

RESET must be held in the LOW state during power-up.

In the DDR2 RDIMM application, RESET is speciﬁed to be completely asynchronous with

respect to CK and CK. Therefore, no timing relationship can be guaranteed between the

two. When entering reset, the register will be cleared and the Qn outputs will be driven

LOW quickly, relative to the time to disable the differential input receivers. However, when

coming out of reset, the register will become active quickly, relative to the time to enable

the differential input receivers. As long as the data inputs are LOW, and the clock is stable

during the time from the LOW-to-HIGH transition of RESET until the input receivers are

fully enabled, the design of the SSTUP32866 must ensure that the outputs will remain

LOW, thus ensuring no glitches on the output.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

9 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

7.1 Function table

Table 4.

Function table (each ﬂip-ﬂop)

L = LOW voltage level; H = HIGH voltage level; X = don’t care; ↑ = LOW-to-HIGH transition; ↓ = HIGH-to-LOW transition.

Inputs

Outputs^[1]

QCS

RESET

DCS

CSR

CK

Dn, DODTn,

DCKEn

Qn

QODT,

QCKE

H

L

↑

↓

L

H

X

L

H

L

H

↓

L

L or H

Q₀

L

Q₀

L

Q₀

L

H

L

↑

↓

L

↑

↓

H

X

L

H

L

H

L

L or H

Q₀

L

Q₀

H

Q₀

L

H

↑

↓

L

↑

L or H

↑

↓

L or H

↓

H

X

L

H

L

Q₀

L

Q₀

H

Q₀

L

H

↑

↓

H

X

H

L or H

Q₀

L

Q₀

L

X or ﬂoating X or ﬂoating X or ﬂoating X or ﬂoating X or ﬂoating

[1] Q₀is the previous state of the associated output.

Table 5.

Parity and standby function table

L = LOW voltage level; H = HIGH voltage level; X = don’t care; ↑ = LOW-to-HIGH transition; ↓ = HIGH-to-LOW transition.

Inputs

Outputs^[1]

CK

RESET

DCS

CSR

CK

∑ of inputs = H PAR_IN^[2]

PPO^[3]

QERR^[4]

(D1 to D25)

H

L

X

L

↑

↓

even

odd

L

H

↑

↓

L

H

L

↑

↓

even

odd

H

L

↑

↓

H

L

H

X

↑

↓

even

odd

L

H

L

↑

↓

L

↑

↓

even

odd

H

L

H

L

↑

↓

H

L

H

X

PPO₀

L

QERR₀

H

L or H

X

X or ﬂoating X or ﬂoating X or ﬂoating X or ﬂoating

X or ﬂoating

[1] PPO₀is the previous state of output PPO; QERR₀is the previous state of output QERR.

[2] Data inputs = D2, D3, D5, D6, D8 to D25 when C0 = 0 and C1 = 0.

Data inputs = D2, D3, D5, D6, D8 to D14 when C0 = 0 and C1 = 1.

Data inputs = D1 to D6, D8 to D10, D12, D13 when C0 = 1 and C1 = 1.

[3] PAR_IN arrives one clock cycle (C0 = 0), or two clock cycles (C0 = 1), after the data to which it applies.

[4] This condition assumes QERR is HIGH at the crossing of CK going HIGH and CK going LOW. If QERR is LOW, it stays latched LOW for

two clock cycles or until RESET is driven LOW.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

10 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

Table 6.

Speed and drive programmability

Inputs

Mode

SELDR

SELAB

L

DDR2-800; high output drive

DDR2-667; high output drive

DDR2-800; normal output drive

DDR2-667; normal output drive

L

H

L

H

8. Limiting values

Table 7.

Limiting values

In accordance with the Absolute Maximum Rating System (IEC 60134).

Symbol Parameter

Conditions

Min

Max

Unit

V

V_DD

V_I

supply voltage

−0.5

−0.5^[1]

+2.5

input voltage

receiver

+2.5^[2]

V_DD+ 0.5^[2]

−50

V

V_O

I_IK

output voltage

driver

V

input clamping current

output clamping current

output current

V_I< 0 V or V_I> V_DD

V_O< 0 V or V_O> V_DD

continuous; 0 V < V_O< V_DD

-

mA

I_OK

I_O

±50

I_CCC

continuous current through each

±100

V_DDor GND pin

T_stg

storage temperature

−65

+150

-

°C

V_esd

electrostatic discharge voltage

Human Body Model (HBM); 1.5 kΩ;

2

kV

100 pF

Machine Model (MM); 0 Ω; 200 pF

200

-

V

[1] The input and output negative voltage ratings may be exceeded if the input and output clamping current ratings are observed.

[2] This value is limited to 2.5 V maximum.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

11 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

9. Recommended operating conditions

Table 8.

