NBC12429 [ONSEMI]

3.3V/5V Programmable PLL Synthesized Clock Generator; 3.3V / 5V可编程PLL合成时钟发生器
NBC12429
型号: NBC12429
厂家: ONSEMI    ONSEMI
描述:

3.3V/5V Programmable PLL Synthesized Clock Generator
3.3V / 5V可编程PLL合成时钟发生器

时钟发生器
文件: 总20页 (文件大小:142K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
NBC12429  
3.3V/5VꢀProgrammable PLL  
Synthesized Clock  
Generator  
25 MHz to 400 MHz  
http://onsemi.com  
MARKING  
The NBC12429 is a general purpose, PLL based synthesized clock  
source. The VCO will operate over a frequency range of 200 MHz to  
400 MHz. The VCO frequency is sent to the N-output divider, where  
it can be configured to provide division ratios of 1, 2, 4, or 8. The VCO  
and output frequency can be programmed using the parallel or serial  
interfaces to the configuration logic. Output frequency steps of  
1.0 MHz can be achieved using a 16 MHz crystal, depending on the  
output dividers. The PLL loop filter is fully integrated and does not  
require any external components.  
DIAGRAMS  
1 28  
NBC12429  
AWLYYWW  
PLCC-28  
FN SUFFIX  
CASE 776  
Best-in-Class Output Jitter Performance, ±20 ps Peak-to-Peak  
25 MHz to 400 MHz Programmable Differential PECL Outputs  
Fully Integrated Phase-Lock-Loop with Internal Loop Filter  
Parallel Interface for Programming Counter and Output Dividers  
During Power-Up  
Minimal Frequency Overshoot  
Serial 3-Wire Programming Interface  
Crystal Oscillator Interface  
NBC12429  
AWLYYWW  
LQFP-32  
FA SUFFIX  
CASE 873A  
32  
Operating Range: V = 3.135 V to 5.25 V  
CC  
1
CMOS and TTL Compatible Control Inputs  
Drop-in Replacement for Motorola MC12429  
A
= Assembly Location  
WL = Wafer Lot  
YY = Year  
WW = Work Week  
ORDERING INFORMATION  
Device  
Package  
Shipping  
NBC12429FN  
PLCC-28  
37 Units/Rail  
NBC12429FNR2  
NBC12429FA  
PLCC-28  
LQFP-32  
LQFP-32  
500 Tape & Reel  
250 Units/Tray  
NBC12429FAR2  
2000 Tape & Reel  
Semiconductor Components Industries, LLC, 2003  
1
Publication Order Number:  
January, 2003 - Rev. 2  
NBC12429/D  
NBC12429  
+3.3 or 5.0 V  
1
PLL_V  
CC  
1 MHz  
F
REF  
PHASE  
B 16  
DETECTOR  
+3.3 or 5.0 V  
21, 25  
VCO  
V
CC  
4
XTAL1  
OSC  
24  
23  
F
9-BIT B M  
COUNTER  
B N  
(1, 2, 4, 8)  
OUT  
10-20 MHz  
F
OUT  
200-400  
MHz  
5
6
XTAL2  
20  
TEST  
OE  
LATCH  
LATCH  
28  
7
S_LOAD  
P_LOAD  
LATCH  
0
1
0
1
27  
26  
S_DATA  
2- BIT SR  
3- BIT SR  
22, 19  
9- BIT SR  
S_CLOCK  
8 16  
17, 18  
9
2
M[8:0]  
N[1:0]  
Figure 1. NBC12429 Block Diagram (28-Lead PLCC)  
25  
24  
23  
22  
21  
20  
19  
18  
17  
16  
15  
14  
13  
12  
26  
27  
28  
1
S_CLOCK  
S_DATA  
N[1]  
N[0]  
M[8]  
M[7]  
M[6]  
M[5]  
M[4]  
32 31 30 29 28 27 26 25  
24  
23  
22  
21  
20  
19  
18  
17  
N/C  
1
2
3
4
5
6
7
8
S_CLOCK  
S_DATA  
N[1]  
N[0]  
M[8]  
S_LOAD  
S_LOAD  
PLL_V  
PLL_V  
CC  
CC  
PLL_V  
M[7]  
M[6]  
M[5]  
M[4]  
CC  
2
NC  
NC  
N/C  
N/C  
3
XTAL1  
4
XTAL1  
9
10 11 12 13 14 15 16  
5
6
7
8
9
10  
11  
Figure 2. 28-Lead PLCC (Top View)  
Figure 3. 32-Lead LQFP (Top View)  
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2
NBC12429  
The following gives a brief description of the functionality of the NBC12429 Inputs and Outputs. Unless explicitly stated,  
all inputs are CMOS/TTL compatible with either pull-up or pulldown resistors. The PECL outputs are capable of driving two  
series terminated 50 W transmission lines on the incident edge.  
PIN FUNCTION DESCRIPTION  
Pin Name  
INPUTS  
XTAL1, XTAL2 Crystal Inputs  
Function  
Description  
These pins form an oscillator when connected to an external series-resonant  
crystal.  
S_LOAD*  
CMOS/TTL Serial Latch Input  
(Internal Pulldown Resistor)  
This pin loads the configuration latches with the contents of the shift registers. The  
latches will be transparent when this signal is HIGH; thus, the data must be stable  
on the HIGH-to-LOW transition of S_LOAD for proper operation.  
S_DATA*  
CMOS/TTL Serial Data Input  
(Internal Pulldown Resistor)  
This pin acts as the data input to the serial configuration shift registers.  
S_CLOCK*  
P_LOAD**  
CMOS/TTL Serial Clock Input  
(Internal Pulldown Resistor)  
This pin serves to clock the serial configuration shift registers. Data from S_DATA  
is sampled on the rising edge.  
CMOS/TTL Parallel Latch Input  
(Internal Pullup Resistor)  
This pin loads the configuration latches with the contents of the parallel inputs  
.The latches will be transparent when this signal is LOW; therefore, the parallel  
data must be stable on the LOW-to-HIGH transition of P_LOAD for proper opera-  
tion.  
M[8:0]**  
N[1:0]**  
OE**  
CMOS/TTL PLL Loop Divider  
Inputs (Internal Pullup Resistor)  
These pins are used to configure the PLL loop divider. They are sampled on the  
LOW-to-HIGH transition of P_LOAD. M[8] is the MSB, M[0] is the LSB.  
