TDA1387TD [NXP]

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TDA1387TD
型号: TDA1387TD
厂家: NXP    NXP
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INTEGRATED CIRCUITS  
DATA SHEET  
TDA1387T  
Stereo Continuous Calibration DAC  
(CC-DAC)  
1995 Dec 11  
Preliminary specification  
Supersedes data of September 1994  
File under Integrated Circuits, IC01  
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
FEATURES  
APPLICATIONS  
Low power consumption  
Portable digital audio equipment.  
Low total harmonic distortion  
Wide dynamic range (16-bit resolution)  
Continuous Calibration (CC) concept  
Single 3 to 5.5 V supply rail  
GENERAL DESCRIPTION  
The TDA1387T is a member of a generation of  
digital-to-analog converters which incorporates the  
innovative technique of Continuous Calibration. The  
largest bit currents are repeatedly generated from one  
single reference current. This duplication is based upon an  
internal charge storage principle and has an accuracy  
which is insensitive to ageing, temperature and process  
variations.  
Output and bias current are proportional to the supply  
voltage  
Fast settling time enables 2, 4 and 8 times  
oversampling (serial input) or double-speed operation at  
4 times oversampling  
Internal bias current ensures maximum dynamic range  
Wide operating temperature range (40 to + 85 °C)  
I2S-bus input format (time multiplex, two’s complement,  
The TDA1387T is fabricated in a 1.0 µm CMOS process  
and features an extremely low power dissipation, small  
package size and easy application. The intrinsic high  
coarse current accuracy combined with the implemented  
symmetrical offset decoding method preclude  
zero-crossing distortion and ensure high quality audio  
reproduction. The CC-DAC is eminently suitable for use in  
portable digital audio equipment.  
TTL)  
No zero-crossing distortion  
Large DC output voltage compliance  
Contained in small outline package.  
ORDERING INFORMATION  
PACKAGE  
TYPE NUMBER  
NAME  
DESCRIPTION  
plastic small outline package; 8 leads; body width 3.9 mm.  
VERSION  
TDA1387T  
SO8  
SOT96-1  
1995 Dec 11  
2
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
QUICK REFERENCE DATA  
SYMBOL  
VDD  
IDD  
IFS  
PARAMETER  
supply voltage  
CONDITIONS  
MIN.  
3.0  
TYP.  
MAX.  
5.5  
UNIT  
5.0  
5.5  
1.0  
0.6  
88  
V
supply current  
VDD = 5 V at code 0000H  
VDD = 5 V  
6.5  
1.14  
mA  
mA  
mA  
dB  
%
full scale output current  
0.86  
V
DD = 3 V  
(THD + N)/S total harmonic distortion  
plus noise-to-signal ratio  
at 0 dB signal level  
78  
0.012  
24  
6
at 0 dB signal level  
0.004  
33  
2.2  
at 60 dB signal level  
at 60 dB signal level  
at 60 dB; A-weighted  
at 60 dB; A-weighted  
dB  
%
35  
1.7  
dB  
%
S/N  
tcs  
signal-to-noise ratio at  
bipolar zero  
A-weighted at code 0000H 86  
98  
dB  
current settling time to  
0.2  
µs  
±1 LSB  
BR  
input bit rate (pin 3)  
clock frequency  
18.4  
18.4  
Mbits/s  
MHz  
fclk  
TCFS  
full scale temperature  
±400 × 106  
coefficient at pins 6 and 8  
Tamb  
Ptot  
operating ambient  
temperature  
40  
+85  
°C  
total power dissipation  
VDD = 5 V at code 0000H  
VDD = 3 V at code 0000H  
27.5  
10  
36  
mW  
mW  
1995 Dec 11  
3
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
BLOCK DIAGRAM  
Fig.1 Block diagram.  
1995 Dec 11  
4
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
PINNING  
SYMBOL PIN  
DESCRIPTION  
bit clock input  
BCK  
WS  
1
2
3
4
5
6
7
8
word selection input  
data input  
DATA  
GND  
VDD  
IOL  
ground  
supply voltage input  
left channel output  
reference decoupling  
right channel output  
REF  
IOR  
Fig.2 Pin configuration.  
The TDA1387T (CC-DAC) accepts serial input data format  
of 16-bit word length. Left and right data words are time  
multiplexed. The input data format is shown in  
Figs 4 and 5.  
FUNCTIONAL DESCRIPTION  
The basic operation of the continuous calibration DAC is  
illustrated in Fig.3 which shows the calibration and  
operation cycle. During calibration of the MOS current  
source (Fig.3a) transistor M1 is connected as a diode by  
applying a reference current. The voltage Vgs on the  
intrinsic gate-source capacitance Cgs of M1 is then  
determined by the transistor characteristics. After the drain  
current has been calibrated to the reference value Iref, the  
switch S1 is opened and S2 is switched to the other  
position (Fig.3b). The gate-to-source voltage Vgs of M1 is  
not changed because the charge on Cgs is preserved.  