Recommended operating conditions

Symbol Parameter

Conditions

Min

Typ

Max

Unit

V

V_DD

V_ref

V_T

supply voltage

1.7

-

2.0

reference voltage

termination voltage

input voltage

0.49 × V_DD

0.50 × V_DD0.51 × V_DD

V

0

_ref− 0.040

V_ref

V_ref+ 0.040

V

V_I

-

V_DD

-

V

V_IH(AC)

AC HIGH-level input voltage

data (Dn), CSR, and

PAR_IN inputs

V_ref+ 0.250

V

V_IL(AC)

V_IH(DC)

V_IL(DC)

V_IH

AC LOW-level input voltage

DC HIGH-level input voltage

DC LOW-level input voltage

HIGH-level input voltage

LOW-level input voltage

data (Dn), CSR, and

PAR_IN inputs

-

V

_ref− 0.250

V

data (Dn), CSR, and

PAR_IN inputs

V_ref+ 0.125

-

data (Dn), CSR, and

PAR_IN inputs

-

V

-

_ref− 0.125

[1]

[2]

RESET, Cn, SELAB,

SELDR

0.65 × V_DD

V_IL

RESET, Cn, SELAB,

SELDR

-

0.35 × V_DD

V_ICR

common mode input voltage

range

CK, CK

0.675

1.125

V_ID

I_OH

differential input voltage

HIGH-level output current

CK, CK

600

-

mV

mA

SELDR either HIGH or

LOW

−8

I_OL

LOW-level output current

ambient temperature

SELDR either HIGH or

LOW

-

8

mA

T_amb

operating in free air

SSTUP32866EC/G

SSTUP32866EC/S

0

-

70

85

°C

[1] The RESET and Cn inputs of the device must be held at valid levels (not ﬂoating) to ensure proper device operation.

[2] The differential inputs must not be ﬂoating, unless RESET is LOW.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

12 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

10. Characteristics

Table 9.

Characteristics

At recommended operating conditions (see Table 8); unless otherwise speciﬁed.

Symbol

V_OH

V_OL

Parameter

Conditions

Min

Typ

Max

-

Unit

V

HIGH-level output voltage

LOW-level output voltage

input current

I_OH= −6 mA; V_DD= 1.7 V

I_OL= 6 mA; V_DD= 1.7 V

all inputs; V_I= V_DDor GND;

1.2

-

0.5

±5

V

I_I

µA

V_DD= 2.0 V

I_DD

supply current

static Standby mode; RESET = GND;

I_O= 0 mA; V_DD= 2.0 V

-

100

40

µA

static Operating mode;

mA

RESET = V_DD; I_O= 0 mA;

V_DD= 2.0 V; V_I= V_IH(AC)or V_IL(AC)

I_DDD

dynamic operating current per MHz clock only; RESET = V_DD

;

-

16

11

-

µA

V_I= V_IH(AC)or V_IL(AC); CK and CK

switching at 50 % duty cycle;

I_O= 0 mA; V_DD= 1.8 V

per each data input, 1 : 1 mode;

RESET = V_DD; V_I= V_IH(AC)or V_IL(AC)

CK and CK switching at 50 % duty

;

cycle; one data input switching at half

clock frequency, 50 % duty cycle;

I_O= 0 mA; V_DD= 1.8 V

per each data input, 1 : 2 mode;

-

19

-

µA

RESET = V_DD; V_I= V_IH(AC)or V_IL(AC)

;

CK and CK switching at 50 % duty

cycle; one data input switching at half

clock frequency, 50 % duty cycle;

I_O= 0 mA; V_DD= 1.8 V

C_i

input capacitance

output impedance

data and CSR inputs;

V_I= V_ref± 250 mV; V_DD= 1.8 V

2.5

2

-

3.5

3

pF

CK and CK inputs; V_ICR= 0.9 V;

V

_i(p-p)= 600 mV; V_DD= 1.8 V

RESET input; V_I= V_DDor GND;

_DD= 1.8 V

3

4

V

[1]

Z_o

normal drive; instantaneous

normal drive; steady-state

high drive; instantaneous

high drive; steady-state

-

15

53

7

-

Ω

53

[1] Instantaneous is deﬁned as within < 2 ns following the output data transition edge.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

13 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

Table 10. Timing requirements

At recommended operating conditions (see Table 8), unless otherwise speciﬁed. See Section 11.1.

Symbol Parameter

f_clockclock frequency

t_W

Conditions

Min

Typ

Max

450

-

Unit

MHz

ns

-

pulse width

CK, CK HIGH or LOW

1

[1][2]

[1][3]

t_ACT

t_INACT

t_su

differential inputs active time

differential inputs inactive time

setup time

-

10

15

-

ns

-

ns

DCS before CK↑, CK↓, CSR HIGH; CSR

before CK↑, CK↓, DCS HIGH

0.6

ns

DCS before CK↑, CK↓, CSR LOW

0.5

-

ns

DODT, DCKE and data (Dn) before CK↑,

CK↓

PAR_IN before CK↑, CK↓

0.5

0.4

-

ns

t_h

hold time

DCS, DODT, DCKE and data (Dn) after

CK↑, CK↓

PAR_IN after CK↑, CK↓

0.4

-

ns

[1] This parameter is not necessarily production tested.