CMOS/TTL Output Divider Inputs  
(Internal Pullup Resistor)  
These pins are used to configure the output divider modulus. They are sampled  
on the LOW-to-HIGH transition of P_LOAD.  
CMOS/TTL Output Enable Input  
(Internal Pullup Resistor)  
Active HIGH Output Enable. The Enable is synchronous to eliminate possibility of  
runt pulse generation on the FOUT output.  
OUTPUTS  
F
, F  
PECL Differential Outputs  
CMOS/TTL Output  
These differential, positive-referenced ECL signals (PECL) are the outputs of the  
synthesizer.  
OUT OUT  
TEST  
The function of this output is determined by the serial configuration bits T[2:0].  
POWER  
V
CC  
Positive Supply for the Logic  
The positive supply for the internal logic and output buffer of the chip, and is con-  
nected to +3.3 V or +5.0 V.  
PLL_V  
GND  
Positive Supply for the PLL  
Negative Power Supply  
This is the positive supply for the PLL and is connected to +3.3 V or +5.0 V.  
CC  
These pins are the negative supply for the chip and are normally all connected to  
ground.  
*
When left Open, these inputs will default LOW.  
** When left Open, these inputs will default HIGH.  
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3
NBC12429  
ATTRIBUTES  
Characteristics  
Value  
75 kW  
Internal Input Pulldown Resistor  
Internal Input Pullup Resistor  
ESD Protection  
37.5 kW  
Human Body Model  
Machine Model  
Charged Device Model  
> 2 kV  
> 150 V  
> 1 kV  
Moisture Sensitivity (Note 1)  
PLCC  
LQFP  
Level 1  
Level 2  
Flammability Rating  
Transistor Count  
Oxygen Index: 28 to 34  
UL 94 V-0 @ 0.125 in  
2035  
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test  
1. For additional information, see Application Note AND8003/D.  
MAXIMUM RATINGS (Note 2)  
Symbol Parameter  
Condition 1  
GND = 0 V  
Condition 2  
Rating  
Unit  
V
V
CC  
V
I
Positive Supply  
Input Voltage  
-
6
6
GND = 0 V  
V V  
V
I
CC  
I
Output Current  
Continuous  
Surge  
-
-
50  
mA  
mA  
out  
100  
TA  
Operating Temperature Range  
-
-
-
-
0 to +70  
°C  
°C  
T
stg  
Storage Temperature Range  
-65 to +150  
q
Thermal Resistance (Junction-to-Ambient)  
0 LFPM  
28 PLCC  
28 PLCC  
63.5  
43.5  
°C/W  
°C/W  
JA  
500 LFPM  
q
q
Thermal Resistance (Junction-to-Case)  
Thermal Resistance (Junction-to-Ambient)  
std bd  
28 PLCC  
22 to 26  
°C/W  
JC  
JA  
0 LFPM  
32 LQFP  
32 LQFP  
80  
55  
°C/W  
°C/W  
500 LFPM  
q
Thermal Resistance (Junction-to-Case)  
Wave Solder  
std bd  
32 LQFP  
-
12 to 17  
265  
°C/W  
°C  
JC  
T
sol  
< 2 to 3 sec @ 248°C  
2. Maximum Ratings are those values beyond which device damage may occur.  
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4
NBC12429  
DC CHARACTERISTICS (V = 3.3 V ± 5%)  
CC  
0°C  
25°C  
Typ  
-
70°C  
Typ  
-
Min  
Typ  
Max  
Min  
Max  
Min  
Max  
Symbol  
Characteristic  
Condition  
Unit  
V
Input HIGH Voltage  
V
V
= 3.3 V  
2.0  
-
-
2.0  
-
2.0  
-
V
IH  
CC  
LVCMOS/  
LVTTL  
V
IL  
Input LOW Voltage  
= 3.3 V  
-
-
0.8  
-
-
0.8  
-
-
0.8  
V
CC  
LVCMOS/  
LVTTL  
I
Input Current  
-
-
-
1.0  
-
-
-
-
1.0  
-
-
-
-
1.0  
-
mA  
V
IN  
V
V
V
Output HIGH Voltage  
I
I
= -0.8 mA  
2.5  
2.5  
2.5  
OH  
OL  
OH  
OH  
TEST  
TEST  
Output LOW Voltage  
Output HIGH Voltage  
Output LOW Voltage  
Power Supply Current  
= 0.8 mA  
-
-
-
-
0.4  
-
-
-
-
0.4  
-
-
-
-
0.4  
V
V
V
OL  
F
OUT  
F
OUT  
V
= 3.3 V  
2.155  
1.355  
2.405 2.155  
1.605 1.355  
2.405 2.155  
1.605 1.355  
2.405  
1.605  
CC  
PECL  
(Notes 3, 4)  
V = 3.3 V  
CC  
V
PECL  
F
OUT  
F
OUT  
OL  
(Notes 3, 4)  
I
V
48  
18  
56  
22  
70  
26  
48  
18  
58  
22  
70  
26  
48  
18  
61  
22  
70  
26  
mA  
mA  
CC  
CC  
CC  
PLL_V  
3. F  
4. F  
/F  
output levels will vary 1:1 with V variation.  
outputs are terminated through a 50 W resistor to V  
OUT OUT  
CC  
/F  
- 2.0 V.  