Therefore, the drain current of M1 will still be equal to Iref  
and this exact duplication of Iref is now available at the  
OUT terminal.  
With a HIGH level on the WS input, data is placed in the  
right input register, with a LOW level on the WS input, data  
is placed in the left input register. The data in the input  
registers are simultaneously latched to the output registers  
which control the bit switches. An internal bias current Ibias  
is added to the full scale output current IFS in order to  
achieve maximum dynamic range at the outputs of OP1  
and OP2.  
The signal current IFS and the bias current Ibias are both  
proportional to the supply voltage VDD, and have a fixed  
mutual relation Abias (where Abias = Ibias/IFS).  
In the TDA1387T, 32 current sources and one spare  
current source are continuously calibrated (see Fig.1). The  
spare current source is included to allow continuous  
converter operation. The output of one calibrated source is  
connected to an 11-bit binary current divider which  
consists of 2048 transistors. A symmetrical offset  
decoding principle is incorporated and arranges the bit  
switching such that the zero-crossing is performed by  
switching only the LSB currents.  
It is preferred that the non-inverting input of operational  
amplifiers OP1 and OP2 is tied to ground to achieve a  
maximum dynamic range over the supply voltage range.  
A decoupling capacitor C4 is recommended for enhancing  
the supply voltage ripple rejection of the DAC. It has no  
significant effect on the noise performance.  
1995 Dec 11  
5
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
(a) Calibration.  
(b) Operation.  
Fig.3 Calibration principle.  
LIMITING VALUES  
In accordance with the Absolute Maximum Rating System (IEC 134).  
SYMBOL  
DESCRIPTION  
supply voltage  
CONDITIONS  
MIN.  
MAX.  
6.0  
UNIT  
VDD  
Txtal(max)  
Tstg  
V
maximum crystal temperature  
storage temperature  
+150  
+150  
+85  
°C  
°C  
°C  
V
55  
Tamb  
Ves  
operating ambient temperature  
electrostatic handling  
40  
note 1  
note 2  
2000  
200  
+2000  
+200  
V
Notes  
1. Human body model: C = 100 pF; R = 1.5 k; 3 zaps positive and 3 zaps negative.  
2. Machine model: C = 200 pF; L = 0.5 µH; R = 10 ; 3 zaps positive and 3 zaps negative.  
THERMAL CHARACTERISTICS  
SYMBOL  
Rth j-a  
DESCRIPTION  
VALUE  
UNIT  
thermal resistance from junction to ambient in free air  
210  
K/W  
1995 Dec 11  
6
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
CHARACTERISTICS  
VDD = 5 V; Tamb = 25 °C; unless otherwise specified.  
SYMBOL PARAMETER  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
Supply  
VDD  
supply voltage  
3.0  
5.0  
5.5  
30  
5.5  
V
IDD  
supply current  
at code 0000H  
6.5  
mA  
dB  
SVRR  
supply voltage ripple  
rejection  
note 1  
Digital inputs; WS, BCK and DATA  
ILI  
LOW level input leakage  
current  
Vi = 0 V  
Vi = 5 V  
10  
10  
µA  
µA  
IHI  
HIGH level input leakage  
current  
fBCK  
BR  
clock frequency  
18.4  
18.4  
384  
MHz  
data bit rate  
Mbits/s  
kHz  
fWS  
word select input frequency  
Timing  
tr  
rise time  
12  
12  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
ns  
tf  
fall time  
Tcy  
bit clock cycle time  
bit clock HIGH time  
bit clock LOW time  
data set-up time  
data hold time  
54  
15  
15  
12  
2
tHB  
tLB  
tsu;DA  
th;DA  
th;WS  
tsu;WS  
word select hold time  
word select set-up time  
2
12  
1995 Dec 11  
7
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
SYMBOL  
PARAMETER  
CONDITIONS  
MIN.  
TYP.  
MAX.  
