NVCR4LS004N10MCA [ONSEMI]

Power MOSFET, N-Channel, 100 V, 4.0 mΩ, Bare Die;
NVCR4LS004N10MCA
型号: NVCR4LS004N10MCA
厂家: ONSEMI    ONSEMI
描述:

Power MOSFET, N-Channel, 100 V, 4.0 mΩ, Bare Die

文件: 总6页 (文件大小:237K)
中文:  中文翻译
下载:  下载PDF数据表文档文件
DATA SHEET  
www.onsemi.com  
MOSFET – Power, N-Channel  
100 V, 4.0 mW  
NVCR4LS004N10MCA  
Features  
Typical R  
Typical Q  
= 3.2 mat V = 10 V  
GS  
DS(on)  
= 47 nC at V = 10 V  
g(tot)  
GS  
AECQ101 Qualified  
RoHS Compliant  
ORDERING INFORMATION  
DIMENSION (mm)  
Die Size  
Device  
Package  
4953 × 2413  
NVCR4LS004N10MCA  
Wafer  
Sawn on Foil  
Die Size (Sawn)  
4933 15 × 2393 15  
1114.8 × 1648.9,  
(1114.8 × 2205.8) × 3  
Source Attach Area  
RECOMMENDED STORAGE CONDITIONS  
Gate Attach Area  
Die Thickness  
385 × 535  
Temperature  
RH  
22 to 28°C  
40 to 66%  
101.6 19.1  
Gate and Source: AlSiCu  
Drain: TiNiVAg (back side of die)  
Passivation: Polyimide  
Wafer Diameter: 8 inch  
Wafer Sawn on UV Tape  
Bad Dice Identified in Inking  
Gross Die Counts: 2113  
The Chip is 100% Probed to Meet the Conditions and Limits  
Specified at T = 25°C.  
J
Symbol  
BV  
Parameter  
Condition  
I = 250 A, V = 0 V  
D
Min  
100  
Typ  
Max  
Unit  
V
Drain to Source Breakdown Voltage  
Drain to Source Leakage Current  
Gate to Source Leakage Current  
Gate to Source Threshold Voltage  
Bare Die Drain to Source On Resistance  
Source to Drain Diode Voltage  
DSS  
GS  
I
V
DS  
V
GS  
V
GS  
= 100 V, V = 0 V  
1
A  
nA  
V
DSS  
GS  
I
=
20 V, V = 0 V  
100  
4.0  
4.0  
1.2  
GSS  
DS  
V
GS(th)  
= V , I = 250 A  
2.0  
DS  
D
*R  
I
D
= 5 A, V = 10 V  
3.2  
mꢀ  
DS(on)  
GS  
V
E
I
= 5 A, V = 0 V  
V
SD  
SD  
GS  
Single Pulse DraintoSource  
Avalanche Energy  
L = 30 H, I = 79 A  
93.6  
mJ  
AS  
AS  
*Accurate R  
test at die level is not feasible for this thin die as limited by the test contact precision attainable in a die form. The max R  
DS(on)  
DS(on)  
DS(on)  
specification is defined from the historical performance of the die in package but is not guaranteed by test in production. The die R  
performance depends on the Source wire/ribbon bonding layout.  
© Semiconductor Components Industries, LLC, 2022  
1
Publication Order Number:  
NVCR4LS004N10MCADIE/D  
June, 2022 Rev. 0  
NVCR4LS004N10MCA  
MOSFET MAXIMUM RATINGS in Reference to the FDBL86066F085 electrical data in TOLL  
(T = 25°C unless otherwise noted)  
J
Symbol  
Parameter  
Ratings  
100  
Unit  
V
DSS  
Drain to Source Voltage  
Gate to Source Voltage  
Continuous Drain Current R  
V
V
A
V
GS  
20  
I
D
(V = 10) (Note 1)  
GS  
J
C
T
C
T
C
= 25°C  
184  
130  
= 100°C  
E
Single Pulse Avalanche Energy (Note 2)  
Power Dissipation R  
93.6  
mJ  
W
AS  
P
300  
D
JC  
Derate Above 25°C  
2
55 to +175  
0.5  
W/°C  
°C  
T , T  
Operating and Storage Temperature  
Thermal Resistance, Junction to Case  
Maximum Thermal Resistance, Junction to Ambient (Note 3)  
J
STG  
R
°C/W  
°C/W  
JC  
JA  
R
43  
Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality  
should not be assumed, damage may occur and reliability may be affected.  
