FDMS3602AS [ONSEMI]

不对称双 N 沟道,PowerTrench® 功率级 MOSFET,25V;
FDMS3602AS
型号: FDMS3602AS
厂家: ONSEMI    ONSEMI
描述:

不对称双 N 沟道,PowerTrench® 功率级 MOSFET,25V

开关 光电二极管 晶体管
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March 2011  
FDMS3602AS  
PowerTrench® Power Stage  
Asymmetric Dual N-Channel MOSFET  
Features  
General Description  
Q1: N-Channel  
This device includes two specialized N-Channel MOSFETs in a  
dual PQFN package. The switch node has been internally  
connected to enable easy placement and routing of synchronous  
buck converters. The control MOSFET (Q1) and synchronous  
SyncFET (Q2) have been designed to provide optimal power  
efficiency.  
„ Max rDS(on) = 5.6 mΩ at VGS = 10 V, ID = 15 A  
„ Max rDS(on) = 8.5 mΩ at VGS = 4.5 V, ID = 14 A  
Q2: N-Channel  
„ Max rDS(on) = 2.2 mΩ at VGS = 10 V, ID = 26 A  
„ Max rDS(on) = 3.4 mΩ at VGS = 4.5 V, ID = 22 A  
Applications  
„ Low inductance packaging shortens rise/fall times, resulting in  
lower switching losses  
„ Computing  
„ MOSFET integration enables optimum layout for lower circuit  
inductance and reduced switch node ringing  
„ Communications  
„ General Purpose Point of Load  
„ Notebook VCORE  
„ RoHS Compliant  
G1  
Pin 1  
D1  
D1  
D1  
Q2  
D1  
S2  
D1  
5
6
7
8
4
3
2
1
PHASE  
(S1/D2)  
PHASE  
D1  
D1  
S2  
S2  
G2  
G2  
S2  
S2  
G1  
Q1  
S2  
Bottom  
Top  
Power 56  
MOSFET Maximum Ratings TA = 25°C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Q1  
Q2  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
25  
±20  
30  
25  
±20  
V
V
(Note 3)  
Drain Current -Continuous (Package limited)  
-Continuous (Silicon limited)  
TC = 25 °C  
40  
T
C = 25 °C  
65  
151a  
135  
261b  
100  
1445  
2.51b  
1.01d  
ID  
A
-Continuous  
TA = 25 °C  
-Pulsed  
40  
EAS  
Single Pulse Avalanche Energy  
Power Dissipation for Single Operation  
Power Dissipation for Single Operation  
Operating and Storage Junction Temperature Range  
504  
2.21a  
1.01c  
mJ  
W
TA = 25°C  
TA = 25°C  
PD  
TJ, TSTG  
-55 to +150  
°C  
Thermal Characteristics  
RθJA  
RθJA  
RθJC  
Thermal Resistance, Junction to Ambient  
571a  
1251c  
3.5  
501b  
1201d  
2
Thermal Resistance, Junction to Ambient  
Thermal Resistance, Junction to Case  
°C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13”  
Tape Width  
Quantity  
22OA  
N7OC  
FDMS3602AS  
Power 56  
12 mm  
3000 units  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
1
www.fairchildsemi.com  
Electrical Characteristics TJ = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max Units  
Off Characteristics  
I
I
D = 250 μA, VGS = 0 V  
D = 1 mA, VGS = 0 V  
Q1  
Q2  
25  
25  
BVDSS  
Drain to Source Breakdown Voltage  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
ID = 250 μA, referenced to 25°C  
D = 10 mA, referenced to 25°C  
Q1  
Q2  
20  
20  
mV/°C  
I
Q1  
Q2  
1
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
VDS = 20 V, VGS = 0 V  
μA  
500  
Gate to Source Leakage Current,  
Forward  
Q1  
Q2  
100  
100  
nA  
nA  
V
