FDP8870 [ONSEMI]

N 沟道 PowerTrench® MOSFET 30V,156A,4.1mΩ;
FDP8870
型号: FDP8870
厂家: ONSEMI    ONSEMI
描述:

N 沟道 PowerTrench® MOSFET 30V,156A,4.1mΩ

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May 2008  
FDP8870  
N-Channel PowerTrench MOSFET  
tmM  
®
30V, 156A, 4.1mΩ  
General Description  
Features  
This N-Channel MOSFET has been designed specifically to  
improve the overall efficiency of DC/DC converters using  
either synchronous or conventional switching PWM  
controllers. It has been optimized for low gate charge, low  
r
= 4.1m, V = 10V, I = 35A  
GS D  
DS(ON)  
r
= 4.6m, V = 4.5V, I = 35A  
DS(ON)  
GS  
D
High performance trench technology for extremely low  
r
r
and fast switching speed.  
DS(ON)  
DS(ON)  
Low gate charge  
Applications  
High power and current handling capability  
DC/DC converters  
RoHS Compliant  
(FLANGE)  
DRAIN  
D
S
SOURCE  
DRAIN  
GATE  
G
TO-220AB  
FDP SERIES  
MOSFET Maximum Ratings T = 25°C unless otherwise noted  
C
Symbol  
Parameter  
Ratings  
30  
Units  
V
V
Drain to Source Voltage  
Gate to Source Voltage  
V
V
DSS  
GS  
±20  
Drain Current  
o
156  
147  
A
A
Continuous (T = 25 C, V = 10V) (Note 1)  
C
GS  
o
I
Continuous (T = 25 C, V = 4.5V) (Note 1)  
C GS  
D
o
o
Continuous (T  
= 25 C, V = 10V, with R = 62 C/W)  
θJA  
19  
A
amb  
GS  
Pulsed  
Figure 4  
300  
A
E
P
Single Pulse Avalanche Energy (Note 2)  
Power dissipation  
mJ  
W
AS  
160  
D
o
o
Derate above 25 C  
1.07  
W/ C  
o
T , T  
Operating and Storage Temperature  
-55 to 175  
C
J
STG  
Thermal Characteristics  
o
R
R
Thermal Resistance Junction to Case TO-220  
Thermal Resistance Junction to Ambient TO-220 ( Note 3)  
0.94  
62  
C/W  
θJC  
θJA  
o
C/W  
Package Marking and Ordering Information  
Device Marking  
Device  
Package  
Reel Size  
Tape Width  
N/A  
Quantity  
50 units  
FDP8870  
FDP8870  
TO-220AB  
Tube  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
Electrical Characteristics T = 25°C unless otherwise noted  
C
Symbol  
Parameter  
Test Conditions  
Min  
Typ  
Max  
Units  
Off Characteristics  
B
Drain to Source Breakdown Voltage  
Zero Gate Voltage Drain Current  
Gate to Source Leakage Current  
I
= 250µA, V = 0V  
30  
-
-
-
-
-
-
V
VDSS  
D
GS  
V
V
V
= 24V  
= 0V  
1
DS  
GS  
GS  
I
I
µA  
nA  
DSS  
o
T
= 150 C  
-
250  
±100  
C
= ±20V  
-
GSS  
On Characteristics  
V
Gate to Source Threshold Voltage  
V
= V , I = 250µA  
1.2  
-
2.5  
V
GS(TH)  
GS  
DS  
D
I
I
I
= 35A, V = 10V  
-
-
0.0034 0.0041  
0.0040 0.0046  
D
D
D
GS  
= 35A, V = 4.5V  
GS  
r
Drain to Source On Resistance  