OUT OUT  
CC  
DC CHARACTERISTICS (V = 5.0 V ± 5%)  
CC  
0°C  
Typ  
-
25°C  
Typ  
-
70°C  
Typ  
-
Min  
Max  
Min  
Max  
Min  
Max  
Symbol  
Characteristic  
Input HIGH Voltage  
Condition  
Unit  
V
IH  
V
V
= 5.0 V  
2.0  
-
2.0  
-
2.0  
-
V
CC  
CMOS/  
TTL  
V
IL  
Input LOW Voltage  
= 5.0 V  
-
-
0.8  
-
-
0.8  
-
-
0.8  
V
CC  
CMOS/  
TTL  
I
Input Current  
-
2.5  
-
-
-
-
1.0  
-
-
2.5  
-
-
-
-
-
1.0  
-
-
2.5  
-
-
-
-
-
1.0  
-
mA  
V
IN  
V
V
V
Output HIGH Voltage  
Output LOW Voltage  
Output HIGH Voltage  
TEST  
TEST  
I
I
= -0.8 mA  
OH  
OL  
OH  
OH  
= 0.8 mA  
= 5.0 V  
0.4  
0.4  
0.4  
V
OL  
F
OUT  
F
OUT  
V
3.855  
-
4.105 3.855  
4.105 3.855  
4.105  
V
CC  
PECL  
(Notes 5, 6)  
V
PECL  
Output LOW Voltage  
Power Supply Current  
F
F
V
CC  
(Notes 5, 6)  
= 5.0 V  
3.055  
-
3.305 3.055  
-
3.305 3.055  
-
3.305  
V
OL  
OUT  
OUT  
I
V
50  
19  
58  
23  
75  
27  
50  
19  
60  
23  
75  
27  
50  
19  
65  
23  
75  
27  
mA  
mA  
CC  
CC  
CC  
PLL_V  
5. F  
6. F  
/F  
output levels will vary 1:1 with V variation.  
outputs are terminated through a 50 W resistor to V  
OUT OUT  
CC  
/F  
- 2.0 volts.  
OUT OUT  
CC  
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5
NBC12429  
AC CHARACTERISTICS (V = 3.125 V to 5.25 V ± 5%; T = 0° to 70°C) (Note 8)  
CC  
A
Symbol  
Characteristic  
Condition  
Min  
Max  
Unit  
F
F
Maximum Input Frequency  
S_CLOCK (Note 7)  
Xtal Oscillator  
-
10  
10  
20  
MHz  
MAXI  
Maximum Output Frequency  
VCO (Internal)  
200  
25  
400  
400  
MHz  
MAXO  
F
OUT  
t
t
t
Maximum PLL Lock Time  
Cycle-to-Cycle Jitter (1 s)  
Setup Time  
-
-
10  
ms  
ps  
ns  
LOCK  
jitter  
s
See Applications Section  
"20  
S_DATA to S_CLOCK  
S_CLOCK to S_LOAD  
M, N to P_LOAD  
20  
20  
20  
-
-
-
t
t
Hold Time  
S_DATA to S_CLOCK  
M, N to P_LOAD  
20  
20  
-
-
ns  
ns  
h
Minimum Pulse Width  
S_LOAD  
P_LOAD  
50  
50  
-
-
pwMIN  
DCO  
t , t  
Output Duty Cycle  
Output Rise/Fall  
47.5  
175  
52.5  
425  
%
F
OUT  
20%-80%  
ps  
r
f
7. 10 MHz is the maximum frequency to load the feedback divide registers. S_CLOCK can be switched at higher frequencies when used as  
a test clock in TEST_MODE 6.  
8. F  
/F  
outputs are terminated through a 50 W resistor to V  
- 2.0 V.  
OUT OUT  
CC  
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6
NBC12429  
FUNCTIONAL DESCRIPTION  
The internal oscillator uses the external quartz crystal as  
for the output driver and the internal logic is separated from  
the power supply for the phase-locked loop to minimize  
noise induced jitter.  
the basis of its frequency reference. The output of the  
reference oscillator is divided by 16 before being sent to the  
phase detector. With a 16 MHz crystal, this provides a  
reference frequency of 1 MHz. Although this data sheet  
illustrates functionality only for a 16 MHz crystal, Table 1,  
any crystal in the 10-20 MHz range can be used, Table 3.  
The VCO within the PLL operates over a range of 200 to  
400 MHz. Its output is scaled by a divider that is configured  
by either the serial or parallel interfaces. The output of this  
loop divider is also applied to the phase detector.  
The phase detector and the loop filter force the VCO  
output frequency to be M times the reference frequency by  
adjusting the VCO control voltage. Note that for some  
values of M (either too high or too low), the PLL will not  
achieve loop lock.  
The output of the VCO is also passed through an output  
divider before being sent to the PECL output driver. This  
output divider (N divider) is configured through either the  
serial or the parallel interfaces and can provide one of four  
division ratios (1, 2, 4, or 8). This divider extends the  
performance of the part while providing a 50% duty cycle.  
The output driver is driven differentially from the output  
divider and is capable of driving a pair of transmission lines  
The configuration logic has two sections: serial and  
parallel. The parallel interface uses the values at the M[8:0]  
and N[1:0] inputs to configure the internal counters.  
Normally upon system reset, the P_LOAD input is held  
LOW until sometime after power becomes valid. On the  
LOW-to-HIGH transition of P_LOAD, the parallel inputs  
are captured. The parallel interface has priority over the  
serial interface. Internal pullup resistors are provided on the  
M[8:0] and N[1:0] inputs to reduce component count in the  
application of the chip.  
The serial interface logic is implemented with a fourteen  
bit shift register scheme. The register shifts once per rising  
edge of the S_CLOCK input. The serial input S_DATA must  
meet setup and hold timing as specified in the AC  
Characteristics section of this document. With P_LOAD  
held high, the configuration latches will capture the value of  
the shift register on the HIGH-to-LOW edge of the  
S_LOAD input. See the programming section for more  
information.  
The TEST output reflects various internal node values and  
is controlled by the T[2:0] bits in the serial data stream. See  
the programming section for more information.  
terminated into 50 W to V -2.0 V. The positive reference  
CC  
Table 1. Programming VCO Frequency Function Table  
VCO  
Frequency  
(MHz)  
256  
128  
64  
32  
16  
8
4
2
1
M8  
0
0
0
0
M7  
1
1
1
1
M6  
1
1
1
1
M5  
0
0
0
0
M4  
0
0
0
0
M3  
1
1
1
1
M2  
0
0
0
0
M1  
0
0
1
1
M0  
0
1
0
1
M Count*  
200  
201  
202  
203  
200  
201  
202  
203  
397  
398  
399  
400  
397  
398  
399  
400  
1
1
1
1
1
1
1
1
0
0
0
0
0
0
0
0
0
0
0
1
1
1
1
0
1
1
1
0
0
1
1
0
1
0
1
0
*With 16 MHz crystal.  
