NOIV2SE2000A-QDC [ONSEMI]
VITA 2000 2.3 Megapixel 92 FPS Global Shutter CMOS Image Sensor;
| 型号： | NOIV2SE2000A-QDC |
| 厂家： | 
ONSEMI |
| 描述： | VITA 2000 2.3 Megapixel 92 FPS Global Shutter CMOS Image Sensor |
| 文件： | 总77页 (文件大小：814K) |
| 中文： | 中文翻译 | 下载： | 下载PDF数据表文档文件 |
NOIV1SN2000A,
NOIV2SN2000A
VITA 2000 2.3 Megapixel
92 FPS Global Shutter
CMOS Image Sensor
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Features
• WUXGA Resolution: 1920 (H) x 1200 (V) Format
• 4.8 mm x 4.8 mm Pixel Size
• 2/3 inch Optical Format
• Monochrome (SN) or Color (SE)
• 92 Frames per Second (fps) at Full Resolution (LVDS)
• 23 Frames per Second (fps) at Full Resolution (CMOS)
• On-chip 10-bit Analog-to-Digital Converter (ADC)
• 8-bit or 10-bit Output Mode
• Four LVDS Serial Outputs or Parallel CMOS Output
• Random Programmable Region of Interest (ROI) Readout
• Pipelined and Triggered Global Shutter, Rolling Shutter
• On-chip Fixed Pattern Noise (FPN) Correction
• Serial Peripheral Interface (SPI)
• Automatic Exposure Control (AEC)
• Phase Locked Loop (PLL)
Figure 1. VITA 2000 Package Photograph
• High Dynamic Range (HDR)
• Dual Power Supply (3.3 V and 1.8 V)
• 0°C to 70°C Operational Temperature Range*
• 52-pin LCC
• 520 mW Power Dissipation (LVDS)
• 385 mW Power Dissipation (CMOS)
• These Devices are Pb−Free and are RoHS Compliant
Applications
• Machine Vision
• Motion Monitoring
• Security
• Barcode Scanning (2D)
Description
The VITA 2000 is a 2/3 inch Widescreen Ultra eXtended Graphics Array (WUXGA) CMOS image sensor configurable in HD
format (1920 x 1080) or 4:3 format (1600 X 1200).
The high sensitivity 4.8 mm x 4.8 mm pixels support pipelined and triggered global shutter readout modes and can also be
operated in a low noise rolling shutter mode. In rolling shutter mode, the sensor supports correlated double sampling readout,
reducing noise and increasing the dynamic range.
The sensor has on-chip programmable gain amplifiers and 10-bit A/D converters. The integration time and gain parameters
can be reconfigured without any visible image artifact. Optionally the on-chip automatic exposure control loop (AEC) controls
these parameters dynamically. The image’s black level is either calibrated automatically or can be adjusted by adding a user
programmable offset.
A high level of programmability using a four wire serial peripheral interface enables the user to read out specific regions
of interest. Up to 8 regions can be programmed, achieving even higher frame rates.
The image data interface of the V1-SN/SE part consists of four LVDS lanes, facilitating frame rates up to 92 frames per
second. Each channel runs at 620 Mbps. A separate synchronization channel containing payload information is provided to
facilitate the image reconstruction at the receive end. The V2-SN/SE part provides a parallel CMOS output interface at reduced
frame rate.
The VITA 2000 is packaged in a 52-pin LCC package and is available in a monochrome and color version.
Contact your local ON Semiconductor office for more information.
*Extended temperature range in Q4, 2013
© Semiconductor Components Industries, LLC, 2014
1
Publication Order Number:
December, 2016 − Rev. 6
NOIV1SN2000A/D
NOIV1SN2000A, NOIV2SN2000A
ORDERING INFORMATION
Part Number
Mono/Color
LVDS Interface mono
LVDS Interface color
Package
NOIV1SN2000A-QDC
NOIV1SE2000A-QDC
NOIV2SN2000A-QDC
NOIV2SE2000A-QDC
52−pin LCC
CMOS Interface mono
CMOS Interface color
The V1-SN/SE base part is used to reference the mono and
color versions of the LVDS interface; the V2-SN/SE base
part is used to reference the mono and color versions of the
CMOS interface.
ORDERING CODE DEFINITION
PACKAGE MARK
Following is the mark on the bottom side of the package with Pin 1 to the left center
Line 1: NOI xxxx 2000A where xxxx denotes LVDS (V1) / CMOS (V2), mono micro lens (SN) /color micro lens (SE) option
Line 2: -QDC
Line 3: AWLYYWW
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NOIV1SN2000A, NOIV2SN2000A
CONTENTS
Features . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
1
1
1
2
2
2
3
4
8
Sensor Operation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 15
Applications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . . .
Ordering Code Definition . . . . . . . . . . . . . . . . . . . . . .
Package Mark . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Specifications . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Overview . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Image Sensor Timing and Readout . . . . . . . . . . . . . . 29
Additional Features . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Data Output Format . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Register Map . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 50
Package Information . . . . . . . . . . . . . . . . . . . . . . . . . . 66
Specifications and Useful References . . . . . . . . . . . . . 73
Silicon Errata . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 74
Acronyms . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 75
Glossary . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 76
Operating Modes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 12
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NOIV1SN2000A, NOIV2SN2000A
SPECIFICATIONS
Key Specifications
Table 1. GENERAL SPECIFICATIONS
Table 2. ELECTRO−OPTICAL SPECIFICATIONS
Parameter
Pixel type
Specification
Parameter
Active pixels
Specification
Full Resolution: 1920 (H) x 1200 (V)
4.8 mm x 4.8 mm
Global shutter pixel architecture
Shutter type
Pipelined and triggered global shutter,
rolling shutter
Pixel size
Optical format
Conversion gain
2/3 inch
Frame rate
at full resolution
V1-SN/SE: 92 fps
V2-SN/SE: 23 fps
-
0.072 LSB10/e
85 mV/e
-
Master clock
V1-SN/SE:
62 MHz when PLL is used,
310 MHz (10-bit) / 248 MHz (8-bit)
when PLL is not used
-
Dark noise
2.2 LSB10, 30e in global shutter
-
0.9 LSB10, 14e in rolling shutter
2
Responsivity at 550 nm
24 LSB10 /nJ/cm , 4.6 V/lux.s
V2-SN/SE: 62 MHz
Parasitic Light
<1/450
Windowing
8 Randomly programmable windows.
Normal, sub-sampled and binned read-
out modes
Sensitivity (PLS)
-
Full well charge
Quantum efficiency
Pixel FPN
13700 e
[1]
53% at 550 nm
ADC resolution
LVDS outputs
CMOS outputs
10-bit, 8-bit
rolling shutter: 0.5 LSB10
global shutter: 1.0 LSB10
V1-SN/SE: 4 data + sync + clock
V2-SN/SE: 10-bit parallel output,
frame_valid, line_valid, clock
PRNU
< 2% of signal
Data rate
V1-SN/SE:
MTF
60% @ 630 nm - X-dir & Y-dir
4 x 620 Mbps (10-bit)
4 x 496 Mbps (8-bit)
V2-SN/SE: 62 MHz
-
PSNL @ 25°C
Dark signal @ 25°C
Dynamic range
100 LSB10/s, 1360 e /s
-
4.5 e /s, 0.33 LSB10/s
60 dB in rolling shutter mode
53 dB in global shutter mode
Power dissipation
Package type
520 mW for V1-SN/SE in 10-bit mode
385 mW for V2-SN/SE
Signal to Noise Ratio
(SNR max)
41 dB
52-pin LCC
Table 3. RECOMMENDED OPERATING RATINGS (Note 2)
Symbol Description
Operating temperature range
Min
Max
Units
T
J
0
70
°C
Table 4. ABSOLUTE MAXIMUM RATINGS (Notes 3 and 4)
Symbol
Parameter
ABS rating for 1.8 V supply group
ABS rating for 3.3 V supply group
ABS storage temperature range
ABS storage humidity range at 85°C
Min
–0.5
–0.5
0
Max
2.2
4.3
150
85
Units
V
ABS (1.8 V supply group)
ABS (3.3 V supply group)
V
T
S
°C
%RH
V
Electrostatic discharge (ESD)
Human Body Model (HBM): JS−001−2010
Charged Device Model (CDM): JESD22−C101
Latch-up: JESD−78
2000
500
LU
140
mA
Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the
Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect
device reliability.
1. The ADC is 11−bit, down−scaled to 10−bit. The VITA 2000 uses a larger word−length internally to provide 10−bit on the output.
2. Operating ratings are conditions in which operation of the device is intended to be functional.
3. ON Semiconductor recommends that customers become familiar with, and follow the procedures in JEDEC Standard JESD625−A. Refer
to Application Note AN52561. Long term exposure toward the maximum storage temperature will accelerate color filter degradation.
4. Caution needs to be taken to avoid dried stains on the underside of the glass due to condensation. The glass lid glue is permeable and can
absorb moisture if the sensor is placed in a high % RH environment.
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NOIV1SN2000A, NOIV2SN2000A
Table 5. ELECTRICAL SPECIFICATIONS
Boldface limits apply for T = T
to T
, all other limits T = +30°C. (Notes 5, 6 and 7)
J
MIN
MAX
J
Parameter
Description
Min
3.0
1.6
Typ
Max
3.6
Units
Power Supply Parameters - V1-SN/SE LVDS
vdd_33
Idd_33
vdd_18
Idd_18
vdd_pix
Ptot
Supply voltage, 3.3 V
3.3
125
1.8
60
V
mA
V
Current consumption 3.3 V supply
Supply voltage, 1.8 V
2.0
Current consumption 1.8 V supply
Supply voltage, pixel
mA
V
3.0
3.3
520
3.6
700
50
Total power consumption at vdd_33 = 3.3 V, vdd_18 = 1.8 V
300
mW
mW
Pstby_lp
Power consumption in low power standby mode. (See Silicon Errata
on page 74)
Popt
Power consumption at lower pixel rates
Configurable
Power Supply Parameters - V2-SN/SE CMOS
vdd_33
Idd_33
vdd_18
Idd_18
vdd_pix
Ptot
Supply voltage, 3.3 V
3.0
1.6
3.3
110
1.8
10
3.6
2.0
V
mA
V
Current consumption 3.3 V supply
Supply voltage, 1.8 V
Current consumption 1.8 V supply
Supply voltage, pixel
mA
V
3.0
3.3
385
3.6
500
50
Total power consumption
285
mW
mW
Pstby_lp
Power consumption in low power standby mode. (See Silicon Errata
on page 74)
Popt
Power consumption at lower pixel rates
Configurable
I/O - V2-SN/SE CMOS (JEDEC- JESD8C-01): Conforming to standard/additional specifications and deviations listed
fpardata
Data rate on parallel channels (10-bit)
Output load (only capacitive load)
Rise time (10% to 90% of input signal)
Fall time (10% to 90% of input signal)
62
10
6.5
5
Mbps
pF
Cout
tr
tf
2.5
2
4.5
3.5
ns
ns
I/O - V1-SN/SE LVDS (EIA/TIA-644): Conforming to standard/additional specifications and deviations listed
fserdata
Data rate on data channels
DDR signaling - 4 data channels, 1 synchronization channel;
620
310
Mbps
MHz
fserclock
Clock rate of output clock
Clock output for mesochronous signaling
Vicm
LVDS input common mode level
0.3
1.25
2.2
50
V
Tccsk
Channel to channel skew (Training pattern allows per channel skew
correction)
ps
V1-SN/SE LVDS Electrical/Interface
fin
fin
tidc
tj
Input clock rate when PLL used
62
310
60
MHz
MHz
%
Input clock when LVDS input used
Input clock duty cycle when PLL used
Input clock jitter
40
50
20
ps
fspi
SPI clock rate when PLL used at fin = 62 MHz
10
62
MHz
V2-SN/SE CMOS Electrical/Interface
fin
tj
Input clock rate
MHz
ps
Input clock jitter
20
fspi
SPI clock rate at fin = 62 MHz
2.5
MHz
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NOIV1SN2000A, NOIV2SN2000A
Table 5. ELECTRICAL SPECIFICATIONS
Boldface limits apply for T = T
to T
, all other limits T = +30°C. (Notes 5, 6 and 7)
J
MIN
MAX
J
Parameter
Description
Min
Typ
Max
Units
Frame Specifications (V1-SN/SE-LVDS - Global Shutter)
fps
Frame rate at full resolution
Xres x Yres = 1920 x 1080
Xres x Yres = 1600 x 1200
Xres x Yres = 1024 x 1024
Xres x Yres = 640 x 480
Xres x Yres = 512 x 512
Xres x Yres = 256 x 256
Frame Overhead Time
92
100
105
185
555
600
1730
fps
fps
fps_roi1
fps_roi2
fps_roi3
fps_roi4
fps_roi5
fps_roi6
FOT
fps
fps
fps
fps
fps
45
ms
ROT
Row Overhead Time
1.1
ms
fpix
Pixel rate (4 channels at 62 Mpix/s)
248
23
Mpix/s
Frame Specifications (V2-SN/SE CMOS - Global Shutter)
fps Frame rate at full resolution
5. All parameters are characterized for DC conditions after thermal equilibrium is established.
fps
6. This device contains circuitry to protect the inputs against damage due to high static voltages or electric fields. However, it is recommended
that normal precautions be taken to avoid application of any voltages higher than the maximum rated voltages to this high impedance circuit.
7. Minimum and maximum limits are guaranteed through test and design.
For recommendations on power supply management
guidelines, refer to application note AN65464: VITA 2000
HSMC Cyclone Reference Board Design Recommenda-
tions.
Y
Color Filter Array
The V1SE and V2SE sensors are processed with a Bayer
RGB color pattern as shown in Figure 2. Pixel (0,0) has a red
filter situated to the bottom left.
X
pixel (0;0)
Figure 2. Color Filter Array for the Pixel Array
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NOIV1SN2000A, NOIV2SN2000A
Spectral Response Curve
Figure 3. Spectral Response Curve
Note that green pixels on a Green−Red (Green 1) and Green−Blue (Green 2) row have similar responsivity to wavelength
trend as is depicted by the legend “Green”.
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NOIV1SN2000A, NOIV2SN2000A
OVERVIEW
Figure 4 and Figure 5 give an overview of the major
are fed into the data formatting block. This block adds
synchronization information to the data stream based on the
frame timing. For the V1-SN/SE version, the data then goes
to the low voltage serial (LVDS) interface block which sends
the data out through the I/O ring. The V2-SN/SE sensor does
not have an LVDS interface but sends out the data through
a 10-bit parallel interface.
functional blocks of the V1-SN/SE and V2-SN/SE sensor
respectively. The system clock is received by the CMOS
clock input. A PLL generates the intenal, high speed, clocks,
which are distributed to the other blocks. Optionally, the
V1-SN/SE can also accept a high speed LVDS clock, in
which case the PLL will be disabled.
The sequencer defines the sensor timing and controls the
image core. The sequencer is started either autonomously
(master mode) or on assertion of an external trigger (slave
mode). The image core contains all pixels and readout
circuits. The column structure selects pixels for readout and
performs correlated double sampling (CDS) or double
sampling (DS). The data comes out sequentially and is fed
into the analog front end (AFE) block. The programmable
gain amplifier (PGA) of the AFE adds the offset and gain.
The output is a fully differential analog signal that goes to the
ADC, where the analog signal is converted to a 10-bit data
stream. Depending on the operating mode, eight or ten bits
On-chip programmability is achieved through the Serial
Peripheral Interface (SPI). See the Register Map on page 50
for register details.
A bias block generates bias currents and voltages for all
analog blocks on the chip. By controlling the bias current,
the speed-versus-power of each block can be tuned. All
biasing programmability is contained in the bias block.
The sensor can automatically control exposure and gain
by enabling the automatic exposure control block (AEC).
This block regulates the integration time along with the
analog and digital gains to reach the desired intensity.
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NOIV1SN2000A, NOIV2SN2000A
Block Diagram
Image Core
Image Core Bias
Pixel Array
(1920x1200)
Column Structure
Automatic
Exposure
Control
8 analog channels
(AEC)
Analog Front End (AFE)
8 x 10 bit
digital channels
Control &
Registers
Data Formatting
Clock
Distribution
4 x 10 bit
digital channels
Serializers & LVDS Interface
PLL
LVDS Receiver
4 LVDS Channels
1 LVDS Sync Channel
1 LVDS Clock Channel
CMOS Clock
Input
LVDS Clock
Input
LVDS Interface
Figure 4. Block Diagram − V1−SN/SE
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NOIV1SN2000A, NOIV2SN2000A
Block Diagram
Image Core
Image Core Bias
Pixel Array
(1920x1200)
Column Structure
Automatic
Exposure
Control
8 analog channels
(AEC)
Analog Front End (AFE)
8 x 10 bit
digital channels
Control &
Registers
Data Formatting
4 x 10 bit
digital channels
Clock
Distribution
Output MUX
CMOS Clock
Input
10 bit Parallel Data
Frame Valid Indication
Line Valid Indication
CMOS Interface
Figure 5. Block Diagram − V2−SN/SE
Image Core
sequencer and can access the pixel array in global and rolling
shutter modes.
The pixel biasing block guarantees that the data on a pixel
is transferred properly to the column multiplexer when the
row drivers select a pixel line for readout.
The image core consists of:
• Pixel Array
• Address Decoders and Row Drivers
• Pixel Biasing
The pixel array contains 1920 (H) x 1200 (V) readable
pixels with a pixel pitch of 4.8 mm. Four dummy pixel rows
and columns are placed at every side of the pixel array to
eliminate possible edge effects. The sensor uses a 5T pixel
architecture, which makes it possible to read out the pixel
array in global shutter mode with double sampling (DS), or
in rolling shutter mode with correlated double sampling
(CDS).
Phase Locked Loop
The PLL accepts a (low speed) clock and generates the
required high speed clock. Optionally this PLL can be
bypassed. Typical input clock frequency is 62 MHz.
LVDS Clock Receiver
The LVDS clock receiver receives an LVDS clock signal
and distributes the required clocks to the sensor.
Typical input clock frequency is 310 MHz in 10-bit mode
and 248 MHz in 8-bit mode. The clock input needs to be
terminated with a 100 W resistor.
The function of the row drivers is to access the image array
line by line, or all lines together, to reset or read the pixel
data. The row drivers are controlled by the on-chip
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NOIV1SN2000A, NOIV2SN2000A
Column Multiplexer
Serializer and LVDS Interface (V1−SN/SE only)
The serializer and LVDS interface block receives the
formatted (10-bit or 8-bit) data from the data formatting
block. This data is serialized and transmitted by the LVDS
output driver.
In 10-bit mode, the maximum output data rate is 620 Mbps
per channel. In 8-bit mode, the maximum output data rate is
496 Mbps per channel.
In addition to the LVDS data outputs, two extra LVDS
outputs are available. One of these outputs carries the output
clock, which is skew aligned to the output data channels. The
second LVDS output contains frame format synchronization
codes to serve system-level image reconstruction.
All pixels of one image row are stored in the column
sample-and-hold (S/H) stages. These stages store both the
reset and integrated signal levels.
The data stored in the column S/H stages is read out
through 8 parallel differential outputs operating at a
frequency of 31 MHz.
At this stage, the reset signal and integrated signal values
are transferred into an FPN-corrected differential signal.
The column multiplexer also supports read-1-skip-1 and
read-2-skip-2 mode. Enabling this mode can speed up the
frame rate, with a decrease in resolution.
Bias Generator
The bias generator generates all required reference
voltages and bias currents that the on-chip blocks use. An
external resistor of 47 kW, connected between pin
IBIAS_MASTER and gnd_33, is required for the bias
generator to operate properly.
Output MUX (V2−SN/SE only)
The output MUX multiplexes the four data channels to
one channel and transmits the data words using a 10-bit
parallel CMOS interface.
Frame synchronization information is communicated by
means of frame and line valid strobes.
Analog Front End
The AFE contains 8 channels, each containing a PGA and
a 10-bit ADC.