DS(ON)  
= 35A, V = 10V,  
GS  
-
0.0051 0.0065  
o
T = 175 C  
J
Dynamic Characteristics  
C
C
C
R
Input Capacitance  
-
-
-
-
-
-
-
-
-
-
5200  
970  
570  
2.1  
106  
56  
-
pF  
pF  
pF  
ISS  
OSS  
RSS  
G
V
= 15V, V = 0V,  
GS  
DS  
Output Capacitance  
-
f = 1MHz  
Reverse Transfer Capacitance  
Gate Resistance  
-
-
V
V
V
V
= 0.5V, f = 1MHz  
= 0V to 10V  
GS  
GS  
GS  
GS  
Q
Q
Q
Q
Q
Q
Total Gate Charge at 10V  
Total Gate Charge at 5V  
Threshold Gate Charge  
Gate to Source Gate Charge  
Gate Charge Threshold to Plateau  
Gate to Drain MillerCharge  
132  
69  
6.5  
-
nC  
nC  
nC  
nC  
nC  
nC  
g(TOT)  
g(5)  
g(TH)  
gs  
= 0V to 5V  
V
= 15V  
DD  
= 35A  
= 0V to 1V  
5.0  
15  
I
D
I = 1.0mA  
g
10  
-
gs2  
23  
-
gd  
Switching Characteristics (V = 10V)  
GS  
t
t
t
t
t
t
Turn-On Time  
Turn-On Delay Time  
Rise Time  
-
-
-
-
-
-
-
11  
105  
70  
46  
-
168  
ns  
ns  
ns  
ns  
ns  
ns  
ON  
-
d(ON)  
-
V
V
= 15V, I = 35A  
r
DD  
GS  
D
= 4.5V, R = 3.3Ω  
Turn-Off Delay Time  
Fall Time  
-
-
GS  
d(OFF)  
f
Turn-Off Time  
173  
OFF  
Drain-Source Diode Characteristics  
I
I
I
I
= 35A  
= 15A  
-
-
-
-
-
-
-
-
1.25  
1.0  
37  
V
V
SD  
SD  
SD  
SD  
V
Source to Drain Diode Voltage  
SD  
t
Reverse Recovery Time  
= 35A, dI /dt = 100A/µs  
ns  
nC  
rr  
SD  
Q
Reverse Recovered Charge  
= 35A, dI /dt = 100A/µs  
21  
RR  
SD  
Notes:  
1: Package current limitation is 80A.  
2: Starting T = 25°C, L = 0.15mH, I = 64A, V = 27V, V = 10V.  
J
AS  
DD  
GS  
3: Pulse width = 100s.  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
Typical Characteristics T = 25°C unless otherwise noted  
C
1.2  
175  
1.0  
0.8  
0.6  
0.4  
0.2  
0
150  
125  
100  
75  
CURRENT LIMITED  
BY PACKAGE  
50  
25  
0
0
25  
50  
75  
100  
150  
175  
125  
o
25  
50  
75  
100  
125  
150  
175  
T
, CASE TEMPERATURE ( C)  
o
C
T
, CASE TEMPERATURE ( C)  
C
Figure 1. Normalized Power Dissipation vs Case  
Temperature  
Figure 2. Maximum Continuous Drain Current vs  
Case Temperature  
2
DUTY CYCLE - DESCENDING ORDER  
0.5  
0.2  
1
0.1  
0.05  
0.02  
0.01  
P
DM  
0.1  
t
1
t
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
SINGLE PULSE  
0.01  
PEAK T = P  
x Z  
x R  
+ T  
θJC C  
J
DM  
θJC  
-5  
-4  
-3  
-2  
-1  
0
1
10  
10  
10  
10  
t, RECTANGULAR PULSE DURATION (s)  
10  
10  
10  
Figure 3. Normalized Maximum Transient Thermal Impedance  
1000  
o
T
= 25 C  
C
TRANSCONDUCTANCE  
MAY LIMIT CURRENT  
IN THIS REGION  
FOR TEMPERATURES  
o
ABOVE 25 C DERATE PEAK  
CURRENT AS FOLLOWS:  
V
= 4.5V  
GS  
175 - T  