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7
NBC12429  
PROGRAMMING INTERFACE  
Programming the NBC12429 is accomplished by  
The input frequency and the selection of the feedback  
divider M is limited by the VCO frequency range and  
properly configuring the internal dividers to produce the  
desired frequency at the outputs. The output frequency can  
by represented by this formula:  
F . M must be configured to match the VCO frequency  
XTAL  
range of 200 to 400 MHz in order to achieve stable PLL  
operation.  
FOUT + (F  
B 16)   M B N  
(eq. 1)  
XTAL  
M
M
+ f  
VCOmin  
B (f  
XTAL  
B 16) and  
B 16)  
(eq. 3)  
(eq. 4)  
min  
where F  
is the crystal frequency, M is the loop divider  
XTAL  
+ f  
VCOmax  
B (f  
XTAL  
max  
modulus, and N is the output divider modulus. Note that it  
is possible to select values of M such that the PLL is unable  
to achieve loop lock. To avoid this, always make sure that M  
is selected to be 200 M 400 for a 16 MHz input reference.  
Assuming that a 16 MHz reference frequency is used the  
above equation reduces to:  
The value for M falls within the constraints set for PLL  
stability. If the value for M fell outside of the valid range, a  
different N value would be selected to move M in the  
appropriate direction.  
The M and N counters can be loaded either through a  
parallel or serial interface. The parallel interface is  
controlled via the P_LOAD signal such that a LOW to HIGH  
transition will latch the information present on the M[8:0]  
and N[1:0] inputs into the M and N counters. When the  
P_LOAD signal is LOW, the input latches will be  
transparent and any changes on the M[8:0] and N[1:0] inputs  
FOUT + M B N  
(eq. 2)  
Substituting the four values for N (1, 2, 4, 8) yields:  
Table 2. Programmable Output Divider Function Table  
Output Frequency  
Range (MHz)*  
200-400  
100-200  
50-100  
N1  
N0  
N Divider  
F
OUT  
will affect the F  
output pair. To use the serial port, the  
OUT  
S_CLOCK signal samples the information on the S_DATA  
line and loads it into a 14 bit shift register. Note that the  
P_LOAD signal must be HIGH for the serial load operation  
to function. The Test register is loaded with the first three  
bits, the N register with the next two, and the M register with  
the final nine bits of the data stream on the S_DATA input.  
For each register, the most significant bit is loaded first (T2,  
N1, and M8). A pulse on the S_LOAD pin after the shift  
register is fully loaded will transfer the divide values into the  
counters. The HIGH to LOW transition on the S_LOAD  
input will latch the new divide values into the counters.  
Figures 4 and 5 illustrate the timing diagram for both a  
parallel and a serial load of the NBC12429 synthesizer.  
M[8:0] and N[1:0] are normally specified once at  
power-up through the parallel interface, and then possibly  
again through the serial interface. This approach allows the  
application to come up at one frequency and then change or  
fine-tune the clock as the ability to control the serial  
interface becomes available.  
0
0
B1  
M
0
1
B2  
M
B
2
4
8
1
0
B4  
M  
B
B
1
1
B8  
M  
25-50  
*For crystal frequency of 16 MHz.  
The user can identify the proper M and N values for the  
desired frequency from the above equations. The four output  
frequency ranges established by N are 200-400 MHz,  
100-200 MHz, 50-100 MHz and 25-50 MHz, respectively.  
From these ranges, the user will establish the value of N  
required. The value of M can then be calculated based on  
equation 1. For example, if an output frequency of 131 MHz  
was desired, the following steps would be taken to identify  
the appropriate M and N values. 131 MHz falls within the  
frequency range set by an N value of 2; thus, N [1:0] = 01.  
For N = 2, F  
= M ÷ 2 and M = 2 x F  
. Therefore,  
OUT  
OUT  
M = 131 x 2 = 262, so M[8:0] = 100000110. Following this  
same procedure, a user can generate any whole frequency  
desired between 25 and 400 MHz. Note that for N > 2,  
fractional values of F  
programmable frequency steps (and thus, the indicator of  
the fractional output frequencies achievable) will be equal  
The TEST output provides visibility for one of the several  
internal nodes as determined by the T[2:0] bits in the serial  
configuration stream. It is not configurable through the  
parallel interface. The T2, T1, and T0 control bits are preset  
can be realized. The size of the  
OUT  
to ‘000’ when P_LOAD is LOW so that the PECL F  
OUT  
outputs are as jitter-free as possible. Any active signal on the  
TEST output pin will have detrimental affects on the jitter  
of the PECL output pair. In normal operations, jitter  
specifications are only guaranteed if the TEST output is  
static. The serial configuration port can be used to select one  
of the alternate functions for this pin.  
to F  
÷ 16 ÷ N.  
XTAL  
For input reference frequencies other than 16 MHz, see  
Table 3, which shows the usable VCO frequency and M  
divider range.  
