FDMS7578 [ONSEMI]

N 沟道,Power Trench® MOSFET,25V,60A,5.8mΩ;
FDMS7578
型号: FDMS7578
厂家: ONSEMI    ONSEMI
描述:

N 沟道,Power Trench® MOSFET,25V,60A,5.8mΩ

开关 脉冲 光电二极管 晶体管
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October 2014  
FDMS7578  
N-Channel Power Trench® MOSFET  
25 V,60 A, 5.8 mΩ  
Features  
General Description  
„ Max rDS(on) = 5.8 mΩ at VGS = 10 V, ID = 17 A  
„ Max rDS(on) = 8 mΩ at VGS = 4.5 V, ID = 14 A  
This N-Channel MOSFET has been designed specifically to  
improve the overall efficiency and to minimize switch node  
ringing of DC/DC converters using either synchronous or  
conventional switching PWM controllers. It has been optimized  
for low gate charge, low rDS(on), fast switching speed and body  
diode reverse recovery performance.  
„ Advanced Package and Silicon combination for low rDS(on)  
and high efficiency  
„ Next generation enhanced body diode technology, engineered  
for soft recovery  
Applications  
„ MSL1 robust package design  
„ 100% UIL tested  
„ Control MOSFET for Synchronous Buck Converters  
„ Notebook  
„ RoHS Compliant  
„ Server  
„ Telecomm  
„ High Efficiency DC-DC Switch Mode Power Supplies  
Bottom  
Top  
Pin 1  
S
G
S
S
S
D
D
D
D
5
6
7
8
4
3
S
S
G
2
1
D
D
D
D
Power 56  
MOSFET Maximum Ratings TA = 25 °C unless otherwise noted  
Symbol  
VDS  
VGS  
Parameter  
Ratings  
Units  
Drain to Source Voltage  
Gate to Source Voltage  
Drain Current -Continuous  
-Continuous  
25  
V
V
(Note 4)  
±20  
TC = 25 °C  
TA = 25 °C  
60  
ID  
(Note 1a)  
(Note5)  
17  
A
-Pulsed  
90  
EAS  
Single Pulse Avalanche Energy  
Power Dissipation  
(Note 3)  
40  
33  
mJ  
W
TC = 25 °C  
TA = 25 °C  
PD  
Power Dissipation  
(Note 1a)  
2.5  
TJ, TSTG  
Operating and Storage Junction Temperature Range  
-55 to +150  
°C  
Thermal Characteristics  
RθJC  
RθJA  
Thermal Resistance, Junction to Case  
Thermal Resistance, Junction to Ambient  
3.7  
50  
°C/W  
(Note 1a)  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
13 ’’  
Tape Width  
12 mm  
Quantity  
FDMS7578  
FDMS7578  
Power 56  
3000 units  
1
©2009 Fairchild Semiconductor Corporation  
FDMS7578 Rev.C2  
www.fairchildsemi.com  
Electrical Characteristics TJ = 25 °C unless otherwise noted  
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
BVDSS  
Drain to Source Breakdown Voltage  
ID = 250 μA, VGS = 0 V  
25  
V
ΔBVDSS  
ΔTJ  
Breakdown Voltage Temperature  
Coefficient  
ID = 250 μA, referenced to 25 °C  
VDS = 20 V, VGS = 0 V  
20  
mV/°C  
IDSS  
IGSS  
Zero Gate Voltage Drain Current  
1
μA  
Gate to Source Leakage Current,Forward VGS = 20 V, VDS = 0 V  
100  
nA  
On Characteristics  
VGS(th)  
Gate to Source Threshold Voltage  
VGS = VDS, ID = 250 μA  
D = 250 μA, referenced to 25 °C  
GS = 10 V, ID = 17 A  
1.0  
1.6  
-6  
3.0  
V
ΔVGS(th)  
ΔTJ  
Gate to Source Threshold Voltage  
Temperature Coefficient  
I
mV/°C  
V
4.6  
6.3  
6.7  
77  
5.8  
8
rDS(on)  
gFS  
Static Drain to Source On Resistance  
Forward Transconductance  
VGS = 4.5 V, ID = 14 A  
mΩ  
VGS = 10 V, ID = 17 A, TJ = 125 °C  
VDD = 5 V, ID = 17 A  
8.5  
S
Dynamic Characteristics  
Ciss  
Coss  
Crss  
Rg  
Input Capacitance  
1221  
371  
54  
1625  
495  
85  
pF  
pF  
pF  
Ω
VDS = 13 V, VGS = 0 V,  
f = 1 MHz  
Output Capacitance  
Reverse Transfer Capacitance  
Gate Resistance  
1.2  
2.4  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Turn-On Delay Time  
Rise Time  
8
17  
10  
33  
10  
25  
11  
ns  
ns  
2.6  
20  
2.2  
18  
8
V
DD = 13 V, ID = 17 A,  
VGS = 10 V, RGEN = 6 Ω  
Turn-Off Delay Time  
Fall Time  
ns  
ns  
Total Gate Charge  
Total Gate Charge  
Total Gate Charge  
Gate to Drain “Miller” Charge  
VGS = 0 V to 10 V  
nC  
nC  
nC  
nC  
Qg(TOT)  
V
GS = 0 V to 4.5 V  
V
DD = 13 V  
ID = 17 A  
Qgs  
Qgd  
3.7  
1.7  
Drain-Source Diode Characteristics  
V
GS = 0 V, IS = 2 A  
(Note 2)  
(Note 2)  
0.72  
0.83  
20  
1.1  
1.2  
32  
12  
34  
24  
VSD  
Source to Drain Diode Forward Voltage  
V
VGS = 0 V, IS = 17 A  
trr  
Reverse Recovery Time  
Reverse Recovery Charge  
Reverse Recovery Time  
Reverse Recovery Charge  
ns  
nC  
ns  
IF = 17 A, di/dt = 100 A/μs  
Qrr  
trr  
6
19  
IF = 17 A, di/dt = 300 A/μs  
Qrr  
13  
nC  
NOTES:  
2
1. R  
is determined with the device mounted on a 1 in pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R  
is guaranteed by design while R  
is determined by  
θCA  
θJA  
θJC  
the user's board design.  