GS = 20 V, VDS = 0 V  
On Characteristics  
V
V
GS = VDS, ID = 250 μA  
GS = VDS, ID = 1 mA  
Q1  
Q2  
1
1
1.8  
1.9  
3
3
VGS(th)  
Gate to Source Threshold Voltage  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
ID = 250 μA, referenced to 25°C  
D = 10 mA, referenced to 25°C  
VGS = 10 V, ID = 15 A  
Q1  
Q2  
-6  
-5  
mV/°C  
I
4.4  
6.2  
5.9  
5.6  
8.5  
8.7  
V
V
GS = 4.5 V, ID = 14 A  
GS = 10 V, ID = 15 A, TJ = 125°C  
Q1  
Q2  
rDS(on)  
Static Drain to Source On Resistance  
mΩ  
V
V
V
GS = 10 V, ID = 26 A  
GS = 4.5 V, ID = 22 A  
GS = 10 V, ID = 26 A, TJ = 125°C  
1.7  
2.6  
2.5  
2.2  
3.4  
3.9  
V
V
DD = 5 V, ID = 15 A  
DD = 5 V, ID = 26 A  
Q1  
Q2  
67  
132  
gFS  
Forward Transconductance  
S
Dynamic Characteristics  
Q1  
Q2  
1330 1770  
3260 4335  
Q1  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
pF  
pF  
pF  
Ω
VDS = 13 V, VGS = 0 V, f = 1 MHZ  
Q1  
Q2  
358  
892  
475  
1185  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
Q2  
VDS = 13 V, VGS = 0 V, f = 1 MHZ  
Q1  
Q2  
61  
90  
145  
220  
Q1  
Q2  
0.2  
0.2  
0.6  
0.9  
2
3
Switching Characteristics  
Q1  
Q2  
7.9  
12  
16  
22  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
ns  
ns  
Q1  
V
DD = 13 V, ID = 15 A, RGEN = 6 Ω  
Q1  
Q2  
2
4.2  
10  
10  
Q1  
Q2  
19  
31  
34  
50  
Q2  
Turn-Off Delay Time  
Fall Time  
ns  
V
DD = 13 V, ID = 26 A, RGEN = 6 Ω  
Q1  
Q2  
1.8  
3.2  
10  
10  
ns  
Q1  
Q2  
19  
45  
27  
64  
Qg(TOT)  
Qg(TOT)  
Qgs  
Total Gate Charge  
Total Gate Charge  
Gate to Source Charge  
Gate to Drain “Miller” Charge  
VGS = 0V to 10 V  
VGS = 0V to 4.5 V  
nC  
nC  
nC  
nC  
Q1  
DD = 13 V,  
D = 15 A  
V
I
Q1  
Q2  
9
21  
13  
30  
Q1  
Q2  
3.9  
9.1  
Q2  
V
DD = 13 V,  
Q1  
Q2  
2.4  
5.3  
I
D = 26 A  
Qgd  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
2
www.fairchildsemi.com  
Electrical Characteristics TJ = 25°C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Type  
Min  
Typ  
Max Units  
Drain-Source Diode Characteristics  
V
V
GS = 0 V, IS = 15 A  
GS = 0 V, IS = 26 A  
(Note 2) Q1  
(Note 2) Q2  
0.8  
0.8  
1.2  
V
VSD  
trr  
Source-Drain Diode Forward Voltage  
Reverse Recovery Time  
1.2  
Q1  
Q2  
21  
28  
34  
ns  
44  
Q1  
IF = 15 A, di/dt = 100 A/s  
Q2  
IF = 26 A, di/dt = 300 A/s  
Q1  
Q2  
6.6  
28  
13  
nC  
44  
Qrr  
Reverse Recovery Charge  
Notes:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R is determined  
θCA  
θJA  
θJC  
by the user's board design.  
b. 50 °C/W when mounted on  
a 1 in pad of 2 oz copper  
a. 57 °C/W when mounted on  
a 1 in pad of 2 oz copper  
2
2
c. 125 °C/W when mounted on a  
minimum pad of 2 oz copper  
d. 120 °C/W when mounted on a  
minimum pad of 2 oz copper  
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%.  
3. As an N-ch device, the negative Vgs rating is for low duty cycle pulse ocurrence only. No continuous rating is implied.  
o
4. E of 50 mJ is based on starting T = 25 C; N-ch: L = 1 mH, I = 10 A, V = 23 V, V = 10 V. 100% test at L= 0.3 mH, I = 15 A.  