Sequencer
The sequencer:
For each of the 8 channels, a pipelined 10-bit ADC is used
to convert the analog image data into a digital signal, which
is delivered to the data formatting block. A black calibration
loop is implemented to ensure that the black level is mapped
to match the correct ADC input level.
• Controls the image core. Starts and stops integration in
rolling and global shutter modes and control pixel
readout.
• Operates the sensor in master or slave mode.
• Applies the window settings. Organizes readouts so that
only the configured windows are read.
Data Formatting
The data block receives data from two ADCs and
multiplexes this data to one data stream. A cyclic
redundancy check (CRC) code is calculated on the passing
data.
A frame synchronization data block is foreseen to transmit
synchronization codes such as frame start, line start, frame
end, and line end indications.
• Controls the column multiplexer and analog core.
Applies gain settings and subsampling modes at the
correct time, without corrupting image data.
• Starts up the sensor correctly when leaving standby
mode.
Automatic Exposure Control
The AEC block implements a control system to modulate
the exposure of an image. Both integration time and gains
are controlled by this block to target a predefined
illumination level.
The data block calculates a CRC once per line for every
channel. This CRC code can be used for error detection at the
receiving end.
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FOT
Readout Fra
e
-1
eadout Fra e N
Integration Ti
Handling
e
Reset
N
Reset
N+1
NOIV1SN2000A, NOIV2SN2000A
OPERATING MODES
The VITA 2000 sensor is able to operate in the following
shutter modes:
• Global Shutter Mode
♦ Pipelined Global Shutter
- Master
- Slave
♦ Triggered Global Shutter
- Master
- Slave
• Rolling Shutter Mode
Global Shutter Mode
In the global shutter mode, light integration takes place on
all pixels in parallel, although subsequent readout is
sequential. Figure 6 shows the integration and readout
sequence for the synchronous shutter. All pixels are light
sensitive at the same period of time. The whole pixel core is
reset simultaneously and after the integration time all pixel
values are sampled together on the storage node inside each
pixel. The pixel core is read out line by line after integration.
Note that the integration and readout can occur in parallel or
sequentially.
Figure 6. Global Shutter Operation
Pipelined Global Shutter
In pipelined global shutter mode, the integration and
readout are done in parallel. Images are continuously read
and integration of frame N is ongoing during readout of the
previous frame N-1. The readout of every frame starts with
a Frame Overhead Time (FOT), during which the analog
value on the pixel diode is transferred to the pixel memory
element. After the FOT, the sensor is read out line per line
and the readout of each line is preceded by the Row
Overhead Time (ROT). Figure 7 shows the exposure and
readout time line in pipelined global shutter mode.
Exposure Time N
FOT
FOT
Exposure Time N+1
FOT
FOT
Readout
Handling
ROT
Line Readout
Figure 7. Integration and Readout for Pipelined Shutter
integration time is controlled by an external pin. As soon as
the control pin is asserted, the pixel array goes out of reset
and integration starts. The integration continues until the
external pin is de-asserted by the system. Now, the image is
sampled and the readout is started. Figure 8 shows the
relation between the external trigger signal and the
exposure/readout timing.
• Master
In this operation mode, the integration time is set through
the register interface and the sensor integrates and reads out
the images autonomously. The sensor acquires images
without any user interaction.
• Slave
The slave mode adds more manual control to the sensor.
The exposure time registers are ignored in this mode and the
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Exposure Ti
Register Controlled
Readout -1
FOT
FOT
Exposure Ti
Readout N
e N
e
+1
FOT
FOT
FOT
Integration Ti
Handling
e
Reset
N
Reset
N+1
NOIV1SN2000A, NOIV2SN2000A
External Trigger
Integration Time
Handling
Reset
N
Reset
N+1
Exposure Time N
FOT
FOT
Exposure T im e N+1
Readout N
FOT
FOT
Readout
Handling
FOT
Readout N−1
ROT
Line Readout
Figure 8. Pipelined Shutter Operated in Slave Mode
Triggered Global Shutter
The triggered global mode is also controlled in a master
or slave mode fashion.
• Master
In this mode, manual intervention is required to control
both the integration time and the start of readout. After the
integration time, indicated by a user controlled pin, the
image core is read out. After this sequence, the sensor goes
to an idle mode until a new user action is detected.
The three main differences with the pipelined global
shutter mode are
In this mode, a rising edge on the synchronization pin is
used to trigger the start of integration and readout. The
integration time is defined by a register setting. The sensor
autonomously integrates during this predefined time, after
which the FOT starts and the image array is readout
sequentially. A falling edge on the synchronization pin does
not have any impact on the readout or integration and
subsequent frames are started again for each rising edge.
Figure 9 shows the relation between the external trigger
signal and the exposure/readout timing.
• Upon user action, one single image is read.
• Integration and readout are done sequentially. However,
the user can control the sensor in such a way that two
consecutive batches are overlapping, that is, having
concurrent integration and readout.
If a rising edge is applied on the external trigger before the
exposure time and FOT of the previous frame is complete,
it is ignored by the sensor.
• Integration and readout is under user control through an
external pin.
This mode requires manual intervention for every frame.
The pixel array is kept in reset state until requested.
No effect on falling edge
External Trigger
Readout
Handling
ROT
Line Readout
Figure 9. Triggered Shutter Operated in Master Mode
FOT starts. The analog value on the pixel diode is
transferred to the pixel memory element and the image
readout can start. A request for a new frame is started when
the synchronization pin is asserted again.
• Slave
Integration time control is identical to the pipelined
shutter slave mode. An external synchronization pin
controls the start of integration. When it is de-asserted, the
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NOIV1SN2000A, NOIV2SN2000A
Rolling Shutter Mode
Figure 10 schematically indicates the relative shift of the
integration times of different lines during the rolling shutter
operation. Each row is read and reset in a sequential way.
Each row in a particular frame is integrated for the same
time, but all lines in a frame ‘see’ a different stare time. As
a consequence, fast horizontal moving objects in the field of
view give rise to motion artifacts in the image; this is an
unavoidable property of a rolling shutter.
In rolling shutter mode, the pixel Fixed Pattern Noise
(FPN) is corrected on-chip by using the CDS technique.
After light integration on all pixels in a row is complete, the
storage node in the pixel is reset. Afterwards the integrated
signal is transferred to that pixel storage node. The
difference between the reset level and integrated signal is the
FPN corrected signal. The advantage of this technique,
compared to the DS technique used in the global shutter
modes, is that the reset noise of the pixel storage node is
cancelled. This results in a lower temporal noise level.
Another shutter mode supported by the sensor is the
rolling shutter mode. The shutter mechanism is an electronic
rolling shutter and the sensor operates in a streaming mode
similar to a video. This mechanism is controlled by the
on-chip sequencer logic. There are two Y pointers. One
points to the row that is to be reset for rolling shutter
operation, the other points to the row to be read out.
Functionally, a row is reset first and selected for read out
sometime later. The time elapsed between these two
operations is the exposure time.
Figure 10. Rolling Shutter Operation
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NOIV1SN2000A, NOIV2SN2000A
SENSOR OPERATION
Flowchart
Low Power Standby
Figure 11 shows the sensor operation flowchart. The
sensor can be in six different ‘states’. Every state is indicated
with the oval circle. These states are:
• Power off
In low power standby state, all power supplies are on, but
internally every block is disabled. No internal clock is
running (PLL / LVDS clock receiver is disabled).
All register settings are unchanged.
Only a subset of the SPI registers is active for read/write
in order to be able to configure clock settings and leave the
low power standby state. The only SPI registers that should
be touched are the ones required for the ‘Enable Clock
Management’ action described in Enable Clock
Management − Part 1 on page 17
• Low power standby
• Standby (1)
• Standby (2)
• Idle
• Running
These states are ordered by power dissipation. In
‘power-off’ state, the power dissipation is minimal; in
‘running’ state the power dissipation is maximal.
On the other hand, the lower the power consumption, the
more actions (and time) are required to put the sensor in
‘running’ state and grab images.
This flowchart allows the trade-off between power saving
and enabling time of the sensor.
Next to the six ‘states’ a set of ‘user actions’, indicated by
arrows, are included in the flowchart. These user actions
make it possible to move from one state to another.
Standby (1)
In standby state, the PLL/LVDS clock receiver is running,
but the derived logic clock signal is not enabled.
Standby (2)
In standby state, the derived logic clock signal is running.
All SPI registers are active, meaning that all SPI registers
can be accessed for read or write operations. All other blocks
are disabled.
Idle
In the idle state, all internal blocks are enabled, except the
sequencer block. The sensor is ready to start grabbing
images as soon as the sequencer block is enabled.
Sensor States
Power Off
Running
In this state, the sensor is inactive. All power supplies are
down and the power dissipation is zero.
In running state, the sensor is enabled and grabbing
images. The sensor can be operated in different
rolling/global master/slave modes.
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NOIV1SN2000A, NOIV2SN2000A
Power Off
Power Down
Sequence
Power Up Sequence
Low-Power Standby
Disable Clock Management
Part 1
Enable Clock Management - Part 1
Poll Lock Indication
(only when PLL is enabled)
Standby (1)
Enable Clock Management - Part 2
(First Pass after Hard Reset)
Disable Clock Management
Part 2
Intermediate Standby
Required Register
Upload
Sensor (re-)configuration
(optional)
Standby (2)
Soft Power-Down
Soft Power-Up
Sensor (re-)configuration
(optional)
Idle
Enable Sequencer
Disable Sequencer
Sensor (re-)configuration
(optional)
Running
Figure 11. Sensor Operation Flowchart
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NOIV1SN2000A, NOIV2SN2000A
User Actions: Power Up Functional Mode Sequences
Enable Clock Management − Part 1
The ‘Enable Clock Management’ action configures the
clock management blocks and activates the clock generation
and distribution circuits in a pre-defined way. First, a set of
clock settings must be uploaded through the SPI register.
These settings are dependent on the desired operation mode
of the sensor.
Table 6 shows the SPI uploads to be executed to configure
the sensor for V1-SN/SE 8-bit serial, V1-SN/SE 10-bit
serial, or V2-SN/SE 10-bit parallel mode, with and without
the PLL.
Power Up Sequence
Figure 12 shows the power up sequence of the sensor. The
figure indicates that the first supply to ramp-up is the vdd_18
supply, followed by vdd_33 and vdd_pix respectively. It is
important to comply with the described sequence. Any other
supply ramping sequence may lead to high current peaks
and, as consequence, a failure of the sensor power up.
The clock input should start running when all supplies are
stabilized. When the clock frequency is stable, the reset_n
signal can be de-asserted. After a wait period of 10 ms, the
power up sequence is finished and the first SPI upload can
be initiated.
In the serial modes, if the PLL is not used, the LVDS clock
input must be running.
In the V2-SN/SE10-bit parallel mode, the PLL is
bypassed. The clk_pll clock is used as sensor clock.
It is important to follow the upload sequence listed in
Table 6.
NOTE: The ‘clock input’ can be the CMOS PLL clock
input (clk_pll), or the LVDS clock input
(lvds_clock_inn/p) in case the PLL is bypassed.
Use of Phase Locked Loop
clock input
reset_n
vdd_18
If PLL is used, the PLL is started after the upload of the
SPI registers. The PLL requires (dependent on the settings)
some time to generate a stable output clock. A lock detect
circuit detects if the clock is stable. When complete, this is
flagged in a status register.
vdd_33
NOTE: The lock detect status must not be checked for
the V2-SN/SE sensor.
vdd_pix
Check this flag by reading the SPI register. When the flag
is set, the ‘Enable Clock Management- Part 2’ action can be
continued. When PLL is not used, this step can be bypassed
as shown in Figure 11 on page 16.
SPI Upload
> 10us
> 10us
> 10us
> 10us
> 10us
Figure 12. Power Up Sequence
Table 6. ENABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 1
Upload #
Address
Data
Description
V1-SN/SE 8-bit mode with PLL
1
0x0000
0x0001
0x200C
0x0000
0X210F
0x1180
0xCCBC
0x0000
0x0003
Monochrome sensor
Color sensor
2
2
3
4
5
6
7
8
32
20
17
26
27
8
Configure clock management
Configure clock management
Configure PLL
Configure PLL lock detector
Configure PLL lock detector
Release PLL soft reset
Enable PLL
16
V1-SN/SE 8-bit mode without PLL
1
2
0x0000
0x0001
0x2008
0x0001
Monochrome sensor
Color sensor
2
3
32
20
Configure clock management
Enable LVDS clock input
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NOIV1SN2000A, NOIV2SN2000A
Table 6. ENABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 1
Upload #
Address
Data
Description
V1-SN/SE 10-bit mode with PLL
1
0x0000
0x0001
0x2004
0x0000
0x2113
0x2280
0x3D2D
0x0000
0x0003
Monochrome sensor
Color sensor
2
2
3
4
5
6
7
8
32
20
17
26
27
8
Configure clock management
Configure clock management
Configure PLL
Configure PLL lock detector
Configure PLL lock detector
Release PLL soft reset
Enable PLL
16
V1-SN/SE 10-bit mode without PLL
1
2
0x0000
0x0001
0x2000
0x0001
Monochrome sensor
Color sensor
2
32
20
Configure clock management
Enable LVDS clock input
3
V2-SN/SE 10-bit mode
1
0x0002
0x0003
0x200C
0x0000
0x0007
Monochrome sensor parallel mode selection
Color sensor parallel mode selection
Configure clock management
2
2
3
4
32
20
16
Configure clock management
Configure PLL bypass mode
Enable Clock Management - Part 2
The required uploads are listed in Table 7. Note that it is
The next step to configure the clock management consists
of SPI uploads which enables all internal clock distribution.
important to follow the upload sequence listed in Table 7.
Table 7. ENABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 2
Upload #
Address
Data
Description
V1-SN/SE 8-bit mode with PLL
1
2
3
9
0x0000
0x200E
0x0001
Release clock generator soft reset
32
34
Enable logic clock
Enable logic blocks
V1-SN/SE 8-bit mode without PLL
1
2
3
9
0x0000
0x200A
0x0001
Release clock generator soft reset
Enable logic clock
32
34
Enable logic blocks
V1-SN/SE 10-bit mode with PLL
1
2
3
9
0x0000
0x2006
0x0001
Release clock generator soft reset
Enable logic clock
32
34
Enable logic blocks
V1-SN/SE 10-bit mode without PLL
1
2
9
0x0000
0x2002
Release clock generator soft reset
Enable logic clock
32
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NOIV1SN2000A, NOIV2SN2000A
Table 7. ENABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 2
Upload #
Address
Data
Description
3
34
0x0001
Enable logic blocks
V2-SN/SE 10-bit mode
1
2
3
9
0x0000
0x200E
0x0001
Release clock generator soft reset
Enable logic clock
32
34
Enable logic blocks
Required Register Upload
In this phase, the ‘reserved’ register settings are uploaded
through the SPI register. Different settings are not allowed
and may cause the sensor to malfunction. The required
uploads are listed in Table 8.
NOTE: This table is subject to change.
Table 8. REQUIRED REGISTER UPLOAD
Upload #
Address
41
Data
Description
1
2
0x085A
0x0
Configure image core
129[13]
10-bit mode
0x1
8-bit mode
3
4
65
66
0x288B
0x53C6
0x0344
0x0085
0x4888
0x86A1
0x460F
0x00F5
0x00FD
0x0144
0x160B
0x3E13
0x0386
0x0BF1
0x0BC3
Configure CP biasing
Configure AFE biasing
Configure MUX biasing
Configure LVDS biasing
Configure reserved register
Configure reserved register
Configure black calibration
Configure AEC
5
67
6
68
7
70
8
81
9
128
176
180
181
218
224
456
447
448
10
11
12
13
14
15
16
17
Configure AEC
Configure AEC
Configure sequencer
Configure sequencer
Configure sequencer
Configure sequencer
Configure sequencer
Soft Power Up
During the soft power up action, the internal blocks are
enabled and prepared to start processing the image data
stream. This action exists of a set of SPI uploads. The soft
power up uploads are listed in Table 9.
Table 9. SOFT POWER UP REGISTER UPLOADS FOR MODE DEPENDENT REGISTERS
Upload #
Address
Data
Description
V1-SN/SE 8-bit mode with PLL
1
2
3
4
5
0x200F
0x0000
0x0001
0x0203
0x0003
Enable analog clock distribution
32
10
64
72
40
Release soft reset state
Enable biasing block
Enable charge pump
Enable column multiplexer
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NOIV1SN2000A, NOIV2SN2000A
Table 9. SOFT POWER UP REGISTER UPLOADS FOR MODE DEPENDENT REGISTERS
Upload #
Address
48
Data
Description
6
7
0x0001
0x0007
Enable AFE
112
Enable LVDS transmitters
V1-SN/SE 8-bit mode without PLL
1
2
3
4
5
6
7
0x200B
0x0000
0x0001
0x0203
0x0003
0x0001
0x0007
Enable analog clock distribution
Release soft reset state
Enable biasing block
32
10
64
72
Enable charge pump
40
Enable column multiplexer
Enable AFE
48
112
Enable LVDS transmitters
V1-SN/SE 10-bit mode with PLL
1
2
3
4
5
6
7
0x2007
0x0000
0x0001
0x0203
0x0003
0x0001
0x0007
Enable analog clock distribution
Release soft reset state
Enable biasing block
32
10
64
72
Enable charge pump
40
Enable column multiplexer
Enable AFE
48
112
Enable LVDS transmitters
V1-SN/SE 10-bit mode without PLL
1
0x2003
0x0000
0x0001
0x0203
0x0003
0x0001
0x0007
Enable analog clock distribution
Release soft reset state
Enable biasing block
32
10
2
3
64
4
72
Enable charge pump
5
40
Enable column multiplexer
Enable AFE
6
48
7
112
Enable LVDS transmitters
V2-SN/SE 10-bit mode
1
2
3
4
5
6
7
0x200F
0x0000
0x0001
0x0203
0x0003
0x0001
0x0000
Enable analog clock distribution
Release soft reset state
Enable biasing block
Enable charge pump
Enable column multiplexer
Enable AFE
32
10
64
72
40
48
112
Configure I/O
Enable Sequencer
The ‘Enable Sequencer’ action consists of a set of register
uploads. The required uploads are listed in Table 10.
During the ‘Enable Sequencer’ action, the frame grabbing
sequencer is enabled. The sensor starts grabbing images in
the configured operation mode. Refer to Sensor States on
page 15 for an overview of the possible operation modes.
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NOIV1SN2000A, NOIV2SN2000A
Table 10. ENABLE SEQUENCER REGISTER UPLOAD
Upload #
Address
Data
Description
1
192[0]
0x1
Enable sequencer.
Note that this address contains other configuration bits to select the opera-
tion mode.
User Actions: Functional Modes to Power Down
Sequences
Refer to Silicon Errata on page 74 for standby power
considerations.
Disable Sequencer
During the ‘Disable Sequencer’ action, the frame
grabbing sequencer is stopped. The sensor stops grabbing
images and returns to the idle mode.
The ’Disable Sequencer’ action consists of a set of register
uploads. as listed in Table 11.
Table 11. DISABLE SEQUENCER REGISTER UPLOAD
Upload #
Address
Data
Description
1
192[0]
0x0
Disable sequencer.
Note that this address contains other configuration bits to select the opera-
tion mode.
Soft Power Down
current dissipation. This action exists of a set of SPI uploads.
During the soft power down action, the internal blocks are
disabled and the sensor is put in standby state to reduce the
The soft power down uploads are listed in Table 12.
Table 12. SOFT POWER DOWN REGISTER UPLOAD
Upload #
Address
112
48
Data
Description
1
2
3
4
5
6
0x0000
0x0000
0x0000
0x0200
0x0000
0x0999
Disable LVDS transmitters
Disable AFE
40
Disable column multiplexer
Disable charge pump
Disable biasing block
Soft reset
72
64
10
Disable Clock Management - Part 2
The ‘Disable Clock Management’ action stops the
internal clocking to further decrease the power dissipation.
