FDB060AN08A0 [ONSEMI]

N 沟道,PowerTrench® MOSFET,75V,80A,6mΩ;
FDB060AN08A0
型号: FDB060AN08A0
厂家: ONSEMI    ONSEMI
描述:

N 沟道,PowerTrench® MOSFET,75V,80A,6mΩ

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October 2013  
FDP060AN08A0 / FDB060AN08A0  
®
N-Channel PowerTrench MOSFET  
75 V, 80 A, 6 mΩ  
Features  
Applications  
RDS(on) = 4.8 m( Typ.) @ VGS = 10 V, ID = 80 A  
QG(tot) = 73 nC ( Typ.) @ VGS = 10 V  
Low Miller Charge  
Synchronous Rectification for ATX / Server / Telecom PSU  
Battery Protection Circuit  
Motor drives and Uninterruptible Power Supplies  
Low Qrr Body Diode  
UIS Capability (Single Pulse and Repetitive Pulse)  
Formerly developmental type 82680  
D
D
G
G
G
D2-PAK  
D
S
S
TO-220  
S
MOSFET Maximum Ratings T = 25°C unless otherwise noted  
C
FDP060AN08A0  
FDB060AN08A0  
Symbol  
Parameter  
Unit  
VDSS  
VGS  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current  
75  
V
V
±20  
Continuous (TC < 127oC, VGS = 10V)  
Continuous (Tamb = 25oC, VGS = 10V, with RθJA = 43oC/W)  
Pulsed  
80  
A
ID  
16  
Figure 4  
350  
A
A
EAS  
Single Pulse Avalanche Energy (Note 1)  
Power dissipation  
Derate above 25oC  
mJ  
W
W/oC  
oC  
255  
PD  
1.7  
TJ, TSTG  
Operating and Storage Temperature  
-55 to 175  
Thermal Characteristics  
RθJC  
RθJA  
RθJA  
Thermal Resistance Junction to Case, Max. TO-220, D2-PAK  
Thermal Resistance Junction to Ambient, Max. TO-220, D2-PAK (Note 2)  
Thermal Resistance Junction to Ambient, Max. D2-PAK, 1in2 copper pad area  
0.58  
oC/W  
oC/W  
oC/W  
62  
43  
1
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Package Marking and Ordering Information  
Device Marking  
FDB060AN08A0  
FDP060AN08A0  
Device  
Package  
D2-PAK  
TO-220  
Reel Size  
330 mm  
Tube  
Tape Width  
24 mm  
N/A  
Quantity  
800 units  
50 units  
FDB060AN08A0  
FDP060AN08A0  
Electrical Characteristics TC = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Unit  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
ID = 250µA, VGS = 0V  
75  
-
-
-
-
-
-
V
V
DS = 60V  
1
IDSS  
µA  
nA  
VGS = 0V  
TC = 150oC  
-
250  
±100  
IGSS  
VGS = ±20V  
-
On Characteristics  
VGS(TH)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250µA  
D = 80A, VGS = 10V  
ID = 40A, VGS = 6V  
2
-
-
4
V
I
0.0048 0.006  
0.0066 0.010  
-
rDS(ON)  
Drain to Source On Resistance  
I
D = 80A, VGS = 10V,  
-
0.010 0.013  
TJ = 175oC  
Dynamic Characteristics  
CISS  
Input Capacitance  
-
-
-
5150  
800  
230  
73  
-
-
pF  
pF  
pF  
nC  
nC  
nC  
nC  
nC  
VDS = 25V, VGS = 0V,  
f = 1MHz  
COSS  
CRSS  
Qg(TOT)  
Qg(TH)  
Qgs  
Output Capacitance  
Reverse Transfer Capacitance  
Total Gate Charge at 10V  
Threshold Gate Charge  
-
VGS = 0V to 10V  
95  
13  
-
VGS = 0V to 2V  
-
-
-
-
10  
VDD = 40V  
ID = 80A  
Gate to Source Gate Charge  
Gate Charge Threshold to Plateau  
Gate to Drain “Miller” Charge  
29  
Ig = 1.0mA  
Qgs2  
19  
-
Qgd  
16  
-
Switching Characteristics (VGS = 10V)  
tON  
td(ON)  
tr  
Turn-On Time  
Turn-On Delay Time  
Rise Time  
-
-
-
-
-
-
-
147  
ns  
ns  
ns  
ns  
ns  
ns  
19  
79  
37  
38  
-
-
-
VDD = 40V, ID = 80A  
VGS = 10V, RGS = 3.9Ω  
td(OFF)  
tf  
Turn-Off Delay Time  
Fall Time  
-
-
tOFF  
Turn-Off Time  
113  
Drain-Source Diode Characteristics  
I
I
SD = 80A  
SD = 40A  
-
-
-
-
-
-
-
-
1.25  
1.0  
37  
V
V
VSD  
Source to Drain Diode Voltage  
trr  
Reverse Recovery Time  
ISD = 75A, dISD/dt = 100A/µs  
ISD = 75A, dISD/dt = 100A/µs  
ns  
nC  
QRR  
Reverse Recovered Charge  
38  
Notes:  
1: Starting T = 25°C, L = 109µH, I = 80A.  