http://onsemi.com  
8
NBC12429  
Table 3. NBC12429 Frequency Operating Range  
Output Frequency for F  
=
XTAL  
16 MHz and for N =  
VCO Frequency Range for a Crystal Frequency of:  
M
M[8:0]  
10  
12  
14  
16  
18  
20  
1
2
4
8
160  
170  
180  
190  
200  
210  
220  
230  
240  
250  
260  
270  
280  
290  
300  
310  
320  
330  
340  
350  
360  
370  
380  
390  
400  
410  
420  
430  
440  
450  
460  
470  
480  
490  
500  
510  
010100000  
010101010  
010110100  
010111110  
011001000  
011010010  
011011100  
011100110  
011110000  
011111010  
100000100  
100001110  
100011000  
100100010  
100101100  
100110110  
101000000  
101001010  
101010100  
101011110  
101101000  
101110010  
101111100  
110000110  
110010000  
110011010  
110100100  
110101110  
110111000  
111000010  
111001100  
111010110  
111100000  
111101010  
111110100  
111111110  
200  
212.5  
225  
202.5  
213.75  
225  
237.5  
250  
200  
210  
220  
230  
240  
250  
260  
270  
280  
290  
300  
310  
320  
330  
340  
350  
360  
370  
380  
390  
400  
200  
210  
220  
230  
240  
250  
260  
270  
280  
290  
300  
310  
320  
330  
340  
350  
360  
370  
380  
390  
400  
100  
105  
110  
115  
120  
125  
130  
135  
140  
145  
150  
155  
160  
165  
170  
175  
180  
185  
190  
195  
200  
50  
52.5  
55  
25  
236.25  
247.5  
258.75  
270  
262.5  
275  
26.25  
27.5  
28.75  
30  
201.25  
210  
287.5  
300  
57.5  
60  
218.75  
227.5  
236.25  
245  
281.25  
292.5  
303.75  
315  
312.5  
325  
62.5  
65  
31.25  
32.5  
33.75  
35  
202.5  
210  
337.5  
350  
67.5  
70  
217.5  
225  
253.75  
262.5  
271.25  
280  
326.25  
337.5  
348.75  
360  
362.5  
375  
72.5  
75  
36.25  
37.5  
38.75  
40  
232.5  
240  
387.5  
400  
77.5  
80  
200  
206.25  
212.5  
218.75  
225  
247.5  
255  
288.75  
297.5  
306.25  
315  
371.25  
382.5  
393.75  
82.5  
85  
41.25  
42.5  
43.75  
45  
262.5  
270  
87.5  
90  
231.25  
237.5  
243.75  
250  
277.5  
285  
323.75  
332.5  
341.25  
350  
92.5  
95  
46.25  
47.5  
48.75  
50  
292.5  
300  
97.5  
100  
256.25  
262.5  
268.75  
275  
307.5  
315  
358.75  
367.5  
376.25  
385  
322.5  
330  
281.25  
287.5  
293.75  
300  
337.5  
345  
393.75  
352.5  
360  
306.25  
312.5  
318.75  
367.5  
375  
382.5  
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9
NBC12429  
Most of the signals available on the TEST output pin are  
T2  
T1  
T0  
TEST (Pin 20)  
useful only for performance verification of the NBC12429  
itself. However, the PLL bypass mode may be of interest at  
the board level for functional debug. When T[2:0] is set to  
110, the NBC12429 is placed in PLL bypass mode. In this  
mode the S_CLOCK input is fed directly into the M and N  
0
0
0
0
1
1
1
1
0
0
1
1
0
0
1
1
0
1
0
1
0
1
0
1
SHIFT REGISTER OUT  
HIGH  
F
REF  
M COUNTER OUT  
F
OUT  
LOW  
PLL BYPASS  
dividers. The N divider drives the F  
differential pair and  
OUT  
the M counter drives the TEST output pin. In this mode the  
S_CLOCK input could be used for low speed board level  
functional test or debug. Bypassing the PLL and driving  
F
OUT  
B 4  
F
OUT  
directly gives the user more control on the test clocks  
sent through the clock tree. Figure 6 shows the functional  
setup of the PLL bypass mode. Because the S_CLOCK is a  
CMOS level the input frequency is limited to 250 MHz or  
M[8:0]  
N[1:0]  
M, N  
less. This means the fastest the F  
pin can be toggled via  
P_LOAD  
OUT  
the S_CLOCK is 250 MHz as the minimum divide ratio of  
the N counter is 1. Note that the M counter output on the  
TEST output will not be a 50% duty cycle due to the way the  
divider is implemented.  
Figure 4. Parallel Interface Timing Diagram  
S_CLOCK  
M0  
T2 T1 T0 N1 N0 M8 M7 M6 M5 M4 M3 M2 M1  
First  
S_DATA  
S_LOAD  
Last  
Bit  
Bit  
Figure 5. Serial Interface Timing Diagram  
FREF  
VCO_CLK  
PLL 12429  
MCNT  
0
1
FOUT  
(VIA ENABLE GATE)  
N B  
(1, 2, 4, 8)  
SCLOCK  
SEL_CLK  
M COUNTER  
FDIV4  
7
MCNT  
LOW  
LATCH  
Reset  
TEST  
MUX  
FOUT  
MCNT  
FREF  
HIGH  
TEST  
SHIFT  
REG  
14- BIT  
SLOAD  
SDATA  
0
PLOAD  
T0  
T1  
T2  
DECODE  
T2=T1=1, T0=0: Test Mode  
SCLOCK is selected, MCNT is on TEST output, SCLOCK B N is on FOUT pin.  
PLOAD acts as reset for test pin latch. When latch reset, T2 data is shifted out TEST pin.  
Figure 6. Serial Test Clock Block Diagram  
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10  
NBC12429  
APPLICATIONS INFORMATION  
Using the On-Board Crystal Oscillator  
Power Supply Filtering  
The NBC12429 features a fully integrated on-board  
crystal oscillator to minimize system implementation costs.  
The oscillator is a series resonant, multivibrator type design  
as opposed to the more common parallel resonant oscillator  
design. The series resonant design provides better stability  
and eliminates the need for large on chip capacitors. The  
oscillator is totally self contained so that the only external  
component required is the crystal. As the oscillator is  
somewhat sensitive to loading on its inputs, the user is  
advised to mount the crystal as close to the NBC12429 as  
possible to avoid any board level parasitics. To facilitate  
co-location, surface mount crystals are recommended, but  
not required. Because the series resonant design is affected  
by capacitive loading on the crystal terminals, loading  
variation introduced by crystals from different vendors  
could be a potential issue. For crystals with a higher shunt  
capacitance, it may be required to place a resistance across  
the terminals to suppress the third harmonic. Although  
typically not required, it is a good idea to layout the PCB  
with the provision of adding this external resistor. The  
resistor value will typically be between 500 W and 1 KW.  
The oscillator circuit is a series resonant circuit and thus,  
for optimum performance, a series resonant crystal should  
be used. Unfortunately, most crystals are characterized in a  
parallel resonant mode. Fortunately, there is no physical  
difference between a series resonant and a parallel resonant  
crystal. The difference is purely in the way the devices are  
characterized. As a result, a parallel resonant crystal can be  
used with the NBC12429 with only a minor error in the  
desired frequency. A parallel resonant mode crystal used in  
a series resonant circuit will exhibit a frequency of  
oscillation a few hundred ppm lower than specified (a few  
hundred ppm translates to kHz inaccuracies). In a general  
computer application, this level of inaccuracy is immaterial.  
Table 4 below specifies the performance requirements of the  
crystals to be used with the NBC12429.  
