SGL50N60RUFDTU [ONSEMI]

IGBT,600V,50A,短路额定;
SGL50N60RUFDTU
型号: SGL50N60RUFDTU
厂家: ONSEMI    ONSEMI
描述:

IGBT,600V,50A,短路额定

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November 2013  
SGL50N60RUFD  
600 V, 50 A Short Circuit Rated IGBT  
General Description  
Features  
Fairchild’s RUFD series of Insulated Gate Bipolar  
Transistors (IGBTs) provide low conduction and switching  
losses as well as short circuit ruggedness. The RUFD  
series is designed for applications such as motor control,  
uninterrupted power supplies (UPS) and general inverters  
where short circuit ruggedness is a required feature.  
50 A, 600 V, TC = 100°C  
Low Saturation Voltage: VCE(sat) = 2.2 V @ IC = 50 A  
Typical Fall Time. . . . . . . . . .261ns at TJ = 125°C  
High Speed Switching  
High Input Impedance  
Short Circuit Rating  
Applications  
Motor Control, UPS, General Inverter.  
C
G
TO-264  
E
G
C
E
Absolute Maximum Ratings  
T = 25C unless otherwise noted  
C
Symbol  
VCES  
VGES  
Description  
Collector-Emitter Voltage  
Ratings  
Unit  
V
600  
Gate-Emitter Voltage  
20  
V
Collector Current  
@ TC  
@ TC = 100C  
=
25C  
80  
A
IC  
ICM (1)  
IF  
Collector Current  
50  
A
Pulsed Collector Current  
150  
A
Diode Continuous Forward Current  
Diode Continuous Forward Current  
Diode Maximum Forward Current  
Short Circuit Withstand Time  
Maximum Power Dissipation  
Maximum Power Dissipation  
Operating Junction Temperature  
Storage Temperature Range  
Maximum Lead Temp. for Soldering  
Purposes, 1/8” from Case for 5 Seconds  
@ TC = 25C  
@ TC = 100C  
60  
30  
A
A
IFM  
TSC  
PD  
90  
A
@ TC = 100C  
@ TC = 25C  
@ TC = 100C  
10  
us  
W
W
C  
C  
250  
100  
TJ  
Tstg  
-55 to +150  
-55 to +150  
TL  
300  
C  
Notes :  
(1) Repetitive rating : Pulse width limited by max. junction temperature  
Thermal Characteristics  
Symbol  
RJC(IGBT)  
RJC(DIODE)  
RJA  
Parameter  
Thermal Resistance, Junction-to-Case  
Thermal Resistance, Junction-to-Case  
Typ.  
Max.  
0.5  
Unit  
C/W  
C/W  
C/W  
--  
--  
--  
1.0  
Thermal Resistance, Junction-to-Ambient  
25  
©1999 Fairchild Semiconductor Corporation  
SGL50N60RUFD Rev. C1  
1
www.fairchildsemi.com  
Electrical Characteristics of the IGBT  
T = 25C unless otherwise noted  
C
Symbol  
Parameter  
Test Conditions  
Min.  
Typ.  
Max.  
Unit  
Off Characteristics  
BVCES  
BVCES  
TJ  
Collector-Emitter Breakdown Voltage  
Temperature Coefficient of Breakdown  
Voltage  
VGE = 0 V, IC = 250 uA  
GE = 0 V, IC = 1 mA  
600  
--  
--  
--  
--  
V
/
V
0.6  
V/C  
ICES  
IGES  
Collector Cut-Off Current  
G-E Leakage Current  
VCE = VCES, VGE = 0 V  
VGE = VGES, VCE = 0 V  
--  
--  
--  
--  
250  
uA  
nA  
± 100  
On Characteristics  
VGE(th)  
G-E Threshold Voltage  
Ic = 50 mA, VCE = VGE  
5.0  
--  
6.0  
2.2  
2.5  
8.5  
2.8  
--  
V
V
V
I
C = 50 A, VGE = 15 V  
Collector to Emitter  
Saturation Voltage  
VCE(sat)  
IC = 80 A, VGE = 15 V  
--  
Dynamic Characteristics  
Cies  
Coes  
Cres  
Input Capacitance  
--  
--  
--  
3311  
399  
139  
--  
--  
--  
pF  
pF  
pF  
VCE=30 V VGE = 0 V,  
f = 1 MHz  
,
Output Capacitance  
Reverse Transfer Capacitance  
Switching Characteristics  
td(on)  
tr  
td(off)  
tf  
Eon  
Eoff  
Ets  
td(on)  
tr  
td(off)  
tf  
Eon  
Eoff  
Ets  
