HCPL2530SD [ONSEMI]

8 引脚 DIP 1Mbit/s 双沟道高速晶体管输出光耦合器(不建议用于新设计新的对等零件编号为 HCPL253xM);
HCPL2530SD
型号: HCPL2530SD
厂家: ONSEMI    ONSEMI
描述:

8 引脚 DIP 1Mbit/s 双沟道高速晶体管输出光耦合器(不建议用于新设计新的对等零件编号为 HCPL253xM)

输出元件 晶体管 光电
文件: 总16页 (文件大小:706K)
中文:  中文翻译
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August 2008  
Single-Channel: 6N135, 6N136, HCPL2503, HCPL4502  
Dual-Channel: HCPL2530, HCPL2531  
High Speed Transistor Optocouplers  
Features  
Description  
High speed –1 MBit/s  
The HCPL4502, HCPL2503, 6N135, 6N136, HCPL2530  
and HCPL2531 optocouplers coof an AlGaAs  
LED optically coupled to a high sped photodetector  
transistor.  
Superior CMR – 10kV/µs  
Dual-Channel HCPL2530/HCPL2531  
Double working voltage – 480V RMS  
CTR guaranteed 0–70°C  
A separate connection for thbias of the photodiode  
improves the speed by several orders of magnitude over  
conventional phototransistor optocouplers by reducing  
the base-collector cpacitance of the input transistor.  
U.L. recognized (File # E90700)  
Applications  
Line receivers  
An internal ise shield provides superior common  
mode rejectioof 10kV/µs. An improved package allows  
superioulation permitting a 480V working voltage  
compareindustry standard of 220V.  
Pulse transformer replacement  
Output interface to CMOS-LSTTL-TTL  
Wide bandwidth analog coupling  
Schematics  
Package Outlines  
VCC  
8
VCC  
1
N/C  
1
8
8
VF1  
_
1
V01  
7
B  
2
+
2
3
6
5
VF  
_
_
V02  
3
6
5
VO  
8
8
VF2  
+
1
1
N/C  
GND  
GND  
4
HCPL2530/HCPL2531  
6N135, 6N136, HCPL2503, HCPL4502  
Pin 7 is not connected in  
Part Number HCPL4502  
©2005 Fairchild Semiconductor Corporation  
www.fairchildsemi.com  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
Absolute Maximum Ratings (T = 25°C unless otherwise specified)  
A
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be  
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.  
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.  
The absolute maximum ratings are stress ratings only.  
Symbol  
Parameter  
Storage Temperature  
Operating Temperature  
Lead Solder Temperature  
Condition  
Value  
Units  
°C  
T
-55 to +125  
-55 to +100  
260 for 10 sec  
STG  
T
°C  
OPR  
T
°C  
SOL  
EMITTER  
I (avg) DC/Average Forward Input  
25  
5
1.0  
5
mA  
mA  
A
F
(1)  
Current Each Channel  
I (pk)  
Peak Forward Input Current  
Each Channel  
50% duty cycle, 1ms P.W.  
F
(2)  
I (trans) Peak Transient Input Current  
1µs P.W., 300pps  
F
Each Channel  
V
P
Reverse Input Voltage Each  
Channel  
V
R
Input Power Dissipation Each 6N135/6N136 and HCPL2503/4502  
100  
45  
mW  
D
Channel  
(3)  
HCPL-2530/253  
DETECTOR  
I
(avg) Average Output Current Each  
Channel  
8
mA  
mA  
O
I
(pk)  
Peak Output Current Each  
Channel  
16  
O
V
Emitter-Base Reverse Voltage 6N1N136 and HCPL2503 only  
5
-0.5 to 30  
-0.5 to 20  
5
V
V
EBR  
V
Supply Voltage  
Output Voltage  
CC  
V
V
O
I
Base Current  
6N135, 6N136 and HCPL2503 only  
6N135, 6N136, HCPL2503, HCPL4502  
HCPL2530, HCPL2531  
mA  
mW  
mW  
B
(4)  
PD  
Output Power Dissipaon  
Each Channel  
100  
35  
Notes:  
