NTD20N06L-1 [ONSEMI]

Power MOSFET 20 Amps, 60 Volts, Logic Level; 功率MOSFET 20安培, 60伏特,逻辑电平
NTD20N06L-1
型号: NTD20N06L-1
厂家: ONSEMI    ONSEMI
描述:

Power MOSFET 20 Amps, 60 Volts, Logic Level
功率MOSFET 20安培, 60伏特,逻辑电平

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NTD20N06L  
Power MOSFET  
20 Amps, 60 Volts, Logic Level  
N−Channel DPAK  
Designed for low voltage, high speed switching applications in  
power supplies, converters and power motor controls and bridge  
circuits.  
http://onsemi.com  
Typical Applications  
Power Supplies  
Converters  
Power Motor Controls  
Bridge Circuits  
V
R
TYP  
I MAX  
D
(BR)DSS  
DS(on)  
20 A  
(Note 1)  
60 V  
39 mW@5.0 V  
N−Channel  
MAXIMUM RATINGS (T = 25°C unless otherwise noted)  
J
D
Rating  
Symbol Value Unit  
Drain−to−Source Voltage  
V
60  
60  
Vdc  
Vdc  
Vdc  
DSS  
Drain−to−Gate Voltage (R = 10 M)  
V
DGR  
GS  
G
Gate−to−Source Voltage  
− Continuous  
V
V
"15  
"20  
GS  
GS  
− Non−repetitive (t v10 ms)  
p
S
Drain Current  
− Continuous @ T = 25°C  
I
20  
10  
60  
Adc  
Apk  
A
D
MARKING DIAGRAMS  
− Continuous @ T = 100°C  
I
D
A
4
− Single Pulse (t v10 µs)  
I
DM  
p
4
Drain  
Total Power Dissipation @ T = 25°C  
P
60  
W
W/°C  
W
A
D
Derate above 25°C  
0.40  
1.88  
1.36  
2
1
Total Power Dissipation @ T = 25°C (Note 1.)  
A
3
Total Power Dissipation @ T = 25°C (Note 2.)  
W
A
DPAK  
Operating and Storage Temperature Range  
T , T  
55 to  
+175  
°C  
J
stg  
CASE 369C  
2
Style 2  
1
3
Single Pulse Drain−to−Source Avalanche  
E
AS  
128  
mJ  
Drain  
Gate  
Source  
4
Energy − Starting T = 25°C  
J
4
(V = 25 Vdc, V = 5.0 Vdc,  
DD  
GS  
Drain  
L = 1.0 mH, I (pk) = 16 A, V = 60 Vdc)  
L
DS  
Thermal Resistance  
− Junction−to−Case  
− Junction−to−Ambient (Note 1.)  
− Junction−to−Ambient (Note 2.)  
°C/W  
°C  
R
R
R
2.5  
80  
110  
θ
JC  
JA  
JA  
1
2
3
θ
θ
DPAK  
CASE 369D  
Style 2  
Maximum Lead Temperature for Soldering  
Purposes, 1/8from case for 10 seconds  
T
260  
L
1. When surface mounted to an FR4 board using 1pad size,  
1
2
3
20N06L  
Y
WW  
Device Code  
= Year  
= Work Week  
2
(Cu Area 1.127 in ).  
Gate Drain Source  
2. When surface mounted to an FR4 board using recommended pad size,  
2
(Cu Area 0.412 in ).  
ORDERING INFORMATION  
Device  
Package  
Shipping  
NTD20N06L  
DPAK  
75 Units/Rail  
75 Units/Rail  
DPAK  
Straight Lead  
NTD20N06L−1  
NTD20N06LT4  
DPAK  
2500 Tape & Reel  
Semiconductor Components Industries, LLC, 2003  
1
Publication Order Number:  
August, 2003 − Rev. 1  
NTD20N06L/D  
NTD20N06L  
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise noted)  
J
Characteristic  
Symbol  
Min  
Typ  
Max  
Unit  
OFF CHARACTERISTICS  
Drain−to−Source Breakdown Voltage (Note 3.)  
