FDG410NZ [ONSEMI]

N 沟道,PowerTrench® MOSFET,20 V,2.2 A,70 mΩ;
FDG410NZ
型号: FDG410NZ
厂家: ONSEMI    ONSEMI
描述:

N 沟道,PowerTrench® MOSFET,20 V,2.2 A,70 mΩ

开关 光电二极管 晶体管
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is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner.  
March 2009  
FDG410NZ  
Single N-Channel PowerTrench® MOSFET  
20 V, 2.2 A, 70 mΩ  
Features  
General Description  
This N-Channel MOSFET has been designed specifically to  
improve the overall efficiency of DC/DC converters using either  
synchronous or conventional switching PWM controllers. It has  
been optimized use in small switching regulaters, providing an  
extremely low rDS(on) and gate charge (Qg) in a small package.  
„ Max rDS(on) = 70 mat VGS = 4.5 V, ID = 2.2 A  
„ Max rDS(on) = 77 mat VGS = 2.5 V, ID = 2.0 A  
„ Max rDS(on) = 87 mat VGS = 1.8 V, ID = 1.8 A  
„ Max rDS(on) = 115 mat VGS = 1.5 V, ID = 1.5 A  
„ HBM ESD protection level > 2 kV (Note 3)  
„ High performance trench technology for extremely low rDS(on)  
„ High power and current handling capability  
„ Fast switching speed  
Applications  
„ DC/DC converter  
„ Power management  
„ Load switch  
„ Low gate charge  
„ RoHS Compliant  
S
D
D
D
6
5
1
D
D
D 2  
G
D
D
3
4 S  
G
SC70-6  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
20  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
V
V
±8  
-Continuous  
-Pulsed  
Power Dissipation  
Power Dissipation  
TA = 25 °C  
(Note 1a)  
2.2  
ID  
A
6.0  
TA = 25 °C  
TA = 25 °C  
(Note 1a)  
(Note 1b)  
0.42  
PD  
W
0.38  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJA  
RθJA  
Thermal Resistance, Junction to Ambient  
Thermal Resistance, Junction to Ambient  
(Note 1a)  
(Note 1b)  
300  
333  
°C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
8 mm  
Quantity  
.41  
FDG410NZ  
SC70-6  
7 ”  
3000 units  
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
1
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 µA, VGS = 0 V  
20  
V
BVDSS  
TJ  
Breakdown Voltage Temperature  
Coefficient  
I
D = 250 µA, referenced to 25 °C  
17  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
VDS = 16 V, VGS = 0 V  
VGS = ±8 V, VDS = 0 V  
1
µA  
µA  
±10  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 µA  
0.4  
0.7  
-3  
1.0  
V
VGS(th)  
TJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
D = 250 µA, referenced to 25 °C  
GS = 4.5 V, ID = 2.2 A  
mV/°C  
V
50  
56  
67  
83  
70  
77  
VGS = 2.5 V, ID = 2.0 A  
VGS = 1.8 V, ID = 1.8 A  
VGS = 1.5 V, ID = 1.5 A  
87  
rDS(on)  
Static Drain to Source On Resistance  
Forward Transconductance  
mΩ  
115  
VGS = 4.5 V, ID = 2.2 A,  
TJ = 125 °C  
71  
11  
100  
gFS  
VDD = 5 V, ID = 2.2 A  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
400  
70  
535  
95  
pF  
pF  
pF  
VDS = 10 V, VGS = 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
45  
70  
2.8  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
5.3  
2.3  
18  
11  
10  
33  
10  
7.2  
ns  
ns  
VDD = 10 V, ID = 2.2 A,  
V
GS = 4.5 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
ns  
2.3  
5.1  
0.6  
1.0  
ns  
Qg  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
nC  
nC  
nC  
VGS = 4.5 V, VDD = 10 V,  
D = 2.2 A  
Qgs  
Qgd  
I
Drain-Source Diode Characteristics  
IS  
Maximum Continuous Drain-Source Diode Forward Current  
0.35  
1.2  
20  
A
V
VSD  
trr  
Source to Drain Diode Forward Voltage  
Reverse Recovery Time  
VGS = 0 V, IS = 0.35 A (Note 2)  
0.6  
11  
ns  
nC  
IF = 2.2 A, di/dt = 100 A/µs  
Qrr  
Reverse Recovery Charge  
2.5  
10  
Notes:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R is determined by  
θJA  
θJA  
θJC  
the user's board design.  
b. 333 °C/W when mounted on a  
minimum pad of 2 oz copper.  
a. 300 °C/W when mounted  
on a 1 in pad of 2 oz copper.  
2
2. Pulse Test: Pulse Width < 300 µs, Duty cycle < 2.0%.  
3: The diode connected between the gate and source serves only as protection against ESD. No gate overvoltage rating is implied.  
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
2
Typical Characteristics TJ = 25 °C unless otherwise noted  
6
2.5  
2.0  
1.5  
1.0  
0.5  
VGS = 4.5 V  
VGS = 3.5 V  
VGS = 2.5 V  
5
4
3
2
1
0
VGS = 1.5 V  
VGS = 1.8 V  
VGS = 1.5 V  
VGS = 1.8 V  
VGS = 2.5 V  
PULSE DURATION = 80  
DUTY CYCLE = 0.5% MAX  
µs  
VGS = 3.5 V  
VGS = 4.5 V  
PULSE DURATION = 80 µs  
DUTY CYCLE = 0.5% MAX  
0
0.2  
VDS  
0.4  
0.6  
0.8  
1.0  
1
2
3
4
5
6
,
DRAIN TO SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
1.6  
1.4  
1.2  
1.0  
0.8  
0.6  
180  
ID = 2.2 A  
GS = 4.5 V  
PULSE DURATION = 80 µs  
DUTY CYCLE = 0.5% MAX  
V