1. Derate linearly above free-air temperature at a rate of 0.8mA/°C.  
2. Derate linearly above 70°C free-air temperature at a rate of 1.6mA/°C.  
3. Derate linearly above 70°C free-air temperature at a rate of 0.9 mW/°C.  
4. Derate linearly above 70°C free-air temperature at a rate of 2.0 mW/°C.  
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
2
Electrical Characteristics (T = 0 to 70°C Unless otherwise specified)  
A
Individual Component Characteristics  
Symbol  
Parameter  
Test Conditions  
Device  
Min. Typ.* Max. Unit  
EMITTER  
V
Input Forward Voltage  
I = 16mA, T =25°C  
1.45  
1.7  
1.8  
V
F
F
A
I = 16mA  
F
B
Input Reverse Breakdown  
Voltage  
I = 10 µA  
5.0  
V
VR  
R
V /T Temperature Coefficient of I = 16mA  
-1.6  
mV/°C  
F
A
F
Forward Voltage  
DETECTOR  
Logic High Output Current I = 0mA, V = V = 5.5V,  
I
All  
0.00
0.005  
0.5  
1
µA  
OH  
F
O
CC  
T =25°C  
A
I = 0mA, V = V = 15V,  
6N135  
6N136  
F
O
CC  
T =25°C  
A
HCPL4502  
HCPL203  
I = 0mA, V = V = 15V  
All  
50  
F
O
CC  
I
Logic Low Supply Current  
I = 16mA, V = Open,  
N135  
6N136  
HCPL4502  
HCPL2503  
120  
200  
200  
µA  
µA  
CCL  
F
O
V
= 15V  
CC  
I
= I = 16mA
HCPL2530  
HCPL2531  
400  
1
F1  
F2  
V = Open, V = V  
O
CC  
I
Logic High Supply Current I = 0mA, V Open,  
6N135  
6N136  
CCH  
F
O
V
= 1=25°C  
CC  
A
HCPL4502  
HCPL2503  
I 0mA, V = Open,  
6N135  
6N136  
HCPL4502  
HCPL2503  
2
4
F
O
V
= 15V  
CC  
I = 0mA, V = Open,  
HCPL2530  
HCPL2531  
0.02  
F
O
V
= 15V  
CC  
*All Typicals at T = 5°C  
A
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
3
Electrical Characteristics (Continued) (T = 0 to 70°C unless otherwise specified)  
A
Transfer Characteristics  
Symbol  
COUPLED  
CTR  
Parameter  
Test Conditions  
Device  
Min. Typ.* Max. Unit  
Current Transfer  
I = 16mA, V = 0.4 V,  
6N135  
HCPL2530  
7
18  
27  
50  
50  
%
%
F
O
(5)  
Ratio  
V
= 4.5V, T =25°C  
CC  
A
6N136  
19  
HCPL4502  
HCPL2531  
HCPL2503  
6N135  
12  
5
27  
21  
%
%
I = 16mA,  
V
V
V
= 0.4V  
= 0.5V  
= 0.4V  
F
OL  
OL  
OL  
V
= 4.5V  
CC  
HCPL2530  
6N136  
HCPL4502  
15  
9
30  
%
V
V
= 0.5V  
= 0.4V  
HCPL2531  
HCPL2503  
6N15  
OL  
30  
%
V
OL  
V
Logic LOW Output  
Voltage  
I = 16mA, I = 1.1mA,  
0.18  
0.18  
0.25  
0.4  
0.5  
0.4  
OL  
F
O
V
= 4.5V, T =25°C  
CC  
A
PL2530  
I = 16mA, I = 3mA,  
6N136  
F
O
V
= 4.5V, T =25°C  
HCPL2503  
CC  
A
HCPL2531  
0.25  
0.5  
0.5  
I = 16mA, I = 0.8mA,  
6N135  
F
O
V
= 4.5V  
HCPL2530  
CC  
I = 16mA, I = 24mA,  
HCPL4502  
HCPL2531  
0.5  
F
O
V
= 4.5V  
CC  
*All Typicals at T = 25°C  
A
Note:  
5. Current Transfer Ratio is defined as ratof output collector current, I , to the forward LED input current, I ,  
O
F
times 100%.  
