MC74VHC373MEL [ONSEMI]

Octal D-Type Latch with 3-State Output; 八D型锁存器具有三态输出
MC74VHC373MEL
型号: MC74VHC373MEL
厂家: ONSEMI    ONSEMI
描述:

Octal D-Type Latch with 3-State Output
八D型锁存器具有三态输出

锁存器
文件: 总8页 (文件大小:93K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
MC74VHC373  
Octal D−Type Latch  
with 3−State Output  
The MC74VHC373 is an advanced high speed CMOS octal latch  
with 3−state output fabricated with silicon gate CMOS technology. It  
achieves high speed operation similar to equivalent Bipolar Schottky  
TTL while maintaining CMOS low power dissipation.  
http://onsemi.com  
This 8−bit D−type latch is controlled by a latch enable input and an  
output enable input. When the output enable input is high, the eight  
outputs are in a high impedance state.  
MARKING  
DIAGRAMS  
The internal circuit is composed of three stages, including a buffer  
output which provides high noise immunity and stable output. The  
inputs tolerate voltages up to 7.0 V, allowing the interface of 5.0 V  
systems to 3.0 V systems.  
20  
1
SOIC−20 WIDE  
DW SUFFIX  
CASE 751D  
VHC373  
AWLYYWW  
20  
1
Features  
20  
High Speed: t = 5.0 ns (Typ) at V = 5.0 V  
PD  
CC  
Low Power Dissipation: I = 4.0 mA (Max) at T = 25°C  
CC  
A
VHC  
373  
ALYW  
TSSOP−20  
DT SUFFIX  
CASE 948E  
20  
High Noise Immunity: V  
= V = 28% V  
NIL CC  
NIH  
Power Down Protection Provided on Inputs  
Balanced Propagation Delays  
1
1
20  
Designed for 2.0 V to 5.5 V Operating Range  
SOEIAJ−20  
M SUFFIX  
CASE 967  
Low Noise: V  
= 0.9 V (Max)  
OLP  
74VHC373  
AWLYYWW  
20  
Pin and Function Compatible with Other Standard Logic Families  
Latchup Performance Exceeds 300 mA  
1
1
ESD Performance: HBM > 2000 V; Machine Model > 200 V  
Chip Complexity: 186 FETs or 46.5 Equivalent Gates  
Pb−Free Packages are Available*  
A
= Assembly Location  
WL, L = Wafer Lot  
YY, Y = Year  
WW, W = Work Week  
PIN ASSIGNMENT  
1
2
3
4
5
6
7
8
9
20  
V
CC  
OE  
Q0  
D0  
D1  
Q1  
Q2  
D2  
D3  
Q3  
19 Q7  
18 D7  
17 D6  
16 Q6  
15 Q5  
14 D5  
13 D4  
12 Q4  
GND 10  
11  
LE  
ORDERING INFORMATION  
See detailed ordering and shipping information in the package  
dimensions section on page 4 of this data sheet.  
*For additional information on our Pb−Free strategy and soldering details, please  
download the ON Semiconductor Soldering and Mounting Techniques  
Reference Manual, SOLDERRM/D.  
Semiconductor Components Industries, LLC, 2005  
1
Publication Order Number:  
January, 2005 − Rev. 6  
MC74VHC373/D  
MC74VHC373  
2
5
3
D0  
D1  
D2  
D3  
D4  
Q0  
Q1  
Q2  
Q3  
Q4  
Q5  
Q6  
Q7  
4
6
7
FUNCTION TABLE  
8
9
DATA  
INPUTS  
LE  
OUTPUT  
NONINVERTING  
OUTPUTS  
INPUTS  
13  
12  
15  
16  
19  
OE  
D
Q
14  
17  
18  
L
L
L
H
H
L
H
L
X
X
H
D5  
D6  
D7  
L
No Change  
Z
H
X
11  
1
LE  
OE  
Figure 1. Logic Diagram  
MAXIMUM RATINGS  
Symbol  
Parameter  
Value  
Unit  
V
This device contains protection  
circuitry to guard against damage  
due to high static voltages or electric  
fields. However, precautions must  
be taken to avoid applications of any  
voltage higher than maximum rated  
voltages to this high−impedance cir-  
V
DC Supply Voltage  
DC Input Voltage  
– 0.5 to + 7.0  
– 0.5 to + 7.0  
CC  
V
V
in  
V
DC Output Voltage  
Input Diode Current  
Output Diode Current  
– 0.5 to V + 0.5  
V
out  
IK  
CC  
I
− 20  
± 20  
± 25  
± 75  
mA  
mA  
mA  
mA  
mW  
cuit. For proper operation, V and  
in  
I
OK  
V
out  
should be constrained to the  
range GND v (V or V ) v V  
.