This action can be implemented with the SPI uploads as
shown in Table 13.
Table 13. DISABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 2
Upload #
Address
Data
Description
V1-SN/SE 8-bit mode with PLL
1
2
3
0x0000
0x200C
0x0009
Disable logic blocks
Disable logic clock
34
32
9
Soft reset clock generator
V1-SN/SE 8-bit mode without PLL
1
2
3
0x0000
0x2008
0x0009
Disable logic blocks
Disable logic clock
34
32
9
Soft reset clock generator
V1-SN/SE 10-bit mode with PLL
1
2
0x0000
0x2004
Disable logic blocks
Disable logic clock
34
32
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NOIV1SN2000A, NOIV2SN2000A
Table 13. DISABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 2
Upload #
Address
Data
Description
3
9
0x0009
Soft reset clock generator
V1-SN/SE 10-bit mode without PLL
1
0x0000
0x2000
0x0009
Disable logic blocks
Disable logic clock
34
32
9
2
3
Soft reset clock generator
V2-SN/SE 10-bit mode
1
2
3
0x0000
0x200C
0x0009
Disable logic blocks
Disable logic clock
34
32
9
Soft reset clock generator
Disable Clock Management - Part 1
The ‘Disable Clock Management’ action stops the
internal clocking to further decrease the power dissipation.
This action can be implemented with the SPI uploads as
shown in Table 14.
Table 14. DISABLE CLOCK MANAGEMENT REGISTER UPLOAD − PART 1
Upload #
Address
Data
Description
1
2
3
0x0000
0x0099
0x0000
Disable PLL
16
8
Soft reset PLL
20
Configure clock management
Power Down Sequence
clock input
Figure 13 illustrates the timing diagram of the preferred
power down sequence. It is important that the sensor is in
reset before the clock input stops running. Otherwise, the
internal PLL becomes unstable and the sensor gets into an
unknown state. This can cause high peak currents.
The same applies for the ramp down of the power
supplies. The preferred order to ramp down the supplies is
first vdd_pix, second vdd_33, and finally vdd_18. Any other
sequence can cause high peak currents.
reset_n
vdd_18
vdd_33
vdd_pix
NOTE: The ‘clock input’ can be the CMOS PLL clock
input (clk_pll), or the LVDS clock input
> 10us > 10us > 10us > 10us
(lvds_clock_inn/p) in case the PLL is bypassed.
Figure 13. Power Down Sequence
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NOIV1SN2000A, NOIV2SN2000A
Sensor Reconfiguration
Sensor Configuration
During the standby, idle, or running state several sensor
parameters can be reconfigured.
• Frame Rate and Exposure Time: Frame rate and
exposure time changes can occur during standby, idle,
and running states.
• Signal Path Gain: Signal path gain changes can occur
during standby, idle, and running states.
• Windowing: Changes with respect to windowing can
occur during standby, idle, and running states. Refer to
Multiple Window Readout on page 32 for more
information.
• Subsampling: Changes of the subsampling mode can
occur during standby, idle, and running states. Refer to
Subsampling on page 33 for more information.
• Shutter Mode: The shutter mode can only be changed
during standby or idle mode. Reconfiguring the shutter
mode during running state is not supported.
This device contains multiple configuration registers.
Some of these registers can only be configured while the
sensor is not acquiring images (while register 192[0] = 0),
while others can be configured while the sensor is acquiring
images. For the latter category of registers, it is possible to
distinguish the register set that can cause corrupted images
(limited number of images containing visible artifacts) from
the set of registers that are not causing corrupted images.
These three categories are described here.
Static Readout Parameters
Some registers are only modified when the sensor is not
acquiring images. Reconfiguration of these registers while
images are acquired can cause corrupted frames or even
interrupt the image acquisition. Therefore, it is
recommended to modify these static configurations while
the sequencer is disabled (register 192[0] = 0). The registers
shown in Table 15 should not be reconfigured during image
acquisition. A specific configuration sequence applies for
these registers. Refer to the operation flow and startup
description.
Table 15. STATIC READOUT PARAMETERS
Group
Clock generator
Addresses
32
Description
Configure according to recommendation
Image core
40
Configure according to recommendation
Configure according to recommendation
Configure according to recommendation
Configure according to recommendation
AFE
48
Bias
64–71
112
LVDS
Sequencer mode selection
192 [6:1]
Operation modes are:
• Rolling shutter enable
• triggered_mode
• slave_mode
All reserved registers
Keep reserved registers to their default state, unless otherwise described in the
recommendation
Dynamic Configuration Potentially Causing Image
Artifacts
The category of registers as shown in Table 16 consists of
configurations that do not interrupt the image acquisition
process, but may lead to one or more corrupted images
during and after the re-configuration. A corrupted image is
an image containing visible artifacts. A typical example of
a corrupted image is an image which is not uniformly
exposed.
The effect is transient in nature and the new configuration
is applied after the transient effect.
Table 16. DYNAMIC CONFIGURATION POTENTIALLY CAUSING IMAGE ARTIFACTS
Group
Addresses
Description
Black level configuration
128–129
197[8]
Reconfiguration of these registers may have an impact on the black-level calibration
algorithm. The effect is a transient number of images with incorrect black level com-
pensation.
Sync codes
129[13]
130–135
Incorrect sync codes may be generated during the frame in which these registers
are modified.
Datablock test configurations
144–150
Modification of these registers may generate incorrect test patterns during
a transient frame.
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NOIV1SN2000A, NOIV2SN2000A
Dynamic Readout Parameters
shown in Table 17. Some reconfiguration may lead to one
frame being blanked. This happens when the modification
requires more than one frame to settle. The image is blanked
out and training patterns are transmitted on the data and sync
channels.
It is possible to reconfigure the sensor while it is acquiring
images. Frame-related parameters are internally
resynchronized to frame boundaries, such that the modified
parameter does not affect a frame that has already started.
However, there can be restrictions to some registers as
Table 17. DYNAMIC READOUT PARAMETERS
Group
Addresses
Description
Subsampling/binning
192[7]
192[8]
Subsampling or binning is synchronized to a new frame start.
Black lines
197
Reconfiguration of these parameters causes one frame to be blanked out in rolling shutter
operation mode, as the reset pointers need to be recalculated for the new frame timing.
No blanking in global shutter mode
Dummy lines
ROI configuration
198
Reconfiguration of these parameters causes one frame to be blanked out in rolling shutter
operation mode, as the reset pointers need to be recalculated for the new frame timing.
No blanking in global shutter mode.
195
256–279
Optionally, it is possible to blank out one frame after reconfiguration of the active ROI in
rolling shutter mode. Therefore, register 206[8] must be asserted (blank_roi_switch config-
uration).
A ROI switch is only detected when a new window is selected as the active window
(reconfiguration of register 195). Reconfiguration of the ROI dimension of the active win-
dow does not lead to a frame blank and can cause a corrupted image.
Exposure reconfiguration
Gain reconfiguration
199-203
204
Exposure reconfiguration does not cause artifact. However, a latency of one frame is
observed unless reg_seq_exposure_sync_mode is set to ‘1’ in triggered global mode
(master).
Gains are synchronized at the start of a new frame. Optionally, one frame latency can be
incorporated to align the gain updates to the exposure updates (refer to register 199[13] -
gain_lat_comp).
Freezing Active Configurations
of registers can be programmed in the sync_configuration
Though the readout parameters are synchronized to frame
boundaries, an update of multiple registers can still lead to
a transient effect in the subsequent images, as some
configurations require multiple register uploads. For
example, to reconfigure the exposure time in master global
mode, both the fr_length and exposure registers need to be
updated. Internally, the sensor synchronizes these
configurations to frame boundaries, but it is still possible
that the reconfiguration of multiple registers spans over two
or even more frames. To avoid inconsistent combinations,
freeze the active settings while altering the SPI registers by
disabling synchronization for the corresponding
functionality before reconfiguration. When all registers are
uploaded, re-enable the synchronization. The sensor’s
sequencer then updates its active set of registers and uses
them for the coming frames. The freezing of the active set
registers, which can be found at the SPI address 206.
Figure 14 shows a re-configuration that does not use the
sync_configuration option. As depicted, new SPI
configurations are synchronized to frame boundaries.
With sync_configuration = ‘1’. Configurations are
synchronized to the frame boundaries.
Figure 15 shows the usage of the sync_configuration
settings. Before uploading
a set of registers, the
corresponding sync_configuration is de-asserted. After the
upload is completed, the sync_configuration is asserted
again and the sensor resynchronizes its set of registers to the
coming frame boundaries. As seen in the figure, this ensures
that the uploads performed at the end of frame N+2 and the
start of frame N+3 become active in the same frame (frame
N+4).
Frame NꢁꢁꢁFrame N+1ꢁꢁꢂFrame N+2ꢁꢁꢂꢀFrame N+3
Frame N+4
Time Line
SPI Registers
Active Registers
Figure 14. Frame Synchronization of Configurations (no freezing)
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NOIV1SN2000A, NOIV2SN2000A
Frame NꢁꢁꢁFrame N+1ꢁꢁꢂFrame N+2ꢁꢁꢂꢀFrame N+3ꢁꢁꢂꢀFrame N+4
Time Line
sync_configuration
SPI Registers
This configuration is not taken into
account as sync_register is inactive.
Active Registers
Figure 15. Reconfiguration Using Sync_configuration
NOTE: SPI updates are not taken into account while sync_configuration is inactive. The active configuration is frozen
for the sensor. Table 18 lists the several sync_configuration possibilities along with the respective registers being
frozen.
Table 18. ALTERNATE SYNC CONFIGURATIONS
Group
Affected Registers
Description
sync_rs_x_length
rs_x_length
Update of x-length configuration (rolling shutter only) is not synchronized at start of
frame when ‘0’. The sensor continues with its previous configurations.
sync_black_lines
sync_dummy_lines
sync_exposure
black_lines
Update of black line configuration is not synchronized at start of frame when ‘0’. The
sensor continues with its previous configurations.
dummy_lines
Update of dummy line configuration is not synchronized at start of frame when ‘0’. The
sensor continues with its previous configurations.
mult_timer
fr_length
exposure
Update of exposure configurations is not synchronized at start of frame when ‘0’. The
sensor continues with its previous configurations.
sync_gain
sync_roi
mux_gainsw
afe_gain
Update of gain configurations is not synchronized at start of frame when ‘0’. The sen-
sor continues with its previous configurations.
roi_active0[7:0]
subsampling
binning
Update of active ROI configurations is not synchronized at start of frame when ‘0’. The
sensor continues with its previous configurations.
Note: The window configurations themselves are not frozen. Re-configuration of act-
ive windows is not gated by this setting.
Window Configuration
window configurations. Note that switching between two
different windows might result in a corrupted frame. This is
Global Shutter Mode
inherent in the rolling shutter mechanism, where each line
must be reset sequentially before being read out. This
corrupted window can be blanked out by setting register
206[8]. In this case, a dead time is noted on the LVDS
interface when the window-switch occurs in the sensor.
During this blank out, training patterns are sent out on the
data and sync channels for the duration of one frame.
Up to 8 windows can be defined in global shutter mode
(pipelined or triggered). The windows are defined by
registers 256 to 279. Each window can be activated or
deactivated separately using register 195. It is possible to
reconfigure the windows while the sensor is acquiring
images. It is also possible to reconfigure the inactive
windows or to switch between predefined windows.
One can switch between predefined windows by
reconfiguring the register 195. This way a minimum number
of registers need to be uploaded when it is necessary to
switch between two or more sets of windows. As an example
of this, scanning the scene at higher frame rates using
multiple windows and switching to full frame capture when
the object is traced. Switching between the two modes only
requires an upload of one register.
Black Calibration
The sensor automatically calibrates the black level for
each frame. Therefore, the device generates a configurable
number of electrical black lines at the start of each frame.
The desired black level in the resulting output interface can
be configured and is not necessarily targeted to ‘0’.
Configuring the target to a higher level yields some
information on the left side of the black level distribution,
while the other end of the distribution tail is clipped to ‘0’
when setting the black level target to ‘0’.
Rolling Shutter Mode
In rolling shutter mode it is not possible to read multiple
windows. Do not activate more than one window (register
195). However, it is possible to configure more than one
window and dynamically switch between the different
The black level is calibrated for the 8 columns contained
in one kernel. Configurable parameters for the black-level
algorithm are listed in Table 19.
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NOIV1SN2000A, NOIV2SN2000A
Table 19. CONFIGURABLE PARAMETERS FOR BLACK LEVEL ALGORITHM
Group
Addresses
Description
Black Line Generation
197[7:0]
black_lines
This register configures the number of black lines that are generated at the start of a
frame. At least one black line must be generated. The maximum number is 255.
Note: When the automatic black-level calibration algorithm is enabled, make sure that this
register is configured properly to produce sufficient black pixels for the black-level filtering.
The number of black pixels generated per line is dependent on the operation mode and
window configurations:
Global Shutter - Each black line contains 240 kernels.
Rolling Shutter - As the line length is fundamental for rolling shutter operation, the length of
a black line is defined by the active window.
197[8]
gate_first_line
When asserting this configuration, the first black line of the frame is blanked out and is not
used for black calibration. It is recommended to enable this functionality, because the first
line can have a different behavior caused by boundary effects. When enabling, the number
of black lines must be set to at least two in order to have valid black samples for the calib-
ration algorithm.
Black Value Filtering
129[0]
auto_blackcal_enable Internal black-level calibration functionality is enabled when set to ‘1’. Required black level
offset compensation is calculated on the black samples and applied to all image pixels.
When set to ‘0’, the automatic black-level calibration functionality is disabled. It is possible
to apply an offset compensation to the image pixels, which is defined by the registers
129[10:1].
Note: Black sample pixels are not compensated; the raw data is sent out to provide ex-
ternal statistics and, optionally, calibrations.
129[9:1]
blackcal_offset
Black calibration offset that is added or subtracted to each regular pixel value when au-
to_blackcal_enable is set to ‘0’. The sign of the offset is determined by register 129[10]
(blackcal_offset_dec).
Note: All channels use the same offset compensation when automatic black calibration is
disabled.
The calculated black calibration factors are frozen when this register is set to 0x1FF
(all−‘1’) in auto calibration mode. Any value different from 0x1FF re−enables the black
calibration algorithm. This freezing option can be used to prevent eventual frame to frame
jitter on the black level as the correction factors are recalculated every frame. It is recom-
mended to enable the black calibration regularly to compensate for temperature changes.
129[10]
blackcal_offset_dec
black_samples
Sign of blackcal_offset. If set to ‘0’, the black calibration offset is added to each pixel. If set
to ‘1’, the black calibration offset is subtracted from each pixel.
This register is not used when auto_blackcal_enable is set to ‘1’.
128[10:8]
The black samples are low-pass filtered before being used for black level calculation. The
more samples are taken into account, the more accurate the calibration, but more samples
require more black lines, which in turn affects the frame rate.
The effective number of samples taken into account for filtering is 2^ black_samples.
Note: An error is reported by the device if more samples than available are requested
(refer to register 136).
Black Level Filtering Monitoring
136 blackcal_error0
An error is reported by the device if there are requests for more samples than are available
(each bit corresponding to one data path). The black level is not compensated correctly if
one of the channels indicates an error. There are three possible methods to overcome this
situation and to perform a correct offset compensation:
• Increase the number of black lines such that enough samples are generated at the
cost of increasing frame time (refer to register 197).
• Relax the black calibration filtering at the cost of less accurate black level determina-
tion (refer to register 128).
• Disable automatic black level calibration and provide the offset via SPI register upload.
Note that the black level can drift in function of the temperature. It is thus recommended
to perform the offset calibration periodically to avoid this drift.
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NOIV1SN2000A, NOIV2SN2000A
Serial Peripheral Interface
indicated in Figure 16. The sensor samples this
data on a rising edge of the sck clock (mosi needs
to be driven by the system on the falling edge of
the sck clock).
The sensor configuration registers are accessed through
an SPI. The SPI consists of four wires:
• sck: Serial Clock
• ss_n: Active Low Slave Select
• mosi: Master Out, Slave In, or Serial Data In
3. The tenth bit sent by the master indicates the type
of transfer: high for a write command, low for a
read command.
• miso: Master In, Slave Out, or Serial Data Out
The SPI is synchronous to the clock provided by the
master (sck) and asynchronous to the sensor’s system clock.
When the master wants to write or read a sensor’s register,
it selects the chip by pulling down the Slave Select line
(ss_n). When selected, data is sent serially and synchronous
to the SPI clock (sck).
Figure 16 shows the communication protocol for read and
write accesses of the SPI registers. The VITA 2000 sensor
uses 9-bit addresses and 16-bit data words.
Data driven by the system is colored blue in Figure 16,
while data driven by the sensor is colored yellow. The data
in grey indicates high-Z periods on the miso interface. Red
markers indicate sampling points for the sensor (mosi
sampling); green markers indicate sampling points for the
system (miso sampling during read operations).
The access sequence is:
4. Data transmission:
- For write commands, the master continues
sending the 16-bit data, most significant bit first.
- For read commands, the sensor returns the
requested address on the miso pin, most significant
bit first. The miso pin must be sampled by the
system on the falling edge of sck (assuming
nominal system clock frequency and maximum
10 MHz SPI frequency).
5. When data transmission is complete, the system
deselects the sensor one clock period after the last
bit transmission by pulling ss_n high.
Maximum frequency for the SPI depends on the input
th
clock and type of sensor. The frequency is 1/6 of the PLL
th
th
input clock or 1/30 (in 10-bit mode) and 1/24 (in 8-bit
mode) of the LVDS input clock frequency.
At nominal input frequency (62 Mhz / 310 MHz /
248 MHz), the maximum frequency for the SPI is 10 MHz.
Bursts of SPI commands can be issued by leaving at least
two SPI clock periods between two register uploads.
Deselect the chip between the SPI uploads by pulling the
ss_n pin high.
1. Select the sensor for read or write by pulling down
the ss_n line.
2. One SPI clock cycle after selecting the sensor, the
9-bit data is transferred, most significant bit first.
The sck clock is passed through to the sensor as
SP I − W R ITE
ss_n
sck
t_sc ks s
t_sssck
ts ck
ts _mos i
th_mosi
A8
A7
..
..
..
A1
A0
`1'
D
5
D14
..
..
..
..
D1
D0
mosi
miso
SPI − REA D
ss_n
sck
t_sc ks s
t_sssck
ts ck
ts_mosi
th_mosi
A8
A7
..
..
..
A1
A0
`0'
mosi
miso
ts _mi so
th_mi so
D
5
D14
..
..
..
..
D1
D0
Figure 16. SPI Read and Write Timing Diagram
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NOIV1SN2000A, NOIV2SN2000A
Table 20. SPI TIMING REQUIREMENTS
Group
tsck
Addresses
Description
Units
ns
(*)
sck clock period
100
tsssck
tsckss
ts_mosi
th_mosi
ts_miso
th_miso
tspi
ss_n low to sck rising edge
sck falling edge to ss_n high
Required setup time for mosi
Required hold time for mosi
Setup time for miso
tsck
tsck
ns
ns
20
ns
20
ns
tsck/2-10
tsck/2-20
2 x tsck
ns
Hold time for miso
ns
Minimal time between two consecutive SPI accesses (not shown in figure)
ns
*Value indicated is for nominal operation. The maximum SPI clock frequency depends on the sensor configuration (operation mode, input clock).
tsck is defined as 1/f . See text for more information on SPI clock frequency restrictions.
SPI
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NOIV1SN2000A, NOIV2SN2000A
IMAGE SENSOR TIMING AND READOUT
The following sections describe the configurations for
reset period, the global photodiode reset condition is
abandoned. This indicates the start of the integration or
exposure time. The length of the exposure time is defined by
the registers exposure and mult_timer.
single slope reset mechanism. Dual and triple slope handling
during global shutter operation is similar to the single slope
operation. Extra integration time registers are available.