J
AS  
2: Pulse width = 100s  
2
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Typical Characteristics T = 25°C unless otherwise noted  
C
1.2  
150  
CURRENT LIMITED  
BY PACKAGE  
1.0  
125  
0.8  
0.6  
0.4  
0.2  
0
100  
75  
50  
25  
0
25  
50  
75  
100  
125  
150  
175  
150  
0
25  
50  
75  
100  
175  
125  
o
o
T
, CASE TEMPERATURE ( C)  
C
T
, CASE TEMPERATURE ( C)  
C
Figure 1. Normalized Power Dissipation vs  
Ambient Temperature  
Figure 2. Maximum Continuous Drain Current vs  
Case Temperature  
2
DUTY CYCLE - DESCENDING ORDER  
0.5  
0.2  
1
0.1  
0.05  
0.02  
0.01  
P
DM  
0.1  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
SINGLE PULSE  
0.01  
PEAK T = P  
x Z  
x R  
+ T  
θJC C  
J
DM  
θJC  
-5  
-4  
-3  
-2  
-1  
0
1
10  
10  
10  
10  
t, RECTANGULAR PULSE DURATION (s)  
10  
10  
10  
Figure 3. Normalized Maximum Transient Thermal Impedance  
2000  
o
T
= 25 C  
C
FOR TEMPERATURES  
TRANSCONDUCTANCE  
MAY LIMIT CURRENT  
IN THIS REGION  
o
ABOVE 25 C DERATE PEAK  
1000  
CURRENT AS FOLLOWS:  
175 - T  
150  
C
I = I  
25  
V
= 10V  
GS  
100  
70  
-5  
-4  
-3  
-2  
-1  
0
1
10  
10  
10  
10  
t, PULSE WIDTH (s)  
10  
10  
10  
Figure 4. Peak Current Capability  
3
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Typical Characteristics T = 25°C unless otherwise noted  
C
1000  
100  
10  
500  
If R = 0  
= (L)(I )/(1.3*RATED BV  
t
AV  
- V  
DD  
)
AS  
DSS  
10µs  
If R 0  
t
AV  
= (L/R)ln[(I *R)/(1.3*RATED BV  
AS  
- V ) +1]  
DSS DD  
100µs  
100  
1ms  
10ms  
OPERATION IN THIS  
AREA MAY BE  
o
STARTING T = 25 C  
J
LIMITED BY r  
DS(ON)  
10  
DC  
o
1
STARTING T = 150 C  
J
SINGLE PULSE  
T
= MAX RATED  
= 25 C  
J
o
T
C
0.1  
1
1
10  
, DRAIN TO SOURCE VOLTAGE (V)  
100  
0.01  
0.1  
1
10  
100  
V
t , TIME IN AVALANCHE (ms)  
DS  
AV  
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515  
Figure 6. Unclamped Inductive Switching  
Capability  
Figure 5. Forward Bias Safe Operating Area  
175  
175  
PULSE DURATION = 80µs  
V
= 7V  
V
= 10V  
GS  
GS  
DUTY CYCLE = 0.5% MAX  
150  
150  
125  
100  
75  
V
= 15V  
DD  
V
= 6V  
GS  
125  
100  
75  
50  
25  
0
o
T
= 175 C  
J
V
= 5V  
GS  
50  
o
o
T
= 25 C  
o
T
= -55 C  
J
J
T
= 25 C  
C
25  
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5% MAX  
0
0
0.5  
1.0  
1.5  
2.0  
3.5  
4.0  
4.5  
5.0  
5.5  
6.0  
V
, GATE TO SOURCE VOLTAGE (V)  
V
, DRAIN TO SOURCE VOLTAGE (V)  
GS  
DS  
Figure 7. Transfer Characteristics  
Figure 8. Saturation Characteristics  
2.5  
7.5  
PULSE DURATION = 80µs  
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5% MAX  
DUTY CYCLE = 0.5% MAX  
7.0  
6.5  
6.0  
5.5  
5.0  
4.5  
4.0  
2.0  
1.5  
1.0  
0.5  
V
= 6V  