[2] VREF must be held at a valid input voltage level and data inputs must be held LOW for a minimum time of t_ACT(max)after RESET is taken

HIGH.

[3] VREF, data and clock inputs must be held at valid levels (not ﬂoating) a minimum time of t_INACT(max)after RESET is taken LOW.

Table 11. Switching characteristics (667 mode, SELAB = HIGH)

At recommended operating conditions (see Table 8), unless otherwise speciﬁed. See Section 11.1.

Symbol Parameter

Conditions

Min

450

1.2

Typ

Max

-

Unit

MHz

ns

f_max

maximum input clock frequency

-

[1]

t_PDM

peak propagation delay

single bit switching;

1.8

from CK↑ and CK↓ to Qn

t_PD

propagation delay

LOW-to-HIGH delay

HIGH-to-LOW delay

from CK↑ and CK↓ to PPO

from CK↑ and CK↓ to QERR

from CK↑ and CK↓ to Qn

0.5

1.2

1

-

1.8

3

ns

t_LH

t_HL

2.4

2.0

[1][2]

t_PDMSS

simultaneous switching peak

propagation delay

-

t_PHL

HIGH-to-LOW propagation delay

from RESET↓ to Qn↓

from RESET↓ to PPO↓

from RESET↓ to QERR↑

-

3

ns

t_PLH

LOW-to-HIGH propagation delay

[1] Includes 350 ps of test load transmission line delay.

[2] This parameter is not necessarily production tested.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

14 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

Table 12. Switching characteristics (800 mode, SELAB = LOW)

At recommended operating conditions (see Table 8), unless otherwise speciﬁed. See Section 11.1.

Symbol Parameter

Conditions

Min

450

1.1

Typ

Max

-

Unit

MHz

ns

f_max

maximum input clock frequency

-

[1]

t_PDM

peak propagation delay

single bit switching;

1.5

from CK↑ and CK↓ to Qn

t_PD

propagation delay

LOW-to-HIGH delay

HIGH-to-LOW delay

from CK↑ and CK↓ to PPO

from CK↑ and CK↓ to QERR

from CK↑ and CK↓ to Qn

0.5

1.2

1

-

1.7

3

ns

t_LH

t_HL

2.4

1.6

[1][2]

t_PDMSS

simultaneous switching peak

propagation delay

-

t_PHL

HIGH-to-LOW propagation delay

from RESET↓ to Qn↓

from RESET↓ to PPO↓

from RESET↓ to QERR↑

-

3

ns

t_PLH

LOW-to-HIGH propagation delay

[1] Includes 350 ps of test load transmission line delay.

[2] This parameter is not necessarily production tested.

Table 13. Data output edge rates

At recommended operating conditions (see Table 8), unless otherwise speciﬁed. See Section 11.2.

Symbol

dV/dt_r

dV/dt_f

dV/dt_∆

Parameter

Conditions

Min

Typ

Max

Unit

rising edge slew rate

falling edge slew rate

from 20 % to 80 %

from 80 % to 20 %

1

-

4

1

V/ns

absolute difference between dV/dt_r from 20 % or 80 %

and dV/dt_f

to 80 % or 20 %

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

15 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

10.1 Timing diagrams

RESET

DCS

CSR

CK

m

m + 1

m + 2

m + 3

m + 4

CK

t

h

su

D1

to

D25

t

PD

CK to Q

Q1

to

Q25

t

h

su

PAR_IN

PPO

t

PD

CK to PPO

t

PD

CK to QERR

QERR

002aaa655

Fig 7. Timing diagram for SSTUP32866 used as a single device; C0 = 0, C1 = 0

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

16 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

RESET

DCS

CSR

CK

m

m + 1

m + 2

m + 3

m + 4

CK

t

h

su

D1

to

D14

t

PD

CK to Q

Q1

to

Q14

t

h

su

PAR_IN

PPO

t

PD

CK to PPO

t

PD

CK to QERR

QERR

(not used)

002aaa656

Fig 8. Timing diagram for the ﬁrst SSTUP32866 (1 : 2 Register A conﬁguration) device used in pair; C0 = 0,

C1 = 1

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

17 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

RESET

DCS

CSR

CK

m

m + 1

m + 2

m + 3

m + 4

CK

t

h

su

D1

to

D14

t

PD

CK to Q

Q1

to

Q14

t

h

su

(1)

PAR_IN

t

PD

CK to PPO

PPO

(not used)

t

PD

CK to QERR

QERR

002aaa657

(1) PAR_IN is driven from PPO of the ﬁrst SSTUP32866 device.