NOTE: The start of the exposure time is synchronized to
the start of a new line (during ROT) if the
exposure period starts during a frame readout.
As a consequence, the effective time during
which the image core is in a reset state is
extended to the start of a new line.
• Make sure that the sum of the reset time and exposure
time exceeds the time required to readout all lines. If
this is not the case, the exposure time is extended until
all (active) lines are read out.
• Alternatively, it is possible to specify the frame time
and exposure time. The sensor automatically calculates
the required reset time. This mode is enabled by the
fr_mode register. The frame time is specified in the
register fr_length.
Global Shutter Mode
Pipelined Global Shutter (Master)
The integration time is controlled by the registers
fr_length[15:0] and exposure[15:0]. The mult_timer
configuration defines the granularity of the registers
reset_length and exposure. It is read as number of system
clock cycles (16.129 ns nominal at 62 MHz) for the
V1-SN/SE version and 15.5 MHz cycles (64.516 ns
nominal) for the V2-SN/SE version.
The exposure control for (Pipelined) Global Master mode
is depicted in Figure 17.
The pixel values are transferred to the storage node during
FOT, after which all photo diodes are reset. The reset state
remains active for a certain time, defined by the reset_length
and mult_timer registers, as shown in the figure. Note that
meanwhile the image array is read out line by line. After this
Frame N
Frame N+1
Exposure State
Readout
FOT
FOT
Reset
Integrating
FOT
FOT
Reset
Integrating
FOT
FOT
Image Array Global Reset
reset_length
x
mult_timer
exposure
x
mult_timer
= ROT
= Readout
= Readout Dummy Line (blanked)
Figure 17. Integration Control for (Pipelined) Global Shutter Mode (Master)
Triggered Global Shutter (Master)
exposure and mult_timer, as in the master pipelined global
mode. The fr_length configuration is not used. This
operation is graphically shown in Figure 18.
In master triggered global mode, the start of integration
time is controlled by a rising edge on the trigger0 pin. The
exposure or integration time is defined by the registers
Frame N
Frame N+1
FOT
FOT
Reset
Integrating
FOT
FOT
Reset
Integrating
FOT
FOT
Exposure State
trigger0
(No effect on falling edge)
Readout
Image Array Global Reset
exposure x mult_timer
= ROT
= Readout
= Readout Dummy Line (blanked)
Figure 18. Exposure Time Control in Triggered Shutter Mode (Master)
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NOIV1SN2000A, NOIV2SN2000A
Notes:
the pixel storage node and readout of the image array. In
other words, the high time of the trigger pin indicates the
integration time, the period of the trigger pin indicates the
frame time.
The use of the trigger during slave mode is shown in
Figure 19.
• The falling edge on the trigger pin does not have any
impact. Note however the trigger must be asserted for
at least 100 ns.
• The start of the exposure time is synchronized to the
start of a new line (during ROT) if the exposure period
starts during a frame readout. As a consequence, the
effective time during which the image core is in a reset
state is extended to the start of a new line.
• If the exposure timer expires before the end of readout,
the exposure time is extended until the end of the last
active line.
• The trigger pin needs to be kept low during the FOT.
The monitor pins can be used as a feedback to the
FPGA/controller (eg. use monitor0, indicating the very
first line when monitor_select = 0x5 − a new trigger can
be initiated after a rising edge on monitor0).
Notes:
• The registers exposure, fr_length, and mult_timer are
not used in this mode.
• The start of exposure time is synchronized to the start
of a new line (during ROT) if the exposure period starts
during a frame readout. As a consequence, the effective
time during which the image core is in a reset state is
extended to the start of a new line.
• If the trigger is de-asserted before the end of readout,
the exposure time is extended until the end of the last
active line.
• The trigger pin needs to be kept low during the FOT.
The monitor pins can be used as a feedback to the
FPGA/controller (eg. use monitor0, indicating the very
first line when monitor_select = 0x5 − a new trigger can
be initiated after a rising edge on monitor0).
Triggered Global Shutter (Slave)
Exposure or integration time is fully controlled by means
of the trigger pin in slave mode. The registers fr_length,
exposure and mult_timer are ignored by the sensor.
A rising edge on the trigger pin indicates the start of the
exposure time, while a falling edge initiates the transfer to
Frame N
Frame N+1
Exposure State
trigger0
FOT
FOT
Reset
Integrating
FOT
FOT
Reset
Integrating
FOT
FOT
Readout
Image Array Global Reset
= ROT
= Readout
= Readout Dummy Line (blanked)
Figure 19. Exposure Time Control in Global−Slave Mode
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NOIV1SN2000A, NOIV2SN2000A
Rolling Shutter Mode
frame rate by adding so called dummy lines. A dummy line
lasts for the same time as a regular line, but no pixel data is
transferred to the system. The number of dummy lines is
controlled by the register dummy_lines. The rolling shutter
exposure mechanism is graphically shown in Figure 20.
The exposure time during rolling shutter mode is always
an integer multiple of line-times. The exposure time is
defined by the register exposure and expressed in number of
lines. The register fr_length and mult_timer are not used in
this mode.
The maximum exposure time is limited by the frame time.
It is possible to increase the exposure time at the cost of the
Figure 20. Integration Control in Rolling Shutter Mode
Note:
It is clear that when the number of rows and/or the length
of a row are reduced (by windowing or subsampling), the
frame time decreases and consequently the frame rate
increases.
To be able to artificially increase the frame time, it is
possible to:
• add dummy clock cycles to a row time
• add dummy rows to the frame
The duration of one line is the sum of the ROT and the time
required to read out one line (depends on the number of
active kernels in the window). Optionally, this readout time
can be extended by the configuration rs_x_length. This
register, expressed in number of periods of the logic clock
(16.129 ns for the V1-SN/SE version and 64.516 ns for the
V2-SN/SE version), determines the length of the x-readout.
However, the minimum for rs_x_length is governed by the
window size (x-size).
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NOIV1SN2000A, NOIV2SN2000A
ADDITIONAL FEATURES
Multiple Window Readout
Up to eight windows can be defined, possibly (partially)
overlapping, as illustrated in Figure 22.
The VITA 2000 sensor supports multiple window
readout, which means that only the user-selected Regions Of
Interest (ROI) are read out. This allows limiting data output
for every frame, which in turn allows increasing the frame
rate.
1920 pixels
y1_end
• In global shutter mode, up to eight ROIs can be
configured.
ROI 1
y0_end
• In rolling shutter mode, only a single ROI is supported.
All multiple windowing features described further in
this section are only valid for global shutter mode.
y1_start
ROI 0
Window Configuration
Figure 21 shows the four parameters defining a region of
interest (ROI).
y0_start
1920 pixels
x0_start
x0_end
x1_start
y-end
x1_end
Figure 22. Overlapping Multiple Window
Configuration
ROI 0
The sequencer analyses each line that need to be read out
for multiple windows.
y-start
Restrictions
The following restrictions for each line are assumed for
the user configuration:
• Windows are ordered from left to right, based on their
x−start address:
x-startꢁꢁꢁꢁꢁꢁꢁꢁꢁꢁꢂx-end
x_start_roi(i) vx_start_roi(j) AND
x_end_roi(i) vx_end_roi(j)
Where j > i
Figure 21. Region of Interest Configuration
• x−start[7:0]
x-start defines the x-starting point of the desired window.
The sensor reads out 8 pixels in one single clock cycle. As
a consequence, the granularity for configuring the x-start
position is also 8 pixels for no sub sampling. The value
configured in the x-start register is multiplied by 8 to find the
corresponding column in the pixel array.
Processing Multiple Windows
The sequencer control block houses two sets of counters
to construct the image frame. As previously described, the
y-counter indicates the line that needs to be read out and is
incremented at the end of each line. For the start of the frame,
it is initialized to the y-start address of the first window and
it runs until the y-end address of the last window to be read
out. The last window is configured by the configuration
registers and it is not necessarily window #7.
The x-counter starts counting from the x-start address of
the window with the lowest ID which is active on the
addressed line. Only windows for which the current
y-address is enclosed are taken into account for scanning.
Other windows are skipped.
• x-end[7:0]
This register defines the window end point on the x-axis.
Similar to x-start, the granularity for this configuration is
one kernel. x-end needs to be larger than x-start.
• y-start[9:0]
The starting line of the readout window. The granularity
of this setting is one line, except with color sensors where it
needs to be an even number.
• y-end[9:0]
The end line of the readout window. y-end must be
configured larger than y-start. This setting has the same
granularity as the y-start configuration.
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NOIV1SN2000A, NOIV2SN2000A
• The x-pointer starting position is equal to the x-start
configuration of the first active window on the current
line addressed. This window is not necessarily window
#0.
ROI 2
• The x-pointer is not necessarily incremented by one
each cycle. At the end of a window it can jump to the
start of the next window.
ROI 4
ROI 3
ys
ROI 1
• Each window can be activated separately. There is no
restriction on which window and how many of the 8
windows are active.
ROI 0
Subsampling
Subsampling is used to reduce the image resolution. This
allows increasing the frame rate. Two subsampling modes
are supported: for monochrome sensors (V1/V2-SN) and
color sensors (V1/V2-SE).
Figure 23. Scanning the Image Array with Five
Windows
Figure23 illustrates a practical example of a configuration
with five windows. The current position of the read pointer
(ys) is indicated by a red line crossing the image array. For
this position of the read pointer, three windows need to be
read out. The initial start position for the x-kernel pointer is
the x-start configuration of ROI1. Kernels are scanned up to
the ROI3 x-end position. From there, the x-pointer jumps to
the next window, which is ROI4 in this illustration. When
reaching ROI4’s x-end position, the read pointer is
incremented to the next line and xs is reinitialized to the
starting position of ROI1.
Monochrome Sensors
For monochrome sensors, the read-1-skip-1 subsampling
scheme is used. Subsampling occurs both in x- and y-
direction.
Color Sensors
For color sensors, the read-2-skip-2 subsampling scheme
is used. Subsampling occurs both in x- and y- direction.
Figure 24 shows which pixels are read and which ones are
skipped.
Notes:
• The starting point for the readout pointer at the start of
a frame is the y-start position of the first active window.
• The read pointer is not necessarily incremental by one,
but depending on the configuration, it can jump in
y-direction. In Figure 23, this is the case when reaching
the end of ROI0 where the read pointer jumps to the
y-start position of ROI1
Binning
Pixel binning is a technique in which different pixels are
averaged in the analog domain. A 2x1 binning mode is
available on the monochrome sensors (V1/V2-SN). When
enabled, two neighboring pixels in the x-direction are
averaged while line readout happens in a read-1-skip-1
manner.
Pixel binning is not supported on V1/V2-SE.
Figure 24. Subsampling Scheme for Monochrome and Color Sensors
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NOIV1SN2000A, NOIV2SN2000A
Multiple Slope Integration
To increase the dynamic range of the sensor, a second
slope is applied in the dual slope mode (green curve). The
sensor has the same responsivity in the black as for a single
slope, but from ‘knee point 1’ on, the sensor is less
responsive to incoming light. The result is that the saturation
point is at a higher light power level.
To further increase the dynamic range, a third slope can be
applied, resulting in a second knee point.
The multiple slope function is only available in global
shutter modes. Refer to section Global Shutter Mode on
page 29 for general notes applicable to the global shutter
operation and more particular to the use of the trigger0 pin.
‘Multiple Slope Integration’ is a method to increase the
dynamic range of the sensor. The VITA 2000 supports up to
three slopes.
Figure 25 shows the sensor response to light when the
sensor is used with one slope, two slopes, and three slopes.
The X-axis represents the light power; the Y-axis shows the
sensor output signal. The kneepoint of the multiple slope
curves are adjustable in both position and voltage level.
It is clear that when using only one slope (red curve), the
sensor has the same responsivity over the entire range, until
the output saturates at the point indicated with ‘single slope
saturation point’.
output
1023
slope 3
`kneepoint 2'
slope 1ꢁꢁꢁꢁꢂslope 2
`kneepoint 1'
light
0
single slope
saturation point
triple slope
saturation point
dual slope
saturation point
Figure 25. Multiple Slope Operation
Required Register Uploads
Table 21. REQUIRED UPLOADS FOR MULTIPLE
SLOPE INTEGRATION
Multiple slope integration requires the uploads as
described in the following table. Note that these are
cumulative with the required register uploads (Table 8).
These register uploads are subject to change.
Upload # Address
Data
Description
1
2
421
429
0x7030
0x7050
Configure sequencer
Configure sequencer
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NOIV1SN2000A, NOIV2SN2000A
Kneepoint Configuration (Multiple Slope Reset Levels)
dual_slope_enableand triple_slope_enable and their values
are defined by the registers exposure_ds and exposure_ts.
The kneepoint reset levels are configured by means of
DAC configurations in the image core. The dual slope
kneepoint is configured with the dac_ds configuration,
while the triple slope kneepoint is configured with the
dac_ts register setting. Both are located on address 41.
NOTE: Dual and triple slope sequences must start after
readout of the previous frame is fully completed.
Figure 26 shows the frame timing for pipelined master
mode with dual and triple slope integration and
fr_mode = ‘0’ (fr_length representing the reset length).
In triggered master mode, the start of integration is
initiated by a rising edge on trigger0, while the falling edge
does not have any relevance. Exposure duration and
dual/triple slope points are defined by the registers.
Multiple Slope Integration in Master Mode (Pipelined or
Triggered)
In master mode, the time stamps for the double and triple
slope resets are configured in a similar way as the exposure
time. They are enabled through the registers
Figure 26. Multiple Slope Operation in Master Mode for fr_mode = ‘0’ (Pipelined)
Slave Mode
initiates the triple slope reset sequence. Rising edges on
In slave mode, the register settings for integration control
are ignored. The user has full control through the trigger0,
trigger1 and trigger2 pins. A falling edge on trigger1
initiates the dual slope reset while a falling edge on trigger2
trigger1 and trigger2 do not have any impact.
NOTE: Dual and triple slope sequences must start after
readout of the previous frame is fully completed.
Frame N
Integrating
Exposure State
trigger0
FOT
Reset
FOT Integrating
trigger1
(No effect on
rising edge)
trigger2
Readout
FOT
DS
TS
FOT
Image Array Global Reset
= ROT
= Readout
Figure 27. Multiple Slope Operation in Slave Mode
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NOIV1SN2000A, NOIV2SN2000A
Black Reference
exposure time and gain are reconfigured together, as an
exposure time update always has one frame latency.
The sensor reads out one or more black lines at the start of
every new frame. The number of black lines to be generated
is programmable and is minimal equal to 1. The length of the
black lines depends on the operation mode: for Rolling
Shutter mode, the length of the black line is equal to the line
length configured in the active window. For Global Shutter
mode, the sensor always reads out the entire line (240
kernels), independent of window configurations.
The black references are used to perform black calibration
and offset compensation in the data channels. The raw black
pixel data is transmitted over the usual output interface,
while the regular image data is compensated (can be
bypassed).
On the output interface, black lines can be seen as a
separate window, however without Frame Start and Ends
(only Line Start/End). The Sync code following the Line
Start and Line End indications (“window ID”) contains the
active window number for Rolling Shutter operation, while
it is 0 for Snapshot Shutter operation. Black reference data
is classified by a BL code.
Table 22. SIGNAL PATH GAIN STAGES
(Analog Gain Stages)
gain_stage1
Gain
Stage 1
gain_stage2
Gain
Stage 2
GAIN to-
tal
0x2
0x2
0x2
0x2
0x2
0x1
0x1
0x1
0x1
0x1
0x1
1.00
1.00
1.00
1.00
1.00
2.00
2.00
2.00
2.00
2.00
2.00
0xF
0x7
0x3
0x5
0x1
0x7
0x3
0x5
0x1
0x6
0x2
1.00
1.14
1.33
1.60
2.00
1.14
1.33
1.60
2.00
2.67
4.00
1.00
1.14
1.33
1.60
2.00
2.29
2.67
3.20
4.00
5.33
8.00
Signal Path Gain
Digital Gain Stage
Analog Gain Stages
The digital gain stage allows fine gain adjustments on the
digitized samples. The gain configuration is an absolute 5.7
unsigned number (5 digits before and 7 digits after the
decimal point).
Two gain steps are available in the analog data path to
apply gain to the analog signal before it is digitized. The gain
amplifier can apply a gain of 1x to 8x to the analog signal.
The moment a gain re-configuration is applied and
becomes valid can be controlled by the gain_lat_comp
configuration.
With ‘gain_lat_comp’ set to ‘0’, the new gain
configurations are applied from the very next frame.
With ‘gain_lat_comp’ set to ‘1’, the new gain settings are
postponed by one extra frame. This feature is useful when
Automatic Exposure Control
The exposure control mechanism has the shape of a
general feedback control system. Figure 28 shows the high
level block diagram of the exposure control loop.
AEC
Statistics
AEC
Filter
AEC
Enforcer
Requested Illumination Level
(Target)
Integration Time
Analog Gain (Coarse Steps)
Digital Gain (Fine Steps)
Image Capture
Figure 28. Automatic Exposure Control Loop
Three main blocks can be distinguished:
• The relative gain change request from the statistics
block is filtered in the time domain (low pass filter)
before being integrated. The output of the filter is the
total requested gain in the complete signal path.
• The statistics block compares the average of the current
image’s samples to the configured target value for the
average illumination of all pixels
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NOIV1SN2000A, NOIV2SN2000A
• The enforcer block accepts the total requested gain and
Table 24. AEC TARGET ILLUMINATION
CONFIGURATION
distributes this gain over the integration time and gain
stages (both analog and digital)
Register
Name
Description
The automatic exposure control loop is enabled by
asserting the aec_enable configuration in register 160.
161[9:0] desired_in Target intensity value, on 10bit scale.
tensity For 8bit mode, target value is con
figured on desired_intensity[9:2]
NOTE: Dual and Triple slope integration is not
supported in conjunction with the AEC.
Color Sensor
The weight of each color can be configured for color
sensors by means of scale factors. Note these scale factor are
only used to calculate the statistics in order to compensate
for (off-chip) white balancing and/or color matrices. The
pixel values itself are not modified.
AEC Statistics Block
The statistics block calculates the average illumination of
the current image. Based on the difference between the
calculated illumination and the target illumination the
statistics block requests a relative gain change.
The scale factors are configured as 3.7 unsigned numbers
(0x80 = unity).
Statistics Subsampling and Windowing
For average calculation, the statistics block will
sub-sample the current image or windows by taking every
fourth sample into account. Note that only the pixels read out
through the active windows are visible for the AEC. In the
case where multiple windows are active, the samples will be
selected from the total samples. Samples contained in a
region covered by multiple (overlapping) window will be
taking into account only once.
It is possible to define an AEC specific sub-window on
which the AEC will calculate it’s average. For instance, the
sensor can be configured to read out a larger frame, while the
illumination is measured on a smaller region of interest, e.g.
center weighted.
Table 25. COLOR SCALE FACTORS
Register
Name
Description
162[9:0] red_scale_factor
Red scale factor for AEC statist-
ics
163[9:0] green1_scale_fa- Green1 scale factor for AEC
ctor statistics
164[9:0] green2_scale_fa- Green2 scale factor for AEC
ctor statistics
165[9:0] blue_scale_factor Blue scale factor for AEC stat-
istics
Configure these factors to their default value for
monochrome sensors.
Table 23. AEC SAMPLE SELECTION
Register
Name
Description
AEC Filter Block
The filter block low-pass filters the gain change requests
received from the statistics block.
The filter can be restarted by asserting the restart_filter
configuration of register 160.
192[10]
roi_aec_en- When 0x0, all active windows are se-
able
lected for statistics calculation.
When 0x1, the AEC samples are
selected from the active pixels con-
tained in the region of interest defined
by roi_aec
AEC Enforcer Block
253-255 roi_aec
These registers define a window from
which the AEC samples will be selec-
ted when roi_aec_enable is asserted.
Configuration is similar to the regular
region of interests.