AS  
J
AS  
DD  
GS  
AS  
o
5. E of 144 mJ is based on starting T = 25 C; N-ch: L = 1 mH, I = 17 A, V = 23 V, V = 10 V. 100% test at L= 0.3 mH, I = 25 A.  
AS  
J
AS  
DD  
GS  
AS  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
3
www.fairchildsemi.com  
Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted  
40  
30  
20  
10  
0
6
5
4
3
2
1
0
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
VGS = 4.5 V  
VGS = 3 V  
VGS = 4 V  
VGS = 3.5 V  
VGS = 3.5 V  
VGS = 4.5 V  
VGS = 4 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
V
= 3 V  
GS  
VGS = 10 V  
0
10  
20  
30  
40  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
ID, DRAIN CURRENT (A)  
Figure 1. On Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
1.6  
25  
ID = 15 A  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
1.4  
1.2  
1.0  
0.8  
0.6  
20  
15  
10  
5
ID = 15 A  
TJ = 125 oC  
TJ = 25 o  
C
0
-75 -50 -25  
0
25 50 75 100 125 150  
2
4
6
8
10  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 3. Normalized On Resistance  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
40  
40  
VGS = 0 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
10  
30  
20  
10  
0
TJ = 150 o  
C
TJ = 25 oC  
VDS = 5 V  
1
TJ = 150 o  
C
TJ = -55 o  
C
0.1  
TJ = 25 o  
C
0.01  
0.001  
TJ = -55 o  
C
1
2
3
4
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
4
www.fairchildsemi.com  
Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted  
10  
8
2000  
1000  
VDD = 10 V  
ID = 15 A  
Ciss  
VDD = 13 V  
Coss  
6
VDD = 16 V  
100  
4
Crss  
2
f = 1 MHz  
GS = 0 V  
V
0
10  
0
5
10  
Qg, GATE CHARGE (nC)  
15  
20  
0.1  
1
10  
25  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
20  
80  
60  
40  
20  
0
RθJC = 3.5 oC/W  
10  
VGS = 10 V  
TJ = 25 oC  
TJ = 100 oC  
VGS = 4.5 V  
TJ = 125 o  
C
Limited by Package  
1
0.01  
0.1  
1
10  
100  
25  
50  
75  
100  
125  
150  
TC, CASE TEMPERATURE (oC)  
t
AV, TIME IN AVALANCHE (ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Case Temperature  
100  
10  
1000  
SINGLE PULSE  
RθJA = 125 oC/W  
100 μs  
T
A = 25 oC  
100  
10  
1 ms  
10 ms  
1
THIS AREA IS  
100 ms  
LIMITED BY r  
DS(on)  
1s  
10s  
SINGLE PULSE  
TJ = MAX RATED  
0.1  
R
θJA = 125 oC/W  
A = 25 oC  
DC  
1
T
0.01  
0.01  
0.5  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
1
10  
100 1000  
0.1  
1
10  
100  
200  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 11. Forward Bias Safe  
Operating Area  
Figure12. Single Pulse Maximum  
Power Dissipation  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
5
www.fairchildsemi.com  
Typical Characteristics (Q1 N-Channel) TJ = 25°C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.01  
0.1  
P
0.05  
0.02  
0.01  
DM  
t
1
SINGLE PULSE  
θJA = 125 oC/W  
t
2
R
NOTES:  
DUTY FACTOR: D = t /t  
1
2
(Note 1c)  
PEAK T = P  
J
x Z  
x R  
+ T  
θJA A  
DM  
θJA  
0.001  
10-4  
10-3  
10-2  
10-1  
1
10  
100  
1000  
t, RECTANGULAR PULSE DURATION (sec)  
Figure 13. Junction-to-Ambient Transient Thermal Response Curve  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
6
www.fairchildsemi.com  
Typical Characteristics (Q2 N-Channel) TJ = 25 °C unless otherwise noted  
100  
80  
60  
40  
20  
0
8
6
4
2
0
VGS = 10 V  
VGS = 4.5 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 3 V  