I
DC Output Current, per Pin  
DC Supply Current, V and GND Pins  
in  
out  
CC  
out  
CC  
Unused inputs must always be  
tied to an appropriate logic voltage  
I
CC  
level (e.g., either GND or V ).  
P
D
Power Dissipation in Still Air,  
SOIC Packages†  
TSSOP Package†  
500  
450  
CC  
Unused outputs must be left open.  
T
Storage Temperature  
– 65 to + 150  
_C  
stg  
Maximum ratings are those values beyond which device damage can occur. Maximum ratings  
applied to the device are individual stress limit values (not normal operating conditions) and are  
not valid simultaneously. If these limits are exceeded, device functional operation is not implied,  
damage may occur and reliability may be affected.  
†Derating — SOIC Packages: – 7 mW/_C from 65_ to 125_C  
TSSOP Package: − 6.1 mW/_C from 65_ to 125_C  
RECOMMENDED OPERATING CONDITIONS  
Symbol  
Parameter  
Min  
2.0  
0
Max  
5.5  
Unit  
V
V
CC  
DC Supply Voltage  
DC Input Voltage  
V
in  
5.5  
V
V
DC Output Voltage  
Operating Temperature  
Input Rise and Fall Time  
0
V
V
out  
CC  
T
− 40  
+ 85  
_C  
ns/V  
A
t , t  
r
V
CC  
V
CC  
= 3.3 V  
= 5.0 V  
0
0
100  
20  
f
http://onsemi.com  
2
MC74VHC373  
DC ELECTRICAL CHARACTERISTICS  
T
A
= 25°C  
T = − 40 to 85°C  
A
V
CC  
Min  
Typ  
Max  
Min  
Max  
V
Symbol  
Parameter  
Test Conditions  
Unit  
V
IH  
Minimum High−Level  
Input Voltage  
2.0  
3.0 to  
5.5  
1.50  
1.50  
V
V
x 0.7  
V
x 0.7  
CC  
CC  
V
Maximum Low−Level  
Input Voltage  
2.0  
3.0 to  
5.5  
0.50  
0.50  
V
V
IL  
V
x 0.3  
V
x 0.3  
CC  
CC  
V
OH  
Minimum High−Level  
Output Voltage  
V
= V or V  
= − 50 mA  
2.0  
3.0  
4.5  
1.9  
2.9  
4.4  
2.0  
3.0  
4.5  
1.9  
2.9  
4.4  
in  
IH  
IL  
I
OH  
V
in  
= V or V  
IH  
IL  
I
I
= − 4 mA  
= − 8 mA  
3.0  
4.5  
2.58  
3.94  
2.48  
3.80  
OH  
OH  
V
OL  
Maximum Low−Level  
Output Voltage  
V
= V or V  
= 50 mA  
2.0  
3.0  
4.5  
0.0  
0.0  
0.0  
0.1  
0.1  
0.1  
0.1  
0.1  
0.1  
V
in  
IH  
IL  
I
OL  
V
in  
= V or V  
IH  
IL  
I
OL  
I
OL  
= 4 mA  
= 8 mA  
3.0  
4.5  
0.36  
0.36  
0.44  
0.44  
I
Maximum Input  
Leakage Current  
V
V
= 5.5 V or GND  
0 to 5.5  
± 0.1  
± 1.0  
mA  
mA  
in  
in  
I
Maximum  
= V or V  
IH  
5.5  
± 0.25  
± 2.5  
OZ  
in  
IL  
Three−State Leakage  
Current  
V
= V or GND  
out CC  
I
Maximum Quiescent  
Supply Current  
V
in  
= V or GND  
5.5  
4.0  
40.0  
mA  
CC  
CC  
AC ELECTRICAL CHARACTERISTICS (Input t = t = 3.0ns)  
r
f
T
A
= 25°C  
T = − 40 to 85°C  
A
Min  
Typ  
Max  
Min  
1.0  
Max  
Symbol  
Parameter  
Test Conditions  
= 3.3 ± 0.3 V C = 15 pF  
Unit  
t
t
t
t
,
Maximum Propagation Delay,  
D to Q  
V
V
V
V
V
7.3  
9.8  
11.4  
14.9  
13.5  
17.0  
ns  
PLH  
t
CC  
CC  
CC  
CC  
CC  
L
C = 50 pF  
L
1.0  
PHL  
= 5.0 ± 0.5 V C = 15 pF  
4.9  
6.4  
7.2  
9.2  
1.0  
1.0  
8.5  
10.5  
L
C = 50 pF  
L
,
Maximum Propagation Delay,  
LE to Q  
= 3.3 ± 0.3 V C = 15 pF  
7.0  
9.5  
11.0  
