NTMYS021N06CLTWG [ONSEMI]
功率 MOSFET,60V,26 A,21Ω,单 N 沟道;型号: | NTMYS021N06CLTWG |
厂家: | ONSEMI |
描述: | 功率 MOSFET,60V,26 A,21Ω,单 N 沟道 |
文件: | 总7页 (文件大小:320K) |
中文: | 中文翻译 | 下载: | 下载PDF数据表文档文件 |
NTMYS021N06CL
Power MOSFET
60 V, 21 mW, 27 A, Single N−Channel
Features
• Small Footprint (5x6 mm) for Compact Design
• Low R
to Minimize Conduction Losses
• Low Q and Capacitance to Minimize Driver Losses
DS(on)
www.onsemi.com
G
• LFPAK4 Package, Industry Standard
• These Devices are Pb−Free and are RoHS Compliant
V
R
MAX
I MAX
D
(BR)DSS
DS(ON)
21 mW @ 10 V
60 V
MAXIMUM RATINGS (T = 25°C unless otherwise noted)
27 A
J
31.5 mW @ 4.5 V
Parameter
Drain−to−Source Voltage
Symbol
Value
60
Unit
V
V
DSS
D (5)
Gate−to−Source Voltage
V
GS
20
V
Continuous Drain
Current R
Steady
State
T
= 25°C
= 100°C
= 25°C
I
27
A
C
D
q
JC
T
C
15
(Notes 1, 2, 3)
Power Dissipation
T
C
P
28
W
A
G (4)
D
R
(Notes 1, 2)
q
JC
T
C
= 100°C
9.0
9.8
6.9
3.8
1.9
131
S (1,2,3)
N−CHANNEL MOSFET
Continuous Drain
Current R
Steady
State
T = 25°C
A
I
D
q
JA
T = 100°C
A
(Notes 1, 2, 3)
Power Dissipation
T = 25°C
A
P
W
D
R
(Notes 1 & 2)
MARKING
DIAGRAM
q
JA
T = 100°C
A
Pulsed Drain Current
T = 25°C, t = 10 ms
A
I
DM
A
p
D
Operating Junction and Storage Temperature
T , T
−55 to
°C
J
stg
+ 175
021N06
CL
AWLYW
Source Current (Body Diode)
I
S
23.5
43
A
LFPAK4
CASE 760AB
Single Pulse Drain−to−Source Avalanche
E
AS
mJ
Energy (I
= 1.1 A)
L(pk)
1
S
S
S
G
Lead Temperature for Soldering Purposes
(1/8″ from case for 10 s)
T
L
260
°C
021N06CL = Specific Device Code
A
WL
Y
= Assembly Location
= Wafer Lot
= Year
Stresses exceeding those listed in the Maximum Ratings table may damage the
device. If any of these limits are exceeded, device functionality should not be
assumed, damage may occur and reliability may be affected.
W
= Work Week
THERMAL RESISTANCE MAXIMUM RATINGS
Parameter
Symbol
Value
5.3
Unit
ORDERING INFORMATION
See detailed ordering, marking and shipping information on
page 5 of this data sheet.
Junction−to−Case − Steady State
Junction−to−Ambient − Steady State (Note 2)
R
°C/W
q
JC
R
39
q
JA
1. The entire application environment impacts the thermal resistance values shown,
they are not constants and are only valid for the particular conditions noted.
2
2. Surface−mounted on FR4 board using a 650 mm , 2 oz. Cu pad.
3. Maximum current for pulses as long as 1 second is higher but is dependent
on pulse duration and duty cycle.