Fig 9. Timing diagram for the second SSTUP32866 (1 : 2 Register B conﬁguration) device used in pair;

C0 = 1, C1 = 1

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

18 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

11. Test information

11.1 Parameter measurement information for data output load circuit

V_DD= 1.8 V ± 0.1 V.

All input pulses are supplied by generators having the following characteristics:

PRR ≤ 10 MHz; Z₀= 50 Ω; input slew rate = 1 V/ns ± 20 %, unless otherwise speciﬁed.

The outputs are measured one at a time with one transition per measurement.

V

DD

DUT

delay = 350 ps

= 50 Ω

R

= 1000 Ω

L

50 Ω

Z

o

CK

CK inputs

OUT

(1)

= 30 pF

C

L

R

L

test point

R

L

= 100 Ω

test point

002aaa371

(1) C_Lincludes probe and jig capacitance.

Fig 10. Load circuit, data output measurements

LVCMOS

V

DD

0.5V

RESET

DD

0 V

t

ACT

INACT

90 %

(1)

DD

I

10 %

002aaa372

(1) I_DDtested with clock and data inputs held at V_DDor GND, and I_O= 0 mA.

Fig 11. Voltage and current waveforms; inputs active and inactive times

t

W

V

IH

IL

V

input

V

ICR

ID

ICR

002aaa373

V_ID= 600 mV.

V_IH= V_ref+ 250 mV (AC voltage levels) for differential inputs. V_IH= V_DDfor LVCMOS inputs.

V_IL= V_ref− 250 mV (AC voltage levels) for differential inputs. V_IL= GND for LVCMOS inputs.

Fig 12. Voltage waveforms; pulse duration

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

19 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

CK

V

ICR

ID

CK

t

h

su

V

IH

IL

input

V

ref

V

ref

002aaa374

V_ID= 600 mV.

V_ref= 0.5V_DD

.

V_IH= V_ref+ 250 mV (AC voltage levels) for differential inputs. V_IH= V_DDfor LVCMOS inputs.

V_IL= V_ref− 250 mV (AC voltage levels) for differential inputs. V_IL= GND for LVCMOS inputs.

Fig 13. Voltage waveforms; setup and hold times

CK

V

i(p-p)

ICR

CK

t

PHL

PLH

V

OH

OL

V

output

T

002aaa375

t_PLHand t_PHLare the same as t_PD

.

Fig 14. Voltage waveforms; propagation delay times (clock to output)

LVCMOS

V

IH

RESET

0.5V

DD

IL

t

PHL

OH

OL

output

V

T

002aaa376

t_PLHand t_PHLare the same as t_PD

.

V_IH= V_ref+ 250 mV (AC voltage levels) for differential inputs. V_IH= V_DDfor LVCMOS inputs.

V_IL= V_ref− 250 mV (AC voltage levels) for differential inputs. V_IL= GND for LVCMOS inputs.

Fig 15. Voltage waveforms; propagation delay times (reset to output)

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

20 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

11.2 Data output slew rate measurement information

V_DD= 1.8 V ± 0.1 V.

All input pulses are supplied by generators having the following characteristics:

PRR ≤ 10 MHz; Z₀= 50 Ω; input slew rate = 1 V/ns ± 20 %, unless otherwise speciﬁed.

V

DD

R

DUT

= 50 Ω

L

OUT

test point

002aaa377

(1)

= 10 pF

C

L

(1) C_Lincludes probe and jig capacitance.

Fig 16. Load circuit, HIGH-to-LOW slew measurement

output

V

OH

80 %

dv_f

20 %

V

OL

dt_f

002aaa378

Fig 17. Voltage waveforms, HIGH-to-LOW slew rate measurement

DUT

OUT

test point

(1)

= 10 pF

C

L

R

L

= 50 Ω

002aaa379

(1) C_Lincludes probe and jig capacitance.

Fig 18. Load circuit, LOW-to-HIGH slew measurement

dt_r

V

OH

80 %

dv_r

20 %

output

OL

002aaa380

Fig 19. Voltage waveforms, LOW-to-HIGH slew rate measurement

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

21 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

11.3 Error output load circuit and voltage measurement information

V_DD= 1.8 V ± 0.1 V.

All input pulses are supplied by generators having the following characteristics:

PRR ≤ 10 MHz; Z₀= 50 Ω; input slew rate = 1 V/ns ± 20 %, unless otherwise speciﬁed.

V

DD

R

DUT

= 1 kΩ

L

OUT

test point

002aaa500

(1)

= 10 pF

C

L

(1) C_Lincludes probe and jig capacitance.