GS  
V
= 10V  
GS  
V
= 10V, I = 80A  
D
GS  
0
20  
40  
I , DRAIN CURRENT (A)  
60  
80  
-80  
-40  
0
40  
80  
120  
160  
200  
o
T , JUNCTION TEMPERATURE ( C)  
D
J
Figure 9. Drain to Source On Resistance vs Drain  
Current  
Figure 10. Normalized Drain to Source On  
Resistance vs Junction Temperature  
4
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Typical Characteristics T = 25°C unless otherwise noted  
C
1.2  
1.0  
0.8  
0.6  
0.4  
1.2  
1.1  
1.0  
0.9  
V
= V , I = 250µA  
I
= 250µA  
GS  
DS  
D
D
-80  
-40  
0
40  
80  
120  
160  
200  
-80  
-40  
0
40  
80  
120  
160  
200  
o
o
T , JUNCTION TEMPERATURE ( C)  
T , JUNCTION TEMPERATURE ( C)  
J
J
Figure 11. Normalized Gate Threshold Voltage vs  
Junction Temperature  
Figure 12. Normalized Drain to Source  
Breakdown Voltage vs Junction Temperature  
10  
7000  
V
= 40V  
DD  
C
= C + C  
GS GD  
ISS  
8
6
4
2
0
C
C
+ C  
GD  
OSS  
DS  
GD  
1000  
C
= C  
RSS  
WAVEFORMS IN  
DESCENDING ORDER:  
I
= 80A  
= 16A  
D
I
D
V
= 0V, f = 1MHz  
GS  
100  
0.1  
0
20  
40  
Q , GATE CHARGE (nC)  
60  
80  
75  
1
10  
V
, DRAIN TO SOURCE VOLTAGE (V)  
DS  
g
Figure 13. Capacitance vs Drain to Source  
Voltage  
Figure 14. Gate Charge Waveforms for Constant  
Gate Current  
5
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Test Circuits and Waveforms  
V
DS  
BV  
DSS  
t
P
L
V
DS  
I
VARY t TO OBTAIN  
P
AS  
+
-
V
DD  
R
REQUIRED PEAK I  
G
AS  
V
DD  
V
GS  
DUT  
t
P
I
0V  
AS  
0
0.01  
t
AV  
Figure 15. Unclamped Energy Test Circuit  
Figure 16. Unclamped Energy Waveforms  
V
DS  
V
Q
DD  
g(TOT)  
V
L
DS  
V
GS  
V
= 10V  
GS  
V
GS  
+
-
Q
gs2  
V
DD  
DUT  
V
= 2V  
GS  
I
g(REF)  
0
Q
g(TH)  
Q
Q
gs  
gd  
I
g(REF)  
0
Figure 17. Gate Charge Test Circuit  
Figure 18. Gate Charge Waveforms  
V
DS  
t
t
ON  
OFF  
t
d(OFF)  
t
d(ON)  
R
L
t
t
f
r
V
DS  
90%  
90%  
+
-
V
GS  
V
DD  
10%  
10%  
0
DUT  
90%  
50%  
R
GS  
V
GS  
50%  
PULSE WIDTH  
V
10%  
GS  
0
Figure 19. Switching Time Test Circuit  
Figure 20. Switching Time Waveforms  
6
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Thermal Resistance vs. Mounting Pad Area  
The maximum rated junction temperature, TJM, and the  
thermal resistance of the heat dissipating path determines  
the maximum allowable device power dissipation, PDM, in an  
80  
60  
40  
20  
R
= 26.51+ 19.84/(0.262+Area) EQ.2  
θJA  
R
= 26.51+ 128/(1.69+Area) EQ.3  
θJA  
application.  
Therefore the application’s ambient  
temperature, TA (oC), and thermal resistance RθJA (oC/W)  
must be reviewed to ensure that TJM is never exceeded.  
Equation 1 mathematically represents the relationship and  
serves as the basis for establishing the rating of the part.  