UNIT  
Analog outputs; IOL and IOR  
RES  
output resolution  
16  
bits  
VDCC  
DC output voltage  
compliance  
0
3.5  
1.14  
V
Io(p-p)  
TCFS  
AC output signal current  
(peak-to-peak value)  
note 2  
0.86  
1.0  
mA  
full-scale temperature  
coefficient  
±400 × 106  
Ibias  
Vref  
Rref  
output bias current  
note 2  
note 2  
0.93  
1.08  
16VDD  
11.4  
88  
1.23  
mA  
V
output reference voltage  
output resistance at pin 7  
7.6  
14.8  
78  
0.01  
24  
6
kΩ  
dB  
%
(TDH + N)/S total harmonic distortion  
plus noise-to-signal ratio  
at 0 dB signal level; note 3  
at 0 dB signal level; note 3  
at 60 dB signal level; note 3  
at 60 dB signal level; note 3  
0.004  
33  
dB  
%
2.2  
at 60 dB; A-weighted; note 3 −  
at 60 dB; A-weighted; note 3 −  
35  
dB  
%
1.8  
fi = 20 Hz to 20 kHz;  
at 0 dB signal level; note 3  
84  
70  
dB  
fi = 20 Hz to 20 kHz;  
at 0 dB signal level; note 3  
0.006  
0.2  
0.03  
%
tcs  
current settling time to  
µs  
±1 LSB  
αcs  
channel separation  
86  
95  
dB  
dB  
IO  
unbalance between  
outputs  
note 3  
0.2  
0.3  
td  
delay time between outputs  
±0.2  
µs  
S/N  
signal-to-noise ratio at  
bipolar zero  
A-weighted at code 0000H  
86  
98  
dB  
Notes  
1. Vripple = 1% of the supply voltage; fripple = 100 Hz.  
2. Values are proportional to VDD  
.
3. Measured with 1 kHz sine wave generated at a sampling rate of 192 kHz.  
QUALITY SPECIFICATION  
In accordance with “SNW-FQ-611E”. The numbers of the quality specification can be found in the “Quality Reference  
Handbook”. The handbook can be ordered using the code 9397 750 00192.  
1995 Dec 11  
8
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
Fig.4 Input signal timing (I2S-bus).  
Fig.5 Input signal format (I2S-bus).  
1995 Dec 11  
9
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
APPLICATION INFORMATION  
The TDA1387T offers great ease in designing-in to  
printed-circuit board due to its small size and low pin count.  
The TDA1387T being a mixed-signal IC in CMOS, some  
attention needs to be paid to layout and topology of the  
application PCB. The following basic rules will yield the  
desired performance. The most important considerations  
are:  
1. Supply: care should be taken to supply the TDA1387T  
with a clean, noiseless supply voltage, for a good  
noise performance of the analog parts of the DAC.  
Supply purity can easily be achieved by using an  
RC-filtered supply.  
2. Grounding: preferably a ground plane should be used,  
in order to have a low-impedance return available at  
any point in the layout. It is advantageous to make a  
partitioning of the ground plane according to the nature  
of the expected return currents (digital input returns  
separate from supply returns separate from the analog  
section).  
3. Topology: the capacitor decoupling high-frequency  
supply interference from VDD to GND should be placed  
as close as is physically possible to the IC body,  
ensuring a low-inductance path to ground. The digital  
input conductors may be shielded by ground leads  
running alongside. The placement of a passive ground  
plane underside the entire IC surface gives ‘free’  
additional decoupling from the IC body to ground as  
well as providing a shield between the digital input pins  
and the analog output pins.  
1995 Dec 11  
10  
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
PACKAGE OUTLINE  
SO8: plastic small outline package; 8 leads (straight); body width 3.9 mm  
SOT96-2  
D
E
A
X
c
H
v
M
A
E
Z
8
5
Q
A
2
pin 1 index  
L
1
4
detail X  
b
e
w
M
p
0
2.5  
scale  
5 mm  
DIMENSIONS (inch dimensions are derived from the original mm dimensions)  
(1)  
(1)  
(2)  
UNIT  
mm  
A
b
c
D
E
e
H
L
Q
v
w
Z
E
2
p
1.45  
1.25  
0.49  
0.36  
0.25  
0.19  
5.0  
4.8  
4.0  
3.8  
6.4  
6.2  
0.7  
0.6  
0.7  
0.3  
1.27  
0.050  
1.2  
0.25  
0.01  
0.25  
0.01  
0.057 0.019 0.0100 0.20  
0.049 0.014 0.0075 0.19  
0.16  
0.15  
0.252  
0.244  
0.028  
0.024  
0.028  
0.012  
inches  
0.047  
Notes  
1. Plastic or metal protrusions of 0.15 mm maximum per side are not included.  
2. Plastic or metal protrusions of 0.25 mm maximum per side are not included.  
REFERENCES  
OUTLINE  
EUROPEAN  
PROJECTION  
ISSUE DATE  
VERSION  
IEC  
JEDEC  
EIAJ  
95-02-04  
97-05-22  
SOT96-2  
1995 Dec 11  
11  
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
SOLDERING  
Introduction  
Wave soldering  
Wave soldering techniques can be used for all SO  
packages if the following conditions are observed:  
There is no soldering method that is ideal for all IC  
packages. Wave soldering is often preferred when  
through-hole and surface mounted components are mixed  
on one printed-circuit board. However, wave soldering is  
not always suitable for surface mounted ICs, or for  
printed-circuits with high population densities. In these  
situations reflow soldering is often used.  