Fig 20. Load circuit, error output measurements

LVCMOS

V

DD

RESET

0.5V

DD

0 V

t

PLH

V

OH

0.15 V

output

waveform 2

0 V

002aaa501

Fig 21. Voltage waveforms, open-drain output LOW-to-HIGH transition time with respect to

RESET input

timing

inputs

V

i(p-p)

V

ICR

t

HL

V

DD

OL

output

waveform 1

0.5V

DD

002aaa502

Fig 22. Voltage waveforms, open-drain output HIGH-to-LOW transition time with respect

to clock inputs

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

22 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

timing

inputs

V

i(p-p)

V

ICR

t

LH

V

OH

output

waveform 2

0.15 V

0 V

002aaa503

Fig 23. Voltage waveforms, open-drain output LOW-to-HIGH transition time with respect to

clock inputs

11.4 Partial parity out load circuit and voltage measurement information

V_DD= 1.8 V ± 0.1 V.

All input pulses are supplied by generators having the following characteristics:

PRR ≤ 10 MHz; Z₀= 50 Ω; input slew rate = 1 V/ns ± 20 %, unless otherwise speciﬁed.

DUT

OUT

test point

(1)

= 5 pF

C

L

R

L

= 1 kΩ

002aaa654

(1) C_Lincludes probe and jig capacitance.

Fig 24. Partial parity out load circuit

CK

V

i(p-p)

ICR

CK

t

PHL

PLH

V

OH

OL

V

output

T

002aaa375

V_T= 0.5V_DD

.

t_PLHand t_PHLare the same as t_PD

.

V_i(p-p)= 600 mV.

Fig 25. Partial parity out voltage waveforms; propagation delay times with respect to clock

inputs

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

23 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

LVCMOS

V

IH

RESET

output

0.5V

DD

IL

t

PHL

OH

OL

V

T

002aaa376

V_T= 0.5V_DD

.

t_PLHand t_PHLare the same as t_PD

.

V_IH= V_ref+ 250 mV (AC voltage levels) for differential inputs. V_IH= V_DDfor LVCMOS inputs.

V_IL= V_ref− 250 mV (AC voltage levels) for differential inputs. V_IL= GND for LVCMOS inputs.

Fig 26. Partial parity out voltage waveforms; propagation delay times with respect to

RESET input

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

24 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

12. Package outline

LFBGA96: plastic low profile fine-pitch ball grid array package; 96 balls; body 13.5 x 5.5 x 1.05 mm SOT536-1

B

A

D

ball A1

index area

A

2

A

E

A

1

detail X

e

1

C

1/2 e

y

v M

w M

C

A B

C

1

e

b

T

R

P

N

e

M

L

K

J

H

G

F

e

2

1/2 e

E

D

C

B

A

ball A1

index area

1

2

3

4

5

6

X

0

5

10 mm

scale

DIMENSIONS (mm are the original dimensions)

A

UNIT

A

b

e

v

w

y

1

D

E

1

2

1

2

max.

0.41

0.31

1.2

0.9

0.51

0.41

5.6

5.4

13.6

13.4

mm

1.5

4

12

0.1

0.2

0.8

0.15

0.1

REFERENCES

JEDEC JEITA

OUTLINE

VERSION

EUROPEAN

PROJECTION

ISSUE DATE

IEC

00-03-04

03-02-05

SOT536-1

Fig 27. Package outline SOT536-1 (LFBGA96)

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

25 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

13. Soldering

13.1 Introduction to soldering surface mount packages

There is no soldering method that is ideal for all surface mount IC packages. Wave

soldering can still be used for certain surface mount ICs, but it is not suitable for ﬁne pitch

SMDs. In these situations reﬂow soldering is recommended.

13.2 Reﬂow soldering

Reﬂow soldering requires solder paste (a suspension of ﬁne solder particles, ﬂux and

binding agent) to be applied to the printed-circuit board by screen printing, stencilling or

pressure-syringe dispensing before package placement. Driven by legislation and

environmental forces the worldwide use of lead-free solder pastes is increasing.

Several methods exist for reﬂowing; for example, convection or convection/infrared

heating in a conveyor type oven. Throughput times (preheating, soldering and cooling)

vary between 100 seconds and 200 seconds depending on heating method.

Typical reﬂow temperatures range from 215 °C to 260 °C depending on solder paste

material. The peak top-surface temperature of the packages should be kept below:

Table 14. SnPb eutectic process - package peak reﬂow temperatures (from J-STD-020C

July 2004)

Package thickness

< 2.5 mm

Volume mm³< 350

240 °C + 0/−5 °C

225 °C + 0/−5 °C

Volume mm³≥ 350

225 °C + 0/−5 °C

≥ 2.5 mm

Table 15. Pb-free process - package peak reﬂow temperatures (from J-STD-020C July

2004)

Package thickness

Volume mm³< 350

Volume mm³350 to

2000

Volume mm³> 2000

< 1.6 mm

260 °C + 0 °C

250 °C + 0 °C

260 °C + 0 °C

250 °C + 0 °C

245 °C + 0 °C

260 °C + 0 °C

245 °C + 0 °C

1.6 mm to 2.5 mm

≥ 2.5 mm

Moisture sensitivity precautions, as indicated on packing, must be respected at all times.