© Semiconductor Components Industries, LLC, 2018
1
Publication Order Number:
April, 2019 − Rev. 0
NTMYS021N06CL/D
NTMYS021N06CL
ELECTRICAL CHARACTERISTICS (T = 25°C unless otherwise specified)
J
Parameter
Symbol
Test Condition
Min
Typ
Max
Unit
OFF CHARACTERISTICS
Drain−to−Source Breakdown Voltage
V
V
GS
= 0 V, I = 250 mA
60
V
(BR)DSS
D
Drain−to−Source Breakdown Voltage
Temperature Coefficient
V
/
28
(BR)DSS
mV/°C
T
J
Zero Gate Voltage Drain Current
I
V
= 0 V,
T = 25 °C
10
DSS
GS
DS
J
V
= 60 V
mA
T = 125°C
J
250
100
Gate−to−Source Leakage Current
ON CHARACTERISTICS (Note 4)
Gate Threshold Voltage
I
V
= 0 V, V = 20 V
nA
GSS
DS
GS
V
V
= V , I = 16 mA
1.2
2.0
V
GS(TH)
GS
DS
D
Threshold Temperature Coefficient
Drain−to−Source On Resistance
V
/T
−5.0
18
mV/°C
GS(TH)
J
R
V
= 10 V
I
I
= 10 A
= 10 A
21
DS(on)
GS
D
mW
V
GS
= 4.5 V
26
31.5
D
Forward Transconductance
CHARGES AND CAPACITANCES
Input Capacitance
g
V
=15 V, I = 10 A
37
S
FS
DS
D
C
410
210
7.0
2.5
5.0
0.6
1.0
0.5
2.7
ISS
Output Capacitance
C
OSS
C
RSS
V
= 0 V, f = 1 MHz, V = 25 V
pF
GS
DS
Reverse Transfer Capacitance
Total Gate Charge
Q
V
GS
= 4.5 V, V = 48 V; I = 10 A
nC
nC
G(TOT)
G(TOT)
DS
D
Total Gate Charge
Q
V
GS
= 10 V, V = 48 V; I = 10 A
DS D
Threshold Gate Charge
Gate−to−Source Charge
Gate−to−Drain Charge
Plateau Voltage
Q
G(TH)
Q
nC
V
GS
GD
GP
V
GS
= 10 V, V = 48 V; I = 10 A
DS
D
Q
V
SWITCHING CHARACTERISTICS (Note 5)
Turn−On Delay Time
t
4.0
12
d(ON)
Rise Time
t
r
V
= 10 V, V = 48 V,
DS
GS
D
ns
V
I
= 10 A, R = 2.5 W
G
Turn−Off Delay Time
t
12
d(OFF)
Fall Time
t
1.5
f
DRAIN−SOURCE DIODE CHARACTERISTICS
Forward Diode Voltage
V
SD
T = 25°C
0.9
0.8
18
1.2
J
V
S
= 0 V,
GS
I
= 10 A
T = 125°C
J
Reverse Recovery Time
Charge Time
t
RR
t
a
9.0
9.0
7.0
ns
V
= 0 V, dI /dt = 100 A/ms,
S
GS
I
S
= 10 A
Discharge Time
t
b
Reverse Recovery Charge
Q
nC
RR
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product
performance may not be indicated by the Electrical Characteristics if operated under different conditions.
4. Pulse Test: pulse width v 300 ms, duty cycle v 2%.
5. Switching characteristics are independent of operating junction temperatures.
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2
NTMYS021N06CL
TYPICAL CHARACTERISTICS
25
20
15
10
25
10 V to
4.5 V
3.4 V
V
DS
= 3 V
3.2 V
3.0 V
20
15
10
2.8 V
2.6 V
T = 25°C
J
5
0
5
0
2.4 V
V
= 2.2 V
GS
T = −55°C
J
T = 125°C
J
0
0.5
1.0
1.5
2.0
2.5
0
0.5
1.0
1.5
2.0
2.5
3.0
3.5 4.0
V
DS
, DRAIN−TO−SOURCE VOLTAGE (V)
V
GS
, GATE−TO−SOURCE VOLTAGE (V)
Figure 1. On−Region Characteristics
Figure 2. Transfer Characteristics
50
50
45
40
T = 25°C
J
T = 25°C
D
J
45
30
25
I
= 10 A
35
30
25
20
V
= 4.5 V
= 10 V
GS
V
GS
20
15
15
10
3
4
5
6
7
8
9
10
10
15
20
25
30
35
40
45
50
V
GS
, GATE−TO−SOURCE VOLTAGE (V)
I , DRAIN CURRENT (A)
D
Figure 3. On−Resistance vs. Gate−to−Source
Figure 4. On−Resistance vs. Drain Current and
Voltage
Gate Voltage
2.5
2.0
1.5
100,000
10,000
1000
T = 175°C
V
= 10 V
= 10 A
J
GS
I
D
T = 150°C
J
T = 125°C
J
T = 85°C
J
100
1.0
0.5
10
1
−50 −25
0
25
50
75 100 125 150 175
10
20
30
40
50
60
T , JUNCTION TEMPERATURE (°C)
J
V
, DRAIN−TO−SOURCE VOLTAGE (V)