150  
C
I = I  
25  
100  
50  
-5  
-4  
-3  
-2  
-1  
0
1
10  
10  
10  
10  
t, PULSE WIDTH (s)  
10  
10  
10  
Figure 4. Peak Current Capability  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
Typical Characteristics T = 25°C unless otherwise noted  
C
1000  
100  
10  
500  
If R = 0  
= (L)(I )/(1.3*RATED BV  
t
- V  
DD  
)
AV  
10µs  
AS  
DSS  
If R 0  
= (L/R)ln[(I *R)/(1.3*RATED BV  
t
AV  
- V ) +1]  
DD  
AS  
DSS  
100  
100µs  
o
STARTING T = 25 C  
J
OPERATION IN THIS  
AREA MAY BE  
10  
LIMITED BY r  
1ms  
DS(ON)  
10ms  
DC  
1
o
STARTING T = 150 C  
J
SINGLE PULSE  
T
= MAX RATED  
J
o
T
= 25 C  
C
0.1  
1
0.01  
0.1  
1
10  
100  
1
10  
, DRAIN TO SOURCE VOLTAGE (V)  
60  
V
t , TIME IN AVALANCHE (ms)  
AV  
DS  
NOTE: Refer to Fairchild Application Notes AN7514 and AN7515  
Figure 6. Unclamped Inductive Switching  
Capability  
Figure 5. Forward Bias Safe Operating Area  
160  
160  
PULSE DURATION = 80µs  
V
= 5V  
GS  
DUTY CYCLE = 0.5% MAX  
V
= 15V  
V
= 4V  
DD  
GS  
120  
80  
40  
0
120  
80  
40  
0
V
= 10V  
o
GS  
T
= 175 C  
J
V
= 3V  
GS  
o
T
= 25 C  
J
o
T
= 25 C  
C
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5% MAX  
o
T
= -55 C  
J
0
0.25  
0.5  
0.75  
1.0  
1.5  
2.0  
2.5  
3.0  
3.5  
V
, GATE TO SOURCE VOLTAGE (V)  
V
, DRAIN TO SOURCE VOLTAGE (V)  
DS  
GS  
Figure 7. Transfer Characteristics  
Figure 8. Saturation Characteristics  
1.6  
10  
8
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 80µs  
DUTY CYCLE = 0.5% MAX  
I
= 35A  
D
1.4  
1.2  
1.0  
0.8  
0.6  
6
4
I
= 1A  
D
V
= 10V, I = 35A  
D
GS  
2
2
4
6
8
10  
-80  
-40  
0
40  
80  
120  
160  
200  
o
T , JUNCTION TEMPERATURE ( C)  
V
, GATE TO SOURCE VOLTAGE (V)  
J
GS  
Figure 9. Drain to Source On Resistance vs Gate  
Voltage and Drain Current  
Figure 10. Normalized Drain to Source On  
Resistance vs Junction Temperature  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
Typical Characteristics T = 25°C unless otherwise noted  
C
1.2  
1.1  
1.0  
0.9  
1.4  
1.2  
1.0  
0.8  
0.6  
0.4  
I
= 250µA  
D
V
= V , I = 250µA  
DS D  
GS  
-80  
-40  
0
40  
80  
120  
160  
200  
-80  
-40  
0
40  
80  
120  
160  
200  
o
o
T , JUNCTION TEMPERATURE ( C)  
T , JUNCTION TEMPERATURE ( C)  
J
J
Figure 11. Normalized Gate Threshold Voltage vs  
Junction Temperature  
Figure 12. Normalized Drain to Source  
Breakdown Voltage vs Junction Temperature  
10000  
10  
V
= 15V  
DD  
C
= C + C  
GS GD  
ISS  
8
6
4
2
0
C
C
+ C  
OSS  
DS GD  
C
= C  
GD  
RSS  
1000  
400  
WAVEFORMS IN  
DESCENDING ORDER:  
I
= 35A  
= 5A  