1. Current is limited by silicon.  
2. Starting T = 25°C, L = 30 H, I = 79 A, V = 100 V during inductor charging and V = 0 V during time in avalanche.  
J
AS  
DD  
DD  
3. R  
is the sum of the junctiontocase and casetoambient thermal resistance, where the case thermal reference is defined as the solder  
JA  
mounting surface of the drain pins. R  
presented here is based on mounting on a 1 in pad of 2oz copper.  
is guaranteed by design, while R  
is determined by the board design. The maximum rating  
JC  
JA  
2
ELECTRICAL CHARACTERISTICS in Reference to the FDBL86066F085 electrical data in TOLL  
(T = 25°C unless otherwise noted)  
J
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
OFF CHARACTERISTICS  
BV  
Drain to Source Breakdown Voltage  
Drain to Source Leakage Current  
I
= 250 A, V = 0 V  
100  
V
DSS  
D
GS  
I
V
V
= 100 V,  
= 0 V  
T = 25°C  
J
1
A
DSS  
DS  
GS  
I
Gate to Source Leakage Current  
V
GS  
=
20 V  
100  
nA  
GSS  
ON CHARACTERISTICS  
V
R
Gate to Source Threshold Voltage  
Drain to Source on Resistance  
V
I
= V , I = 250 A  
2.0  
4.0  
4.1  
8.8  
V
GS(th)  
GS  
DS  
D
= 80 A,  
= 10 V  
T = 25°C  
J
3.3  
7.3  
mꢀ  
DS(on)  
D
V
GS  
T = 175°C (Note 4)  
m
J
DYNAMIC CHARACTERISTICS  
V
= 50 V, V = 0 V, f = 1 MHz  
C
Input Capacitance  
3240  
1950  
26  
pF  
DS  
GS  
iss  
C
Output Capacitance  
pF  
pF  
oss  
C
Reverse Transfer Capacitance  
Gate Resistance  
rss  
R
f = 1 MHz  
0.5  
47  
g
Q
Total Gate Charge  
V
GS  
V
GS  
V
DD  
= 0 to 10 V, V = 50 V, I = 80 A  
nC  
nC  
nC  
nC  
g(ToT)  
DD  
D
Q
Threshold Gate Charge  
Gate to Source Gate Charge  
Gate to Drain “Miller” Charge  
= 0 to 2 V, V = 50 V, I = 80 A  
6
g(th)  
DD  
D
= 50 V, I = 80 A  
Q
15  
D
gs  
Q
10  
gd  
SWITCHING CHARACTERISTICS  
V
DD  
V
GS  
= 50 V, I = 80 A,  
t
TurnOn Delay  
Rise Time  
18  
9
ns  
ns  
ns  
ns  
D
d(on)  
= 10 V, R  
= 6 ꢀ  
GEN  
t
r
t
TurnOff Delay  
Fall Time  
36  
13  
d(off)  
t
f
DRAINSOURCE DIODE CHARACTERISTIC  
V
Source to Drain Diode Voltage  
I
= 80 A, V = 0 V  
1.25  
1.2  
V
V
SD  
SD  
GS  
I
= 40 A, V = 0 V  
GS  
SD  
I = 80 A, dI /dt = 1000 A/s  
F
t
Reverse Recovery Time  
32  
243  
ns  
nC  
SD  
rr  
Q
Reverse Recovery Charge  
rr  
Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product  
performance may not be indicated by the Electrical Characteristics if operated under different conditions.  
4. The maximum value is specified by design at T = 175°C. Product is not tested to this condition in production.  
J
www.onsemi.com  
2
 
NVCR4LS004N10MCA  
TYPICAL CHARACTERISTICS  
1.2  
1.0  
0.8  
0.6  
0.4  
0.2  
0.0  
200  
160  
120  
80  
CURRENT LIMITED  
BY SILICON  
VGS = 10 V  
40  
0
0
25  
50  
75  
100  
125 150  
175  
25  
50  
75  
100  
125  
150  
175  
TC, CASE TEMPERATURE(oC)  
TC, CASE TEMPERATURE(oC)  
Figure 1. Normalized Power Dissipation vs. Case  
Temperature  
Figure 2. Maximum Continuous Drain Current vs.  