DS
Figure 5. On−Resistance Variation with
Figure 6. Drain−to−Source Leakage Current
Temperature
vs. Voltage
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3
NTMYS021N06CL
TYPICAL CHARACTERISTICS
1000
100
10
Q
T
C
ISS
9
8
7
C
OSS
6
5
4
3
Q
Q
GD
GS
10
1
C
V
DS
= 48 V
RSS
V
= 0 V
2
GS
T = 25°C
J
T = 25°C
J
1
0
I
D
= 10 A
f = 1 MHz
0
10
20
30
40
50
60
0
1
2
3
4
5
V
DS
, DRAIN−TO−SOURCE VOLTAGE (V)
Q , TOTAL GATE CHARGE (nC)
G
Figure 7. Capacitance Variation
Figure 8. Gate−to−Source vs. Total Charge
100
10
10
V
GS
= 0 V
t
t
t
t
f
d(off)
r
d(on)
1
0.1
10
1
V
V
I
= 10 V
= 48 V
= 10 A
GS
DS
T = 125°C
T = 25°C
T = −55°C
D
J
J
J
0.1
1
10
R , GATE RESISTANCE (W)
100
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
V
SD
, SOURCE−TO−DRAIN VOLTAGE (V)
G
Figure 9. Resistive Switching Time Variation
vs. Gate Resistance
Figure 10. Diode Forward Voltage vs. Current
1000
100
10
T
= 25°C
C
Single Pulse
≤ 10 V
V
GS
1 ms
T
= 25°C
J(initial)
500 ms
10 ms
T
= 100°C
1
J(initial)
1
R
Limit
DS(on)
Thermal Limit
Package Limit
dc
0.1
0.1
0.1
1
10
100
1E−05
1E−04
T , TIME IN AVALANCHE (s)
AV
1E−03
1E−02
V
DS
, DRAIN−TO−SOURCE VOLTAGE (V)
Figure 11. Maximum Rated Forward Biased
Safe Operating Area
Figure 12. Maximum Drain Current vs. Time in
Avalanche
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4
NTMYS021N06CL
TYPICAL CHARACTERISTICS
100
10
1
50% Duty Cycle
20%
10%
5%
2%
1%
0.1
Single Pulse
0.01
0.0000001 0.000001
0.00001
0.0001
0.001
0.01
0.1
1
10
100
1000
PULSE TIME (sec)
Figure 13. Thermal Characteristics
DEVICE ORDERING INFORMATION
Device
†
Marking
Package
Shipping
NTMYS021N06CLTWG
021N06CL
LFPAK4
(Pb−Free)
3000 / Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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5
MECHANICAL CASE OUTLINE
PACKAGE DIMENSIONS
LFPAK4 5x6
CASE 760AB
ISSUE C
DATE 19 NOV 2019
GENERIC
MARKING DIAGRAM*
XXXXXX = Specific Device Code
A
WL
Y
= Assembly Location
= Wafer Lot
= Year
XXXXXX
XXXXXX
AWLYW
W
= Work Week
*This information is generic. Please refer
to device data sheet for actual part
marking. Some products may not follow
the Generic Marking.
Electronic versions are uncontrolled except when accessed directly from the Document Repository.
Printed versions are uncontrolled except when stamped “CONTROLLED COPY” in red.
DOCUMENT NUMBER:
DESCRIPTION:
98AON82777G
LFPAK4 5x6
PAGE 1 OF 1
ON Semiconductor and
are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries.
ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding
the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically
disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the
rights of others.
© Semiconductor Components Industries, LLC, 2018
www.onsemi.com
onsemi,
, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.
A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. onsemi reserves the right to make changes at any time to any
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information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does onsemi assume any liability arising out of the application or use
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