D
I
V
= 0V, f = 1MHz  
D
GS  
0
20  
40  
60  
80  
100  
30  
0.1  
1
10  
V
, DRAIN TO SOURCE VOLTAGE (V)  
Q , GATE CHARGE (nC)  
DS  
g
Figure 13. Capacitance vs Drain to Source  
Voltage  
Figure 14. Gate Charge Waveforms for Constant  
Gate Current  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
Test Circuits and Waveforms  
V
DS  
BV  
DSS  
t
P
L
V
DS  
I
VARY t TO OBTAIN  
P
AS  
+
-
V
DD  
R
REQUIRED PEAK I  
G
AS  
V
DD  
V
GS  
DUT  
t
P
I
0V  
AS  
0
0.01Ω  
t
AV  
Figure 15. Unclamped Energy Test Circuit  
Figure 16. Unclamped Energy Waveforms  
V
DS  
V
Q
DD  
g(TOT)  
V
GS  
V
L
DS  
V
= 10V  
GS  
Q
V
g(5)  
GS  
+
-
Q
gs2  
V
V
= 5V  
DD  
GS  
DUT  
V
= 1V  
GS  
I
g(REF)  
0
Q
g(TH)  
Q
Q
gs  
gd  
I
g(REF)  
0
Figure 17. Gate Charge Test Circuit  
Figure 18. Gate Charge Waveforms  
V
DS  
t
t
ON  
OFF  
t
d(OFF)  
t
d(ON)  
R
L
t
t
f
r
V
DS  
90%  
90%  
+
-
V
GS  
V
DD  
10%  
10%  
0
DUT  
90%  
50%  
R
GS  
V
GS  
50%  
PULSE WIDTH  
V
10%  
GS  
0
Figure 19. Switching Time Test Circuit  
Figure 20. Switching Time Waveforms  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
PSPICE Electrical Model  
.SUBCKT FDP8870 2 1 3 ; rev December 2003  
Ca 12 8 4.5e-9  
Cb 15 14 4.5e-9  
Cin 6 8 4.7e-9  
LDRAIN  
DPLCAP  
5
DRAIN  
2
10  
Dbody 7 5 DbodyMOD  
Dbreak 5 11 DbreakMOD  
Dplcap 10 5 DplcapMOD  
RLDRAIN  
RSLC1  
51  
DBREAK  
+
RSLC2  
5
ESLC  
11  
51  
Ebreak 11 7 17 18 33.45  
Eds 14 8 5 8 1  
Egs 13 8 6 8 1  
Esg 6 10 6 8 1  
Evthres 6 21 19 8 1  
-
+
50  
-
17  
DBODY  
RDRAIN  
6
8
EBREAK 18  
-
ESG  
EVTHRES  
+
16  
21  
+
-
19  
8
MWEAK  
Evtemp 20 6 18 22 1  
LGATE  
EVTEMP  
RGATE  
GATE  
1
6
+
-
18  
22  
MMED  
It 8 17 1  
9
20  
MSTRO  
8
RLGATE  
Lgate 1 9 3.6e-9  
Ldrain 2 5 1.0e-9  
Lsource 3 7 3.3e-9  
LSOURCE  
CIN  
SOURCE  
3
7
RSOURCE  
RLSOURCE  
RLgate 1 9 36  
RLdrain 2 5 10  
RLsource 3 7 33  
S1A  
S2A  
RBREAK  
12  
15  
13  
8
14  
13  
17  
18  
RVTEMP  
19  
S1B  
S2B  
Mmed 16 6 8 8 MmedMOD  
Mstro 16 6 8 8 MstroMOD  
Mweak 16 21 8 8 MweakMOD  
13  
CB  
CA  
IT  
14  
-
+
+
VBAT  
6
8
5
8
EGS  
EDS  
+
Rbreak 17 18 RbreakMOD 1  
Rdrain 50 16 RdrainMOD 2.15e-3  
Rgate 9 20 2.1  
-
-
8
22  
RVTHRES  
RSLC1 5 51 RSLCMOD 1e-6  
RSLC2 5 50 1e3  
Rsource 8 7 RsourceMOD 9e-4  
Rvthres 22 8 RvthresMOD 1  
Rvtemp 18 19 RvtempMOD 1  
S1a 6 12 13 8 S1AMOD  
S1b 13 12 13 8 S1BMOD  
S2a 6 15 14 13 S2AMOD  
S2b 13 15 14 13 S2BMOD  
Vbat 22 19 DC 1  
ESLC 51 50 VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))}  
.MODEL DbodyMOD D (IS=7.5E-12 IKF=17 N=1.01 RS=2.1e-3 TRS1=2e-3 TRS2=2e-7  