13.3 Wave soldering

Conventional single wave soldering is not recommended for surface mount devices

(SMDs) or printed-circuit boards with a high component density, as solder bridging and

non-wetting can present major problems.

To overcome these problems the double-wave soldering method was speciﬁcally

developed.

If wave soldering is used the following conditions must be observed for optimal results:

• Use a double-wave soldering method comprising a turbulent wave with high upward

pressure followed by a smooth laminar wave.

• For packages with leads on two sides and a pitch (e):

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

26 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

– larger than or equal to 1.27 mm, the footprint longitudinal axis is preferred to be

parallel to the transport direction of the printed-circuit board;

– smaller than 1.27 mm, the footprint longitudinal axis must be parallel to the

transport direction of the printed-circuit board.

The footprint must incorporate solder thieves at the downstream end.

• For packages with leads on four sides, the footprint must be placed at a 45° angle to

the transport direction of the printed-circuit board. The footprint must incorporate

solder thieves downstream and at the side corners.

During placement and before soldering, the package must be ﬁxed with a droplet of

adhesive. The adhesive can be applied by screen printing, pin transfer or syringe

dispensing. The package can be soldered after the adhesive is cured.

Typical dwell time of the leads in the wave ranges from 3 seconds to 4 seconds at 250 °C

or 265 °C, depending on solder material applied, SnPb or Pb-free respectively.

A mildly-activated ﬂux will eliminate the need for removal of corrosive residues in most

applications.

13.4 Manual soldering

Fix the component by ﬁrst soldering two diagonally-opposite end leads. Use a low voltage

(24 V or less) soldering iron applied to the ﬂat part of the lead. Contact time must be

limited to 10 seconds at up to 300 °C.

When using a dedicated tool, all other leads can be soldered in one operation within

2 seconds to 5 seconds between 270 °C and 320 °C.

13.5 Package related soldering information

Table 16. Suitability of surface mount IC packages for wave and reﬂow soldering methods

Package^[1]

Soldering method

Wave

Reﬂow^[2]

BGA, HTSSON..T^[3], LBGA, LFBGA, SQFP,

SSOP..T^[3], TFBGA, VFBGA, XSON

not suitable

suitable

DHVQFN, HBCC, HBGA, HLQFP, HSO, HSOP,

HSQFP, HSSON, HTQFP, HTSSOP, HVQFN,

HVSON, SMS

not suitable^[4]

suitable

PLCC^[5], SO, SOJ

suitable

LQFP, QFP, TQFP

not recommended^[5][6]

not recommended^[7]

not suitable

suitable

SSOP, TSSOP, VSO, VSSOP

CWQCCN..L^[8], PMFP^[9], WQCCN..L^[8]

suitable

not suitable

[1] For more detailed information on the BGA packages refer to the (LF)BGA Application Note (AN01026);

order a copy from your Philips Semiconductors sales ofﬁce.

[2] All surface mount (SMD) packages are moisture sensitive. Depending upon the moisture content, the

maximum temperature (with respect to time) and body size of the package, there is a risk that internal or

external package cracks may occur due to vaporization of the moisture in them (the so called popcorn

effect). For details, refer to the Drypack information in the Data Handbook IC26; Integrated Circuit

Packages; Section: Packing Methods.

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

27 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

[3] These transparent plastic packages are extremely sensitive to reﬂow soldering conditions and must on no

account be processed through more than one soldering cycle or subjected to infrared reﬂow soldering with

peak temperature exceeding 217 °C ± 10 °C measured in the atmosphere of the reﬂow oven. The package

body peak temperature must be kept as low as possible.

[4] These packages are not suitable for wave soldering. On versions with the heatsink on the bottom side, the

solder cannot penetrate between the printed-circuit board and the heatsink. On versions with the heatsink

on the top side, the solder might be deposited on the heatsink surface.

[5] If wave soldering is considered, then the package must be placed at a 45° angle to the solder wave

direction. The package footprint must incorporate solder thieves downstream and at the side corners.

[6] Wave soldering is suitable for LQFP, QFP and TQFP packages with a pitch (e) larger than 0.8 mm; it is

deﬁnitely not suitable for packages with a pitch (e) equal to or smaller than 0.65 mm.

[7] Wave soldering is suitable for SSOP, TSSOP, VSO and VSSOP packages with a pitch (e) equal to or larger

than 0.65 mm; it is deﬁnitely not suitable for packages with a pitch (e) equal to or smaller than 0.5 mm.

[8] Image sensor packages in principle should not be soldered. They are mounted in sockets or delivered

pre-mounted on ﬂex foil. However, the image sensor package can be mounted by the client on a ﬂex foil by

using a hot bar soldering process. The appropriate soldering proﬁle can be provided on request.