a. 50 °C/W when mounted on  
a 1 in pad of 2 oz copper  
b.125 °C/W when mounted on  
a minimum pad of 2 oz copper  
2
2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %.  
3. E of 40 mJ is based on starting T = 25 °C, L = 1 mH, I = 9 A, V = 23 V, V = 10 V. 100% test at L = 0.3 mH, I = 14 A.  
AS  
J
AS  
DD  
GS  
AS  
4. As an N-ch device, the negative Vgs rating is for low duty cycle pulse occurrence only. No continuous rating is implied.  
5. Pulse Id refers to Figure.11 Forward Bias Safe Operation Area.  
©2009 Fairchild Semiconductor Corporation  
FDMS7578 Rev.C2  
www.fairchildsemi.com  
2
Typical Characteristics TJ = 25 °C unless otherwise noted  
90  
12  
10  
8
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 10 V  
VGS = 2.5 V  
75  
VGS = 3.5 V  
VGS = 4.5 V  
VGS = 3 V  
60  
45  
30  
15  
0
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
VGS = 3 V  
6
VGS = 3.5 V  
4
VGS = 10 V  
VGS = 4.5 V  
2
VGS = 2.5 V  
0
0
0.5  
1.0  
1.5  
2.0  
2.5  
3.0  
0
15  
30  
45  
60  
75  
90  
ID, DRAIN CURRENT (A)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 1. On-Region Characteristics  
Figure2. N o r m a l i z e d O n - R e s i s ta n c e  
vs Drain Current and Gate Voltage  
20  
1.6  
ID = 17 A  
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
1.5  
1.4  
1.3  
1.2  
1.1  
1.0  
0.9  
0.8  
0.7  
ID = 17 A  
VGS = 10 V  
15  
10  
5
TJ = 125 o  
C
TJ = 25 o  
C
0
2
4
6
8
10  
-75 -50 -25  
0
25 50 75 100 125 150  
TJ, JUNCTION TEMPERATURE (oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
F i gu re 3 . N orma li zed On - Res is ta nc e  
vs Junction Temperature  
Figure4. On-Resistance vs Gate to  
Source Voltage  
90  
10  
90  
VGS = 0 V  
VDS = 5 V  
75  
60  
45  
30  
15  
0
TJ = 150 o  
C
TJ = 25 oC  
TJ = 25 o  
C
1
0.1  
TJ = 150 o  
C
TJ = -55 o  
C
TJ = -55 o  
C
PULSE DURATION = 80 μs  
DUTY CYCLE = 0.5% MAX  
0.01  
1
2
3
4
5
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VGS, GATE TO SOURCE VOLTAGE (V)  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
Figure 5. Transfer Characteristics  
Figure6. Source to Drain Diode  
Forward Voltage vs Source Current  
©2009 Fairchild Semiconductor Corporation  
FDMS7578 Rev.C2  
www.fairchildsemi.com  
3
Typical Characteristics TJ = 25 °C unless otherwise noted  
10  
5000  
1000  
ID = 17 A  
8
Ciss  
VDD = 16 V  
VDD = 10 V  
6
4
2
0
VDD = 13 V  
Coss  
100  
10  
Crss  
f = 1 MHz  
= 0 V  
V
GS  
0
5
10  
15  
20  
0.1  
1
10  
25  
Qg, GATE CHARGE (nC)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 7. Gate Charge Characteristics  
Figure8. C a p a c i t a n c e v s D r a i n  
to Source Voltage  
80  
60  
40  
20  
0
50  
TJ = 25 oC  
TJ = 100 oC  
VGS = 10 V  
10  
TJ = 125 o  
C
Limited by Package  
RθJC = 3.7 oC/W  
VGS = 4.5 V  
1
0.01  
25  
50  
75  
100  
125  
150  
0.1  
1
10  
100  
TC, CASE TEMPERATURE (oC)  
tAV, TIME IN AVALANCHE (ms)  
Figure9. U n c l a m p e d I n d u c t i v e  
Switching Capability  
Figure10. Maximum Continuous Drain  
Current vs Case Temperature  
105  
500  
100  