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
4
Electrical Characteristics (Continued) (T = 0 to 70°C unless otherwise specified)  
A
Switching Characteristics (V = 5V)  
CC  
Symbol Parameter  
Test Conditions  
Device  
Min. Typ.* Max. Unit  
T
Propagation Delay  
Time to Logic LOW  
T = 25°C, R = 4.1k,  
6N135  
HCPL2530  
0.45  
1.5  
µs  
PHL  
A
L
(6)  
I = 16mA (Fig. 7)  
F
R = 1.9k, I = 16mA,  
6N136  
0.45  
0.8  
µs  
L
F
(7)  
T = 25°C (Fig. 7)  
HCPL4502  
HCPL2503  
HCPL2531  
A
(6)  
R = 4.1k, I = 16mA (Fig. 7)  
6N135  
HCPL2530  
2.0  
1.0  
µs  
µs  
L
F
(7)  
R = 1.9k, I = 16mA (Fig. 7)  
6N136  
L
F
HCPL4502  
HCPL2503  
HCPL2531  
T
Propagation Delay  
Time to Logic HIGH  
T = 25°C, (R = 4.1k,  
6N135  
HCPL2530  
0.5  
0.3  
1.5  
0.8  
µs  
µs  
PLH  
A
L
(6)  
I = 16mA (Fig. 7)  
F
(7)  
R = 1.9k, I = 16mA (Fig. 7)  
6N136  
L
F
T = 25°C  
HCPL4502  
HL2503  
HPL2531  
A
(6)  
R = 4.1k, I = 16mA (Fig. 7)  
6N135  
HCPL2530  
2.0  
1.0  
µs  
µs  
L
F
(7)  
R = 1.9k, I = 16mA (Fig. 7)  
6N136  
L
F
HCPL4502  
HCPL2503  
HCPL2531  
|CM | Common Mode  
I = 0mA, V  
0V  
,
6N135  
HCPL2530  
10,000  
10,000  
V/µs  
V/µs  
H
F
CM  
P-P  
(8)  
Transient  
Immunity at  
Logic High  
R = 4.1k, T 25°C (Fig. 8)  
L
A
I = 0mA, V  
= 10V  
,
6N136  
F
CM  
P-P  
(8)  
R = .9k, T = 25°C (Fig. 8)  
HCPL4502  
HCPL2503  
HCPL2531  
L
A
|CM | Common Mode  
I = 16mA, V  
= 10 V  
,
6N135  
HCPL2530  
10,000  
10,000  
V/µs  
V/µs  
L
F
CM  
P-P  
(8)  
Transient  
Immunity at  
Logic Low  
R = 4.1k, T = 25°C (Fig. 8)  
L
A
I = 16mA, V  
= 10 V ,  
P-P  
6N136  
F
CM  
(8)  
R = 1.9k(Fig. 8)  
HCPL4502  
HCPL2503  
HCPL2531  
L
** All Typicat T = 25°C  
A
Notes
6. The 4.1kload represents 1 LSTTL unit load of 0.36mA and 6.1kpull-up resistor.  
e 1.9kload represents 1 TTL unit load of 1.6mA and 5.6kpull-up resistor.  
8. Common mode transient immunity in logic high level is the maximum tolerable (positive) dV /dt on the leading edge  
cm  
of the common mode pulse signal V , to assure that the output will remain in a logic high state (i.e., V > 2.0V).  
CM  
O
Common mode transient immunity in logic low level is the maximum tolerable (negative) dV /dt on the trailing edge  
cm  
of the common mode pulse signal, V , to assure that the output will remain in a logic low state (i.e., V < 0.8V).  