V
Vdc  
(BR)DSS  
(V = 0 Vdc, I = 250 µAdc)  
Temperature Coefficient (Positive)  
60  
71.3  
71.2  
GS  
D
mV/°C  
µAdc  
Zero Gate Voltage Drain Current  
I
DSS  
(V = 60 Vdc, V = 0 Vdc)  
1.0  
10  
DS  
GS  
(V = 60 Vdc, V = 0 Vdc, T = 150°C)  
DS  
GS  
J
Gate−Body Leakage Current (V = ±15 Vdc, V = 0 Vdc)  
I
±100  
nAdc  
Vdc  
GS  
DS  
GSS  
ON CHARACTERISTICS (Note 3.)  
Gate Threshold Voltage (Note 3.)  
(V = V , I = 250 µAdc)  
V
GS(th)  
1.0  
1.6  
4.6  
2.0  
DS  
GS  
D
Threshold Temperature Coefficient (Negative)  
mV/°C  
mΩ  
Static Drain−to−Source On−Resistance (Note 3.)  
R
V
DS(on)  
(V = 5.0 Vdc, I = 10 Adc)  
39  
48  
GS  
D
Static Drain−to−Source On−Resistance (Note 3.)  
(V = 5.0 Vdc, I = 20 Adc)  
Vdc  
DS(on)  
0.81  
0.72  
1.66  
GS  
D
(V = 5.0 Vdc, I = 10 Adc, T = 150°C)  
GS  
D
J
Forward Transconductance (Note 3.) (V = 4.0 Vdc, I = 10 Adc)  
g
FS  
17.5  
mhos  
pF  
DS  
D
DYNAMIC CHARACTERISTICS  
Input Capacitance  
C
707  
224  
72  
990  
320  
105  
iss  
(V = 25 Vdc, V = 0 Vdc,  
DS  
GS  
Output Capacitance  
C
oss  
f = 1.0 MHz)  
Transfer Capacitance  
C
rss  
SWITCHING CHARACTERISTICS (Note 4.)  
Turn−On Delay Time  
t
9.6  
98  
20  
200  
50  
120  
32  
ns  
d(on)  
(V = 30 Vdc, I = 20 Adc,  
DD  
D
Rise Time  
t
r
V
GS  
= 5.0 Vdc,  
Turn−Off Delay Time  
Fall Time  
t
25  
d(off)  
R
= 9.1 ) (Note 3.)  
G
t
f
62  
Gate Charge  
Q
T
Q
1
Q
2
16.6  
5.5  
8.5  
nC  
(V = 48 Vdc, I = 20 Adc,  
DS  
D
V
GS  
= 5.0 Vdc) (Note 3.)  
SOURCE−DRAIN DIODE CHARACTERISTICS  
Forward On−Voltage  
(I = 20 Adc, V = 0 Vdc) (Note 3.)  
V
SD  
0.97  
0.85  
1.2  
Vdc  
ns  
S
GS  
(I = 20 Adc, V = 0 Vdc, T = 150°C)  
S
GS  
J
Reverse Recovery Time  
t
rr  
42  
30  
(I = 20 Adc, V = 0 Vdc,  
S
GS  
t
a
dI /dt = 100 A/µs) (Note 3.)  