+ CJO=1.9e-9 M=0.57 TT=9e-11 XTI=2.6)  
.MODEL DbreakMOD D (RS=8e-2 TRS1=1e-3 TRS2=-8.9e-6)  
.MODEL DplcapMOD D (CJO=1.75e-9 IS=1e-30 N=10 M=0.4)  
.MODEL MmedMOD NMOS (VTO=2.1 KP=30 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=2.1 T_ABS=25)  
.MODEL MstroMOD NMOS (VTO=2.51 KP=650 IS=1e-30 N=10 TOX=1 L=1u W=1u T_ABS=25)  
.MODEL MweakMOD NMOS (VTO=1.67 KP=0.1 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=21 RS=0.1 T_ABS=25)  
.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-9e-7)  
.MODEL RdrainMOD RES (TC1=2.3e-3 TC2=5e-6)  
.MODEL RSLCMOD RES (TC1=1e-4 TC2=1e-6)  
.MODEL RsourceMOD RES (TC1=8e-3 TC2=1e-6)  
.MODEL RvthresMOD RES (TC1=-2.3e-3 TC2=-9e-6)  
.MODEL RvtempMOD RES (TC1=-3e-3 TC2=2e-7)  
.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-2)  
.MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-4)  
.MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-1 VOFF=-0.5)  
.MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-1)  
.ENDS  
Note: For further discussion of the PSPICE model, consult A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global  
Temperature Options; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank  
Wheatley.  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
SABER Electrical Model  
rev December 2003  
template FDP8870 n2,n1,n3 =m_temp  
electrical n2,n1,n3  
number m_temp=25  
{
var i iscl  
dp..model dbodymod = (isl=7.5e-12,ikf=17,nl=1.01,rs=2.1e-3,trs1=2e-3,trs2=2e-7,cjo=1.9e-9,m=0.57,tt=9e-11,xti=2.6)  
dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6)  
dp..model dplcapmod = (cjo=1.75e-9,isl=10e-30,nl=10,m=0.4)  
m..model mmedmod = (type=_n,vto=2.1,kp=30,is=1e-30, tox=1)  
m..model mstrongmod = (type=_n,vto=2.51,kp=650,is=1e-30, tox=1)  
m..model mweakmod = (type=_n,vto=1.67,kp=0.1,is=1e-30, tox=1,rs=0.1)  
LDRAIN  
sw_vcsp..model s1amod = (ron=1e-5,roff=0.1,von=-4,voff=-2)  
sw_vcsp..model s1bmod = (ron=1e-5,roff=0.1,von=-2,voff=-4)  
sw_vcsp..model s2amod = (ron=1e-5,roff=0.1,von=-1,voff=-0.5)  
sw_vcsp..model s2bmod = (ron=1e-5,roff=0.1,von=-0.5,voff=-1)  
c.ca n12 n8 = 4.5e-9  
DPLCAP  
5
DRAIN  
2
10  
RLDRAIN  
RSLC1  
51  
RSLC2  
c.cb n15 n14 = 4.5e-9  
c.cin n6 n8 = 4.7e-9  
ISCL  
DBREAK  
11  
50  
-
dp.dbody n7 n5 = model=dbodymod  
dp.dbreak n5 n11 = model=dbreakmod  
dp.dplcap n10 n5 = model=dplcapmod  
RDRAIN  
6
8
ESG  
DBODY  
EVTHRES  
+
16  
21  
+
-
19  
8
MWEAK  
LGATE  
EVTEMP  
spe.ebreak n11 n7 n17 n18 = 33.45  
RGATE  
GATE  
1
+
6
-
18  
22  
EBREAK  
+
spe.eds n14 n8 n5 n8 = 1  
spe.egs n13 n8 n6 n8 = 1  
