FDB0300N1007L [ONSEMI]

N 沟道,PowerTrench® MOSFET,100V,200A,3mΩ;
FDB0300N1007L
型号: FDB0300N1007L
厂家: ONSEMI    ONSEMI
描述:

N 沟道,PowerTrench® MOSFET,100V,200A,3mΩ

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March 2016  
FDB0300N1007L  
N-Channel PowerTrench MOSFET  
100 V, 200 A, 3 mΩ  
®
Features  
General Description  
This N-Channel MOSFET is produced using Fairchild  
Semiconductor’s advance PowerTrench® process that has  
been especially tailored to minimize the on-state resistance  
while maintaining superior ruggedness and switching  
performance for industrial applications.  
„ Max rDS(on) = 3 mΩ at VGS = 10 V, ID = 26 A  
„ Max rDS(on) = 4.5 mΩ at VGS = 6 V, ID = 20 A  
„ Fast Switching Speed  
„ Low Gate Charge  
Applications  
„ High Performance Trench Technology for Extremely Low  
„ Industrial Motor Drive  
„ Industrial Power Supply  
„ Industrial Automation  
„ Battery Operated tools  
„ Battery Protection  
„ Solar Inverters  
RDS(on)  
„ High Power and Current Handling Capability  
„ RoHS Compliant  
„ UPS and Energy Inverters  
„ Energy Storage  
„ Load Switch  
D(Pin4, tab)  
1. Gate  
4
2. Source/Kelvin Sense  
3. Source/Kelvin Sense  
4. Drain  
5. Source  
6. Source  
G
(Pin1)  
1
7. Source  
2
3
5
6
7
D2-PAK  
(TO263)  
S(Pin2,3,5,6,7)  
MOSFET Maximum Ratings TC = 25 °C unless otherwise noted.  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
100  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Continuous  
V
V
±20  
TC = 25°C  
(Note 5)  
(Note 5)  
(Note 4)  
(Note 3)  
200  
ID  
TC = 100°C  
140  
A
-Pulsed  
1090  
843  
EAS  
Single Pulse Avalanche Energy  
Power Dissipation  
mJ  
W
TC = 25°C  
TA = 25°C  
250  
PD  
Power Dissipation  
(Note 1a)  
3.8  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +175  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
(Note 1)  
0.6  
40  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
330 mm  
Tape Width  
24 mm  
Quantity  
FDB0300N1007L  
FDB0300N1007L  
D2-PAK-7L  
800 units  
1
www.fairchildsemi.com  
©2016 Fairchild Semiconductor Corporation  
FDB0300N1007L Rev.C1  
Electrical Characteristics TJ = 25 °C unless otherwise noted.  
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
100  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 μA, referenced to 25 °C  
57  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 80 V, VGS = 0 V  
VGS = ±20 V, VDS = 0 V  
1
μA  
±100  
nA  
On Characteristics (Note 2)  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
2
2.7  
-12  
4
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 μA, referenced to 25 °C  
mV/°C  
V
GS = 10 V, ID = 26 A  
2.4  
3.4  
4.9  
85  
3
rDS(on)  
gFS  
Static Drain to Source On Resistance  
Forward Transconductance  
VGS = 6 V, ID = 20 A  
4.5  
11  
mΩ  
VGS = 10 V, ID = 26 A, TJ = 150°C  
VDS = 10 V, ID = 26 A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
5925  
1220  
42  
8295  
1710  
60  
pF  
pF  
pF  
Ω
VDS = 50 V, VGS = 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
2.7  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
28  
29  
52  
18  
81  
44  
24  
16  
45  
46  
ns  
ns  
ns  
ns  
nC  
VDD = 50 V, ID = 26 A,  
V
GS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
83  
32  
Qg  
Total Gate Charge  
Total Gate Charge  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
VGS = 0 V to 5 V  
113  
62  
Qg  
VDD = 50 V,  
D = 26 A  
I
Qgs  
Qgd  
nC  
nC  
Drain-Source Diode Characteristics  
IS  
Maximum Continuous Drain to Source Diode Forward Current  
Maximum Pulsed Drain to Source Diode Forward Current  
200  
1090  
1.2  
A
A
ISM  
VSD  
trr  
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, IS = 26 A  
(Note 2)  
0.8  
84  
V
134  
205  
ns  
nC  
IF = 26 A, di/dt = 100 A/μs  
Qrr  
Reverse Recovery Charge  
128  
Notes:  
1. R  
R
is the sum of the junction-to-case and case-to-ambient thermal resistance where the case thermal reference is defined as the solder mounting surface of the drain pins.  
θJA  
θJC  
is guaranteed by design while R  
is determined by the user's board design.  
θCA  
2
a) 40 °C/W when mounted on a 1 in pad of 2 oz copper.  
b) 62.5 °C/W when mounted on a minimum pad of 2 oz copper.  
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.  
3. E of 843 mJ is based on starting T = 25 °C, L = 0.3 mH, I = 75 A, V = 90 V, V = 10 V. 100% test at L = 0.1 mH, I = 108 A.  