The intersection of this window with
the active windows define the selec-
ted pixels. It is important that this win-
dow at least overlaps with one or
more active windows.
The enforcer block calculates the four different gain
parameters, based on the required total gain, thereby
respecting a specific hierarchy in those configurations.
Some (digital) hysteresis is added so that the (analog) sensor
settings don’t need to change too often.
Exposure Control Parameters
The several gain parameters are described below, in the
order in which these are controlled by the AEC for large
adjustments. Small adjustments are regulated by digital gain
only.
Important note for rolling shutter operation: a minimum
of 4 dummy lines is required when using the automatic
exposure controller.
• Exposure Time
Target Illumination
The target illumination value is configured by means of
register desired_intensity.
In rolling shutter mode, the exposure time is the time
elapsed between resetting a particular line and reading it out.
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NOIV1SN2000A, NOIV2SN2000A
This time is constant for all lines in a frame, lest the image
be non-uniformly exposed. The exposure time is always an
integer multiple of the line time.
In a snapshot shutter mode, the exposure is the time
between the global image array reset de-assertion and the
pixel charge transfer. The granularity of the integration time
steps is configured by the mult_timer register.
170[15:0] max_exposure
Upper bound for the integration
time applied by the AEC
171[1:0]
max_mux_gain
Upper bound for the first stage
analog amplifier.
This stage has two configura-
tions with the following approx-
imative gains:
0x0 = 1x
0x1 = 2x
NOTE: The exposure_time register is ignored when the
AEC is enabled. The register fr_length defines
the frame time and needs to be configured
accordingly.
171[3:2]
max_afe_gain
Upper bound for the second
stage analog amplifier
This stage has four configura-
tions with the following approx-
imative gains:
0x0 = 1.00x
0x1 = 1.33x
0x2 = 2.00x
0x3 = 2.50x
• Analog Gain
The sensor has two analog gain stages, configurable
independently from each other. Typically the AEC shall first
regulate the first stage. Optionally this behavior can be
inverted by setting the amp_pri register.
• Digital Gain
171[15:4] max_digit-
al_gain
Upper bound for the digital gain
stage. This configuration spe-
cifies the effective gain in 5.7
unsigned format
The last gain stage is a gain applied on the digitized
samples. The digital gain is represented by a 5.7 unsigned
number (i.e. 7 bits after the decimal point). While the analog
gain steps are coarse, the digital gain stage makes it possible
to achieve very fine adjustments.
AEC Update Frequency
As an integration time update has a latency of one frame,
the exposure control parameters are evaluated and updated
every other frame.
AEC Control Range
The control range for each of the exposure parameters can
be pre-programmed in the sensor. Note that for rolling
shutter operation the maximum integration time should not
exceed the number of lines read out (i.e. the sum of black
lines, active window-defined lines and dummy lines).
Table 26 lists the relevant registers.
NOTE: The gain update latency must be postpone to
match the integration time latency. This is done
by asserting the gain_lat_comp register on
address 204[13].
Exposure Control Status Registers
Configured integration and gain parameters are reported
to the user by means of status registers. The sensor provides
two levels of reporting: the status registers reported in the
AEC address space are updated once the parameters are
recalculated and requested to the internal sequencer. The
status registers residing in the sequencer’s address space on
the other hand are updated once these parameters are taking
effect on the image readout. The first set shall thus lead the
second set of status registers.
Table 26. MINIMUM AND MAXIMUM EXPOSURE
CONTROL PARAMETERS
Register
Name
Description
168[15:0] min_exposure
Lower bound for the integration
time applied by the AEC
169[1:0]
169[3:2]
min_mux_gain
min_afe_gain
Lower bound for the first stage
analog amplifier.
This stage has two configura-
tions with the following approx-
imative gains:
0x0 = 1x
0x1 = 2x
Table 27. EXPOSURE CONTROL STATUS REGISTERS
Register
Name
Description
AEC Status Registers
184[15:0] total_pixels
Lower bound for the second
stage analog amplifier
Total number of pixels taken into
account for the AEC statistics.
This stage has four configura-
tions with the following approx-
imative gains:
0x0 = 1.00x
0x1 = 1.33x
0x2 = 2.00x
0x3 = 2.50x
186[9:0]
average
Calculated average illumination lev-
el for the current frame.
187[15:0] exposure
AEC calculated exposure.
Note: this parameter is updated at
the frame end.
169[15:4] min_digital_gain Lower bound for the digital gain
stage. This configuration spe-
cifies the effective gain in 5.7
unsigned format
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NOIV1SN2000A, NOIV2SN2000A
Temperature Sensor
st
188[1:0]
188[3:2]
mux_gain
afe_gain
AEC calculated analog gain (1
The VITA 2000 has an on-chip temperature sensor which
can output a digital code (Tsensor) of the silicon junction
temperature. The Tsensor output is a 8-bit digital count
between 0 and 255, proportional to the temperature of the
silicon substrate. This reading can be translated directly to
a temperature reading in °C by calibrating the 8-bit readout
at 0°C and 70°C to achieve an output accuracy of 2°C. The
Tsensor output can also be calibrated using a single
temperature point (example: room temperature or the
ambient temperature of the application), to achieve an
output accuracy of 5°C.
The resolution of the temperature sensor in ºC / bit is made
almost constant over process variations by design.
Therefore any process variation will result in an offset in the
bit count and this offset will remain within 5°C over the
temperature range of 0°C and 70°C.
stage)
Note: this parameter is updated at
the frame end.
st
AEC calculated analog gain (2
stage)
Note: this parameter is updated at
the frame end.
188[15:4] digital_gain
AEC calculated digital gain (5.7 un-
signed format)
Note: this parameter is updated at
the frame end.
Sequencer Status Registers
208[15:0] mult_timer
mult_timer for current frame (global
shutter only).
Note: this parameter is updated
once it takes effect on the image.
209[15:0] reset_length Image array reset length for the cur-
rent frame (global shutter only).
Tsensor output digital code can be read out through the
SPI interface. Refer to the Register Map on page 50.
The output of the temperature sensor to the SPI:
Note: this parameter is updated
once it takes effect on the image.
tempd_reg_temp<7:0>: This is the 8-bit N count readout
proportional to temperature.
The input from the SPI:
210[15:0] exposure
Exposure for the current frame.
Note: this parameter is updated
once it takes effect on the image.
The reg_tempd_enable is a global enable and this enables
or disables the temperature sensor when logic high or logic
low respectively. The temperature sensor is reset or disabled
when the input reg_tempd_enable is set to a digital low state.
211[15:0] exposure_ds Dual slope exposure for the current
frame. Note this parameter is not
controlled by the AEC.
Note: this parameter is updated
once it takes effect on the image.
212[15:0] exposure_ts Triple slope exposure for the cur-
rent frame. Note this parameter is
Calibration using one temperature point
The temperature sensor resolution is fixed for a given type
of package for the operating range of 0°C to +70°C and
hence devices can be calibrated at any ambient temperature
of the application, with the device configured in the mode of
operation.
not controlled by the AEC.
Note: this parameter is updated
once it takes effect on the image.
st
213[4:0]
mux_gainsw
1
stage analog gain for the current
frame.
Note: this parameter is updated
once it takes effect on the image.
Interpreting the actual temperature for the digital code
readout:
The formula used is
st
213[12:5] afe_gain
214[11:0] db_gain
2
stage analog gain for the current
frame.
T = R (Nread - Ncalib) + Tcalib
Note: this parameter is updated
once it takes effect on the image.
J
T = junction die temperature
J
R = resolution in degrees/LSB (typical 0.75 deg/LSB)
Nread = Tsensor output (LSB count between 0 and 255)
Tcalib = Tsensor calibration temperature
Digital gain configuration for the
current frame (5.7 unsigned for-
mat).
Note: this parameter is updated
once it takes effect on the image.
Ncalib = Tsensor output reading at Tcalib
214[12]
214[13]
dual_slope
triple_slope
Dual slope configuration for the cur-
rent frame
Note 1: this parameter is updated
once it takes effect on the image.
Note 2: This parameter is not con-
trolled by the AEC.
Monitor Pins
The internal sequencer has two monitor outputs (Pin 44
and Pin 45) that can be used to communicate the internal
states from the sequencer. A three-bit register configures the
assignment of the pins.
Triple slope configuration for the
current frame.
Note 1: this parameter is updated
once it takes effect on the image.
Note 2: This parameter is not con-
trolled by the AEC.
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NOIV1SN2000A, NOIV2SN2000A
Table 28. REGISTER SETTING FOR THE MONITOR SELECT PIN
monitor_select [2:0]
192 [13:11]
monitor pin
Description
0x0
0x1
0x2
0x3
0x4
0x5
0x6
0x7
monitor0
monitor1
‘0’
‘0’
monitor0
monitor1
Integration Time
ROT Indication (‘1’ during ROT, ‘0’ outside)
monitor0
monitor1
Integration Time
Dual/Triple Slope Integration (asserted during DS/TS FOT sequence)
monitor0
monitor1
Start of x-Readout Indication
Black Line Indication (‘1’ during black lines, ‘0’ outside)
monitor0
monitor1
Frame Start Indication
Start of ROT Indication
monitor0
monitor1
First Line Indication (‘1’ during first line, ‘0’ for all others)
Start of ROT Indication
monitor0
monitor1
ROT Indication (‘1’ during ROT, ‘0’ outside)
Start of X-Readout Indication
monitor0
monitor1
Start of X-readout Indication for Black Lines
Start of X-readout Indication for Image Lines
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NOIV1SN2000A, NOIV2SN2000A
DATA OUTPUT FORMAT
The VITA 2000 is available in two different versions:
Frame Format
The frame format is explained by example of the readout
of two (overlapping) windows as shown in Figure 29 (a).
The readout of a frame occurs on a line-by-line basis. The
read pointer goes from left to right, bottom to top.
Figure 29 indicates that, after the FOT is completed, the
sensor reads out a number of black lines for black calibration
purposes. After these black lines, the windows are
processed. First a number of lines which only includes
information of ‘ROI 0’ are sent out, starting at position
y0_start. When the line at position y1_start is reached, a
number of lines containing data of ‘ROI 0’ and ‘ROI 1’ are
sent out, until the line position of y0_end is reached. From
there on, only data of ‘ROI 1’ appears on the data output
channels until line position y1_end is reached.
• V1-SN/SE: Four LVDS output channels, together with
an LVDS clock output and an LVDS synchronization
output channel.
• V2-SN/SE: A 10-bit parallel CMOS output, together
with a CMOS clock output and ‘frame valid’ and ‘line
valid’ CMOS output signals.
V1-SN/SE: LVDS Interface Version
LVDS Output Channels
The image data output occurs through four LVDS data
channels. A synchronization LVDS channel and an LVDS
output clock signal is foreseen to synchronize the data.
The four data channels are used to output the image data
only. The sync channel transmits information about the data
sent over these data channels (includes codes indicating
black pixels, normal pixels, and CRC codes).
During read out of the image data over the data channels,
the sync channel sends out frame synchronization codes
which give information related to the image data that is sent
over the four data output channels.
8-bit / 10-bit Mode
Each line of a window starts with a Line Start (LS)
indication and ends with a Line End (LE) indication. The
line start of the first line is replaced by a Frame Start (FS);
the line end of the last line is replaced with a Frame End
indication (FE). Each such frame synchronization code is
followed by a window ID (range 0 to 7). For overlapping
windows, the line synchronization codes of the overlapping
windows with lower IDs are not sent out (as shown in the
illustration: no LE/FE is transmitted for the overlapping part
of window 0).
The sensor can be used in 8-bit or 10-bit mode.
In 10-bit mode, the words on data and sync channel have
a 10-bit length. The output data rate is 620 Mbps.
In 8-bit mode, the words on data and sync channel have an
8-bit length, the output data rate is 496 Mbps.
Note that the 8-bit mode can only be used to limit the data
rate at the consequence of image data word depth. It is not
supported to operate the sensor in 8-bit mode at a higher
clock frequency to achieve higher frame rates.
NOTE: In Figure 29, only Frame Start and Frame End
Sync words are indicated in (b). CRC codes are
also omitted from the figure.
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NOIV1SN2000A, NOIV2SN2000A
y1_end
y0_end
y1_start
ROI 1
ROI 0
y0_start
x0_start
x0_end
x1_start
x1_end
(a)
Integration Time
Handling
Reset
N
Reset
N+1
FOT
FOT
FOT
FOT
Exposure Time N
Exposure Time N+1
Readout Frame N-1
Readout Frame N
Readout
Handling
B
L
ROI
1
B
L
ROI
1
FOT
ROI 0
ROI 0
FS0
FS1
FE1
FS0
FS1
FE1
(b)
Figure 29. V1−SN/SE: Frame Sync Codes
Figure 30 shows the detail of a black line readout during global or full-frame readout.
Sequencer
FOT
ROT
black
ROT
ROT
line Ys+1
ROT
line Ye
line Ys
Internal State
data channels
sync channel
Training
TR
Training
data channels
sync channel
LS
0
BL
BL
BL
BL
BL
BL
LE
0
CRC
TR
timeslot
0
timeslot
1
timeslot
157
timeslot
158
timeslot
159
CRC
timeslot
Figure 30. V1−SN/SE: Time Line for Black Line Readout
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NOIV1SN2000A, NOIV2SN2000A
Figure 31 shows the details of the readout of a number of lines for single window readout, at the beginning of the frame.
Sequencer
Internal State
FOT
ROT
black
ROT
ROT
line Ys+1
ROT
line Ye
line Ys
data channels
sync channel
Training
Training
TR
data channels
sync channel
TR
FS
ID
IMG IMG
IMG
IMG IMG IMG
LE
ID
CRC
timeslot
Xstart
timeslot
Xstart + 1
timeslot
Xend - 2
timeslot
Xend - 1
timeslot
Xend
CRC
timeslot
Figure 31. V1−SN/SE: Time Line for Single Window Readout (at the start of a frame)
Figure 32 shows the detail of the readout of a number of lines for readout of two overlapping windows.
Sequencer
Internal State
FOT
ROT
black
ROT
line Ys
ROT
line Ys+1
ROT
line Ye
data channels
sync channel
Training
TR
Training
TR
data channels
sync channel
LS
IMG IMG
LS
IDN
IMG
IMG LE
IDN
CRC
IDM
IMG
timeslot
XstartM
timeslot
XstartN
timeslot
XendN
Figure 32. V1−SN/SE: Time Line Showing the Readout of Two Overlapping Windows
Frame Synchronization for 10−bit Mode
active at the same time, the sync channel transmits the frame
synchronization codes of the window with highest index
only.
Table 30 shows the structure of the frame synchronization
code. Note that the table shows the default data word
(configurable) for 10-bit mode. If more than one window is
Table 29. FRAME SYNCHRONIZATION CODE DETAILS FOR 10-BIT MODE
Sync Word Bit
Position
Register
Address
Default Val-
ue
Description
9:7
9:7
9:7
9:7
6:0
N/A
N/A
0x5
0x6
Frame start indication
Frame end indication
Line start indication
Line end indication
N/A
0x1
N/A
0x2
131[6:0]
0x2A
These bits indicate that the received sync word is a frame synchronization code. The
value is programmable by a register setting
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NOIV1SN2000A, NOIV2SN2000A
• Window Identification
• Data Classification Codes
Frame synchronization codes are always followed by a
3-bit window identification (bits 2:0). This is an integer
number, ranging from 0 to 7, indicating the active window.
If more than one window is active for the current cycle, the
highest window ID is transmitted.
For the remaining cycles, the sync channel indicates the
type of data sent through the data links: black pixel data
(BL), image data (IMG), or training pattern (TR). These
codes are programmable by a register setting. The default
values are listed in Table 31.
Table 30. SYNCHRONIZATION CHANNEL DEFAULT IDENTIFICATION CODE VALUES FOR 10-BIT MODE
Sync Word Bit
Position
Register
Address
Default
Value
Description
9:0
9:0
9:0
9:0
132 [9:0]
133 [9:0]
134 [9:0]
135 [9:0]
0x015
0x035
0x059
0x3A6
Black pixel data (BL). This data is not part of the image. The black pixel data is used in-
ternally to correct channel offsets.
Valid pixel data (IMG). The data on the data output channels is valid pixel data (part of the
image).
CRC value. The data on the data output channels is the CRC code of the finished image
data line.
Training pattern (TR). The sync channel sends out the training pattern which can be pro-
grammed by a register setting.
Frame Synchronization in 8-bit Mode
and not sent out. Table 32 shows the structure of the frame
The frame synchronization words are configured using
the same registers as in 10-bit mode. The two least
significant bits of these configuration registers are ignored
synchronization code, together with the default value, as
specified in SPI registers. The same restriction for
overlapping windows applies in 8-bit mode.
Table 31. FRAME SYNCHRONIZATION CODE DETAILS FOR 8-BIT MODE
Sync Word Bit
Position
Register
Address
Default
Value
Description
7:5
7:5
7:5
7:5
4:0
N/A
N/A
N/A
N/A
[6:2]
0x5
0x6
Frame start (FS) indication
Frame end (FE) indication
Line start (LS) indication
Line end (LE) indication
0x1
0x2
0x0A
These bits indicate that the received sync word is a frame synchronization code. The val-
ue is programmable by a register setting.
• Window Identification
Similar to 10-bit operation mode, the frame
synchronization codes are followed by window
identification. The window ID is located in bits 4:2 (all other
bit positions are ‘0’). The same restriction for overlapping
windows applies in 8-bit mode.
• Data Classification Codes
BL, IMG, CRC, and TR codes are defined by the same
registers as in 10-bit mode. Bits 9:2 of the respective
configuration registers are used as classification code with
default values shown in Table 33.
a
Table 32. SYNCHRONIZATION CHANNEL DEFAULT IDENTIFICATION CODE VALUES FOR 8-BIT MODE
Sync Word Bit
Position
Register
Address
Default
Value
Description
7:0
7:0
7:0
7:0
132 [9:2]
133 [9:2]
134 [9:2]
135 [9:2]
0x05
0x0D
0x16
0xE9
Black pixel data (BL). This data is not part of the image. The black pixel data is used in-
ternally to correct channel offsets.
Valid pixel data (IMG). The data on the data output channels is valid pixel data (part of
the image).
CRC value. The data on the data output channels is the CRC code of the finished image
data line.
Training Pattern (TR). The sync channel sends out the training pattern which can be pro-
grammed by a register setting.
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NOIV1SN2000A, NOIV2SN2000A
Training Patterns on Data Channels
In 8-bit mode, the training pattern for the data channels is
defined by the same register as in 10-bit mode, where the
lower two bits are omitted; see Table 35.
In 10-bit mode, during idle periods, the data channels
transmit training patterns, indicated on the sync channel by
a TR code. These training patterns are configurable
independent of the training code on the sync channel as
shown in Table 34.
Table 33. TRAINING CODE ON SYNC CHANNEL IN 10-BIT MODE
Sync Word Bit
Position
Register
Address
Default Val-
ue
Description
[9:0]
130 [9:0]
0x3A6
Data channel training pattern. The data output channels send out the training pattern,
which can be programmed by a register setting. The default value of the training pattern
is 0x3A6, which is identical to the training pattern indication code on the sync channel.
Table 34. TRAINING PATTERN ON DATA CHANNEL IN 8-BIT MODE
Data Word Bit
Position
Register
Address
Default Val-
ue
Description
[7:0]
130 [9:2]
0xE9
Data Channel Training Pattern (Training pattern).
Cyclic Redundancy Code
Data Order
At the end of each line, a CRC code is calculated to allow
error detection at the receiving end. Each data channel
transmits a CRC code to protect the data words sent during
the previous cycles. Idle and training patterns are not
included in the calculation.
The sync channel is not protected. A special character
(CRC indication) is transmitted whenever the data channels
send their respective CRC code.
To read out the image data through the output channels,
the pixel array is organized in kernels. The kernel size is
eight pixels in x-direction by one pixel in y-direction.