The NBC12429 is a mixed analog/digital product and as  
such, it exhibits some sensitivities that would not necessarily  
be seen on a fully digital product. Analog circuitry is  
naturally susceptible to random noise, especially if this noise  
is seen on the power supply pins. The NBC12429 provides  
separate power supplies for the digital circuitry (V ) and  
CC  
the internal PLL (PLL_V ) of the device. The purpose of  
CC  
this design technique is to try and isolate the high switching  
noise of the digital outputs from the relatively sensitive  
internal analog phase-locked loop. In a controlled  
environment such as an evaluation board, this level of  
isolation is sufficient. However, in a digital system  
environment where it is more difficult to minimize noise on  
the power supplies, a second level of isolation may be  
required. The simplest form of isolation is a power supply  
filter on the PLL_V pin for the NBC12429.  
CC  
Figure 7 illustrates a typical power supply filter scheme.  
The NBC12429 is most susceptible to noise with spectral  
content in the 1 KHz to 1 MHz range. Therefore, the filter  
should be designed to target this range. The key parameter  
that needs to be met in the final filter design is the DC voltage  
drop that will be seen between the V supply and the  
CC  
PLL_V pin of the NBC12429. From the data sheet, the  
CC  
PLL_V  
PLL_V  
current (the current sourced through the  
pin) is typically 23 mA (27 mA maximum).  
CC  
CC  
Assuming that a minimum of 2.8 V must be maintained on  
the PLL_V pin, very little DC voltage drop can be  
CC  
tolerated when a 3.3 V V supply is used. The resistor  
CC  
shown in Figure 7 must have a resistance of 10-15 W to meet  
the voltage drop criteria. The RC filter pictured will provide  
a broadband filter with approximately 100:1 attenuation for  
noise whose spectral content is above 20 KHz. As the noise  
frequency crosses the series resonant point of an individual  
capacitor, it’s overall impedance begins to look inductive  
and thus increases with increasing frequency. The parallel  
capacitor combination shown ensures that a low impedance  
path to ground exists for frequencies well above the  
bandwidth of the PLL.  
Table 4. Crystal Specifications  
Parameter  
Value  
Fundamental AT Cut  
Series Resonance*  
±75 ppm at 25°C  
±150 ppm 0 to 70°C  
0 to 70°C  
3.3 V or  
5.0 V  
3.3 V or  
5.0 V  
Crystal Cut  
Resonance  
L=1000 mH  
R=15 W  
R = 10-15 W  
Frequency Tolerance  
Frequency/Temperature Stability  
Operating Range  
S
PLL_V  
CC  
22 mF  
NBC12429  
0.01 mF  
Shunt Capacitance  
5-7 pF  
Equivalent Series Resistance (ESR)  
Correlation Drive Level  
Aging  
50 to 80 W  
V
CC  
100 mW  
0.01 mF  
5 ppm/Yr  
(First 3 Years)  
* See accompanying text for series versus parallel resonant  
discussion.  
Figure 7. Power Supply Filter  
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11  
NBC12429  
A higher level of attenuation can be achieved by replacing  
between V  
and GND for the bypass capacitors.  
CC  
the resistor with an appropriate valued inductor. Figure 7  
shows a 1000 mH choke. This value choke will show a  
significant impedance at 10 KHz frequencies and above.  
Because of the current draw and the voltage that must be  
Combining good quality general purpose chip capacitors  
with good PCB layout techniques will produce effective  
capacitor resonances at frequencies adequate to supply the  
instantaneous switching current for the NBC12429 outputs.  
It is imperative that low inductance chip capacitors are used.  
It is equally important that the board layout not introduce  
any of the inductance saved by using the leadless capacitors.  
Thin interconnect traces between the capacitor and the  
power plane should be avoided and multiple large vias  
should be used to tie the capacitors to the buried power  
planes. Fat interconnect and large vias will help to minimize  
layout induced inductance and thus maximize the series  
resonant point of the bypass capacitors.  
maintained on the PLL_V  
pin, a low DC resistance  
CC  
inductor is required (less than 15 W). Generally, the  
resistor/capacitor filter will be cheaper, easier to implement,  
and provide an adequate level of supply filtering.  
The NBC12429 provides sub-nanosecond output edge  
rates and therefore a good power supply bypassing scheme  
is a must. Figure 8 shows a representative board layout for  
the NBC12429. There exists many different potential board  
layouts and the one pictured is but one. The important aspect  
of the layout in Figure 8 is the low impedance connections  
C1  
C1  
R1  
1
C3  
C2  
R1 = 10-15 W  
C1 = 0.01 mF  
C2 = 22 mF  
C3 = 0.1 mF  
Xtal  
= V  
CC  
= GND  
= Via  
Figure 8. PCB Board Layout for NBC12429 (28 PLCC)  
Note the dotted lines circling the crystal oscillator  
connection to the device. The oscillator is a series resonant  
circuit and the voltage amplitude across the crystal is  
relatively small. It is imperative that no actively switching  
signals cross under the crystal as crosstalk energy coupled  
to these lines could significantly impact the jitter of the  
device. Special attention should be paid to the layout of the  
crystal to ensure a stable, jitter free interface between the  
crystal and the on-board oscillator. Note the provisions for  
placing a resistor across the crystal oscillator terminals as  
discussed in the crystal oscillator section of this data sheet.  
Although the NBC12429 has several design features to  
minimize the susceptibility to power supply noise (isolated  
power and grounds and fully differential PLL), there still  
may be applications in which overall performance is being  
degraded due to system power supply noise. The power  
supply filter and bypass schemes discussed in this section  
should be adequate to eliminate power supply noise-related  
problems in most designs.  
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12  
NBC12429  
Jitter Performance of the NBC12429  
Care must be taken that the measured edge is the edge  
immediately following the trigger edge. These scopes can  
also store a finite number of period durations and  
post-processing software can analyze the data to find the  
maximum and minimum periods.  
Jitter is a common parameter associated with clock  
generation and distribution. Clock jitter can be defined as the  
deviation in a clock’s output transition from its ideal  
position.  
Cycle-to-Cycle Jitter (short-term) is the period  
variation between two adjacent cycles over a defined  
number of observed cycles. The number of cycles observed  
is application dependent but the JEDEC specification is  
1000 cycles.  