VGS = 4 V  
VGS = 3.5 V  
VGS = 3.5 V  
VGS = 4 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 3 V  
VGS = 10 V  
80 100  
VGS = 4.5 V  
60  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
0
20  
40  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 14. On- Region Characteristics  
Figure 15. Normalized on-Resistance vs Drain  
Current and Gate Voltage  
1.6  
12  
ID = 26 A  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
10  
1.4  
1.2  
1.0  
0.8  
ID = 26 A  
8
6
TJ = 125 oC  
4
2
TJ = 25 o  
C
0
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 17. On-Resistance vs Gate to  
Source Voltage  
Figure 16. Normalized On-Resistance  
vs Junction Temperature  
100  
200  
100  
VGS = 0 V  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
80  
60  
40  
20  
0
VDS = 5 V  
TJ = 125 o  
C
TJ = 125 o  
C
10  
1
TJ = 25 o  
C
TJ = 25 oC  
TJ = -55 o  
C
TJ = -55 o  
C
0.1  
1.5  
2.0  
2.5  
3.0  
3.5  
4.0  
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 18. Transfer Characteristics  
Figure 19. Source to Drain Diode  
Forward Voltage vs Source Current  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
7
www.fairchildsemi.com  
Typical Characteristics (Q2 N-Channel) TJ = 25°C unless otherwise noted  
10  
8
10000  
ID = 26 A  
Ciss  
VDD = 10 V  
Coss  
6
1000  
VDD = 13 V  
4
VDD = 16 V  
Crss  
2
f = 1 MHz  
VGS = 0 V  
100  
50  
0
25  
0.1  
1
10  
0
10  
20  
30  
40  
50  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Q , GATE CHARGE (nC)  
g
Figure 21. Capacitance vs Drain  
to Source Voltage  
Figure 20. Gate Charge Characteristics  
50  
150  
120  
90  
RθJC = 2 oC/W  
VGS = 10 V  
TJ = 25 oC  
10  
TJ = 100 oC  
VGS = 4.5 V  
60  
TJ = 125 o  
C
30  
Limited by Package  
1
0.01  
0
0.1  
1
10  
100 300  
25  
50  
75  
100  
125  
150  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure 22. Unclamped Inductive  
Switching Capability  
Figure 23. Maximum Continuous Drain  
Current vs Case Temperature  
200  
100  
10000  
100 μs  
SINGLE PULSE  
RθJC = 2 oC/W  
1000  
100  
10  
1 ms  
10  
1
10 ms  
THIS AREA IS  
LIMITED BY r  
100 ms  
DS(on)  
1s  
SINGLE PULSE  
TJ = MAX RATED  
RθJA = 120 oC/W  
10s  
DC  
0.1  
T
A = 25 oC  
0.01  
1
0.01  
0.1  
1
10  
100200  
10-4  
10-3  
10-2  
t, PULSE WIDTH (sec)  
10-1  
1
10  
100 1000  
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 24. Forward Bias Safe  
Operating Area  
Figure 25. Single Pulse Maximum Power  
Dissipation  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
8
www.fairchildsemi.com  
Typical Characteristics (Q2 N-Channel) TJ = 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.1  
P
DM  
0.05  
0.02  
0.01  
0.001  
0.01  
t
1
t
2
SINGLE PULSE  
θJA = 120 oC/W  
NOTES:  
DUTY FACTOR: D = t /t  
R
1
2
PEAK T = P  
J
x Z  
x R  
+ T  
θJA A  
(Note 1d)  
DM  
θJA  
0.0001  
10-4  
10-3  
10-2  
10-1  
t, RECTANGULAR PULSE DURATION (sec)  
1
10  
100  
1000  
Figure 26. Junction-to-Ambient Transient Thermal Response Curve  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
9
www.fairchildsemi.com  
Typical Characteristics (continued)  
SyncFET Schottky body diode  
Characteristics  
Schottky barrier diodes exhibit significant leakage at high tem-  
perature and high reverse voltage. This will increase the power  
in the device.  