S
t
b
12  
Reverse Recovery Stored Charge  
Q
0.066  
µC  
RR  
3. Pulse Test: Pulse Width 300 µs, Duty Cycle 2%.  
4. Switching characteristics are independent of operating junction temperatures.  
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2
NTD20N06L  
40  
30  
20  
10  
40  
V
= 10 V  
GS  
V
10 V  
DS  
4.5 V  
8 V  
5 V  
30  
6 V  
4 V  
20  
10  
3.5 V  
3 V  
T = 25°C  
J
T = 100°C  
J
T = −55°C  
J
0
0
0
1
2
3
4
5
1.6  
2.4  
3.2  
4
4.8  
5.6  
V
DS  
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)  
V
GS  
, GATE−TO−SOURCE VOLTAGE (VOLTS)  
Figure 1. On−Region Characteristics  
Figure 2. Transfer Characteristics  
0.085  
0.075  
0.065  
0.055  
0.045  
0.035  
0.025  
0.015  
0.085  
0.075  
0.065  
0.055  
V
GS  
= 5 V  
V
GS  
= 10 V  
T = 100°C  
J
T = 100°C  
J
T = 25°C  
J
0.045  
0.035  
0.025  
0.015  
T = 25°C  
J
T = −55°C  
J
T = −55°C  
J
0
10  
20  
30  
40  
0
10  
20  
30  
40  
I , DRAIN CURRENT (AMPS)  
D
I , DRAIN CURRENT (AMPS)  
D
Figure 3. On−Resistance versus  
Gate−to−Source Voltage  
Figure 4. On−Resistance versus Drain Current  
and Gate Voltage  
10000  
1000  
2
1.8  
1.6  
V
GS  
= 0 V  
I
V
= 10 A  
D
= 5 V  
GS  
T = 150°C  
J
1.4  
1.2  
1
100  
10  
T = 100°C  
J
0.8  
0.6  
−50 −25  
0
25  
50  
75 100 125 150 175  
0
10  
20  
30  
40  
50  
60  
T , JUNCTION TEMPERATURE (°C)  
J
V
DS  
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)  
Figure 5. On−Resistance Variation with  
Temperature  
Figure 6. Drain−to−Source Leakage Current  
versus Voltage  
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3
NTD20N06L  
POWER MOSFET SWITCHING  
Switching behavior is most easily modeled and predicted  
by recognizing that the power MOSFET is charge  
controlled. The lengths of various switching intervals (t)  
are determined by how fast the FET input capacitance can  
be charged by current from the generator.  
The published capacitance data is difficult to use for  
calculating rise and fall because drain−gate capacitance  
varies greatly with applied voltage. Accordingly, gate  
charge data is used. In most cases, a satisfactory estimate of  
The capacitance (C ) is read from the capacitance curve at  
a voltage corresponding to the off−state condition when  
iss  
calculating t  
and is read at a voltage corresponding to the  
d(on)  
on−state when calculating t  
.
d(off)  
At high switching speeds, parasitic circuit elements  
complicate the analysis. The inductance of the MOSFET  
source lead, inside the package and in the circuit wiring  
which is common to both the drain and gate current paths,  
produces a voltage at the source which reduces the gate drive  
current. The voltage is determined by Ldi/dt, but since di/dt  
is a function of drain current, the mathematical solution is  
complex. The MOSFET output capacitance also  
complicates the mathematics. And finally, MOSFETs have  
finite internal gate resistance which effectively adds to the  
resistance of the driving source, but the internal resistance  
is difficult to measure and, consequently, is not specified.  
The resistive switching time variation versus gate  
resistance (Figure 9) shows how typical switching  
performance is affected by the parasitic circuit elements. If  
the parasitics were not present, the slope of the curves would  
maintain a value of unity regardless of the switching speed.  
The circuit used to obtain the data is constructed to minimize  
common inductance in the drain and gate circuit loops and  
is believed readily achievable with board mounted  
components. Most power electronic loads are inductive; the  
data in the figure is taken with a resistive load, which  
approximates an optimally snubbed inductive load. Power  
MOSFETs may be safely operated into an inductive load;  
however, snubbing reduces switching losses.  
average input current (I  
) can be made from a  
G(AV)  
rudimentary analysis of the drive circuit so that  
t = Q/I  
G(AV)  
During the rise and fall time interval when switching a  
resistive load, V remains virtually constant at a level  
GS  
known as the plateau voltage, V . Therefore, rise and fall  
SGP  
times may be approximated by the following:  
t = Q x R /(V − V )  
GSP  
r
2
G
GG  
t = Q x R /V  
f
2
G
GSP  
where  
= the gate drive voltage, which varies from zero to V  
V
GG  
GG  
R = the gate drive resistance  
G
and Q and V  
are read from the gate charge curve.  