(T  
T )  
A
JM  
(EQ. 1)  
P
= -----------------------------  
DM  
RθJA  
In using surface mount devices such as the TO-263  
package, the environment in which it is applied will have a  
significant influence on the part’s current and maximum  
power dissipation ratings. Precise determination of PDM is  
complex and influenced by many factors:  
10  
0.1  
(0.645)  
1
(6.45)  
(64.5)  
2
2
AREA, TOP COPPER AREA in (cm )  
Figure 21. Thermal Resistance vs Mounting  
Pad Area  
1. Mounting pad area onto which the device is attached and  
whether there is copper on one side or both sides of the  
board.  
2. The number of copper layers and the thickness of the  
board.  
3. The use of external heat sinks.  
4. The use of thermal vias.  
5. Air flow and board orientation.  
6. For non steady state applications, the pulse width, the  
duty cycle and the transient thermal response of the part,  
the board and the environment they are in.  
Fairchild provides thermal information to assist the  
designer’s preliminary application evaluation. Figure 21  
defines the RθJA for the device as a function of the top  
copper (component side) area. This is for a horizontally  
positioned FR-4 board with 1oz copper after 1000 seconds  
of steady state power with no air flow. This graph provides  
the necessary information for calculation of the steady state  
junction temperature or power dissipation. Pulse  
applications can be evaluated using the Fairchild device  
Spice thermal model or manually utilizing the normalized  
maximum transient thermal impedance curve.  
Thermal resistances corresponding to other copper areas  
can be obtained from Figure 21 or by calculation using  
Equation 2 or 3. Equation 2 is used for copper area defined  
in inches square and equation 3 is for area in centimeters  
square. The area, in square inches or square centimeters is  
the top copper area including the gate and source pads.  
19.84  
(0.262 + Area)  
R
= 26.51 + ------------------------------------  
(EQ. 2)  
θJA  
θJA  
Area in Inches Squared  
128  
R
= 26.51 + ---------------------------------  
(EQ. 3)  
(1.69 + Area)  
Area in Centimeters Squared  
7
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
PSPICE Electrical Model  
.SUBCKT FDP060AN08A0 2 1 3 ; rev October 2002  
Ca 12 8 2.5e-9  
Cb 15 14 2.1e-9  
Cin 6 8 4.7e-9  
LDRAIN  
DPLCAP  
DRAIN  
2
5
10  
Dbody 7 5 DbodyMOD  
Dbreak 5 11 DbreakMOD  
Dplcap 10 5 DplcapMOD  
RLDRAIN  
RSLC1  
51  
DBREAK  
+
RSLC2  
5
ESLC  
11  
51  
Ebreak 11 7 17 18 82.1  
Eds 14 8 5 8 1  
Egs 13 8 6 8 1  
Esg 6 10 6 8 1  
Evthres 6 21 19 8 1  
-
+
50  
-
17  
DBODY  
RDRAIN  
6
8
EBREAK 18  
-
ESG  
EVTHRES  
+
16  
21  
+
-
19  
8
MWEAK  
Evtemp 20 6 18 22 1  
LGATE  
EVTEMP  
RGATE  
GATE  
1
6
+
-
18  
22  
MMED  
It 8 17 1  
9
20  
MSTRO  
8
RLGATE  
Lgate 1 9 5.3e-9  
Ldrain 2 5 1.0e-9  
Lsource 3 7 5e-9  
LSOURCE  
CIN  
SOURCE  
3
7
RSOURCE  
RLSOURCE  
RLgate 1 9 53  
RLdrain 2 5 10  
RLsource 3 7 50  
S1A  
S2A  
RBREAK  
12  
15  
13  
14  
13  
17  
18  
8
RVTEMP  
19  
-
S1B  
S2B  
Mmed 16 6 8 8 MmedMOD  
Mstro 16 6 8 8 MstroMOD  
Mweak 16 21 8 8 MweakMOD  
13  
CB  
CA  
IT  
14  
+
+
VBAT  
6
8
5
8
EGS  
EDS  
+
Rbreak 17 18 RbreakMOD 1  
Rdrain 50 16 RdrainMOD 9e-4  
Rgate 9 20 1.4  
-
-
8
22  
RVTHRES  
RSLC1 5 51 RSLCMOD 1e-6  