SINGLE PULSE  
θJC = 3.7 oC/W  
TC = 25 oC  
R
104  
103  
102  
101  
10  
1
THIS AREA IS  
LIMITED BY rDS(on)  
100 μs  
SINGLE PULSE  
TJ = MAX RATED  
1 ms  
10 ms  
DC  
R
θJC = 3.7 oC/W  
TC = 25 oC  
CURVE BENT TO  
MEASURED DATA  
0.1  
10-6  
10-5  
10-4  
t, PULSE WIDTH (sec)  
10-3  
10-2  
10-1  
0.1  
1
10  
100  
1
VDS, DRAIN to SOURCE VOLTAGE (V)  
Figure 11. Forward Bias Safe  
Operating Area  
Figure12. Single Pulse Maximum  
Power Dissipation  
©2009 Fairchild Semiconductor Corporation  
FDMS7578 Rev.C2  
www.fairchildsemi.com  
4
Typical Characteristics TJ = 25 °C unless otherwise noted  
2
DUTY CYCLE-DESCENDING ORDER  
1
D = 0.5  
0.2  
0.1  
0.1  
0.01  
0.05  
0.02  
0.01  
P
DM  
t
1
t
2
SINGLE PULSE  
RθJC = 3.7 oC/W  
NOTES:  
DUTY FACTOR: D = t /t  
1
2
PEAK T = P  
x Z  
x R  
+ T  
J
DM  
θJC  
θJC C  
0.001  
10-6  
10-5  
10-4  
10-3  
10-2  
10-1  
1
t, RECTANGULAR PULSE DURATION (sec)  
Figure 13. Transient Thermal Response Curve  
©2009 Fairchild Semiconductor Corporation  
FDMS7578 Rev.C2  
www.fairchildsemi.com  
5
PQFN8 5X6, 1.27P  
CASE 483AE  
ISSUE A  
5.10  
3.91  
5.10  
PKG  
A
SEE  
DETAIL B  
1.27  
6.61  
C
L
B
8
7
6
5
8
5
0.77  
4.52  
3.75  
5.85  
5.65  
C
PKG  
6.15  
L
KEEP OUT  
AREA  
1.27  
1
4
1
2
3
4
TOP VIEW  
0.61  
1.27  
3.81  
LAND PATTERN  
RECOMMENDATION  
OPTIONAL DRAFT  
ANGLE MAY APPEAR  
ON FOUR SIDES  
SEE  
DETAIL C  
5.00  
4.80  
OF THE PACKAGE  
0.35  
0.15  
ꢀƒꢁꢂꢃƒ  
0.10 C  
0.30  
0.05  
0.05  
0.00  
SIDE VIEW  
ꢀƒꢁꢂꢃƒ  
8X  
0.08 C  
C
0.35  
0.15  
5.20  
4.80  
1.10  
0.90  
SEATING  
PLANE  
DETAIL C  
DETAIL B  
SCALE: 2:1  
3.81  
SCALE: 2:1  
1.27  
0.51  
(8X)  
0.31  
NOTES: UNLESS OTHERWISE SPECIFIED  
(0.34)  
A. PACKAGE STANDARD REFERENCE: JEDEC MO-240,  
ISSUE A, VAR. AA,.  
0.10  
C A B  
1
2
3
4
B. DIMENSIONS DO NOT INCLUDE BURRS OR MOLD FLASH.  
MOLD FLASH OR BURRS DOES NOT EXCEED 0.10MM.  
C. ALL DIMENSIONS ARE IN MILLIMETERS.  
0.76  
0.51  
(0.52)  
D. DIMENSIONING AND TOLERANCING PER ASME Y14.5M-2009.  
E. IT IS RECOMMENDED TO HAVE NO TRACES OR  
VIAS WITHIN THE KEEP OUT AREA.  
6.25  
5.90  
+0.30  
3.48  
-0.10  
(0.50)  
(0.30)  
(2X)  
8
7
6
5
ꢀꢄꢅꢅ“ꢀꢄꢂꢀ  
+0.10  
-0.15  
0.20  
(8X)  
3.96  
3.61  
BOTTOM VIEW  
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are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.  
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coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.  
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arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.  
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,  
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer  
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not  
designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification  
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application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and  
expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such  
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