2
GSP  
During the turn−on and turn−off delay times, gate current is  
not constant. The simplest calculation uses appropriate  
values from the capacitance curves in a standard equation for  
voltage change in an RC network. The equations are:  
t
t
= R C In [V /(V − V )]  
G iss GG GG GSP  
d(on)  
d(off)  
= R C In (V /V )  
GG GSP  
G
iss  
2400  
V
DS  
= 0 V  
V
GS  
= 0 V  
T = 25°C  
J
2000  
1600  
1200  
800  
C
iss  
C
rss  
C
iss  
400  
0
C
oss  
C
rss  
10  
5
0
5
10  
15  
20  
25  
V
GS  
V
DS  
GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)  
Figure 7. Capacitance Variation  
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NTD20N06L  
1000  
6
5
4
3
2
V
I
= 30 V  
= 20 A  
DS  
Q
D
T
V
GS  
= 5 V  
t
V
GS  
100  
10  
Q
Q
2
r
1
t
f
t
d(off)  
t
d(on)  
1
0
I
= 20 A  
D
T = 25°C  
J
1
0
4
8
12  
16  
20  
1
10  
100  
Q , TOTAL GATE CHARGE (nC)  
G
R , GATE RESISTANCE (OHMS)  
G
Figure 8. Gate−To−Source and Drain−To−Source  
Voltage versus Total Charge  
Figure 9. Resistive Switching Time  
Variation versus Gate Resistance  
DRAIN−TO−SOURCE DIODE CHARACTERISTICS  
20  
V
GS  
= 0 V  
T = 25°C  
J
16  
12  
8
4
0
0.6  
0.68  
0.76  
0.84  
0.92  
1
V
SD  
, SOURCE−TO−DRAIN VOLTAGE (VOLTS)  
Figure 10. Diode Forward Voltage versus Current  
SAFE OPERATING AREA  
The Forward Biased Safe Operating Area curves define  
the maximum simultaneous drain−to−source voltage and  
drain current that a transistor can handle safely when it is  
forward biased. Curves are based upon maximum peak  
reliable operation, the stored energy from circuit inductance  
dissipated in the transistor while in avalanche must be less  
than the rated limit and adjusted for operating conditions  
differing from those specified. Although industry practice is  
to rate in terms of energy, avalanche energy capability is not  
a constant. The energy rating decreases non−linearly with an  
increase of peak current in avalanche and peak junction  
temperature.  
junction temperature and a case temperature (T ) of 25°C.  
C
Peak repetitive pulsed power limits are determined by using  
the thermal response data in conjunction with the procedures  
discussed in AN569, “Transient Thermal Resistance −  
General Data and Its Use.”  
Switching between the off−state and the on−state may  
traverse any load line provided neither rated peak current  
Although many E−FETs can withstand the stress of  
drain−to−source avalanche at currents up to rated pulsed  
current (I ), the energy rating is specified at rated  
DM  
(I ) nor rated voltage (V ) is exceeded and the  
continuous current (I ), in accordance with industry custom.  
DM  
DSS  
D
transition time (t ,t ) do not exceed 10 µs. In addition the total  
power averaged over a complete switching cycle must not  
The energy rating must be derated for temperature as shown  
in the accompanying graph (Figure 12). Maximum energy at  
r f  
exceed (T  
− T )/(R ).  
currents below rated continuous I can safely be assumed to  
J(MAX)  
C
θJC  
D
A Power MOSFET designated E−FET can be safely used  
in switching circuits with unclamped inductive loads. For  
equal the values indicated.  
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NTD20N06L  
SAFE OPERATING AREA  
100  
10  
140  
V
= 15 V  
I
D
= 16 A  
GS  
SINGLE PULSE  
120  
100  
80  
10 µs  
T
C
= 25°C  
100 µs  
1 ms  
60  
10 ms  
1
dc  
40  
R
LIMIT  
DS(on)  
THERMAL LIMIT  
PACKAGE LIMIT  
20  
0
0.1  
0.1  
1
10  
100  
25  
50  
75  
100  
125  
150  
175  
V
DS  
, DRAIN−TO−SOURCE VOLTAGE (VOLTS)  
T , STARTING JUNCTION TEMPERATURE (°C)  
J
Figure 11. Maximum Rated Forward Biased  
Safe Operating Area  
Figure 12. Maximum Avalanche Energy versus  
Starting Junction Temperature  
1.0  
D = 0.5  
0.2  
0.1  
0.05  
0.02  
P
(pk)  
0.1  
R
(t) = r(t) R  
θ
JC  
θ
JC  
D CURVES APPLY FOR POWER  
PULSE TRAIN SHOWN  
READ TIME AT t  
0.01  
SINGLE PULSE  
t
1
1
t
2
T
J(pk)  
− T = P  
R
θ
(t)  
JC  
C
(pk)  
DUTY CYCLE, D = t /t  
1
2
0.01  
0.00001  
0.0001  
0.001  
0.01  
t, TIME (s)  
0.1  
1
10  
Figure 13. Thermal Response  
di/dt  
I
S
t
rr  
t
a
t
b
TIME  
0.25 I  
t
p
S
I
S
Figure 14. Diode Reverse Recovery Waveform  
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NTD20N06L  
INFORMATION FOR USING THE DPAK SURFACE MOUNT PACKAGE  
RECOMMENDED FOOTPRINT FOR SURFACE MOUNTED APPLICATIONS  
Surface mount board layout is a critical portion of the  
total design. The footprint for the semiconductor packages  
must be the correct size to ensure proper solder connection  
interface between the board and the package. With the  
correct pad geometry, the packages will self align when  
subjected to a solder reflow process.  