Turn-On Delay Time  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
--  
26  
89  
--  
--  
ns  
ns  
Rise Time  
Turn-Off Delay Time  
Fall Time  
66  
100  
200  
--  
ns  
VCC = 300 V, IC = 50 A,  
R
G = 5.9 , VGE = 15 V,  
118  
1.68  
1.03  
2.71  
28  
ns  
Inductive Load, TC = 25C  
Turn-On Switching Loss  
Turn-Off Switching Loss  
Total Switching Loss  
Turn-On Delay Time  
Rise Time  
mJ  
mJ  
mJ  
ns  
--  
3.8  
--  
91  
--  
ns  
Turn-Off Delay Time  
Fall Time  
68  
110  
400  
--  
ns  
VCC = 300 V, IC = 50 A,  
R
G = 5.9 , VGE = 15 V,  
261  
1.7  
ns  
Inductive Load, TC = 125C  
Turn-On Switching Loss  
Turn-Off Switching Loss  
Total Switching Loss  
mJ  
mJ  
mJ  
2.31  
4.01  
--  
5.62  
V
CC = 300 V, VGE = 15 V  
Tsc  
Short Circuit Withstand Time  
10  
--  
--  
us  
@ TC = 100C  
Qg  
Total Gate Charge  
--  
--  
--  
--  
145  
25  
210  
35  
nC  
nC  
nC  
nH  
VCE = 300 V, IC = 50 A,  
Qge  
Qgc  
Le  
Gate-Emitter Charge  
Gate-Collector Charge  
Internal Emitter Inductance  
V
GE = 15 V  
70  
100  
--  
Measured 5mm from PKG  
18  
Electrical Characteristics of DIODE  
T
= 25C unless otherwise noted  
C
Symbol  
Parameter  
Test Conditions  
Min.  
--  
Typ.  
1.9  
1.8  
70  
Max.  
2.8  
--  
Unit  
TC  
C = 100C  
TC 25C  
C = 100C  
TC 25C  
TC = 100C  
TC 25C  
C = 100C  
=
25C  
VFM  
Diode Forward Voltage  
IF = 30 A  
V
T
--  
=
--  
100  
--  
trr  
Diode Reverse Recovery Time  
ns  
A
T
--  
140  
6
=
--  
7.8  
--  
Diode Peak Reverse Recovery  
Current  
IF= 30 A,  
diF/dt=200A/us  
Irr  
--  
8
=
--  
200  
580  
360  
--  
Qrr  
Diode Reverse Recovery Charge  
nC  
T
--  
©1999 Fairchild Semiconductor Corporation  
SGL50N60RUFD Rev. C1  
2
www.fairchildsemi.com  
140  
120  
100  
80  
15V  
20V  
Common Emitter  
TC = 25  
140  
120  
100  
80  
Common Emitter  
VGE = 15V  
TC  
= 25━  
TC = 125------  
12V  
60  
60  
VGE = 10V  
40  
40  
20  
20  
0
0
0
2
4
6
8
1
10  
Collector - Emitter Voltage, VCE [V]  
Collector - Emitter Voltage, VCE [V]  
Fig 1. Typical Output Characteristics  
Fig 2. Typical Saturation Voltage Characteristics  
5
60  
VCC = 300V  
Common Emitter  
Load Current : peak of square wave  
V
GE = 15V  
50  
4
3
2
1
0
100A  
40  
30  
20  
50A  
IC = 30A  
10  
Duty cycle : 50%  
TC = 100  
Power Dissipation = 70W  
0
1
10  
100  
1000  
-50  
0
50  
100  
150  
Frequency [KHz]  
Case Temperature, TC []  
Fig 3. Saturation Voltage vs. Case  
Fig 4. Load Current vs. Frequency  
Temperature at Variant Current Level  
20  
16  
12  
8
20  
Common Emitter  
Common Emitter  
TC = 125  
T
C = 25  
16  
12  
8
100A  
100A  
4
4
50A  
50A  
IC = 30A  
IC = 30A  
8
0
0
0
4
8
12  
16  
20  
0
4
12  
16  
20  
Gate - Emitter Voltage, VGE [V]  
Gate - Emitter Voltage, VGE [V]  
Fig 6. Saturation Voltage vs. V  
Fig 5. Saturation Voltage vs. V  
GE  
GE  
©1999 Fairchild Semiconductor Corporation  
3
www.fairchildsemi.com  
SGL50N60RUFD Rev. C1  
7000  
6000  
5000  
4000  
3000  
2000  
1000  
0
1000  
Common Emitter  
Common Emitter  
VCC = 300V, VGE = ± 15V  
IC = 50A  
V
T
GE = 0V, f = 1MHz  
C = 25  
TC  
= 25━  
Ton  
Tr  
TC = 125------  
Cies  
Coes  
Cres  
100  
1
10  
Collector - Emitter Voltage, VCE [V]  
10  
100  
Gate Resistance, RG []  
Fig 7. Capacitance Characteristics  
Fig 8. Turn-On Characteristics vs.  