CM  
O
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
5
Electrical Characteristics (Continued) (T = 0 to 70°C unless otherwise specified)  
A
Isolation Characteristics (T = 0 to 70°C Unless otherwise specified)  
A
Symbol  
Characteristics  
Test Conditions  
Min  
Typ**  
Max  
Unit  
I
Input-Output Insulation  
Leakage Current  
Relative humidity = 45%,  
1.0  
µA  
I-O  
T = 25°C, t = 5s,  
A
(9)  
V
= 3000 VDC  
I-O  
V
Withstand Insulation Test  
Voltage  
RH 50%, T = 25°C, I 2µA,  
t = 1 min.  
2500  
V
RMS  
ISO  
A
I-O  
(9)  
(9)  
12  
R
C
Resistance (Input to Output)  
V
= 500VDC  
10  
I-O  
I-O  
(9)  
Capacitance (Input to Output) f = 1MHz  
DC Current Gain  
Input-Input Insulation Leakage RH 45%, V = 500VDC  
0.6  
150  
pF  
I-O  
(9)  
HFE  
I = 3mA, V = 5V  
O O  
(10)  
I
0.005  
µA  
I-I  
I-I  
Current  
t = 5 s, (HCPL2530/2531 only)  
(10)  
1  
R
C
Input-Input Resistance  
V
= 500 VDC  
10  
I-I  
I-I  
(HCPL2530/2531 only)  
(10)  
Input-Input Capacitance  
f = 1MHz)  
0.03  
pF  
I-I  
(HCPL2530/2531 only)  
Notes:  
9. Device is considered a two terminal device: Pins 1, 2, 3 and 4 are shord together and Pins 5, 6, 7 and 8 are  
shorted together.  
10. Measured between pins 1 and 2 shorted together, and pins 3 and orted together.  
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
6
Typical Performance Curves  
Fig. 1 Normalized CTR vs. Forward Current  
Fig. 2 Normalized CTR vs.Temperature  
1.2  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
1.0  
0.8  
0.6  
0.4  
V
V
= 0.4 V  
O
I
V
16mA  
Normalized to:  
= 16 mA  
Normalized to:  
T = 25°C  
A
= 5 V  
CC  
= 5 V  
CC  
0.4 V  
I
F
T
= 25°C  
A
O
0.2  
0.0  
0.1  
1
10  
100  
-60  
-40  
-20  
0
20  
40  
60  
80  
100  
I
- FORWARD CURRENT (mA)  
T - TEMPERATRE (°C)  
A
F
Fig. 4 Logc High Output Current  
vs.Temperature  
Fig. 3 Output Current vs. Output Voltage  
1000  
100  
10  
16  
14  
12  
10  
8
TA = 25°C  
CC = 5 V  
I
F = 40mA  
F = 35mA  
I
V
V
= 0
F
V
CC  
=
I
O
IF = 30mA  
IF = 25mA  
I
F = 20mA  
F = 15mA  
6
I
1
4
IF = 10mA  
IF = 5mA  
2
0.1  
-60  
0
-40  
-20  
0
20  
40  
60  
80  
100  
0
2
4
6
8
10  
12  
14  
16  
18  
20  
T
– TEMPERATURE (°C)  
V
– OUTPUT VOLTAGE (V
A
O
Fig. 5 Propagation Delvs.Temperature  
Fig. 6 Propagation Delay vs. Load Resistance  
800  
700  
600  
500  
400  
300  
200  
0
10000  
= 4.1k(TPLH)  
RL 4.1k(TPLH)  
k(TPHL)  
I
- 10mA (TPHL)  
F
1000  
I
- 16mA (TPHL)  
- 16mA (TPLH)  
F
RL = 1.9k(TPLH)  
I
F
V
T
= 5 V  
I
V
= 16mA  
= 5 V  
CC  
= 25°C  
F
CC  
I
- 10mA (TPLH)  
F
A
100  
-60  
-40  
-20  
0
20  
40  
60  
80  
100  
1
10  
T
– TEMPERATURE (°C)  
R – LOAD RESISTANCE (k)  
L
A
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
7
Test Circuits  
Noise  
Shield  
Noise  
Shield  
Pulse  
+
VCC  
I
F
V
CC  
Generator  
tr = 5ns  
+5 V  
+5 V  
1
2
3
4
8
7
6
5
1
2
3
4
8
7
6
5
Pulse  
ZO = 50  
R
L
Generator  
V
F1  
IF  
+
VB  
tr = 5ns  
ZO= 50  
10% D.C.  