14.5  
1.0  
1.0  
13.0  
16.5  
ns  
ns  
ns  
PLH  
t
L
C = 50 pF  
L
PHL  
= 5.0 ± 0.5 V C = 15 pF  
5.0  
6.5  
7.2  
9.2  
1.0  
1.0  
8.5  
10.5  
L
C = 50 pF  
L
,
Output Enable Time,  
OE to Q  
= 3.3 ± 0.3 V C = 15 pF  
7.3  
9.8  
11.4  
14.9  
1.0  
1.0  
13.5  
17.0  
PZL  
t
L
R = 1 kW  
C = 50 pF  
L
PZH  
L
V
CC  
= 5.0 ± 0.5 V C = 15 pF  
5.5  
7.0  
8.1  
10.1  
1.0  
1.0  
9.5  
11.5  
L
R = 1 kW  
C = 50 pF  
L
L
,
Output Disable Time,  
OE to Q  
V
CC  
= 3.3 ± 0.3 V C = 50 pF  
9.5  
13.2  
9.2  
1.5  
1.0  
1.0  
15.0  
10.5  
1.5  
PLZ  
L
t
R = 1 kW  
L
PHZ  
V
CC  
= 5.0 ± 0.5V C = 50 pF  
L
R = 1 kW  
6.5  
1.0  
L
t
,
Output to Output Skew  
V
CC  
= 3.3 ± 0.3 V C = 50 pF  
ns  
ns  
OSLH  
L
t
(Note 1)  
OSHL  
V
CC  
= 5.5 ± 0.5 V C = 50 pF  
1.0  
L
(Note 1)  
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3
MC74VHC373  
AC ELECTRICAL CHARACTERISTICS (Input t = t = 3.0ns)  
r
f
T
A
= 25°C  
T = − 40 to 85°C  
A
Min  
Typ  
4
Max  
Min  
Max  
Symbol  
Parameter  
Test Conditions  
Unit  
pF  
C
Maximum Input Capacitance  
10  
10  
in  
C
Maximum Three−State Output  
Capacitance (Output in  
6
pF  
out  
High−Impedance State)  
Typical @ 25°C, V = 5.0 V  
CC  
27  
C
Power Dissipation Capacitance (Note 2)  
pF  
PD  
1. Parameter guaranteed by design. t  
= |t  
− t  
|, t  
= |t  
− t  
PHLn  
|.  
OSLH  
PLHm  
PLHn OSHL  
PHLm  
2. C is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load.  
PD  
Average operating current can be obtained by the equation: I  
no−load dynamic power consumption; P = C V  
) = C V f + I /8 (per latch). C is used to determine the  
CC(OPR  
PD CC in CC PD  
2
f + I V  
.
D
PD  
CC  
in  
CC  
CC  
NOISE CHARACTERISTICS (Input t = t = 3.0ns, C = 50 pF, V = 5.0V)  
r
f
L
CC  
T
A
= 25°C  
Typ  
Max  
Symbol  
Parameter  
Unit  
V
V
V
Quiet Output Maximum Dynamic V  
0.6  
0.9  
− 0.9  
3.5  
OLP  
OL  
Quiet Output Minimum Dynamic V  
− 0.6  
V
OLV  
OL  
V
IHD  
Minimum High Level Dynamic Input Voltage  
Maximum Low Level Dynamic Input Voltage  
V
V
ILD  
1.5  
V
TIMING REQUIREMENTS (Input t = t = 3.0 ns)  
r
f
T
A
= − 40  
to 85°C  
T
A
= 25°C  
Typ  
Limit  
Limit  
Symbol  
Parameter  
Test Conditions  
Unit  
t
Minimum Pulse Width, LE  
V
CC  
V
CC  
= 3.3 ± 0.3 V  
= 5.0 ±0.5 V  
5.0  
5.0  
5.0  
5.0  
ns  
w(h)  
t
Minimum Setup Time, D to LE  
Minimum Hold Time, D to LE  
V
V
= 3.3 ± 0.3 V  
= 5.0 ± 0.5 V  
4.0  
4.0  
4.0  
4.0  
ns  
ns  
su  
CC  
CC  
t
V
CC  
V
CC  
= 3.3 ± 0.3 V  
= 5.0 ± 0.5 V  
1.0  
1.0  
1.0  
1.0  
h
ORDERING INFORMATION  
Device  
Package  
Shipping  
MC74VHC373DWR2  
MC74VHC373DWR2G  
SOIC−20  
1000 Tape & Reel  
1000 Tape & Reel  
SOIC−20  
(Pb−Free)  
MC74VHC373DTR2  
MC74VHC373MEL  
MC74VHC373MELG  
TSSOP−20*  
SOEIAJ−20  
2500 Tape & Reel  
2000 Tape & Reel  
2000 Tape & Reel  
SOEIAJ−20  
(Pb−Free)  
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging  
Specifications Brochure, BRD8011/D.  