160  
140  
120  
100  
80  
ID = 1.1 A  
TJ = 125 oC  
TJ = 25 oC  
60  
40  
1.0  
-75 -50 -25  
TJ  
0
25 50 75 100 125 150  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
4.5  
,
JUNCTION TEMPERATURE ( )  
oC  
VGS  
, GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
6
6
VGS = 0 V  
PULSE DURATION = 80 µs  
DUTY CYCLE = 0.5% MAX  
5
4
3
2
1
0
VDS = 5 V  
1
0.1  
TJ = 125 oC  
TJ = 25 o  
C
TJ = 125 o  
C
TJ = 25 o  
C
TJ = -55 o  
C
TJ = -55 oC  
0.01  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
0.0  
0.5  
1.0  
1.5  
2.0  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
3
Typical Characteristics TJ = 25 °C unless otherwise noted  
5
1000  
100  
10  
ID = 2.2 A  
4
Ciss  
VDD = 5 V  
3
VDD = 10 V  
VDD = 15 V  
Coss  
2
1
0
Crss  
f = 1 MHz  
= 0 V  
V
GS  
0.1  
1
10  
20  
0
1
2
3
4
5
6
Q , GATE CHARGE (nC)  
g
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
10  
105  
103  
101  
10-1  
10-3  
10-5  
VGS = 0 V  
0.1 ms  
1 ms  
1
0.1  
TJ = 125 oC  
10 ms  
THIS AREA IS  
LIMITED BY r  
TJ = 25 o  
C
DS(on)  
100 ms  
SINGLE PULSE  
J = MAX RATED  
RθJA = 333 oC/W  
T
10 s  
1 s  
DC  
T
A = 25 oC  
0.01  
0
2
4
6
8
10  
12  
14  
0.01  
0.1  
1
10  
100  
VGS, GATE TO SOURCE VOLTAGE (V)  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 9. Forward Bias Safe  
Operating Area  
Figure 10. Gate Leakage Current vs Gate to Source  
Voltage  
100  
10  
1
VGS = 4.5 V  
SINGLE PULSE  
RθJA = 333 oC/W  
A = 25 oC  
T
0.1  
10-4  
10-3  
10-2  
10-1  
t, PULSE WIDTH (sec)  
1
10  
100  
1000  
Figure 11. Single Pulse Maximum Power Dissipation  
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
4
Typical Characteristics TJ = 25 °C unless otherwise noted  
2
1
DUTY CYCLE-DESCENDING ORDER  
D = 0.5  
0.2  
0.1  
P
0.1  
DM  
0.05  
0.02  
0.01  
t
1
t
0.01  
0.001  
2
NOTES:  
DUTY FACTOR: D = t /t  
SINGLE PULSE  
RθJA = 333 oC/W  
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
DM  
θJA  
θJA A  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 12. Junction-to-Ambient Transient Thermal Response Curve  
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
5
Dimensional Outline and Pad Layout  
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
6
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intended to be an exhaustive list of all such trademarks.  
®
®
Auto-SPM™  
Build it Now™  
CorePLUS™  
CorePOWER™  
CROSSVOLT™  
CTL™  
F-PFS™  
FRFET  
Global Power Resource  
Green FPS™  
Green FPS™ e-Series™  
Gmax™  
PowerTrench  
PowerXS™  
The Power Franchise  
®
®
SM  
Programmable Active Droop™  
®
QFET  
TinyBoost™  
TinyBuck™  
QS™  
Quiet Series™  
RapidConfigure™  
®
TinyLogic  
Current Transfer Logic™  
EcoSPARK  
GTO™  
IntelliMAX™  
®
TINYOPTO™  
TinyPower™  
TinyPWM™  
EfficentMax™  
ISOPLANAR™  
MegaBuck™  
MICROCOUPLER™  
MicroFET™  
EZSWITCH™ *  
Saving our world, 1mW /W /kW at a time™  
SmartMax™  
TinyWire™  
™*  
TriFault Detect™  
TRUECURRENT™*  
µSerDes™  
SMART START™  
®
MicroPak™  
SPM  
®
MillerDrive™  
MotionMax™  
Motion-SPM™  
STEALTH™  
SuperFET™  
SuperSOT™-3  
SuperSOT™-6  
SuperSOT™-8  
SupreMOS™  
SyncFET™  
Sync-Lock™  
®*  
®
Fairchild  
®
Fairchild Semiconductor  
FACT Quiet Series™  
®
®
OPTOLOGIC  
UHC  
®
®
FACT  
FAST  
OPTOPLANAR  
Ultra FRFET™  
UniFET™  
VCX™  
VisualMax™  
XS™  
®
®
FastvCore™  
FETBench™  
PDP SPM™  
Power-SPM™  
®
FlashWriter  
FPS™  
*
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.  
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Definition of Terms  
Datasheet Identification  
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Datasheet contains the design specifications for product development. Specifications  
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Datasheet contains preliminary data; supplementary data will be published at a later  
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First Production  
Datasheet contains final specifications. Fairchild Semiconductor reserves the right to  
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Obsolete  
Full Production  
Datasheet contains specifications on a product that is discontinued by Fairchild  
Semiconductor. The datasheet is for reference information only.  
Not In Production  
Rev. I40  
7
©2009 Fairchild Semiconductor Corporation  
FDG410NZ Rev.B  
www.fairchildsemi.com  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
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arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized  
application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
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