spe.esg n6 n10 n6 n8 = 1  
spe.evthres n6 n21 n19 n8 = 1  
spe.evtemp n20 n6 n18 n22 = 1  
MMED  
9
20  
MSTRO  
8
17  
18  
-
RLGATE  
LSOURCE  
CIN  
SOURCE  
3
7
RSOURCE  
RLSOURCE  
i.it n8 n17 = 1  
S1A  
S2A  
RBREAK  
12  
15  
13  
8
14  
13  
17  
18  
l.lgate n1 n9 = 3.6e-9  
l.ldrain n2 n5 = 1.0e-9  
l.lsource n3 n7 = 3.3e-9  
RVTEMP  
19  
S1B  
S2B  
13  
CB  
CA  
IT  
14  
-
+
+
res.rlgate n1 n9 = 36  
res.rldrain n2 n5 = 10  
res.rlsource n3 n7 = 33  
VBAT  
6
8
5
8
EGS  
EDS  
+
-
-
8
22  
m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u, temp=m_temp  
m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u, temp=m_temp  
m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u, temp=m_temp  
RVTHRES  
res.rbreak n17 n18 = 1, tc1=8.3e-4,tc2=-9e-7  
res.rdrain n50 n16 = 2.15e-3, tc1=2.3e-3,tc2=5e-6  
res.rgate n9 n20 = 2.1  
res.rslc1 n5 n51 = 1e-6, tc1=1e-4,tc2=1e-6  
res.rslc2 n5 n50 = 1e3  
res.rsource n8 n7 = 9e-4, tc1=8e-3,tc2=1e-6  
res.rvthres n22 n8 = 1, tc1=-2.3e-3,tc2=-9e-6  
res.rvtemp n18 n19 = 1, tc1=-3e-3,tc2=2e-7  
sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod  
sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod  
sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod  
sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod  
v.vbat n22 n19 = dc=1  
equations {  
i (n51->n50) +=iscl  
iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10))  
}
}
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
PSPICE Thermal Model  
JUNCTION  
th  
REV 23 December 2003  
FDP8870T  
CTHERM1 TH 6 1e-3  
CTHERM2 6 5 2e-3  
CTHERM3 5 4 3e-3  
CTHERM4 4 3 9e-3  
CTHERM5 3 2 1e-2  
CTHERM6 2 TL 2e-2  
RTHERM1  
RTHERM2  
RTHERM3  
RTHERM4  
RTHERM5  
RTHERM6  
CTHERM1  
6
RTHERM1 TH 6 3e-2  
RTHERM2 6 5 8e-2  
RTHERM3 5 4 1.1e-1  
RTHERM4 4 3 1.6e-1  
RTHERM5 3 2 1.72e-1  
RTHERM6 2 TL 2e-1  
CTHERM2  
CTHERM3  
CTHERM4  
CTHERM5  
CTHERM6  
5
SABER Thermal Model  
SABER thermal model FDP8870T  
template thermal_model th tl  
thermal_c th, tl  
{
ctherm.ctherm1 th 6 =1e-3  
ctherm.ctherm2 6 5 =2e-3  
ctherm.ctherm3 5 4 =3e-3  
ctherm.ctherm4 4 3 =9e-3  
ctherm.ctherm5 3 2 =1e-2  
ctherm.ctherm6 2 tl =2e-2  
4
3
2
rtherm.rtherm1 th 6 =3e-2  
rtherm.rtherm2 6 5 =8e-2  
rtherm.rtherm3 5 4 =1.1e-1  
rtherm.rtherm4 4 3 =1.6e-1  
rtherm.rtherm5 3 2 =1.72e-1  
rtherm.rtherm6 2 tl =2e-1  
}
tl  
CASE  
©2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
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@2008 Fairchild Semiconductor Corporation  
FDP8870 Rev. A3  
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