Figure 33 indicates how the kernels are organized. The first
kernel (kernel [0, 0]) is located in the bottom left corner. The
data order of this image data on the data output channels
depends on the subsampling mode.
kernel
(239,1199)
The polynomial in 10-bit operation mode is
10
9
6
3
2
x
+ x + x + x + x + x + 1. The CRC encoder is seeded
pixel array
ROI
at the start of a new line and updated for every (valid) data
word received. The CRC seed is configurable using the
crc_seed register. When ‘0’, the CRC is seeded by all-‘0’;
when ‘1’ it is seeded with all-‘1’.
In 8-bit mode, the polynomial is x + x + x + x + 1.
The CRC seed is configured by means of the crc_seed
register.
kernel
8
6
3
2
(x_start,y_start)
kernel
(0,0)
Note The CRC is calculated for every line. This implies
that the CRC code can protect lines from multiple windows.
0
1
2
3
5
6
7
Figure 33. Kernel Organization in Pixel Array
www.onsemi.com
45
NOIV1SN2000A, NOIV2SN2000A
Figure 34 shows how a kernel is read out over the four
• V1−SN/SE: No Subsampling
output channels. For even positioned kernels, the kernels are
read out ascending, while for odd positioned kernels the data
order is reversed (descending).
The image data is read out in kernels of eight pixels in
x-direction by one pixel in y-direction. One data channel
output delivers two pixel values of one kernel sequentially.
kernel 12
kernel 13
kernel 14
kernel 15
time
pixel # (even kernel)
pixel # (odd kernel)
0
1
2
3
4
5
6
7
7
6
5
4
3
2
1
0
MSB
LSB
MSB
LSB
Note: The bit order is always MSB first,
regardless the kernel number
10-bit
10-bit
Figure 34. V1−SN/SE: Data Output Order when Subsampling is Disabled
pixel positions inside that kernel are read out. Figure 35
shows the data order.
Note that there is no difference in data order for even/odd
kernel numbers, as opposed to the ‘no-subsampling’
readout.
• V1−SN/SE: Subsampling on Monochrome Sensor
To read out the image data with subsampling enabled on
a monochrome sensor, two neighboring kernels are
combined to a single kernel of 16 pixels in the x-direction
and one pixel in the y-direction. Only the pixels at the even
kernel 12
kernel 13
kernel 14
kernel 15
time
pixel #
0
14
2
12
4
10
6
8
MSB
LSB
MSB
LSB
Note: The bit order is always MSB first,
regardless the kernel number
10-bit
10-bit
Figure 35. V1−SN/SE: Data Output Order in Subsampling Mode on a Monochrome Sensor
www.onsemi.com
46
NOIV1SN2000A, NOIV2SN2000A
the y-direction. Only the pixels 0, 1, 4, 5, 8, 9, 12, and 13 are
• V1−SN/SE: Subsampling on Color Sensor
read out. Figure 36 shows the data order.
Note that there is no difference in data order for even/odd
kernel numbers, as opposed to the ‘no-subsampling’
readout.
To read out the image data with subsampling enabled on
a color sensor, two neighboring kernels are combined to a
single kernel of 16 pixels in the x-direction and one pixel in
kernel 12
kernel 13
kernel 14
kernel 15
time
pixel #
0
1
13 12
4
5
9
8
MSB
LSB
MSB
LSB
Note: The bit order is always MSB first,
regardless the kernel number
10-bit
10-bit
Figure 36. V1−SN/SE: Data Output Order in Subsampling Mode on a Color Sensor
V2−SN/SE: CMOS Interface Version
The frame_valid indication is asserted at the start of a new
frame and remains asserted until the last line of the frame is
completely transmitted.
The line_valid indication serves the following needs:
CMOS Output Signals
The image data output occurs through a single 10-bit
parallel CMOS data output, operating at 62 MSps. A CMOS
clock output, ‘frame valid’ and ‘line valid’ signal is foreseen
to synchronize the output data.
• While the line_valid indication is asserted, the data
channels contain valid pixel data.
No windowing information is sent out by the sensor.
• The line valid communicates frame timing as it is
asserted at the start of each line and it is de-asserted at
the end of the line. Low periods indicate the idle time
between lines (ROT).
• The data channels transmit the calculated CRC code
after each line. This can be detected as the data words
right after the falling edge of the line valid.
8-bit/10-bit Mode
The 8-bit mode is not supported when using the parallel
CMOS output interface.
Frame Format
Frame timing is indicated by means of two signals:
frame_valid and line_valid.
Sequencer
Internal State
FOT ROT
black
ROT
ROT
line Ys+1
ROT
line Ye
FOT ROT
black
line Ys
data channels
frame_valid
line_valid
Figure 37. V2−SN/SE: Frame Timing Indication
www.onsemi.com
47
x1_sꢀt
(a)
x1_eꢀnd
t
x0_start
x0_
aꢀr
end
NOIV1SN2000A, NOIV2SN2000A
The frame format is explained with an example of the
readout of two (overlapping) windows as shown in
Figure 38 (a).
The readout of a frame occurs on a line-by-line basis. The
read pointer goes from left to right, bottom to top.
Figure 38 (a) and (b) indicate that, after the FOT is finished,
a number of lines which include information of ‘ROI 0’ are
sent out, starting at position y0_start. When the line at
position y1_start is reached, a number of lines containing
data of ‘ROI 0’ and ‘ROI 1’ are sent out, until the line
position of y0_end is reached. Then, only data of ‘ROI 1’
appears on the data output until line position y1_end is
reached. The line_valid strobe is not shown in Figure 38.
1920 pixels
y1_end
y0_eꢀnꢀd
y1 ꢀstart
ROI1
ROI0
y0 ꢀstart
Reset
N
Reset
Integration Time
Handling
FOT
FOT
FOT
Exposure Time N
Exposure Time N +1
N+1
Readout Frame N
Readout Frame N -1
Readout
Handling
ROI1
ROI1
FOT
ROI0
FOT
ROI0
Frame valid
(b)
Figure 38. V2−SN/SE: Frame Format to Read Out Image Data
Black Lines: Black pixel data is also sent through the data
channels. To distinguish these pixels from the regular image
data, it is possible to ‘mute’ the frame and/or line valid
indications for the black lines.
Table 35. BLACK LINE FRAME_VALID AND LINE_VALID SETTINGS
bl_frame_val-
id_enable
bl_line_val-
id_enable
Description
0x1
0x1
The black lines are handled similar to normal image lines. The frame valid indication is asserted
before the first black line and the line valid indication is asserted for every valid (black) pixel.
0x1
0x0
The frame valid indication is asserted before the first black line, but the line valid indication is not
asserted for the black lines. The line valid indication indicates the valid image pixels only. This
mode is useful when one does not use the black pixels and when the frame valid indication needs
to be asserted some time before the first image lines (for example, to precondition ISP pipelines).
0x0
0x0
0x1
0x0
In this mode, the black pixel data is clearly unambiguously indicated by the line valid indication,
while the decoding of the real image data is simplified.
Black lines are not indicated and frame and line valid strobes remain de-asserted. Note however
that the data channels contains the black pixel data and CRC codes (Training patterns are inter-
rupted).
www.onsemi.com
48
NOIV1SN2000A, NOIV2SN2000A
Data Order
• V2-SN/SE: No Subsampling
To read out the image data through the parallel CMOS
output, the pixel array is divided in kernels. The kernel size
is eight pixels in x-direction by one pixel in y-direction.
Figure 33 on page 45 indicates how the kernels are
organized.
The image data is read out in kernels of eight pixels in
x-direction by one pixel in y-direction.
Figure 39 shows the pixel sequence of a kernel which is
read out over the single CMOS output channel. The pixel
order is different for even and odd kernel positions.
The data order of this image data on the data output
channels depends on the subsampling mode.
kernel 12
kernel 13
kernel 14
kernel 15
time
pixel # (even kernel)
pixel # (odd kernel)
0
2
4
6
1
3
5
7
7
5
3
1
6
4
2
0
time
Figure 39. V2−SN/SE: Data Output Order without Subsampling
pixel positions inside that kernel are read out. Figure 40
shows the data order
Note that there is no difference in data order for even/odd
kernel numbers, as opposed to the ‘no-subsampling’
readout.
• V2−SN/SE: Subsampling On Monochrome Sensor
To read out the image data with subsampling enabled on
a monochrome sensor, two neighboring kernels are
combined to a single kernel of 16 pixels in the x-direction
and one pixel in the y-direction. Only the pixels at the even
kernel 12
kernel 13
kernel 14
kernel 15
time
pixel #
14 12 10
0
2
4
6
8
time
Figure 40. V2−SN/SE: Data Output Order with Subsampling on a Monochrome Sensor
the y-direction. Only the pixels 0, 1, 4, 5, 8, 9, 12, and 13 are
• V2−SN/SE: Subsampling On Color Sensor
read out. Figure 41 shows the data order.
Note that there is no difference in data order for even/odd
kernel numbers, as opposed to the ‘no-subsampling’
readout.
To read out the image data with subsampling enabled on
a color sensor, two neighboring kernels are combined to a
single kernel of 16 pixels in the x-direction and one pixel in
kernel 12
kernel 13
kernel 14
kernel 15
time
pixel #
0
13
4
9
1
12
5
8
time
Figure 41. V2−SN/SE: Data Output Order with Subsampling on a Color Sensor
www.onsemi.com
49
NOIV1SN2000A, NOIV2SN2000A
REGISTER MAP
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
Description
Type
RO
Chip ID [Block Offset: 0]
0
1
2
0
1
2
chip_id
0x5614
0x5614
0x0000
0x0000
0x0000
0x0
22036
[15:0]
[3:0]
[1:0]
id
22036 ON Semiconductor chip ID
0
reserved
reserved
chip_configuration
RO
0
0
0
Reserved
RW
Configure as per part number:
NOIV1SN2000A-QDC: 0x0
NOIV1SN2000A-QDC: 0x1
NOIV2SN2000A-QDC: 0x2
NOIV2SN2000A-QDC: 0x3
Reset Generator [Block Offset: 8]
0
8
soft_reset_pll
pll_soft_reset
0x099
0x9
153
9
RW
[3:0]
[7:4]
PLL reset
0x9: Soft reset state
Others: Operational
pll_lock_soft_reset
0x9
9
PLL lock detect reset
0x9: Soft reset state
Others: Operational
1
2
9
soft_reset_cgen
cgen_soft_reset
0x09
0x9
9
9
RW
RW
[3:0]
Clock generator reset
0x9: Soft reset state
Others: Operational
10
soft_reset_analog
mux_soft_reset
0x0999
0x9
2457
9
[3:0]
[7:4]
Column MUX reset
0x9: Soft reset state
Others: Operational
afe_soft_reset
ser_soft_reset
0x9
0x9
9
9
AFE reset
0x9: Soft reset state
Others: Operational
[11:8]
Serializer reset
0x9: Soft reset state
Others: Operational
PLL [Block Offset: 16]
0 16
power_down
pwd_n
0x0004
0x0
4
0
RW
[0]
[1]
[2]
PLL Power down
‘0’ = Power down,
‘1’ = Operational
enable
bypass
config
0x0
0x1
0
1
PLL enable
‘0’ = disabled,
‘1’ = enabled
PLL bypass
‘0’ = PLL active,
‘1’ = PLL bypassed
1
17
0x2113
8467
RW
www.onsemi.com
50
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
mdiv
Description
Type
[7:0]
0x13
19
M-divider
19: NOIV1SN2000-10 bit,
15: NOIV1SN2000-8 bit
[12:8]
ndiv
pdiv
0x1
0x1
1
1
N-divider
P-divider
[14:13]
IO [Block Offset: 20]
0
20
config
0x0000
0x0
0
0
0
RW
[0]
clock_in_pwd_n
reserved
Power down clock Input
Reserved
[10:8]
0x0
PLL lock detector [Block Offset: 24]
0
2
3
24
26
27
pll_lock
lock
0x0000
0x0
0
RO
RW
RW
[0]
0
PLL lock indication
Reserved
reserved
reserved
reserved
reserved
0x2280
0x2280
0x3D2D
0x3D2D
8832
8832
[14:0]
15661 Reserved
15661 Reserved
[15:0]
Clock Generator [Block Offset: 32]
32
0
config
0x0004
0x0
4
RW
[0]
[1]
[2]
[3]
enable_analog
0
0
1
0
Enable analog clocks
‘0’ = disabled,
‘1’ = enabled
enable_log
select_pll
adc_mode
0x0
0x1
0x0
Enable logic clock
‘0’ = disabled,
‘1’ = enabled
Input clock selection
‘0’ = Select LVDS clock input,
‘1’ = Select PLL clock input
Set operation mode
‘0’ = 10-bit mode,
‘1’ = 8-bit mode
[11:8]
reserved
reserved
0x0
0x0
0
0
Reserved
Reserved
[14:12]
General Logic [Block Offset: 34]
34
0
config
0x0000
0x0
0
0
RW
RW
[0]
[0]
enable
Logic general enable Configura-
tion
‘0’ = Disable
‘1’ = Enable
Image Core [Block Offset: 40]
40
0
image_core_config
imc_pwd_n
0x0000
0x0
0
0
Image core power down
‘0’ = powered down,
‘1’ = powered up
www.onsemi.com
51
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
mux_pwd_n
Description
Type
[1]
0x0
0
Column multiplexer Power down
‘0’ = powered down,
‘1’ = powered up
[2]
colbias_enable
0x0
0
Bias enable
‘0’ = disabled
‘1’ = enabled
1
41
image_core_config
dac_ds
0xB5A
0xA
0x5
2906
RW
[3:0]
[7:4]
[10:8]
[12:11]
[13]
10
5
Double slope reset level
Triple slope reset level
Reserved
dac_ts
reserved
reserved
reserved
reserved
reserved
0x3
3
0x1
1
Reserved
0x0
0
Reserved
[14]
0x0
0
Reserved
[15]
0x0
0
Reserved
AFE [Block Offset:48]
48
0
power_down
pwd_n
0x0000
0x0
0
0
RW
[0]
Power down for AFEs (8 columns)
‘0’ = powered down,
‘1’ = powered up
Bias [Block Offset: 64]
0
64
power_down
pwd_n
0x0000
0x0
0
0
RW
RW
[0]
[0]
Power down bandgap
‘0’ = powered down,
‘1’ = powered up
1
65
configuration
extres
0x888B
0x1
34955
1
External resistor selection
‘0’ = internal resistor,
‘1’ = external resistor
[3:1]
[7:4]
reserved
0x5
0x8
5
8
Reserved
imc_colpc_ibias
Column precharge ibias Configur-
ation
[11:8]
imc_colbias_ibias
cp_ibias
0x8
0x8
8
8
Column bias ibias configuration
Charge pump bias
[15:12]
2
3
66
67
afe_bias
0x53C8
0x8
21448
8
RW
RW
[3:0]
[7:4]
afe_ibias
AFE ibias configuration
ADC iref configuration
PGA iref configuration
afe_adc_iref
afe_pga_iref
mux_bias
0xC
12
[14:8]
0x53
0x8888
0x8
83
34952
8
[3:0]
[7:4]
mux_25u_stage1
Column multiplexer stage 1 bias
configuration
mux_25u_stage2
0x8
8
Column multiplexer stage 2 bias
configuration
[15:8]
reserved
lvds_bias
0x88
72
Reserved
4
68
0x0088
136
RW
www.onsemi.com
52
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
[3:0]
Register Name
lvds_ibias
Description
Type
0x8
8
8
LVDS Ibias
LVDS Iref
[7:4]
lvds_iref
0x8
6
70
reserved
reserved
afe_ref_bias
0x8888
0x888
0x8
34952
2184
8
RW
[11:0]
[15:2]
Reserved
AFE_reference
Charge Pump [Block Offset: 72]
72
0
config
0x1200
0x0
4608
0
RW
[0]
[1]
respd_trans_pwd_n
PD trans charge pump enable
‘0’ = disabled, ‘1’ = enabled
resfd_pwd_n
0x0
0
FD charge pump enable
‘0’ = disabled, ‘1’ = enabled
[10:8]
respd_trans_trim
resfd_trim
0x2
0x1
2
1
PD trans charge pump trim
FD charge pump trim
[14:12]
Reserved [Block Offset: 80]
0
80
reserved
reserved
reserved
reserved
0x0000
0x000
0
0
RW
RW
[9:0]
Reserved
1
81
0x8881
0x8881
34945
[15:0]
34945 Reserved
Temperature Sensor [Block Offset: 96]
0
96
sensor enable
0x0000
0x0
0
RW
[0]
reg_tempd_enable
0
Temperature Diode Enable
‘0’ = disabled
‘1’ = enabled
1
97
sensor output
0x0000
0x00
0
0
RO
RW
[7:0]
tempd_reg_temp
Temperature Readout
Serializer/LVDS [Block Offset: 112]
112
0
power_down
0x0000
0x0
0
0
[0]
[1]
[2]
clock_out_pwd_n
Power down for clock output.
‘0’ = powered down,
‘1’ = powered up
sync_pwd_n
data_pwd_n
0x0
0x0
0
0
Power down for sync channel
‘0’ = powered down,
‘1’ = powered up
Power down for data channels (4
channels)
‘0’ = powered down,
‘1’ = powered up
Data Block [Block Offset: 128]
128
0
blackcal
0x4008
0x08
0x0
16392
RW
[7:0]
black_offset
black_samples
8
0
Desired black level at output
[10:8]
Black pixels taken into account for
black calibration.
Total samples = 2**black_samples
www.onsemi.com
53
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
adc_offset
Description
Type
[14:11]
0x8
8
ADC offset = 2**adc_offset.
This setting should correspond to
the Calibration DAC setting
[15]
crc_seed
0x0
0
CRC seed
‘0’ = All 0
‘1’ = All 1
1
129
general_configuration
auto_blackcal_enable
0xC001
0x1
49153
1
RW
[0]
Automatic blackcalibration is en-
abled when 1, bypassed when 0
[9:1]
[10]
blackcal_offset
0x00
0x0
0
0
Black Calibration offset used when
auto_black_cal_en = ‘0’.
blackcal_offset_dec
blackcal_offset is added when 0,
subtracted when 1
[11]
[12]
[13]
reserved
reserved
8bit_mode
0x0
0x0
0x0
0
0
0
Reserved
Reserved
Shifts window ID indications by 4
cycles.
‘0’ = 10 bit mode, ‘1’ = 8 bit mode
[14]
[15]
bl_frame_valid_
enable
0x1
0x1
1
1
Assert frame_valid for black lines
when ‘1’, gate frame_valid for
black lines when ‘0’.
NOIV2SN2000AA-QZDC only
bl_line_valid_enable
Assert line_valid for black lines
when ‘1’, gate line_valid for black
lines when ‘0’.
NOIV2SN2000AA-QZDC only
2
130
trainingpattern
trainingpattern
0x03A6
0x3A6
934
934
RW
[9:0]
Training pattern sent on data
channels during idle mode. This
data is used to perform word
alignment on the LVDS data chan-
nels.
[10]
reserved
0x0
0
Reserved
3
4
131
132
sync_code0
frame_sync
0x002A
0x02A
42
42
RW
RW
[6:0]
Frame sync LSBs.
Note: The tenth bit indicates
frame/line sync code, ninth bit in-
dicates start, eighth bit indicates
end.
sync_code1
bl
0x0015
0x015
21
21
[9:0]
Black pixel identification sync
code
5
6
133
134
sync_code2
img
0x0035
0x035
53
53
89
89
RW
RW
[9:0]
[9:0]
Valid pixel identification sync code
sync_code3
crc
0x0059
0x059
CRC value identification sync
code
7
135
sync_code4
tr
0x03A6
0x3A6
934
934
RW
[9:0]
Training value identification sync
code
www.onsemi.com
54
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
0x0000
0x0000
(Dec)
Address
Bit Field
Register Name
blackcal_error0
Description
Type
8
136
0
0
RO
[7:0]
blackcal_error[7:0]
Black Calibration Error. This flag is
set when not enough black sam-
ples are available. Black Cal-
ibration is not valid. Channels 0-7.