Case Temperature  
2
DUTY CYCLE DESCENDING ORDER  
1
D = 0.50  
0.20  
P
DM  
0.10  
0.05  
0.02  
0.01  
t
1
0.1  
t
2
NOTES:  
DUTY FACTOR: D = t /t  
1
2
SINGLE PULSE  
PEAK T = P x Z  
x R  
+ T  
J
DM  
J
C
JC C  
0.01  
100  
101  
105  
104  
103  
102  
101  
t, RECTANGULAR PULSE DURATION(s)  
Figure 3. Normalized Maximum Transient Thermal Impedance  
1000  
100  
10  
VGS = 10 V  
o
T
= 25  
C
C
FOR TEMPERATURES  
o
ABOVE 25 C DERATE PEAK  
CURRENT AS FOLLOWS:  
175 T  
C
I = I  
25  
150  
SINGLE PULSE  
105  
104  
103  
102  
101  
100  
101  
t, RECTANGULAR PULSE DURATION(s)  
Figure 4. Peak Current Capability  
www.onsemi.com  
3
NVCR4LS004N10MCA  
TYPICAL CHARACTERISTICS (continued)  
1000  
100  
10  
1000  
If R = 0  
tAV = (L)(I AS )/(1.3*RATED BV DSS VDD  
)
0
If R  
0
tAV = (L/R)ln[(I AS *R)/(1.3*RATED BV DSS VDD) +1]  
100  
100us  
STARTING T = 25oC  
J
OPERATION IN THIS  
AREA MAY BE  
LIMITED BY r  
DS(on)  
10  
1
SINGLE PULSE  
1ms  
STARTING TJ = 150oC  
T
J
= MAX RATED  
10ms  
100ms  
o
T
C
= 25  
C
0.1  
1
1
10  
100  
300  
0.0001 0.001 0.01 0.1  
1
10  
100 1000  
tAV, TIME IN AVALANCHE (ms)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 5. Forward Bias Safe Operating Area  
Figure 6. Unclamped Inductive Switching Capability  
240  
300  
PULSE DURATION = 250 s  
DUTY CYCLE = 0.5% MAX  
VGS = 0 V  
100  
200  
V
DD  
= 10 V  
10  
1
TJ = 175 o  
C
160  
120  
80  
40  
0
TJ = 25 o  
C
T
J = 175oC  
0.1  
T
J = 25oC  
0.01  
0.001  
TJ = 55oC  
TJ = 55oC  
1
2
3
4
5
6
7
0.0  
0.2  
0.4  
0.6  
0.8  
1.0  
1.2  
VSD, BODY DIODE FORWARD VOLTAGE (V)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 7. Transfer Characteristics  
Figure 8. Forward Diode Characteristics  
300  
200  
100  
0
300  
VGS  
15V Top  
10V  
8V  
7V  
6V  
5.5V  
5V Bottom  
250 s PULSE WIDTH  
Tj=25oC  
VGS  
15V Top  
10V  
8V  
7V  
6V  
5.5V  
5V Bottom  
240  
180  
120  
60  
250 s PULSE WIDTH  
Tj=175oC  
0
0
1
2
3
4
5
0
1
2
3
4
5
VDS, DRAIN TO SOURCE VOLTAGE (V)  
VDS, DRAIN TO SOURCE VOLTAGE (V)  
Figure 9. Saturation Characteristics  
Figure 10. Saturation Characteristics  
www.onsemi.com  
4
NVCR4LS004N10MCA  
TYPICAL CHARACTERISTICS (continued)  
30  
25  
20  
15  
10  
5
2.8  
PULSE DURATION = 250 s  
DUTY CYCLE = 0.5% MAX  
PULSE DURATION = 250 s  
DUTY CYCLE = 0.5% MAX  
2.4  
2.0  
1.6  
1.2  
0.8  
0.4  
ID = 80 A  
ID = 80 A  
VGS = 10 V  
T
J = 175oC  
TJ = 25oC  
6
0
4
5
7
8
9
10  
80 40  
0
40  
80  
120 160  
200  
TJ, JUNCTION TEMPERATURE ( oC)  
VGS, GATE TO SOURCE VOLTAGE (V)  
Figure 11. RDS(on) vs. Gate Voltage  
Figure 12. Normalized RDS(on) vs. Junction  
Temperature  
1.2  
1.10  
VGS = VDS  
ID = 1 mA  
I
D
= 250 A  
1.0  
0.8  
0.6  
0.4  
1.05  
1.00  
0.95  
0.90  
80 40  
0
40  
80  
120 160  
200  
80 40  
0
40  
80  
120 160  
200  
TJ, JUNCTION TEMPERATURE ( oC)  
TJ, JUNCTION TEMPERATURE ( oC)  
Figure 13. Normalized Gate Threshold Voltage  
vs. Temperature  
Figure 14. Normalized Drain to Source  
Breakdown Voltage vs. Junction Temperature  
10000  
10  
ID = 80 A  
Ciss  
VDD = 50 V  
8
1000  
Coss  
VDD = 40 V  
VDD = 60 V  
6
4
2
0
100  
10  
f = 1 MHz  
GS = 0 V  
Crss  
V
1
0.1  
1
10  
100  
0
10  
20  
30  
40  
50  
V
DS, DRAIN TO SOURCE VOLTAGE (V)  
Qg, GATE CHARGE(nC)  
Figure 15. Capacitance vs. Drain to Source  
Voltage  
Figure 16. Gate Charge vs. Gate to Source  
Voltage  
www.onsemi.com  
5
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, and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “onsemi” or its affiliates  
and/or subsidiaries in the United States and/or other countries. onsemi owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property.  
A listing of onsemi’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/PatentMarking.pdf. onsemi reserves the right to make changes at any time to any  
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