AS  
J
AS  
DD  
GS  
AS  
4. Pulsed Id please refer to Figure “Forward Bias Safe Operating Area” for more details.  
5. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro-mechanical application board design.  
©2016 Fairchild Semiconductor Corporation  
FDB0300N1007L Rev.C1  
www.fairchildsemi.com  
2
Typical Characteristics TJ = 25 °C unless otherwise noted.  
300  
3
2
1
0
VGS = 10 V  
VGS = 8 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
200  
VGS = 7 V  
VGS = 6.5 V  
VGS = 6 V  
VGS = 6.5 V  
VGS = 6 V  
100  
VGS = 10 V  
VGS = 8 V  
VGS = 7 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
0
0
1
2
3
0
100  
200  
300  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs. Drain Current and Gate Voltage  
2.4  
20  
ID = 26 A  
GS = 10 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
2.2  
2.0  
1.8  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
V
15  
10  
5
ID = 26 A  
TJ = 150 o  
C
TJ = 25 o  
C
0
-75 -50 -25  
0
25 50 75 100 125 150 175  
4
5
6
7
8
9
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs. Junction Temperature  
Figure4. On-Resistance vs. Gate to  
Source Voltage  
300  
300  
VGS = 0 V  
100  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
10  
VDS = 5 V  
200  
100  
0
TJ = 175 o  
C
1
TJ = 175 o  
C
0.1  
TJ = 25 o  
C
TJ = 25 o  
C
0.01  
TJ = -55 o  
C
TJ = -55 o  
C
0.001  
2
3
4
5
6
7
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs. Source Current  
©2016 Fairchild Semiconductor Corporation  
FDB0300N1007L Rev.C1  
www.fairchildsemi.com  
3
Typical Characteristics TJ = 25 °C unless otherwise noted.  
10  
10000  
1000  
100  
ID = 26 A  
Ciss  
8
VDD = 25 V  
VDD = 50 V  
Coss  
6
VDD = 75 V  
4
f = 1 MHz  
GS = 0 V  
2
0
V
Crss  
10  
0.1  
0
20  
40  
60  
80  
100  
1
10  
100  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE (nC)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s . D r a i n  
to Source Voltage  
2000  
1000  
1000  
10 μs  
100  
10  
1
100  
10  
1
TJ = 25 o  
C
100 μs  
THIS AREA IS  
LIMITED BY rDS(on)  
TJ = 150 o  
C
1 ms  
SINGLE PULSE  
TJ = MAX RATED  
RθJC = 0.6 oC/W  
10 ms  
100 ms/DC  
CURVE BENT TO  
MEASURED DATA  
T
C = 25 oC  
0.1  
0.1  
0.001  
0.01  
0.1  
1
10  
100  
1000  
1
10  
100  
1000  
tAV, TIME IN AVALANCHE (ms)  
VDS, DRAIN to SOURCE VOLTAGE (V)  
F i g u r e 9 . U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure 10. Forward Bias Safe  
Operating Area  
105  
SINGLE PULSE  
RθJC = 0.6 oC/W  
TC = 25 o  
C
104  
103  
102  
10-5  
10-4  
10-3  
t, PULSE WIDTH (sec)  
10-2  
10-1  
1
Figure 11. Single Pulse Maximum Power Dissipation  
©2016 Fairchild Semiconductor Corporation  
FDB0300N1007L Rev.C1  
www.fairchildsemi.com  
4
Typical Characteristics TJ = 25 °C unless otherwise noted.  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
P
DM  
0.05  
0.02  
0.01  
0.1  
t
1
t
2
NOTES:  
(t) = r(t) x R  
0.01  
0.001  
Z
θJC  
θJC  
SINGLE PULSE  
o
R
= 0.6 C/W  
θJC  
Peak T = P  
x Z (t) + T  
J
DM  
θJC C  
Duty Cycle, D = t / t  
1
2
10-5  
10-4  
10-3  
t, RECTANGULAR PULSE DURATION (sec)  
10-2  
10-1  
1
Figure 12. Junction-to-Case Transient Thermal Response Curve  
©2016 Fairchild Semiconductor Corporation  
FDB0300N1007L Rev.C1  
www.fairchildsemi.com  
5
10.20  
9.70  
1.40  
1.00  
A
10.50  
8.40  
9.40  
9.00  
10.20  
C
1.40 MAX  
3.45  
0.73  
1
7
0.95  
0.90  
0.70  
(1.27) 6X  
1.27 6X  
7.62  
LAND PATTERN RECOMMENDATION  
0.70  
0.50  
C
M
0.25  
A
7.62  
4.70  
4.30  
B
8.78  
8.38  
1.40  
1.20  
7.70 MIN  
8
15.70  
15.10  
C
1
7
A
0.60  
0.40  
0.254  
0.20 MAX  
NOTES:  
A. PACKAGE CONFORMS TO JEDEC TO-263  
VARIATION CB EXCEPT W HERE NOTED.  
B. ALL DIMENSIONS ARE IN MILLIMETERS.  
GAGE PLANE  
C
OUT OF JEDEC STANDARD VALUE.  
SEATING PLANE  
D. DIMENSION AND TOLERANCE AS PER ASME  
Y14.5-1994.  
E. DIMENSIONS ARE EXCLUSIVE OF BURRS,  
MOLD FLASH AND TIE BAR PROTRUSIONS.  
F. LAND PATTERN RECOMMENDATION PER IPC.  
TO127P1524X465-8N.  
5.20  
4.80  
G. DRAW ING FILE NAME: TO263A07REV5.  
R0.50  
2.84  
2.44  
0.20  
0 - 8°  
B
C
DETAIL A  
SCALE 2:1  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability  
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This  
literature is subject to all applicable copyright laws and is not for resale in any manner.  
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