Fairchild’s SyncFET process embeds a Schottky diode in parallel  
with PowerTrench MOSFET. This diode exhibits similar  
characteristics to a discrete external Schottky diode in parallel  
with  
a MOSFET. Figure 27 shows the reverse recovery  
characteristic of the FDMS3602AS.  
10-2  
30  
25  
20  
TJ = 125 o  
C
10-3  
10-4  
10-5  
10-6  
TJ = 100 o  
C
di/dt = 300 A/μs  
15  
10  
5
TJ = 25 o  
C
0
-5  
0
5
10  
15  
20  
25  
0
50  
100  
TIME (ns)  
150  
200  
250  
VDS, REVERSE VOLTAGE (V)  
Figure 27. FDMS3602AS SyncFET body  
diode reverse recovery characteristic  
Figure 28. SyncFET body diode reverse  
leakage versus drain-source voltage  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
10  
www.fairchildsemi.com  
Application Information  
1. Switch Node Ringing Suppression  
Fairchild’s Power Stage products incorporate a proprietary design* that minimizes the peak overshoot, ringing voltage on the switch  
node (PHASE) without the need of any external snubbing components in a buck converter. As shown in the figure 29, the Power Stage  
solution rings significantly less than competitor solutions under the same set of test conditions.  
Power Stage Device  
Competitors solution  
Figure 29. Power Stage phase node rising edge, High Side Turn on  
*Patent Pending  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
11  
www.fairchildsemi.com  
Figure 30. Shows the Power Stage in a buck converter topology  
2. Recommended PCB Layout Guidelines  
As a PCB designer, it is necessary to address critical issues in layout to minimize losses and optimize the performance of the power  
train. Power Stage is a high power density solution and all high current flow paths, such as VIN (D1), PHASE (S1/D2) and GND (S2),  
should be short and wide for better and stable current flow, heat radiation and system performance. A recommended layout proce-  
dure is discussed below to maximize the electrical and thermal performance of the part.  
Figure 31. Recommended PCB Layout  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
12  
www.fairchildsemi.com  
Following is a guideline, not a requirement which the PCB designer should consider:  
1. Input ceramic bypass capacitors C1 and C2 must be placed close to the D1 and S2 pins of Power Stage to help reduce parasitic  
inductance and high frequency conduction loss induced by switching operation. C1 and C2 show the bypass capacitors placed close  
to the part between D1 and S2. Input capacitors should be connected in parallel close to the part. Multiple input caps can be connected  
depending upon the application.  
2. The PHASE copper trace serves two purposes; In addition to being the current path from the Power Stage package to the output  
inductor (L), it also serves as heat sink for the lower FET in the Power Stage package. The trace should be short and wide enough to  
present a low resistance path for the high current flow between the Power Stage and the inductor. This is done to minimize conduction  
losses and limit temperature rise. Please note that the PHASE node is a high voltage and high frequency switching node with high  
noise potential. Care should be taken to minimize coupling to adjacent traces. The reference layout in figure 31 shows a good balance  
between the thermal and electrical performance of Power Stage.  
3. Output inductor location should be as close as possible to the Power Stage device for lower power loss due to copper trace  
resistance. A shorter and wider PHASE trace to the inductor reduces the conduction loss. Preferably the Power Stage should be  
directly in line (as shown in figure 31) with the inductor for space savings and compactness.  
4. The PowerTrench® Technology MOSFETs used in the Power Stage are effective at minimizing phase node ringing. It allows the  
part to operate well within the breakdown voltage limits. This eliminates the need to have an external snubber circuit in most cases. If  
the designer chooses to use an RC snubber, it should be placed close to the part between the PHASE pad and S2 pins to dampen  
the high-frequency ringing.  
5. The driver IC should be placed close to the Power Stage part with the shortest possible paths for the High Side gate and Low Side  
gates through a wide trace connection. This eliminates the effect of parasitic inductance and resistance between the driver and the  
MOSFET and turns the devices on and off as efficiently as possible. At higher-frequency operation this impedance can limit the gate  
current trying to charge the MOSFET input capacitance. This will result in slower rise and fall times and additional switching losses.  
Power Stage has both the gate pins on the same side of the package which allows for back mounting of the driver IC to the board. This  
provides a very compact path for the drive signals and improves efficiency of the part.  