9
137
138
139
140
141
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0x0000
0xFFFF
0xFFFF
0
RO
RO
RO
RW
RW
[15:0]
[15:0]
[15:0]
[15:0]
[15:0]
0
Reserved
Reserved
Reserved
Reserved
10
11
12
13
0
0
0
0
0
0
65535
65535 Reserved
Datablock - Test
16
144
test_configuration
testpattern_en
0x0000
0x0
0
RW
[0]
[1]
0
0
Insert synthesized testpattern
when ‘1’
inc_testpattern
0x0
Incrementing testpattern when ‘1’,
constant testpattern when ‘0’
[2]
[3]
prbs_en
0x0
0x0
0
0
Insert PRBS when ‘1’
frame_testpattern
Frame test patterns when ‘1’, un-
framed testpatterns when ‘0’
[4]
reserved
0x0
0
0
Reserved
17
18
145
146
reserved
0x0000
RW
RW
[15:0]
[7:0]
reserved
0
Reserved
test_configuration0
testpattern0_lsb
0x0100
0x00
256
0
Testpattern used on datapath #0
when testpattern_en = ‘1’.
Note: Most significant bits are con-
figured in register 150.
[15:8]
testpattern1_lsb
0x01
1
Testpattern used on datapath #1
when testpattern_en = ‘1’.
Note: Most significant bits are con-
figured in register 150.
19
147
test_configuration1
testpattern2_lsb
0x0302
0x02
770
2
RW
[7:0]
Testpattern used on datapath #2
when testpattern_en = ‘1’.
Note: Most significant bits are con-
figured in register 150.
[15:8]
testpattern3_lsb
0x03
3
Testpattern used on datapath #3
when testpattern_en = ‘1’.
Note: Most significant bits are con-
figured in register 150.
20
148
reserved
reserved
0x0504
0x04
1284
4
RW
[7:0]
Reserved
www.onsemi.com
55
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
reserved
Description
Type
[15:8]
0x05
5
Reserved
21
22
149
150
test_configuration3
reserved
0x0706
0x06
1798
RW
[7:0]
6
7
0
0
Reserved
Reserved
[15:8]
reserved
0x07
test_configuration16
testpattern0_msb
0x0000
0x0
RW
[1:0]
[3:2]
[5:4]
[7:6]
Testpattern used when testpat-
tern_en = ‘1’
testpattern1_msb
testpattern2_msb
testpattern3_msb
0x0
0x0
0x0
0
0
0
Testpattern used when testpat-
tern_en = ‘1’
Testpattern used when testpat-
tern_en = ‘1’
Testpattern used when testpat-
tern_en = ‘1’
[9:8]
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
0x0
0x0
0
0
0
0
0
0
0
0
Reserved
Reserved
Reserved
Reserved
[11:10]
[13:12]
[15:14]
0x0
0x0
26
27
154
155
0x0000
0x0000
0x0000
0x0000
RW
RW
[15:0]
[15:0]
Reserved
Reserved
AEC[Block Offset: 160]
0 160
configuration
enable
0x0010
0x0
16
0
RW
[0]
[1]
[2]
AEC enable
restart_filter
freeze
0x0
0
Restart AEC filter
0x0
0
Freeze AEC filter and enforcer
gains
[3]
[4]
pixel_valid
amp_pri
0x0
0x1
0
1
Use every pixel from channel
when 0, every 4th pixel when 1
Stage 1 amplifier gets higher prior-
ity than stage 2 gain distribution if
1. vice versa if 0
1
161
intensity
0x60B8
0xB8
24760
184
RW
[9:0]
desired_intensity
Target average intensity
[13:10]
clipping_thresh-
old_avg
0x018
24
Clipping threshold for average inc
factor
3.3 unsigned
2
3
162
163
red_scale_factor
red_scale_factor
0x0080
0x80
128
128
RW
RW
[9:0]
[9:0]
Red scale factor for AEC statistics
3.7 unsigned
green1_scale_factor
green1_scale_factor
0x0080
0x80
128
128
Green1 scale factor for AEC stat-
istics
3.7 unsigned
4
164
green2_scale_factor
0x0080
128
RW
www.onsemi.com
56
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
Description
Type
[9:0]
green2_scale_factor
0x80
128
Green2 scale factor for AEC stat-
istics
3.7 unsigned
5
165
blue_scale_factor
blue_scale_factor
0x0080
0x80
128
128
RW
[9:0]
Blue scale factor for AEC statistics
3.7 unsigned
6
7
166
167
exposure
0x03FF
0x03FF
0x0800
0x0
1023
1023
2048
0
RW
RW
[15:0]
fixed_exposure
gain
Fixed/default exposure time
[1:0]
[3:2]
gain_stage1_select
gain_stage2_select
fixed_digital_gain
Fixed default gain stage1
Fixed/default gain stage2
0x0
0
[15:4]
0x080
128
Fixed/default digital gain
5.7 unsigned
8
9
168
169
min_exposure
min_exposure
min_gain
0x0001
0x0001
0x0800
0x0
1
1
RW
RW
[15:0]
Minimum exposure time
2048
0
[1:0]
[3:2]
min_gain_stage1
min_gain_stage2
min_digital_gain
Minimum gain stage 1
Minimum gain stage 2
0x0
0
[15:4]
0x080
128
Minimum digital gain
5.7 unsigned
10
11
170
171
max_exposure
max_exposure
max_gain
0x03FF
0x03FF
0x100D
0x1
1023
1023
4109
1
RW
RW
[15:0]
Maximum exposure time
[1:0]
[3:2]
max_gain_stage1
max_gain_stage2
max_digital_gain
Maximum gain stage 1
Maximum gain stage 2
0x3
3
[15:4]
0x100
256
Maximum digital gain
5.7 unsigned
12
13
172
173
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
0x00083
0x083
0x00
131
131
0
RW
RW
[7:0]
[13:8]
[15:14]
Reserved
Reserved
Reserved
0x0
0
0x2824
0x024
0x028
0x2A96
0x2A96
0x0080
0x080
0x0100
0x100
0x0100
0x100
0x0080
10276
36
[7:0]
Reserved
Reserved
[15:8]
40
14
15
16
17
18
174
175
176
177
178
10902
RW
RW
RW
RW
RW
[15:0]
[9:0]
[9:0]
[9:0]
10902 Reserved
128
128
256
256
256
256
128
Reserved
Reserved
Reserved
www.onsemi.com
57
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
128
170
170
256
256
341
341
0
Address
Bit Field
Register Name
reserved
Description
Type
RW
RW
RW
RO
[9:0]
0x080
Reserved
Reserved
Reserved
Reserved
19
20
21
24
179
180
181
184
reserved
0x00AA
0x0AA
0x0100
0x100
[9:0]
[9:0]
reserved
reserved
reserved
reserved
0x0155
0x155
[9:0]
reserved
total_pixels0
total_pixels[15:0]
0x0000
0x0000
[15:0]
0
Total number of pixels sampled for
Average, LSB
25
26
185
186
total_pixels1
0x0000
0x0
0
0
RO
RO
[2:0]
total_pixels[18:16]
Total number of pixels sampled for
Average, MSB
average_status
average
0x0000
0x000
0x0
0
0
0
0
0
0
0
0
0
[9:0]
[12]
AEC average status
AEC filter lock status
locked
27
28
187
188
exposure_status
exposure
0x0000
0x0000
0x00
RO
RO
[15:0]
AEC exposure status
gain_status
gain_stage1
gain_stage2
digital_gain
[1:0]
[3:2]
0x0
Gain stage 1 status
Gain stage 2 status
0x0
[15:4]
0x000
AEC digital gain status
5.7 unsigned
29
189
reserved
reserved
0x0000
0x000
0
0
RO
RW
[12:0]
Reserved
Sequencer [Block Offset: 192]
192
0
general_configuration
enable
0x00
0x0
0
0
[0]
[1]
Enable sequencer
‘0’ = Idle,
‘1’ = enabled
rolling_shutter_enable
0x0
0
Operation Selection
‘0’ = global shutter,
‘1’ = rolling shutter
[2]
[3]
[4]
reserved
0x0
0x0
0x0
0
0
0
Reserved
Reserved
reserved
triggered_mode
Triggered mode selection (global
shutter only)
‘0’ = Normal Mode,
‘1’ = Triggered Mode
[5]
slave_mode
0x0
0
Master/slave selection (global
shutter only)
‘0’ = master,
‘1’ = slave
www.onsemi.com
58
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
Description
Type
[6]
xsm_delay_enable
0x0
0
Insert delay between end of ROT
and start of readout if ‘1’. ROT de-
lay is defined by register xsm_de-
lay
[7]
[8]
subsampling
binning
0x0
0x0
0x0
0
0
0
Subsampling mode selection
‘0’ = no subsampling,
‘1’ = subsampling
Binning mode selection
‘0’ = no binning,
‘1’ = binning
[10]
roi_aec_enable
Enable windowing for AEC statist-
ics.
‘0’ = Subsample all windows
‘1’ = Subsample configured win-
dow
[13:11]
[14]
monitor_select
reserved
0x0
0x0
0
0
Control of the monitor pins
Reserved
1
2
193
194
delay_configuration
rs_x_length
0x0000
0x00
0
0
RW
RW
[7:0]
X-Readout duration in rolling shut-
ter mode (extends lines with dum-
my pixels).
[15:8]
xsm_delay
0x00
0
Delay between ROT end and
X-readout (only when xsm_de-
lay_enable=‘1’)
integration_control
dual_slope_enable
0x0004
0x0
4
0
[0]
[1]
[2]
Enable dual slope (global shutter
mode only)
triple_slope_enable
fr_mode
0x0
0x1
0
1
Enable triple slope (global shutter
mode only)
Representation of fr_length.
‘0’: reset length
‘1’: frame length
[9:3]
[7:0]
reserved
0x00
0x0001
0x01
0
1
Reserved
3
4
5
195
196
197
roi_active0
roi_active[7:0]
reserved
RW
RW
RW
1
Active ROI selection
Reserved
0x0000
0x0000
0x0102
0x02
0
[15:0]
[7:0]
reserved
0
black_lines
black_lines
258
2
Number of black lines; minimum is
1
Range 1 to 255
[8]
gate_first_line
0x1
1
Blank out first line
‘0’: No blank out
‘1’: Blank out
6
198
dummy_lines
dummy_lines
0x0000
0x000
0
0
RW
[11:0]
Number of dummy lines (Rolling
shutter only)
Range 0 to 2047
www.onsemi.com
59
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
0x0001
0x0001
(Dec)
Address
Bit Field
Register Name
mult_timer
Description
Type
7
199
1
1
RW
[15:0]
mult_timer
Mult timer (global shutter only)
Defines granularity (unit = 1/Sys-
tem Clock) of exposure and re-
set_length
8
200
fr_length
fr_length
0x0000
0x0000
0
0
RW
[15:0]
Frame/reset length (global shutter
only)
Reset length when fr_mode = ‘0’,
Frame length when fr_mode = ‘1’
Granularity defined by mult_timer
9
201
202
203
204
exposure
exposure
0x0000
0x0000
0
0
RW
RW
RW
RW
[15:0]
[15:0]
[15:0]
Exposure time
Rolling shutter: granularity lines
Global shutter: granularity defined
by mult_timer
10
11
12
exposure
0x0000
0x0000
0
0
exposure_ds
Exposure time (dual slope)
Rolling shutter: N/A
Global shutter: granularity defined
by mult_timer
exposure
0x0000
0x0000
0
0
exposure_ts
Exposure time (triple slope)
Rolling shutter: N/A
Global shutter: granularity defined
by mult_timer
gain_configuration
gain_stage1
0x01E2
0x02
0xF
482
2
[1:0]
[8:5]
[13]
Gain stage 1
Gain stage 2
gain_stage2
15
0
gain_lat_comp
0x0
Postpone gain update by 1 frame
when ‘1’ to compensate for expos-
ure time updates latency.
Gain is applied at start of next
frame if ‘0’
13
14
205
206
digital_gain_configura- 0x0080
tion
128
RW
RW
[11:0]
[0]
db_gain
0x080
0x033F
0x1
128
831
1
Digital gain
sync_configuration
sync_rs_x_length
Update of rs_x_length are not syn-
chronized at start of frame when
‘0’
[1]
[2]
[3]
sync_black_lines
sync_dummy_lines
sync_exposure
0x1
0x1
0x1
1
1
1
Update of black_lines are not syn-
chronized at start of frame when
‘0’
Update of dummy_lines are not
synchronized at start of frame
when ‘0’
Update of exposure are not syn-
chronized at start of frame when
‘0’
www.onsemi.com
60
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
sync_gain
Description
Type
[4]
0x1
1
Update of gain settings (gain_sw,
afe_gain) are not synchronized at
start of frame when ‘0’
[5]
sync_roi
0x1
1
ROI updates (active_roi) are not
synchronized at start of frame
when ‘0’
[8]
[9]
blank_roi_switch
0x1
0x1
1
1
Blank first frame after ROI switch-
ing
blank_subsampling_ss
Blank first frame after sub-
sampling/binning mode switching
in global shutter mode (always
blanked out in rolling shutter
mode)
[10]
exposure_sync_mode
0x0
0
When ‘0’, exposure configurations
are synchronized at the start of
FOT. When ‘1’, exposure configur-
ations sync is disabled (continu-
ously syncing). This mode is only
relevant for Triggered global mas-
ter mode, where the exposure
configurations are sync’ed at the
start of exposure rather than the
start of FOT. For all other modes it
should be set to ‘0’.
Note: Sync is still postponed if
sync_exposure=‘0’.
16
17
18
19
20
21
208
209
210
211
212
213
mult_timer_status
mult_timer
0x0000
0x0000
0
0
RO
RO
RO
RO
RO
RO
[15:0]
[15:0]
[15:0]
[15:0]
[15:0]
Mult timer status (master global
shutter only)
reset_length_status
reset_length
0x0000
0x0000
0
0
Current reset length (not in slave
mode)
exposure_status
exposure
0x0000
0x0000
0
0
Current exposure time (not in
slave mode)
exposure_ds_status
exposure_ds
0x0000
0x0000
0
0
Current exposure time (not in
slave mode)
exposure_ts_status
exposure_ts
0x0000
0x0000
0
0
Current exposure time (not in
slave mode)
gain_status
gain_stage1
gain_stage2
digital_gain_status
db_gain
0x0000
0x00
0
[1:0]
[8:5]
0
Current stage 1 gain
Current stage 2 gain
0x00
0
22
214
0x0000
0x000
0x0
0
RO
[11:0]
[12]
0
Current digital gain
Dual slope enabled
Triple slope enabled
dual_slope
triple_slope
reserved
0
0
[13]
0x0
24
25
216
217
0x7F00
0x7F00
0x261E
32512
RW
RW
[14:0]
reserved
32512 Reserved
9758
reserved
www.onsemi.com
61
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
0x261E
0x160B
0x160B
0x3E2E
0x3E2E
0x6368
0x6368
0x0008
0x08
(Dec)
9758
5643
5643
15918
Address
Bit Field
Register Name
reserved
Description
Type
RW
RW
RW
RW
RW
[14:0]
Reserved
Reserved
26
27
28
29
32
218
219
220
221
224
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
reserved
[14:0]
[14:0]
[14:0]
[6:0]
15918 Reserved
25448
25448 Reserved
8
8
15873
1
Reserved
0x3E01
0x1
[3:0]
[7:4]
Reserved
Reserved
Reserved
0x0
0
[13:8]
0x3E
62
33
34
35
36
58
225
226
227
228
250
0x5EF1
0x5EF1
0x6000
0x6000
0x0000
0x0000
0xFFFF
0xFFFF
0x0422
0x02
24305
RW
RW
RW
RW
RW
[15:0]
[15:0]
[15:0]
[15:0]
24305 Reserved
24576
24576 Reserved
0
0
Reserved
65535
65535 Reserved
1058
[4:0]
[9:5]
2
1
Reserved
Reserved
Reserved
0x01
[14:10]
0x01
1
59
60
61
251
252
253
0x30F
0xF
783
15
3
RW
RW
RW
[7:0]
Reserved
Reserved
[15:8]
0x3
0x0601
0x1
1537
1
[7:0]
Reserved
Reserved
[15:8]
0x6
6
roi_aec_configuration0 0x0000
0
[7:0]
x_start
x_end
0x00
0x0
0
AEC ROI X start
Configuration (used for AEC stat-
istics when roi_aec_enable=‘1’)
[15:8]
0
AEC ROI X end
Configuration (used for AEC stat-
istics when roi_aec_enable=‘1’)
62
63
254
255
roi_aec_configuration1 0x0000
y_start 0x000
0
0
RW
RW
[10:0]
AEC ROI Y start
Configuration (used for AEC stat-
istics when roi_aec_enable=‘1’)
roi_aec_configuration2 0x0000
0
www.onsemi.com
62
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
y_end
Description
AEC ROI Y end
Type
[10:0]
0x0
0
Configuration (used for AEC stat-
istics when roi_aec_enable=‘1’)
Sequencer ROI [Block Offset: 256]
0
256
roi0_configuration0
x_start
0xEF00
0x00
61184
0
RW
[7:0]
ROI 0 X start
Configuration
[15:8]
x_end
0xEF
239
ROI 0 X end
Configuration
1
2
3
257
258
259
roi0_configuration1
y_start
0x0000
0x000
0
0
RW
RW
RW
[10:0]
[10:0]
ROI 0 Y start
Configuration
roi0_configuration2
y_end
0x04AF
0x4AF
1199
1199
ROI 0 Y end
Configuration
roi1_configuration0
x_start
0xEF00
0x00
61184
0
[7:0]
ROI 1 X start
Configuration
[15:8]
x_end
0xEF
239
ROI 1 X end
Configuration
4
5
6
260
261
262
roi1_configuration1
y_start
0x0000
0x000
0
0
RW
RW
RW
[10:0]
[10:0]
ROI 1 Y start
Configuration
roi1_configuration2
y_end
0x04AF
0x4AF
1199
1199
ROI 1 Y end
Configuration
roi2_configuration0
x_start
0xEF00
0x00
61184
0
[7:0]
ROI 2 X start
Configuration
[15:8]
x_end
0xEF
239
ROI 2 X end
Configuration
7
8
9
263
264
265
roi2_configuration1
y_start
0x0000
0x000
0
0
RW
RW
RW
[10:0]
[10:0]
ROI 2 Y start
Configuration
roi2_configuration2
y_end
0x04AF
0x4AF
1199
1199
ROI 2 Y end
Configuration
roi3_configuration0
x_start
0xEF00
0x00
61184
0
[7:0]
ROI 3 X start
Configuration
[15:8]
x_end
0xEF
239
0
ROI 3 X end
Configuration
10
266
roi3_configuration1
0x0000
RW
www.onsemi.com
63
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
y_start
Description
ROI 3 Y start
Type
RW
[10:0]
0x000
0
Configuration
11
12
267
268
roi3_configuration2
y_end
0x04AF
0x4AF
1199
1199
[10:0]
ROI 3 Y end
Configuration
roi4_configuration0
x_start
0xEF00
0x00
61184
0
RW
[7:0]
ROI 4 X start
Configuration
[15:8]
x_end
0xEF
239
ROI 4 X end
Configuration
13
14
15
269
270
271
roi4_configuration1
y_start
0x0000
0x000
0
0
RW
RW
RW
[10:0]
[10:0]
ROI 4 Y start
Configuration
roi4_configuration2
y_end
0x04AF
0x4AF
1199
1199
ROI 4 Y end
Configuration
roi5_configuration0
x_start
0xEF00
0x00
61184
0
[7:0]
ROI 5 X start
Configuration
[15:8]
x_end
0xEF
239
ROI 5 X end
Configuration
16
17
18
272
273
274
roi5_configuration1
y_start
0x0000
0x000
0
0
RW
RW
RW
[10:0]
[10:0]
ROI 5 Y start
Configuration
roi5_configuration2
y_end
0x04AF
0x4AF
1199
1199
ROI 5 Y end
Configuration
roi6_configuration0
x_start
0xEF00
0x00
61184
0
[7:0]
ROI 6 X start
Configuration
[15:8]
x_end
0xEF
239
ROI 6 X end
Configuration
19
20
21
275
276
277
roi6_configuration1
y_start
0x0000
0x000
0
0
RW
RW
RW
[10:0]
[10:0]
ROI 6 Y start
Configuration
roi6_configuration2
y_end
0x04AF
0x4AF
1199
1199
ROI 6 Y end
Configuration
roi7_configuration0
x_start
0xEF00
0x00
61184
0
[7:0]
ROI 7 X start
Configuration
[15:8]
x_end
0xEF
239
0
ROI 7 X end
Configuration
22
278
roi7_configuration1
0x0000
RW
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64
NOIV1SN2000A, NOIV2SN2000A
Table 36. REGISTER MAP
Address
Default Default
Offset
(Hex)
(Dec)
Address
Bit Field
Register Name
y_start
Description
ROI 7 Y start
Type
[10:0]
0x000
0
Configuration
23
279
roi7_configuration2
y_end
0x04AF
0x3AF
1199
1199
RW
[10:0]
[15:0]
ROI 7 Y end
Configuration
Reserved [Block Offset: 384]
0
384
reserved
reserved
…
RW
RW
RW
Reserved
…
…
…
…
127
511
reserved
reserved
[15:0]
Reserved
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65
NOIV1SN2000A, NOIV2SN2000A
PACKAGE INFORMATION
Pin List
TIA/EIA-644-A Standard and the CMOS I/Os have a 3.3 V
signal level. Table 37 and Table 38 show the pin list for both
versions.