[9] Hot bar soldering or manual soldering is suitable for PMFP packages.

14. Abbreviations

Table 17. Abbreviations

Acronym

CMOS

DDR

Description

Complementary Metal Oxide Semiconductor

Double Data Rate

DIMM

LVCMOS

PPO

Dual In-line Memory Module

Low Voltage Complementary Metal Oxide Semiconductor

Partial Parity Out

PRR

Pulse Repetition Rate

RDIMM

SSTL

Registered Dual In-line Memory Module

Stub Series Terminated Logic

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

28 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

15. Revision history

Table 18. Revision history

Document ID

SSTUP32866_2

Modiﬁcations:

Release date

Data sheet status

Change notice

Supersedes

20060914

Product data sheet

-

SSTUP32866_1

• Table 1 “Ordering information”: added Type number SSTUP32866EC/S

• added Section 4.1 “Ordering options”

• Figure 3 “Pin conﬁguration for LFBGA96” modiﬁed (added Type number SSTUP32866EC/S)

• Table 5 “Parity and standby function table”: added reference to Table note 4 at column heading

“QERR”

• Table 8 “Recommended operating conditions”, Symbol T_amb: added separate speciﬁcations for

SSTUP32866EC/G and SSTUP32866EC/S

• Table 10 “Timing requirements”, description below table title: changed “See Figure 2.” to

“See Section 11.1.”

• Table 11 “Switching characteristics (667 mode, SELAB = HIGH)” and Table 12 “Switching

characteristics (800 mode, SELAB = LOW)”:

–

changed parameter description of t_PDMfrom “propagation delay, single bit switching” to “peak

propagation delay” (moved “single bit switching” to Conditions column)

changed parameter description of t_PDMSSfrom “propagation delay, simultaneous switching” to

“simultaneous switching peak propagation delay”

• Figure 26 “Partial parity out voltage waveforms; propagation delay times with respect to RESET

input”, 4^thnote: changed “V_IL= V_DD” to “V_IL= GND”

SSTUP32866_1

20060406

Product data sheet

-

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

29 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

16. Legal information

16.1 Data sheet status

Document status^[1][2]

Product status^[3]

Development

Deﬁnition

Objective [short] data sheet

This document contains data from the objective speciﬁcation for product development.

This document contains data from the preliminary speciﬁcation.

This document contains the product speciﬁcation.

Preliminary [short] data sheet Qualiﬁcation

Product [short] data sheet Production

[1]

[2]

[3]

Please consult the most recently issued document before initiating or completing a design.

The term ‘short data sheet’ is explained in section “Deﬁnitions”.

The product status of device(s) described in this document may have changed since this document was published and may differ in case of multiple devices. The latest product status

information is available on the Internet at URL http://www.semiconductors.philips.com.

malfunction of a Philips Semiconductors product can reasonably be expected

16.2 Deﬁnitions

to result in personal injury, death or severe property or environmental

damage. Philips Semiconductors accepts no liability for inclusion and/or use

of Philips Semiconductors products in such equipment or applications and

therefore such inclusion and/or use is at the customer’s own risk.

Draft — The document is a draft version only. The content is still under

internal review and subject to formal approval, which may result in

modiﬁcations or additions. Philips Semiconductors does not give any

representations or warranties as to the accuracy or completeness of

information included herein and shall have no liability for the consequences of

use of such information.

Applications — Applications that are described herein for any of these

products are for illustrative purposes only. Philips Semiconductors makes no

representation or warranty that such applications will be suitable for the

speciﬁed use without further testing or modiﬁcation.

Short data sheet — A short data sheet is an extract from a full data sheet

with the same product type number(s) and title. A short data sheet is intended

for quick reference only and should not be relied upon to contain detailed and

full information. For detailed and full information see the relevant full data

sheet, which is available on request via the local Philips Semiconductors

sales ofﬁce. In case of any inconsistency or conﬂict with the short data sheet,

the full data sheet shall prevail.

Limiting values — Stress above one or more limiting values (as deﬁned in

the Absolute Maximum Ratings System of IEC 60134) may cause permanent

damage to the device. Limiting values are stress ratings only and operation of

the device at these or any other conditions above those given in the

Characteristics sections of this document is not implied. Exposure to limiting

values for extended periods may affect device reliability.

Terms and conditions of sale — Philips Semiconductors products are sold

subject to the general terms and conditions of commercial sale, as published

at http://www.semiconductors.philips.com/proﬁle/terms, including those

pertaining to warranty, intellectual property rights infringement and limitation

of liability, unless explicitly otherwise agreed to in writing by Philips

16.3 Disclaimers

General — Information in this document is believed to be accurate and

reliable. However, Philips Semiconductors does not give any representations

or warranties, expressed or implied, as to the accuracy or completeness of

such information and shall have no liability for the consequences of use of

such information.