*This package is inherently Pb−Free.  
http://onsemi.com  
4
 
MC74VHC373  
SWITCHING WAVEFORMS  
t
w
V
CC  
V
CC  
LE  
50%  
D
Q
50%  
GND  
GND  
t
t
PHL  
PLH  
t
t
PHL  
PLH  
50% VCC  
Q
50% VCC  
Figure 2.  
Figure 3.  
V
CC  
OE  
50%  
GND  
VALID  
t
t
PLZ  
PZL  
V
CC  
HIGH  
D
50%  
IMPEDANCE  
50% VCC  
GND  
Q
Q
t
su  
t
VOL +0.3V  
h
t
t
PHZ  
V
PZH  
CC  
LE  
50%  
VOL −0.3V  
GND  
50% VCC  
HIGH  
IMPEDANCE  
Figure 4.  
Figure 5.  
TEST CIRCUITS  
TEST POINT  
OUTPUT  
TEST POINT  
1 kW  
CONNECT TO V WHEN  
CC  
OUTPUT  
TESTING t AND t  
PLZ  
.
PZL  
DEVICE  
UNDER  
TEST  
DEVICE  
UNDER  
TEST  
CONNECT TO GND WHEN  
TESTING t AND t  
.
PZH  
C *  
L
PHZ  
C *  
L
*Includes all probe and jig capacitance  
*Includes all probe and jig capacitance  
Figure 6.  
Figure 7.  
http://onsemi.com  
5
MC74VHC373  
D0  
D1  
D2  
D3  
D4  
13  
D5  
14  
D6  
17  
D7  
18  
3
4
7
8
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
D
Q
LE  
LE  
LE  
LE  
LE  
LE  
LE  
LE  
11  
1
LE  
OE  
2
5
6
9
12  
Q4  
15  
Q5  
16  
Q6  
19  
Q7  
Q0  
Q1  
Q2  
Q3  
Figure 8. EXPANDED LOGIC DIAGRAM  
INPUT  
Figure 9. INPUT EQUIVALENT CIRCUIT  
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6
MC74VHC373  
OUTLINE DIMENSIONS  
SOIC−20  
DW SUFFIX  
CASE 751D−05  
ISSUE G  
D
A
q
NOTES:  
1. DIMENSIONS ARE IN MILLIMETERS.  
2. INTERPRET DIMENSIONS AND TOLERANCES  
PER ASME Y14.5M, 1994.  
20  
11  
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD  
PROTRUSION.  
E
B
4. MAXIMUM MOLD PROTRUSION 0.15 PER SIDE.  
5. DIMENSION B DOES NOT INCLUDE DAMBAR  
PROTRUSION. ALLOWABLE PROTRUSION  
SHALL BE 0.13 TOTAL IN EXCESS OF B  
DIMENSION AT MAXIMUM MATERIAL  
CONDITION.  
1
10  
MILLIMETERS  
DIM MIN  
MAX  
2.65  
0.25  
0.49  
0.32  
12.95  
7.60  
20X B  
A
A1  
B
C
D
E
2.35  
0.10  
0.35  
0.23  
12.65  
7.40  
M
S
S
B
T
0.25  
A
A
e
1.27 BSC  
H
h
10.05  
0.25  
0.50  
0
10.55  
0.75  
0.90  
7
SEATING  
PLANE  
L
18X e  
q
_
_
A1  
C
T
TSSOP−20  
DT SUFFIX  
CASE 948E−02  
ISSUE B  
20X K REF  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
M
S
S
V
0.10 (0.004)  
T U  
S
0.15 (0.006) T U  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSION A DOES NOT INCLUDE MOLD FLASH,  
PROTRUSIONS OR GATE BURRS. MOLD FLASH  
OR GATE BURRS SHALL NOT EXCEED 0.15  
(0.006) PER SIDE.  
