FDT457N [ONSEMI]
N 沟道增强型场效应晶体管 30V,5A,60mΩ;型号: | FDT457N |
厂家: | ONSEMI |
描述: | N 沟道增强型场效应晶体管 30V,5A,60mΩ PC 开关 脉冲 光电二极管 晶体管 场效应晶体管 |
文件: | 总6页 (文件大小:198K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
DATA SHEET
www.onsemi.com
Transistor, N-Channel, Field
Effect, Enhancement Mode
V
R
MAX
I MAX
D
DSS
DS(ON)
30 V
ꢂ
ꢃ
ꢂ
ꢄ
ꢀ
@
1
0
V
5 A
FDT457N
0.090 ꢀ @ 4.5 V
General Description
These N−Channel enhancement mode power field effect transistors
are produced using onsemi’s proprietary, high cell density,
DMOS technology. This very high density process is especially
tailored to minimize on−state resistance, provide superior switching
performance. These products are well suited to low voltage, low
current applications such as notebook computer power management,
battery powered circuits, and DC motor control.
D
S
D
G
SOT−223
CASE 318H
Features
• 5 A, 30 V
MARKING DIAGRAM
R
R
= 0.06 ꢀ @ V = 10 V
GS
DS(on)
= 0.090 ꢀ @ V = 4.5 V
DS(on)
GS
• High Density Cell Design for Extremely Low R
DS(ON)
AYW
457G
G
• High Power and Current Handling Capability in a Widely Used
Surface Mount Package
• This Device is Pb−Free
1
A
Y
= Specific Device Code
= Date Code
ABSOLUTE MAXIMUM RATINGS (TA = 25°C unless otherwise noted)
Symbol
Parameter
Drain−Source Voltage
Gate−Source Voltage − Continuous
Ratings
Unit
V
W
= Work Week
457 = Specific Device Code
G
V
DSS
V
GSS
30
= Pb−Free Package
20
V
(Note: Microdot may be in either location)
I
D
Maximum
− Continuous (Note 1a)
− Pulsed
5
A
Drain Current
16
P
D
Maximum
Power
Dissipation
(Note 1a)
(Note 1b)
(Note 1c)
3
1.3
W
PINOUT
1.1
D
T , T
Operating and Storage
Temperature Range
−65 to +150
°C
J
stg
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
D
S
G
THERMAL CHARACTERISTICS
Symbol
Parameter
Ratings
Unit
R
ꢁ JA
ꢁ JC
Thermal Resistance, Junction−to−Ambient
42
°C/W
ORDERING INFORMATION
(Note 1a)
R
Thermal Resistance, Junction−to−Case
(Note 1)
12
°C/W
†
Device
FDT457N
Shipping
Package
4000 / Tape & Reel
SOT−223
(Pb−Free)
†For information on tape and reel specifications,
including part orientation and tape sizes, please
refer to our Tape and Reel Packaging Specifications
Brochure, BRD8011/D.