Gate Resistance  
10000  
Common Emitter  
Common Emitter  
VCC = 300V, VGE = ± 15V  
IC = 50A  
V
I
CC = 300V, VGE = ± 15V  
C = 50A  
TC 25━  
TC = 125------  
1000  
=
TC  
= 25━  
Eon  
Toff  
Toff  
TC = 125------  
Eoff  
Eoff  
Tf  
Tf  
1000  
100  
10  
100  
10  
100  
Gate Resistance, RG []  
Gate Resistance, RG []  
Fig 9. Turn-Off Characteristics vs.  
Gate Resistance  
Fig 10. Switching Loss vs. Gate Resistance  
1000  
1000  
Common Emitter  
V
GE = ± 15V, RG = 5.9  
TC 25━  
=
TC = 125------  
Ton  
Tr  
Toff  
Tf  
100  
Toff  
100  
Tf  
Common Emitter  
VGE = ± 15V, RG = 5.9  
TC  
= 25━  
TC = 125------  
10  
10  
20  
40  
60  
80  
100  
10  
20  
40  
60  
80  
100  
Collector Current, IC [A]  
Collector Current, IC [A]  
Fig 11. Turn-On Characteristics vs.  
Collector Current  
Fig 12. Turn-Off Characteristics vs.  
Collector Current  
©1999 Fairchild Semiconductor Corporation  
4
www.fairchildsemi.com  
SGL50N60RUFD Rev. C1  
15  
12  
9
10000  
1000  
100  
Common Emitter  
RL = 6  
TC = 25  
Common Emitter  
GE = ± 15V, RG = 5.9  
TC 25━  
TC = 125------  
V
=
VCC = 100 V  
300 V  
200 V  
Eoff  
Eoff  
Eon  
6
3
0
10  
20  
40  
60  
80  
100  
0
30  
60  
90  
120  
150  
180  
Collector Current, IC [A]  
Gate Charge, Qg [ nC ]  
Fig 13. Switching Loss vs. Collector Current  
Fig 14. Gate Charge Characteristics  
500  
IC MAX. (Pulsed)  
100  
100  
50us  
IC MAX. (Continuous)  
100us  
1  
DC Operation  
10  
1
10  
Single Nonrepetitive  
Pulse TC = 25℃  
Curves must be derated  
linearly with increase  
in temperature  
Safe Operating Area  
VGE = 20V, TC = 100  
0.1  
1
0.3  
1
10  
100  
1000  
1
10  
100  
1000  
Collector-Emitter Voltage, VCE [V]  
Collector-Emitter Voltage, VCE [V]  
Fig 15. SOA Characteristics  
Fig 16. Turn-Off SOA Characteristics  
1
0.5  
0.2  
0.1  
0.1  
0.05  
Pdm  
0.02  
0.01  
0.01  
t1  
t2  
single pulse  
1E-3  
Duty factor D = t1 / t2  
Peak Tj = Pdm  
Zthjc + T  
C
10-5  
10-4  
10-3  
10-2  
10-1  
100  
101  
Rectangular Pulse Duration [sec]  
Fig 17. Transient Thermal Impedance of IGBT  
©1999 Fairchild Semiconductor Corporation  
SGL50N60RUFD Rev. C1  
5
www.fairchildsemi.com  
100  
10  
1
TC  
= 25━  
VR = 200V  
IF = 30A  
TC = 100------  
100  
10  
1
TC  
= 25━  
TC = 100------  
0
1
2
3
4
100  
1000  
di/dt [A/us]  
Forward Voltage Drop, VFM [V]  
Fig 18. Forward Characteristics  
Fig 19. Reverse Recovery Current  
1400  
200  
VR = 200V  
IF = 30A  
VR = 200V  
IF = 30A  
TC 25━  
TC = 100------  
180  
160  
140  
120  
100  
80  
1200  
TC  
= 25━  
=
TC = 100------  
1000  
800  
600  
400  
200  
0
60  
40  
20  
100  
1000  
100  
1000  
di/dt [A/us]  
di/dt [A/us]  
Fig 20. Stored Charge  
Fig 21. Reverse Recovery Time  
©1999 Fairchild Semiconductor Corporation  
SGL50N60RUFD Rev. C1  
6
www.fairchildsemi.com  
Mechanical Dimensions  
Figure 22. TO-264 3L - 3LD; TO264; MOLDED; JEDEC VARIATION AA  
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without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or  
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Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:  
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SGL50N60RUFD Rev. C1  
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