4. DIMENSION B DOES NOT INCLUDE INTERLEAD  
FLASH OR PROTRUSION. INTERLEAD FLASH OR  
PROTRUSION SHALL NOT EXCEED 0.25 (0.010)  
PER SIDE.  
5. DIMENSION K DOES NOT INCLUDE DAMBAR  
PROTRUSION. ALLOWABLE DAMBAR  
PROTRUSION SHALL BE 0.08 (0.003) TOTAL IN  
EXCESS OF THE K DIMENSION AT MAXIMUM  
MATERIAL CONDITION.  
K
K1  
20  
11  
2X L/2  
J J1  
B
L
−U−  
PIN 1  
IDENT  
SECTION N−N  
1
10  
0.25 (0.010)  
6. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
N
S
7. DIMENSION A AND B ARE TO BE DETERMINED  
AT DATUM PLANE −W−.  
0.15 (0.006) T U  
M
A
−V−  
MILLIMETERS  
DIM MIN MAX  
INCHES  
MIN  
MAX  
0.260  
0.177  
0.047  
0.006  
0.030  
A
B
6.40  
4.30  
−−−  
6.60 0.252  
4.50 0.169  
N
C
1.20  
−−−  
D
0.05  
0.50  
0.15 0.002  
0.75 0.020  
F
F
G
H
0.65 BSC  
0.026 BSC  
DETAIL E  
0.27  
0.09  
0.09  
0.19  
0.19  
0.37  
0.011  
0.015  
0.008  
0.006  
0.012  
0.010  
J
0.20 0.004  
0.16 0.004  
0.30 0.007  
0.25 0.007  
−W−  
J1  
K
C
K1  
L
6.40 BSC  
0 8 0 8  
0.252 BSC  
G
D
M
_
_
_
_
H
DETAIL E  
0.100 (0.004)  
−T− SEATING  
PLANE  
http://onsemi.com  
7
MC74VHC373  
OUTLINE DIMENSIONS  
SOEIAJ−20  
M SUFFIX  
CASE 967−01  
ISSUE O  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DIMENSIONS D AND E DO NOT INCLUDE MOLD  
FLASH OR PROTRUSIONS AND ARE MEASURED  
AT THE PARTING LINE. MOLD FLASH OR  
PROTRUSIONS SHALL NOT EXCEED 0.15 (0.006)  
PER SIDE.  
L
E
20  
11  
Q
1
4. TERMINAL NUMBERS ARE SHOWN FOR  
REFERENCE ONLY.  
H
E
_
E
M
5. THE LEAD WIDTH DIMENSION (b) DOES NOT  
INCLUDE DAMBAR PROTRUSION. ALLOWABLE  
DAMBAR PROTRUSION SHALL BE 0.08 (0.003)  
TOTAL IN EXCESS OF THE LEAD WIDTH  
DIMENSION AT MAXIMUM MATERIAL CONDITION.  
DAMBAR CANNOT BE LOCATED ON THE LOWER  
RADIUS OR THE FOOT. MINIMUM SPACE  
BETWEEN PROTRUSIONS AND ADJACENT LEAD  
TO BE 0.46 ( 0.018).  
L
1
10  
DETAIL P  
Z
D
VIEW P  
MILLIMETERS  
INCHES  
MIN  
e
A
DIM MIN  
MAX  
2.05  
0.20  
0.50  
0.27  
12.80  
5.45  
MAX  
0.081  
0.008  
0.020  
0.011  
0.504  
0.215  
c
A
−−−  
0.05  
0.35  
0.18  
12.35  
5.10  
−−−  
0.002  
0.014  
0.007  
0.486  
0.201  
A
1
b
c
D
E
e
A
b
1
1.27 BSC  
0.050 BSC  
M
0.10 (0.004)  
0.13 (0.005)  
H
7.40  
0.50  
1.10  
8.20  
0.85  
1.50  
0.291  
0.020  
0.043  
0.323  
0.033  
0.059  
E
L
L
E
M
Q
0
10  
0
10  
_
0.035  
0.032  
_
_
_
0.70  
−−−  
0.90  
0.81  
0.028  
−−−  
1
Z
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MC74VHC373/D  

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