RSLC2 5 50 1e3  
Rsource 8 7 RsourceMOD 3e-3  
Rvthres 22 8 RvthresMOD 1  
Rvtemp 18 19 RvtempMOD 1  
S1a 6 12 13 8 S1AMOD  
S1b 13 12 13 8 S1BMOD  
S2a 6 15 14 13 S2AMOD  
S2b 13 15 14 13 S2BMOD  
Vbat 22 19 DC 1  
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*350),5))}  
.MODEL DbodyMOD D (IS=2E-11 N=1.04 RS=1.76e-3 TRS1=2.7e-3 TRS2=1e-6  
+ CJO=3.2e-9 M=5.6e-1 TT=3e-10 XTI=3.9)  
.MODEL DbreakMOD D (RS=3e-1 TRS1=1e-3 TRS2=-8.9e-6)  
.MODEL DplcapMOD D (CJO=1.56e-9 IS=1e-30 N=10 M=0.53)  
.MODEL MmedMOD NMOS (VTO=3.6 KP=6 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.4)  
.MODEL MstroMOD NMOS (VTO=4.22 KP=220 IS=1e-30 N=10 TOX=1 L=1u W=1u)  
.MODEL MweakMOD NMOS (VTO=3 KP=0.03 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=14 RS=0.1)  
.MODEL RbreakMOD RES (TC1=9.4e-4 TC2=-9e-7)  
.MODEL RdrainMOD RES (TC1=2.2e-2 TC2=6e-5)  
.MODEL RSLCMOD RES (TC1=2e-3 TC2=1e-5)  
.MODEL RsourceMOD RES (TC1=1e-3 TC2=1e-6)  
.MODEL RvthresMOD RES (TC1=-6e-3 TC2=-1.6e-5)  
.MODEL RvtempMOD RES (TC1=-2.4e-3 TC2=1e-6)  
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-8 VOFF=-5)  
.MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-5 VOFF=-8)  
.MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3.5)  
.MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3.5 VOFF=-4)  
.ENDS  
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global  
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank  
Wheatley.  
8
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
SABER Electrical Model  
rev October 2002  
template FDP060AN08A0 n2,n1,n3  
electrical n2,n1,n3  
{
var i iscl  
dp..model dbodymod = (isl=2e-11,nl=1.04,rs=1.76e-3,trs1=2.7e-3,trs2=1e-6,cjo=3.2e-9,m=5.6e-1,tt=3e-10,xti=3.9)  
dp..model dbreakmod = (rs=3e-1,trs1=1e-3,trs2=-8.9e-6)  
dp..model dplcapmod = (cjo=1.56e-9,isl=10e-30,nl=10,m=0.53)  
m..model mmedmod = (type=_n,vto=3.6,kp=6,is=1e-30, tox=1)  
m..model mstrongmod = (type=_n,vto=4.22,kp=220,is=1e-30, tox=1)  
m..model mweakmod = (type=_n,vto=3,kp=0.03,is=1e-30, tox=1,rs=0.1)  
sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-8,voff=-5)  
LDRAIN  
DPLCAP  
5
DRAIN  
2
sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-5,voff=-8)  
sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-4,voff=-3.5)  
sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-3.5,voff=-4)  
c.ca n12 n8 = 2.5e-9  
10  
RLDRAIN  
RSLC1  
51  
RSLC2  
c.cb n15 n14 = 2.1e-9  
ISCL  
c.cin n6 n8 = 4.7e-9  
DBREAK  
11  
50  
-
dp.dbody n7 n5 = model=dbodymod  
dp.dbreak n5 n11 = model=dbreakmod  
dp.dplcap n10 n5 = model=dplcapmod  
RDRAIN  
6
8
ESG  
DBODY  
EVTHRES  
+
16  
21  
+
-
19  
8
MWEAK  
LGATE  
EVTEMP  
spe.ebreak n11 n7 n17 n18 = 82.1  
RGATE  
GATE  
1
+
6
-
18  
22  
EBREAK  
+
spe.eds n14 n8 n5 n8 = 1  
spe.egs n13 n8 n6 n8 = 1  
spe.esg n6 n10 n6 n8 = 1  
spe.evthres n6 n21 n19 n8 = 1  
spe.evtemp n20 n6 n18 n22 = 1  
MMED  
9
20  
MSTRO  
8
17  
18  
-
RLGATE  
LSOURCE  
CIN  
SOURCE  
3
7
RSOURCE  
RLSOURCE  
i.it n8 n17 = 1  
S1A  
S2A  
RBREAK  
12  
15  
13  
8
14  
13  
l.lgate n1 n9 = 5.3e-9  
l.ldrain n2 n5 = 1.0e-9  
l.lsource n3 n7 = 5e-9  
17  
18  
RVTEMP  
19  
S1B  
S2B  
13  
CB  
CA  
IT  
14  
-
+
+
res.rlgate n1 n9 = 53  
res.rldrain n2 n5 = 10  
res.rlsource n3 n7 = 50  
VBAT  
6
8
5
8
EGS  
EDS  
+
-