I/f< 100µs  
V01  
-
10% DUTY CYCLE  
I/f < 100µS  
VO  
RL  
VF  
-
C
L
= 1.5 µF  
VO  
V02  
-
VO  
I
F
V
F2  
0.1 µF  
MONITOR  
+
0.1 µF  
IF Monitor  
GND  
Rm  
Rm  
C
L = 1.5 µF  
GND  
Test Circuit for 6N135, 6N136, HCPL-2503 and HCPL- 4502  
Test Circuit for HCPL-2530 and HCPL-2531  
IF  
0
5 V  
VO  
1.5 V  
1.5 V  
VOL  
TPHL  
LH  
Fig. 7 Switching Time Circuit  
IF  
Noise  
Shield  
Noise  
Shield  
VCC  
V
CC  
+
+5 V  
+5 V  
VO  
1
2
3
4
8
7
6
1
8
7
6
5
IF  
R
L
V
F1  
+
VB  
V01  
-
RL  
2
3
4
A
VF  
-
A
VO  
V02  
B
-
0.1 µF  
VO  
B
VFF  
V
F2  
0.1 µF  
VFF  
+
GN
GND  
-
+
-
VCM  
-
+
PulsGe
Pulse Gen  
Test Circuit for 6N135, 6HCPL-2503 and HCPL-4502  
Test Circuit for HCPL-2530 and HCPL-2531  
VCM 10 V  
90% 90%  
10%  
tr  
10%  
tf  
0 V  
VO  
5 V  
Switch at A : IF = 0 mA  
VO  
VOL  
Switch at A : IF = 16 mA  
Fig. 8 Common Mode Immunity Test Circuit  
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
8
Ordering Information  
Option  
S
Example Part Number  
6N135S  
Description  
Surface Mount Lead Bend  
SD  
W
6N135SD  
Surface Mount; Tape and reel  
0.4" Lead Spacing  
6N135W  
V
6N135V  
VDE0884  
WV  
SV  
6N135WV  
VDE0884; 0.4” lead spacing  
VDE0884; surface mount  
VDE0884; surface mount; tape and reel  
6N135SV  
SDV  
6N135SDV  
Marking Information  
1
2
253  
6
V XX YY T1  
5
3
4
Definitions  
1
Fairchild lgo  
2
3
Dvice number  
VDmark (Note: Only appears on parts ordered with VDE option –  
See order entry table)  
4
6
Two digit year code, e.g., ‘03’  
Two digit work week ranging from ‘01’ to ‘53’  
Assembly package code  
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
9
Tape Specifications  
12.0 ± 0.1  
4.0 ± 0.1  
4.90 ± 0.20  
Ø1.55 ± 0.05  
1.75 ± 0.10  
4.0 ± 0.1  
0.30 ± 0.05  
7.5 ± 0.1  
16.0 ± 03  
10.30± 0.20  
13.2 ± 0.2  
Ø1.6 ± 0.1  
10.30 ± 0.20  
User Direction of Feed  
0.1 MAX  
Reflow Profile  
300  
250  
200  
150  
100  
50  
215C, 10–30 s  
225C pe
Time above 183C, 60–150 sec  
Ramp up = 3C/sec  
0
0
.5  
1
1.5  
2
2.5  
3
3.5  
4
4.5  
Time (Minute)  
Pak reflow temperature: 225C (package surface temperature)  
• Time of temperature higher than 183C for 60–150 seconds  
• One time soldering reflow is recommended  
©2005 Fairchild Semiconductor Corporation  
6N135, 6N136, HCPL2503, HCPL4502, HCPL2530, HCPL2531 Rev. 1.0.7  
www.fairchildsemi.com  
10  
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