A double-wave (a turbulent wave with high upward  
pressure followed by a smooth laminar wave) soldering  
technique should be used.  
The longitudinal axis of the package footprint must be  
parallel to the solder flow.  
The package footprint must incorporate solder thieves at  
the downstream end.  
This text gives a very brief insight to a complex technology.  
A more in-depth account of soldering ICs can be found in  
our “IC Package Databook” (order code 9398 652 90011).  
During placement and before soldering, the package must  
be fixed with a droplet of adhesive. The adhesive can be  
applied by screen printing, pin transfer or syringe  
dispensing. The package can be soldered after the  
adhesive is cured.  
Reflow soldering  
Reflow soldering techniques are suitable for all SO  
packages.  
Maximum permissible solder temperature is 260 °C, and  
maximum duration of package immersion in solder is  
10 seconds, if cooled to less than 150 °C within  
Reflow soldering requires solder paste (a suspension of  
fine solder particles, flux and binding agent) to be applied  
to the printed-circuit board by screen printing, stencilling or  
pressure-syringe dispensing before package placement.  
6 seconds. Typical dwell time is 4 seconds at 250 °C.  
A mildly-activated flux will eliminate the need for removal  
of corrosive residues in most applications.  
Several techniques exist for reflowing; for example,  
thermal conduction by heated belt. Dwell times vary  
between 50 and 300 seconds depending on heating  
method. Typical reflow temperatures range from  
215 to 250 °C.  
Repairing soldered joints  
Fix the component by first soldering two diagonally-  
opposite end leads. Use only a low voltage soldering iron  
(less than 24 V) applied to the flat part of the lead. Contact  
time must be limited to 10 seconds at up to 300 °C. When  
using a dedicated tool, all other leads can be soldered in  
one operation within 2 to 5 seconds between  
270 and 320 °C.  
Preheating is necessary to dry the paste and evaporate  
the binding agent. Preheating duration: 45 minutes at  
45 °C.  
1995 Dec 11  
12  
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC (CC-DAC)  
TDA1387T  
DEFINITIONS  
Data sheet status  
Objective specification  
Preliminary specification  
Product specification  
This data sheet contains target or goal specifications for product development.  
This data sheet contains preliminary data; supplementary data may be published later.  
This data sheet contains final product specifications.  
Limiting values  
Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one or  
more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation  
of the device at these or at any other conditions above those given in the Characteristics sections of the specification  
is not implied. Exposure to limiting values for extended periods may affect device reliability.  
Application information  
Where application information is given, it is advisory and does not form part of the specification.  
LIFE SUPPORT APPLICATIONS  
These products are not designed for use in life support appliances, devices, or systems where malfunction of these  
products can reasonably be expected to result in personal injury. Philips customers using or selling these products for  
use in such applications do so at their own risk and agree to fully indemnify Philips for any damages resulting from such  
improper use or sale.  
1995 Dec 11  
13  
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC  
(CC-DAC)  
TDA1387T  
NOTES  
1995 Dec 11  
14  
Philips Semiconductors  
Preliminary specification  
Stereo Continuous Calibration DAC  
(CC-DAC)  
TDA1387T  
NOTES  
1995 Dec 11  
15  
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Korea: Philips House, 260-199 Itaewon-dong,  
Internet: http://www.semiconductors.philips.com/ps/  
For all other countries apply to: Philips Semiconductors,  
International Marketing and Sales, Building BE-p,  
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Tel. (040)2783749, Fax. (040)2788399  
New Zealand: 2 Wagener Place, C.P.O. Box 1041, AUCKLAND,  
SCD47  
© Philips Electronics N.V. 1995  
All rights are reserved. Reproduction in whole or in part is prohibited without the  
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use. Publication thereof does not convey nor imply any license under patent- or  
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Tel. (09)849-4160, Fax. (09)849-7811  
Norway: Box 1, Manglerud 0612, OSLO,  
Printed in The Netherlands  
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Pakistan: Philips Electrical Industries of Pakistan Ltd.,  
Exchange Bldg. ST-2/A, Block 9, KDA Scheme 5, Clifton,  
KARACHI 75600, Tel. (021)587 4641-49,  
Fax. (021)577035/5874546  
513061/50/02/pp16  
Date of release: 1995 Dec 11  
9397 750 00519  
Document order number:  

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