Recent hardware and software developments have  
resulted in advanced jitter measurement techniques. The  
Tektronix TDS-series oscilloscopes have superb jitter  
analysis capabilities on non-contiguous clocks with their  
histogram and statistics capabilities. The Tektronix  
TDSJIT2/3 Jitter Analysis software provides many key  
timing parameter measurements and will extend that  
capability by making jitter measurements on contiguous  
clock and data cycles from single-shot acquisitions.  
M1 by Amherst was used as well and both test methods  
correlated.  
T
0
T
1
This test process can be correlated to earlier test methods  
and is more accurate. All of the jitter data reported on the  
NBC12429 was collected in this manner. Figure 11 shows  
the jitter as a function of the output frequency. The graph  
shows that for output frequencies from 25 to 400 MHz the  
jitter falls within the "20 ps peak-to-peak specification.  
The general trend is that as the output frequency is increased,  
the output edge jitter will decrease.  
T
= T - T  
1 0  
JITTER(cycle- cycle)  
Figure 9. Cycle-to-Cycle Jitter  
Peak-to-Peak Jitter is the difference between the  
highest and lowest acquired value and is represented as the  
width of the Gaussian base.  
Figure 12 illustrates the RMS jitter performance of the  
NBC12429 across its specified VCO frequency range. Note  
that the jitter is a function of both the output frequency as  
well as the VCO frequency. However, the VCO frequency  
shows a much stronger dependence. The data presented has  
not been compensated for trigger jitter.  
RMS  
or one  
Sigma  
Jitter  
Long-Term Period Jitter is the maximum jitter  
observed at the end of a period’s edge when compared to the  
position of the perfect reference clock’s edge and is specified  
by the number of cycles over which the jitter is measured.  
The number of cycles used to look for the maximum jitter  
varies by application but the JEDEC spec is 10,000 observed  
cycles.  
The NBC12429 exhibits long term and cycle-to-cycle  
jitter, which rivals that of SAW based oscillators. This jitter  
performance comes with the added flexibility associated  
with a synthesizer over a fixed frequency oscillator. The  
jitter data presented should provide users with enough  
information to determine the effect on their overall timing  
budget. The jitter performance meets the needs of most  
system designs while adding the flexibility of frequency  
margining and field upgrades. These features are not  
available with a fixed frequency SAW oscillator.  
Typical  
Time  
Gaussian  
Distribution  
Figure 10. Peak-to-Peak Jitter  
There are different ways to measure jitter and often they  
are confused with one another. The typical method of  
measuring jitter is to look at the timing signal with an  
oscilloscope and observe the variations in period-to-period  
or cycle-to-cycle. If the scope is set up to trigger on every  
rising or falling edge, set to infinite persistence mode and  
allowed to trace sufficient cycles, it is possible to determine  
the maximum and minimum periods of the timing signal.  
Digital scopes can accumulate a large number of cycles,  
create a histogram of the edge placements and record  
peak-to-peak as well as standard deviations of the jitter.  
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13  
NBC12429  
25  
25  
20  
15  
10  
5
20  
15  
10  
N = 8  
N = 4  
250  
5
0
N = 1  
N = 2  
0
200  
300  
350  
400  
50  
100  
150  
200  
250  
300  
350 400  
VCO FREQUENCY (MHz)  
OUTPUT FREQUENCY (MHz)  
Figure 12. RMS Jitter vs. Output Frequency  
Figure 11. RMS Jitter vs. VCO Frequency  
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14  
NBC12429  
S_DATA  
S_CLOCK  
t
HOLD  
t
SET- UP  
Figure 13. Set-Up and Hold  
S_DATA  
S_LOAD  
t
HOLD  
t
SET- UP  
Figure 14. Set-Up and Hold  
M[8:0]  
N[1:0]  
P_  
LOAD  
t
HOLD  
t
SET- UP  
Figure 15. Set-Up and Hold  
F
F
OUT  
OUT  
Pulse Width  
t
tpw  
tPERIOD  
PERIOD  
DCO +  
Figure 16. Output Duty Cycle  
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15  
NBC12429  
F
F
OUT  
D
D
Receiver  
Device  
Driver  
Device  
OUT  
50  
TT  
50  
W
W
V
TT  
V
V
=
- 2.0 V  
CC  
Figure 17. Typical Termination for Output Driver and Device Evaluation  
(See Application Note AND8020 - Termination of ECL Logic Devices.)  
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16  
NBC12429  
PACKAGE DIMENSIONS  
PLCC-28  
FN SUFFIX  
PLASTIC PLCC PACKAGE  
CASE 776-02  
ISSUE E  
M
S
S
0.007 (0.180)  
T
L−M  
N
B
Z
Y BRK  
D
-N-  
M
S
S
N
0.007 (0.180)  
T
L−M  
U
-M-  
-L-  
W
D
S
S
S
N
0.010 (0.250)  
T
L−M  
X
G1  
V
28  
1
VIEW D-D  
M
S
S
S
A
0.007 (0.180)  
0.007 (0.180)  
T
L−M  
L−M  
N
M
S
S
N
0.007 (0.180)  
T
L−M  
H
Z
M
S
T
N
R
K1  
C
E
0.004 (0.100)  
G
K
SEATING  
PLANE  
-T-  
J
M
S
S
N
0.007 (0.180)  
T
L−M  
F
VIEW S  
G1  
S
S
S
N
0.010 (0.250)  
T
L−M  
VIEW S  
NOTES:  
INCHES  
MILLIMETERS  
1. DATUMS −L−, −M−, AND −N− DETERMINED  
WHERE TOP OF LEAD SHOULDER EXITS  
PLASTIC BODY AT MOLD PARTING LINE.  
2. DIMENSION G1, TRUE POSITION TO BE  
MEASURED AT DATUM −T−, SEATING PLANE.  
3. DIMENSIONS R AND U DO NOT INCLUDE  
MOLD FLASH. ALLOWABLE MOLD FLASH IS  
0.010 (0.250) PER SIDE.  