-
8
22  
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u  
RVTHRES  
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u  
m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u  
res.rbreak n17 n18 = 1, tc1=9.4e-4,tc2=-9e-7  
res.rdrain n50 n16 = 9e-4, tc1=2.2e-2,tc2=6e-5  
res.rgate n9 n20 = 1.4  
res.rslc1 n5 n51 = 1e-6, tc1=2e-3,tc2=1e-5  
res.rslc2 n5 n50 = 1e3  
res.rsource n8 n7 = 3e-3, tc1=1e-3,tc2=1e-6  
res.rvthres n22 n8 = 1, tc1=-6e-3,tc2=-1.6e-5  
res.rvtemp n18 n19 = 1, tc1=-2.4e-3,tc2=1e-6  
sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod  
sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod  
sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod  
sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod  
v.vbat n22 n19 = dc=1  
equations {  
i (n51->n50) +=iscl  
iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/350))** 5))  
}
}
9
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
SPICE Thermal Model  
REV 23 October 2002  
JUNCTION  
th  
FDP060AN08A0T  
CTHERM1 TH 6 9.6e-3  
CTHERM2 6 5 9.7e-3  
CTHERM3 5 4 9.8e-3  
CTHERM4 4 3 1e-2  
CTHERM5 3 2 3e-2  
CTHERM6 2 TL 9e-2  
RTHERM1  
RTHERM2  
RTHERM3  
RTHERM4  
RTHERM5  
RTHERM6  
CTHERM1  
6
RTHERM1 TH 6 3.2e-3  
RTHERM2 6 5 8.1e-3  
RTHERM3 5 4 2.3e-2  
RTHERM4 4 3 1.2e-1  
RTHERM5 3 2 1.5e-1  
RTHERM6 2 TL 1.6e-1  
CTHERM2  
CTHERM3  
CTHERM4  
CTHERM5  
CTHERM6  
5
SABER Thermal Model  
SABER thermal model FDP060AN08A0T  
template thermal_model th tl  
thermal_c th, tl  
{
ctherm.ctherm1 th 6 =9.6e-3  
ctherm.ctherm2 6 5 =9.7e-3  
ctherm.ctherm3 5 4 =9.8e-3  
ctherm.ctherm4 4 3 =1e-2  
ctherm.ctherm5 3 2 =3e-2  
ctherm.ctherm6 2 tl =9e-2  
4
3
2
rtherm.rtherm1 th 6 =3.2e-3  
rtherm.rtherm2 6 5 =8.1e-3  
rtherm.rtherm3 5 4 =2.3e-2  
rtherm.rtherm4 4 3 =1.2e-1  
rtherm.rtherm5 3 2 =1.5e-1  
rtherm.rtherm6 2 tl =1.6e-1  
}
tl  
CASE  
10  
www.fairchildsemi.com  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
Mechanical Dimensions  
TO-220 3L  
Figure 22. TO-220, Molded, 3Lead, Jedec Variation AB  
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obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-  
ically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT220-003  
Dimension in Millimeters  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
11  
www.fairchildsemi.com  
Mechanical Dimensions  
TO-263 2L (D2PAK)  
Figure 23. 2LD, TO263, Surface Mount  
Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner  
without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or  
obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specif-  
ically the warranty therein, which covers Fairchild products.  
Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT263-002  
Dimension in Millimeters  
©2003 Fairchild Semiconductor Corporation  
FDP060AN08A0 / FDB060AN08A0 Rev. C4  
12  
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intended to be an exhaustive list of all such trademarks.  
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AX-CAP *  
BitSiC™  
Build it Now™  
CorePLUS™  
CorePOWER™  
CROSSVOLT™  
CTL™  
F-PFS™  
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Sync-Lock™  
®*  
®
®
®
tm  
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Green FPS™  
PowerTrench  
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