© Semiconductor Components Industries, LLC, 1998
1
Publication Order Number:
September, 2022 − Rev. 4
FDT457N/D
FDT457N
ELECTRICAL CHARACTERISTICS (TA = 25°C unless otherwise noted)
Symbol
Parameter
Test Conditions
Min
Typ
Max
Unit
OFF CHARACTERISTICS
BV
Drain–Source Breakdown Voltage
V
I
= 0 V, I = 250 ꢅ A
30
−
−
−
V
DSS
GS
D
Breakdown Voltage Temperature
Coefficient
= 250 ꢅ A,Referenced to 25°C
−
35
mV/°C
ꢆ BVDSS
ꢆ TJ
D
I
Zero Gate Voltage Drain Current
V
V
V
V
= 24 V, V = 0 V
−
−
−
−
−
−
−
−
1
ꢅ A
ꢅ A
nA
nA
DSS
DS
GS
= 24 V, V = 0 V, T = 55°C
10
DS
GS
GS
GS
J
I
Gate–Body Leakage Current, Forward
Gate–Body Leakage Current, Reverse
= 20 V, V = 0 V
100
–100
GSSF
DS
I
= −20 V, V = 0 V
DS
GSSR
ON CHARACTERISTICS (Note 2)
V
Gate Threshold Voltage
V
I
= V , I = 250 ꢅ A
1
1.6
3
V
GS(th)
DS
GS
D
Gate Threshold Voltage
Temperature Coefficient
= 250 ꢅ A, Referenced to 25°C
−
–4.2
−
mV/°C
ꢆ VGS(th)
ꢆ TJ
D
R
Static Drain–Source On–Resistance
V
GS
V
GS
V
GS
= 10 V, I = 5 A
−
−
−
0.043
0.065
0.071
0.06
0.1
0.09
ꢀ
DS(on)
D
= 10 V, I = 5 A, T = 125°C
D
J
= 4.5 V, I = 3.8 A
D
I
On−State Drain Current
V
GS
V
DS
= 10 V, V = 5 V
5
−
−
−
A
S
D(on)
DS
g
FS
Forward Transconductance
= 10 V, I = 5 A
−
5
D
DYNAMIC CHARACTERISTICS
C
Input Capacitance
V
DS
= 15 V, V = 0 V, f = 1.0 MHz
−
−
−
235
145
50
−
−
−
pF
pF
pF
iss
GS
C
Output Capacitance
oss
C
Reverse Transfer Capacitance
rss
SWITCHING CHARACTERISTICS (Note 2)
t
Turn–On Delay Time
Turn–On Rise Time
Turn–Off Delay Time
Turn–Off Fall Time
Total Gate Charge
Gate–Source Charge
Gate–Drain Charge
V
= 10 V, I = 1 A, V = 10 V,
GEN
−
−
−
−
−
−
−
5
10
22
22
8
ns
ns
d(on)
DD
D
GS
R
= 6 ꢀ
t
r
12
12
3
t
ns
d(off)
t
f
ns
Q
V
DS
= 10 V, I = 5 A, V = 5 V
4.2
1.3
1.7
5.9
−
nC
nC
nC
g
D
GS
Q
gs
gd
Q
−
DRAIN−SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATIINGS
Maximum Continuous Drain−Source Diode Forward Current
Drain–Source Diode Forward Voltage = 0 V, I = 2.5 A (Note 2)
I
−
−
−
2.5
1.2
A
V
S
V
SD
V
GS
0.85
S
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
NOTES:
1. R
is the sum of the junction−to−case and case−to−ambient thermal resistance where the case thermal reference is defined as the solder
ꢁ
JA
mounting surface of the drain pins. R
is guaranteed by design while R
is determined by the user’s board design.
ꢁ
ꢁ
JC
CA
a. 42°C/W when
mounted on a 1 in
pad of 2oz Cu.
b. 95°C/W when
mounted on a 0.066 in
pad of 2oz Cu.
c. 110°C/W when
2
2
mounted on a 0.00123
2
in pad of 2oz Cu.