Semiconductors. In case of any inconsistency or conﬂict between information

in this document and such terms and conditions, the latter will prevail.

No offer to sell or license — Nothing in this document may be interpreted

or construed as an offer to sell products that is open for acceptance or the

grant, conveyance or implication of any license under any copyrights, patents

or other industrial or intellectual property rights.

Right to make changes — Philips Semiconductors reserves the right to

make changes to information published in this document, including without

limitation speciﬁcations and product descriptions, at any time and without

notice. This document supersedes and replaces all information supplied prior

to the publication hereof.

16.4 Trademarks

Notice: All referenced brands, product names, service names and trademarks

are the property of their respective owners.

Suitability for use — Philips Semiconductors products are not designed,

authorized or warranted to be suitable for use in medical, military, aircraft,

space or life support equipment, nor in applications where failure or

17. Contact information

For additional information, please visit: http://www.semiconductors.philips.com

For sales ofﬁce addresses, send an email to: sales.addresses@www.semiconductors.philips.com

SSTUP32866_2

Product data sheet

Rev. 02 — 14 September 2006

30 of 31

SSTUP32866

Philips Semiconductors

1.8 V DDR2-667/800 programmable registered buffer with parity

18. Contents

1

General description . . . . . . . . . . . . . . . . . . . . . . 1

2

Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1

Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2

Ordering information. . . . . . . . . . . . . . . . . . . . . 2

Ordering options. . . . . . . . . . . . . . . . . . . . . . . . 2

Functional diagram . . . . . . . . . . . . . . . . . . . . . . 3

3

4

4.1

5

6

6.1

6.2

Pinning information. . . . . . . . . . . . . . . . . . . . . . 5

Pinning . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5

Pin description . . . . . . . . . . . . . . . . . . . . . . . . . 7

7

7.1

8

Functional description . . . . . . . . . . . . . . . . . . . 8

Function table . . . . . . . . . . . . . . . . . . . . . . . . . 10

Limiting values. . . . . . . . . . . . . . . . . . . . . . . . . 11

Recommended operating conditions. . . . . . . 12

Characteristics. . . . . . . . . . . . . . . . . . . . . . . . . 13

Timing diagrams . . . . . . . . . . . . . . . . . . . . . . . 16

9

10

10.1

11

11.1

Test information. . . . . . . . . . . . . . . . . . . . . . . . 19

Parameter measurement information for

data output load circuit . . . . . . . . . . . . . . . . . . 19

Data output slew rate measurement

information . . . . . . . . . . . . . . . . . . . . . . . . . . . 21

Error output load circuit and voltage

measurement information. . . . . . . . . . . . . . . . 22

Partial parity out load circuit and voltage

11.2

11.3

11.4

measurement information. . . . . . . . . . . . . . . . 23

12

Package outline . . . . . . . . . . . . . . . . . . . . . . . . 25

13

13.1

Soldering . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Introduction to soldering surface mount

packages . . . . . . . . . . . . . . . . . . . . . . . . . . . . 26

Reﬂow soldering . . . . . . . . . . . . . . . . . . . . . . . 26

Wave soldering . . . . . . . . . . . . . . . . . . . . . . . . 26

Manual soldering . . . . . . . . . . . . . . . . . . . . . . 27

Package related soldering information . . . . . . 27

13.2

13.3

13.4

13.5

14

15

Abbreviations. . . . . . . . . . . . . . . . . . . . . . . . . . 28

Revision history. . . . . . . . . . . . . . . . . . . . . . . . 29

16

Legal information. . . . . . . . . . . . . . . . . . . . . . . 30

Data sheet status . . . . . . . . . . . . . . . . . . . . . . 30

Deﬁnitions. . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Disclaimers . . . . . . . . . . . . . . . . . . . . . . . . . . . 30

Trademarks. . . . . . . . . . . . . . . . . . . . . . . . . . . 30

16.1

16.2

16.3

16.4

17

18

Contact information. . . . . . . . . . . . . . . . . . . . . 30

Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 31

Please be aware that important notices concerning this document and the product(s)

described herein, have been included in section ‘Legal information’.

For more information, please visit: http://www.semiconductors.philips.com.

For sales office addresses, email to: sales.addresses@www.semiconductors.philips.com.

Date of release: 14 September 2006

Document identifier: SSTUP32866_2


型号：	SSTUP32866EC/S
厂家：	NXP
描述：	1.8 V 25-bit 1 : 1 or 14-bit 1 : 2 configurable registered buffer with parity and programmable output for DDR2-800 RDIMMs 1.8伏25位1：1或14位1：2配置的注册校验和可编程输出为DDR2-800的RDIMM缓冲双倍数据速率
文件：	总31页 (文件大小：542K)
中文：	中文翻译
下载：	下载PDF数据表文档文件

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