6.20  
3.0  
0.244  
0.118  
2.58  
0.101  
5.80  
1.6  
6.172  
0.243  
0.228  
0.063  
mm  
inches  
ǒ
Ǔ
SCALE 3:1  
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NTD20N06L  
SOLDER STENCIL GUIDELINES  
Prior to placing surface mount components onto a printed  
pattern of the opening in the stencil for the drain pad is not  
critical as long as it allows approximately 50% of the pad to  
be covered with paste.  
circuit board, solder paste must be applied to the pads.  
Solder stencils are used to screen the optimum amount.  
These stencils are typically 0.008 inches thick and may be  
made of brass or stainless steel. For packages such as the  
SC−59, SC−70/SOT−323, SOD−123, SOT−23, SOT−143,  
SOT−223, SO−8, SO−14, SO−16, and SMB/SMC diode  
packages, the stencil opening should be the same as the pad  
size or a 1:1 registration. This is not the case with the DPAK  
SOLDER PASTE  
OPENINGS  
2
and D PAK packages. If one uses a 1:1 opening to screen  
solder onto the drain pad, misalignment and/or  
“tombstoning” may occur due to an excess of solder. For  
these two packages, the opening in the stencil for the paste  
should be approximately 50% of the tab area. The opening  
for the leads is still a 1:1 registration. Figure 15 shows a  
STENCIL  
Figure 15. Typical Stencil for DPAK and  
D2PAK Packages  
2
typical stencil for the DPAK and D PAK packages. The  
SOLDERING PRECAUTIONS  
The melting temperature of solder is higher than the rated  
temperature of the device. When the entire device is heated  
to a high temperature, failure to complete soldering within  
a short time could result in device failure. Therefore, the  
following items should always be observed in order to  
minimize the thermal stress to which the devices are  
subjected.  
Always preheat the device.  
The delta temperature between the preheat and  
soldering should be 100°C or less.*  
When shifting from preheating to soldering, the  
maximum temperature gradient shall be 5°C or less.  
After soldering has been completed, the device should  
be allowed to cool naturally for at least three minutes.  
Gradual cooling should be used as the use of forced  
cooling will increase the temperature gradient and  
result in latent failure due to mechanical stress.  
Mechanical stress or shock should not be applied  
during cooling.  
When preheating and soldering, the temperature of the  
leads and the case must not exceed the maximum  
temperature ratings as shown on the data sheet. When  
using infrared heating with the reflow soldering  
method, the difference shall be a maximum of 10°C.  
The soldering temperature and time shall not exceed  
260°C for more than 10 seconds.  
* Soldering a device without preheating can cause  
excessive thermal shock and stress which can result in  
damage to the device.  
* Due to shadowing and the inability to set the wave height  
2
to incorporate other surface mount components, the D PAK  
is not recommended for wave soldering.  
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NTD20N06L  
TYPICAL SOLDER HEATING PROFILE  
For any given circuit board, there will be a group of  
The line on the graph shows the actual temperature that  
might be experienced on the surface of a test board at or  
near a central solder joint. The two profiles are based on a  
high density and a low density board. The Vitronics  
SMD310 convection/infrared reflow soldering system was  
used to generate this profile. The type of solder used was  
62/36/2 Tin Lead Silver with a melting point between  
177189°C. When this type of furnace is used for solder  
reflow work, the circuit boards and solder joints tend to  
heat first. The components on the board are then heated by  
conduction. The circuit board, because it has a large surface  
area, absorbs the thermal energy more efficiently, then  
distributes this energy to the components. Because of this  
effect, the main body of a component may be up to 30  
degrees cooler than the adjacent solder joint.  
control settings that will give the desired heat pattern. The  
operator must set temperatures for several heating zones,  
and a figure for belt speed. Taken together, these control  
settings make up a heating “profile” for that particular  
circuit board. On machines controlled by a computer, the  
computer remembers these profiles from one operating  
session to the next. Figure 16 shows a typical heating  
profile for use when soldering a surface mount device to a  
printed circuit board. This profile will vary among  
soldering systems but it is a good starting point. Factors that  
can affect the profile include the type of soldering system in  
use, density and types of components on the board, type of  
solder used, and the type of board or substrate material  
being used. This profile shows temperature versus time.  