6. S2 pins should be connected to the GND plane with multiple vias for a low impedance grounding. Poor grounding can create a noise  
transient offset voltage level between S2 and driver ground. This could lead to faulty operation of the gate driver and MOSFET.  
7. Use multiple vias on each copper area to interconnect top, inner and bottom layers to help smooth current flow and heat conduction.  
Vias should be relatively large, around 8 mils to 10 mils, and of reasonable inductance. Critical high frequency components such as  
ceramic bypass caps should be located close to the part and on the same side of the PCB. If not feasible, they should be connected  
from the backside via a network of low inductance vias.  
©2011 Fairchild Semiconductor Corporation  
FDMS3602AS Rev.C4  
13  
www.fairchildsemi.com  
4.00  
C
L
5.10  
4.90  
0.10 C  
A
1.27 TYP  
0.65 TYP  
(2X)  
PKG  
B
C
L
8
5
8
6
7
5
0.63  
2.15  
2.52  
1.60  
KEEP OUT AREA  
6.25  
5.90  
C
PKG  
C
L
0.00  
L
4.16  
1.21  
2.13  
2.31  
3.15  
1
4
0.10 C  
(2X)  
2
4
1
3
PIN # 1  
INDICATOR  
0.63  
0.59  
TOP VIEW  
3.18  
5.10  
SEE  
DETAIL A  
RECOMMENDED LAND PATTERN  
FOR SAWN / PUNCHED TYPE  
SIDE VIEW  
0.10  
0.05  
C A B  
C
0.10 C  
3.16  
2.80  
0.65  
0.38  
0.70  
0.36  
8X  
0.45  
0.25  
(6X)  
0.08 C  
1.34  
1.12  
C
0.05  
0.00  
1
2
3
0.35  
0.15  
4
1.10  
0.90  
SEATING  
PLANE  
0.66±.05  
(SCALE: 2X)  
2.25  
2.05  
4.08  
3.70  
1.02  
0.82  
0.65  
0.38  
8
7
6
5
0.44  
0.24  
0.61  
0.31 (8X)  
1.27  
3.81  
BOTTOM VIEW  
5.10  
4.90  
0.10 C  
(2X)  
SEE  
0.35  
0.15  
PKG  
DETAIL B  
C
L
5
8
0.28  
0.08  
10°  
6.25  
5.90  
5.90  
5.70  
PKG  
C
L
(SCALE: 2X)  
0.10 C  
1
4
(2X)  
0.41  
0.21  
(8X)  
TOP VIEW  
5.00  
4.80  
SEE  
0.10 C  
0.08 C  
DETAIL C  
0.35  
0.15  
8X  
C
SIDE VIEW  
SEATING  
PLANE  
1.10  
0.90  
(SCALE: 2X)  
0.10  
0.05  
C A B  
3.16  
2.80  
0.70  
0.36  
0.65  
0.38  
C
0.45  
0.25  
(6X)  
1
2
3
1.34  
1.12  
4
NOTES: UNLESS OTHERWISE SPECIFIED  
A) PACKAGE STANDARD REFERENCE:  
0.66±.05  
JEDEC REGISTRATION, MO-240, VARIATION AA.  
B) ALL DIMENSIONS ARE IN MILLIMETERS.  
C) DIMENSIONS DO NOT INCLUDE BURRS OR  
MOLD FLASH. MOLD FLASH OR BURRS DOES  
NOT EXCEED 0.10MM.  
2.25  
2.05  
4.08  
3.70  
D) DIMENSIONING AND TOLERANCING PER  
ASME Y14.5M-1994.  
E) IT IS RECOMMENDED TO HAVE NO TRACES  
OR VIAS WITHIN THE KEEP OUT AREA.  
F) DRAWING FILE NAME: PQFN08EREV6.  
G) FAIRCHILD SEMICONDUCTOR  
1.02  
0.82  
0.65  
0.38  
6
8
7
5
0.61  
0.44  
0.24  
(8X)  
0.31  
1.27  
3.81  
BOTTOM VIEW  
ON Semiconductor and  
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent  
coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
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