DIM MIN  
MAX  
0.495  
0.495  
0.180  
0.110  
0.019  
MIN  
12.32  
12.32  
4.20  
MAX  
12.57  
12.57  
4.57  
A
B
C
E
F
0.485  
0.485  
0.165  
0.090  
0.013  
2.29  
0.33  
2.79  
0.48  
G
H
J
0.050 BSC  
1.27 BSC  
4. DIMENSIONING AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
0.026  
0.020  
0.025  
0.450  
0.450  
0.042  
0.042  
0.042  
−−−  
0.032  
−−−  
−−−  
0.66  
0.51  
0.64  
11.43  
11.43  
1.07  
1.07  
1.07  
−−−  
0.81  
−−−  
5. CONTROLLING DIMENSION: INCH.  
6. THE PACKAGE TOP MAY BE SMALLER THAN  
THE PACKAGE BOTTOM BY UP TO 0.012  
(0.300). DIMENSIONS R AND U ARE  
DETERMINED AT THE OUTERMOST  
EXTREMES OF THE PLASTIC BODY  
EXCLUSIVE OF MOLD FLASH, TIE BAR  
BURRS, GATE BURRS AND INTERLEAD  
FLASH, BUT INCLUDING ANY MISMATCH  
BETWEEN THE TOP AND BOTTOM OF THE  
PLASTIC BODY.  
K
R
U
V
W
X
Y
Z
−−−  
0.456  
0.456  
0.048  
0.048  
0.056  
0.020  
10  
11.58  
11.58  
1.21  
1.21  
1.42  
0.50  
10  
2
2
_
_
_
_
G1 0.410  
K1 0.040  
0.430  
−−−  
10.42  
1.02  
10.92  
−−−  
7. DIMENSION H DOES NOT INCLUDE DAMBAR  
PROTRUSION OR INTRUSION. THE DAMBAR  
PROTRUSION(S) SHALL NOT CAUSE THE H  
DIMENSION TO BE GREATER THAN 0.037  
(0.940). THE DAMBAR INTRUSION(S) SHALL  
NOT CAUSE THE H DIMENSION TO BE  
SMALLER THAN 0.025 (0.635).  
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17  
NBC12429  
PACKAGE DIMENSIONS  
LQFP-32  
FA SUFFIX  
PLASTIC LQFP PACKAGE  
CASE 873A-02  
ISSUE A  
4X  
A
A1  
0.20 (0.008) AB T−U  
Z
32  
25  
1
AE  
AE  
-U-  
-T-  
P
B
V
B1  
DETAIL Y  
-Z-  
BASE  
METAL  
DETAIL Y  
V1  
17  
8
N
9
4X  
0.20 (0.008) AC T−U  
Z
9
F
D
S1  
S
_
8X M  
J
R
DETAIL AD  
G
SECTION AE-AE  
-AB-  
-AC-  
E
C
SEATING  
PLANE  
0.10 (0.004) AC  
W
_
Q
H
K
X
DETAIL AD  
NOTES:  
1. DIMENSIONING AND TOLERANCING PER ANSI  
Y14.5M, 1982.  
2. CONTROLLING DIMENSION: MILLIMETER.  
3. DATUM PLANE −AB− IS LOCATED AT BOTTOM OF  
LEAD AND IS COINCIDENT WITH THE LEAD  
WHERE THE LEAD EXITS THE PLASTIC BODY AT  
THE BOTTOM OF THE PARTING LINE.  
4. DATUMS −T−, −U−, AND −Z− TO BE DETERMINED  
AT DATUM PLANE −AB−.  
MILLIMETERS  
DIM MIN MAX  
7.000 BSC  
3.500 BSC  
INCHES  
MIN MAX  
0.276 BSC  
A
A1  
B
0.138 BSC  
0.276 BSC  
0.138 BSC  
7.000 BSC  
3.500 BSC  
B1  
C
1.400  
1.600  
0.450  
1.450  
0.400  
0.055  
0.063  
0.018  
0.057  
0.016  
D
0.300  
1.350  
0.300  
0.012  
0.053  
0.012  
E
5. DIMENSIONS S AND V TO BE DETERMINED AT  
SEATING PLANE −AC−.  
F
G
H
0.800 BSC  
0.031 BSC  
6. DIMENSIONS A AND B DO NOT INCLUDE MOLD  
PROTRUSION. ALLOWABLE PROTRUSION IS  
0.250 (0.010) PER SIDE. DIMENSIONS A AND B  
DO INCLUDE MOLD MISMATCH AND ARE  
DETERMINED AT DATUM PLANE −AB−.  
7. DIMENSION D DOES NOT INCLUDE DAMBAR  
PROTRUSION. DAMBAR PROTRUSION SHALL  
NOT CAUSE THE D DIMENSION TO EXCEED  
0.520 (0.020).  
0.050  
0.090  
0.500  
0.150  
0.200  
0.700  
0.002  
0.004  
0.020  
0.006  
0.008  
0.028  
J
K
_
12 REF  
_
12 REF  
M
N
0.090  
0.160  
0.004  
0.006  
P
0.400 BSC  
1_  
0.016 BSC  
1_  
Q
R
5_  
5_  
0.150  
0.250  
0.006  
0.010  
S
9.000 BSC  
0.354 BSC  
8. MINIMUM SOLDER PLATE THICKNESS SHALL BE  
0.0076 (0.0003).  
9. EXACT SHAPE OF EACH CORNER MAY VARY  
FROM DEPICTION.  
S1  
V
4.500 BSC  
9.000 BSC  
4.500 BSC  
0.200 REF  
1.000 REF  
0.177 BSC  
0.354 BSC  
0.177 BSC  
0.008 REF  
0.039 REF  
V1  
W
X
http://onsemi.com  
18  
NBC12429  
Notes  
http://onsemi.com  
19  
NBC12429  
ON Semiconductor and  
are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC reserves the right to make  
changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any  
particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all  
liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or  
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be  
validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others.  
SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications  
intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death  
may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC  
and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees  
arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that  
SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer.  
PUBLICATION ORDERING INFORMATION  
Literature Fulfillment:  
JAPAN: ON Semiconductor, Japan Customer Focus Center  
2-9-1 Kamimeguro, Meguro-ku, Tokyo, Japan 153-0051  
Phone: 81-3-5773-3850  
Literature Distribution Center for ON Semiconductor  
P.O. Box 5163, Denver, Colorado 80217 USA  
Phone: 303-675-2175 or 800-344-3860 Toll Free USA/Canada  
Fax: 303-675-2176 or 800-344-3867 Toll Free USA/Canada  
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For additional information, please contact your local  
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