STEP 1  
PREHEAT  
ZONE 1  
“RAMP”  
STEP 2  
VENT  
“SOAK” ZONES 2 & 5  
“RAMP”  
STEP 3  
HEATING  
STEP 4  
HEATING  
ZONES 3 & 6  
“SOAK”  
STEP 5  
HEATING  
ZONES 4 & 7  
“SPIKE”  
STEP 6  
VENT  
STEP 7  
COOLING  
205° TO 219°C  
PEAK AT  
SOLDER  
JOINT  
170°C  
DESIRED CURVE FOR HIGH  
MASS ASSEMBLIES  
200°C  
150°C  
100°C  
5°C  
160°C  
150°C  
SOLDER IS LIQUID FOR  
40 TO 80 SECONDS  
(DEPENDING ON  
100°C  
140°C  
MASS OF ASSEMBLY)  
DESIRED CURVE FOR LOW  
MASS ASSEMBLIES  
TIME (3 TO 7 MINUTES TOTAL)  
T
MAX  
Figure 16. Typical Solder Heating Profile  
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NTD20N06L  
PACKAGE DIMENSIONS  
DPAK  
CASE 369C−01  
ISSUE O  
SEATING  
PLANE  
−T−  
C
B
R
INCHES  
DIM MIN MAX  
MILLIMETERS  
E
V
MIN  
5.97  
6.35  
2.19  
0.69  
0.46  
0.94  
MAX  
6.22  
6.73  
2.38  
0.88  
0.58  
1.14  
A
B
C
D
E
F
G
H
J
0.235 0.245  
0.250 0.265  
0.086 0.094  
0.027 0.035  
0.018 0.023  
0.037 0.045  
0.180 BSC  
0.034 0.040  
0.018 0.023  
0.102 0.114  
0.090 BSC  
4
2
Z
A
K
S
1
3
4.58 BSC  
U
0.87  
0.46  
2.60  
1.01  
0.58  
2.89  
K
L
2.29 BSC  
F
J
R
S
U
V
Z
0.180 0.215  
0.025 0.040  
4.57  
0.63  
0.51  
0.89  
3.93  
5.45  
1.01  
−−−  
1.27  
−−−  
L
H
0.020  
0.035 0.050  
0.155 −−−  
−−−  
D 2 PL  
M
STYLE 2:  
PIN 1. GATE  
2. DRAIN  
G
0.13 (0.005)  
T
3. SOURCE  
4. DRAIN  
DPAK  
CASE 369D−01  
ISSUE O  
C
B
R
NOTES:  
1. DIMENSIONING AND TOLERANCING PER  
ANSI Y14.5M, 1982.  
2. CONTROLLING DIMENSION: INCH.  
V
E
INCHES  
DIM MIN MAX  
MILLIMETERS  
4
2
MIN  
5.97  
6.35  
2.19  
0.69  
0.46  
0.94  
MAX  
6.35  
6.73  
2.38  
0.88  
0.58  
1.14  
Z
A
B
C
D
E
F
G
H
J
K
R
S
V
Z
0.235 0.245  
0.250 0.265  
0.086 0.094  
0.027 0.035  
0.018 0.023  
0.037 0.045  
0.090 BSC  
0.034 0.040  
0.018 0.023  
0.350 0.380  
0.180 0.215  
0.025 0.040  
0.035 0.050  
A
K
S
1
3
−T−  
SEATING  
PLANE  
2.29 BSC  
0.87  
0.46  
8.89  
4.45  
0.63  
0.89  
3.93  
1.01  
0.58  
9.65  
5.45  
1.01  
1.27  
−−−  
J
F
H
0.155  
−−−  
D 3 PL  
STYLE 2:  
G
M
PIN 1. GATE  
0.13 (0.005)  
T
2. DRAIN  
3. SOURCE  
4. DRAIN  
http://onsemi.com  
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NTD20N06L  
Notes  
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NTD20N06L  
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