Scale 1 : 1 on letter size paper
2. Pulse Test: Pulse Width v300 ꢅ s, Duty cycle v2.0 %.
www.onsemi.com
2
FDT457N
TYPICAL CHARACTERISTICS
2.5
10
8
10 V
6.0 V
V
GS
= 5.0 V
V
GS
= 3.5 V
4.5 V
4.0 V
2
1.5
1
4.0 V
6
4
2
3.5 V
4.5 V
5.0 V
6.0 V
3.0 V
7.0 V
10 V
0
0
2
4
6
8
10
0
0.5
1
1.5
2
2.5
3
I , Drain Current (A)
D
V
DS
, Drain−Source Voltage (V)
Figure 2. On−Resistance Variation
with Drain Current and Gate Voltage
Figure 1. On−Region Characteristics
1.6
1.4
1.2
1
0.25
0.2
0.15
0.1
0.05
0
I
V
= 5 A
I
= 2 A
D
D
= 10 V
GS
T = 125°C
A
0.8
T = 25°C
A
0.6
−50 −25
0
25
50
75
100 125 150
2
4
6
8
10
T , Junction Temperature (5C)
J
V
GS
, Gate to Source Voltage (V)
Figure 3. On−Resistance Variation
Figure 4. On−Resistance Variation
with Gate−to−Source Voltage
with Temperature
10
14
12
10
8
V
GS
= 0 V
T = −55°C
A
V
DS
= 10 V
25°C
1
0.1
T = 125°C
J
125°C
25°C
6
0.01
4
−55°C
0.001
0.0001
2
0
1
2
3
4
5
6
0
0.2
0.6
0.8
1
1.2
0.4
V
GS
, Gate to Source Voltage (V)
V
SD
, Body Diode Forward Voltage (V)
Figure 5. Transfer Characteristics
Figure 6. Body Diode Forward Voltage Variation
with Source Current and Temperature
www.onsemi.com
3
FDT457N
TYPICAL ELECTRICAL CHARACTERISTICS (continued)
1000
10
8
I
D
= 4 A
V
DS
= 5 V
400
200
100
C
iss
10 V
6
C
oss
15 V
4
C
rss
2
f = 1 MHz
50
30
V
GS
= 0 V
0
0
2
4
6
8
0.1
0.3
1
3
10
30
Q , Gate Charge (nC)
g
V
DS
, Drain to Source Voltage (V)
Figure 7. Gate Charge Characteristics
Figure 8. Capacitance Characteristics
50
200
160
120
80
SINGLE PULSE
= 110°C/W
T = 25°C
A
R
DS(ON)
LIMIT
20
10
5
100 ꢅs
R
ꢁ
JA
1 ms
10 ms
100 ms
1 s
10 s
1
0.5
DC
V
= 10 V
GS
0.1
0.05
SINGLE PULSE
= 110°C/W
40
R
ꢁ
JA
T = 25°C
A
0.01
0
0.1 0.2
0.5
1
2
5
10 20
50
0.001
0.01
0.1
1
10
100 300
V
DS
, Drain−Source Voltage (V)
Single Pulse Time (s)
Figure 9. Maximum Safe Operating Area
Figure 10. Single Pulse Maximum Power
Dissipation
1
D = 0.5
0.5
0.2
0.2
0.1
R
R
(t) = r(t) x R
= 110°C/W
ꢁ
ꢁ
ꢁ
JA
JA
JA
0.1
0.05
0.05
0.02
0.01
0.02
0.01
t
1
t
2
0.005
Single Pulse
T − T = P x R (t)
ꢁ
JA
Duty Cycle, D = t / t
J
A
0.002
0.001
1
2
0.0001
0.001
0.01
0.1
t , Time (s)
1
10
100
300
1
Figure 11. Transient Thermal Response Curve
(Note: Thermal characterization performed using the conditions described in Note 1c.
Transient thermal response will change depending on the circuit board design.)
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4
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
SOT−223
CASE 318H
ISSUE B
DATE 13 MAY 2020
SCALE 2:1
A
Y
W
= Assembly Location
= Year
= Work Week
GENERIC
MARKING DIAGRAM*
XXXXX = Specific Device Code
G
= Pb−Free Package
(Note: Microdot may be in either location)
AYW
XXXXXG
G
*This information is generic. Please refer to
device data sheet for actual part marking.
Pb−Free indicator, “G” or microdot “G”, may
or may not be present. Some products may
not follow the Generic Marking.
1
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98ASH70634A
SOT−223
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
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© Semiconductor Components Industries, LLC, 2018
www.onsemi.com
onsemi,
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.
A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any
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information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use
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and applications using onsemi products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information
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