VITA 2000 has two output versions; V1-SN/SE (LVDS)
and V2-SN/SE (CMOS). The LVDS I/Os comply to the
Table 37. LIST FOR V1SN/SE LVDS INTERFACE
Pack Pin
No.
Pin Name
gnd_33
vdd_33
mosi
I/O Type
Supply
Supply
CMOS
CMOS
CMOS
Supply
Supply
Direction
Description
3.3 V ground
1
2
3.3 V Supply
3
Input
Output
Input
SPI master out - slave in
SPI master in - slave out
SPI clock
4
miso
5
sclk
6
gnd_18
vdd_18
NC
1.8 V ground
7
1.8 V supply
8
Not connected
9
clock_outn
clock_outp
doutn0
LVDS
LVDS
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
LVDS clock output (Negative)
LVDS clock output (Positive)
LVDS data output channel #0 (Negative)
LVDS data output channel #0(Positive)
LVDS data output channel #1 (Negative)
LVDS data output channel #1(Positive)
LVDS data output channel #2 (Negative)
LVDS data output channel #2 (Positive)
LVDS data output channel #3 (Negative)
LVDS data output channel #3 (Positive)
LVDS sync channel output (Negative)
LVDS sync channel output (Positive)
3.3 V supply
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
LVDS
doutp0
LVDS
doutn1
LVDS
doutp1
LVDS
doutn2
LVDS
doutp2
LVDS
doutn3
LVDS
doutp3
LVDS
syncn
LVDS
syncp
LVDS
vdd_33
gnd_33
gnd_18
vdd_18
lvds_clock_inn
lvds_clock_inp
clk_pll
Supply
Supply
Supply
Supply
LVDS
3.3 V ground
1.8 V ground
1.8 V supply
Input
Input
Input
LVDS clock input (Negative)
LVDS clock input (Positive)
Reference clock input for PLL
1.8 V supply
LVDS
CMOS
Supply
Supply
Analog
Supply
Supply
Supply
Supply
Supply
Supply
Supply
vdd_18
gnd_18
ibias_master
vdd_33
gnd_33
vdd_pix_low
vdd_pix
gnd_colpc
vdd_pix
gnd_colpc
1.8 V ground
I/O
Master bias reference. Connect 47 k to gnd_33
3.3 V supply
3.3 V ground
1.8 V supply
Pixel array supply (3.3 V)
Pixel array ground (0 V)
Pixel array supply (3.3 V)
Pixel array ground (0 V)
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66
NOIV1SN2000A, NOIV2SN2000A
Table 37. LIST FOR V1SN/SE LVDS INTERFACE
Pack Pin
No.
Pin Name
gnd_33
I/O Type
Supply
Supply
Supply
Supply
Supply
Supply
Supply
CMOS
CMOS
Supply
CMOS
CMOS
CMOS
CMOS
CMOS
Direction
Description
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
3.3 V ground
vdd_33
3.3 V supply
vdd_pix_low
gnd_colpc
vdd_pix
1.8 V supply
Pixel array ground (0 V)
Pixel array supply (3.3 V)
Pixel array ground (0 V)
Pixel array supply (3.3 V)
Trigger input #0
gnd_colpc
vdd_pix
trigger0
Input
Input
trigger1
Trigger input #1
vdd_pix_low
trigger2
1.8 V supply
Input
Output
Output
Input
Trigger input #2
monitor0
monitor1
reset_n
Monitor output #0
Monitor output #1
Sensor reset (active low)
ss_n
Input
SPI slave select (active low)
Table 38. PIN LIST FOR V2SN/SE CMOS INTERFACE
Pack Pin
No.
Pin Name
gnd_33
vdd_33
mosi
I/O Type
Supply
Supply
CMOS
CMOS
CMOS
Supply
Supply
Direction
Description
1
3.3 V ground
2
3.3 V supply
3
Input
Output
Input
SPI master out - slave in
SPI master in - slave out
SPI clock
4
miso
5
sclk
6
gnd_18
vdd_18
NC
1.8 V ground
7
1.8 V supply
8
Not connected
9
dout9
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
CMOS
Supply
Supply
CMOS
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Output
Data output bit #9
Data output bit #8
Data output bit #7
Data output bit #6
Data output bit #5
Data output bit #4
Data output bit #3
Data output bit #2
Data output bit #1
Data output bit #0
Frame valid output
Line valid output
3.3 V supply
10
11
12
13
14
15
16
17
18
19
20
21
22
23
dout8
dout7
dout6
dout5
dout4
dout3
dout2
dout1
dout0
frame_valid
line_valid
vdd_33
gnd_33
clk_out
3.3 V ground
clock output
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67
NOIV1SN2000A, NOIV2SN2000A
Table 38. PIN LIST FOR V2SN/SE CMOS INTERFACE
Pack Pin
No.
Pin Name
vdd_18
I/O Type
Supply
LVDS
Direction
Description
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
45
46
47
48
49
50
51
52
1.8 V supply
lvds_clock_inn
lvds_clock_inp
clk_pll
Input
Input
Input
LVDS clock input (Negative)
LVDS clock input (Positive)
Reference clock input for PLL
1.8 V supply
LVDS
CMOS
Supply
Supply
Analog
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
Supply
CMOS
CMOS
Supply
CMOS
CMOS
CMOS
CMOS
CMOS
vdd_18
gnd_18
1.8 V ground
ibias_master
vdd_33
I/O
Master bias reference. Connect 47 k to gnd_33
3.3 V supply
gnd_33
3.3 V ground
vdd_pix_low
vdd_pix
1.8 V supply
Pixel array supply (3.3 V)
Pixel array ground (0 V)
Pixel array supply (3.3 V)
Pixel array ground (0 V)
3.3 V ground
gnd_colpc
vdd_pix
gnd_colpc
gnd_33
vdd_33
3.3 V supply
vdd_pix_low
gnd_colpc
vdd_pix
1.8 V supply
Pixel array ground (0 V)
Pixel array supply (3.3 V)
Pixel array ground (0 V)
Pixel array supply (3.3 V)
Trigger input #0
gnd_colpc
vdd_pix
trigger0
Input
Input
trigger1
Trigger input #1
vdd_pix_low
trigger2
1.8 V supply
Input
Output
Output
Input
Trigger input #2
monitor0
monitor1
reset_n
Monitor output #0
Monitor output #1
Sensor reset (active low)
SPI slave select (active low)
ss_n
Input
www.onsemi.com
68
NOIV1SN2000A, NOIV2SN2000A
Package Specification
Table 39. MECHANICAL SPECIFICATION FOR VITA 2000 CERAMIC LCC PACKAGE AND BARE DIE
Parameter
Description
Min
Typ
Max
Units
Die
Die thickness
Die Size
NA
750
NA
mm
(Refer to Figure 43
showing Pin 1 refer-
ence as left center)
2
11 x 9.5
mm
Die center, X offset to the center of package
Die center, Y offset to the center of the package
Die position, tilt to the Die Attach Plane
-50
-50
-1
0
0
0
0
50
50
1
mm
mm
deg
deg
Die rotation accuracy (referenced to die scribe and lead fin-
gers on package on all four sides)
-1
1
Optical center referenced from the die/package center (X-dir)
Optical center referenced from the die/package center (Y-dir)
Distance from PCB plane to top of the die surface
Distance from top of the die surface to top of the glass lid
XY size
4.8
1359.7
1.26
mm
mm
mm
mm
0.94
2
Glass Lid
Specification
(-10%)
0.5
19.05 x 19.05 (+10%)
mm
Thickness
0.55
0.6
1000
92
mm
nm
%
Spectral response range
400
Transmission of glass lid (refer to Figure 44)
JESD22-B104C; Condition G
Mechanical Shock
Vibration
2000
2000
260
G
JESD22-B103B; Condition 1
20
Hz
°C
Mounting Profile
Reflow profile according to J-STD-020D.1
Andon Electronics Corporation (www.andonelectronics.com)
Recommended
Socket
620-52-SM-G10-L14-X
www.onsemi.com
69
NOIV1SN2000A, NOIV2SN2000A
Package Outline Drawing
Figure 42. 52−Pin LCC Package (dimensions in mm)
www.onsemi.com
70
NOIV1SN2000A, NOIV2SN2000A
Optical Center Information
• Active Area outer dimensions
♦ A1 is the at (880, 9006.535) mm
♦ A2 is at (10129, 9006.535) mm
♦ A3 is at (10129, 3212.935) mm
♦ A4 is at (880, 3212.935) mm
• Center of the Active Area
♦ AA is at (5504.8, 6109.735) mm
• Center of the Die
The center of the die (CD) is the center of the cavity
The center of the die (CD) is exactly at 50% between the
outsides of the two outer seal rings
The center of the cavity is exactly at 50% between the
insides of the finger pads.
• Die outer dimensions:
♦ B4 is the reference for the Die (0,0) in mm
♦ B1 is at (0,9500) mm
♦ CD is at (5500, 4750) mm
♦ B2 is at (11000,9500) mm
♦ B3 is at (11000,0) mm
Figure 43. Graphical Representation of the Optical Center
www.onsemi.com
71
NOIV1SN2000A, NOIV2SN2000A
Glass Lid
As shown in Figure 44, no infrared attenuating color filter
glass is used. A filter must be provided in the optical path
The VITA 2000 image sensor uses a glass lid without any
coatings. Figure 44 shows the transmission characteristics
of the glass lid.
when
color
devices
are
used
(source:
http://www.pgo-online.com).
Figure 44. Transmission Characteristics of the Glass Lid
www.onsemi.com
72
NOIV1SN2000A, NOIV2SN2000A
ADDITIONAL REFERENCES AND RESOURCES
Application Notes and other resources can be found
For quality and reliability information, please download
the Quality & Reliability Handbook (HBD851/D) from
www.onsemi.com.
For information on Standard terms and Conditions of
Sale, please download Terms and Conditions document
from www.onsemi.com.
For information on Return Material Authorization
procedures, please refer to the RMA Policy Procedure
document from www.onsemi.com.
The Product Acceptance Criteria document, which lists
criteria to which this device is tested prior to shipment, is
available upon request.
linked to the product web page at www.onsemi.com.
Additional information on this device may also be available
in the Image Sensor Portal, accessible within the MyON
section of www.onsemi.com. A signed NDA is required to
access the Image Sensor Portal – please see your
ON Semiconductor sales representative for more
information.
For information on ESD and cover glass care and
cleanliness, please download the Application Note Image
Sensor Handling and Best Practices (AN52561/D) from
www.onsemi.com.
www.onsemi.com
73
NOIV1SN2000A, NOIV2SN2000A
SILICON ERRATA
VITA 2000 Qualification Status
Production Silicon
This section describes the erratum for the VITA 2000
family.
Details include erratum trigger conditions, scope of
impact, available workaround, and silicon revision
applicability.
VITA 2000 Erratum Summary
This table defines how the erratum applies to the
VITA 2000.
Items
Part Number
VITA 2000 family
Silicon revision
Fix Status
Silicon fix planned
[1]. Higher Standby current than rat-
ed in data sheet
Production Silicon
(same as “ES2”)
Higher Standby Current
• PROBLEM DEFINITION
• WORKAROUND
Maintain the device in ‘power-off’, ‘idle’ or ‘running’
In all states except for ‘idle’ and ‘running’ (including
‘reset’) there can be abnormal high power consumption on
vdd_33, up to 300mW.
modes.
• FIX STATUS
The cause of this problem and its solution have been
identified. Silicon fix is planned to correct the deficiency.
• PARAMETERS AFFECTED
Power
• TRIGGER CONDITION(S)
Entering an affected state (reset, low-power standby,
standby(1), standby(2)).
• COMPLETION DATE
Production silicon with Stand-by current fix is planned.
• SCOPE OF IMPACT
High power consumption, not influencing performance
when grabbing images.
Items
Part Number
Silicon revision
Fix Status
[2]. Rolling shutter mode has first line VITA 2000 family
brighter than the remainder rows in
uniform illumination
Production Silicon
(same as “ES2”)
No silicon fix planned
Rolling Shutter Mode: First row is brighter in uniform
illumination
• SCOPE OF IMPACT
First 1 to 5 rows may show the blooming effect. Refer to
the VITA 2000 Acceptance Criteria Specification for
production test criteria.
• PROBLEM DEFINITION
The first line(s) are brighter than the remainder rows in
uniform illumination due to blooming.
• PARAMETERS AFFECTED
• WORKAROUND
Maximum resolution of actual image is 1900 x 1195.
Image artifact: Brighter row(s)
• FIX STATUS
• TRIGGER CONDITION(S)
The cause of this problem has been identified. No silicon
fix is planned to correct the deficiency.
• COMPLETION DATE
Artifact observed in rolling shutter mode only.
Not applicable.
www.onsemi.com
74
NOIV1SN2000A, NOIV2SN2000A
ACRONYMS
Acronym
ADC
AFE
BL
Description
Acronym
IP
Description
Intellectual Property
Analog-to-Digital Converter
Analog Front End
LE
Line End
Black pixel data
LS
Line Start
CDM
CDS
CMOS
CRC
DAC
DDR
DNL
DS
Charged Device Model
Correlated Double Sampling
Complementary Metal Oxide Semiconductor
Cyclic Redundancy Check
Digital-to-Analog Converter
Double Data Rate
LSB
LVDS
MSB
PGA
PLS
PRBS
PRNU
QE
least significant bit
Low-Voltage Differential Signaling
most significant bit
Programmable Gain Amplifier
Parasitic Light Sensitivity
Pseudo-Random Binary Sequence
Photo Response Non-Uniformity
Quantum Efficiency
Differential Non-Llinearity
Double Sampling
DSNU
EIA
Dark Signal Non-Uniformity
Electronic Industries Alliance
Electrostatic Discharge
Frame End
RGB
RMA
rms
Red-Green-Blue
Return Material Authorization
Root Mean Square
ESD
FE
ROI
ROT
S/H
Region of Interest
FF
Fill Factor
Row Overhead Time
FOT
FPGA
FPN
FPS
FS
Frame Overhead Time
Field Programmable Gate Array
Fixed Pattern Noise
Sample and Hold
SNR
SPI
Signal-to-Noise Ratio
Serial Peripheral Interface
Telecommunications Industry Association
Junction temperature
Training pattern
Frame per Second
TIA
Frame Start
T
J
HBM
IMG
INL
Human Body Model
TR
Image data (regular pixel data)
Integral Non-Linearity
% RH
Percent Relative Humidity
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75
NOIV1SN2000A, NOIV2SN2000A
GLOSSARY
conversion gain
CDS
A constant that converts the number of electrons collected by a pixel into the voltage swing of the pixel.
Conversion gain = q/C where q is the charge of an electron (1.602E 19 Coulomb) and C is the capacitance
of the photodiode or sense node.
Correlated double sampling. This is a method for sampling a pixel where the pixel voltage after reset is
sampled and subtracted from the voltage after exposure to light.
CFA
Color filter array. The materials deposited on top of pixels that selectively transmit color.
Differential non-linearity (for ADCs)
DNL
DSNU
Dark signal non-uniformity. This parameter characterizes the degree of non-uniformity in dark leakage
currents, which can be a major source of fixed pattern noise.
fill-factor
A parameter that characterizes the optically active percentage of a pixel. In theory, it is the ratio of the
actual QE of a pixel divided by the QE of a photodiode of equal area. In practice, it is never measured.
INL
Integral nonlinearity (for ADCs)
IR
Infrared. IR light has wavelengths in the approximate range 750 nm to 1 mm.
2
2
Lux
Photometric unit of luminance (at 550 nm, 1lux = 1 lumen/m = 1/683 W/m )
pixel noise
Variation of pixel signals within a region of interest (ROI). The ROI typically is a rectangular portion of the
pixel array and may be limited to a single color plane.
photometric units
PLS
Units for light measurement that take into account human physiology.
Parasitic light sensitivity. Parasitic discharge of sampled information in pixels that have storage nodes.
PRNU
Photo-response non-uniformity. This parameter characterizes the spread in response of pixels, which is a
source of FPN under illumination.
QE
Quantum efficiency. This parameter characterizes the effectiveness of a pixel in capturing photons and
converting them into electrons. It is photon wavelength and pixel color dependent.
read noise
reset
Noise associated with all circuitry that measures and converts the voltage on a sense node or photodiode
into an output signal.
The process by which a pixel photodiode or sense node is cleared of electrons. ”Soft” reset occurs when
the reset transistor is operated below the threshold. ”Hard” reset occurs when the reset transistor is oper-
ated above threshold.
reset noise
responsivity
Noise due to variation in the reset level of a pixel. In 3T pixel designs, this noise has a component (in units
of volts) proportionality constant depending on how the pixel is reset (such as hard and soft). In 4T pixel
designs, reset noise can be removed with CDS.
The standard measure of photodiode performance (regardless of whether it is in an imager or not). Units
are typically A/W and are dependent on the incident light wavelength. Note that responsivity and sensitivity
are used interchangeably in image sensor characterization literature so it is best to check the units.
ROI
Region of interest. The area within a pixel array chosen to characterize noise, signal, crosstalk, and so on.
The ROI can be the entire array or a small subsection; it can be confined to a single color plane.
sense node
sensitivity
In 4T pixel designs, a capacitor used to convert charge into voltage. In 3T pixel designs it is the photodi-
ode itself.
A measure of pixel performance that characterizes the rise of the photodiode or sense node signal in Volts
2
upon illumination with light. Units are typically V/(W/m )/sec and are dependent on the incident light wave-
length. Sensitivity measurements are often taken with 550 nm incident light. At this wavelength, 1 683 lux
2
is equal to 1 W/m ; the units of sensitivity are quoted in V/lux/sec. Note that responsivity and sensitivity are
used interchangeably in image sensor characterization literature so it is best to check the units.
spectral response
SNR
The photon wavelength dependence of sensitivity or responsivity.
Signal-to-noise ratio. This number characterizes the ratio of the fundamental signal to the noise spectrum
up to half the Nyquist frequency.
temporal noise
Noise that varies from frame to frame. In a video stream, temporal noise is visible as twinkling pixels.
www.onsemi.com
76
NOIV1SN2000A, NOIV2SN2000A
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent
coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein.
ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability
arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages.
Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards,
regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or
specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer
application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not
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◊
NOIV1SN2000A/D
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SI9137LG
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SI9122E
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